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Schmalhorst, S. Kämmerer, M. Sacher, G. Reiss, A. Hütten, A. Scholl, Physical Review B 70 (2004).","apa":"Schmalhorst, J., Kämmerer, S., Sacher, M., Reiss, G., Hütten, A., &#38; Scholl, A. (2004). Interface structure and magnetism of magnetic tunnel junctions with aCo2MnSielectrode. <i>Physical Review B</i>, <i>70</i>(2), Article 024426. <a href=\"https://doi.org/10.1103/physrevb.70.024426\">https://doi.org/10.1103/physrevb.70.024426</a>","ama":"Schmalhorst J, Kämmerer S, Sacher M, Reiss G, Hütten A, Scholl A. Interface structure and magnetism of magnetic tunnel junctions with aCo2MnSielectrode. <i>Physical Review B</i>. 2004;70(2). doi:<a href=\"https://doi.org/10.1103/physrevb.70.024426\">10.1103/physrevb.70.024426</a>","ieee":"J. Schmalhorst, S. Kämmerer, M. Sacher, G. Reiss, A. Hütten, and A. 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Scholl. “Interface Structure and Magnetism of Magnetic Tunnel Junctions with ACo2MnSielectrode.” <i>Physical Review B</i> 70, no. 2 (2004). <a href=\"https://doi.org/10.1103/physrevb.70.024426\">https://doi.org/10.1103/physrevb.70.024426</a>."},"intvolume":"        70","publication_status":"published","publication_identifier":{"issn":["1098-0121","1550-235X"]},"doi":"10.1103/physrevb.70.024426","author":[{"first_name":"J.","full_name":"Schmalhorst, J.","last_name":"Schmalhorst"},{"first_name":"S.","last_name":"Kämmerer","full_name":"Kämmerer, S."},{"first_name":"Marc","orcid":"0000-0001-6217-336X","last_name":"Sacher","full_name":"Sacher, Marc","id":"26883"},{"last_name":"Reiss","full_name":"Reiss, G.","first_name":"G."},{"first_name":"A.","last_name":"Hütten","full_name":"Hütten, A."},{"last_name":"Scholl","full_name":"Scholl, A.","first_name":"A."}],"volume":70,"date_updated":"2024-04-23T12:14:36Z","status":"public","type":"journal_article","extern":"1","article_number":"024426","user_id":"26883","department":[{"_id":"15"}],"_id":"29695","year":"2004","issue":"2","title":"Interface structure and magnetism of magnetic tunnel junctions with aCo2MnSielectrode","date_created":"2022-01-31T10:26:48Z","publisher":"American Physical Society (APS)","publication":"Physical Review B","language":[{"iso":"eng"}],"keyword":["Condensed Matter Physics","Electronic","Optical and Magnetic Materials"]},{"date_updated":"2023-01-24T08:53:31Z","date_created":"2023-01-24T08:53:26Z","author":[{"last_name":"Krupp","full_name":"Krupp, Alexander","first_name":"Alexander"},{"last_name":"Müller","id":"16243","full_name":"Müller, Wolfgang","first_name":"Wolfgang"},{"first_name":"Ian","last_name":"Oliver","full_name":"Oliver, Ian"}],"title":"Formal Refinement and Model Checking of An Echo Cancellation Unit","doi":"10.1109/DATE.2004.1269214","conference":{"name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition"},"publication_identifier":{"isbn":["0-7695-2085-5"]},"place":"Paris","year":"2004","citation":{"ieee":"A. Krupp, W. Müller, and I. Oliver, “Formal Refinement and Model Checking of An Echo Cancellation Unit,” presented at the Proceedings Design, Automation and Test in Europe Conference and Exhibition, 2004, doi: <a href=\"https://doi.org/10.1109/DATE.2004.1269214\">10.1109/DATE.2004.1269214</a>.","chicago":"Krupp, Alexander, Wolfgang Müller, and Ian Oliver. “Formal Refinement and Model Checking of An Echo Cancellation Unit.” In <i>Proceedings of DATE’04 Designers’ Forum</i>. Paris, 2004. <a href=\"https://doi.org/10.1109/DATE.2004.1269214\">https://doi.org/10.1109/DATE.2004.1269214</a>.","ama":"Krupp