---
_id: '29210'
abstract:
- lang: eng
text: This paper investigates an ultra-broadband sampling technique based on charge
sampling using an Integrate-and-Hold Circuit (IHC) and ultra-short integration
times. The charge sampling technique is mathematically analyzed in detail and
compared to conventional switched-capacitor sampling. The mathematical analysis
allows to predict the sampler bandwidth as well as the degradation of sampling
precision due to analog circuit impairments such as integrator gain error, integration
capacitor leakage, hold-mode droop, thermal noise, and clock jitter. Furthermore,
design, simulation, and measurement results of an ultra-broadband charge sampler
IC in SiGe BiCMOS technology are presented. The charge sampler IC achieves a 1dB
bandwidth of 70 GHz. A resolution of better than 5.9 effective number of bits
(ENOB) is measured from 0 to 70 GHz at a sampling rate of 5 GS/s. The results
suggest that charge sampling using an IHC is a viable concept for ultra-broadband
sampling.
author:
- first_name: Liang
full_name: Wu, Liang
id: '30401'
last_name: Wu
- first_name: J. Christoph
full_name: Scheytt, J. Christoph
id: '37144'
last_name: Scheytt
citation:
ama: 'Wu L, Scheytt JC. Analysis and Design of a Charge Sampler With 70-GHz 1-dB
Bandwidth in 130-nm SiGe BiCMOS. IEEE Transactions on Circuits and Systems
I: Regular Papers. 2021;68(9):3668-3681. doi:10.1109/tcsi.2021.3094428'
apa: 'Wu, L., & Scheytt, J. C. (2021). Analysis and Design of a Charge Sampler
With 70-GHz 1-dB Bandwidth in 130-nm SiGe BiCMOS. IEEE Transactions on Circuits
and Systems I: Regular Papers, 68(9), 3668–3681. https://doi.org/10.1109/tcsi.2021.3094428'
bibtex: '@article{Wu_Scheytt_2021, title={Analysis and Design of a Charge Sampler
With 70-GHz 1-dB Bandwidth in 130-nm SiGe BiCMOS}, volume={68}, DOI={10.1109/tcsi.2021.3094428},
number={9}, journal={IEEE Transactions on Circuits and Systems I: Regular Papers},
publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Wu,
Liang and Scheytt, J. Christoph}, year={2021}, pages={3668–3681} }'
chicago: 'Wu, Liang, and J. Christoph Scheytt. “Analysis and Design of a Charge
Sampler With 70-GHz 1-DB Bandwidth in 130-Nm SiGe BiCMOS.” IEEE Transactions
on Circuits and Systems I: Regular Papers 68, no. 9 (2021): 3668–81. https://doi.org/10.1109/tcsi.2021.3094428.'
ieee: 'L. Wu and J. C. Scheytt, “Analysis and Design of a Charge Sampler With 70-GHz
1-dB Bandwidth in 130-nm SiGe BiCMOS,” IEEE Transactions on Circuits and Systems
I: Regular Papers, vol. 68, no. 9, pp. 3668–3681, 2021, doi: 10.1109/tcsi.2021.3094428.'
mla: 'Wu, Liang, and J. Christoph Scheytt. “Analysis and Design of a Charge Sampler
With 70-GHz 1-DB Bandwidth in 130-Nm SiGe BiCMOS.” IEEE Transactions on Circuits
and Systems I: Regular Papers, vol. 68, no. 9, Institute of Electrical and
Electronics Engineers (IEEE), 2021, pp. 3668–81, doi:10.1109/tcsi.2021.3094428.'
short: 'L. Wu, J.C. Scheytt, IEEE Transactions on Circuits and Systems I: Regular
Papers 68 (2021) 3668–3681.'
date_created: 2022-01-10T13:51:36Z
date_updated: 2022-01-10T13:53:08Z
department:
- _id: '58'
doi: 10.1109/tcsi.2021.3094428
intvolume: ' 68'
issue: '9'
keyword:
- Electrical and Electronic Engineering
language:
- iso: eng
page: 3668-3681
publication: 'IEEE Transactions on Circuits and Systems I: Regular Papers'
publication_identifier:
issn:
- 1549-8328
- 1558-0806
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
related_material:
link:
- relation: confirmation
url: https://ieeexplore.ieee.org/document/9482511/authors#authors
status: public
title: Analysis and Design of a Charge Sampler With 70-GHz 1-dB Bandwidth in 130-nm
SiGe BiCMOS
type: journal_article
user_id: '15931'
volume: 68
year: '2021'
...
