[{"language":[{"iso":"eng"}],"_id":"24240","article_number":"055104","user_id":"464","doi":"10.1063/1.5133438","author":[{"full_name":"Rasche, David B.","last_name":"Rasche","first_name":"David B."},{"full_name":"Tigges, Lena","first_name":"Lena","last_name":"Tigges"},{"full_name":"Schmid, Hans-Joachim","last_name":"Schmid","first_name":"Hans-Joachim"}],"publication_identifier":{"issn":["0034-6748","1089-7623"]},"status":"public","title":"An apparatus to synthesize ceramic nanoparticles with a precisely adjusted temperature history and a significant mass output","year":"2020","publication_status":"published","date_updated":"2022-01-06T06:56:13Z","date_created":"2021-09-13T08:49:58Z","type":"journal_article","citation":{"bibtex":"@article{Rasche_Tigges_Schmid_2020, title={An apparatus to synthesize ceramic nanoparticles with a precisely adjusted temperature history and a significant mass output}, DOI={<a href=\"https://doi.org/10.1063/1.5133438\">10.1063/1.5133438</a>}, number={055104}, journal={Review of Scientific Instruments}, author={Rasche, David B. and Tigges, Lena and Schmid, Hans-Joachim}, year={2020} }","ama":"Rasche DB, Tigges L, Schmid H-J. An apparatus to synthesize ceramic nanoparticles with a precisely adjusted temperature history and a significant mass output. <i>Review of Scientific Instruments</i>. Published online 2020. doi:<a href=\"https://doi.org/10.1063/1.5133438\">10.1063/1.5133438</a>","mla":"Rasche, David B., et al. “An Apparatus to Synthesize Ceramic Nanoparticles with a Precisely Adjusted Temperature History and a Significant Mass Output.” <i>Review of Scientific Instruments</i>, 055104, 2020, doi:<a href=\"https://doi.org/10.1063/1.5133438\">10.1063/1.5133438</a>.","short":"D.B. Rasche, L. Tigges, H.-J. Schmid, Review of Scientific Instruments (2020).","chicago":"Rasche, David B., Lena Tigges, and Hans-Joachim Schmid. “An Apparatus to Synthesize Ceramic Nanoparticles with a Precisely Adjusted Temperature History and a Significant Mass Output.” <i>Review of Scientific Instruments</i>, 2020. <a href=\"https://doi.org/10.1063/1.5133438\">https://doi.org/10.1063/1.5133438</a>.","ieee":"D. B. Rasche, L. Tigges, and H.-J. Schmid, “An apparatus to synthesize ceramic nanoparticles with a precisely adjusted temperature history and a significant mass output,” <i>Review of Scientific Instruments</i>, Art. no. 055104, 2020, doi: <a href=\"https://doi.org/10.1063/1.5133438\">10.1063/1.5133438</a>.","apa":"Rasche, D. B., Tigges, L., &#38; Schmid, H.-J. (2020). An apparatus to synthesize ceramic nanoparticles with a precisely adjusted temperature history and a significant mass output. <i>Review of Scientific Instruments</i>, Article 055104. <a href=\"https://doi.org/10.1063/1.5133438\">https://doi.org/10.1063/1.5133438</a>"},"publication":"Review of Scientific Instruments"},{"user_id":"26263","volume":91,"_id":"37935","publisher":"AIP Publishing","status":"public","citation":{"mla":"Meyer-Scott, Evan, et al. “Single-Photon Sources: Approaching the Ideal through           Multiplexing.” <i>Review of Scientific Instruments</i>, vol. 91, no. 4, 041101, AIP Publishing, 2020, doi:<a href=\"https://doi.org/10.1063/5.0003320\">10.1063/5.0003320</a>.","bibtex":"@article{Meyer-Scott_Silberhorn_Migdall_2020, title={Single-photon sources: Approaching the ideal through           multiplexing}, volume={91}, DOI={<a href=\"https://doi.org/10.1063/5.0003320\">10.1063/5.0003320</a>}, number={4041101}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Meyer-Scott, Evan and Silberhorn, Christine and Migdall, Alan}, year={2020} }","ama":"Meyer-Scott E, Silberhorn C, Migdall A. Single-photon sources: Approaching the ideal through           multiplexing. <i>Review of Scientific Instruments</i>. 2020;91(4). doi:<a href=\"https://doi.org/10.1063/5.0003320\">10.1063/5.0003320</a>","ieee":"E. Meyer-Scott, C. Silberhorn, and A. Migdall, “Single-photon sources: Approaching the ideal through           multiplexing,” <i>Review of Scientific Instruments</i>, vol. 91, no. 4, Art. no. 041101, 2020, doi: <a href=\"https://doi.org/10.1063/5.0003320\">10.1063/5.0003320</a>.","apa":"Meyer-Scott, E., Silberhorn, C., &#38; Migdall, A. (2020). Single-photon sources: Approaching the ideal through           multiplexing. <i>Review of Scientific Instruments</i>, <i>91</i>(4), Article 041101. <a href=\"https://doi.org/10.1063/5.0003320\">https://doi.org/10.1063/5.0003320</a>","short":"E. Meyer-Scott, C. Silberhorn, A. Migdall, Review of Scientific Instruments 91 (2020).","chicago":"Meyer-Scott, Evan, Christine Silberhorn, and Alan Migdall. “Single-Photon Sources: Approaching the Ideal through           Multiplexing.” <i>Review of Scientific Instruments</i> 91, no. 4 (2020). <a href=\"https://doi.org/10.1063/5.0003320\">https://doi.org/10.1063/5.0003320</a>."},"doi":"10.1063/5.0003320","article_number":"041101","language":[{"iso":"eng"}],"publication_status":"published","date_updated":"2023-01-30T11:12:47Z","intvolume":"        91","year":"2020","title":"Single-photon sources: Approaching the ideal through           multiplexing","publication_identifier":{"issn":["0034-6748","1089-7623"]},"author":[{"full_name":"Meyer-Scott, Evan","last_name":"Meyer-Scott","first_name":"Evan"},{"full_name":"Silberhorn, Christine","last_name":"Silberhorn","first_name":"Christine","id":"26263"},{"full_name":"Migdall, Alan","last_name":"Migdall","first_name":"Alan"}],"keyword":["Instrumentation"],"type":"journal_article","department":[{"_id":"288"},{"_id":"15"},{"_id":"623"},{"_id":"230"}],"date_created":"2023-01-22T17:43:25Z","publication":"Review of Scientific Instruments","issue":"4"},{"_id":"13166","language":[{"iso":"eng"}],"article_number":"054903","user_id":"15164","doi":"10.1063/1.4921478","publication_identifier":{"issn":["0034-6748","1089-7623"]},"author":[{"full_name":"Dubberke, Frithjof H.","last_name":"Dubberke","first_name":"Frithjof H."