---
_id: '29694'
article_number: '2120'
author:
- first_name: A.
  full_name: Thomas, A.
  last_name: Thomas
- first_name: H.
  full_name: Brückl, H.
  last_name: Brückl
- first_name: Marc
  full_name: Sacher, Marc
  id: '26883'
  last_name: Sacher
  orcid: 0000-0001-6217-336X
- first_name: J.
  full_name: Schmalhorst, J.
  last_name: Schmalhorst
- first_name: G.
  full_name: Reiss, G.
  last_name: Reiss
citation:
  ama: 'Thomas A, Brückl H, Sacher M, Schmalhorst J, Reiss G. Aluminum oxidation
    by a remote electron cyclotron resonance plasma in magnetic tunnel junctions.
    <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer
    Structures</i>. 2003;21(5). doi:<a href="https://doi.org/10.1116/1.1609480">10.1116/1.1609480</a>'
  apa: 'Thomas, A., Brückl, H., Sacher, M., Schmalhorst, J., &#38; Reiss, G. (2003).
    Aluminum oxidation by a remote electron cyclotron resonance plasma in magnetic
    tunnel junctions. <i>Journal of Vacuum Science &#38; Technology B: Microelectronics
    and Nanometer Structures</i>, <i>21</i>(5), Article 2120. <a href="https://doi.org/10.1116/1.1609480">https://doi.org/10.1116/1.1609480</a>'
  bibtex: '@article{Thomas_Brückl_Sacher_Schmalhorst_Reiss_2003, title={Aluminum
    oxidation by a remote electron cyclotron resonance plasma in magnetic tunnel junctions},
    volume={21}, DOI={<a href="https://doi.org/10.1116/1.1609480">10.1116/1.1609480</a>},
    number={52120}, journal={Journal of Vacuum Science &#38; Technology B: Microelectronics
    and Nanometer Structures}, publisher={American Vacuum Society}, author={Thomas,
    A. and Brückl, H. and Sacher, Marc and Schmalhorst, J. and Reiss, G.}, year={2003}
    }'
  chicago: 'Thomas, A., H. Brückl, Marc Sacher, J. Schmalhorst, and G. Reiss. “Aluminum
    Oxidation by a Remote Electron Cyclotron Resonance Plasma in Magnetic Tunnel Junctions.”
    <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer
    Structures</i> 21, no. 5 (2003). <a href="https://doi.org/10.1116/1.1609480">https://doi.org/10.1116/1.1609480</a>.'
  ieee: 'A. Thomas, H. Brückl, M. Sacher, J. Schmalhorst, and G. Reiss, “Aluminum
    oxidation by a remote electron cyclotron resonance plasma in magnetic tunnel junctions,”
    <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer
    Structures</i>, vol. 21, no. 5, Art. no. 2120, 2003, doi: <a href="https://doi.org/10.1116/1.1609480">10.1116/1.1609480</a>.'
  mla: 'Thomas, A., et al. “Aluminum Oxidation by a Remote Electron Cyclotron Resonance
    Plasma in Magnetic Tunnel Junctions.” <i>Journal of Vacuum Science &#38; Technology
    B: Microelectronics and Nanometer Structures</i>, vol. 21, no. 5, 2120, American
    Vacuum Society, 2003, doi:<a href="https://doi.org/10.1116/1.1609480">10.1116/1.1609480</a>.'
  short: 'A. Thomas, H. Brückl, M. Sacher, J. Schmalhorst, G. Reiss, Journal of Vacuum
    Science &#38; Technology B: Microelectronics and Nanometer Structures 21 (2003).'
date_created: 2022-01-31T10:26:12Z
date_updated: 2024-04-23T12:14:43Z
department:
- _id: '15'
doi: 10.1116/1.1609480
extern: '1'
intvolume: '        21'
issue: '5'
keyword:
- General Engineering
language:
- iso: eng
publication: 'Journal of Vacuum Science & Technology B: Microelectronics and Nanometer
  Structures'
publication_identifier:
  issn:
  - 0734-211X
publication_status: published
publisher: American Vacuum Society
status: public
title: Aluminum oxidation by a remote electron cyclotron resonance plasma in magnetic
  tunnel junctions
type: journal_article
user_id: '26883'
volume: 21
year: '2003'
...
