---
_id: '7286'
author:
- first_name: Genziana
  full_name: Bussone, Genziana
  last_name: Bussone
- first_name: Rüdiger
  full_name: Schott, Rüdiger
  last_name: Schott
- first_name: Andreas
  full_name: Biermanns, Andreas
  last_name: Biermanns
- first_name: Anton
  full_name: Davydok, Anton
  last_name: Davydok
- first_name: Dirk
  full_name: Reuter, Dirk
  id: '37763'
  last_name: Reuter
- first_name: Gerardina
  full_name: Carbone, Gerardina
  last_name: Carbone
- first_name: Tobias U.
  full_name: Schülli, Tobias U.
  last_name: Schülli
- first_name: Andreas D.
  full_name: Wieck, Andreas D.
  last_name: Wieck
- first_name: Ullrich
  full_name: Pietsch, Ullrich
  last_name: Pietsch
citation:
  ama: Bussone G, Schott R, Biermanns A, et al. Grazing-incidence X-ray diffraction
    of single GaAs nanowires at locations defined by focused ion beams. <i>Journal
    of Applied Crystallography</i>. 2013;46(4):887-892. doi:<a href="https://doi.org/10.1107/s0021889813004226">10.1107/s0021889813004226</a>
  apa: Bussone, G., Schott, R., Biermanns, A., Davydok, A., Reuter, D., Carbone, G.,
    … Pietsch, U. (2013). Grazing-incidence X-ray diffraction of single GaAs nanowires
    at locations defined by focused ion beams. <i>Journal of Applied Crystallography</i>,
    <i>46</i>(4), 887–892. <a href="https://doi.org/10.1107/s0021889813004226">https://doi.org/10.1107/s0021889813004226</a>
  bibtex: '@article{Bussone_Schott_Biermanns_Davydok_Reuter_Carbone_Schülli_Wieck_Pietsch_2013,
    title={Grazing-incidence X-ray diffraction of single GaAs nanowires at locations
    defined by focused ion beams}, volume={46}, DOI={<a href="https://doi.org/10.1107/s0021889813004226">10.1107/s0021889813004226</a>},
    number={4}, journal={Journal of Applied Crystallography}, publisher={International
    Union of Crystallography (IUCr)}, author={Bussone, Genziana and Schott, Rüdiger
    and Biermanns, Andreas and Davydok, Anton and Reuter, Dirk and Carbone, Gerardina
    and Schülli, Tobias U. and Wieck, Andreas D. and Pietsch, Ullrich}, year={2013},
    pages={887–892} }'
  chicago: 'Bussone, Genziana, Rüdiger Schott, Andreas Biermanns, Anton Davydok, Dirk
    Reuter, Gerardina Carbone, Tobias U. Schülli, Andreas D. Wieck, and Ullrich Pietsch.
    “Grazing-Incidence X-Ray Diffraction of Single GaAs Nanowires at Locations Defined
    by Focused Ion Beams.” <i>Journal of Applied Crystallography</i> 46, no. 4 (2013):
    887–92. <a href="https://doi.org/10.1107/s0021889813004226">https://doi.org/10.1107/s0021889813004226</a>.'
  ieee: G. Bussone <i>et al.</i>, “Grazing-incidence X-ray diffraction of single GaAs
    nanowires at locations defined by focused ion beams,” <i>Journal of Applied Crystallography</i>,
    vol. 46, no. 4, pp. 887–892, 2013.
  mla: Bussone, Genziana, et al. “Grazing-Incidence X-Ray Diffraction of Single GaAs
    Nanowires at Locations Defined by Focused Ion Beams.” <i>Journal of Applied Crystallography</i>,
    vol. 46, no. 4, International Union of Crystallography (IUCr), 2013, pp. 887–92,
    doi:<a href="https://doi.org/10.1107/s0021889813004226">10.1107/s0021889813004226</a>.
  short: G. Bussone, R. Schott, A. Biermanns, A. Davydok, D. Reuter, G. Carbone, T.U.
    Schülli, A.D. Wieck, U. Pietsch, Journal of Applied Crystallography 46 (2013)
    887–892.
date_created: 2019-01-31T08:45:31Z
date_updated: 2022-01-06T07:03:32Z
department:
- _id: '15'
- _id: '230'
doi: 10.1107/s0021889813004226
intvolume: '        46'
issue: '4'
language:
- iso: eng
page: 887-892
publication: Journal of Applied Crystallography
publication_identifier:
  issn:
  - 0021-8898
publication_status: published
publisher: International Union of Crystallography (IUCr)
status: public
title: Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined
  by focused ion beams
type: journal_article
user_id: '42514'
volume: 46
year: '2013'
...