A, Müller W, Oliver I. Formal Refinement and Model Checking of An Echo Cancellation Unit. In: <i>Proceedings of DATE’04 Designers’ Forum</i>. ; 2004. doi:<a href=\"https://doi.org/10.1109/DATE.2004.1269214\">10.1109/DATE.2004.1269214</a>","apa":"Krupp, A., Müller, W., &#38; Oliver, I. (2004). Formal Refinement and Model Checking of An Echo Cancellation Unit. <i>Proceedings of DATE’04 Designers’ Forum</i>. Proceedings Design, Automation and Test in Europe Conference and Exhibition. <a href=\"https://doi.org/10.1109/DATE.2004.1269214\">https://doi.org/10.1109/DATE.2004.1269214</a>","bibtex":"@inproceedings{Krupp_Müller_Oliver_2004, place={Paris}, title={Formal Refinement and Model Checking of An Echo Cancellation Unit}, DOI={<a href=\"https://doi.org/10.1109/DATE.2004.1269214\">10.1109/DATE.2004.1269214</a>}, booktitle={Proceedings of DATE’04 Designers’ Forum}, author={Krupp, Alexander and Müller, Wolfgang and Oliver, Ian}, year={2004} }","mla":"Krupp, Alexander, et al. “Formal Refinement and Model Checking of An Echo Cancellation Unit.” <i>Proceedings of DATE’04 Designers’ Forum</i>, 2004, doi:<a href=\"https://doi.org/10.1109/DATE.2004.1269214\">10.1109/DATE.2004.1269214</a>.","short":"A. Krupp, W. Müller, I. Oliver, in: Proceedings of DATE’04 Designers’ Forum, Paris, 2004."},"_id":"39061","user_id":"5786","department":[{"_id":"672"}],"keyword":["Echo cancellers","Logic","Unified modeling language","Automata","Data structures","Boolean functions","Electronic design automation and methodology","Prototypes","Specification languages","Constraint theory"],"language":[{"iso":"eng"}],"type":"conference","publication":"Proceedings of DATE’04 Designers' Forum","abstract":[{"lang":"eng","text":"This article presents an approach, which combines theorem proving-based refinement with model checking for state based real-time systems. Our verification flow starts from UML state diagrams, which are translated to the formal B language and are model checked for real-time properties. By means of the B language and a B theorem prover, refined state diagrams are verified against their abstract representation. The approach is presented by means of the refinement of a digital echo cancellation unit."}],"status":"public"},{"language":[{"iso":"eng"}],"keyword":["Colloid and Surface Chemistry","Surfaces","Coatings and Films","Biomaterials","Electronic","Optical and Magnetic Materials"],"user_id":"237","department":[{"_id":"314"}],"_id":"42018","status":"public","type":"journal_article","publication":"Journal of Colloid and Interface Science","doi":"10.1016/j.jcis.2004.06.102","title":"Colloid–polymer mixtures in solution with refractive index matched acrylate colloids","date_created":"2023-02-10T15:24:19Z","author":[{"last_name":"Kramer","full_name":"Kramer, Thomas","first_name":"Thomas"},{"last_name":"Scholz","full_name":"Scholz, Stephanie","first_name":"Stephanie"},{"full_name":"Maskos, Michael","last_name":"Maskos","first_name":"Michael"},{"last_name":"Huber","full_name":"Huber, Klaus","id":"237","first_name":"Klaus"}],"volume":279,"publisher":"Elsevier BV","date_updated":"2023-02-10T15:24:46Z","citation":{"ama":"Kramer T, Scholz S, Maskos M, Huber K. Colloid–polymer mixtures in solution with refractive index matched acrylate colloids. <i>Journal of Colloid and Interface Science</i>. 