---
_id: '40433'
author:
- first_name: Chuan-Ding
  full_name: Dong, Chuan-Ding
  id: '67188'
  last_name: Dong
- first_name: Stefan
  full_name: Schumacher, Stefan
  id: '27271'
  last_name: Schumacher
  orcid: 0000-0003-4042-4951
citation:
  ama: Dong C-D, Schumacher S. Microscopic Insights into Charge Formation and Energetics
    in n-Doped Organic Semiconductors. <i>The Journal of Physical Chemistry C</i>.
    2021;125(40):21824-21830. doi:<a href="https://doi.org/10.1021/acs.jpcc.1c05666">10.1021/acs.jpcc.1c05666</a>
  apa: Dong, C.-D., &#38; Schumacher, S. (2021). Microscopic Insights into Charge
    Formation and Energetics in n-Doped Organic Semiconductors. <i>The Journal of
    Physical Chemistry C</i>, <i>125</i>(40), 21824–21830. <a href="https://doi.org/10.1021/acs.jpcc.1c05666">https://doi.org/10.1021/acs.jpcc.1c05666</a>
  bibtex: '@article{Dong_Schumacher_2021, title={Microscopic Insights into Charge
    Formation and Energetics in n-Doped Organic Semiconductors}, volume={125}, DOI={<a
    href="https://doi.org/10.1021/acs.jpcc.1c05666">10.1021/acs.jpcc.1c05666</a>},
    number={40}, journal={The Journal of Physical Chemistry C}, publisher={American
    Chemical Society (ACS)}, author={Dong, Chuan-Ding and Schumacher, Stefan}, year={2021},
    pages={21824–21830} }'
  chicago: 'Dong, Chuan-Ding, and Stefan Schumacher. “Microscopic Insights into Charge
    Formation and Energetics in N-Doped Organic Semiconductors.” <i>The Journal of
    Physical Chemistry C</i> 125, no. 40 (2021): 21824–30. <a href="https://doi.org/10.1021/acs.jpcc.1c05666">https://doi.org/10.1021/acs.jpcc.1c05666</a>.'
  ieee: 'C.-D. Dong and S. Schumacher, “Microscopic Insights into Charge Formation
    and Energetics in n-Doped Organic Semiconductors,” <i>The Journal of Physical
    Chemistry C</i>, vol. 125, no. 40, pp. 21824–21830, 2021, doi: <a href="https://doi.org/10.1021/acs.jpcc.1c05666">10.1021/acs.jpcc.1c05666</a>.'
  mla: Dong, Chuan-Ding, and Stefan Schumacher. “Microscopic Insights into Charge
    Formation and Energetics in N-Doped Organic Semiconductors.” <i>The Journal of
    Physical Chemistry C</i>, vol. 125, no. 40, American Chemical Society (ACS), 2021,
    pp. 21824–30, doi:<a href="https://doi.org/10.1021/acs.jpcc.1c05666">10.1021/acs.jpcc.1c05666</a>.
  short: C.-D. Dong, S. Schumacher, The Journal of Physical Chemistry C 125 (2021)
    21824–21830.
date_created: 2023-01-26T15:49:13Z
date_updated: 2025-12-16T11:17:39Z
department:
- _id: '15'
- _id: '170'
- _id: '297'
- _id: '230'
- _id: '35'
- _id: '27'
doi: 10.1021/acs.jpcc.1c05666
intvolume: '       125'
issue: '40'
keyword:
- Surfaces
- Coatings and Films
- Physical and Theoretical Chemistry
- General Energy
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
page: 21824-21830
project:
- _id: '52'
  name: 'PC2: Computing Resources Provided by the Paderborn Center for Parallel Computing'
publication: The Journal of Physical Chemistry C
publication_identifier:
  issn:
  - 1932-7447
  - 1932-7455
publication_status: published
publisher: American Chemical Society (ACS)
status: public
title: Microscopic Insights into Charge Formation and Energetics in n-Doped Organic
  Semiconductors
type: journal_article
user_id: '16199'
volume: 125
year: '2021'
...
---
_id: '40379'
article_number: '106769'
author:
- first_name: Vladislav
  full_name: Sukharnikov, Vladislav
  last_name: Sukharnikov
- first_name: Polina
  full_name: Sharapova, Polina
  id: '60286'
  last_name: Sharapova
- first_name: Olga
  full_name: Tikhonova, Olga
  last_name: Tikhonova
citation:
  ama: Sukharnikov V, Sharapova P, Tikhonova O. Managing spectral properties and Schmidt
    mode content of squeezed vacuum light using sum-frequency converter. <i>Optics
    &#38;amp; Laser Technology</i>. 2021;136. doi:<a href="https://doi.org/10.1016/j.optlastec.2020.106769">10.1016/j.optlastec.2020.106769</a>
  apa: Sukharnikov, V., Sharapova, P., &#38; Tikhonova, O. (2021). Managing spectral
    properties and Schmidt mode content of squeezed vacuum light using sum-frequency
    converter. <i>Optics &#38;amp; Laser Technology</i>, <i>136</i>, Article 106769.
    <a href="https://doi.org/10.1016/j.optlastec.2020.106769">https://doi.org/10.1016/j.optlastec.2020.106769</a>
  bibtex: '@article{Sukharnikov_Sharapova_Tikhonova_2021, title={Managing spectral
    properties and Schmidt mode content of squeezed vacuum light using sum-frequency
    converter}, volume={136}, DOI={<a href="https://doi.org/10.1016/j.optlastec.2020.106769">10.1016/j.optlastec.2020.106769</a>},
    number={106769}, journal={Optics &#38;amp; Laser Technology}, publisher={Elsevier
    BV}, author={Sukharnikov, Vladislav and Sharapova, Polina and Tikhonova, Olga},
    year={2021} }'
  chicago: Sukharnikov, Vladislav, Polina Sharapova, and Olga Tikhonova. “Managing
    Spectral Properties and Schmidt Mode Content of Squeezed Vacuum Light Using Sum-Frequency
    Converter.” <i>Optics &#38;amp; Laser Technology</i> 136 (2021). <a href="https://doi.org/10.1016/j.optlastec.2020.106769">https://doi.org/10.1016/j.optlastec.2020.106769</a>.
  ieee: 'V. Sukharnikov, P. Sharapova, and O. Tikhonova, “Managing spectral properties
    and Schmidt mode content of squeezed vacuum light using sum-frequency converter,”
    <i>Optics &#38;amp; Laser Technology</i>, vol. 136, Art. no. 106769, 2021, doi:
    <a href="https://doi.org/10.1016/j.optlastec.2020.106769">10.1016/j.optlastec.2020.106769</a>.'
