[{"year":"2024","citation":{"apa":"Müller, H., Stadler, H., de los Arcos de Pedro, M. T., Keller, A., &#38; Grundmeier, G. (2024). AFM-IR investigation of thin PECVD SiO x films on a polypropylene substrate in the surface-sensitive mode. <i>Beilstein Journal of Nanotechnology</i>, <i>15</i>(1), 603–611. <a href=\"https://doi.org/10.3762/bjnano.15.51\">https://doi.org/10.3762/bjnano.15.51</a>","mla":"Müller, Hendrik, et al. “AFM-IR Investigation of Thin PECVD SiO x Films on a Polypropylene Substrate in the Surface-Sensitive Mode.” <i>Beilstein Journal of Nanotechnology</i>, vol. 15, no. 1, 2024, pp. 603–611, doi:<a href=\"https://doi.org/10.3762/bjnano.15.51\">10.3762/bjnano.15.51</a>.","short":"H. Müller, H. Stadler, M.T. de los Arcos de Pedro, A. Keller, G. Grundmeier, Beilstein Journal of Nanotechnology 15 (2024) 603–611.","bibtex":"@article{Müller_Stadler_de los Arcos de Pedro_Keller_Grundmeier_2024, title={AFM-IR investigation of thin PECVD SiO x films on a polypropylene substrate in the surface-sensitive mode}, volume={15}, DOI={<a href=\"https://doi.org/10.3762/bjnano.15.51\">10.3762/bjnano.15.51</a>}, number={1}, journal={Beilstein Journal of Nanotechnology}, author={Müller, Hendrik and Stadler, Hartmut and de los Arcos de Pedro, Maria Teresa and Keller, Adrian and Grundmeier, Guido}, year={2024}, pages={603–611} }","ama":"Müller H, Stadler H, de los Arcos de Pedro MT, Keller A, Grundmeier G. AFM-IR investigation of thin PECVD SiO x films on a polypropylene substrate in the surface-sensitive mode. <i>Beilstein Journal of Nanotechnology</i>. 2024;15(1):603–611. doi:<a href=\"https://doi.org/10.3762/bjnano.15.51\">10.3762/bjnano.15.51</a>","chicago":"Müller, Hendrik, Hartmut Stadler, Maria Teresa de los Arcos de Pedro, Adrian Keller, and Guido Grundmeier. “AFM-IR Investigation of Thin PECVD SiO x Films on a Polypropylene Substrate in the Surface-Sensitive Mode.” <i>Beilstein Journal of Nanotechnology</i> 15, no. 1 (2024): 603–611. <a href=\"https://doi.org/10.3762/bjnano.15.51\">https://doi.org/10.3762/bjnano.15.51</a>.","ieee":"H. Müller, H. Stadler, M. T. de los Arcos de Pedro, A. Keller, and G. Grundmeier, “AFM-IR investigation of thin PECVD SiO x films on a polypropylene substrate in the surface-sensitive mode,” <i>Beilstein Journal of Nanotechnology</i>, vol. 15, no. 1, pp. 603–611, 2024, doi: <a href=\"https://doi.org/10.3762/bjnano.15.51\">10.3762/bjnano.15.51</a>."},"page":"603–611","intvolume":"        15","publication_identifier":{"issn":["2190-4286"]},"issue":"1","title":"AFM-IR investigation of thin PECVD SiO x films on a polypropylene substrate in the surface-sensitive mode","doi":"10.3762/bjnano.15.51","date_updated":"2025-02-12T14:56:14Z","author":[{"first_name":"Hendrik","full_name":"Müller, Hendrik","last_name":"Müller"},{"last_name":"Stadler","full_name":"Stadler, Hartmut","first_name":"Hartmut"},{"last_name":"de los Arcos de Pedro","orcid":"0000-0002-8684-273X ","id":"54556","full_name":"de los Arcos de Pedro, Maria Teresa","first_name":"Maria Teresa"},{"first_name":"Adrian","orcid":"0000-0001-7139-3110","last_name":"Keller","full_name":"Keller, Adrian","id":"48864"},{"full_name":"Grundmeier, Guido","id":"194","last_name":"Grundmeier","first_name":"Guido"}],"date_created":"2025-02-12T14:48:49Z","volume":15,"abstract":[{"text":"AFM-IR