[{"user_id":"11848","_id":"45575","language":[{"iso":"eng"}],"article_type":"original","article_number":"147317","keyword":["XPS","Near ambient pressure","Environmental charge compensation","UV"],"type":"journal_article","publication":"Journal of Electron Spectroscopy and Related Phenomena","status":"public","abstract":[{"text":"In this work, we discuss the possibility of improving charge neutralization in near ambient pressure X-ray photoelectron spectroscopy by co-irradiating the sample with He I photons of 21.2 eV. This UV-enhanced neutralization of charges is a variation of the so-called environmental charge compensation, which uses the electrons produced by the photoionization of the ambient gas to neutralize the positive charges built at the sample surface. Adding an additional ionization source generates more charges at the sample but also larger amounts of electrons available for neutralization. The final surface charge equilibrium depends on different aspects of the experiment, such as the sample composition and geometry, the total ionization cross sections of the gas compared to the surface materials, the gas used, the luminosity and spot size of the sources used for photoionization, and the energy of the electrons present in the gas phase. Here we illustrate the efficiency of the UV-enhanced neutralization using three different dielectric samples with different geometries (a porous SiO2 monolith with an irregular surface, a flat mica sample, and a thin SiO2 film deposited onto a Si substrate), different X-ray spot sizes, and two different gases (N2 and Ar). The effect of biasing on the efficiency of the sample surface to attract electrons produced in the gas phase is also discussed.","lang":"eng"}],"date_created":"2023-06-12T08:09:57Z","author":[{"full_name":"Arcos, Teresa de los","last_name":"Arcos","first_name":"Teresa de los"},{"first_name":"Hendrik","last_name":"Müller","full_name":"Müller, Hendrik"},{"first_name":"Christian","full_name":"Weinberger, Christian","last_name":"Weinberger"},{"last_name":"Grundmeier","full_name":"Grundmeier, Guido","first_name":"Guido"}],"volume":264,"publisher":"Elsevier","date_updated":"2023-06-12T08:12:42Z","doi":"10.1016/j.elspec.2023.147317","title":"UV-enhanced environmental charge compensation in near ambient pressure XPS","issue":"264","publication_status":"published","publication_identifier":{"issn":["0368-2048"]},"citation":{"ieee":"T. de los Arcos, H. Müller, C. Weinberger, and G. Grundmeier, “UV-enhanced environmental charge compensation in near ambient pressure XPS,” <i>Journal of Electron Spectroscopy and Related Phenomena</i>, vol. 264, no. 264, Art. no. 147317, 2023, doi: <a href=\"https://doi.org/10.1016/j.elspec.2023.147317\">10.1016/j.elspec.2023.147317</a>.","chicago":"Arcos, Teresa de los, Hendrik Müller, Christian Weinberger, and Guido Grundmeier. “UV-Enhanced Environmental Charge Compensation in near Ambient Pressure XPS.” <i>Journal of Electron Spectroscopy and Related Phenomena</i> 264, no. 264 (2023). <a href=\"https://doi.org/10.1016/j.elspec.2023.147317\">https://doi.org/10.1016/j.elspec.2023.147317</a>.","ama":"Arcos T de los, Müller H, Weinberger C, Grundmeier G. UV-enhanced environmental charge compensation in near ambient pressure XPS. <i>Journal of Electron Spectroscopy and Related Phenomena</i>. 