  mla: Sukharnikov, Vladislav, et al. “Managing Spectral Properties and Schmidt Mode
    Content of Squeezed Vacuum Light Using Sum-Frequency Converter.” <i>Optics &#38;amp;
    Laser Technology</i>, vol. 136, 106769, Elsevier BV, 2021, doi:<a href="https://doi.org/10.1016/j.optlastec.2020.106769">10.1016/j.optlastec.2020.106769</a>.
  short: V. Sukharnikov, P. Sharapova, O. Tikhonova, Optics &#38;amp; Laser Technology
    136 (2021).
date_created: 2023-01-26T14:03:44Z
date_updated: 2025-12-16T11:27:32Z
department:
- _id: '15'
- _id: '569'
- _id: '170'
- _id: '230'
- _id: '35'
doi: 10.1016/j.optlastec.2020.106769
intvolume: '       136'
keyword:
- Electrical and Electronic Engineering
- Atomic and Molecular Physics
- and Optics
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
publication: Optics &amp; Laser Technology
publication_identifier:
  issn:
  - 0030-3992
publication_status: published
publisher: Elsevier BV
status: public
title: Managing spectral properties and Schmidt mode content of squeezed vacuum light
  using sum-frequency converter
type: journal_article
user_id: '16199'
volume: 136
year: '2021'
...
---
_id: '21542'
abstract:
- lang: eng
  text: Using near-field (NF) scan data to predict the far-field (FF) behaviour of
    radiating electronic systems represents a novel method to accompany the whole
    RF design process. This approach involves so-called Huygens' box as an efficient
    radiation model inside an electromagnetic (EM) simulation tool and then transforms
    the scanned NF measured data into the FF. For this, the basic idea of the Huygens'box
    principle and the NF-to-FF transformation are briefly presented. The NF is measured
    on the Huygens' box around a device under test using anNF scanner, recording the
    magnitude and phase of the site-related magnetic and electric components. A comparison
    between a fullwave simulation and the measurement results shows a good similarity
    in both the NF and the simulated and transformed FF.Thus, this method is applicable
    to predict the FF behaviour of any electronic system by measuring the NF. With
    this knowledge, the RF design can be improved due to allowing a significant reduction
    of EM compatibility failure at the end of the development flow. In addition, the
    very efficient FF radiation model can be used for detailed investigations in various
    environments and the impact of such an equivalent radiation source on other electronic
    systems can be assessed.
author:
- first_name: Dominik
  full_name: Schröder, Dominik
  last_name: Schröder
- first_name: Sven
  full_name: Lange, Sven
  id: '38240'
  last_name: Lange
- first_name: Christian
  full_name: Hangmann, Christian
  last_name: Hangmann
- first_name: Christian
  full_name: Hedayat, Christian
  last_name: Hedayat
citation:
  ama: 'Schröder D, Lange S, Hangmann C, Hedayat C. Far-field prediction combining
    simulations with near-field measurements for EMI assessment of PCBs. In: <i>Tensorial
    Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis</i>.
    1st ed. Croyton, UK:  The Institution of Engineering and Technology (IET); 2020:315-346
    (32). doi:<a href="https://doi.org/10.1049/pbcs072e_ch14">10.1049/pbcs072e_ch14</a>'
  apa: 'Schröder, D., Lange, S., Hangmann, C., &#38; Hedayat, C. (2020). Far-field
    prediction combining simulations with near-field measurements for EMI assessment
    of PCBs. In <i>Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity
    and EMC Analysis</i> (1st ed., pp. 315-346 (32)). Croyton, UK:  The Institution
    of Engineering and Technology (IET). <a href="https://doi.org/10.1049/pbcs072e_ch14">https://doi.org/10.1049/pbcs072e_ch14</a>'
  bibtex: '@inbook{Schröder_Lange_Hangmann_Hedayat_2020, place={Croyton, UK}, edition={1},
    title={Far-field prediction combining simulations with near-field measurements
    for EMI assessment of PCBs}, DOI={<a href="https://doi.org/10.1049/pbcs072e_ch14">10.1049/pbcs072e_ch14</a>},
    booktitle={Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity
    and EMC Analysis}, publisher={ The Institution of Engineering and Technology (IET)},
    author={Schröder, Dominik and Lange, Sven and Hangmann, Christian and Hedayat,
    Christian}, year={2020}, pages={315-346 (32)} }'
  chicago: 'Schröder, Dominik, Sven Lange, Christian Hangmann, and Christian Hedayat.
    “Far-Field Prediction Combining Simulations with near-Field Measurements for EMI
    Assessment of PCBs.” In <i>Tensorial Analysis of Networks (TAN) Modelling for
    PCB Signal Integrity and EMC Analysis</i>, 1st ed., 315-346 (32). Croyton, UK:  The
    Institution of Engineering and Technology (IET), 2020. <a href="https://doi.org/10.1049/pbcs072e_ch14">https://doi.org/10.1049/pbcs072e_ch14</a>.'
  ieee: 'D. Schröder, S. Lange, C. Hangmann, and C. Hedayat, “Far-field prediction
    combining simulations with near-field measurements for EMI assessment of PCBs,”
    in <i>Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity
    and EMC Analysis</i>, 1st ed., Croyton, UK:  The Institution of Engineering and
    Technology (IET), 2020, pp. 315-346 (32).'
  mla: Schröder, Dominik, et al. “Far-Field Prediction Combining Simulations with
    near-Field Measurements for EMI Assessment of PCBs.” <i>Tensorial Analysis of
    Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis</i>, 1st ed.,  The
    Institution of Engineering and Technology (IET), 2020, pp. 315-346 (32), doi:<a
    href="https://doi.org/10.1049/pbcs072e_ch14">10.1049/pbcs072e_ch14</a>.
  short: 'D. Schröder, S. Lange, C. Hangmann, C. Hedayat, in: Tensorial Analysis
    of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis, 1st ed.,  The
    Institution of Engineering and Technology (IET), Croyton, UK, 2020, pp. 315-346
    (32).'
date_created: 2021-03-18T13:49:49Z
date_updated: 2022-01-06T06:55:03Z
department:
- _id: '485'
doi: 10.1049/pbcs072e_ch14
edition: '1'
keyword:
- Huygens' box
- NF-to-FF transformation
- efficient FF radiation model
- FF behaviour
- EMI assessment
- PCB
- near-field measurements
- efficient radiation model
- far-field behaviour
- RF design process
- far-field prediction
- Huygens'box principle
- fullwave simulation
- electronic system radiation
- equivalent radiation source
- electromagnetic simulation tool
- near-field scan data
- EM compatibility failure reduction
language:
- iso: eng
main_file_link:
- url: https://digital-library.theiet.org/content/books/10.1049/pbcs072e_ch14
page: 315-346 (32)
place: Croyton, UK
project:
- _id: '52'
  name: Computing Resources Provided by the Paderborn Center for Parallel Computing
publication: Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity
  and EMC Analysis
publication_identifier:
  isbn:
  - '9781839530494'
  - '9781839530500'
publication_status: published
publisher: ' The Institution of Engineering and Technology (IET)'
related_material:
  record:
  - id: '21542'
    relation: other
    status: public
status: public
title: Far-field prediction combining simulations with near-field measurements for
  EMI assessment of PCBs
type: book_chapter
user_id: '38240'
year: '2020'
...
