[{"publisher":"IEEE","date_updated":"2023-01-17T10:41:25Z","author":[{"first_name":"Alexander","full_name":"Krupp, Alexander","last_name":"Krupp"},{"first_name":"Wolfgang","id":"16243","full_name":"Müller, Wolfgang","last_name":"Müller"}],"date_created":"2023-01-17T10:41:15Z","title":"A Systematic Approach to Combined HW/SW System Test","conference":{"location":"Dresden","name":"Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)"},"doi":"10.1109/DATE.2010.5457186","year":"2010","place":"Dresden","citation":{"apa":"Krupp, A., &#38; Müller, W. (2010). A Systematic Approach to Combined HW/SW System Test. <i>Proceedings of DATE’10</i>. Design, Automation &#38; Test in Europe Conference &#38; Exhibition (DATE 2010), Dresden. <a href=\"https://doi.org/10.1109/DATE.2010.5457186\">https://doi.org/10.1109/DATE.2010.5457186</a>","short":"A. Krupp, W. Müller, in: Proceedings of DATE’10, IEEE, Dresden, 2010.","mla":"Krupp, Alexander, and Wolfgang Müller. “A Systematic Approach to Combined HW/SW System Test.” <i>Proceedings of DATE’10</i>, IEEE, 2010, doi:<a href=\"https://doi.org/10.1109/DATE.2010.5457186\">10.1109/DATE.2010.5457186</a>.","bibtex":"@inproceedings{Krupp_Müller_2010, place={Dresden}, title={A Systematic Approach to Combined HW/SW System Test}, DOI={<a href=\"https://doi.org/10.1109/DATE.2010.5457186\">10.1109/DATE.2010.5457186</a>}, booktitle={Proceedings of DATE’10}, publisher={IEEE}, author={Krupp, Alexander and Müller, Wolfgang}, year={2010} }","ama":"Krupp A, Müller W. A Systematic Approach to Combined HW/SW System Test. In: <i>Proceedings of DATE’10</i>. IEEE; 2010. doi:<a href=\"https://doi.org/10.1109/DATE.2010.5457186\">10.1109/DATE.2010.5457186</a>","ieee":"A. Krupp and W. Müller, “A Systematic Approach to Combined HW/SW System Test,” presented at the Design, Automation &#38; Test in Europe Conference &#38; Exhibition (DATE 2010), Dresden, 2010, doi: <a href=\"https://doi.org/10.1109/DATE.2010.5457186\">10.1109/DATE.2010.5457186</a>.","chicago":"Krupp, Alexander, and Wolfgang Müller. “A Systematic Approach to Combined HW/SW System Test.” In <i>Proceedings of DATE’10</i>. Dresden: IEEE, 2010. <a href=\"https://doi.org/10.1109/DATE.2010.5457186\">https://doi.org/10.1109/DATE.2010.5457186</a>."},"_id":"37037","user_id":"5786","department":[{"_id":"672"}],"keyword":["System testing","Automatic testing","Object oriented modeling","Classification tree analysis","Automotive engineering","Mathematical model","Embedded system","Control systems","Electronic equipment testing","Software testing"],"language":[{"iso":"eng"}],"type":"conference","publication":"Proceedings of DATE’10","abstract":[{"lang":"eng","text":"Today we can identify a big gap between requirement specification and the generation of test environments. This article extends the Classification Tree Method for Embedded Systems (CTM/ES) to fill this gap by new concepts for the precise specification of stimuli for operational ranges of continuous control systems. It introduces novel means for continuous acceptance criteria definition and for functional coverage definition."}],"status":"public"},{"publication":"Proceedings of the Design Automation & Test in Europe Conference","type":"conference","status":"public","abstract":[{"lang":"eng","text":"This article presents the classification tree method for functional verification to close the gap from the specification of a test plan to SystemVerilog (Chandra and Chakrabarty, 2001) test bench generation. Our method supports the systematic development of test configurations and is based on the classification tree method for embedded systems (CTM/ES) (Chakrabarty et al., 2000) extending CTM/ES for random test generation as well as for functional coverage and property specification"}],"department":[{"_id":"672"}],"user_id":"5786","_id":"38784","language":[{"iso":"eng"}],"keyword":["Classification tree analysis","System testing","Embedded system","Safety","Automatic testing","Automation"],"publication_identifier":{"isbn":["3-9810801-1-4"]},"citation":{"ama":"Krupp A, Müller W. Classification Trees for Functional Coverage and Random Test Generation. In: <i>Proceedings of the Design Automation &#38; Test in Europe Conference</i>. IEEE; 2006. doi:<a href=\"https://doi.org/10.1109/DATE.2006.243902\">10.1109/DATE.2006.243902</a>","chicago":"Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional Coverage and Random Test Generation.” In <i>Proceedings of the Design Automation &#38; Test in Europe Conference</i>. Munich, Germany: IEEE, 2006. <a href=\"https://doi.org/10.1109/DATE.2006.243902\">https://doi.org/10.1109/DATE.2006.243902</a>.","ieee":"A. Krupp