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Aluminum oxidation by a remote electron cyclotron resonance plasma in magnetic tunnel junctions. <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>. 2003;21(5). doi:<a href=\"https://doi.org/10.1116/1.1609480\">10.1116/1.1609480</a>","mla":"Thomas, A., et al. “Aluminum Oxidation by a Remote Electron Cyclotron Resonance Plasma in Magnetic Tunnel Junctions.” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>, vol. 21, no. 5, 2120, American Vacuum Society, 2003, doi:<a href=\"https://doi.org/10.1116/1.1609480\">10.1116/1.1609480</a>.","chicago":"Thomas, A., H. Brückl, Marc Sacher, J. Schmalhorst, and G. Reiss. “Aluminum Oxidation by a Remote Electron Cyclotron Resonance Plasma in Magnetic Tunnel Junctions.” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i> 21, no. 5 (2003). <a href=\"https://doi.org/10.1116/1.1609480\">https://doi.org/10.1116/1.1609480</a>.","short":"A. Thomas, H. Brückl, M. Sacher, J. Schmalhorst, G. Reiss, Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures 21 (2003).","ieee":"A. Thomas, H. Brückl, M. Sacher, J. Schmalhorst, and G. Reiss, “Aluminum oxidation by a remote electron cyclotron resonance plasma in magnetic tunnel junctions,” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>, vol. 21, no. 5, Art. no. 2120, 2003, doi: <a href=\"https://doi.org/10.1116/1.1609480\">10.1116/1.1609480</a>.","apa":"Thomas, A., Brückl, H., Sacher, M., Schmalhorst, J., &#38; Reiss, G. (2003). Aluminum oxidation by a remote electron cyclotron resonance plasma in magnetic tunnel junctions. <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>, <i>21</i>(5), Article 2120. <a href=\"https://doi.org/10.1116/1.1609480\">https://doi.org/10.1116/1.1609480</a>"},"_id":"29694","publisher":"American Vacuum Society","user_id":"26883","volume":21,"status":"public"},{"publication_identifier":{"issn":["0734-211X"]},"author":[{"first_name":"N.","last_name":"Esser","full_name":"Esser, N."},{"id":"468","orcid":"0000-0002-2717-5076","first_name":"Wolf Gero","last_name":"Schmidt","full_name":"Schmidt, Wolf Gero"},{"full_name":"Cobet, C.","first_name":"C.","last_name":"Cobet"},{"full_name":"Fleischer, K.","first_name":"K.","last_name":"Fleischer"},{"full_name":"Shkrebtii, A. I.","last_name":"Shkrebtii","first_name":"A. I."},{"full_name":"Fimland, B. O.","last_name":"Fimland","first_name":"B. O."},{"last_name":"Richter","first_name":"W.","full_name":"Richter, W."}],"title":"Atomic structure and optical anisotropy of III–V(001) surfaces","year":"2001","intvolume":"        19","publication_status":"published","date_updated":"2025-12-16T07:15:56Z","language":[{"iso":"eng"}],"article_number":"1756","doi":"10.1116/1.1394730","publication":"Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures","issue":"5","date_created":"2019-10-10T12:05:50Z","department":[{"_id":"15"},{"_id":"170"},{"_id":"295"},{"_id":"35"},{"_id":"230"}],"type":"journal_article","status":"public","_id":"13751","funded_apc":"1","volume":19,"user_id":"16199","citation":{"chicago":"Esser, N., Wolf Gero Schmidt, C. Cobet, K. Fleischer, A. I. Shkrebtii, B. O. Fimland, and W. Richter. “Atomic Structure and Optical Anisotropy of III–V(001) Surfaces.” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i> 19, no. 5 (2001). <a href=\"https://doi.org/10.1116/1.1394730\">https://doi.org/10.1116/1.1394730</a>.","short":"N. Esser, W.G. Schmidt, C. Cobet, K. Fleischer, A.I. Shkrebtii, B.O. Fimland, W. Richter, Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures 19 (2001).","ieee":"N. Esser <i>et al.</i>, “Atomic structure and optical anisotropy of III–V(001) surfaces,” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>, vol. 19, no. 5, Art. no. 1756, 2001, doi: <a href=\"https://doi.org/10.1116/1.1394730\">10.1116/1.1394730</a>.","apa":"Esser, N., Schmidt, W. G., Cobet, C., Fleischer, K., Shkrebtii, A. I., Fimland, B. O., &#38; Richter, W. (2001). Atomic structure and optical anisotropy of III–V(001) surfaces. <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>, <i>19</i>(5), Article 1756. <a href=\"https://doi.org/10.1116/1.1394730\">https://doi.org/10.1116/1.1394730</a>","bibtex":"@article{Esser_Schmidt_Cobet_Fleischer_Shkrebtii_Fimland_Richter_2001, title={Atomic structure and optical anisotropy of III–V(001) surfaces}, volume={19}, DOI={<a href=\"https://doi.org/10.1116/1.1394730\">10.1116/1.1394730</a>}, number={51756}, journal={Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures}, author={Esser, N. and Schmidt, Wolf Gero and Cobet, C. and Fleischer, K. and Shkrebtii, A. I. and Fimland, B. O. and Richter, W.}, year={2001} }","ama":"Esser N, Schmidt WG, Cobet C, et al. Atomic structure and optical anisotropy of III–V(001) surfaces. <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>. 2001;19(5). doi:<a href=\"https://doi.org/10.1116/1.1394730\">10.1116/1.1394730</a>","mla":"Esser, N., et al. “Atomic Structure and Optical Anisotropy of III–V(001) Surfaces.” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>, vol. 19, no. 5, 1756, 2001, doi:<a href=\"https://doi.org/10.1116/1.1394730\">10.1116/1.1394730</a>."