---
_id: '30033'
author:
- first_name: Marius
  full_name: Stender, Marius
  id: '41240'
  last_name: Stender
- first_name: Oliver
  full_name: Wallscheid, Oliver
  id: '11291'
  last_name: Wallscheid
  orcid: https://orcid.org/0000-0001-9362-8777
- first_name: Joachim
  full_name: Böcker, Joachim
  id: '66'
  last_name: Böcker
  orcid: 0000-0002-8480-7295
citation:
  ama: Stender M, Wallscheid O, Böcker J. Comparison of Gray-Box and Black-Box Two-Level
    Three-Phase Inverter Models for Electrical Drives. <i>IEEE Transactions on Industrial
    Electronics</i>. 2020;68(9):8646-8656. doi:<a href="https://doi.org/10.1109/tie.2020.3018060">10.1109/tie.2020.3018060</a>
  apa: Stender, M., Wallscheid, O., &#38; Böcker, J. (2020). Comparison of Gray-Box
    and Black-Box Two-Level Three-Phase Inverter Models for Electrical Drives. <i>IEEE
    Transactions on Industrial Electronics</i>, <i>68</i>(9), 8646–8656. <a href="https://doi.org/10.1109/tie.2020.3018060">https://doi.org/10.1109/tie.2020.3018060</a>
  bibtex: '@article{Stender_Wallscheid_Böcker_2020, title={Comparison of Gray-Box
    and Black-Box Two-Level Three-Phase Inverter Models for Electrical Drives}, volume={68},
    DOI={<a href="https://doi.org/10.1109/tie.2020.3018060">10.1109/tie.2020.3018060</a>},
    number={9}, journal={IEEE Transactions on Industrial Electronics}, publisher={Institute
    of Electrical and Electronics Engineers (IEEE)}, author={Stender, Marius and Wallscheid,
    Oliver and Böcker, Joachim}, year={2020}, pages={8646–8656} }'
  chicago: 'Stender, Marius, Oliver Wallscheid, and Joachim Böcker. “Comparison of
    Gray-Box and Black-Box Two-Level Three-Phase Inverter Models for Electrical Drives.”
    <i>IEEE Transactions on Industrial Electronics</i> 68, no. 9 (2020): 8646–56.
    <a href="https://doi.org/10.1109/tie.2020.3018060">https://doi.org/10.1109/tie.2020.3018060</a>.'
  ieee: 'M. Stender, O. Wallscheid, and J. Böcker, “Comparison of Gray-Box and Black-Box
    Two-Level Three-Phase Inverter Models for Electrical Drives,” <i>IEEE Transactions
    on Industrial Electronics</i>, vol. 68, no. 9, pp. 8646–8656, 2020, doi: <a href="https://doi.org/10.1109/tie.2020.3018060">10.1109/tie.2020.3018060</a>.'
  mla: Stender, Marius, et al. “Comparison of Gray-Box and Black-Box Two-Level Three-Phase
    Inverter Models for Electrical Drives.” <i>IEEE Transactions on Industrial Electronics</i>,
    vol. 68, no. 9, Institute of Electrical and Electronics Engineers (IEEE), 2020,
    pp. 8646–56, doi:<a href="https://doi.org/10.1109/tie.2020.3018060">10.1109/tie.2020.3018060</a>.
  short: M. Stender, O. Wallscheid, J. Böcker, IEEE Transactions on Industrial Electronics
    68 (2020) 8646–8656.
date_created: 2022-02-24T09:26:06Z
date_updated: 2022-02-24T09:26:45Z
department:
- _id: '52'
doi: 10.1109/tie.2020.3018060
intvolume: '        68'
issue: '9'
keyword:
- Electrical and Electronic Engineering
- Control and Systems Engineering
language:
- iso: eng
page: 8646-8656
publication: IEEE Transactions on Industrial Electronics
publication_identifier:
  issn:
  - 0278-0046
  - 1557-9948
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: Comparison of Gray-Box and Black-Box Two-Level Three-Phase Inverter Models
  for Electrical Drives
type: journal_article
user_id: '41240'
volume: 68
year: '2020'
...
---
_id: '35580'
author:
- first_name: Moritz
  full_name: Schulze Darup, Moritz
  last_name: Schulze Darup
citation:
  ama: Schulze Darup M. Encrypted polynomial control based on tailored two‐party computation.
    <i>International Journal of Robust and Nonlinear Control</i>. 2020;30(11):4168-4187.
    doi:<a href="https://doi.org/10.1002/rnc.5003">10.1002/rnc.5003</a>
  apa: Schulze Darup, M. (2020). Encrypted polynomial control based on tailored two‐party
    computation. <i>International Journal of Robust and Nonlinear Control</i>, <i>30</i>(11),
    4168–4187. <a href="https://doi.org/10.1002/rnc.5003">https://doi.org/10.1002/rnc.5003</a>
  bibtex: '@article{Schulze Darup_2020, title={Encrypted polynomial control based
    on tailored two‐party computation}, volume={30}, DOI={<a href="https://doi.org/10.1002/rnc.5003">10.1002/rnc.5003</a>},
    number={11}, journal={International Journal of Robust and Nonlinear Control},
    publisher={Wiley}, author={Schulze Darup, Moritz}, year={2020}, pages={4168–4187}
    }'
  chicago: 'Schulze Darup, Moritz. “Encrypted Polynomial Control Based on Tailored
    Two‐party Computation.” <i>International Journal of Robust and Nonlinear Control</i>
    30, no. 11 (2020): 4168–87. <a href="https://doi.org/10.1002/rnc.5003">https://doi.org/10.1002/rnc.5003</a>.'
  ieee: 'M. Schulze Darup, “Encrypted polynomial control based on tailored two‐party
    computation,” <i>International Journal of Robust and Nonlinear Control</i>, vol.