2004;279(2):447-457. doi:<a href=\"https://doi.org/10.1016/j.jcis.2004.06.102\">10.1016/j.jcis.2004.06.102</a>","chicago":"Kramer, Thomas, Stephanie Scholz, Michael Maskos, and Klaus Huber. “Colloid–Polymer Mixtures in Solution with Refractive Index Matched Acrylate Colloids.” <i>Journal of Colloid and Interface Science</i> 279, no. 2 (2004): 447–57. <a href=\"https://doi.org/10.1016/j.jcis.2004.06.102\">https://doi.org/10.1016/j.jcis.2004.06.102</a>.","ieee":"T. Kramer, S. Scholz, M. Maskos, and K. Huber, “Colloid–polymer mixtures in solution with refractive index matched acrylate colloids,” <i>Journal of Colloid and Interface Science</i>, vol. 279, no. 2, pp. 447–457, 2004, doi: <a href=\"https://doi.org/10.1016/j.jcis.2004.06.102\">10.1016/j.jcis.2004.06.102</a>.","apa":"Kramer, T., Scholz, S., Maskos, M., &#38; Huber, K. (2004). Colloid–polymer mixtures in solution with refractive index matched acrylate colloids. <i>Journal of Colloid and Interface Science</i>, <i>279</i>(2), 447–457. <a href=\"https://doi.org/10.1016/j.jcis.2004.06.102\">https://doi.org/10.1016/j.jcis.2004.06.102</a>","mla":"Kramer, Thomas, et al. “Colloid–Polymer Mixtures in Solution with Refractive Index Matched Acrylate Colloids.” <i>Journal of Colloid and Interface Science</i>, vol. 279, no. 2, Elsevier BV, 2004, pp. 447–57, doi:<a href=\"https://doi.org/10.1016/j.jcis.2004.06.102\">10.1016/j.jcis.2004.06.102</a>.","bibtex":"@article{Kramer_Scholz_Maskos_Huber_2004, title={Colloid–polymer mixtures in solution with refractive index matched acrylate colloids}, volume={279}, DOI={<a href=\"https://doi.org/10.1016/j.jcis.2004.06.102\">10.1016/j.jcis.2004.06.102</a>}, number={2}, journal={Journal of Colloid and Interface Science}, publisher={Elsevier BV}, author={Kramer, Thomas and Scholz, Stephanie and Maskos, Michael and Huber, Klaus}, year={2004}, pages={447–457} }","short":"T. Kramer, S. Scholz, M. Maskos, K. Huber, Journal of Colloid and Interface Science 279 (2004) 447–457."},"intvolume":"       279","page":"447-457","year":"2004","issue":"2","publication_status":"published","publication_identifier":{"issn":["0021-9797"]}},{"publication":"Synthetic Metals","type":"journal_article","status":"public","department":[{"_id":"313"},{"_id":"638"}],"user_id":"254","_id":"39985","language":[{"iso":"eng"}],"keyword":["Materials Chemistry","Metals and Alloys","Mechanical Engineering","Mechanics of Materials","Condensed Matter Physics","Electronic","Optical and Magnetic Materials"],"issue":"3","publication_identifier":{"issn":["0379-6779"]},"publication_status":"published","page":"271-275","intvolume":"       141","citation":{"apa":"Röder, T., Kitzerow, H.-S., &#38; Hummelen, J. C. (2003). Morphology and fluorescence quenching in photovoltaic samples containing fullerene and poly(p-phenylene-vinylene) derivatives. <i>Synthetic Metals</i>, <i>141</i>(3), 271–275. <a href=\"https://doi.org/10.1016/s0379-6779(03)00412-0\">https://doi.org/10.1016/s0379-6779(03)00412-0</a>","bibtex":"@article{Röder_Kitzerow_Hummelen_2003, title={Morphology and fluorescence quenching in photovoltaic samples containing fullerene and poly(p-phenylene-vinylene) derivatives}, volume={141}, DOI={<a href=\"https://doi.org/10.1016/s0379-6779(03)00412-0\">10.1016/s0379-6779(03)00412-0</a>}, number={3}, journal={Synthetic Metals}, publisher={Elsevier BV}, author={Röder, T and Kitzerow, Heinz-Siegfried and Hummelen, J.C}, year={2003}, pages={271–275} }","mla":"Röder, T., et al. “Morphology and Fluorescence Quenching in Photovoltaic Samples Containing Fullerene and Poly(p-Phenylene-Vinylene) Derivatives.” <i>Synthetic Metals</i>, vol. 141, no. 3, Elsevier BV, 2003, pp. 271–75, doi:<a href=\"https://doi.org/10.1016/s0379-6779(03)00412-0\">10.1016/s0379-6779(03)00412-0</a>.","short":"T. Röder, H.