},{"id":"15164","last_name":"Baumhögger","first_name":"Elmar","full_name":"Baumhögger, Elmar"},{"full_name":"Vrabec, Jadran","last_name":"Vrabec","first_name":"Jadran"}],"year":"2015","title":"Burst design and signal processing for the speed of sound measurement of fluids with the pulse-echo technique","status":"public","publication_status":"published","date_updated":"2022-01-06T06:51:29Z","date_created":"2019-09-09T15:19:16Z","department":[{"_id":"155"}],"type":"journal_article","citation":{"mla":"Dubberke, Frithjof H., et al. “Burst Design and Signal Processing for the Speed of Sound Measurement of Fluids with the Pulse-Echo Technique.” <i>Review of Scientific Instruments</i>, 054903, 2015, doi:<a href=\"https://doi.org/10.1063/1.4921478\">10.1063/1.4921478</a>.","ama":"Dubberke FH, Baumhögger E, Vrabec J. Burst design and signal processing for the speed of sound measurement of fluids with the pulse-echo technique. <i>Review of Scientific Instruments</i>. 2015. doi:<a href=\"https://doi.org/10.1063/1.4921478\">10.1063/1.4921478</a>","bibtex":"@article{Dubberke_Baumhögger_Vrabec_2015, title={Burst design and signal processing for the speed of sound measurement of fluids with the pulse-echo technique}, DOI={<a href=\"https://doi.org/10.1063/1.4921478\">10.1063/1.4921478</a>}, number={054903}, journal={Review of Scientific Instruments}, author={Dubberke, Frithjof H. and Baumhögger, Elmar and Vrabec, Jadran}, year={2015} }","apa":"Dubberke, F. H., Baumhögger, E., &#38; Vrabec, J. (2015). Burst design and signal processing for the speed of sound measurement of fluids with the pulse-echo technique. <i>Review of Scientific Instruments</i>. <a href=\"https://doi.org/10.1063/1.4921478\">https://doi.org/10.1063/1.4921478</a>","ieee":"F. H. Dubberke, E. Baumhögger, and J. Vrabec, “Burst design and signal processing for the speed of sound measurement of fluids with the pulse-echo technique,” <i>Review of Scientific Instruments</i>, 2015.","short":"F.H. Dubberke, E. Baumhögger, J. Vrabec, Review of Scientific Instruments (2015).","chicago":"Dubberke, Frithjof H., Elmar Baumhögger, and Jadran Vrabec. “Burst Design and Signal Processing for the Speed of Sound Measurement of Fluids with the Pulse-Echo Technique.” <i>Review of Scientific Instruments</i>, 2015. <a href=\"https://doi.org/10.1063/1.4921478\">https://doi.org/10.1063/1.4921478</a>."},"publication":"Review of Scientific Instruments"},{"date_updated":"2023-01-24T08:19:23Z","publication_status":"published","author":[{"last_name":"Marcak","first_name":"Adrian","full_name":"Marcak, Adrian"},{"last_name":"Corbella","first_name":"Carles","full_name":"Corbella, Carles"},{"id":"54556","last_name":"de los Arcos de Pedro","first_name":"Maria Teresa","full_name":"de los Arcos de Pedro, Maria Teresa"},{"full_name":"von Keudell, Achim","last_name":"von Keudell","first_name":"Achim"}],"publication_identifier":{"issn":["0034-6748","1089-7623"]},"title":"Note: Ion-induced secondary electron emission from oxidized metal surfaces measured in a particle beam reactor","year":"2015","status":"public","doi":"10.1063/1.4932309","user_id":"54556","_id":"22581","language":[{"iso":"eng"}],"article_number":"106102","citation":{"chicago":"Marcak, Adrian, Carles Corbella, Maria Teresa de los Arcos de Pedro, and Achim von Keudell. “Note: Ion-Induced Secondary Electron Emission from Oxidized Metal Surfaces Measured in a Particle Beam Reactor.” <i>Review of Scientific Instruments</i>, 2015. <a href=\"https://doi.org/10.1063/1.4932309\">https://doi.org/10.1063/1.4932309</a>.","short":"A. Marcak, C. Corbella, M.T. de los Arcos de Pedro, A. von Keudell, Review of Scientific Instruments (2015).","ieee":"A. Marcak, C. Corbella, M. T. de los Arcos de Pedro, and A. von Keudell, “Note: Ion-induced secondary electron emission from oxidized metal surfaces measured in a particle beam reactor,” <i>Review of Scientific Instruments</i>, Art. no. 106102, 2015, doi: <a href=\"https://doi.org/10.1063/1.4932309\">10.1063/1.4932309</a>.","apa":"Marcak, A., Corbella, C., de los Arcos de Pedro, M. T., &#38; von Keudell, A. (2015). Note: Ion-induced secondary electron emission from oxidized metal surfaces measured in a particle beam reactor. <i>Review of Scientific Instruments</i>, Article 106102. <a href=\"https://doi.org/10.1063/1.4932309\">https://doi.org/10.1063/1.4932309</a>","bibtex":"@article{Marcak_Corbella_de los Arcos de Pedro_von Keudell_2015, title={Note: Ion-induced secondary electron emission from oxidized metal surfaces measured in a particle beam reactor}, DOI={<a href=\"https://doi.org/10.1063/1.4932309\">10.1063/1.4932309</a>}, number={106102}, journal={Review of Scientific Instruments}, author={Marcak, Adrian and Corbella, Carles and de los Arcos de Pedro, Maria Teresa and von Keudell, Achim}, year={2015} }","ama":"Marcak A, Corbella C, de los Arcos de Pedro MT, von Keudell A. Note: Ion-induced secondary electron emission from oxidized metal surfaces measured in a particle beam reactor. <i>Review of Scientific Instruments</i>. Published online 2015. doi:<a href=\"https://doi.org/10.1063/1.4932309\">10.1063/1.4932309</a>","mla":"Marcak, Adrian, et al. “Note: Ion-Induced Secondary Electron Emission from Oxidized Metal Surfaces Measured in a Particle Beam Reactor.” <i>Review of Scientific Instruments</i>, 106102, 2015, doi:<a href=\"https://doi.org/10.1063/1.4932309\">10.1063/1.4932309</a>."},"publication":"Review of Scientific Instruments","department":[{"_id":"302"}],"type":"journal_article","date_created":"2021-07-07T09:15:01Z"},{"article_number":"084901","_id":"13168","language":[{"iso":"eng"}],"user_id":"15164","doi":"10.1063/1.4891795","title":"Apparatus for the measurement of the speed of sound of ammonia up to high temperatures and pressures","year":"2014","status":"public","author":[{"full_name":"Dubberke, Frithjof H.","last_name":"Dubberke","first_name":"Frithjof H."