---
_id: '4554'
abstract:
- lang: eng
  text: We have investigated the properties of neutral and charged excitons in single
    CdSe/ZnSe QD photodiodes by μ-photoluminescence spectroscopy. By applying a bias
    voltage, we have been able to control the number of electrons in a single QD by
    shifting the energy levels of the QD with respect to the Fermi level in the back
    contact. Also the quantum-confined Stark effect was observed as a function of
    the applied electric field.
article_type: original
author:
- first_name: S. Michaelis
  full_name: de Vasconcellos, S. Michaelis
  last_name: de Vasconcellos
- first_name: A.
  full_name: Pawlis, A.
  last_name: Pawlis
- first_name: C.
  full_name: Arens, C.
  last_name: Arens
- first_name: M.
  full_name: Panfilova, M.
  last_name: Panfilova
- first_name: Artur
  full_name: Zrenner, Artur
  id: '606'
  last_name: Zrenner
  orcid: 0000-0002-5190-0944
- first_name: D.
  full_name: Schikora, D.
  last_name: Schikora
- first_name: K.
  full_name: Lischka, K.
  last_name: Lischka
citation:
  ama: de Vasconcellos SM, Pawlis A, Arens C, et al. Exciton spectroscopy on single
    CdSe/ZnSe quantum dot photodiodes. <i>Microelectronics Journal</i>. 2008;40(2):215-217.
    doi:<a href="https://doi.org/10.1016/j.mejo.2008.07.055">10.1016/j.mejo.2008.07.055</a>
  apa: de Vasconcellos, S. M., Pawlis, A., Arens, C., Panfilova, M., Zrenner, A.,
    Schikora, D., &#38; Lischka, K. (2008). Exciton spectroscopy on single CdSe/ZnSe
    quantum dot photodiodes. <i>Microelectronics Journal</i>, <i>40</i>(2), 215–217.
    <a href="https://doi.org/10.1016/j.mejo.2008.07.055">https://doi.org/10.1016/j.mejo.2008.07.055</a>
  bibtex: '@article{de Vasconcellos_Pawlis_Arens_Panfilova_Zrenner_Schikora_Lischka_2008,
    title={Exciton spectroscopy on single CdSe/ZnSe quantum dot photodiodes}, volume={40},
    DOI={<a href="https://doi.org/10.1016/j.mejo.2008.07.055">10.1016/j.mejo.2008.07.055</a>},
    number={2}, journal={Microelectronics Journal}, publisher={Elsevier BV}, author={de
    Vasconcellos, S. Michaelis and Pawlis, A. and Arens, C. and Panfilova, M. and
    Zrenner, Artur and Schikora, D. and Lischka, K.}, year={2008}, pages={215–217}
    }'
  chicago: 'Vasconcellos, S. Michaelis de, A. Pawlis, C. Arens, M. Panfilova, Artur
    Zrenner, D. Schikora, and K. Lischka. “Exciton Spectroscopy on Single CdSe/ZnSe
    Quantum Dot Photodiodes.” <i>Microelectronics Journal</i> 40, no. 2 (2008): 215–17.
    <a href="https://doi.org/10.1016/j.mejo.2008.07.055">https://doi.org/10.1016/j.mejo.2008.07.055</a>.'
  ieee: S. M. de Vasconcellos <i>et al.</i>, “Exciton spectroscopy on single CdSe/ZnSe
    quantum dot photodiodes,” <i>Microelectronics Journal</i>, vol. 40, no. 2, pp.
    215–217, 2008.
  mla: de Vasconcellos, S. Michaelis, et al. “Exciton Spectroscopy on Single CdSe/ZnSe
    Quantum Dot Photodiodes.” <i>Microelectronics Journal</i>, vol. 40, no. 2, Elsevier
    BV, 2008, pp. 215–17, doi:<a href="https://doi.org/10.1016/j.mejo.2008.07.055">10.1016/j.mejo.2008.07.055</a>.
  short: S.M. de Vasconcellos, A. Pawlis, C. Arens, M. Panfilova, A. Zrenner, D. Schikora,
    K. Lischka, Microelectronics Journal 40 (2008) 215–217.
date_created: 2018-09-20T13:37:03Z
date_updated: 2022-01-06T07:01:09Z
department:
- _id: '15'
- _id: '230'
- _id: '35'
doi: 10.1016/j.mejo.2008.07.055
intvolume: '        40'
issue: '2'
keyword:
- CdSe quantum dots
- Photodiode
- Stark effect
language:
- iso: eng
page: 215-217
publication: Microelectronics Journal
publication_identifier:
  issn:
  - 0026-2692
publication_status: published
publisher: Elsevier BV
status: public
title: Exciton spectroscopy on single CdSe/ZnSe quantum dot photodiodes
type: journal_article
user_id: '49428'
volume: 40
year: '2008'
...