-S. Kitzerow, J.C. Hummelen, Synthetic Metals 141 (2003) 271–275.","ama":"Röder T, Kitzerow H-S, Hummelen JC. Morphology and fluorescence quenching in photovoltaic samples containing fullerene and poly(p-phenylene-vinylene) derivatives. <i>Synthetic Metals</i>. 2003;141(3):271-275. doi:<a href=\"https://doi.org/10.1016/s0379-6779(03)00412-0\">10.1016/s0379-6779(03)00412-0</a>","chicago":"Röder, T, Heinz-Siegfried Kitzerow, and J.C Hummelen. “Morphology and Fluorescence Quenching in Photovoltaic Samples Containing Fullerene and Poly(p-Phenylene-Vinylene) Derivatives.” <i>Synthetic Metals</i> 141, no. 3 (2003): 271–75. <a href=\"https://doi.org/10.1016/s0379-6779(03)00412-0\">https://doi.org/10.1016/s0379-6779(03)00412-0</a>.","ieee":"T. Röder, H.-S. Kitzerow, and J. C. Hummelen, “Morphology and fluorescence quenching in photovoltaic samples containing fullerene and poly(p-phenylene-vinylene) derivatives,” <i>Synthetic Metals</i>, vol. 141, no. 3, pp. 271–275, 2003, doi: <a href=\"https://doi.org/10.1016/s0379-6779(03)00412-0\">10.1016/s0379-6779(03)00412-0</a>."},"year":"2003","volume":141,"author":[{"last_name":"Röder","full_name":"Röder, T","first_name":"T"},{"first_name":"Heinz-Siegfried","last_name":"Kitzerow","full_name":"Kitzerow, Heinz-Siegfried","id":"254"},{"full_name":"Hummelen, J.C","last_name":"Hummelen","first_name":"J.C"}],"date_created":"2023-01-25T12:06:23Z","date_updated":"2023-01-25T12:09:38Z","publisher":"Elsevier BV","doi":"10.1016/s0379-6779(03)00412-0","title":"Morphology and fluorescence quenching in photovoltaic samples containing fullerene and poly(p-phenylene-vinylene) derivatives"},{"doi":"10.1016/s0167-9317(03)00146-1","title":"Nanometer scale organic thin film transistors with Pentacene","author":[{"first_name":"Ch.","last_name":"Pannemann","full_name":"Pannemann, Ch."},{"last_name":"Diekmann","full_name":"Diekmann, T.","first_name":"T."},{"first_name":"Ulrich","full_name":"Hilleringmann, Ulrich","id":"20179","last_name":"Hilleringmann"}],"date_created":"2023-01-25T08:39:40Z","volume":"67-68","publisher":"Elsevier BV","date_updated":"2023-03-21T10:04:43Z","citation":{"ieee":"Ch. Pannemann, T. Diekmann, and U. Hilleringmann, “Nanometer scale organic thin film transistors with Pentacene,” <i>Microelectronic Engineering</i>, vol. 67–68, pp. 845–852, 2003, doi: <a href=\"https://doi.org/10.1016/s0167-9317(03)00146-1\">10.1016/s0167-9317(03)00146-1</a>.","chicago":"Pannemann, Ch., T. Diekmann, and Ulrich Hilleringmann. “Nanometer Scale Organic Thin Film Transistors with Pentacene.” <i>Microelectronic Engineering</i> 67–68 (2003): 845–52. <a href=\"https://doi.org/10.1016/s0167-9317(03)00146-1\">https://doi.org/10.1016/s0167-9317(03)00146-1</a>.","ama":"Pannemann Ch, Diekmann T, Hilleringmann U. Nanometer scale organic thin film transistors with Pentacene. <i>Microelectronic Engineering</i>. 