---
_id: '39469'
author:
- first_name: Ehsan
full_name: Ali, Ehsan
last_name: Ali
- first_name: Christian
full_name: Hangmann, Christian
last_name: Hangmann
- first_name: Christian
full_name: Hedayat, Christian
last_name: Hedayat
- first_name: Fayrouz
full_name: Haddad, Fayrouz
last_name: Haddad
- first_name: Wenceslas
full_name: Rahajandraibe, Wenceslas
last_name: Rahajandraibe
- first_name: Ulrich
full_name: Hilleringmann, Ulrich
id: '20179'
last_name: Hilleringmann
citation:
ama: 'Ali E, Hangmann C, Hedayat C, Haddad F, Rahajandraibe W, Hilleringmann U.
Event Driven Modeling and Characterization of the Second Order Voltage Switched
Charge Pump PLL. IEEE Transactions on Circuits and Systems I: Regular Papers.
2016;63(3):347-358. doi:10.1109/tcsi.2015.2512759'
apa: 'Ali, E., Hangmann, C., Hedayat, C., Haddad, F., Rahajandraibe, W., & Hilleringmann,
U. (2016). Event Driven Modeling and Characterization of the Second Order Voltage
Switched Charge Pump PLL. IEEE Transactions on Circuits and Systems I: Regular
Papers, 63(3), 347–358. https://doi.org/10.1109/tcsi.2015.2512759'
bibtex: '@article{Ali_Hangmann_Hedayat_Haddad_Rahajandraibe_Hilleringmann_2016,
title={Event Driven Modeling and Characterization of the Second Order Voltage
Switched Charge Pump PLL}, volume={63}, DOI={10.1109/tcsi.2015.2512759},
number={3}, journal={IEEE Transactions on Circuits and Systems I: Regular Papers},
publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Ali,
Ehsan and Hangmann, Christian and Hedayat, Christian and Haddad, Fayrouz and Rahajandraibe,
Wenceslas and Hilleringmann, Ulrich}, year={2016}, pages={347–358} }'
chicago: 'Ali, Ehsan, Christian Hangmann, Christian Hedayat, Fayrouz Haddad, Wenceslas
Rahajandraibe, and Ulrich Hilleringmann. “Event Driven Modeling and Characterization
of the Second Order Voltage Switched Charge Pump PLL.” IEEE Transactions on
Circuits and Systems I: Regular Papers 63, no. 3 (2016): 347–58. https://doi.org/10.1109/tcsi.2015.2512759.'
ieee: 'E. Ali, C. Hangmann, C. Hedayat, F. Haddad, W. Rahajandraibe, and U. Hilleringmann,
“Event Driven Modeling and Characterization of the Second Order Voltage Switched
Charge Pump PLL,” IEEE Transactions on Circuits and Systems I: Regular Papers,
vol. 63, no. 3, pp. 347–358, 2016, doi: 10.1109/tcsi.2015.2512759.'
mla: 'Ali, Ehsan, et al. “Event Driven Modeling and Characterization of the Second
Order Voltage Switched Charge Pump PLL.” IEEE Transactions on Circuits and
Systems I: Regular Papers, vol. 63, no. 3, Institute of Electrical and Electronics
Engineers (IEEE), 2016, pp. 347–58, doi:10.1109/tcsi.2015.2512759.'
short: 'E. Ali, C. Hangmann, C. Hedayat, F. Haddad, W. Rahajandraibe, U. Hilleringmann,
IEEE Transactions on Circuits and Systems I: Regular Papers 63 (2016) 347–358.'
date_created: 2023-01-24T11:15:51Z
date_updated: 2023-03-21T10:10:36Z
department:
- _id: '59'
doi: 10.1109/tcsi.2015.2512759
intvolume: ' 63'
issue: '3'
keyword:
- Electrical and Electronic Engineering
language:
- iso: eng
page: 347-358
publication: 'IEEE Transactions on Circuits and Systems I: Regular Papers'
publication_identifier:
issn:
- 1549-8328
- 1558-0806
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: Event Driven Modeling and Characterization of the Second Order Voltage Switched
Charge Pump PLL
type: journal_article
user_id: '20179'
volume: 63
year: '2016'
...