---
_id: '13751'
article_number: '1756'
author:
- first_name: N.
  full_name: Esser, N.
  last_name: Esser
- first_name: Wolf Gero
  full_name: Schmidt, Wolf Gero
  id: '468'
  last_name: Schmidt
  orcid: 0000-0002-2717-5076
- first_name: C.
  full_name: Cobet, C.
  last_name: Cobet
- first_name: K.
  full_name: Fleischer, K.
  last_name: Fleischer
- first_name: A. I.
  full_name: Shkrebtii, A. I.
  last_name: Shkrebtii
- first_name: B. O.
  full_name: Fimland, B. O.
  last_name: Fimland
- first_name: W.
  full_name: Richter, W.
  last_name: Richter
citation:
  ama: 'Esser N, Schmidt WG, Cobet C, et al. Atomic structure and optical anisotropy
    of III–V(001) surfaces. <i>Journal of Vacuum Science &#38; Technology B: Microelectronics
    and Nanometer Structures</i>. 2001;19(5). doi:<a href="https://doi.org/10.1116/1.1394730">10.1116/1.1394730</a>'
  apa: 'Esser, N., Schmidt, W. G., Cobet, C., Fleischer, K., Shkrebtii, A. I., Fimland,
    B. O., &#38; Richter, W. (2001). Atomic structure and optical anisotropy of III–V(001)
    surfaces. <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and
    Nanometer Structures</i>, <i>19</i>(5), Article 1756. <a href="https://doi.org/10.1116/1.1394730">https://doi.org/10.1116/1.1394730</a>'
  bibtex: '@article{Esser_Schmidt_Cobet_Fleischer_Shkrebtii_Fimland_Richter_2001,
    title={Atomic structure and optical anisotropy of III–V(001) surfaces}, volume={19},
    DOI={<a href="https://doi.org/10.1116/1.1394730">10.1116/1.1394730</a>}, number={51756},
    journal={Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer
    Structures}, author={Esser, N. and Schmidt, Wolf Gero and Cobet, C. and Fleischer,
    K. and Shkrebtii, A. I. and Fimland, B. O. and Richter, W.}, year={2001} }'
  chicago: 'Esser, N., Wolf Gero Schmidt, C. Cobet, K. Fleischer, A. I. Shkrebtii,
    B. O. Fimland, and W. Richter. “Atomic Structure and Optical Anisotropy of III–V(001)
    Surfaces.” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and
    Nanometer Structures</i> 19, no. 5 (2001). <a href="https://doi.org/10.1116/1.1394730">https://doi.org/10.1116/1.1394730</a>.'
  ieee: 'N. Esser <i>et al.</i>, “Atomic structure and optical anisotropy of III–V(001)
    surfaces,” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and
    Nanometer Structures</i>, vol. 19, no. 5, Art. no. 1756, 2001, doi: <a href="https://doi.org/10.1116/1.1394730">10.1116/1.1394730</a>.'
  mla: 'Esser, N., et al. “Atomic Structure and Optical Anisotropy of III–V(001) Surfaces.”
    <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer
    Structures</i>, vol. 19, no. 5, 1756, 2001, doi:<a href="https://doi.org/10.1116/1.1394730">10.1116/1.1394730</a>.'
  short: 'N. Esser, W.G. Schmidt, C. Cobet, K. Fleischer, A.I. Shkrebtii, B.O. Fimland,
    W. Richter, Journal of Vacuum Science &#38; Technology B: Microelectronics and
    Nanometer Structures 19 (2001).'
date_created: 2019-10-10T12:05:50Z
date_updated: 2025-12-16T07:15:56Z
department:
- _id: '15'
- _id: '170'
- _id: '295'
- _id: '35'
- _id: '230'
doi: 10.1116/1.1394730
funded_apc: '1'
intvolume: '        19'
issue: '5'
language:
- iso: eng
publication: 'Journal of Vacuum Science & Technology B: Microelectronics and Nanometer
  Structures'
publication_identifier:
  issn:
  - 0734-211X
publication_status: published
status: public
title: Atomic structure and optical anisotropy of III–V(001) surfaces
type: journal_article
user_id: '16199'
volume: 19
year: '2001'
...
