---
_id: '22481'
abstract:
- lang: eng
  text: During the industrial processing of materials for the manufacture of new products,
    surface defects can quickly occur. In order to achieve high quality without a
    long time delay, it makes sense to inspect the work pieces so that defective work
    pieces can be sorted out right at the beginning of the process. At the same time,
    the evaluation unit should come close the perception of the human eye regarding
    detection of defects in surfaces. Such defects often manifest themselves by a
    deviation of the existing structure. The only restriction should be that only
    matt surfaces should be considered here. Therefore in this work, different classification
    and image processing algorithms are applied to surface data to identify possible
    surface damages. For this purpose, the Gabor filter and the FST (Fused Structure
    and Texture) features generated with it, as well as the salience metric are used
    on the image processing side. On the classification side, however, deep neural
    networks, Convolutional Neural Networks (CNN), and autoencoders are used to make
    a decision. A distinction is also made between training using class labels and
    without. It turns out later that the salience metric are best performed by CNN.
    On the other hand, if there is no labeled training data available, a novelty classification
    can easily be achieved by using autoencoders as well as the salience metric and
    some filters.
author:
- first_name: Tom
  full_name: Sander, Tom
  last_name: Sander
- first_name: Sven
  full_name: Lange, Sven
  id: '38240'
  last_name: Lange
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  last_name: Hilleringmann
- first_name: Volker
  full_name: Geneis, Volker
  last_name: Geneis
- first_name: Christian
  full_name: Hedayat, Christian
  last_name: Hedayat
- first_name: Harald
  full_name: Kuhn, Harald
  last_name: Kuhn
- first_name: Franz-Barthold
  full_name: Gockel, Franz-Barthold
  last_name: Gockel
citation:
  ama: 'Sander T, Lange S, Hilleringmann U, et al. Detection of Defects on Irregular
    Structured Surfaces by Image Processing Methods for Feature Extraction. In: <i>22nd
    IEEE International Conference on Industrial Technology (ICIT)</i>. Valencia, Spain
    : IEEE; 2021. doi:<a href="https://doi.org/10.1109/icit46573.2021.9453646">10.1109/icit46573.2021.9453646</a>'
  apa: 'Sander, T., Lange, S., Hilleringmann, U., Geneis, V., Hedayat, C., Kuhn, H.,
    &#38; Gockel, F.-B. (2021). Detection of Defects on Irregular Structured Surfaces
    by Image Processing Methods for Feature Extraction. In <i>22nd IEEE International
    Conference on Industrial Technology (ICIT)</i>. Valencia, Spain : IEEE. <a href="https://doi.org/10.1109/icit46573.2021.9453646">https://doi.org/10.1109/icit46573.2021.9453646</a>'
  bibtex: '@inproceedings{Sander_Lange_Hilleringmann_Geneis_Hedayat_Kuhn_Gockel_2021,
    place={Valencia, Spain }, title={Detection of Defects on Irregular Structured
    Surfaces by Image Processing Methods for Feature Extraction}, DOI={<a href="https://doi.org/10.1109/icit46573.2021.9453646">10.1109/icit46573.2021.9453646</a>},
    booktitle={22nd IEEE International Conference on Industrial Technology (ICIT)},
    publisher={IEEE}, author={Sander, Tom and Lange, Sven and Hilleringmann, Ulrich
    and Geneis, Volker and Hedayat, Christian and Kuhn, Harald and Gockel, Franz-Barthold},
    year={2021} }'
  chicago: 'Sander, Tom, Sven Lange, Ulrich Hilleringmann, Volker Geneis, Christian
    Hedayat, Harald Kuhn, and Franz-Barthold Gockel. “Detection of Defects on Irregular
    Structured Surfaces by Image Processing Methods for Feature Extraction.” In <i>22nd
    IEEE International Conference on Industrial Technology (ICIT)</i>. Valencia, Spain
    : IEEE, 2021. <a href="https://doi.org/10.1109/icit46573.2021.9453646">https://doi.org/10.1109/icit46573.2021.9453646</a>.'
  ieee: T. Sander <i>et al.</i>, “Detection of Defects on Irregular Structured Surfaces
    by Image Processing Methods for Feature Extraction,” in <i>22nd IEEE International
    Conference on Industrial Technology (ICIT)</i>, Valencia, Spain , 2021.
  mla: Sander, Tom, et al. “Detection of Defects on Irregular Structured Surfaces
    by Image Processing Methods for Feature Extraction.” <i>22nd IEEE International
    Conference on Industrial Technology (ICIT)</i>, IEEE, 2021, doi:<a href="https://doi.org/10.1109/icit46573.2021.9453646">10.1109/icit46573.2021.9453646</a>.
  short: 'T. Sander, S. Lange, U. Hilleringmann, V. Geneis, C. Hedayat, H. Kuhn, F.-B.
    Gockel, in: 22nd IEEE International Conference on Industrial Technology (ICIT),
    IEEE, Valencia, Spain , 2021.'
conference:
  end_date: 2021-03-12
  location: 'Valencia, Spain '
  name: 22nd IEEE International Conference on Industrial Technology (ICIT)
  start_date: 2021-03-10
date_created: 2021-06-20T23:32:11Z
date_updated: 2022-01-06T06:55:33Z
department:
- _id: '59'
- _id: '485'
doi: 10.1109/icit46573.2021.9453646
keyword:
- Image Processing
- Defect Detection
- wooden surfaces
- Machine Learning
- Neural Networks
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/document/9453646
place: 'Valencia, Spain '
publication: 22nd IEEE International Conference on Industrial Technology (ICIT)
publication_identifier:
  isbn:
  - '9781728157306'
publication_status: published
publisher: IEEE
status: public
title: Detection of Defects on Irregular Structured Surfaces by Image Processing Methods
  for Feature Extraction
type: conference
user_id: '38240'
year: '2021'
...