investigation of thin PECVD SiOx films on a polypropylene substrate in the surface-sensitive mode","lang":"eng"}],"status":"public","type":"journal_article","publication":"Beilstein Journal of Nanotechnology","language":[{"iso":"eng"}],"_id":"58611","user_id":"54556","department":[{"_id":"302"}]},{"keyword":["Electrical and Electronic Engineering","General Physics and Astronomy","General Materials Science"],"language":[{"iso":"eng"}],"abstract":[{"text":"<jats:p>The proton conductivity of two coordination networks, [Mg(H<jats:sub>2</jats:sub>O)<jats:sub>2</jats:sub>(H<jats:sub>3</jats:sub>L)]·H<jats:sub>2</jats:sub>O and [Pb<jats:sub>2</jats:sub>(HL)]·H<jats:sub>2</jats:sub>O (H<jats:sub>5</jats:sub>L = (H<jats:sub>2</jats:sub>O<jats:sub>3</jats:sub>PCH<jats:sub>2</jats:sub>)<jats:sub>2</jats:sub>-NCH<jats:sub>2</jats:sub>-C<jats:sub>6</jats:sub>H<jats:sub>4</jats:sub>-SO<jats:sub>3</jats:sub>H), is investigated by AC impedance spectroscopy. Both materials contain the same phosphonato-sulfonate linker molecule, but have clearly different crystal structures, which has a strong effect on proton conductivity. In the Mg-based coordination network, dangling sulfonate groups are part of an extended hydrogen bonding network, facilitating a “proton hopping” with low activation energy; the material shows a moderate proton conductivity. In the Pb-based metal-organic framework, in contrast, no extended hydrogen bonding occurs, as the sulfonate groups coordinate to Pb<jats:sup>2+</jats:sup>, without forming hydrogen bonds; the proton conductivity is much lower in this material.</jats:p>","lang":"eng"}],"publication":"Beilstein Journal of Nanotechnology","title":"The role of sulfonate groups and hydrogen bonding in the proton conductivity of two coordination networks","publisher":"Beilstein Institut","date_created":"2023-01-10T09:12:54Z","year":"2022","quality_controlled":"1","article_type":"original","_id":"35707","user_id":"23547","department":[{"_id":"35"},{"_id":"2"},{"_id":"307"}],"status":"public","type":"journal_article","main_file_link":[{"open_access":"1","url":"https://www.beilstein-journals.org/bjnano/content/pdf/2190-4286-13-36.pdf"}],"doi":"10.3762/bjnano.13.36","oa":"1","date_updated":"2023-03-03T08:37:14Z","author":[{"last_name":"Javed","full_name":"Javed, Ali","first_name":"Ali"},{"first_name":"Felix","full_name":"Steinke, Felix","last_name":"Steinke"},{"full_name":"Wöhlbrandt, Stephan","last_name":"Wöhlbrandt","first_name":"Stephan"},{"full_name":"Bunzen, Hana","last_name":"Bunzen","first_name":"Hana"},{"first_name":"Norbert","full_name":"Stock, Norbert","last_name":"Stock"},{"first_name":"Michael","last_name":"Tiemann","orcid":"0000-0003-1711-2722","id":"23547","full_name":"Tiemann, Michael"}],"volume":13,"citation":{"apa":"Javed, A., Steinke, F., Wöhlbrandt, S., Bunzen, H., Stock, N., &#38; Tiemann, M. (2022). The role of sulfonate groups and hydrogen bonding in the proton conductivity of two coordination networks. <i>Beilstein Journal of Nanotechnology</i>, <i>13</i>, 