and W. Müller, “Classification Trees for Functional Coverage and Random Test Generation,” 2006, doi: <a href=\"https://doi.org/10.1109/DATE.2006.243902\">10.1109/DATE.2006.243902</a>.","short":"A. Krupp, W. Müller, in: Proceedings of the Design Automation &#38; Test in Europe Conference, IEEE, Munich, Germany, 2006.","bibtex":"@inproceedings{Krupp_Müller_2006, place={Munich, Germany}, title={Classification Trees for Functional Coverage and Random Test Generation}, DOI={<a href=\"https://doi.org/10.1109/DATE.2006.243902\">10.1109/DATE.2006.243902</a>}, booktitle={Proceedings of the Design Automation &#38; Test in Europe Conference}, publisher={IEEE}, author={Krupp, Alexander and Müller, Wolfgang}, year={2006} }","mla":"Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional Coverage and Random Test Generation.” <i>Proceedings of the Design Automation &#38; Test in Europe Conference</i>, IEEE, 2006, doi:<a href=\"https://doi.org/10.1109/DATE.2006.243902\">10.1109/DATE.2006.243902</a>.","apa":"Krupp, A., &#38; Müller, W. (2006). Classification Trees for Functional Coverage and Random Test Generation. <i>Proceedings of the Design Automation &#38; Test in Europe Conference</i>. <a href=\"https://doi.org/10.1109/DATE.2006.243902\">https://doi.org/10.1109/DATE.2006.243902</a>"},"year":"2006","place":"Munich, Germany","author":[{"full_name":"Krupp, Alexander","last_name":"Krupp","first_name":"Alexander"},{"last_name":"Müller","id":"16243","full_name":"Müller, Wolfgang","first_name":"Wolfgang"}],"date_created":"2023-01-24T08:06:09Z","date_updated":"2023-01-24T08:06:14Z","publisher":"IEEE","doi":"10.1109/DATE.2006.243902","title":"Classification Trees for Functional Coverage and Random Test Generation"},{"keyword":["System testing","Software testing","Automotive engineering","Automatic testing","Machinery production industries","Protocols","Hardware design languages","Samarium","XML","Computer industry"],"language":[{"iso":"eng"}],"_id":"38107","department":[{"_id":"672"}],"user_id":"5786","abstract":[{"text":"TestML is an XML-based language for the exchange of test descriptions in automotive systems design and mainly introduced through the structural definition of an XML schema as an independent exchange format for existing tools and methods covering a wide range of different test technologies. In this paper, we present a rigorous formal behavioral semantics for TestML by means of Abstract State Machines (ASMs). Our semantics is a concise, unambiguous, high-level specification for TestML-based implementations and serves as a basis to define exact and well-defined mappings between existing test languages and TestML.","lang":"eng"}],"status":"public","publication":"Proc. of ISOLA 06","type":"conference","title":"A Formal Behavioral Semantics for TestML","doi":"10.1109/ISoLA.2006.37","conference":{"location":"Paphos, Cyprus"},"date_updated":"2023-01-23T12:06:26Z","author":[{"full_name":"Großmann, Jürgen","last_name":"Großmann","first_name":"Jürgen"},{"last_name":"Müller","id":"16243","full_name":"Müller, Wolfgang","first_name":"Wolfgang"}],"date_created":"2023-01-23T12:00:06Z","place":"Paphos, Cyprus","year":"2006","citation":{"short":"J. Großmann, W. Müller, in: Proc. of ISOLA 06, Paphos, Cyprus, 2006.","bibtex":"@inproceedings{Großmann_Müller_2006, place={Paphos, Cyprus}, title={A Formal Behavioral Semantics for TestML}, DOI={<a href=\"https://doi.org/10.1109/ISoLA.2006.37\">10.1109/ISoLA.2006.37</a>}, booktitle={Proc. of ISOLA 06}, author={Großmann, Jürgen and Müller, Wolfgang}, year={2006} }","mla":"Großmann, Jürgen, and Wolfgang Müller. “A Formal Behavioral Semantics for TestML.” <i>Proc. of ISOLA 06</i>, 2006, doi:<a href=\"https://doi.org/10.1109/ISoLA.2006.37\">10.1109/ISoLA.2006.37</a>.","apa":"Großmann, J., &#38; Müller, W. (2006). A Formal Behavioral Semantics for TestML. <i>Proc. of ISOLA 06</i>. <a href=\"https://doi.org/10.1109/ISoLA.2006.37\">https://doi.org/10.1109/ISoLA.2006.37</a>","ama":"Großmann J, Müller W. A Formal Behavioral Semantics for TestML. In: <i>Proc. of ISOLA 06</i>. ; 2006. doi:<a href=\"https://doi.org/10.1109/ISoLA.2006.37\">10.1109/ISoLA.2006.37</a>","ieee":"J. Großmann and W. Müller, “A Formal Behavioral Semantics for TestML,” Paphos, Cyprus, 2006, doi: <a href=\"https://doi.org/10.1109/ISoLA.2006.37\">10.1109/ISoLA.2006.37</a>.","chicago":"Großmann, Jürgen, and Wolfgang Müller. “A Formal Behavioral Semantics for TestML.” In <i>Proc. of ISOLA 06</i>. Paphos, Cyprus, 2006. <a href=\"https://doi.org/10.1109/ISoLA.2006.37\">https://doi.org/10.1109/ISoLA.2006.37</a>."},"publication_identifier":{"isbn":["978-0-7695-3071-0"]}}]