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Marcak, A. von Keudell, M.T. de los Arcos de Pedro, Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films (2016).","bibtex":"@article{Corbella_Marcak_von Keudell_de los Arcos de Pedro_2016, title={Electric potential screening on metal targets submitted to reactive sputtering}, DOI={10.1116/1.4972566}, number={021307}, journal={Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films}, author={Corbella, Carles and Marcak, Adrian and von Keudell, Achim and de los Arcos de Pedro, Maria Teresa}, year={2016} }","mla":"Corbella, Carles, et al. “Electric Potential Screening on Metal Targets Submitted to Reactive Sputtering.” Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 021307, 2016, doi:10.1116/1.4972566.","ama":"Corbella C, Marcak A, von Keudell A, de los Arcos de Pedro MT. Electric potential screening on metal targets submitted to reactive sputtering. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. Published online 2016. doi:10.1116/1.4972566","apa":"Corbella, C., Marcak, A., von Keudell, A., & de los Arcos de Pedro, M. T. (2016). Electric potential screening on metal targets submitted to reactive sputtering. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Article 021307. https://doi.org/10.1116/1.4972566","chicago":"Corbella, Carles, Adrian Marcak, Achim von Keudell, and Maria Teresa de los Arcos de Pedro. “Electric Potential Screening on Metal Targets Submitted to Reactive Sputtering.” Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 2016. https://doi.org/10.1116/1.4972566."},"year":"2016","type":"journal_article","language":[{"iso":"eng"}],"date_updated":"2023-01-24T08:16:05Z","_id":"22565","article_number":"021307","doi":"10.1116/1.4972566","author":[{"last_name":"Corbella","first_name":"Carles","full_name":"Corbella, Carles"},{"full_name":"Marcak, Adrian","first_name":"Adrian","last_name":"Marcak"},{"last_name":"von Keudell","first_name":"Achim","full_name":"von Keudell, Achim"},{"first_name":"Maria Teresa","full_name":"de los Arcos de Pedro, Maria Teresa","last_name":"de los Arcos de Pedro","id":"54556"}],"department":[{"_id":"302"}],"publication":"Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films","publication_status":"published","publication_identifier":{"issn":["0734-2101","1520-8559"]},"status":"public","date_created":"2021-07-07T09:07:08Z","title":"Electric potential screening on metal targets submitted to reactive sputtering","user_id":"54556"},{"department":[{"_id":"15"},{"_id":"230"},{"_id":"287"},{"_id":"35"}],"publication_identifier":{"issn":["0734-2101","1520-8559"]},"publication_status":"published","title":"Ultrathin K∕p-Si(001) Schottky diodes as detectors of chemically generated hot charge carriers","language":[{"iso":"eng"}],"date_updated":"2022-01-06T07:03:39Z","doi":"10.1116/1.3100218","publication":"Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films","author":[{"last_name":"Huba","first_name":"K.","full_name":"Huba, K."},{"full_name":"Krix, D.","first_name":"D.","last_name":"Krix"},{"first_name":"Cedrik","orcid":"https://orcid.org/0000-0002-3787-3572","full_name":"Meier, Cedrik","last_name":"Meier","id":"20798"},{"last_name":"Nienhaus","full_name":"Nienhaus, H.","first_name":"H."}],"publisher":"American Vacuum Society","volume":27,"date_created":"2019-02-04T14:47:36Z","status":"public","user_id":"20798","page":"889-894","type":"journal_article","citation":{"ieee":"K. Huba, D. Krix, C. Meier, and H. Nienhaus, “Ultrathin K∕p-Si(001) Schottky diodes as detectors of chemically generated hot charge carriers,” Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 27, no. 4, pp. 889–894, 2009.","short":"K. Huba, D. Krix, C. Meier, H. Nienhaus, Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 27 (2009) 889–894.","mla":"Huba, K., et al. “Ultrathin K∕p-Si(001) Schottky Diodes as Detectors of Chemically Generated Hot Charge Carriers.” Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 27, no. 4, American Vacuum Society, 2009, pp. 889–94, doi:10.1116/1.3100218.","bibtex":"@article{Huba_Krix_Meier_Nienhaus_2009, title={Ultrathin K∕p-Si(001) Schottky diodes as detectors of chemically generated hot charge carriers}, volume={27}, DOI={10.1116/1.3100218}, number={4}, journal={Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films}, publisher={American Vacuum Society}, author={Huba, K. and Krix, D. and Meier, Cedrik and Nienhaus, H.}, year={2009}, pages={889–894} }","apa":"Huba, K., Krix, D., Meier, C., & Nienhaus, H. (2009). Ultrathin K∕p-Si(001) Schottky diodes as detectors of chemically generated hot charge carriers. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 27(4), 889–894. https://doi.org/10.1116/1.3100218","ama":"Huba K, Krix D, Meier C, Nienhaus H. Ultrathin K∕p-Si(001) Schottky diodes as detectors of chemically generated hot charge carriers. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 2009;27(4):889-894. doi:10.1116/1.3100218","chicago":"Huba, K., D. Krix, Cedrik Meier, and H. Nienhaus. “Ultrathin K∕p-Si(001) Schottky Diodes as Detectors of Chemically Generated Hot Charge Carriers.” Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 27, no. 4 (2009): 889–94. https://doi.org/10.1116/1.3100218."},"year":"2009","intvolume":" 27","_id":"7499","issue":"4"}]