    30, no. 11, pp. 4168–4187, 2020, doi: <a href="https://doi.org/10.1002/rnc.5003">10.1002/rnc.5003</a>.'
  mla: Schulze Darup, Moritz. “Encrypted Polynomial Control Based on Tailored Two‐party
    Computation.” <i>International Journal of Robust and Nonlinear Control</i>, vol.
    30, no. 11, Wiley, 2020, pp. 4168–87, doi:<a href="https://doi.org/10.1002/rnc.5003">10.1002/rnc.5003</a>.
  short: M. Schulze Darup, International Journal of Robust and Nonlinear Control 30
    (2020) 4168–4187.
date_created: 2023-01-09T16:36:47Z
date_updated: 2023-01-09T16:36:57Z
department:
- _id: '622'
doi: 10.1002/rnc.5003
intvolume: '        30'
issue: '11'
keyword:
- Electrical and Electronic Engineering
- Industrial and Manufacturing Engineering
- Mechanical Engineering
- Aerospace Engineering
- Biomedical Engineering
- General Chemical Engineering
- Control and Systems Engineering
language:
- iso: eng
page: 4168-4187
publication: International Journal of Robust and Nonlinear Control
publication_identifier:
  issn:
  - 1049-8923
  - 1099-1239
publication_status: published
publisher: Wiley
status: public
title: Encrypted polynomial control based on tailored two‐party computation
type: journal_article
user_id: '158'
volume: 30
year: '2020'
...
---
_id: '35585'
author:
- first_name: Jingyi
  full_name: Lu, Jingyi
  last_name: Lu
- first_name: Alex S.
  full_name: Leong, Alex S.
  last_name: Leong
- first_name: Daniel E.
  full_name: Quevedo, Daniel E.
  last_name: Quevedo
citation:
  ama: Lu J, Leong AS, Quevedo DE. Optimal event‐triggered transmission scheduling
    for privacy‐preserving wireless state estimation. <i>International Journal of
    Robust and Nonlinear Control</i>. 2020;30(11):4205-4224. doi:<a href="https://doi.org/10.1002/rnc.4910">10.1002/rnc.4910</a>
  apa: Lu, J., Leong, A. S., &#38; Quevedo, D. E. (2020). Optimal event‐triggered
    transmission scheduling for privacy‐preserving wireless state estimation. <i>International
    Journal of Robust and Nonlinear Control</i>, <i>30</i>(11), 4205–4224. <a href="https://doi.org/10.1002/rnc.4910">https://doi.org/10.1002/rnc.4910</a>
  bibtex: '@article{Lu_Leong_Quevedo_2020, title={Optimal event‐triggered transmission
    scheduling for privacy‐preserving wireless state estimation}, volume={30}, DOI={<a
    href="https://doi.org/10.1002/rnc.4910">10.1002/rnc.4910</a>}, number={11}, journal={International
    Journal of Robust and Nonlinear Control}, publisher={Wiley}, author={Lu, Jingyi
    and Leong, Alex S. and Quevedo, Daniel E.}, year={2020}, pages={4205–4224} }'
  chicago: 'Lu, Jingyi, Alex S. Leong, and Daniel E. Quevedo. “Optimal Event‐triggered
    Transmission Scheduling for Privacy‐preserving Wireless State Estimation.” <i>International
    Journal of Robust and Nonlinear Control</i> 30, no. 11 (2020): 4205–24. <a href="https://doi.org/10.1002/rnc.4910">https://doi.org/10.1002/rnc.4910</a>.'
  ieee: 'J. Lu, A. S. Leong, and D. E. Quevedo, “Optimal event‐triggered transmission
    scheduling for privacy‐preserving wireless state estimation,” <i>International
    Journal of Robust and Nonlinear Control</i>, vol. 30, no. 11, pp. 4205–4224, 2020,
    doi: <a href="https://doi.org/10.1002/rnc.4910">10.1002/rnc.4910</a>.'
  mla: Lu, Jingyi, et al. “Optimal Event‐triggered Transmission Scheduling for Privacy‐preserving
    Wireless State Estimation.” <i>International Journal of Robust and Nonlinear Control</i>,
    vol. 30, no. 11, Wiley, 2020, pp. 4205–24, doi:<a href="https://doi.org/10.1002/rnc.4910">10.1002/rnc.4910</a>.
  short: J. Lu, A.S. Leong, D.E. Quevedo, International Journal of Robust and Nonlinear
    Control 30 (2020) 4205–4224.
date_created: 2023-01-09T16:46:15Z
date_updated: 2023-01-09T16:46:29Z
department:
- _id: '57'
doi: 10.1002/rnc.4910
intvolume: '        30'
issue: '11'
keyword:
- Electrical and Electronic Engineering
- Industrial and Manufacturing Engineering
- Mechanical Engineering
- Aerospace Engineering
- Biomedical Engineering
- General Chemical Engineering
- Control and Systems Engineering
language:
- iso: eng
page: 4205-4224
publication: International Journal of Robust and Nonlinear Control
publication_identifier:
  issn:
  - 1049-8923
  - 1099-1239
publication_status: published
publisher: Wiley
status: public
title: Optimal event‐triggered transmission scheduling for privacy‐preserving wireless
  state estimation
type: journal_article
user_id: '158'
volume: 30
year: '2020'
...
---
_id: '35723'
abstract:
- lang: eng
  text: <jats:p>The development of renewable energies and smart mobility has profoundly
    impacted the future of the distribution grid. An increasing bidirectional energy
    flow stresses the assets of the distribution grid, especially medium voltage switchgear.
    This calls for improved maintenance strategies to prevent critical failures. Predictive
    maintenance, a maintenance strategy relying on current condition data of assets,
    serves as a guideline. Novel sensors covering thermal, mechanical, and partial
    discharge aspects of switchgear, enable continuous condition monitoring of some
    of the most critical assets of the distribution grid. Combined with machine learning
    algorithms, the demands put on the distribution grid by the energy and mobility
    revolutions can be handled. In this paper, we review the current state-of-the-art
    of all aspects of condition monitoring for medium voltage switchgear. Furthermore,
    we present an approach to develop a predictive maintenance system based on novel
    sensors and machine learning. We show how the existing medium voltage grid infrastructure
    can adapt these new needs on an economic scale.</jats:p>
article_number: '2099'
author:
- first_name: Martin W.
  full_name: Hoffmann, Martin W.
