---
_id: '4076'
abstract:
- lang: eng
  text: 'This contribution analyzes the reliability of strain and rotation variation
    determination using cross‐ as well as phase‐only correlation of experimental wide‐angle
    electron backscatter diffraction (EBSD) patterns. For both rotation and three‐point
    bending the resulting displacement gradient tensor components are examined in
    terms of magnitude and statistical scatter as a function of various correlation
    procedure parameters and signal‐to‐noise ratio. It is shown that on the one hand
    the Fourier filter width has a major impact on the strain results. At higher noise
    level a smaller filter width has to be applied for obtaining maximum precision.
    On the other hand, the influence of the degree of overlap of the regions of interest
    positioned in the patterns is less important. For both rotation and bending experiments
    the cross‐correlation variant yields a smaller standard deviation with respect
    to phase‐only correlation, in particular for elevated noise level. The difference
    is attributed to the stronger propagation of noise effects in the course of phase‐only
    correlation function calculation and fitting. In the rotation experiment a standard
    deviation of ∼1.0 × 10^−4, averaged over the displacement gradient tensor components,
    and a rotational precision of ∼1.5 × 10^−4 rad have been achieved by using optimized
    evaluation settings. '
article_type: original
author:
- first_name: Thomas
  full_name: Riedl, Thomas
  id: '36950'
  last_name: Riedl
- first_name: H.
  full_name: Wendrock, H.
  last_name: Wendrock
citation:
  ama: Riedl T, Wendrock H. Reliability of high-resolution electron backscatter diffraction
    determination of strain and rotation variations using phase-only and cross correlation.
    <i>Crystal Research and Technology</i>. 2014;49(4):195-203. doi:<a href="https://doi.org/10.1002/crat.201300217">10.1002/crat.201300217</a>
  apa: Riedl, T., &#38; Wendrock, H. (2014). Reliability of high-resolution electron
    backscatter diffraction determination of strain and rotation variations using
    phase-only and cross correlation. <i>Crystal Research and Technology</i>, <i>49</i>(4),
    195–203. <a href="https://doi.org/10.1002/crat.201300217">https://doi.org/10.1002/crat.201300217</a>
  bibtex: '@article{Riedl_Wendrock_2014, title={Reliability of high-resolution electron
    backscatter diffraction determination of strain and rotation variations using
    phase-only and cross correlation}, volume={49}, DOI={<a href="https://doi.org/10.1002/crat.201300217">10.1002/crat.201300217</a>},
    number={4}, journal={Crystal Research and Technology}, publisher={Wiley}, author={Riedl,
    Thomas and Wendrock, H.}, year={2014}, pages={195–203} }'
  chicago: 'Riedl, Thomas, and H. Wendrock. “Reliability of High-Resolution Electron
    Backscatter Diffraction Determination of Strain and Rotation Variations Using
    Phase-Only and Cross Correlation.” <i>Crystal Research and Technology</i> 49,
    no. 4 (2014): 195–203. <a href="https://doi.org/10.1002/crat.201300217">https://doi.org/10.1002/crat.201300217</a>.'
  ieee: T. Riedl and H. Wendrock, “Reliability of high-resolution electron backscatter
    diffraction determination of strain and rotation variations using phase-only and
    cross correlation,” <i>Crystal Research and Technology</i>, vol. 49, no. 4, pp.
    195–203, 2014.
  mla: Riedl, Thomas, and H. Wendrock. “Reliability of High-Resolution Electron Backscatter
    Diffraction Determination of Strain and Rotation Variations Using Phase-Only and
    Cross Correlation.” <i>Crystal Research and Technology</i>, vol. 49, no. 4, Wiley,
    2014, pp. 195–203, doi:<a href="https://doi.org/10.1002/crat.201300217">10.1002/crat.201300217</a>.
  short: T. Riedl, H. Wendrock, Crystal Research and Technology 49 (2014) 195–203.
date_created: 2018-08-22T12:45:23Z
date_updated: 2022-01-06T07:00:13Z
ddc:
- '530'
department:
- _id: '15'
- _id: '286'
doi: 10.1002/crat.201300217
file:
- access_level: closed
  content_type: application/pdf
  creator: hclaudia
  date_created: 2018-08-22T12:45:58Z
  date_updated: 2018-08-22T12:45:58Z
  file_id: '4077'
  file_name: Reliability of high-resolution electron backscatter diffraction determination
    of strain an totation variations using phase-only and cross correlation.pdf
  file_size: 1377255
  relation: main_file
  success: 1
file_date_updated: 2018-08-22T12:45:58Z
has_accepted_license: '1'
intvolume: '        49'
issue: '4'
language:
- iso: eng
page: 195-203
publication: Crystal Research and Technology
publication_identifier:
  issn:
  - 0232-1300
publication_status: published
publisher: Wiley
status: public
title: Reliability of high-resolution electron backscatter diffraction determination
  of strain and rotation variations using phase-only and cross correlation
type: journal_article
user_id: '55706'
volume: 49
year: '2014'
...