---
_id: '13761'
article_number: '2215'
author:
- first_name: Wolf Gero
  full_name: Schmidt, Wolf Gero
  id: '468'
  last_name: Schmidt
  orcid: 0000-0002-2717-5076
- first_name: F.
  full_name: Bechstedt, F.
  last_name: Bechstedt
- first_name: J.
  full_name: Bernholc, J.
  last_name: Bernholc
citation:
  ama: 'Schmidt WG, Bechstedt F, Bernholc J. Understanding reflectance anisotropy:
    Surface-state signatures and bulk-related features. <i>Journal of Vacuum Science
    &#38; Technology B: Microelectronics and Nanometer Structures</i>. 2000;18(4).
    doi:<a href="https://doi.org/10.1116/1.1305289">10.1116/1.1305289</a>'
  apa: 'Schmidt, W. G., Bechstedt, F., &#38; Bernholc, J. (2000). Understanding reflectance
    anisotropy: Surface-state signatures and bulk-related features. <i>Journal of
    Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>,
    <i>18</i>(4), Article 2215. <a href="https://doi.org/10.1116/1.1305289">https://doi.org/10.1116/1.1305289</a>'
  bibtex: '@article{Schmidt_Bechstedt_Bernholc_2000, title={Understanding reflectance
    anisotropy: Surface-state signatures and bulk-related features}, volume={18},
    DOI={<a href="https://doi.org/10.1116/1.1305289">10.1116/1.1305289</a>}, number={42215},
    journal={Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer
    Structures}, author={Schmidt, Wolf Gero and Bechstedt, F. and Bernholc, J.}, year={2000}
    }'
  chicago: 'Schmidt, Wolf Gero, F. Bechstedt, and J. Bernholc. “Understanding Reflectance
    Anisotropy: Surface-State Signatures and Bulk-Related Features.” <i>Journal of
    Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>
    18, no. 4 (2000). <a href="https://doi.org/10.1116/1.1305289">https://doi.org/10.1116/1.1305289</a>.'
  ieee: 'W. G. Schmidt, F. Bechstedt, and J. Bernholc, “Understanding reflectance
    anisotropy: Surface-state signatures and bulk-related features,” <i>Journal of
    Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>,
    vol. 18, no. 4, Art. no. 2215, 2000, doi: <a href="https://doi.org/10.1116/1.1305289">10.1116/1.1305289</a>.'
  mla: 'Schmidt, Wolf Gero, et al. “Understanding Reflectance Anisotropy: Surface-State
    Signatures and Bulk-Related Features.” <i>Journal of Vacuum Science &#38; Technology
    B: Microelectronics and Nanometer Structures</i>, vol. 18, no. 4, 2215, 2000,
    doi:<a href="https://doi.org/10.1116/1.1305289">10.1116/1.1305289</a>.'
  short: 'W.G. Schmidt, F. Bechstedt, J. Bernholc, Journal of Vacuum Science &#38;
    Technology B: Microelectronics and Nanometer Structures 18 (2000).'
date_created: 2019-10-10T12:45:27Z
date_updated: 2025-12-05T13:30:13Z
department:
- _id: '15'
- _id: '170'
- _id: '295'
- _id: '35'
- _id: '230'
doi: 10.1116/1.1305289
intvolume: '        18'
issue: '4'
language:
- iso: eng
publication: 'Journal of Vacuum Science & Technology B: Microelectronics and Nanometer
  Structures'
publication_identifier:
  issn:
  - 0734-211X
publication_status: published
status: public
title: 'Understanding reflectance anisotropy: Surface-state signatures and bulk-related
  features'
type: journal_article
user_id: '16199'
volume: 18
year: '2000'
...
---
_id: '13767'
article_number: '1691'
author:
- first_name: N.
  full_name: Esser, N.
  last_name: Esser
- first_name: Wolf Gero
  full_name: Schmidt, Wolf Gero
  id: '468'
  last_name: Schmidt
  orcid: 0000-0002-2717-5076
- first_name: J.
  full_name: Bernholc, J.
  last_name: Bernholc
- first_name: A. M.
  full_name: Frisch, A. M.
  last_name: Frisch
- first_name: P.
  full_name: Vogt, P.
  last_name: Vogt
- first_name: M.
  full_name: Zorn, M.
  last_name: Zorn
- first_name: M.