},{"last_name":"Rasche","first_name":"David B.","full_name":"Rasche, David B."},{"id":"15164","full_name":"Baumhögger, Elmar","first_name":"Elmar","last_name":"Baumhögger"},{"full_name":"Vrabec, Jadran","last_name":"Vrabec","first_name":"Jadran"}],"publication_identifier":{"issn":["0034-6748","1089-7623"]},"publication_status":"published","date_updated":"2022-01-06T06:51:29Z","date_created":"2019-09-09T15:21:15Z","type":"journal_article","department":[{"_id":"155"}],"publication":"Review of Scientific Instruments","citation":{"apa":"Dubberke, F. H., Rasche, D. B., Baumhögger, E., &#38; Vrabec, J. (2014). Apparatus for the measurement of the speed of sound of ammonia up to high temperatures and pressures. <i>Review of Scientific Instruments</i>. <a href=\"https://doi.org/10.1063/1.4891795\">https://doi.org/10.1063/1.4891795</a>","ieee":"F. H. Dubberke, D. B. Rasche, E. Baumhögger, and J. Vrabec, “Apparatus for the measurement of the speed of sound of ammonia up to high temperatures and pressures,” <i>Review of Scientific Instruments</i>, 2014.","chicago":"Dubberke, Frithjof H., David B. Rasche, Elmar Baumhögger, and Jadran Vrabec. “Apparatus for the Measurement of the Speed of Sound of Ammonia up to High Temperatures and Pressures.” <i>Review of Scientific Instruments</i>, 2014. <a href=\"https://doi.org/10.1063/1.4891795\">https://doi.org/10.1063/1.4891795</a>.","short":"F.H. Dubberke, D.B. Rasche, E. Baumhögger, J. Vrabec, Review of Scientific Instruments (2014).","mla":"Dubberke, Frithjof H., et al. “Apparatus for the Measurement of the Speed of Sound of Ammonia up to High Temperatures and Pressures.” <i>Review of Scientific Instruments</i>, 084901, 2014, doi:<a href=\"https://doi.org/10.1063/1.4891795\">10.1063/1.4891795</a>.","ama":"Dubberke FH, Rasche DB, Baumhögger E, Vrabec J. Apparatus for the measurement of the speed of sound of ammonia up to high temperatures and pressures. <i>Review of Scientific Instruments</i>. 2014. doi:<a href=\"https://doi.org/10.1063/1.4891795\">10.1063/1.4891795</a>","bibtex":"@article{Dubberke_Rasche_Baumhögger_Vrabec_2014, title={Apparatus for the measurement of the speed of sound of ammonia up to high temperatures and pressures}, DOI={<a href=\"https://doi.org/10.1063/1.4891795\">10.1063/1.4891795</a>}, number={084901}, journal={Review of Scientific Instruments}, author={Dubberke, Frithjof H. and Rasche, David B. and Baumhögger, Elmar and Vrabec, Jadran}, year={2014} }"}},{"volume":84,"user_id":"42514","_id":"7264","publisher":"AIP Publishing","status":"public","citation":{"apa":"Wortmann, M., Ludwig, A., Meijer, J., Reuter, D., &#38; Wieck, A. D. (2013). High-resolution mass spectrometer for liquid metal ion sources. <i>Review of Scientific Instruments</i>, <i>84</i>(9). <a href=\"https://doi.org/10.1063/1.4822275\">https://doi.org/10.1063/1.4822275</a>","ieee":"M. Wortmann, A. Ludwig, J. Meijer, D. Reuter, and A. D. Wieck, “High-resolution mass spectrometer for liquid metal ion sources,” <i>Review of Scientific Instruments</i>, vol. 84, no. 9, 2013.","short":"M. Wortmann, A. Ludwig, J. Meijer, D. Reuter, A.D. Wieck, Review of Scientific Instruments 84 (2013).","chicago":"Wortmann, Martin, Arne Ludwig, Jan Meijer, Dirk Reuter, and Andreas D. Wieck. “High-Resolution Mass Spectrometer for Liquid Metal Ion Sources.” <i>Review of Scientific Instruments</i> 84, no. 9 (2013). <a href=\"https://doi.org/10.1063/1.4822275\">https://doi.org/10.1063/1.4822275</a>.","mla":"Wortmann, Martin, et al. “High-Resolution Mass Spectrometer for Liquid Metal Ion Sources.” <i>Review of Scientific Instruments</i>, vol. 84, no. 9, 093305, AIP Publishing, 2013, doi:<a href=\"https://doi.org/10.1063/1.4822275\">10.1063/1.4822275</a>.","ama":"Wortmann M, Ludwig A, Meijer J, Reuter D, Wieck AD. High-resolution mass spectrometer for liquid metal ion sources. <i>Review of Scientific Instruments</i>. 2013;84(9). doi:<a href=\"https://doi.org/10.1063/1.4822275\">10.1063/1.4822275</a>","bibtex":"@article{Wortmann_Ludwig_Meijer_Reuter_Wieck_2013, title={High-resolution mass spectrometer for liquid metal ion sources}, volume={84}, DOI={<a href=\"https://doi.org/10.1063/1.4822275\">10.1063/1.4822275</a>}, number={9093305}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Wortmann, Martin and Ludwig, Arne and Meijer, Jan and Reuter, Dirk and Wieck, Andreas D.}, year={2013} }"},"doi":"10.1063/1.4822275","language":[{"iso":"eng"}],"article_number":"093305","intvolume":"        84","publication_status":"published","date_updated":"2022-01-06T07:03:31Z","publication_identifier":{"issn":["0034-6748","1089-7623"]},"author":[{"full_name":"Wortmann, Martin","first_name":"Martin","last_name":"Wortmann"},{"last_name":"Ludwig","first_name":"Arne","full_name":"Ludwig, Arne"},{"first_name":"Jan","last_name":"Meijer","full_name":"Meijer, Jan"},{"first_name":"Dirk","last_name":"Reuter","full_name":"Reuter, Dirk","id":"37763"},{"last_name":"Wieck","first_name":"Andreas D.","full_name":"Wieck, Andreas D."}],"year":"2013","title":"High-resolution mass spectrometer for liquid metal ion sources","department":[{"_id":"15"},{"_id":"230"}],"type":"journal_article","date_created":"2019-01-30T13:13:29Z","publication":"Review of Scientific Instruments","issue":"9"},{"volume":84,"user_id":"42514","_id":"7267","publisher":"AIP Publishing","status":"public","citation":{"ama":"Kuhlmann AV, Houel J, Brunner D, et al. A dark-field microscope for background-free detection of resonance fluorescence from single semiconductor quantum dots operating in a set-and-forget mode. <i>Review of Scientific Instruments</i>. 