  last_name: Hoffmann
- first_name: Stephan
  full_name: Wildermuth, Stephan
  last_name: Wildermuth
- first_name: Ralf
  full_name: Gitzel, Ralf
  last_name: Gitzel
- first_name: Aydin
  full_name: Boyaci, Aydin
  last_name: Boyaci
- first_name: Jörg
  full_name: Gebhardt, Jörg
  last_name: Gebhardt
- first_name: Holger
  full_name: Kaul, Holger
  last_name: Kaul
- first_name: Ido
  full_name: Amihai, Ido
  last_name: Amihai
- first_name: Bodo
  full_name: Forg, Bodo
  last_name: Forg
- first_name: Michael
  full_name: Suriyah, Michael
  last_name: Suriyah
- first_name: Thomas
  full_name: Leibfried, Thomas
  last_name: Leibfried
- first_name: Volker
  full_name: Stich, Volker
  last_name: Stich
- first_name: Jan
  full_name: Hicking, Jan
  last_name: Hicking
- first_name: Martin
  full_name: Bremer, Martin
  last_name: Bremer
- first_name: Lars
  full_name: Kaminski, Lars
  last_name: Kaminski
- first_name: Daniel
  full_name: Beverungen, Daniel
  id: '59677'
  last_name: Beverungen
- first_name: Philipp
  full_name: zur Heiden, Philipp
  id: '64394'
  last_name: zur Heiden
- first_name: Tanja
  full_name: Tornede, Tanja
  last_name: Tornede
citation:
  ama: Hoffmann MW, Wildermuth S, Gitzel R, et al. Integration of Novel Sensors and
    Machine Learning for Predictive Maintenance in Medium Voltage Switchgear to Enable
    the Energy and Mobility Revolutions. <i>Sensors</i>. 2020;20(7). doi:<a href="https://doi.org/10.3390/s20072099">10.3390/s20072099</a>
  apa: Hoffmann, M. W., Wildermuth, S., Gitzel, R., Boyaci, A., Gebhardt, J., Kaul,
    H., Amihai, I., Forg, B., Suriyah, M., Leibfried, T., Stich, V., Hicking, J.,
    Bremer, M., Kaminski, L., Beverungen, D., zur Heiden, P., &#38; Tornede, T. (2020).
    Integration of Novel Sensors and Machine Learning for Predictive Maintenance in
    Medium Voltage Switchgear to Enable the Energy and Mobility Revolutions. <i>Sensors</i>,
    <i>20</i>(7), Article 2099. <a href="https://doi.org/10.3390/s20072099">https://doi.org/10.3390/s20072099</a>
  bibtex: '@article{Hoffmann_Wildermuth_Gitzel_Boyaci_Gebhardt_Kaul_Amihai_Forg_Suriyah_Leibfried_et
    al._2020, title={Integration of Novel Sensors and Machine Learning for Predictive
    Maintenance in Medium Voltage Switchgear to Enable the Energy and Mobility Revolutions},
    volume={20}, DOI={<a href="https://doi.org/10.3390/s20072099">10.3390/s20072099</a>},
    number={72099}, journal={Sensors}, publisher={MDPI AG}, author={Hoffmann, Martin
    W. and Wildermuth, Stephan and Gitzel, Ralf and Boyaci, Aydin and Gebhardt, Jörg
    and Kaul, Holger and Amihai, Ido and Forg, Bodo and Suriyah, Michael and Leibfried,
    Thomas and et al.}, year={2020} }'
  chicago: Hoffmann, Martin W., Stephan Wildermuth, Ralf Gitzel, Aydin Boyaci, Jörg
    Gebhardt, Holger Kaul, Ido Amihai, et al. “Integration of Novel Sensors and Machine
    Learning for Predictive Maintenance in Medium Voltage Switchgear to Enable the
    Energy and Mobility Revolutions.” <i>Sensors</i> 20, no. 7 (2020). <a href="https://doi.org/10.3390/s20072099">https://doi.org/10.3390/s20072099</a>.
  ieee: 'M. W. Hoffmann <i>et al.</i>, “Integration of Novel Sensors and Machine Learning
    for Predictive Maintenance in Medium Voltage Switchgear to Enable the Energy and
    Mobility Revolutions,” <i>Sensors</i>, vol. 20, no. 7, Art. no. 2099, 2020, doi:
    <a href="https://doi.org/10.3390/s20072099">10.3390/s20072099</a>.'
  mla: Hoffmann, Martin W., et al. “Integration of Novel Sensors and Machine Learning
    for Predictive Maintenance in Medium Voltage Switchgear to Enable the Energy and
    Mobility Revolutions.” <i>Sensors</i>, vol. 20, no. 7, 2099, MDPI AG, 2020, doi:<a
    href="https://doi.org/10.3390/s20072099">10.3390/s20072099</a>.
  short: M.W. Hoffmann, S. Wildermuth, R. Gitzel, A. Boyaci, J. Gebhardt, H. Kaul,
    I. Amihai, B. Forg, M. Suriyah, T. Leibfried, V. Stich, J. Hicking, M. Bremer,
    L. Kaminski, D. Beverungen, P. zur Heiden, T. Tornede, Sensors 20 (2020).
date_created: 2023-01-10T09:39:14Z
date_updated: 2023-01-10T09:53:13Z
department:
- _id: '526'
doi: 10.3390/s20072099
intvolume: '        20'
issue: '7'
keyword:
- Electrical and Electronic Engineering
- Biochemistry
- Instrumentation
- Atomic and Molecular Physics
- and Optics
- Analytical Chemistry
language:
- iso: eng
publication: Sensors
publication_identifier:
  issn:
  - 1424-8220
publication_status: published
publisher: MDPI AG
status: public
title: Integration of Novel Sensors and Machine Learning for Predictive Maintenance
  in Medium Voltage Switchgear to Enable the Energy and Mobility Revolutions
type: journal_article
user_id: '21671'
volume: 20
year: '2020'
...