  full_name: Pristovsek, M.
  last_name: Pristovsek
- first_name: W.
  full_name: Richter, W.
  last_name: Richter
- first_name: F.
  full_name: Bechstedt, F.
  last_name: Bechstedt
- first_name: Th.
  full_name: Hannappel, Th.
  last_name: Hannappel
- first_name: S.
  full_name: Visbeck, S.
  last_name: Visbeck
citation:
  ama: 'Esser N, Schmidt WG, Bernholc J, et al. GaP(001) and InP(001): Reflectance
    anisotropy and surface geometry. <i>Journal of Vacuum Science &#38; Technology
    B: Microelectronics and Nanometer Structures</i>. 1999;17(4). doi:<a href="https://doi.org/10.1116/1.590810">10.1116/1.590810</a>'
  apa: 'Esser, N., Schmidt, W. G., Bernholc, J., Frisch, A. M., Vogt, P., Zorn, M.,
    Pristovsek, M., Richter, W., Bechstedt, F., Hannappel, Th., &#38; Visbeck, S.
    (1999). GaP(001) and InP(001): Reflectance anisotropy and surface geometry. <i>Journal
    of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>,
    <i>17</i>(4), Article 1691. <a href="https://doi.org/10.1116/1.590810">https://doi.org/10.1116/1.590810</a>'
  bibtex: '@article{Esser_Schmidt_Bernholc_Frisch_Vogt_Zorn_Pristovsek_Richter_Bechstedt_Hannappel_et
    al._1999, title={GaP(001) and InP(001): Reflectance anisotropy and surface geometry},
    volume={17}, DOI={<a href="https://doi.org/10.1116/1.590810">10.1116/1.590810</a>},
    number={41691}, journal={Journal of Vacuum Science &#38; Technology B: Microelectronics
    and Nanometer Structures}, author={Esser, N. and Schmidt, Wolf Gero and Bernholc,
    J. and Frisch, A. M. and Vogt, P. and Zorn, M. and Pristovsek, M. and Richter,
    W. and Bechstedt, F. and Hannappel, Th. and et al.}, year={1999} }'
  chicago: 'Esser, N., Wolf Gero Schmidt, J. Bernholc, A. M. Frisch, P. Vogt, M. Zorn,
    M. Pristovsek, et al. “GaP(001) and InP(001): Reflectance Anisotropy and Surface
    Geometry.” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and
    Nanometer Structures</i> 17, no. 4 (1999). <a href="https://doi.org/10.1116/1.590810">https://doi.org/10.1116/1.590810</a>.'
  ieee: 'N. Esser <i>et al.</i>, “GaP(001) and InP(001): Reflectance anisotropy and
    surface geometry,” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics
    and Nanometer Structures</i>, vol. 17, no. 4, Art. no. 1691, 1999, doi: <a href="https://doi.org/10.1116/1.590810">10.1116/1.590810</a>.'
  mla: 'Esser, N., et al. “GaP(001) and InP(001): Reflectance Anisotropy and Surface
    Geometry.” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and
    Nanometer Structures</i>, vol. 17, no. 4, 1691, 1999, doi:<a href="https://doi.org/10.1116/1.590810">10.1116/1.590810</a>.'
  short: 'N. Esser, W.G. Schmidt, J. Bernholc, A.M. Frisch, P. Vogt, M. Zorn, M. Pristovsek,
    W. Richter, F. Bechstedt, Th. Hannappel, S. Visbeck, Journal of Vacuum Science
    &#38; Technology B: Microelectronics and Nanometer Structures 17 (1999).'
date_created: 2019-10-10T13:02:11Z
date_updated: 2025-12-16T07:13:57Z
department:
- _id: '15'
- _id: '170'
- _id: '295'
- _id: '35'
- _id: '230'
doi: 10.1116/1.590810
funded_apc: '1'
intvolume: '        17'
issue: '4'
language:
- iso: eng
publication: 'Journal of Vacuum Science & Technology B: Microelectronics and Nanometer
  Structures'
publication_identifier:
  issn:
  - 0734-211X
publication_status: published
status: public
title: 'GaP(001) and InP(001): Reflectance anisotropy and surface geometry'
type: journal_article
user_id: '16199'
volume: 17
year: '1999'
...