437–443. <a href=\"https://doi.org/10.3762/bjnano.13.36\">https://doi.org/10.3762/bjnano.13.36</a>","short":"A. Javed, F. Steinke, S. Wöhlbrandt, H. Bunzen, N. Stock, M. Tiemann, Beilstein Journal of Nanotechnology 13 (2022) 437–443.","mla":"Javed, Ali, et al. “The Role of Sulfonate Groups and Hydrogen Bonding in the Proton Conductivity of Two Coordination Networks.” <i>Beilstein Journal of Nanotechnology</i>, vol. 13, Beilstein Institut, 2022, pp. 437–43, doi:<a href=\"https://doi.org/10.3762/bjnano.13.36\">10.3762/bjnano.13.36</a>.","bibtex":"@article{Javed_Steinke_Wöhlbrandt_Bunzen_Stock_Tiemann_2022, title={The role of sulfonate groups and hydrogen bonding in the proton conductivity of two coordination networks}, volume={13}, DOI={<a href=\"https://doi.org/10.3762/bjnano.13.36\">10.3762/bjnano.13.36</a>}, journal={Beilstein Journal of Nanotechnology}, publisher={Beilstein Institut}, author={Javed, Ali and Steinke, Felix and Wöhlbrandt, Stephan and Bunzen, Hana and Stock, Norbert and Tiemann, Michael}, year={2022}, pages={437–443} }","ama":"Javed A, Steinke F, Wöhlbrandt S, Bunzen H, Stock N, Tiemann M. The role of sulfonate groups and hydrogen bonding in the proton conductivity of two coordination networks. <i>Beilstein Journal of Nanotechnology</i>. 2022;13:437-443. doi:<a href=\"https://doi.org/10.3762/bjnano.13.36\">10.3762/bjnano.13.36</a>","chicago":"Javed, Ali, Felix Steinke, Stephan Wöhlbrandt, Hana Bunzen, Norbert Stock, and Michael Tiemann. “The Role of Sulfonate Groups and Hydrogen Bonding in the Proton Conductivity of Two Coordination Networks.” <i>Beilstein Journal of Nanotechnology</i> 13 (2022): 437–43. <a href=\"https://doi.org/10.3762/bjnano.13.36\">https://doi.org/10.3762/bjnano.13.36</a>.","ieee":"A. Javed, F. Steinke, S. Wöhlbrandt, H. Bunzen, N. Stock, and M. Tiemann, “The role of sulfonate groups and hydrogen bonding in the proton conductivity of two coordination networks,” <i>Beilstein Journal of Nanotechnology</i>, vol. 13, pp. 437–443, 2022, doi: <a href=\"https://doi.org/10.3762/bjnano.13.36\">10.3762/bjnano.13.36</a>."},"page":"437-443","intvolume":"        13","publication_status":"published","publication_identifier":{"issn":["2190-4286"]}},{"department":[{"_id":"286"},{"_id":"321"},{"_id":"15"},{"_id":"9"}],"user_id":"77496","_id":"21374","language":[{"iso":"eng"}],"publication":"Beilstein Journal of Nanotechnology","type":"journal_article","status":"public","abstract":[{"lang":"eng","text":"<jats:p>A dark-field scanning transmission ion microscopy detector was designed for the helium ion microscope. The detection principle is based on a secondary electron conversion holder with an exchangeable aperture strip allowing its acceptance angle to be tuned from 3 to 98 mrad. The contrast mechanism and performance were investigated using freestanding nanometer-thin carbon membranes. The results demonstrate that the detector can be optimized either for most efficient signal collection or for maximum image contrast. The designed setup allows for the imaging of thin low-density materials that otherwise provide little signal or contrast and for a clear end-point detection in the fabrication of nanopores. In addition, the detector is able to determine the thickness of membranes with sub-nanometer precision by quantitatively evaluating the image signal and comparing the results with Monte Carlo simulations. The thickness determined by the dark-field transmission detector is compared to X-ray photoelectron spectroscopy and energy-filtered transmission electron microscopy measurements.