2003;67-68:845-852. doi:<a href=\"https://doi.org/10.1016/s0167-9317(03)00146-1\">10.1016/s0167-9317(03)00146-1</a>","mla":"Pannemann, Ch., et al. “Nanometer Scale Organic Thin Film Transistors with Pentacene.” <i>Microelectronic Engineering</i>, vol. 67–68, Elsevier BV, 2003, pp. 845–52, doi:<a href=\"https://doi.org/10.1016/s0167-9317(03)00146-1\">10.1016/s0167-9317(03)00146-1</a>.","bibtex":"@article{Pannemann_Diekmann_Hilleringmann_2003, title={Nanometer scale organic thin film transistors with Pentacene}, volume={67–68}, DOI={<a href=\"https://doi.org/10.1016/s0167-9317(03)00146-1\">10.1016/s0167-9317(03)00146-1</a>}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Pannemann, Ch. and Diekmann, T. and Hilleringmann, Ulrich}, year={2003}, pages={845–852} }","short":"Ch. Pannemann, T. Diekmann, U. Hilleringmann, Microelectronic Engineering 67–68 (2003) 845–852.","apa":"Pannemann, Ch., Diekmann, T., &#38; Hilleringmann, U. (2003). Nanometer scale organic thin film transistors with Pentacene. <i>Microelectronic Engineering</i>, <i>67–68</i>, 845–852. <a href=\"https://doi.org/10.1016/s0167-9317(03)00146-1\">https://doi.org/10.1016/s0167-9317(03)00146-1</a>"},"page":"845-852","year":"2003","publication_status":"published","publication_identifier":{"issn":["0167-9317"]},"language":[{"iso":"eng"}],"keyword":["Electrical and Electronic Engineering","Surfaces","Coatings and Films","Condensed Matter Physics","Atomic and Molecular Physics","and Optics","Electronic","Optical and Magnetic Materials"],"user_id":"20179","department":[{"_id":"59"}],"_id":"39851","status":"public","type":"journal_article","publication":"Microelectronic Engineering"},{"publication":"IEEE Transactions on Industrial Electronics","type":"journal_article","status":"public","department":[{"_id":"52"}],"user_id":"66","_id":"29998","language":[{"iso":"eng"}],"extern":"1","keyword":["Electrical and Electronic Engineering","Control and Systems Engineering"],"issue":"5","publication_identifier":{"issn":["0278-0046"]},"publication_status":"published","intvolume":"        49","page":"1081-1092","citation":{"bibtex":"@article{Böcker_Janning_Jebenstreit_2002, title={High dynamic control of a three-level voltage-source-converter drive for a main strip mill}, volume={49}, DOI={<a href=\"https://doi.org/10.1109/tie.2002.803220\">10.1109/tie.2002.803220</a>}, number={5}, journal={IEEE Transactions on Industrial Electronics}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Böcker, Joachim and Janning, Jörg and Jebenstreit, Helmut}, year={2002}, pages={1081–1092} }","mla":"Böcker, Joachim, et al. “High Dynamic Control of a Three-Level Voltage-Source-Converter Drive for a Main Strip Mill.” <i>IEEE Transactions on Industrial Electronics</i>, vol. 49, no. 5, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 1081–92, doi:<a href=\"https://doi.org/10.1109/tie.2002.803220\">10.1109/tie.2002.803220</a>.","short":"J. Böcker, J. Janning, H. Jebenstreit, IEEE Transactions on Industrial Electronics 49 (2002) 1081–1092.","apa":"Böcker, J., Janning, J., &#38; Jebenstreit, H. (2002). High dynamic control of a three-level voltage-source-converter drive for a main strip mill. <i>IEEE Transactions on Industrial Electronics</i>, <i>49</i>(5), 1081–1092. <a href=\"https://doi.org/10.1109/tie.2002.803220\">https://doi.org/10.1109/tie.2002.803220</a>","ama":"Böcker J, Janning J, Jebenstreit H. High dynamic control of a three-level voltage-source-converter drive for a main strip mill. <i>IEEE Transactions on Industrial Electronics</i>. 2002;49(5):1081-1092. doi:<a href=\"https://doi.org/10.1109/tie.2002.803220\">10.1109/tie.2002.803220</a>","chicago":"Böcker, Joachim, Jörg Janning, and Helmut Jebenstreit. “High Dynamic Control of a Three-Level Voltage-Source-Converter Drive for a Main Strip Mill.” <i>IEEE Transactions on Industrial Electronics</i> 49, no. 5 (2002): 1081–92. <a href=\"https://doi.org/10.1109/tie.2002.803220\">https://doi.org/10.1109/tie.2002.803220</a>.","ieee":"J. Böcker, J. Janning, and H. Jebenstreit, “High dynamic control of a three-level voltage-source-converter drive for a main strip mill,” <i>IEEE Transactions on Industrial Electronics</i>, vol. 49, no. 5, pp. 1081–1092, 2002, doi: <a href=\"https://doi.org/10.1109/tie.2002.803220\">10.1109/tie.2002.803220</a>."