2023;264(264). doi:<a href=\"https://doi.org/10.1016/j.elspec.2023.147317\">10.1016/j.elspec.2023.147317</a>","short":"T. de los Arcos, H. Müller, C. Weinberger, G. Grundmeier, Journal of Electron Spectroscopy and Related Phenomena 264 (2023).","bibtex":"@article{Arcos_Müller_Weinberger_Grundmeier_2023, title={UV-enhanced environmental charge compensation in near ambient pressure XPS}, volume={264}, DOI={<a href=\"https://doi.org/10.1016/j.elspec.2023.147317\">10.1016/j.elspec.2023.147317</a>}, number={264147317}, journal={Journal of Electron Spectroscopy and Related Phenomena}, publisher={Elsevier}, author={Arcos, Teresa de los and Müller, Hendrik and Weinberger, Christian and Grundmeier, Guido}, year={2023} }","mla":"Arcos, Teresa de los, et al. “UV-Enhanced Environmental Charge Compensation in near Ambient Pressure XPS.” <i>Journal of Electron Spectroscopy and Related Phenomena</i>, vol. 264, no. 264, 147317, Elsevier, 2023, doi:<a href=\"https://doi.org/10.1016/j.elspec.2023.147317\">10.1016/j.elspec.2023.147317</a>.","apa":"Arcos, T. de los, Müller, H., Weinberger, C., &#38; Grundmeier, G. (2023). UV-enhanced environmental charge compensation in near ambient pressure XPS. <i>Journal of Electron Spectroscopy and Related Phenomena</i>, <i>264</i>(264), Article 147317. <a href=\"https://doi.org/10.1016/j.elspec.2023.147317\">https://doi.org/10.1016/j.elspec.2023.147317</a>"},"intvolume":"       264","year":"2023"},{"language":[{"iso":"eng"}],"keyword":["Physical and Theoretical Chemistry","Spectroscopy","Condensed Matter Physics","Atomic and Molecular Physics","and Optics","Radiation","Electronic","Optical and Magnetic Materials"],"article_number":"147317","department":[{"_id":"302"}],"user_id":"54556","_id":"46480","status":"public","publication":"Journal of Electron Spectroscopy and Related Phenomena","type":"journal_article","doi":"10.1016/j.elspec.2023.147317","title":"UV-enhanced environmental charge compensation in near ambient pressure XPS","volume":264,"date_created":"2023-08-11T14:11:57Z","author":[{"first_name":"Hendrik","last_name":"Müller","full_name":"Müller, Hendrik"},{"first_name":"Christian","full_name":"Weinberger, Christian","id":"11848","last_name":"Weinberger"},{"last_name":"Grundmeier","full_name":"Grundmeier, Guido","id":"194","first_name":"Guido"},{"id":"54556","full_name":"de los Arcos de Pedro, Maria Teresa","last_name":"de los Arcos de Pedro","first_name":"Maria Teresa"}],"publisher":"Elsevier BV","date_updated":"2023-08-11T14:13:19Z","intvolume":"       264","citation":{"ama":"Müller H, Weinberger C, Grundmeier G, de los Arcos de Pedro MT. UV-enhanced environmental charge compensation in near ambient pressure XPS. <i>Journal of Electron Spectroscopy and Related Phenomena</i>. 