</jats:p>"}],"date_created":"2021-03-04T10:12:59Z","author":[{"full_name":"Emmrich, Daniel","last_name":"Emmrich","first_name":"Daniel"},{"full_name":"Wolff, Annalena","last_name":"Wolff","first_name":"Annalena"},{"full_name":"Meyerbröker, Nikolaus","last_name":"Meyerbröker","first_name":"Nikolaus"},{"last_name":"Lindner","full_name":"Lindner, Jörg","id":"20797","first_name":"Jörg"},{"last_name":"Beyer","full_name":"Beyer, André","first_name":"André"},{"first_name":"Armin","full_name":"Gölzhäuser, Armin","last_name":"Gölzhäuser"}],"date_updated":"2022-01-06T06:54:57Z","doi":"10.3762/bjnano.12.18","title":"Scanning transmission helium ion microscopy on carbon nanomembranes","publication_identifier":{"issn":["2190-4286"]},"publication_status":"published","page":"222-231","citation":{"chicago":"Emmrich, Daniel, Annalena Wolff, Nikolaus Meyerbröker, Jörg Lindner, André Beyer, and Armin Gölzhäuser. “Scanning Transmission Helium Ion Microscopy on Carbon Nanomembranes.” <i>Beilstein Journal of Nanotechnology</i>, 2021, 222–31. <a href=\"https://doi.org/10.3762/bjnano.12.18\">https://doi.org/10.3762/bjnano.12.18</a>.","ieee":"D. Emmrich, A. Wolff, N. Meyerbröker, J. Lindner, A. Beyer, and A. Gölzhäuser, “Scanning transmission helium ion microscopy on carbon nanomembranes,” <i>Beilstein Journal of Nanotechnology</i>, pp. 222–231, 2021.","ama":"Emmrich D, Wolff A, Meyerbröker N, Lindner J, Beyer A, Gölzhäuser A. Scanning transmission helium ion microscopy on carbon nanomembranes. <i>Beilstein Journal of Nanotechnology</i>. 2021:222-231. doi:<a href=\"https://doi.org/10.3762/bjnano.12.18\">10.3762/bjnano.12.18</a>","mla":"Emmrich, Daniel, et al. “Scanning Transmission Helium Ion Microscopy on Carbon Nanomembranes.” <i>Beilstein Journal of Nanotechnology</i>, 2021, pp. 222–31, doi:<a href=\"https://doi.org/10.3762/bjnano.12.18\">10.3762/bjnano.12.18</a>.","bibtex":"@article{Emmrich_Wolff_Meyerbröker_Lindner_Beyer_Gölzhäuser_2021, title={Scanning transmission helium ion microscopy on carbon nanomembranes}, DOI={<a href=\"https://doi.org/10.3762/bjnano.12.18\">10.3762/bjnano.12.18</a>}, journal={Beilstein Journal of Nanotechnology}, author={Emmrich, Daniel and Wolff, Annalena and Meyerbröker, Nikolaus and Lindner, Jörg and Beyer, André and Gölzhäuser, Armin}, year={2021}, pages={222–231} }","short":"D. Emmrich, A. Wolff, N. Meyerbröker, J. Lindner, A. Beyer, A. Gölzhäuser, Beilstein Journal of Nanotechnology (2021) 222–231.","apa":"Emmrich, D., Wolff, A., Meyerbröker, N., Lindner, J., Beyer, A., &#38; Gölzhäuser, A. (2021). Scanning transmission helium ion microscopy on carbon nanomembranes. <i>Beilstein Journal of Nanotechnology</i>, 222–231. <a href=\"https://doi.org/10.3762/bjnano.12.18\">https://doi.org/10.3762/bjnano.12.18</a>"},"year":"2021"}]