},"year":"2002","volume":49,"author":[{"full_name":"Böcker, Joachim","id":"66","last_name":"Böcker","orcid":"0000-0002-8480-7295","first_name":"Joachim"},{"first_name":"Jörg","last_name":"Janning","full_name":"Janning, Jörg"},{"first_name":"Helmut","last_name":"Jebenstreit","full_name":"Jebenstreit, Helmut"}],"date_created":"2022-02-23T13:23:46Z","date_updated":"2022-03-17T09:50:08Z","publisher":"Institute of Electrical and Electronics Engineers (IEEE)","doi":"10.1109/tie.2002.803220","title":"High dynamic control of a three-level voltage-source-converter drive for a main strip mill"},{"status":"public","type":"journal_article","publication":"IEEE Transactions on Electron Devices","language":[{"iso":"eng"}],"keyword":["Electrical and Electronic Engineering","Electronic","Optical and Magnetic Materials"],"user_id":"20179","department":[{"_id":"59"}],"_id":"39904","citation":{"apa":"Hilleringmann, U., &#38; Goser, K. (2002). Optoelectronic system integration on silicon: waveguides, photodetectors, and VLSI CMOS circuits on one chip. <i>IEEE Transactions on Electron Devices</i>, <i>42</i>(5), 841–846. <a href=\"https://doi.org/10.1109/16.381978\">https://doi.org/10.1109/16.381978</a>","short":"U. Hilleringmann, K. Goser, IEEE Transactions on Electron Devices 42 (2002) 841–846.","bibtex":"@article{Hilleringmann_Goser_2002, title={Optoelectronic system integration on silicon: waveguides, photodetectors, and VLSI CMOS circuits on one chip}, volume={42}, DOI={<a href=\"https://doi.org/10.1109/16.381978\">10.1109/16.381978</a>}, number={5}, journal={IEEE Transactions on Electron Devices}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Hilleringmann, Ulrich and Goser, K.}, year={2002}, pages={841–846} }","mla":"Hilleringmann, Ulrich, and K. Goser. “Optoelectronic System Integration on Silicon: Waveguides, Photodetectors, and VLSI CMOS Circuits on One Chip.” <i>IEEE Transactions on Electron Devices</i>, vol. 42, no. 5, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 841–46, doi:<a href=\"https://doi.org/10.1109/16.381978\">10.1109/16.381978</a>.","ieee":"U. Hilleringmann and K. Goser, “Optoelectronic system integration on silicon: waveguides, photodetectors, and VLSI CMOS circuits on one chip,” <i>IEEE Transactions on Electron Devices</i>, vol. 42, no. 5, pp. 841–846, 2002, doi: <a href=\"https://doi.org/10.1109/16.381978\">10.1109/16.381978</a>.","chicago":"Hilleringmann, Ulrich, and K. Goser. “Optoelectronic System Integration on Silicon: Waveguides, Photodetectors, and VLSI CMOS Circuits on One Chip.” <i>IEEE Transactions on Electron Devices</i> 42, no. 5 (2002): 841–46. <a href=\"https://doi.org/10.1109/16.381978\">https://doi.org/10.1109/16.381978</a>.","ama":"Hilleringmann U, Goser K. Optoelectronic system integration on silicon: waveguides, photodetectors, and VLSI CMOS circuits on one chip. <i>IEEE Transactions on Electron Devices</i>. 2002;42(5):841-846. doi:<a href=\"https://doi.org/10.1109/16.381978\">10.1109/16.381978</a>"},"page":"841-846","intvolume":"        42","year":"2002","issue":"5","publication_status":"published","publication_identifier":{"issn":["0018-9383"]},"doi":"10.1109/16.381978","title":"Optoelectronic system integration on silicon: waveguides, photodetectors, and VLSI CMOS circuits on one chip","author":[{"last_name":"Hilleringmann","full_name":"Hilleringmann, Ulrich","id":"20179","first_name":"Ulrich"},{"first_name":"K.","last_name":"Goser","full_name":"Goser, K."