}},{"volume":18,"doi":"10.1116/1.1305289","user_id":"16199","_id":"13761","language":[{"iso":"eng"}],"article_number":"2215","intvolume":"        18","date_updated":"2025-12-05T13:30:13Z","publication_status":"published","publication_identifier":{"issn":["0734-211X"]},"author":[{"first_name":"Wolf Gero","orcid":"0000-0002-2717-5076","last_name":"Schmidt","full_name":"Schmidt, Wolf Gero","id":"468"},{"full_name":"Bechstedt, F.","last_name":"Bechstedt","first_name":"F."},{"first_name":"J.","last_name":"Bernholc","full_name":"Bernholc, J."}],"status":"public","year":"2000","title":"Understanding reflectance anisotropy: Surface-state signatures and bulk-related features","department":[{"_id":"15"},{"_id":"170"},{"_id":"295"},{"_id":"35"},{"_id":"230"}],"type":"journal_article","date_created":"2019-10-10T12:45:27Z","citation":{"short":"W.G. Schmidt, F. Bechstedt, J. Bernholc, Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures 18 (2000).","chicago":"Schmidt, Wolf Gero, F. Bechstedt, and J. Bernholc. “Understanding Reflectance Anisotropy: Surface-State Signatures and Bulk-Related Features.” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i> 18, no. 4 (2000). <a href=\"https://doi.org/10.1116/1.1305289\">https://doi.org/10.1116/1.1305289</a>.","ieee":"W. G. Schmidt, F. Bechstedt, and J. Bernholc, “Understanding reflectance anisotropy: Surface-state signatures and bulk-related features,” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>, vol. 18, no. 4, Art. no. 2215, 2000, doi: <a href=\"https://doi.org/10.1116/1.1305289\">10.1116/1.1305289</a>.","apa":"Schmidt, W. G., Bechstedt, F., &#38; Bernholc, J. (2000). Understanding reflectance anisotropy: Surface-state signatures and bulk-related features. <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>, <i>18</i>(4), Article 2215. <a href=\"https://doi.org/10.1116/1.1305289\">https://doi.org/10.1116/1.1305289</a>","bibtex":"@article{Schmidt_Bechstedt_Bernholc_2000, title={Understanding reflectance anisotropy: Surface-state signatures and bulk-related features}, volume={18}, DOI={<a href=\"https://doi.org/10.1116/1.1305289\">10.1116/1.1305289</a>}, number={42215}, journal={Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures}, author={Schmidt, Wolf Gero and Bechstedt, F. and Bernholc, J.}, year={2000} }","ama":"Schmidt WG, Bechstedt F, Bernholc J. Understanding reflectance anisotropy: Surface-state signatures and bulk-related features. <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>. 2000;18(4). doi:<a href=\"https://doi.org/10.1116/1.1305289\">10.1116/1.1305289</a>","mla":"Schmidt, Wolf Gero, et al. “Understanding Reflectance Anisotropy: Surface-State Signatures and Bulk-Related Features.” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>, vol. 18, no. 4, 2215, 2000, doi:<a href=\"https://doi.org/10.1116/1.1305289\">10.1116/1.1305289</a>."},"publication":"Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures","issue":"4"},{"citation":{"apa":"Esser, N., Schmidt, W. G., Bernholc, J., Frisch, A. M., Vogt, P., Zorn, M., Pristovsek, M., Richter, W., Bechstedt, F., Hannappel, Th., &#38; Visbeck, S. (1999). GaP(001) and InP(001): Reflectance anisotropy and surface geometry. <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>, <i>17</i>(4), Article 1691. <a href=\"https://doi.org/10.1116/1.590810\">https://doi.org/10.1116/1.590810</a>","ieee":"N. Esser <i>et al.</i>, “GaP(001) and InP(001): Reflectance anisotropy and surface geometry,” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>, vol. 17, no. 4, Art. no. 1691, 1999, doi: <a href=\"https://doi.org/10.1116/1.590810\">10.1116/1.590810</a>.","chicago":"Esser, N., Wolf Gero Schmidt, J. Bernholc, A. M. Frisch, P. Vogt, M. Zorn, M. Pristovsek, et al. “GaP(001) and InP(001): Reflectance Anisotropy and Surface Geometry.” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i> 17, no. 4 (1999). <a href=\"https://doi.org/10.1116/1.590810\">https://doi.org/10.1116/1.590810</a>.","short":"N. Esser, W.G. Schmidt, J. Bernholc, A.M. Frisch, P. Vogt, M. Zorn, M. Pristovsek, W. Richter, F. Bechstedt, Th. Hannappel, S. Visbeck, Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures 17 (1999).","mla":"Esser, N., et al. “GaP(001) and InP(001): Reflectance Anisotropy and Surface Geometry.” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>, vol. 17, no. 4, 1691, 1999, doi:<a href=\"https://doi.org/10.1116/1.590810\">10.1116/1.590810</a>.","ama":"Esser N, Schmidt WG, Bernholc J, et al. GaP(001) and InP(001): Reflectance anisotropy and surface geometry. <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>. 1999;17(4). doi:<a href=\"https://doi.org/10.1116/1.590810\">10.1116/1.590810</a>","bibtex":"@article{Esser_Schmidt_Bernholc_Frisch_Vogt_Zorn_Pristovsek_Richter_Bechstedt_Hannappel_et al._1999, title={GaP(001) and InP(001): Reflectance anisotropy and surface geometry}, volume={17}, DOI={<a href=\"https://doi.org/10.1116/1.590810\">10.1116/1.590810</a>}, number={41691}, journal={Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures}, author={Esser, N. and Schmidt, Wolf Gero and Bernholc, J. and Frisch, A. 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