[{"abstract":[{"lang":"eng","text":"System-level interconnects provide the\r\nbackbone for increasingly complex systems on a chip. Their\r\nvulnerability to electromigration and crosstalk can lead to\r\nserious reliability and safety issues during the system lifetime.\r\nThis article presents an approach for periodic in-system testing\r\nwhich maintains a reliability profile to detect potential\r\nproblems before they actually cause a failure. Relying on a\r\ncommon infrastructure for EM-aware system workload\r\nmanagement and test, it minimizes the stress induced by the\r\ntest itself and contributes to the self-healing of system-induced\r\nelectromigration degradations. "}],"publication":"IEEE Design &Test","department":[{"_id":"48"}],"keyword":["Electrical and Electronic Engineering","Hardware and Architecture","Software"],"type":"journal_article","date_created":"2023-08-02T11:07:43Z","article_type":"original","date_updated":"2024-03-22T17:15:10Z","publication_status":"published","author":[{"id":"78614","last_name":"Sadeghi-Kohan","orcid":"https://orcid.org/0000-0001-7246-0610","first_name":"Somayeh","full_name":"Sadeghi-Kohan, Somayeh"},{"last_name":"Hellebrand","orcid":"0000-0002-3717-3939","first_name":"Sybille","full_name":"Hellebrand, Sybille","id":"209"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"}],"publication_identifier":{"issn":["2168-2356","2168-2364"]},"title":"Workload-Aware Periodic Interconnect BIST","year":"2023","doi":"10.1109/mdat.2023.3298849","language":[{"iso":"eng"}],"main_file_link":[{"url":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10194315"}],"citation":{"apa":"Sadeghi-Kohan, S., Hellebrand, S., &#38; Wunderlich, H.-J. (2023). Workload-Aware Periodic Interconnect BIST. <i>IEEE Design &#38;Test</i>, 1–1. <a href=\"https://doi.org/10.1109/mdat.2023.3298849\">https://doi.org/10.1109/mdat.2023.3298849</a>","ieee":"S. Sadeghi-Kohan, S. Hellebrand, and H.-J. Wunderlich, “Workload-Aware Periodic Interconnect BIST,” <i>IEEE Design &#38;Test</i>, pp. 1–1, 2023, doi: <a href=\"https://doi.org/10.1109/mdat.2023.3298849\">10.1109/mdat.2023.3298849</a>.","chicago":"Sadeghi-Kohan, Somayeh, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Workload-Aware Periodic Interconnect BIST.” <i>IEEE Design &#38;Test</i>, 2023, 1–1. <a href=\"https://doi.org/10.1109/mdat.2023.3298849\">https://doi.org/10.1109/mdat.2023.3298849</a>.","short":"S. Sadeghi-Kohan, S. Hellebrand, H.-J. Wunderlich, IEEE Design &#38;Test (2023) 1–1.","mla":"Sadeghi-Kohan, Somayeh, et al. “Workload-Aware Periodic Interconnect BIST.” <i>IEEE Design &#38;Test</i>, Institute of Electrical and Electronics Engineers (IEEE), 2023, pp. 1–1, doi:<a href=\"https://doi.org/10.1109/mdat.2023.3298849\">10.1109/mdat.2023.3298849</a>.","ama":"Sadeghi-Kohan S, Hellebrand S, Wunderlich H-J. Workload-Aware Periodic Interconnect BIST. <i>IEEE Design &#38;Test</i>. Published online 2023:1-1. doi:<a href=\"https://doi.org/10.1109/mdat.2023.3298849\">10.1109/mdat.2023.3298849</a>","bibtex":"@article{Sadeghi-Kohan_Hellebrand_Wunderlich_2023, title={Workload-Aware Periodic Interconnect BIST}, DOI={<a href=\"https://doi.org/10.1109/mdat.2023.3298849\">10.1109/mdat.2023.3298849</a>}, journal={IEEE Design &#38;Test}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2023}, pages={1–1} }"},"status":"public","user_id":"209","_id":"46264","publisher":"Institute of Electrical and Electronics Engineers (IEEE)","page":"1-1"},{"page":"39-46","publisher":"Institute of Electrical and Electronics Engineers (IEEE)","_id":"66229","doi":"10.1109/mdat.2020.3012085","user_id":"128464","volume":37,"title":"Project-Based CPS Education: A Case Study of an Autonomous Driving Student Project","year":"2020","status":"public","publication_identifier":{"issn":["2168-2356","2168-2364"]},"author":[{"full_name":"Ueter, Niklas","last_name":"Ueter","first_name":"Niklas"},{"full_name":"Chen, Kuan-Hsun","last_name":"Chen","first_name":"Kuan-Hsun"},{"last_name":"Chen","first_name":"Jian-Jia","full_name":"Chen, Jian-Jia"}],"date_updated":"2026-07-05T14:44:37Z","publication_status":"published","intvolume":"        37","date_created":"2026-07-03T21:23:49Z","type":"journal_article","publication":"IEEE Design &amp; Test","issue":"6","citation":{"mla":"Ueter, Niklas, et al. “Project-Based CPS Education: A Case Study of an Autonomous Driving Student Project.” <i>IEEE Design &#38;amp; Test</i>, vol. 37, no. 6, Institute of Electrical and Electronics Engineers (IEEE), 2020, pp. 39–46, doi:<a href=\"https://doi.org/10.1109/mdat.2020.3012085\">10.1109/mdat.2020.3012085</a>.","bibtex":"@article{Ueter_Chen_Chen_2020, title={Project-Based CPS Education: A Case Study of an Autonomous Driving Student Project}, volume={37}, DOI={<a href=\"https://doi.org/10.1109/mdat.2020.3012085\">10.1109/mdat.2020.3012085</a>}, number={6}, journal={IEEE Design &#38;amp; Test}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Ueter, Niklas and Chen, Kuan-Hsun and Chen, Jian-Jia}, year={2020}, pages={39–46} }","ama":"Ueter N, Chen K-H, Chen J-J. Project-Based CPS Education: A Case Study of an Autonomous Driving Student Project. <i>IEEE Design &#38;amp; Test</i>. 2020;37(6):39-46. doi:<a href=\"https://doi.org/10.1109/mdat.2020.3012085\">10.1109/mdat.2020.3012085</a>","ieee":"N. Ueter, K.-H. Chen, and J.-J. Chen, “Project-Based CPS Education: A Case Study of an Autonomous Driving Student Project,” <i>IEEE Design &#38;amp; Test</i>, vol. 37, no. 6, pp. 39–46, 2020, doi: <a href=\"https://doi.org/10.1109/mdat.2020.3012085\">10.1109/mdat.2020.3012085</a>.","apa":"Ueter, N., Chen, K.-H., &#38; Chen, J.-J. (2020). Project-Based CPS Education: A Case Study of an Autonomous Driving Student Project. <i>IEEE Design &#38;amp; Test</i>, <i>37</i>(6), 39–46. <a href=\"https://doi.org/10.1109/mdat.2020.3012085\">https://doi.org/10.1109/mdat.2020.3012085</a>","short":"N. Ueter, K.-H. Chen, J.-J. Chen, IEEE Design &#38;amp; Test 37 (2020) 39–46.","chicago":"Ueter, Niklas, Kuan-Hsun Chen, and Jian-Jia Chen. “Project-Based CPS Education: A Case Study of an Autonomous Driving Student Project.” <i>IEEE Design &#38;amp; Test</i> 37, no. 6 (2020): 39–46. <a href=\"https://doi.org/10.1109/mdat.2020.3012085\">https://doi.org/10.1109/mdat.2020.3012085</a>."}}]