---
_id: '34088'
article_number: '113118'
author:
- first_name: Julius
  full_name: Bürger, Julius
  id: '46952'
  last_name: Bürger
- first_name: Thomas
  full_name: Riedl, Thomas
  id: '36950'
  last_name: Riedl
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
citation:
  ama: Bürger J, Riedl T, Lindner J. Influence of lens aberrations, specimen thickness
    and tilt on differential phase contrast STEM images. <i>Ultramicroscopy</i>. 2020;219.
    doi:<a href="https://doi.org/10.1016/j.ultramic.2020.113118">10.1016/j.ultramic.2020.113118</a>
  apa: Bürger, J., Riedl, T., &#38; Lindner, J. (2020). Influence of lens aberrations,
    specimen thickness and tilt on differential phase contrast STEM images. <i>Ultramicroscopy</i>,
    <i>219</i>, Article 113118. <a href="https://doi.org/10.1016/j.ultramic.2020.113118">https://doi.org/10.1016/j.ultramic.2020.113118</a>
  bibtex: '@article{Bürger_Riedl_Lindner_2020, title={Influence of lens aberrations,
    specimen thickness and tilt on differential phase contrast STEM images}, volume={219},
    DOI={<a href="https://doi.org/10.1016/j.ultramic.2020.113118">10.1016/j.ultramic.2020.113118</a>},
    number={113118}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Bürger,
    Julius and Riedl, Thomas and Lindner, Jörg}, year={2020} }'
  chicago: Bürger, Julius, Thomas Riedl, and Jörg Lindner. “Influence of Lens Aberrations,
    Specimen Thickness and Tilt on Differential Phase Contrast STEM Images.” <i>Ultramicroscopy</i>
    219 (2020). <a href="https://doi.org/10.1016/j.ultramic.2020.113118">https://doi.org/10.1016/j.ultramic.2020.113118</a>.
  ieee: 'J. Bürger, T. Riedl, and J. Lindner, “Influence of lens aberrations, specimen
    thickness and tilt on differential phase contrast STEM images,” <i>Ultramicroscopy</i>,
    vol. 219, Art. no. 113118, 2020, doi: <a href="https://doi.org/10.1016/j.ultramic.2020.113118">10.1016/j.ultramic.2020.113118</a>.'
  mla: Bürger, Julius, et al. “Influence of Lens Aberrations, Specimen Thickness and
    Tilt on Differential Phase Contrast STEM Images.” <i>Ultramicroscopy</i>, vol.
    219, 113118, Elsevier BV, 2020, doi:<a href="https://doi.org/10.1016/j.ultramic.2020.113118">10.1016/j.ultramic.2020.113118</a>.
  short: J. Bürger, T. Riedl, J. Lindner, Ultramicroscopy 219 (2020).
date_created: 2022-11-15T14:15:16Z
date_updated: 2023-01-10T12:12:40Z
department:
- _id: '15'
- _id: '230'
doi: 10.1016/j.ultramic.2020.113118
intvolume: '       219'
keyword:
- Instrumentation
- Atomic and Molecular Physics
- and Optics
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
publication: Ultramicroscopy
publication_identifier:
  issn:
  - 0304-3991
publication_status: published
publisher: Elsevier BV
status: public
title: Influence of lens aberrations, specimen thickness and tilt on differential
  phase contrast STEM images
type: journal_article
user_id: '77496'
volume: 219
year: '2020'
...
---
_id: '53270'
author:
- first_name: Mohammad
  full_name: Soleymani, Mohammad
  last_name: Soleymani
- first_name: Ignacio
  full_name: Santamaria, Ignacio
  last_name: Santamaria
- first_name: Peter J.
  full_name: Schreier, Peter J.
  last_name: Schreier
citation:
  ama: Soleymani M, Santamaria I, Schreier PJ. Improper Gaussian Signaling for the
    $K$-User MIMO Interference Channels With Hardware Impairments. <i>IEEE Transactions
    on Vehicular Technology</i>. 2020;69(10):11632-11645. doi:<a href="https://doi.org/10.1109/tvt.2020.3015558">10.1109/tvt.2020.3015558</a>
  apa: Soleymani, M., Santamaria, I., &#38; Schreier, P. J. (2020). Improper Gaussian
    Signaling for the $K$-User MIMO Interference Channels With Hardware Impairments.
    <i>IEEE Transactions on Vehicular Technology</i>, <i>69</i>(10), 11632–11645.
    <a href="https://doi.org/10.1109/tvt.2020.3015558">https://doi.org/10.1109/tvt.2020.3015558</a>
  bibtex: '@article{Soleymani_Santamaria_Schreier_2020, title={Improper Gaussian Signaling
    for the $K$-User MIMO Interference Channels With Hardware Impairments}, volume={69},
    DOI={<a href="https://doi.org/10.1109/tvt.2020.3015558">10.1109/tvt.2020.3015558</a>},
    number={10}, journal={IEEE Transactions on Vehicular Technology}, publisher={Institute
    of Electrical and Electronics Engineers (IEEE)}, author={Soleymani, Mohammad and
    Santamaria, Ignacio and Schreier, Peter J.}, year={2020}, pages={11632–11645}
    }'
  chicago: 'Soleymani, Mohammad, Ignacio Santamaria, and Peter J. Schreier. “Improper
    Gaussian Signaling for the $K$-User MIMO Interference Channels With Hardware Impairments.”
    <i>IEEE Transactions on Vehicular Technology</i> 69, no. 10 (2020): 11632–45.
    <a href="https://doi.org/10.1109/tvt.2020.3015558">https://doi.org/10.1109/tvt.2020.3015558</a>.'
  ieee: 'M. Soleymani, I. Santamaria, and P. J. Schreier, “Improper Gaussian Signaling
    for the $K$-User MIMO Interference Channels With Hardware Impairments,” <i>IEEE
    Transactions on Vehicular Technology</i>, vol. 69, no. 10, pp. 11632–11645, 2020,
    doi: <a href="https://doi.org/10.1109/tvt.2020.3015558">10.1109/tvt.2020.3015558</a>.'
  mla: Soleymani, Mohammad, et al. “Improper Gaussian Signaling for the $K$-User MIMO
    Interference Channels With Hardware Impairments.” <i>IEEE Transactions on Vehicular
    Technology</i>, vol. 69, no. 10, Institute of Electrical and Electronics Engineers
    (IEEE), 2020, pp. 11632–45, doi:<a href="https://doi.org/10.1109/tvt.2020.3015558">10.1109/tvt.2020.3015558</a>.
  short: M. Soleymani, I. Santamaria, P.J. Schreier, IEEE Transactions on Vehicular
    Technology 69 (2020) 11632–11645.
date_created: 2024-04-05T09:05:11Z
date_updated: 2024-04-05T13:22:19Z
department:
- _id: '263'
doi: 10.1109/tvt.2020.3015558
intvolume: '        69'
issue: '10'
keyword:
- Electrical and Electronic Engineering
- Computer Networks and Communications
- Aerospace Engineering
- Automotive Engineering
language:
- iso: eng
page: 11632-11645
publication: IEEE Transactions on Vehicular Technology
publication_identifier:
  issn:
  - 0018-9545
  - 1939-9359
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: Improper Gaussian Signaling for the $K$-User MIMO Interference Channels With
  Hardware Impairments
type: journal_article
user_id: '67076'
volume: 69
year: '2020'
...
