---
_id: '41866'
author:
- first_name: Johannes A.
  full_name: Russer, Johannes A.
  last_name: Russer
- first_name: Nasir
  full_name: Uddin, Nasir
  last_name: Uddin
- first_name: Ahmed Sanaa
  full_name: Awny, Ahmed Sanaa
  last_name: Awny
- first_name: Andreas
  full_name: Thiede, Andreas
  id: '538'
  last_name: Thiede
- first_name: Peter
  full_name: Russer, Peter
  last_name: Russer
citation:
  ama: Russer JA, Uddin N, Awny AS, Thiede A, Russer P. Near-field measurement of
    stochastic electromagnetic fields. <i>IEEE Electromagnetic Compatibility Magazine</i>.
    2015;4(3):79-85. doi:<a href="https://doi.org/10.1109/memc.2015.7336761">10.1109/memc.2015.7336761</a>
  apa: Russer, J. A., Uddin, N., Awny, A. S., Thiede, A., &#38; Russer, P. (2015).
    Near-field measurement of stochastic electromagnetic fields. <i>IEEE Electromagnetic
    Compatibility Magazine</i>, <i>4</i>(3), 79–85. <a href="https://doi.org/10.1109/memc.2015.7336761">https://doi.org/10.1109/memc.2015.7336761</a>
  bibtex: '@article{Russer_Uddin_Awny_Thiede_Russer_2015, title={Near-field measurement
    of stochastic electromagnetic fields}, volume={4}, DOI={<a href="https://doi.org/10.1109/memc.2015.7336761">10.1109/memc.2015.7336761</a>},
    number={3}, journal={IEEE Electromagnetic Compatibility Magazine}, publisher={Institute
    of Electrical and Electronics Engineers (IEEE)}, author={Russer, Johannes A. and
    Uddin, Nasir and Awny, Ahmed Sanaa and Thiede, Andreas and Russer, Peter}, year={2015},
    pages={79–85} }'
  chicago: 'Russer, Johannes A., Nasir Uddin, Ahmed Sanaa Awny, Andreas Thiede, and
    Peter Russer. “Near-Field Measurement of Stochastic Electromagnetic Fields.” <i>IEEE
    Electromagnetic Compatibility Magazine</i> 4, no. 3 (2015): 79–85. <a href="https://doi.org/10.1109/memc.2015.7336761">https://doi.org/10.1109/memc.2015.7336761</a>.'
  ieee: 'J. A. Russer, N. Uddin, A. S. Awny, A. Thiede, and P. Russer, “Near-field
    measurement of stochastic electromagnetic fields,” <i>IEEE Electromagnetic Compatibility
    Magazine</i>, vol. 4, no. 3, pp. 79–85, 2015, doi: <a href="https://doi.org/10.1109/memc.2015.7336761">10.1109/memc.2015.7336761</a>.'
  mla: Russer, Johannes A., et al. “Near-Field Measurement of Stochastic Electromagnetic
    Fields.” <i>IEEE Electromagnetic Compatibility Magazine</i>, vol. 4, no. 3, Institute
    of Electrical and Electronics Engineers (IEEE), 2015, pp. 79–85, doi:<a href="https://doi.org/10.1109/memc.2015.7336761">10.1109/memc.2015.7336761</a>.
  short: J.A. Russer, N. Uddin, A.S. Awny, A. Thiede, P. Russer, IEEE Electromagnetic
    Compatibility Magazine 4 (2015) 79–85.
date_created: 2023-02-07T10:59:53Z
date_updated: 2023-02-07T11:00:56Z
department:
- _id: '51'
doi: 10.1109/memc.2015.7336761
intvolume: '         4'
issue: '3'
keyword:
- Electrical and Electronic Engineering
- Computer Networks and Communications
- Instrumentation
- Signal Processing
- Software
language:
- iso: eng
page: 79-85
publication: IEEE Electromagnetic Compatibility Magazine
publication_identifier:
  issn:
  - 2162-2264
  - 2162-2272
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: Near-field measurement of stochastic electromagnetic fields
type: journal_article
user_id: '77496'
volume: 4
year: '2015'
...