2013;84(7). doi:<a href=\"https://doi.org/10.1063/1.4813879\">10.1063/1.4813879</a>","bibtex":"@article{Kuhlmann_Houel_Brunner_Ludwig_Reuter_Wieck_Warburton_2013, title={A dark-field microscope for background-free detection of resonance fluorescence from single semiconductor quantum dots operating in a set-and-forget mode}, volume={84}, DOI={<a href=\"https://doi.org/10.1063/1.4813879\">10.1063/1.4813879</a>}, number={7073905}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Kuhlmann, Andreas V. and Houel, Julien and Brunner, Daniel and Ludwig, Arne and Reuter, Dirk and Wieck, Andreas D. and Warburton, Richard J.}, year={2013} }","mla":"Kuhlmann, Andreas V., et al. “A Dark-Field Microscope for Background-Free Detection of Resonance Fluorescence from Single Semiconductor Quantum Dots Operating in a Set-and-Forget Mode.” <i>Review of Scientific Instruments</i>, vol. 84, no. 7, 073905, AIP Publishing, 2013, doi:<a href=\"https://doi.org/10.1063/1.4813879\">10.1063/1.4813879</a>.","short":"A.V. Kuhlmann, J. Houel, D. Brunner, A. Ludwig, D. Reuter, A.D. Wieck, R.J. Warburton, Review of Scientific Instruments 84 (2013).","chicago":"Kuhlmann, Andreas V., Julien Houel, Daniel Brunner, Arne Ludwig, Dirk Reuter, Andreas D. Wieck, and Richard J. Warburton. “A Dark-Field Microscope for Background-Free Detection of Resonance Fluorescence from Single Semiconductor Quantum Dots Operating in a Set-and-Forget Mode.” <i>Review of Scientific Instruments</i> 84, no. 7 (2013). <a href=\"https://doi.org/10.1063/1.4813879\">https://doi.org/10.1063/1.4813879</a>.","apa":"Kuhlmann, A. V., Houel, J., Brunner, D., Ludwig, A., Reuter, D., Wieck, A. D., &#38; Warburton, R. J. (2013). A dark-field microscope for background-free detection of resonance fluorescence from single semiconductor quantum dots operating in a set-and-forget mode. <i>Review of Scientific Instruments</i>, <i>84</i>(7). <a href=\"https://doi.org/10.1063/1.4813879\">https://doi.org/10.1063/1.4813879</a>","ieee":"A. V. Kuhlmann <i>et al.</i>, “A dark-field microscope for background-free detection of resonance fluorescence from single semiconductor quantum dots operating in a set-and-forget mode,” <i>Review of Scientific Instruments</i>, vol. 84, no. 7, 2013."},"doi":"10.1063/1.4813879","language":[{"iso":"eng"}],"article_number":"073905","intvolume":"        84","publication_status":"published","date_updated":"2022-01-06T07:03:31Z","author":[{"last_name":"Kuhlmann","first_name":"Andreas V.","full_name":"Kuhlmann, Andreas V."},{"first_name":"Julien","last_name":"Houel","full_name":"Houel, Julien"},{"first_name":"Daniel","last_name":"Brunner","full_name":"Brunner, Daniel"},{"first_name":"Arne","last_name":"Ludwig","full_name":"Ludwig, Arne"},{"full_name":"Reuter, Dirk","first_name":"Dirk","last_name":"Reuter","id":"37763"},{"full_name":"Wieck, Andreas D.","last_name":"Wieck","first_name":"Andreas D."},{"full_name":"Warburton, Richard J.","first_name":"Richard J.","last_name":"Warburton"}],"publication_identifier":{"issn":["0034-6748","1089-7623"]},"title":"A dark-field microscope for background-free detection of resonance fluorescence from single semiconductor quantum dots operating in a set-and-forget mode","year":"2013","department":[{"_id":"15"},{"_id":"230"}],"type":"journal_article","date_created":"2019-01-30T13:16:44Z","issue":"7","publication":"Review of Scientific Instruments"},{"doi":"10.1063/1.4826066","user_id":"54556","article_number":"103303","_id":"22591","language":[{"iso":"eng"}],"date_updated":"2023-01-24T08:22:42Z","publication_status":"published","status":"public","title":"Particle beam experiments for the analysis of reactive sputtering processes in metals and polymer surfaces","year":"2013","publication_identifier":{"issn":["0034-6748","1089-7623"]},"author":[{"first_name":"Carles","last_name":"Corbella","full_name":"Corbella, Carles"},{"full_name":"Grosse-Kreul, Simon","last_name":"Grosse-Kreul","first_name":"Simon"},{"full_name":"Kreiter, Oliver","last_name":"Kreiter","first_name":"Oliver"},{"id":"54556","full_name":"de los Arcos de Pedro, Maria Teresa","last_name":"de los Arcos de Pedro","first_name":"Maria Teresa"},{"full_name":"Benedikt, Jan","first_name":"Jan","last_name":"Benedikt"},{"full_name":"von Keudell, Achim","last_name":"von Keudell","first_name":"Achim"}],"type":"journal_article","department":[{"_id":"302"}],"date_created":"2021-07-07T11:12:42Z","extern":"1","publication":"Review of Scientific Instruments","citation":{"chicago":"Corbella, Carles, Simon Grosse-Kreul, Oliver Kreiter, Maria Teresa de los Arcos de Pedro, Jan Benedikt, and Achim von Keudell. “Particle Beam Experiments for the Analysis of Reactive Sputtering Processes in Metals and Polymer Surfaces.” <i>Review of Scientific Instruments</i>, 2013. <a href=\"https://doi.org/10.1063/1.4826066\">https://doi.org/10.1063/1.4826066</a>.","short":"C. Corbella, S. Grosse-Kreul, O. Kreiter, M.T. de los Arcos de Pedro, J. Benedikt, A. von Keudell, Review of Scientific Instruments (2013).","apa":"Corbella, C., Grosse-Kreul, S., Kreiter, O., de los Arcos de Pedro, M. T., Benedikt, J., &#38; von Keudell, A. (2013). Particle beam experiments for the analysis of reactive sputtering processes in metals and polymer surfaces. <i>Review of Scientific Instruments</i>, Article 103303. <a href=\"https://doi.org/10.1063/1.4826066\">https://doi.org/10.1063/1.4826066</a>","ieee":"C. Corbella, S. Grosse-Kreul, O. Kreiter, M. T. de los Arcos de Pedro, J. Benedikt, and A. von Keudell, “Particle beam experiments for the analysis of reactive sputtering processes in metals and polymer surfaces,” <i>Review of Scientific Instruments</i>, Art. no. 103303, 2013, doi: <a href=\"https://doi.org/10.1063/1.4826066\">10.1063/1.4826066</a>.","ama":"Corbella C, Grosse-Kreul S, Kreiter O, de los Arcos de Pedro MT, Benedikt J, von Keudell A. Particle beam experiments for the analysis of reactive sputtering processes in metals and polymer surfaces. <i>Review of