[{"_id":"37037","language":[{"iso":"eng"}],"publisher":"IEEE","doi":"10.1109/DATE.2010.5457186","user_id":"5786","title":"A Systematic Approach to Combined HW/SW System Test","year":"2010","status":"public","conference":{"location":"Dresden","name":"Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)"},"author":[{"first_name":"Alexander","last_name":"Krupp","full_name":"Krupp, Alexander"},{"id":"16243","full_name":"Müller, Wolfgang","first_name":"Wolfgang","last_name":"Müller"}],"date_updated":"2023-01-17T10:41:25Z","place":"Dresden","date_created":"2023-01-17T10:41:15Z","type":"conference","keyword":["System testing","Automatic testing","Object oriented modeling","Classification tree analysis","Automotive engineering","Mathematical model","Embedded system","Control systems","Electronic equipment testing","Software testing"],"department":[{"_id":"672"}],"publication":"Proceedings of DATE’10","citation":{"short":"A. Krupp, W. Müller, in: Proceedings of DATE’10, IEEE, Dresden, 2010.","chicago":"Krupp, Alexander, and Wolfgang Müller. “A Systematic Approach to Combined HW/SW System Test.” In <i>Proceedings of DATE’10</i>. Dresden: IEEE, 2010. <a href=\"https://doi.org/10.1109/DATE.2010.5457186\">https://doi.org/10.1109/DATE.2010.5457186</a>.","ieee":"A. Krupp and W. Müller, “A Systematic Approach to Combined HW/SW System Test,” presented at the Design, Automation &#38; Test in Europe Conference &#38; Exhibition (DATE 2010), Dresden, 2010, doi: <a href=\"https://doi.org/10.1109/DATE.2010.5457186\">10.1109/DATE.2010.5457186</a>.","apa":"Krupp, A., &#38; Müller, W. (2010). A Systematic Approach to Combined HW/SW System Test. <i>Proceedings of DATE’10</i>. Design, Automation &#38; Test in Europe Conference &#38; Exhibition (DATE 2010), Dresden. <a href=\"https://doi.org/10.1109/DATE.2010.5457186\">https://doi.org/10.1109/DATE.2010.5457186</a>","bibtex":"@inproceedings{Krupp_Müller_2010, place={Dresden}, title={A Systematic Approach to Combined HW/SW System Test}, DOI={<a href=\"https://doi.org/10.1109/DATE.2010.5457186\">10.1109/DATE.2010.5457186</a>}, booktitle={Proceedings of DATE’10}, publisher={IEEE}, author={Krupp, Alexander and Müller, Wolfgang}, year={2010} }","ama":"Krupp A, Müller W. A Systematic Approach to Combined HW/SW System Test. In: <i>Proceedings of DATE’10</i>. IEEE; 2010. doi:<a href=\"https://doi.org/10.1109/DATE.2010.5457186\">10.1109/DATE.2010.5457186</a>","mla":"Krupp, Alexander, and Wolfgang Müller. “A Systematic Approach to Combined HW/SW System Test.” <i>Proceedings of DATE’10</i>, IEEE, 2010, doi:<a href=\"https://doi.org/10.1109/DATE.2010.5457186\">10.1109/DATE.2010.5457186</a>."},"abstract":[{"lang":"eng","text":"Today we can identify a big gap between requirement specification and the generation of test environments. This article extends the Classification Tree Method for Embedded Systems (CTM/ES) to fill this gap by new concepts for the precise specification of stimuli for operational ranges of continuous control systems. It introduces novel means for continuous acceptance criteria definition and for functional coverage definition."}]},{"abstract":[{"text":"This article presents the classification tree method for functional verification to close the gap from the specification of a test plan to SystemVerilog (Chandra and Chakrabarty, 2001) test bench generation. Our method supports the systematic development of test configurations and is based on the classification tree method for embedded systems (CTM/ES) (Chakrabarty et al., 2000) extending CTM/ES for random test generation as well as for functional coverage and property specification","lang":"eng"}],"citation":{"apa":"Krupp, A., &#38; Müller, W. (2006). Classification Trees for Functional Coverage and Random Test Generation. <i>Proceedings of the Design Automation &#38; Test in Europe Conference</i>. <a href=\"https://doi.org/10.1109/DATE.2006.243902\">https://doi.org/10.1109/DATE.2006.243902</a>","ieee":"A. Krupp and W. Müller, “Classification Trees for Functional Coverage and Random Test Generation,” 2006, doi: <a href=\"https://doi.org/10.1109/DATE.2006.243902\">10.1109/DATE.2006.243902</a>.","short":"A. Krupp, W. Müller, in: Proceedings of the Design Automation &#38; Test in Europe Conference, IEEE, Munich, Germany, 2006.","chicago":"Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional Coverage and Random Test Generation.” In <i>Proceedings of the Design Automation &#38; Test in Europe Conference</i>. Munich, Germany: IEEE, 2006. <a href=\"https://doi.org/10.1109/DATE.2006.243902\">https://doi.org/10.1109/DATE.2006.243902</a>.","mla":"Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional Coverage and Random Test Generation.” <i>Proceedings of the Design Automation &#38; Test in Europe Conference</i>, IEEE, 2006, doi:<a href=\"https://doi.org/10.1109/DATE.2006.243902\">10.1109/DATE.2006.243902</a>.","ama":"Krupp A, Müller W. Classification Trees for Functional Coverage and Random Test Generation. In: <i>Proceedings of the Design Automation &#38; Test in Europe Conference</i>. IEEE; 2006. doi:<a href=\"https://doi.org/10.1109/DATE.2006.243902\">10.1109/DATE.2006.243902</a>","bibtex":"@inproceedings{Krupp_Müller_2006, place={Munich, Germany}, title={Classification Trees for Functional Coverage and Random Test Generation}, DOI={<a href=\"https://doi.org/10.1109/DATE.2006.243902\">10.1109/DATE.2006.243902</a>}, booktitle={Proceedings of the Design Automation &#38; Test in Europe Conference}, publisher={IEEE}, author={Krupp, Alexander and Müller, Wolfgang}, year={2006} }"},"publication":"Proceedings of the Design Automation & Test in Europe Conference","department":[{"_id":"672"}],"keyword":["Classification tree analysis","System testing","Embedded system","Safety","Automatic testing","Automation"],"type":"conference","place":"Munich, Germany","date_created":"2023-01-24T08:06:09Z","date_updated":"2023-01-24T08:06:14Z","author":[{"last_name":"Krupp","first_name":"Alexander","full_name":"Krupp, Alexander"},{"id":"16243","full_name":"Müller, Wolfgang","first_name":"Wolfgang","last_name":"Müller"}],"publication_identifier":{"isbn":["3-9810801-1-4"]},"year":"2006","title":"Classification Trees for Functional Coverage and Random Test Generation","status":"public","doi":"10.1109/DATE.2006.243902","user_id":"5786","_id":"38784","language":[{"iso":"eng"}],"publisher":"IEEE"}]