---
_id: '39504'
author:
- first_name: F. F.
  full_name: Vidor, F. F.
  last_name: Vidor
- first_name: G.
  full_name: Wirth, G.
  last_name: Wirth
- first_name: F.
  full_name: Assion, F.
  last_name: Assion
- first_name: K.
  full_name: Wolff, K.
  last_name: Wolff
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  id: '20179'
  last_name: Hilleringmann
citation:
  ama: Vidor FF, Wirth G, Assion F, Wolff K, Hilleringmann U. Characterization and
    Analysis of the Hysteresis in a ZnO Nanoparticle Thin-Film Transistor. <i>IEEE
    Transactions on Nanotechnology</i>. 2013;12(3):296-303. doi:<a href="https://doi.org/10.1109/tnano.2012.2236891">10.1109/tnano.2012.2236891</a>
  apa: Vidor, F. F., Wirth, G., Assion, F., Wolff, K., &#38; Hilleringmann, U. (2013).
    Characterization and Analysis of the Hysteresis in a ZnO Nanoparticle Thin-Film
    Transistor. <i>IEEE Transactions on Nanotechnology</i>, <i>12</i>(3), 296–303.
    <a href="https://doi.org/10.1109/tnano.2012.2236891">https://doi.org/10.1109/tnano.2012.2236891</a>
  bibtex: '@article{Vidor_Wirth_Assion_Wolff_Hilleringmann_2013, title={Characterization
    and Analysis of the Hysteresis in a ZnO Nanoparticle Thin-Film Transistor}, volume={12},
    DOI={<a href="https://doi.org/10.1109/tnano.2012.2236891">10.1109/tnano.2012.2236891</a>},
    number={3}, journal={IEEE Transactions on Nanotechnology}, publisher={Institute
    of Electrical and Electronics Engineers (IEEE)}, author={Vidor, F. F. and Wirth,
    G. and Assion, F. and Wolff, K. and Hilleringmann, Ulrich}, year={2013}, pages={296–303}
    }'
  chicago: 'Vidor, F. F., G. Wirth, F. Assion, K. Wolff, and Ulrich Hilleringmann.
    “Characterization and Analysis of the Hysteresis in a ZnO Nanoparticle Thin-Film
    Transistor.” <i>IEEE Transactions on Nanotechnology</i> 12, no. 3 (2013): 296–303.
    <a href="https://doi.org/10.1109/tnano.2012.2236891">https://doi.org/10.1109/tnano.2012.2236891</a>.'
  ieee: 'F. F. Vidor, G. Wirth, F. Assion, K. Wolff, and U. Hilleringmann, “Characterization
    and Analysis of the Hysteresis in a ZnO Nanoparticle Thin-Film Transistor,” <i>IEEE
    Transactions on Nanotechnology</i>, vol. 12, no. 3, pp. 296–303, 2013, doi: <a
    href="https://doi.org/10.1109/tnano.2012.2236891">10.1109/tnano.2012.2236891</a>.'
  mla: Vidor, F. F., et al. “Characterization and Analysis of the Hysteresis in a
    ZnO Nanoparticle Thin-Film Transistor.” <i>IEEE Transactions on Nanotechnology</i>,
    vol. 12, no. 3, Institute of Electrical and Electronics Engineers (IEEE), 2013,
    pp. 296–303, doi:<a href="https://doi.org/10.1109/tnano.2012.2236891">10.1109/tnano.2012.2236891</a>.
  short: F.F. Vidor, G. Wirth, F. Assion, K. Wolff, U. Hilleringmann, IEEE Transactions
    on Nanotechnology 12 (2013) 296–303.
date_created: 2023-01-24T11:46:28Z
date_updated: 2023-03-22T10:09:49Z
department:
- _id: '59'
doi: 10.1109/tnano.2012.2236891
intvolume: '        12'
issue: '3'
keyword:
- Electrical and Electronic Engineering
- Computer Science Applications
language:
- iso: eng
page: 296-303
publication: IEEE Transactions on Nanotechnology
publication_identifier:
  issn:
  - 1536-125X
  - 1941-0085
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: Characterization and Analysis of the Hysteresis in a ZnO Nanoparticle Thin-Film
  Transistor
type: journal_article
user_id: '20179'
volume: 12
year: '2013'
...