Scientific Instruments</i>. Published online 2013. doi:<a href=\"https://doi.org/10.1063/1.4826066\">10.1063/1.4826066</a>","bibtex":"@article{Corbella_Grosse-Kreul_Kreiter_de los Arcos de Pedro_Benedikt_von Keudell_2013, title={Particle beam experiments for the analysis of reactive sputtering processes in metals and polymer surfaces}, DOI={<a href=\"https://doi.org/10.1063/1.4826066\">10.1063/1.4826066</a>}, number={103303}, journal={Review of Scientific Instruments}, author={Corbella, Carles and Grosse-Kreul, Simon and Kreiter, Oliver and de los Arcos de Pedro, Maria Teresa and Benedikt, Jan and von Keudell, Achim}, year={2013} }","mla":"Corbella, Carles, et al. “Particle Beam Experiments for the Analysis of Reactive Sputtering Processes in Metals and Polymer Surfaces.” <i>Review of Scientific Instruments</i>, 103303, 2013, doi:<a href=\"https://doi.org/10.1063/1.4826066\">10.1063/1.4826066</a>."}},{"status":"public","_id":"7708","publisher":"AIP Publishing","volume":82,"user_id":"42514","citation":{"ieee":"M. Sladkov, M. P. Bakker, A. U. Chaubal, D. Reuter, A. D. Wieck, and C. H. van der Wal, “Polarization-preserving confocal microscope for optical experiments in a dilution refrigerator with high magnetic field,” <i>Review of Scientific Instruments</i>, vol. 82, no. 4, 2011.","apa":"Sladkov, M., Bakker, M. P., Chaubal, A. U., Reuter, D., Wieck, A. D., &#38; van der Wal, C. H. (2011). Polarization-preserving confocal microscope for optical experiments in a dilution refrigerator with high magnetic field. <i>Review of Scientific Instruments</i>, <i>82</i>(4). <a href=\"https://doi.org/10.1063/1.3574217\">https://doi.org/10.1063/1.3574217</a>","chicago":"Sladkov, Maksym, M. P. Bakker, A. U. Chaubal, Dirk Reuter, A. D. Wieck, and C. H. van der Wal. “Polarization-Preserving Confocal Microscope for Optical Experiments in a Dilution Refrigerator with High Magnetic Field.” <i>Review of Scientific Instruments</i> 82, no. 4 (2011). <a href=\"https://doi.org/10.1063/1.3574217\">https://doi.org/10.1063/1.3574217</a>.","short":"M. Sladkov, M.P. Bakker, A.U. Chaubal, D. Reuter, A.D. Wieck, C.H. van der Wal, Review of Scientific Instruments 82 (2011).","mla":"Sladkov, Maksym, et al. “Polarization-Preserving Confocal Microscope for Optical Experiments in a Dilution Refrigerator with High Magnetic Field.” <i>Review of Scientific Instruments</i>, vol. 82, no. 4, 043105, AIP Publishing, 2011, doi:<a href=\"https://doi.org/10.1063/1.3574217\">10.1063/1.3574217</a>.","bibtex":"@article{Sladkov_Bakker_Chaubal_Reuter_Wieck_van der Wal_2011, title={Polarization-preserving confocal microscope for optical experiments in a dilution refrigerator with high magnetic field}, volume={82}, DOI={<a href=\"https://doi.org/10.1063/1.3574217\">10.1063/1.3574217</a>}, number={4043105}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Sladkov, Maksym and Bakker, M. P. and Chaubal, A. U. and Reuter, Dirk and Wieck, A. D. and van der Wal, C. H.}, year={2011} }","ama":"Sladkov M, Bakker MP, Chaubal AU, Reuter D, Wieck AD, van der Wal CH. Polarization-preserving confocal microscope for optical experiments in a dilution refrigerator with high magnetic field. <i>Review of Scientific Instruments</i>. 2011;82(4). doi:<a href=\"https://doi.org/10.1063/1.3574217\">10.1063/1.3574217</a>"},"author":[{"last_name":"Sladkov","first_name":"Maksym","full_name":"Sladkov, Maksym"},{"first_name":"M. P.","last_name":"Bakker","full_name":"Bakker, M. P."},{"first_name":"A. U.","last_name":"Chaubal","full_name":"Chaubal, A. U."},{"full_name":"Reuter, Dirk","last_name":"Reuter","first_name":"Dirk","id":"37763"},{"full_name":"Wieck, A. D.","first_name":"A. D.","last_name":"Wieck"},{"first_name":"C. H.","last_name":"van der Wal","full_name":"van der Wal, C. H."}],"publication_identifier":{"issn":["0034-6748","1089-7623"]},"year":"2011","title":"Polarization-preserving confocal microscope for optical experiments in a dilution refrigerator with high magnetic field","intvolume":"        82","publication_status":"published","date_updated":"2022-01-06T07:03:45Z","language":[{"iso":"eng"}],"article_number":"043105","doi":"10.1063/1.3574217","issue":"4","publication":"Review of Scientific Instruments","date_created":"2019-02-14T10:25:11Z","department":[{"_id":"15"},{"_id":"230"}],"type":"journal_article"},{"language":[{"iso":"eng"}],"_id":"8612","article_number":"123904","user_id":"42514","doi":"10.1063/1.3046283","publication_identifier":{"issn":["0034-6748","1089-7623"]},"author":[{"first_name":"P. J.","last_name":"Rizo","full_name":"Rizo, P. J."},{"full_name":"Pugžlys, A.","last_name":"Pugžlys","first_name":"A."},{"last_name":"Liu","first_name":"J.","full_name":"Liu, J."},{"full_name":"Reuter, Dirk","first_name":"Dirk","last_name":"Reuter","id":"37763"},{"full_name":"Wieck, A. D.","first_name":"A. D.","last_name":"Wieck"},{"first_name":"C. H.","last_name":"van der Wal","full_name":"van der Wal, C. H."},{"full_name":"van Loosdrecht, P. H. M.","last_name":"van Loosdrecht","first_name":"P. H. M."}],"title":"Compact cryogenic Kerr microscope for time-resolved studies of electron spin transport in microstructures","status":"public","year":"2008","publication_status":"published","date_updated":"2022-01-06T07:03:57Z","date_created":"2019-03-26T09:58:52Z","department":[{"_id":"15"},{"_id":"230"}],"type":"journal_article","citation":{"ieee":"P. J. Rizo <i>et al.