---
_id: '35869'
article_number: '2000414'
author:
- first_name: Changmin
  full_name: Keum, Changmin
  last_name: Keum
- first_name: David
  full_name: Becker, David
  last_name: Becker
- first_name: Emily
  full_name: Archer, Emily
  last_name: Archer
- first_name: Harald
  full_name: Bock, Harald
  last_name: Bock
- first_name: Heinz-Siegfried
  full_name: Kitzerow, Heinz-Siegfried
  id: '254'
  last_name: Kitzerow
- first_name: Malte C.
  full_name: Gather, Malte C.
  last_name: Gather
- first_name: Caroline
  full_name: Murawski, Caroline
  last_name: Murawski
citation:
  ama: Keum C, Becker D, Archer E, et al. Organic Light‐Emitting Diodes Based on a
    Columnar Liquid‐Crystalline Perylene Emitter. <i>Advanced Optical Materials</i>.
    2020;8(17). doi:<a href="https://doi.org/10.1002/adom.202000414">10.1002/adom.202000414</a>
  apa: Keum, C., Becker, D., Archer, E., Bock, H., Kitzerow, H.-S., Gather, M. C.,
    &#38; Murawski, C. (2020). Organic Light‐Emitting Diodes Based on a Columnar Liquid‐Crystalline
    Perylene Emitter. <i>Advanced Optical Materials</i>, <i>8</i>(17), Article 2000414.
    <a href="https://doi.org/10.1002/adom.202000414">https://doi.org/10.1002/adom.202000414</a>
  bibtex: '@article{Keum_Becker_Archer_Bock_Kitzerow_Gather_Murawski_2020, title={Organic
    Light‐Emitting Diodes Based on a Columnar Liquid‐Crystalline Perylene Emitter},
    volume={8}, DOI={<a href="https://doi.org/10.1002/adom.202000414">10.1002/adom.202000414</a>},
    number={172000414}, journal={Advanced Optical Materials}, publisher={Wiley}, author={Keum,
    Changmin and Becker, David and Archer, Emily and Bock, Harald and Kitzerow, Heinz-Siegfried
    and Gather, Malte C. and Murawski, Caroline}, year={2020} }'
  chicago: Keum, Changmin, David Becker, Emily Archer, Harald Bock, Heinz-Siegfried
    Kitzerow, Malte C. Gather, and Caroline Murawski. “Organic Light‐Emitting Diodes
    Based on a Columnar Liquid‐Crystalline Perylene Emitter.” <i>Advanced Optical
    Materials</i> 8, no. 17 (2020). <a href="https://doi.org/10.1002/adom.202000414">https://doi.org/10.1002/adom.202000414</a>.
  ieee: 'C. Keum <i>et al.</i>, “Organic Light‐Emitting Diodes Based on a Columnar
    Liquid‐Crystalline Perylene Emitter,” <i>Advanced Optical Materials</i>, vol.
    8, no. 17, Art. no. 2000414, 2020, doi: <a href="https://doi.org/10.1002/adom.202000414">10.1002/adom.202000414</a>.'
  mla: Keum, Changmin, et al. “Organic Light‐Emitting Diodes Based on a Columnar Liquid‐Crystalline
    Perylene Emitter.” <i>Advanced Optical Materials</i>, vol. 8, no. 17, 2000414,
    Wiley, 2020, doi:<a href="https://doi.org/10.1002/adom.202000414">10.1002/adom.202000414</a>.
  short: C. Keum, D. Becker, E. Archer, H. Bock, H.-S. Kitzerow, M.C. Gather, C. Murawski,
    Advanced Optical Materials 8 (2020).
date_created: 2023-01-10T14:01:41Z
date_updated: 2023-01-24T16:54:14Z
department:
- _id: '313'
doi: 10.1002/adom.202000414
intvolume: '         8'
issue: '17'
keyword:
- Atomic and Molecular Physics
- and Optics
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
publication: Advanced Optical Materials
publication_identifier:
  issn:
  - 2195-1071
  - 2195-1071
publication_status: published
publisher: Wiley
status: public
title: Organic Light‐Emitting Diodes Based on a Columnar Liquid‐Crystalline Perylene
  Emitter
type: journal_article
user_id: '254'
volume: 8
year: '2020'
...
---
_id: '40217'
author:
- first_name: Inga
  full_name: Wagenknecht, Inga
  id: '98804'
  last_name: Wagenknecht
- first_name: Uta
  full_name: Meier-Gräwe, Uta
  last_name: Meier-Gräwe
citation:
  ama: Wagenknecht I, Meier-Gräwe U. Psychische Auffälligkeiten bei Kindern und Jugendlichen,
    für die das Jugendamt in Anspruch genommen wurde. <i>Praxis der Kinderpsychologie
    und Kinderpsychiatrie</i>. 2020;69(7):643-665. doi:<a href="https://doi.org/10.13109/prkk.2020.69.7.643">10.13109/prkk.2020.69.7.643</a>
  apa: Wagenknecht, I., &#38; Meier-Gräwe, U. (2020). Psychische Auffälligkeiten bei
    Kindern und Jugendlichen, für die das Jugendamt in Anspruch genommen wurde. <i>Praxis
    der Kinderpsychologie und Kinderpsychiatrie</i>, <i>69</i>(7), 643–665. <a href="https://doi.org/10.13109/prkk.2020.69.7.643">https://doi.org/10.13109/prkk.2020.69.7.643</a>
  bibtex: '@article{Wagenknecht_Meier-Gräwe_2020, title={Psychische Auffälligkeiten
    bei Kindern und Jugendlichen, für die das Jugendamt in Anspruch genommen wurde},
    volume={69}, DOI={<a href="https://doi.org/10.13109/prkk.2020.69.7.643">10.13109/prkk.2020.69.7.643</a>},
    number={7}, journal={Praxis der Kinderpsychologie und Kinderpsychiatrie}, publisher={Vandenhoeck
    &#38; Ruprecht GmbH &#38; Co, KG}, author={Wagenknecht, Inga and Meier-Gräwe,
    Uta}, year={2020}, pages={643–665} }'
  chicago: 'Wagenknecht, Inga, and Uta Meier-Gräwe. “Psychische Auffälligkeiten bei
    Kindern und Jugendlichen, für die das Jugendamt in Anspruch genommen wurde.” <i>Praxis
    der Kinderpsychologie und Kinderpsychiatrie</i> 69, no. 7 (2020): 643–65. <a href="https://doi.org/10.13109/prkk.2020.69.7.643">https://doi.org/10.13109/prkk.2020.69.7.643</a>.'
