---
_id: '46264'
abstract:
- lang: eng
  text: "System-level interconnects provide the\r\nbackbone for increasingly complex
    systems on a chip. Their\r\nvulnerability to electromigration and crosstalk can
    lead to\r\nserious reliability and safety issues during the system lifetime.\r\nThis
    article presents an approach for periodic in-system testing\r\nwhich maintains
    a reliability profile to detect potential\r\nproblems before they actually cause
    a failure. Relying on a\r\ncommon infrastructure for EM-aware system workload\r\nmanagement
    and test, it minimizes the stress induced by the\r\ntest itself and contributes
    to the self-healing of system-induced\r\nelectromigration degradations. "
article_type: original
author:
- first_name: Somayeh
  full_name: Sadeghi-Kohan, Somayeh
  id: '78614'
  last_name: Sadeghi-Kohan
  orcid: https://orcid.org/0000-0001-7246-0610
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
citation:
  ama: Sadeghi-Kohan S, Hellebrand S, Wunderlich H-J. Workload-Aware Periodic Interconnect
    BIST. <i>IEEE Design &#38;Test</i>. Published online 2023:1-1. doi:<a href="https://doi.org/10.1109/mdat.2023.3298849">10.1109/mdat.2023.3298849</a>
  apa: Sadeghi-Kohan, S., Hellebrand, S., &#38; Wunderlich, H.-J. (2023). Workload-Aware
    Periodic Interconnect BIST. <i>IEEE Design &#38;Test</i>, 1–1. <a href="https://doi.org/10.1109/mdat.2023.3298849">https://doi.org/10.1109/mdat.2023.3298849</a>
  bibtex: '@article{Sadeghi-Kohan_Hellebrand_Wunderlich_2023, title={Workload-Aware
    Periodic Interconnect BIST}, DOI={<a href="https://doi.org/10.1109/mdat.2023.3298849">10.1109/mdat.2023.3298849</a>},
    journal={IEEE Design &#38;Test}, publisher={Institute of Electrical and Electronics
    Engineers (IEEE)}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and
    Wunderlich, Hans-Joachim}, year={2023}, pages={1–1} }'
  chicago: Sadeghi-Kohan, Somayeh, Sybille Hellebrand, and Hans-Joachim Wunderlich.
    “Workload-Aware Periodic Interconnect BIST.” <i>IEEE Design &#38;Test</i>, 2023,
    1–1. <a href="https://doi.org/10.1109/mdat.2023.3298849">https://doi.org/10.1109/mdat.2023.3298849</a>.
  ieee: 'S. Sadeghi-Kohan, S. Hellebrand, and H.-J. Wunderlich, “Workload-Aware Periodic
    Interconnect BIST,” <i>IEEE Design &#38;Test</i>, pp. 1–1, 2023, doi: <a href="https://doi.org/10.1109/mdat.2023.3298849">10.1109/mdat.2023.3298849</a>.'
  mla: Sadeghi-Kohan, Somayeh, et al. “Workload-Aware Periodic Interconnect BIST.”
    <i>IEEE Design &#38;Test</i>, Institute of Electrical and Electronics Engineers
    (IEEE), 2023, pp. 1–1, doi:<a href="https://doi.org/10.1109/mdat.2023.3298849">10.1109/mdat.2023.3298849</a>.
  short: S. Sadeghi-Kohan, S. Hellebrand, H.-J. Wunderlich, IEEE Design &#38;Test
    (2023) 1–1.
date_created: 2023-08-02T11:07:43Z
date_updated: 2024-03-22T17:15:10Z
department:
- _id: '48'
doi: 10.1109/mdat.2023.3298849
keyword:
- Electrical and Electronic Engineering
- Hardware and Architecture
- Software
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10194315
page: 1-1
publication: IEEE Design &Test
publication_identifier:
  issn:
  - 2168-2356
  - 2168-2364
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: Workload-Aware Periodic Interconnect BIST
type: journal_article
user_id: '209'
year: '2023'
...
---
_id: '66229'
author:
- first_name: Niklas
  full_name: Ueter, Niklas
  last_name: Ueter
- first_name: Kuan-Hsun
  full_name: Chen, Kuan-Hsun
  last_name: Chen
- first_name: Jian-Jia
  full_name: Chen, Jian-Jia
  last_name: Chen
citation:
  ama: 'Ueter N, Chen K-H, Chen J-J. Project-Based CPS Education: A Case Study of
    an Autonomous Driving Student Project. <i>IEEE Design &#38;amp; Test</i>. 2020;37(6):39-46.
    doi:<a href="https://doi.org/10.1109/mdat.2020.3012085">10.1109/mdat.2020.3012085</a>'
  apa: 'Ueter, N., Chen, K.-H., &#38; Chen, J.-J. (2020). Project-Based CPS Education:
    A Case Study of an Autonomous Driving Student Project. <i>IEEE Design &#38;amp;
    Test</i>, <i>37</i>(6), 39–46. <a href="https://doi.org/10.1109/mdat.2020.3012085">https://doi.org/10.1109/mdat.2020.3012085</a>'
  bibtex: '@article{Ueter_Chen_Chen_2020, title={Project-Based CPS Education: A Case
    Study of an Autonomous Driving Student Project}, volume={37}, DOI={<a href="https://doi.org/10.1109/mdat.2020.3012085">10.1109/mdat.2020.3012085</a>},
    number={6}, journal={IEEE Design &#38;amp; Test}, publisher={Institute of Electrical
    and Electronics Engineers (IEEE)}, author={Ueter, Niklas and Chen, Kuan-Hsun and
    Chen, Jian-Jia}, year={2020}, pages={39–46} }'
  chicago: 'Ueter, Niklas, Kuan-Hsun Chen, and Jian-Jia Chen. “Project-Based CPS Education:
    A Case Study of an Autonomous Driving Student Project.” <i>IEEE Design &#38;amp;
    Test</i> 37, no. 6 (2020): 39–46. <a href="https://doi.org/10.1109/mdat.2020.3012085">https://doi.org/10.1109/mdat.2020.3012085</a>.'
  ieee: 'N. Ueter, K.-H. Chen, and J.-J. Chen, “Project-Based CPS Education: A Case
    Study of an Autonomous Driving Student Project,” <i>IEEE Design &#38;amp; Test</i>,
    vol. 37, no. 6, pp. 39–46, 2020, doi: <a href="https://doi.org/10.1109/mdat.2020.3012085">10.1109/mdat.2020.3012085</a>.'
  mla: 'Ueter, Niklas, et al. “Project-Based CPS Education: A Case Study of an Autonomous
    Driving Student Project.” <i>IEEE Design &#38;amp; Test</i>, vol. 37, no. 6, Institute
    of Electrical and Electronics Engineers (IEEE), 2020, pp. 39–46, doi:<a href="https://doi.org/10.1109/mdat.2020.3012085">10.1109/mdat.2020.3012085</a>.'
  short: N. Ueter, K.-H. Chen, J.-J. Chen, IEEE Design &#38;amp; Test 37 (2020) 39–46.
date_created: 2026-07-03T21:23:49Z
date_updated: 2026-07-05T14:44:37Z
doi: 10.1109/mdat.2020.3012085
intvolume: '        37'
issue: '6'
page: 39-46
publication: IEEE Design &amp; Test
publication_identifier:
  issn:
  - 2168-2356
  - 2168-2364
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: 'Project-Based CPS Education: A Case Study of an Autonomous Driving Student
  Project'
type: journal_article
user_id: '128464'
volume: 37
year: '2020'
...