2023;264. doi:<a href=\"https://doi.org/10.1016/j.elspec.2023.147317\">10.1016/j.elspec.2023.147317</a>","chicago":"Müller, Hendrik, Christian Weinberger, Guido Grundmeier, and Maria Teresa de los Arcos de Pedro. “UV-Enhanced Environmental Charge Compensation in near Ambient Pressure XPS.” <i>Journal of Electron Spectroscopy and Related Phenomena</i> 264 (2023). <a href=\"https://doi.org/10.1016/j.elspec.2023.147317\">https://doi.org/10.1016/j.elspec.2023.147317</a>.","ieee":"H. Müller, C. Weinberger, G. Grundmeier, and M. T. de los Arcos de Pedro, “UV-enhanced environmental charge compensation in near ambient pressure XPS,” <i>Journal of Electron Spectroscopy and Related Phenomena</i>, vol. 264, Art. no. 147317, 2023, doi: <a href=\"https://doi.org/10.1016/j.elspec.2023.147317\">10.1016/j.elspec.2023.147317</a>.","bibtex":"@article{Müller_Weinberger_Grundmeier_de los Arcos de Pedro_2023, title={UV-enhanced environmental charge compensation in near ambient pressure XPS}, volume={264}, DOI={<a href=\"https://doi.org/10.1016/j.elspec.2023.147317\">10.1016/j.elspec.2023.147317</a>}, number={147317}, journal={Journal of Electron Spectroscopy and Related Phenomena}, publisher={Elsevier BV}, author={Müller, Hendrik and Weinberger, Christian and Grundmeier, Guido and de los Arcos de Pedro, Maria Teresa}, year={2023} }","mla":"Müller, Hendrik, et al. “UV-Enhanced Environmental Charge Compensation in near Ambient Pressure XPS.” <i>Journal of Electron Spectroscopy and Related Phenomena</i>, vol. 264, 147317, Elsevier BV, 2023, doi:<a href=\"https://doi.org/10.1016/j.elspec.2023.147317\">10.1016/j.elspec.2023.147317</a>.","short":"H. Müller, C. Weinberger, G. Grundmeier, M.T. de los Arcos de Pedro, Journal of Electron Spectroscopy and Related Phenomena 264 (2023).","apa":"Müller, H., Weinberger, C., Grundmeier, G., &#38; de los Arcos de Pedro, M. T. (2023). UV-enhanced environmental charge compensation in near ambient pressure XPS. <i>Journal of Electron Spectroscopy and Related Phenomena</i>, <i>264</i>, Article 147317. <a href=\"https://doi.org/10.1016/j.elspec.2023.147317\">https://doi.org/10.1016/j.elspec.2023.147317</a>"},"year":"2023","publication_identifier":{"issn":["0368-2048"]},"publication_status":"published"},{"title":"Exposure of [MnIII6CrIII]3+ single-molecule magnets to soft X-rays: The effect of the counterions on radiation stability","date_created":"2022-01-31T10:10:17Z","publisher":"Elsevier BV","year":"2011","issue":"11-12","language":[{"iso":"eng"}],"keyword":["Physical and Theoretical Chemistry","Spectroscopy","Condensed Matter Physics","Atomic and Molecular Physics","and Optics","Radiation","Electronic","Optical and Magnetic Materials"],"publication":"Journal of Electron Spectroscopy and Related Phenomena","doi":"10.1016/j.elspec.2011.11.002","author":[{"first_name":"Andreas","last_name":"Helmstedt","full_name":"Helmstedt, Andreas"},{"id":"26883","full_name":"Sacher, Marc","last_name":"Sacher","orcid":"0000-0001-6217-336X","first_name":"Marc"},{"full_name":"Gryzia, Aaron","last_name":"Gryzia","first_name":"Aaron"},{"full_name":"Harder, Alexander","last_name":"Harder","first_name":"Alexander"},{"first_name":"Armin","last_name":"Brechling","full_name":"Brechling, Armin"},{"full_name":"Müller, Norbert","last_name":"Müller","first_name":"Norbert"},{"first_name":"Ulrich","full_name":"Heinzmann, Ulrich","last_name":"Heinzmann"},{"first_name":"Veronika","last_name":"Hoeke","full_name":"Hoeke, Veronika"},{"first_name":"Erich","last_name":"Krickemeyer","full_name":"Krickemeyer, Erich"},{"full_name":"Glaser, Thorsten","last_name":"Glaser","first_name":"Thorsten"},{"first_name":"Samuel","full_name":"Bouvron, Samuel","last_name":"Bouvron"},{"first_name":"Mikhail","last_name":"Fonin","full_name":"Fonin, Mikhail"}],"volume":184,"date_updated":"2024-04-23T12:20:04Z","citation":{"bibtex":"@article{Helmstedt_Sacher_Gryzia_Harder_Brechling_Müller_Heinzmann_Hoeke_Krickemeyer_Glaser_et