[{"publication_identifier":{"issn":["0026-2692"]},"publication_status":"published","issue":"2","year":"2008","intvolume":"        40","page":"215-217","citation":{"chicago":"Vasconcellos, S. Michaelis de, A. Pawlis, C. Arens, M. Panfilova, Artur Zrenner, D. Schikora, and K. Lischka. “Exciton Spectroscopy on Single CdSe/ZnSe Quantum Dot Photodiodes.” <i>Microelectronics Journal</i> 40, no. 2 (2008): 215–17. <a href=\"https://doi.org/10.1016/j.mejo.2008.07.055\">https://doi.org/10.1016/j.mejo.2008.07.055</a>.","ieee":"S. M. de Vasconcellos <i>et al.</i>, “Exciton spectroscopy on single CdSe/ZnSe quantum dot photodiodes,” <i>Microelectronics Journal</i>, vol. 40, no. 2, pp. 215–217, 2008.","ama":"de Vasconcellos SM, Pawlis A, Arens C, et al. Exciton spectroscopy on single CdSe/ZnSe quantum dot photodiodes. <i>Microelectronics Journal</i>. 2008;40(2):215-217. doi:<a href=\"https://doi.org/10.1016/j.mejo.2008.07.055\">10.1016/j.mejo.2008.07.055</a>","mla":"de Vasconcellos, S. Michaelis, et al. “Exciton Spectroscopy on Single CdSe/ZnSe Quantum Dot Photodiodes.” <i>Microelectronics Journal</i>, vol. 40, no. 2, Elsevier BV, 2008, pp. 215–17, doi:<a href=\"https://doi.org/10.1016/j.mejo.2008.07.055\">10.1016/j.mejo.2008.07.055</a>.","short":"S.M. de Vasconcellos, A. Pawlis, C. Arens, M. Panfilova, A. Zrenner, D. Schikora, K. Lischka, Microelectronics Journal 40 (2008) 215–217.","bibtex":"@article{de Vasconcellos_Pawlis_Arens_Panfilova_Zrenner_Schikora_Lischka_2008, title={Exciton spectroscopy on single CdSe/ZnSe quantum dot photodiodes}, volume={40}, DOI={<a href=\"https://doi.org/10.1016/j.mejo.2008.07.055\">10.1016/j.mejo.2008.07.055</a>}, number={2}, journal={Microelectronics Journal}, publisher={Elsevier BV}, author={de Vasconcellos, S. Michaelis and Pawlis, A. and Arens, C. and Panfilova, M. and Zrenner, Artur and Schikora, D. and Lischka, K.}, year={2008}, pages={215–217} }","apa":"de Vasconcellos, S. M., Pawlis, A., Arens, C., Panfilova, M., Zrenner, A., Schikora, D., &#38; Lischka, K. (2008). Exciton spectroscopy on single CdSe/ZnSe quantum dot photodiodes. <i>Microelectronics Journal</i>, <i>40</i>(2), 215–217. <a href=\"https://doi.org/10.1016/j.mejo.2008.07.055\">https://doi.org/10.1016/j.mejo.2008.07.055</a>"},"publisher":"Elsevier BV","date_updated":"2022-01-06T07:01:09Z","volume":40,"author":[{"first_name":"S. Michaelis","full_name":"de Vasconcellos, S. Michaelis","last_name":"de Vasconcellos"},{"first_name":"A.","full_name":"Pawlis, A.","last_name":"Pawlis"},{"last_name":"Arens","full_name":"Arens, C.","first_name":"C."},{"first_name":"M.","last_name":"Panfilova","full_name":"Panfilova, M."},{"first_name":"Artur","id":"606","full_name":"Zrenner, Artur","last_name":"Zrenner","orcid":"0000-0002-5190-0944"},{"first_name":"D.","full_name":"Schikora, D.","last_name":"Schikora"},{"full_name":"Lischka, K.","last_name":"Lischka","first_name":"K."}],"date_created":"2018-09-20T13:37:03Z","title":"Exciton spectroscopy on single CdSe/ZnSe quantum dot photodiodes","doi":"10.1016/j.mejo.2008.07.055","publication":"Microelectronics Journal","type":"journal_article","abstract":[{"text":"We have investigated the properties of neutral and charged excitons in single CdSe/ZnSe QD photodiodes by μ-photoluminescence spectroscopy. By applying a bias voltage, we have been able to control the number of electrons in a single QD by shifting the energy levels of the QD with respect to the Fermi level in the back contact. Also the quantum-confined Stark effect was observed as a function of the applied electric field.","lang":"eng"}],"status":"public","_id":"4554","department":[{"_id":"15"},{"_id":"230"},{"_id":"35"}],"user_id":"49428","keyword":["CdSe quantum dots","Photodiode","Stark effect"],"article_type":"original","language":[{"iso":"eng"}]},{"date_created":"2018-09-20T13:39:35Z","publisher":"Elsevier BV","title":"Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs","issue":"2","year":"2008","language":[{"iso":"eng"}],"keyword":["Raman","Photoluminescence","Microdisc","ZnSe"],"publication":"Microelectronics