---
_id: '64193'
author:
- first_name: Ying
  full_name: Xu, Ying
  last_name: Xu
- first_name: Philipp
  full_name: Terhörst, Philipp
  id: '97123'
  last_name: Terhörst
- first_name: Marius
  full_name: Pedersen, Marius
  last_name: Pedersen
- first_name: Kiran
  full_name: Raja, Kiran
  last_name: Raja
citation:
  ama: Xu Y, Terhörst P, Pedersen M, Raja K. Analyzing Fairness in Deepfake Detection
    With Massively Annotated Databases. <i>IEEE Transactions on Technology and Society</i>.
    2024;5(1):93-106. doi:<a href="https://doi.org/10.1109/tts.2024.3365421">10.1109/tts.2024.3365421</a>
  apa: Xu, Y., Terhörst, P., Pedersen, M., &#38; Raja, K. (2024). Analyzing Fairness
    in Deepfake Detection With Massively Annotated Databases. <i>IEEE Transactions
    on Technology and Society</i>, <i>5</i>(1), 93–106. <a href="https://doi.org/10.1109/tts.2024.3365421">https://doi.org/10.1109/tts.2024.3365421</a>
  bibtex: '@article{Xu_Terhörst_Pedersen_Raja_2024, title={Analyzing Fairness in Deepfake
    Detection With Massively Annotated Databases}, volume={5}, DOI={<a href="https://doi.org/10.1109/tts.2024.3365421">10.1109/tts.2024.3365421</a>},
    number={1}, journal={IEEE Transactions on Technology and Society}, publisher={Institute
    of Electrical and Electronics Engineers (IEEE)}, author={Xu, Ying and Terhörst,
    Philipp and Pedersen, Marius and Raja, Kiran}, year={2024}, pages={93–106} }'
  chicago: 'Xu, Ying, Philipp Terhörst, Marius Pedersen, and Kiran Raja. “Analyzing
    Fairness in Deepfake Detection With Massively Annotated Databases.” <i>IEEE Transactions
    on Technology and Society</i> 5, no. 1 (2024): 93–106. <a href="https://doi.org/10.1109/tts.2024.3365421">https://doi.org/10.1109/tts.2024.3365421</a>.'
  ieee: 'Y. Xu, P. Terhörst, M. Pedersen, and K. Raja, “Analyzing Fairness in Deepfake
    Detection With Massively Annotated Databases,” <i>IEEE Transactions on Technology
    and Society</i>, vol. 5, no. 1, pp. 93–106, 2024, doi: <a href="https://doi.org/10.1109/tts.2024.3365421">10.1109/tts.2024.3365421</a>.'
  mla: Xu, Ying, et al. “Analyzing Fairness in Deepfake Detection With Massively Annotated
    Databases.” <i>IEEE Transactions on Technology and Society</i>, vol. 5, no. 1,
    Institute of Electrical and Electronics Engineers (IEEE), 2024, pp. 93–106, doi:<a
    href="https://doi.org/10.1109/tts.2024.3365421">10.1109/tts.2024.3365421</a>.
  short: Y. Xu, P. Terhörst, M. Pedersen, K. Raja, IEEE Transactions on Technology
    and Society 5 (2024) 93–106.
date_created: 2026-02-18T09:32:05Z
date_updated: 2026-02-19T07:50:47Z
doi: 10.1109/tts.2024.3365421
intvolume: '         5'
issue: '1'
language:
- iso: eng
page: 93-106
publication: IEEE Transactions on Technology and Society
publication_identifier:
  issn:
  - 2637-6415
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: Analyzing Fairness in Deepfake Detection With Massively Annotated Databases
type: journal_article
user_id: '97123'
volume: 5
year: '2024'
...