</i>, “Compact cryogenic Kerr microscope for time-resolved studies of electron spin transport in microstructures,” <i>Review of Scientific Instruments</i>, 2008.","apa":"Rizo, P. J., Pugžlys, A., Liu, J., Reuter, D., Wieck, A. D., van der Wal, C. H., &#38; van Loosdrecht, P. H. M. (2008). Compact cryogenic Kerr microscope for time-resolved studies of electron spin transport in microstructures. <i>Review of Scientific Instruments</i>. <a href=\"https://doi.org/10.1063/1.3046283\">https://doi.org/10.1063/1.3046283</a>","short":"P.J. Rizo, A. Pugžlys, J. Liu, D. Reuter, A.D. Wieck, C.H. van der Wal, P.H.M. van Loosdrecht, Review of Scientific Instruments (2008).","chicago":"Rizo, P. J., A. Pugžlys, J. Liu, Dirk Reuter, A. D. Wieck, C. H. van der Wal, and P. H. M. van Loosdrecht. “Compact Cryogenic Kerr Microscope for Time-Resolved Studies of Electron Spin Transport in Microstructures.” <i>Review of Scientific Instruments</i>, 2008. <a href=\"https://doi.org/10.1063/1.3046283\">https://doi.org/10.1063/1.3046283</a>.","mla":"Rizo, P. J., et al. “Compact Cryogenic Kerr Microscope for Time-Resolved Studies of Electron Spin Transport in Microstructures.” <i>Review of Scientific Instruments</i>, 123904, 2008, doi:<a href=\"https://doi.org/10.1063/1.3046283\">10.1063/1.3046283</a>.","bibtex":"@article{Rizo_Pugžlys_Liu_Reuter_Wieck_van der Wal_van Loosdrecht_2008, title={Compact cryogenic Kerr microscope for time-resolved studies of electron spin transport in microstructures}, DOI={<a href=\"https://doi.org/10.1063/1.3046283\">10.1063/1.3046283</a>}, number={123904}, journal={Review of Scientific Instruments}, author={Rizo, P. J. and Pugžlys, A. and Liu, J. and Reuter, Dirk and Wieck, A. D. and van der Wal, C. H. and van Loosdrecht, P. H. M.}, year={2008} }","ama":"Rizo PJ, Pugžlys A, Liu J, et al. Compact cryogenic Kerr microscope for time-resolved studies of electron spin transport in microstructures. <i>Review of Scientific Instruments</i>. 2008. doi:<a href=\"https://doi.org/10.1063/1.3046283\">10.1063/1.3046283</a>"},"publication":"Review of Scientific Instruments"},{"page":"4833-4840","language":[{"iso":"eng"}],"_id":"26154","user_id":"70093","doi":"10.1063/1.1809258","volume":75,"title":"Reactor system for the study of high-temperature short-time sintering of nanoparticles","status":"public","year":"2004","author":[{"full_name":"Kirchhof, Martin J.","last_name":"Kirchhof","first_name":"Martin J."},{"last_name":"Schmid","first_name":"Hans-Joachim","full_name":"Schmid, Hans-Joachim","id":"464"},{"full_name":"Peukert, Wolfgang","last_name":"Peukert","first_name":"Wolfgang"}],"publication_identifier":{"issn":["0034-6748","1089-7623"]},"publication_status":"published","date_updated":"2022-01-06T06:57:17Z","intvolume":"        75","date_created":"2021-10-13T16:13:56Z","type":"journal_article","issue":"11","publication":"Review of Scientific Instruments","citation":{"chicago":"Kirchhof, Martin J., Hans-Joachim Schmid, and Wolfgang Peukert. “Reactor System for the Study of High-Temperature Short-Time Sintering of Nanoparticles.” <i>Review of Scientific Instruments</i> 75, no. 11 (2004): 4833–40. <a href=\"https://doi.org/10.1063/1.1809258\">https://doi.org/10.1063/1.1809258</a>.","short":"M.J. Kirchhof, H.-J. Schmid, W. Peukert, Review of Scientific Instruments 75 (2004) 4833–4840.","apa":"Kirchhof, M. J., Schmid, H.-J., &#38; Peukert, W. (2004). Reactor system for the study of high-temperature short-time sintering of nanoparticles. <i>Review of Scientific Instruments</i>, <i>75</i>(11), 4833–4840. <a href=\"https://doi.org/10.1063/1.1809258\">https://doi.org/10.1063/1.1809258</a>","ieee":"M. J. Kirchhof, H.-J. Schmid, and W. Peukert, “Reactor system for the study of high-temperature short-time sintering of nanoparticles,” <i>Review of Scientific Instruments</i>, vol. 75, no. 11, pp. 4833–4840, 2004, doi: <a href=\"https://doi.org/10.1063/1.1809258\">10.1063/1.1809258</a>.","ama":"Kirchhof MJ, Schmid H-J, Peukert W. Reactor system for the study of high-temperature short-time sintering of nanoparticles. <i>Review of Scientific Instruments</i>. 2004;75(11):4833-4840. doi:<a href=\"https://doi.org/10.1063/1.1809258\">10.1063/1.1809258</a>","bibtex":"@article{Kirchhof_Schmid_Peukert_2004, title={Reactor system for the study of high-temperature short-time sintering of nanoparticles}, volume={75}, DOI={<a href=\"https://doi.org/10.1063/1.1809258\">10.1063/1.1809258</a>}, number={11}, journal={Review of Scientific Instruments}, author={Kirchhof, Martin J. and Schmid, Hans-Joachim and Peukert, Wolfgang}, year={2004}, pages={4833–4840} }","mla":"Kirchhof, Martin J., et al. “Reactor System for the Study of High-Temperature Short-Time Sintering of Nanoparticles.” <i>Review of Scientific Instruments</i>, vol. 75, no. 11, 2004, pp. 4833–40, doi:<a href=\"https://doi.org/10.1063/1.1809258\">10.1063/1.1809258</a>."},"abstract":[{"text":"A high-temperature short residence time flow reactor system has been realized for the investigation of the gas phase sintering kinetics of nanoparticles separated from all other synthesis mechanisms, e.g., chemical reaction, nucleation, coagulation and condensation. Major components are a hot-wall tubular reactor for the production of unsintered aggregates consisting of spherical primary particles in the size range 10–80 nm and a sintering reactor for the investigation of the sintering kinetics at well-defined temperature and residence time history. Therefore, rapid heating and quenching of the particles at the beginning and at the end of the reaction zone, respectively, is maintained. Main parameters in the sintering reactor are: temperatures up to 1873 K and residence times in the range 8–1000 ms. The reactor conditions are characterized by temperature profile measurements with a newly constructed suction thermocouple probe and by computational fluid dynamics simulations of the residence time distributions. Exemplary results of the sintering of silica nanoparticles obtained by transmission electron microscopy analysis are presented.","lang":"eng"}]},{"page":"3435-3438","_id":"8779","language":[{"iso":"eng"}],"doi":"10.1063/1.1149933","user_id":"42514","status":"public","title":"A compact electron beam evaporator for carbon doping in solid source molecular beam epitaxy","year":"2002","publication_identifier":{"issn":["0034-6748","1089-7623"]},"author":[{"id":"37763","first_name":"Dirk","last_name":"Reuter","full_name":"Reuter, Dirk"},{"first_name":"A. D.","last_name":"Wieck","full_name":"Wieck, A. D."