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Published online 2009:353-374. doi:<a href=\"https://doi.org/10.1080/10589750802588002\">10.1080/10589750802588002</a>","bibtex":"@article{Sauerland_Mahnken_2009, title={Deformation analysis for thermal shock using optical sensors and constitutive modelling}, DOI={<a href=\"https://doi.org/10.1080/10589750802588002\">10.1080/10589750802588002</a>}, journal={Nondestructive Testing and Evaluation}, author={Sauerland, Kim-Henning and Mahnken, Rolf}, year={2009}, pages={353–374} }","apa":"Sauerland, K.-H., &#38; Mahnken, R. (2009). Deformation analysis for thermal shock using optical sensors and constitutive modelling. <i>Nondestructive Testing and Evaluation</i>, 353–374. <a href=\"https://doi.org/10.1080/10589750802588002\">https://doi.org/10.1080/10589750802588002</a>","ieee":"K.-H. Sauerland and R. Mahnken, “Deformation analysis for thermal shock using optical sensors and constitutive modelling,” <i>Nondestructive Testing and Evaluation</i>, pp. 353–374, 2009, doi: <a href=\"https://doi.org/10.1080/10589750802588002\">10.1080/10589750802588002</a>.","chicago":"Sauerland, Kim-Henning, and Rolf Mahnken. “Deformation Analysis for Thermal Shock Using Optical Sensors and Constitutive Modelling.” <i>Nondestructive Testing and Evaluation</i>, 2009, 353–74. <a href=\"https://doi.org/10.1080/10589750802588002\">https://doi.org/10.1080/10589750802588002</a>.","short":"K.-H. Sauerland, R. Mahnken, Nondestructive Testing and Evaluation (2009) 353–374."},"quality_controlled":"1","date_created":"2021-10-15T10:31:29Z","type":"journal_article","department":[{"_id":"9"},{"_id":"154"}],"status":"public","title":"Deformation analysis for thermal shock using optical sensors and constitutive modelling","year":"2009","author":[{"last_name":"Sauerland","first_name":"Kim-Henning","full_name":"Sauerland, Kim-Henning"},{"full_name":"Mahnken, Rolf","last_name":"Mahnken","first_name":"Rolf","id":"335"}],"publication_identifier":{"issn":["1058-9759","1477-2671"]},"date_updated":"2023-01-25T14:27:48Z","publication_status":"published","page":"353-374","_id":"26257","language":[{"iso":"eng"}],"doi":"10.1080/10589750802588002","user_id":"335"},{"language":[{"iso":"eng"}],"_id":"26258","page":"3-18","doi":"10.1080/10589750802195451","user_id":"335","author":[{"full_name":"Sauerland, Kim-Henning","last_name":"Sauerland","first_name":"Kim-Henning"},{"first_name":"Franz-Barthold","last_name":"Gockel","full_name":"Gockel, Franz-Barthold"},{"id":"335","full_name":"Mahnken, Rolf","first_name":"Rolf","last_name":"Mahnken"},{"last_name":"Ferber","first_name":"Ferdinand","full_name":"Ferber, Ferdinand"}],"publication_identifier":{"issn":["1058-9759","1477-2671"]},"title":"Damage analysis under thermal shock loading using eddy current sensors","status":"public","year":"2008","date_updated":"2023-01-25T14:29:30Z","publication_status":"published","date_created":"2021-10-15T10:32:01Z","department":[{"_id":"9"},{"_id":"154"}],"type":"journal_article","citation":{"chicago":"Sauerland, Kim-Henning, Franz-Barthold Gockel, Rolf Mahnken, and Ferdinand Ferber. “Damage Analysis under Thermal Shock Loading Using Eddy Current Sensors.” <i>Nondestructive Testing and Evaluation</i>, 2008, 3–18. <a href=\"https://doi.org/10.1080/10589750802195451\">https://doi.org/10.1080/10589750802195451</a>.","short":"K.-H. Sauerland, F.-B. Gockel, R. Mahnken, F. Ferber, Nondestructive Testing and Evaluation (2008) 3–18.","ieee":"K.-H. Sauerland, F.-B. Gockel, R. Mahnken, and F. Ferber, “Damage analysis under thermal shock loading using eddy current sensors,” <i>Nondestructive Testing and Evaluation</i>, pp. 3–18, 2008, doi: <a href=\"https://doi.org/10.1080/10589750802195451\">10.1080/10589750802195451</a>.","apa":"Sauerland, K.-H., Gockel, F.-B., Mahnken, R., &#38; Ferber, F. (2008). Damage analysis under thermal shock loading using eddy current sensors. <i>Nondestructive Testing and Evaluation</i>, 3–18. <a href=\"https://doi.org/10.1080/10589750802195451\">https://doi.org/10.1080/10589750802195451</a>","bibtex":"@article{Sauerland_Gockel_Mahnken_Ferber_2008, title={Damage analysis under thermal shock loading using eddy current sensors}, DOI={<a href=\"https://doi.org/10.1080/10589750802195451\">10.1080/10589750802195451</a>}, journal={Nondestructive Testing and Evaluation}, author={Sauerland, Kim-Henning and Gockel, Franz-Barthold and Mahnken, Rolf and Ferber, Ferdinand}, year={2008}, pages={3–18} }","ama":"Sauerland K-H, Gockel F-B, Mahnken R, Ferber F. Damage analysis under thermal shock loading using eddy current sensors. <i>Nondestructive Testing and Evaluation</i>. Published online 2008:3-18. doi:<a href=\"https://doi.org/10.1080/10589750802195451\">10.1080/10589750802195451</a>","mla":"Sauerland, Kim-Henning, et al. “Damage Analysis under Thermal Shock Loading Using Eddy Current Sensors.” <i>Nondestructive Testing and Evaluation</i>, 2008, pp. 3–18, doi:<a href=\"https://doi.org/10.1080/10589750802195451\">10.1080/10589750802195451</a>."},"publication":"Nondestructive Testing and Evaluation","quality_controlled":"1"}]