---
_id: '4555'
abstract:
- lang: eng
  text: Semiconductor microdiscs are promising for applications in photonics and quantum-information
    processing, such as efficient solid-state-based single-photon emitters. Strain
    in the multilayer structure of those devices has an important influence on their
    optical properties. We present measurements of the strain distribution in ZnMgSe/ZnSe
    microdiscs by means of micro-photoluminescence and micro-Raman imaging. Photoluminescence
    measurements of microdiscs reveal substantially broadened emission lines with
    a shift to lower energy at the undercut part of microdiscs, indicating local relaxation
    in this area. The distribution of the strain in the microdiscs is obtained from
    an imaging micro-Raman analysis, revealing that the freestanding part of the microdiscs
    is free of defects.
article_type: original
author:
- first_name: M.
  full_name: Panfilova, M.
  last_name: Panfilova
- first_name: A.
  full_name: Pawlis, A.
  last_name: Pawlis
- first_name: C.
  full_name: Arens, C.
  last_name: Arens
- first_name: S. Michaelis
  full_name: de Vasconcellos, S. Michaelis
  last_name: de Vasconcellos
- first_name: Gerhard
  full_name: Berth, Gerhard
  id: '53'
  last_name: Berth
- first_name: K.P.
  full_name: Hüsch, K.P.
  last_name: Hüsch
- first_name: V.
  full_name: Wiedemeier, V.
  last_name: Wiedemeier
- first_name: Artur
  full_name: Zrenner, Artur
  id: '606'
  last_name: Zrenner
  orcid: 0000-0002-5190-0944
- first_name: K.
  full_name: Lischka, K.
  last_name: Lischka
citation:
  ama: Panfilova M, Pawlis A, Arens C, et al. Micro-Raman imaging and micro-photoluminescence
    measurements of strain in ZnMgSe/ZnSe microdiscs. <i>Microelectronics Journal</i>.
    2008;40(2):221-223. doi:<a href="https://doi.org/10.1016/j.mejo.2008.07.056">10.1016/j.mejo.2008.07.056</a>
  apa: Panfilova, M., Pawlis, A., Arens, C., de Vasconcellos, S. M., Berth, G., Hüsch,
    K. P., … Lischka, K. (2008). Micro-Raman imaging and micro-photoluminescence measurements
    of strain in ZnMgSe/ZnSe microdiscs. <i>Microelectronics Journal</i>, <i>40</i>(2),
    221–223. <a href="https://doi.org/10.1016/j.mejo.2008.07.056">https://doi.org/10.1016/j.mejo.2008.07.056</a>
  bibtex: '@article{Panfilova_Pawlis_Arens_de Vasconcellos_Berth_Hüsch_Wiedemeier_Zrenner_Lischka_2008,
    title={Micro-Raman imaging and micro-photoluminescence measurements of strain
    in ZnMgSe/ZnSe microdiscs}, volume={40}, DOI={<a href="https://doi.org/10.1016/j.mejo.2008.07.056">10.1016/j.mejo.2008.07.056</a>},
    number={2}, journal={Microelectronics Journal}, publisher={Elsevier BV}, author={Panfilova,
    M. and Pawlis, A. and Arens, C. and de Vasconcellos, S. Michaelis and Berth, Gerhard
    and Hüsch, K.P. and Wiedemeier, V. and Zrenner, Artur and Lischka, K.}, year={2008},
    pages={221–223} }'
  chicago: 'Panfilova, M., A. Pawlis, C. Arens, S. Michaelis de Vasconcellos, Gerhard
    Berth, K.P. Hüsch, V. Wiedemeier, Artur Zrenner, and K. Lischka. “Micro-Raman
    Imaging and Micro-Photoluminescence Measurements of Strain in ZnMgSe/ZnSe Microdiscs.”
    <i>Microelectronics Journal</i> 40, no. 2 (2008): 221–23. <a href="https://doi.org/10.1016/j.mejo.2008.07.056">https://doi.org/10.1016/j.mejo.2008.07.056</a>.'
  ieee: M. Panfilova <i>et al.</i>, “Micro-Raman imaging and micro-photoluminescence
    measurements of strain in ZnMgSe/ZnSe microdiscs,” <i>Microelectronics Journal</i>,
    vol. 40, no. 2, pp. 221–223, 2008.
  mla: Panfilova, M., et al. “Micro-Raman Imaging and Micro-Photoluminescence Measurements
    of Strain in ZnMgSe/ZnSe Microdiscs.” <i>Microelectronics Journal</i>, vol. 40,
    no. 2, Elsevier BV, 2008, pp. 221–23, doi:<a href="https://doi.org/10.1016/j.mejo.2008.07.056">10.1016/j.mejo.2008.07.056</a>.
  short: M. Panfilova, A. Pawlis, C. Arens, S.M. de Vasconcellos, G. Berth, K.P. Hüsch,
    V. Wiedemeier, A. Zrenner, K. Lischka, Microelectronics Journal 40 (2008) 221–223.
date_created: 2018-09-20T13:39:35Z
date_updated: 2022-01-06T07:01:09Z
department:
- _id: '15'
- _id: '230'
- _id: '35'
doi: 10.1016/j.mejo.2008.07.056
intvolume: '        40'
issue: '2'
keyword:
- Raman
- Photoluminescence
- Microdisc
- ZnSe
language:
- iso: eng
page: 221-223
publication: Microelectronics Journal
publication_identifier:
  issn:
  - 0026-2692
publication_status: published
publisher: Elsevier BV
status: public
title: Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe
  microdiscs
type: journal_article
user_id: '49428'
volume: 40
year: '2008'
...