al._2011, title={Exposure of [MnIII6CrIII]3+ single-molecule magnets to soft X-rays: The effect of the counterions on radiation stability}, volume={184}, DOI={<a href=\"https://doi.org/10.1016/j.elspec.2011.11.002\">10.1016/j.elspec.2011.11.002</a>}, number={11–12}, journal={Journal of Electron Spectroscopy and Related Phenomena}, publisher={Elsevier BV}, author={Helmstedt, Andreas and Sacher, Marc and Gryzia, Aaron and Harder, Alexander and Brechling, Armin and Müller, Norbert and Heinzmann, Ulrich and Hoeke, Veronika and Krickemeyer, Erich and Glaser, Thorsten and et al.}, year={2011}, pages={583–588} }","short":"A. Helmstedt, M. Sacher, A. Gryzia, A. Harder, A. Brechling, N. Müller, U. Heinzmann, V. Hoeke, E. Krickemeyer, T. Glaser, S. Bouvron, M. Fonin, Journal of Electron Spectroscopy and Related Phenomena 184 (2011) 583–588.","mla":"Helmstedt, Andreas, et al. “Exposure of [MnIII6CrIII]3+ Single-Molecule Magnets to Soft X-Rays: The Effect of the Counterions on Radiation Stability.” <i>Journal of Electron Spectroscopy and Related Phenomena</i>, vol. 184, no. 11–12, Elsevier BV, 2011, pp. 583–88, doi:<a href=\"https://doi.org/10.1016/j.elspec.2011.11.002\">10.1016/j.elspec.2011.11.002</a>.","apa":"Helmstedt, A., Sacher, M., Gryzia, A., Harder, A., Brechling, A., Müller, N., Heinzmann, U., Hoeke, V., Krickemeyer, E., Glaser, T., Bouvron, S., &#38; Fonin, M. (2011). Exposure of [MnIII6CrIII]3+ single-molecule magnets to soft X-rays: The effect of the counterions on radiation stability. <i>Journal of Electron Spectroscopy and Related Phenomena</i>, <i>184</i>(11–12), 583–588. <a href=\"https://doi.org/10.1016/j.elspec.2011.11.002\">https://doi.org/10.1016/j.elspec.2011.11.002</a>","ama":"Helmstedt A, Sacher M, Gryzia A, et al. Exposure of [MnIII6CrIII]3+ single-molecule magnets to soft X-rays: The effect of the counterions on radiation stability. <i>Journal of Electron Spectroscopy and Related Phenomena</i>. 2011;184(11-12):583-588. doi:<a href=\"https://doi.org/10.1016/j.elspec.2011.11.002\">10.1016/j.elspec.2011.11.002</a>","ieee":"A. Helmstedt <i>et al.</i>, “Exposure of [MnIII6CrIII]3+ single-molecule magnets to soft X-rays: The effect of the counterions on radiation stability,” <i>Journal of Electron Spectroscopy and Related Phenomena</i>, vol. 184, no. 11–12, pp. 583–588, 2011, doi: <a href=\"https://doi.org/10.1016/j.elspec.2011.11.002\">10.1016/j.elspec.2011.11.002</a>.","chicago":"Helmstedt, Andreas, Marc Sacher, Aaron Gryzia, Alexander Harder, Armin Brechling, Norbert Müller, Ulrich Heinzmann, et al. “Exposure of [MnIII6CrIII]3+ Single-Molecule Magnets to Soft X-Rays: The Effect of the Counterions on Radiation Stability.” <i>Journal of Electron Spectroscopy and Related Phenomena</i> 184, no. 11–12 (2011): 583–88. <a href=\"https://doi.org/10.1016/j.elspec.2011.11.002\">https://doi.org/10.1016/j.elspec.2011.11.002</a>."},"page":"583-588","intvolume":"       184","publication_status":"published","publication_identifier":{"issn":["0368-2048"]},"extern":"1","user_id":"26883","department":[{"_id":"15"}],"_id":"29676","status":"public","type":"journal_article"}]