---
_id: '39484'
author:
- first_name: Christian
full_name: Hangmann, Christian
last_name: Hangmann
- first_name: Christian
full_name: Hedayat, Christian
last_name: Hedayat
- first_name: Ulrich
full_name: Hilleringmann, Ulrich
id: '20179'
last_name: Hilleringmann
citation:
ama: 'Hangmann C, Hedayat C, Hilleringmann U. Stability Analysis of a Charge Pump
Phase-Locked Loop Using Autonomous Difference Equations. IEEE Transactions
on Circuits and Systems I: Regular Papers. 2014;61(9):2569-2577. doi:10.1109/tcsi.2014.2333331'
apa: 'Hangmann, C., Hedayat, C., & Hilleringmann, U. (2014). Stability Analysis
of a Charge Pump Phase-Locked Loop Using Autonomous Difference Equations. IEEE
Transactions on Circuits and Systems I: Regular Papers, 61(9), 2569–2577.
https://doi.org/10.1109/tcsi.2014.2333331'
bibtex: '@article{Hangmann_Hedayat_Hilleringmann_2014, title={Stability Analysis
of a Charge Pump Phase-Locked Loop Using Autonomous Difference Equations}, volume={61},
DOI={10.1109/tcsi.2014.2333331},
number={9}, journal={IEEE Transactions on Circuits and Systems I: Regular Papers},
publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Hangmann,
Christian and Hedayat, Christian and Hilleringmann, Ulrich}, year={2014}, pages={2569–2577}
}'
chicago: 'Hangmann, Christian, Christian Hedayat, and Ulrich Hilleringmann. “Stability
Analysis of a Charge Pump Phase-Locked Loop Using Autonomous Difference Equations.”
IEEE Transactions on Circuits and Systems I: Regular Papers 61, no. 9 (2014):
2569–77. https://doi.org/10.1109/tcsi.2014.2333331.'
ieee: 'C. Hangmann, C. Hedayat, and U. Hilleringmann, “Stability Analysis of a Charge
Pump Phase-Locked Loop Using Autonomous Difference Equations,” IEEE Transactions
on Circuits and Systems I: Regular Papers, vol. 61, no. 9, pp. 2569–2577,
2014, doi: 10.1109/tcsi.2014.2333331.'
mla: 'Hangmann, Christian, et al. “Stability Analysis of a Charge Pump Phase-Locked
Loop Using Autonomous Difference Equations.” IEEE Transactions on Circuits
and Systems I: Regular Papers, vol. 61, no. 9, Institute of Electrical and
Electronics Engineers (IEEE), 2014, pp. 2569–77, doi:10.1109/tcsi.2014.2333331.'
short: 'C. Hangmann, C. Hedayat, U. Hilleringmann, IEEE Transactions on Circuits
and Systems I: Regular Papers 61 (2014) 2569–2577.'
date_created: 2023-01-24T11:26:19Z
date_updated: 2023-03-22T10:15:23Z
department:
- _id: '59'
doi: 10.1109/tcsi.2014.2333331
intvolume: ' 61'
issue: '9'
keyword:
- Electrical and Electronic Engineering
language:
- iso: eng
page: 2569-2577
publication: 'IEEE Transactions on Circuits and Systems I: Regular Papers'
publication_identifier:
issn:
- 1549-8328
- 1558-0806
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: Stability Analysis of a Charge Pump Phase-Locked Loop Using Autonomous Difference
Equations
type: journal_article
user_id: '20179'
volume: 61
year: '2014'
...