Journal","abstract":[{"lang":"eng","text":"Semiconductor microdiscs are promising for applications in photonics and quantum-information processing, such as efficient solid-state-based single-photon emitters. Strain in the multilayer structure of those devices has an important influence on their optical properties. We present measurements of the strain distribution in ZnMgSe/ZnSe microdiscs by means of micro-photoluminescence and micro-Raman imaging. Photoluminescence measurements of microdiscs reveal substantially broadened emission lines with a shift to lower energy at the undercut part of microdiscs, indicating local relaxation in this area. The distribution of the strain in the microdiscs is obtained from an imaging micro-Raman analysis, revealing that the freestanding part of the microdiscs is free of defects."}],"volume":40,"author":[{"last_name":"Panfilova","full_name":"Panfilova, M.","first_name":"M."},{"full_name":"Pawlis, A.","last_name":"Pawlis","first_name":"A."},{"full_name":"Arens, C.","last_name":"Arens","first_name":"C."},{"first_name":"S. Michaelis","full_name":"de Vasconcellos, S. Michaelis","last_name":"de Vasconcellos"},{"first_name":"Gerhard","id":"53","full_name":"Berth, Gerhard","last_name":"Berth"},{"last_name":"Hüsch","full_name":"Hüsch, K.P.","first_name":"K.P."},{"last_name":"Wiedemeier","full_name":"Wiedemeier, V.","first_name":"V."},{"orcid":"0000-0002-5190-0944","last_name":"Zrenner","id":"606","full_name":"Zrenner, Artur","first_name":"Artur"},{"last_name":"Lischka","full_name":"Lischka, K.","first_name":"K."}],"date_updated":"2022-01-06T07:01:09Z","doi":"10.1016/j.mejo.2008.07.056","publication_identifier":{"issn":["0026-2692"]},"publication_status":"published","intvolume":"        40","page":"221-223","citation":{"apa":"Panfilova, M., Pawlis, A., Arens, C., de Vasconcellos, S. M., Berth, G., Hüsch, K. P., … Lischka, K. (2008). Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs. <i>Microelectronics Journal</i>, <i>40</i>(2), 221–223. <a href=\"https://doi.org/10.1016/j.mejo.2008.07.056\">https://doi.org/10.1016/j.mejo.2008.07.056</a>","mla":"Panfilova, M., et al. “Micro-Raman Imaging and Micro-Photoluminescence Measurements of Strain in ZnMgSe/ZnSe Microdiscs.” <i>Microelectronics Journal</i>, vol. 40, no. 2, Elsevier BV, 2008, pp. 221–23, doi:<a href=\"https://doi.org/10.1016/j.mejo.2008.07.056\">10.1016/j.mejo.2008.07.056</a>.","bibtex":"@article{Panfilova_Pawlis_Arens_de Vasconcellos_Berth_Hüsch_Wiedemeier_Zrenner_Lischka_2008, title={Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs}, volume={40}, DOI={<a href=\"https://doi.org/10.1016/j.mejo.2008.07.056\">10.1016/j.mejo.2008.07.056</a>}, number={2}, journal={Microelectronics Journal}, publisher={Elsevier BV}, author={Panfilova, M. and Pawlis, A. and Arens, C. and de Vasconcellos, S. Michaelis and Berth, Gerhard and Hüsch, K.P. and Wiedemeier, V. and Zrenner, Artur and Lischka, K.}, year={2008}, pages={221–223} }","short":"M. Panfilova, A. Pawlis, C. Arens, S.M. de Vasconcellos, G. Berth, K.P. Hüsch, V. Wiedemeier, A. Zrenner, K. Lischka, Microelectronics Journal 40 (2008) 221–223.","chicago":"Panfilova, M., A. Pawlis, C. Arens, S. Michaelis de Vasconcellos, Gerhard Berth, K.P. Hüsch, V. Wiedemeier, Artur Zrenner, and K. Lischka. “Micro-Raman Imaging and Micro-Photoluminescence Measurements of Strain in ZnMgSe/ZnSe Microdiscs.” <i>Microelectronics Journal</i> 40, no. 2 (2008): 221–23. <a href=\"https://doi.org/10.1016/j.mejo.2008.07.056\">https://doi.org/10.1016/j.mejo.2008.07.056</a>.","ieee":"M. Panfilova <i>et al.</i>, “Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs,” <i>Microelectronics Journal</i>, vol. 40, no. 2, pp. 221–223, 2008.","ama":"Panfilova M, Pawlis A, Arens C, et al. Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs. <i>Microelectronics Journal</i>. 2008;40(2):221-223. doi:<a href=\"https://doi.org/10.1016/j.mejo.2008.07.056\">10.1016/j.mejo.2008.07.056</a>"},"department":[{"_id":"15"},{"_id":"230"},{"_id":"35"}],"user_id":"49428","_id":"4555","article_type":"original","type":"journal_article","status":"public"}]