[{"date_created":"2018-09-20T13:37:03Z","keyword":["CdSe quantum dots","Photodiode","Stark effect"],"type":"journal_article","department":[{"_id":"15"},{"_id":"230"},{"_id":"35"}],"issue":"2","publication":"Microelectronics Journal","abstract":[{"text":"We have investigated the properties of neutral and charged excitons in single CdSe/ZnSe QD photodiodes by μ-photoluminescence spectroscopy. By applying a bias voltage, we have been able to control the number of electrons in a single QD by shifting the energy levels of the QD with respect to the Fermi level in the back contact. Also the quantum-confined Stark effect was observed as a function of the applied electric field.","lang":"eng"}],"language":[{"iso":"eng"}],"doi":"10.1016/j.mejo.2008.07.055","year":"2008","title":"Exciton spectroscopy on single CdSe/ZnSe quantum dot photodiodes","author":[{"last_name":"de Vasconcellos","first_name":"S. Michaelis","full_name":"de Vasconcellos, S. Michaelis"},{"first_name":"A.","last_name":"Pawlis","full_name":"Pawlis, A."},{"first_name":"C.","last_name":"Arens","full_name":"Arens, C."},{"full_name":"Panfilova, M.","first_name":"M.","last_name":"Panfilova"},{"id":"606","full_name":"Zrenner, Artur","first_name":"Artur","orcid":"0000-0002-5190-0944","last_name":"Zrenner"},{"full_name":"Schikora, D.","first_name":"D.","last_name":"Schikora"},{"last_name":"Lischka","first_name":"K.","full_name":"Lischka, K."}],"publication_identifier":{"issn":["0026-2692"]},"date_updated":"2022-01-06T07:01:09Z","publication_status":"published","intvolume":"        40","article_type":"original","citation":{"ama":"de Vasconcellos SM, Pawlis A, Arens C, et al. Exciton spectroscopy on single CdSe/ZnSe quantum dot photodiodes. <i>Microelectronics Journal</i>. 2008;40(2):215-217. doi:<a href=\"https://doi.org/10.1016/j.mejo.2008.07.055\">10.1016/j.mejo.2008.07.055</a>","bibtex":"@article{de Vasconcellos_Pawlis_Arens_Panfilova_Zrenner_Schikora_Lischka_2008, title={Exciton spectroscopy on single CdSe/ZnSe quantum dot photodiodes}, volume={40}, DOI={<a href=\"https://doi.org/10.1016/j.mejo.2008.07.055\">10.1016/j.mejo.2008.07.055</a>}, number={2}, journal={Microelectronics Journal}, publisher={Elsevier BV}, author={de Vasconcellos, S. Michaelis and Pawlis, A. and Arens, C. and Panfilova, M. and Zrenner, Artur and Schikora, D. and Lischka, K.}, year={2008}, pages={215–217} }","mla":"de Vasconcellos, S. Michaelis, et al. “Exciton Spectroscopy on Single CdSe/ZnSe Quantum Dot Photodiodes.” <i>Microelectronics Journal</i>, vol. 40, no. 2, Elsevier BV, 2008, pp. 215–17, doi:<a href=\"https://doi.org/10.1016/j.mejo.2008.07.055\">10.1016/j.mejo.2008.07.055</a>.","chicago":"Vasconcellos, S. Michaelis de, A. Pawlis, C. Arens, M. Panfilova, Artur Zrenner, D. Schikora, and K. Lischka. “Exciton Spectroscopy on Single CdSe/ZnSe Quantum Dot Photodiodes.” <i>Microelectronics Journal</i> 40, no. 2 (2008): 215–17. <a href=\"https://doi.org/10.1016/j.mejo.2008.07.055\">https://doi.org/10.1016/j.mejo.2008.07.055</a>.","short":"S.M. de Vasconcellos, A. Pawlis, C. Arens, M. Panfilova, A. Zrenner, D. Schikora, K. Lischka, Microelectronics Journal 40 (2008) 215–217.","apa":"de Vasconcellos, S. M., Pawlis, A., Arens, C., Panfilova, M., Zrenner, A., Schikora, D., &#38; Lischka, K. (2008). Exciton spectroscopy on single CdSe/ZnSe quantum dot photodiodes. <i>Microelectronics Journal</i>, <i>40</i>(2), 215–217. <a href=\"https://doi.org/10.1016/j.mejo.2008.07.055\">https://doi.org/10.1016/j.mejo.2008.07.055</a>","ieee":"S. M. de Vasconcellos <i>et al.</i>, “Exciton spectroscopy on single CdSe/ZnSe quantum dot photodiodes,” <i>Microelectronics Journal</i>, vol. 40, no. 2, pp. 215–217, 2008."},"page":"215-217","publisher":"Elsevier BV","_id":"4554","user_id":"49428","volume":40,"status":"public"},{"citation":{"ieee":"M. Panfilova <i>et al.</i>, “Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs,” <i>Microelectronics Journal</i>, vol. 40, no. 2, pp. 221–223, 2008.","apa":"Panfilova, M., Pawlis, A., Arens, C., de Vasconcellos, S. M., Berth, G., Hüsch, K. P., … Lischka, K. (2008). Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs. <i>Microelectronics Journal</i>, <i>40</i>(2), 221–223. <a href=\"https://doi.org/10.1016/j.mejo.2008.07.056\">https://doi.org/10.1016/j.mejo.2008.07.056</a>","chicago":"Panfilova, M., A. Pawlis, C. Arens, S. Michaelis de Vasconcellos, Gerhard Berth, K.P. Hüsch, V. Wiedemeier, Artur Zrenner, and K. Lischka. “Micro-Raman Imaging and Micro-Photoluminescence Measurements of Strain in ZnMgSe/ZnSe Microdiscs.” <i>Microelectronics Journal</i> 40, no. 2 (2008): 221–23. <a href=\"https://doi.org/10.1016/j.mejo.2008.07.056\">https://doi.org/10.1016/j.mejo.2008.07.056</a>.","short":"M. Panfilova, A. Pawlis, C. Arens, S.M. de Vasconcellos, G. Berth, K.P. Hüsch, V. Wiedemeier, A. Zrenner, K. Lischka, Microelectronics Journal 40 (2008) 221–223.","mla":"Panfilova, M., et al. “Micro-Raman Imaging and Micro-Photoluminescence Measurements of Strain in ZnMgSe/ZnSe Microdiscs.” <i>Microelectronics Journal</i>, vol. 40, no. 2, Elsevier BV, 2008, pp. 221–23, doi:<a href=\"https://doi.org/10.1016/j.mejo.2008.07.056\">10.1016/j.mejo.2008.07.056</a>.","bibtex":"@article{Panfilova_Pawlis_Arens_de Vasconcellos_Berth_Hüsch_Wiedemeier_Zrenner_Lischka_2008, title={Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs}, volume={40}, DOI={<a href=\"https://doi.org/10.1016/j.mejo.2008.07.056\">10.1016/j.mejo.2008.07.056</a>}, number={2}, journal={Microelectronics Journal}, publisher={Elsevier BV}, author={Panfilova, M. and Pawlis, A. and Arens, C. and de Vasconcellos, S. Michaelis and Berth, Gerhard and Hüsch, K.P. and Wiedemeier, V. and Zrenner, Artur and Lischka, K.}, year={2008}, pages={221–223} }","ama":"Panfilova M, Pawlis A, Arens C, et al. Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs. <i>Microelectronics Journal</i>. 2008;40(2):221-223. doi:<a href=\"https://doi.org/10.1016/j.mejo.2008.07.056\">10.1016/j.mejo.2008.07.056</a>"},"status":"public","volume":40,"user_id":"49428","publisher":"Elsevier BV","_id":"4555","page":"221-223","abstract":[{"lang":"eng","text":"Semiconductor microdiscs are promising for applications in photonics and quantum-information processing, such as efficient solid-state-based single-photon emitters. Strain in the multilayer structure of those devices has an important influence on their optical properties. We present measurements of the strain distribution in ZnMgSe/ZnSe microdiscs by means of micro-photoluminescence and micro-Raman imaging. Photoluminescence measurements of microdiscs reveal substantially broadened emission lines with a shift to lower energy at the undercut part of microdiscs, indicating local relaxation in this area. The distribution of the strain in the microdiscs is obtained from an imaging micro-Raman analysis, revealing that the freestanding part of the microdiscs is free of defects."}],"issue":"2","publication":"Microelectronics Journal","department":[{"_id":"15"},{"_id":"230"},{"_id":"35"}],"type":"journal_article","keyword":["Raman","Photoluminescence","Microdisc","ZnSe"],"date_created":"2018-09-20T13:39:35Z","article_type":"original","intvolume":"        40","publication_status":"published","date_updated":"2022-01-06T07:01:09Z","author":[{"full_name":"Panfilova, M.","last_name":"Panfilova","first_name":"M."},{"first_name":"A.","last_name":"Pawlis","full_name":"Pawlis, A."},{"last_name":"Arens","first_name":"C.","full_name":"Arens, C."},{"full_name":"de Vasconcellos, S. Michaelis","first_name":"S. Michaelis","last_name":"de Vasconcellos"},{"first_name":"Gerhard","last_name":"Berth","full_name":"Berth, Gerhard","id":"53"},{"first_name":"K.P.","last_name":"Hüsch","full_name":"Hüsch, K.P."},{"full_name":"Wiedemeier, V.","first_name":"V.","last_name":"Wiedemeier"},{"id":"606","full_name":"Zrenner, Artur","last_name":"Zrenner","first_name":"Artur","orcid":"0000-0002-5190-0944"},{"last_name":"Lischka","first_name":"K.","full_name":"Lischka, K."}],"publication_identifier":{"issn":["0026-2692"]},"title":"Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs","year":"2008","doi":"10.1016/j.mejo.2008.07.056","language":[{"iso":"eng"}]}]