}],"date_created":"2023-01-25T09:22:34Z","volume":42,"date_updated":"2023-03-21T09:51:52Z","publisher":"Institute of Electrical and Electronics Engineers (IEEE)"},{"issue":"1-4","year":"2002","date_created":"2023-01-25T09:26:21Z","publisher":"Elsevier BV","title":"Characterization of submicron NMOS devices due to visible light emission","publication":"Microelectronic Engineering","language":[{"iso":"eng"}],"keyword":["Electrical and Electronic Engineering","Surfaces","Coatings and Films","Condensed Matter Physics","Atomic and Molecular Physics","and Optics","Electronic","Optical and Magnetic Materials"],"publication_identifier":{"issn":["0167-9317"]},"publication_status":"published","intvolume":"        21","page":"363-366","citation":{"ama":"Schönstein I, Müller J, Hilleringmann U, Goser K. Characterization of submicron NMOS devices due to visible light emission. <i>Microelectronic Engineering</i>. 2002;21(1-4):363-366. doi:<a href=\"https://doi.org/10.1016/0167-9317(93)90092-j\">10.1016/0167-9317(93)90092-j</a>","chicago":"Schönstein, I., J. Müller, Ulrich Hilleringmann, and K. Goser. “Characterization of Submicron NMOS Devices Due to Visible Light Emission.” <i>Microelectronic Engineering</i> 21, no. 1–4 (2002): 363–66. <a href=\"https://doi.org/10.1016/0167-9317(93)90092-j\">https://doi.org/10.1016/0167-9317(93)90092-j</a>.","ieee":"I. Schönstein, J. Müller, U. Hilleringmann, and K. Goser, “Characterization of submicron NMOS devices due to visible light emission,” <i>Microelectronic Engineering</i>, vol. 21, no. 1–4, pp. 363–366, 2002, doi: <a href=\"https://doi.org/10.1016/0167-9317(93)90092-j\">10.1016/0167-9317(93)90092-j</a>.","short":"I. Schönstein, J. Müller, U. Hilleringmann, K. Goser, Microelectronic Engineering 21 (2002) 363–366.","bibtex":"@article{Schönstein_Müller_Hilleringmann_Goser_2002, title={Characterization of submicron NMOS devices due to visible light emission}, volume={21}, DOI={<a href=\"https://doi.org/10.1016/0167-9317(93)90092-j\">10.1016/0167-9317(93)90092-j</a>}, number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Schönstein, I. and Müller, J. and Hilleringmann, Ulrich and Goser, K.}, year={2002}, pages={363–366} }","mla":"Schönstein, I., et al. “Characterization of Submicron NMOS Devices Due to Visible Light Emission.” <i>Microelectronic Engineering</i>, vol. 21, no. 1–4, Elsevier BV, 2002, pp. 363–66, doi:<a href=\"https://doi.org/10.1016/0167-9317(93)90092-j\">10.1016/0167-9317(93)90092-j</a>.","apa":"Schönstein, I., Müller, J., Hilleringmann, U., &#38; Goser, K. (2002). Characterization of submicron NMOS devices due to visible light emission. <i>Microelectronic Engineering</i>, <i>21</i>(1–4), 363–366. <a href=\"https://doi.org/10.1016/0167-9317(93)90092-j\">https://doi.org/10.1016/0167-9317(93)90092-j</a>"},"volume":21,"author":[{"full_name":"Schönstein, I.","last_name":"Schönstein","first_name":"I."},{"last_name":"Müller","full_name":"Müller, J.","first_name":"J."},{"first_name":"Ulrich","full_name":"Hilleringmann, Ulrich","id":"20179","last_name":"Hilleringmann"},{"first_name":"K.","full_name":"Goser, K.","last_name":"Goser"}],"date_updated":"2023-03-21T09:50:03Z","doi":"10.1016/0167-9317(93)90092-j","type":"journal_article","status":"public","department":[{"_id":"59"}],"user_id":"20179","_id":"39912"}]