},{"last_name":"Fischer","first_name":"A.","full_name":"Fischer, A."}],"date_updated":"2022-01-06T07:04:00Z","publication_status":"published","date_created":"2019-04-01T08:27:04Z","type":"journal_article","department":[{"_id":"15"},{"_id":"230"}],"publication":"Review of Scientific Instruments","citation":{"mla":"Reuter, Dirk, et al. “A Compact Electron Beam Evaporator for Carbon Doping in Solid Source Molecular Beam Epitaxy.” <i>Review of Scientific Instruments</i>, 2002, pp. 3435–38, doi:<a href=\"https://doi.org/10.1063/1.1149933\">10.1063/1.1149933</a>.","ama":"Reuter D, Wieck AD, Fischer A. A compact electron beam evaporator for carbon doping in solid source molecular beam epitaxy. <i>Review of Scientific Instruments</i>. 2002:3435-3438. doi:<a href=\"https://doi.org/10.1063/1.1149933\">10.1063/1.1149933</a>","bibtex":"@article{Reuter_Wieck_Fischer_2002, title={A compact electron beam evaporator for carbon doping in solid source molecular beam epitaxy}, DOI={<a href=\"https://doi.org/10.1063/1.1149933\">10.1063/1.1149933</a>}, journal={Review of Scientific Instruments}, author={Reuter, Dirk and Wieck, A. D. and Fischer, A.}, year={2002}, pages={3435–3438} }","apa":"Reuter, D., Wieck, A. D., &#38; Fischer, A. (2002). A compact electron beam evaporator for carbon doping in solid source molecular beam epitaxy. <i>Review of Scientific Instruments</i>, 3435–3438. <a href=\"https://doi.org/10.1063/1.1149933\">https://doi.org/10.1063/1.1149933</a>","ieee":"D. Reuter, A. D. Wieck, and A. Fischer, “A compact electron beam evaporator for carbon doping in solid source molecular beam epitaxy,” <i>Review of Scientific Instruments</i>, pp. 3435–3438, 2002.","chicago":"Reuter, Dirk, A. D. Wieck, and A. Fischer. “A Compact Electron Beam Evaporator for Carbon Doping in Solid Source Molecular Beam Epitaxy.” <i>Review of Scientific Instruments</i>, 2002, 3435–38. <a href=\"https://doi.org/10.1063/1.1149933\">https://doi.org/10.1063/1.1149933</a>.","short":"D. Reuter, A.D. Wieck, A. Fischer, Review of Scientific Instruments (2002) 3435–3438."}},{"publication":"Review of Scientific Instruments","citation":{"ama":"Reuter D, Wieck AD, Fischer A. A compact electron beam evaporator for carbon doping in solid source molecular beam epitaxy. <i>Review of Scientific Instruments</i>. 2002:3435-3438. doi:<a href=\"https://doi.org/10.1063/1.1149933\">10.1063/1.1149933</a>","bibtex":"@article{Reuter_Wieck_Fischer_2002, title={A compact electron beam evaporator for carbon doping in solid source molecular beam epitaxy}, DOI={<a href=\"https://doi.org/10.1063/1.1149933\">10.1063/1.1149933</a>}, journal={Review of Scientific Instruments}, author={Reuter, Dirk and Wieck, A. D. and Fischer, A.}, year={2002}, pages={3435–3438} }","mla":"Reuter, Dirk, et al. “A Compact Electron Beam Evaporator for Carbon Doping in Solid Source Molecular Beam Epitaxy.” <i>Review of Scientific Instruments</i>, 2002, pp. 3435–38, doi:<a href=\"https://doi.org/10.1063/1.1149933\">10.1063/1.1149933</a>.","chicago":"Reuter, Dirk, A. D. Wieck, and A. Fischer. “A Compact Electron Beam Evaporator for Carbon Doping in Solid Source Molecular Beam Epitaxy.” <i>Review of Scientific Instruments</i>, 2002, 3435–38. <a href=\"https://doi.org/10.1063/1.1149933\">https://doi.org/10.1063/1.1149933</a>.","short":"D. Reuter, A.D. Wieck, A. Fischer, Review of Scientific Instruments (2002) 3435–3438.","apa":"Reuter, D., Wieck, A. D., &#38; Fischer, A. (2002). A compact electron beam evaporator for carbon doping in solid source molecular beam epitaxy. <i>Review of Scientific Instruments</i>, 3435–3438. <a href=\"https://doi.org/10.1063/1.1149933\">https://doi.org/10.1063/1.1149933</a>","ieee":"D. Reuter, A. D. Wieck, and A. Fischer, “A compact electron beam evaporator for carbon doping in solid source molecular beam epitaxy,” <i>Review of Scientific Instruments</i>, pp. 3435–3438, 2002."},"type":"journal_article","department":[{"_id":"15"},{"_id":"230"}],"date_created":"2019-04-01T08:28:09Z","date_updated":"2022-01-06T07:04:00Z","publication_status":"published","year":"2002","status":"public","title":"A compact electron beam evaporator for carbon doping in solid source molecular beam epitaxy","publication_identifier":{"issn":["0034-6748","1089-7623"]},"author":[{"id":"37763","full_name":"Reuter, Dirk","first_name":"Dirk","last_name":"Reuter"},{"first_name":"A. D.","last_name":"Wieck","full_name":"Wieck, A. D."},{"full_name":"Fischer, A.","last_name":"Fischer","first_name":"A."}],"doi":"10.1063/1.1149933","user_id":"42514","page":"3435-3438","language":[{"iso":"eng"}],"_id":"8780"},{"author":[{"first_name":"Th.","last_name":"Röder","full_name":"Röder, Th."},{"first_name":"L.","last_name":"Paelke","full_name":"Paelke, L."},{"full_name":"Held, N.","last_name":"Held","first_name":"N."},{"last_name":"Vinzelberg","first_name":"S.","full_name":"Vinzelberg, S."},{"id":"254","full_name":"Kitzerow, Heinz-Siegfried","first_name":"Heinz-Siegfried","last_name":"Kitzerow"}],"publication_identifier":{"issn":["0034-6748","1089-7623"]},"title":"Imaging of liquid crystals using a new scanning near-field optical microscope with microfabricated tips and shear force detection","year":"2002","intvolume":"        71","publication_status":"published","date_updated":"2023-01-24T19:24:17Z","language":[{"iso":"eng"}],"doi":"10.1063/1.1150688","publication":"Review of Scientific Instruments","issue":"7","date_created":"2023-01-24T19:23:50Z","department":[{"_id":"313"},{"_id":"638"}],"type":"journal_article","keyword":["Instrumentation"],"status":"public","_id":"39780","publisher":"AIP Publishing","page":"2759-2764","volume":71,"user_id":"254","citation":{"chicago":"Röder, Th., L. Paelke, N. Held, S. Vinzelberg, and Heinz-Siegfried Kitzerow. “Imaging of Liquid Crystals Using a New Scanning Near-Field Optical Microscope with Microfabricated Tips and Shear Force Detection.” <i>Review of Scientific Instruments</i> 71, no. 7 (2002): 2759–64. <a href=\"https://doi.org/10.1063/1.1150688\">https://doi.org/10.1063/1.1150688</a>.","short":"Th. Röder, L. Paelke, N. Held, S. Vinzelberg, H.