---
_id: '46264'
abstract:
- lang: eng
  text: "System-level interconnects provide the\r\nbackbone for increasingly complex
    systems on a chip. Their\r\nvulnerability to electromigration and crosstalk can
    lead to\r\nserious reliability and safety issues during the system lifetime.\r\nThis
    article presents an approach for periodic in-system testing\r\nwhich maintains
    a reliability profile to detect potential\r\nproblems before they actually cause
    a failure. Relying on a\r\ncommon infrastructure for EM-aware system workload\r\nmanagement
    and test, it minimizes the stress induced by the\r\ntest itself and contributes
    to the self-healing of system-induced\r\nelectromigration degradations. "
article_type: original
author:
- first_name: Somayeh
  full_name: Sadeghi-Kohan, Somayeh
  id: '78614'
  last_name: Sadeghi-Kohan
  orcid: https://orcid.org/0000-0001-7246-0610
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
citation:
  ama: Sadeghi-Kohan S, Hellebrand S, Wunderlich H-J. Workload-Aware Periodic Interconnect
    BIST. <i>IEEE Design &#38;Test</i>. Published online 2023:1-1. doi:<a href="https://doi.org/10.1109/mdat.2023.3298849">10.1109/mdat.2023.3298849</a>
  apa: Sadeghi-Kohan, S., Hellebrand, S., &#38; Wunderlich, H.-J. (2023). Workload-Aware
    Periodic Interconnect BIST. <i>IEEE Design &#38;Test</i>, 1–1. <a href="https://doi.org/10.1109/mdat.2023.3298849">https://doi.org/10.1109/mdat.2023.3298849</a>
  bibtex: '@article{Sadeghi-Kohan_Hellebrand_Wunderlich_2023, title={Workload-Aware
    Periodic Interconnect BIST}, DOI={<a href="https://doi.org/10.1109/mdat.2023.3298849">10.1109/mdat.2023.3298849</a>},
    journal={IEEE Design &#38;Test}, publisher={Institute of Electrical and Electronics
    Engineers (IEEE)}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and
    Wunderlich, Hans-Joachim}, year={2023}, pages={1–1} }'
  chicago: Sadeghi-Kohan, Somayeh, Sybille Hellebrand, and Hans-Joachim Wunderlich.
    “Workload-Aware Periodic Interconnect BIST.” <i>IEEE Design &#38;Test</i>, 2023,
    1–1. <a href="https://doi.org/10.1109/mdat.2023.3298849">https://doi.org/10.1109/mdat.2023.3298849</a>.
  ieee: 'S. Sadeghi-Kohan, S. Hellebrand, and H.-J. Wunderlich, “Workload-Aware Periodic
    Interconnect BIST,” <i>IEEE Design &#38;Test</i>, pp. 1–1, 2023, doi: <a href="https://doi.org/10.1109/mdat.2023.3298849">10.1109/mdat.2023.3298849</a>.'
  mla: Sadeghi-Kohan, Somayeh, et al. “Workload-Aware Periodic Interconnect BIST.”
    <i>IEEE Design &#38;Test</i>, Institute of Electrical and Electronics Engineers
    (IEEE), 2023, pp. 1–1, doi:<a href="https://doi.org/10.1109/mdat.2023.3298849">10.1109/mdat.2023.3298849</a>.
  short: S. Sadeghi-Kohan, S. Hellebrand, H.-J. Wunderlich, IEEE Design &#38;Test
    (2023) 1–1.
date_created: 2023-08-02T11:07:43Z
date_updated: 2024-03-22T17:15:10Z
department:
- _id: '48'
doi: 10.1109/mdat.2023.3298849
keyword:
- Electrical and Electronic Engineering
- Hardware and Architecture
- Software
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10194315
page: 1-1
publication: IEEE Design &Test
publication_identifier:
  issn:
  - 2168-2356
  - 2168-2364
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: Workload-Aware Periodic Interconnect BIST
type: journal_article
user_id: '209'
year: '2023'
...