-S. Kitzerow, Review of Scientific Instruments 71 (2002) 2759–2764.","ieee":"Th. Röder, L. Paelke, N. Held, S. Vinzelberg, and H.-S. Kitzerow, “Imaging of liquid crystals using a new scanning near-field optical microscope with microfabricated tips and shear force detection,” <i>Review of Scientific Instruments</i>, vol. 71, no. 7, pp. 2759–2764, 2002, doi: <a href=\"https://doi.org/10.1063/1.1150688\">10.1063/1.1150688</a>.","apa":"Röder, Th., Paelke, L., Held, N., Vinzelberg, S., &#38; Kitzerow, H.-S. (2002). Imaging of liquid crystals using a new scanning near-field optical microscope with microfabricated tips and shear force detection. <i>Review of Scientific Instruments</i>, <i>71</i>(7), 2759–2764. <a href=\"https://doi.org/10.1063/1.1150688\">https://doi.org/10.1063/1.1150688</a>","bibtex":"@article{Röder_Paelke_Held_Vinzelberg_Kitzerow_2002, title={Imaging of liquid crystals using a new scanning near-field optical microscope with microfabricated tips and shear force detection}, volume={71}, DOI={<a href=\"https://doi.org/10.1063/1.1150688\">10.1063/1.1150688</a>}, number={7}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Röder, Th. and Paelke, L. and Held, N. and Vinzelberg, S. and Kitzerow, Heinz-Siegfried}, year={2002}, pages={2759–2764} }","ama":"Röder Th, Paelke L, Held N, Vinzelberg S, Kitzerow H-S. Imaging of liquid crystals using a new scanning near-field optical microscope with microfabricated tips and shear force detection. <i>Review of Scientific Instruments</i>. 2002;71(7):2759-2764. doi:<a href=\"https://doi.org/10.1063/1.1150688\">10.1063/1.1150688</a>","mla":"Röder, Th., et al. “Imaging of Liquid Crystals Using a New Scanning Near-Field Optical Microscope with Microfabricated Tips and Shear Force Detection.” <i>Review of Scientific Instruments</i>, vol. 71, no. 7, AIP Publishing, 2002, pp. 2759–64, doi:<a href=\"https://doi.org/10.1063/1.1150688\">10.1063/1.1150688</a>."}},{"publication":"Review of Scientific Instruments","issue":"7","department":[{"_id":"313"},{"_id":"638"}],"keyword":["Instrumentation"],"type":"journal_article","date_created":"2023-01-25T16:39:07Z","intvolume":"        71","date_updated":"2023-01-25T16:41:04Z","publication_status":"published","publication_identifier":{"issn":["0034-6748","1089-7623"]},"author":[{"full_name":"Röder, Th.","first_name":"Th.","last_name":"Röder"},{"full_name":"Paelke, L.","first_name":"L.","last_name":"Paelke"},{"last_name":"Held","first_name":"N.","full_name":"Held, N."},{"last_name":"Vinzelberg","first_name":"S.","full_name":"Vinzelberg, S."},{"id":"254","full_name":"Kitzerow, Heinz-Siegfried","last_name":"Kitzerow","first_name":"Heinz-Siegfried"}],"title":"Imaging of liquid crystals using a new scanning near-field optical microscope with microfabricated tips and shear force detection","year":"2000","doi":"10.1063/1.1150688","language":[{"iso":"eng"}],"citation":{"bibtex":"@article{Röder_Paelke_Held_Vinzelberg_Kitzerow_2000, title={Imaging of liquid crystals using a new scanning near-field optical microscope with microfabricated tips and shear force detection}, volume={71}, DOI={<a href=\"https://doi.org/10.1063/1.1150688\">10.1063/1.1150688</a>}, number={7}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Röder, Th. and Paelke, L. and Held, N. and Vinzelberg, S. and Kitzerow, Heinz-Siegfried}, year={2000}, pages={2759–2764} }","ama":"Röder Th, Paelke L, Held N, Vinzelberg S, Kitzerow H-S. Imaging of liquid crystals using a new scanning near-field optical microscope with microfabricated tips and shear force detection. <i>Review of Scientific Instruments</i>. 2000;71(7):2759-2764. doi:<a href=\"https://doi.org/10.1063/1.1150688\">10.1063/1.1150688</a>","mla":"Röder, Th., et al. “Imaging of Liquid Crystals Using a New Scanning Near-Field Optical Microscope with Microfabricated Tips and Shear Force Detection.” <i>Review of Scientific Instruments</i>, vol. 71, no. 7, AIP Publishing, 2000, pp. 2759–64, doi:<a href=\"https://doi.org/10.1063/1.1150688\">10.1063/1.1150688</a>.","chicago":"Röder, Th., L. Paelke, N. Held, S. Vinzelberg, and Heinz-Siegfried Kitzerow. “Imaging of Liquid Crystals Using a New Scanning Near-Field Optical Microscope with Microfabricated Tips and Shear Force Detection.” <i>Review of Scientific Instruments</i> 71, no. 7 (2000): 2759–64. <a href=\"https://doi.org/10.1063/1.1150688\">https://doi.org/10.1063/1.1150688</a>.","short":"Th. Röder, L. Paelke, N. Held, S. Vinzelberg, H.-S. Kitzerow, Review of Scientific Instruments 71 (2000) 2759–2764.","ieee":"Th. Röder, L. Paelke, N. Held, S. Vinzelberg, and H.-S. Kitzerow, “Imaging of liquid crystals using a new scanning near-field optical microscope with microfabricated tips and shear force detection,” <i>Review of Scientific Instruments</i>, vol. 71, no. 7, pp. 2759–2764, 2000, doi: <a href=\"https://doi.org/10.1063/1.1150688\">10.1063/1.1150688</a>.","apa":"Röder, Th., Paelke, L., Held, N., Vinzelberg, S., &#38; Kitzerow, H.-S. (2000). Imaging of liquid crystals using a new scanning near-field optical microscope with microfabricated tips and shear force detection. <i>Review of Scientific Instruments</i>, <i>71</i>(7), 2759–2764. <a href=\"https://doi.org/10.1063/1.1150688\">https://doi.org/10.1063/1.1150688</a>"},"status":"public","volume":71,"user_id":"254","publisher":"AIP Publishing","_id":"40084","page":"2759-2764"}]