  ieee: 'I. Wagenknecht and U. Meier-Gräwe, “Psychische Auffälligkeiten bei Kindern
    und Jugendlichen, für die das Jugendamt in Anspruch genommen wurde,” <i>Praxis
    der Kinderpsychologie und Kinderpsychiatrie</i>, vol. 69, no. 7, pp. 643–665,
    2020, doi: <a href="https://doi.org/10.13109/prkk.2020.69.7.643">10.13109/prkk.2020.69.7.643</a>.'
  mla: Wagenknecht, Inga, and Uta Meier-Gräwe. “Psychische Auffälligkeiten bei Kindern
    und Jugendlichen, für die das Jugendamt in Anspruch genommen wurde.” <i>Praxis
    der Kinderpsychologie und Kinderpsychiatrie</i>, vol. 69, no. 7, Vandenhoeck &#38;
    Ruprecht GmbH &#38; Co, KG, 2020, pp. 643–65, doi:<a href="https://doi.org/10.13109/prkk.2020.69.7.643">10.13109/prkk.2020.69.7.643</a>.
  short: I. Wagenknecht, U. Meier-Gräwe, Praxis der Kinderpsychologie und Kinderpsychiatrie
    69 (2020) 643–665.
date_created: 2023-01-26T09:08:15Z
date_updated: 2023-01-26T09:13:40Z
department:
- _id: '22'
doi: 10.13109/prkk.2020.69.7.643
intvolume: '        69'
issue: '7'
keyword:
- Electrical and Electronic Engineering
- Atomic and Molecular Physics
- and Optics
language:
- iso: ger
page: 643-665
publication: Praxis der Kinderpsychologie und Kinderpsychiatrie
publication_identifier:
  eissn:
  - 2196-8225
  issn:
  - 0032-7034
publication_status: published
publisher: Vandenhoeck & Ruprecht GmbH & Co, KG
status: public
title: Psychische Auffälligkeiten bei Kindern und Jugendlichen, für die das Jugendamt
  in Anspruch genommen wurde
type: journal_article
user_id: '50419'
volume: 69
year: '2020'
...
---
_id: '40233'
article_number: '2000463'
author:
- first_name: Lukas
  full_name: Meier, Lukas
  last_name: Meier
- first_name: Christian
  full_name: Braun, Christian
  last_name: Braun
- first_name: Thomas
  full_name: Hannappel, Thomas
  last_name: Hannappel
- first_name: Wolf Gero
  full_name: Schmidt, Wolf Gero
  id: '468'
  last_name: Schmidt
  orcid: 0000-0002-2717-5076
citation:
  ama: Meier L, Braun C, Hannappel T, Schmidt WG. Band Alignment at Ga           
    <sub>              <i>x</i>            </sub>            In            <sub> 
                1–              <i>x</i>            </sub>            P/Al       
        <sub>              <i>y</i>            </sub>            In            <sub> 
                1–              <i>y</i>            </sub>            P Alloy Interfaces
    from Hybrid Density Functional Theory Calculations. <i>physica status solidi (b)</i>.
    2020;258(2). doi:<a href="https://doi.org/10.1002/pssb.202000463">10.1002/pssb.202000463</a>
  apa: Meier, L., Braun, C., Hannappel, T., &#38; Schmidt, W. G. (2020). Band Alignment
    at Ga            <sub>              <i>x</i>            </sub>            In 
              <sub>              1–              <i>x</i>            </sub>       
        P/Al            <sub>              <i>y</i>            </sub>            In 
              <sub>              1–              <i>y</i>            </sub>       
        P Alloy Interfaces from Hybrid Density Functional Theory Calculations. <i>Physica
    Status Solidi (b)</i>, <i>258</i>(2), Article 2000463. <a href="https://doi.org/10.1002/pssb.202000463">https://doi.org/10.1002/pssb.202000463</a>
  bibtex: '@article{Meier_Braun_Hannappel_Schmidt_2020, title={Band Alignment at Ga 
              <sub>              <i>x</i>            </sub>            In         
      <sub>              1–              <i>x</i>            </sub>            P/Al 
              <sub>              <i>y</i>            </sub>            In         
      <sub>              1–              <i>y</i>            </sub>            P Alloy
    Interfaces from Hybrid Density Functional Theory Calculations}, volume={258},
    DOI={<a href="https://doi.org/10.1002/pssb.202000463">10.1002/pssb.202000463</a>},
    number={22000463}, journal={physica status solidi (b)}, publisher={Wiley}, author={Meier,
    Lukas and Braun, Christian and Hannappel, Thomas and Schmidt, Wolf Gero}, year={2020}
    }'
  chicago: Meier, Lukas, Christian Braun, Thomas Hannappel, and Wolf Gero Schmidt.
    “Band Alignment at Ga            <sub>              <i>x</i>            </sub> 
              In            <sub>              1–              <i>x</i>           
    </sub>            P/Al            <sub>              <i>y</i>            </sub> 
              In            <sub>              1–              <i>y</i>           
    </sub>            P Alloy Interfaces from Hybrid Density Functional Theory Calculations.”
    <i>Physica Status Solidi (b)</i> 258, no. 2 (2020). <a href="https://doi.org/10.1002/pssb.202000463">https://doi.org/10.1002/pssb.202000463</a>.
  ieee: 'L. Meier, C. Braun, T. Hannappel, and W. G. Schmidt, “Band Alignment at Ga 
              <sub>              <i>x</i>            </sub>            In         
      <sub>              1–              <i>x</i>            </sub>            P/Al 
              <sub>              <i>y</i>            </sub>            In         
      <sub>              1–              <i>y</i>            </sub>            P Alloy
    Interfaces from Hybrid Density Functional Theory Calculations,” <i>physica status
    solidi (b)</i>, vol. 258, no. 2, Art. no. 2000463, 2020, doi: <a href="https://doi.org/10.1002/pssb.202000463">10.1002/pssb.202000463</a>.'
  mla: Meier, Lukas, et al. “Band Alignment at Ga            <sub>              <i>x</i> 
              </sub>            In            <sub>              1–              <i>x</i> 
              </sub>            P/Al            <sub>              <i>y</i>       
        </sub>            In            <sub>              1–              <i>y</i> 
              </sub>            P Alloy Interfaces from Hybrid Density Functional
    Theory Calculations.” <i>Physica Status Solidi (b)</i>, vol. 258, no. 2, 2000463,
    Wiley, 2020, doi:<a href="https://doi.org/10.1002/pssb.202000463">10.1002/pssb.202000463</a>.
  short: L. Meier, C. Braun, T. Hannappel, W.G. Schmidt, Physica Status Solidi (b)
    258 (2020).
date_created: 2023-01-26T09:33:46Z
date_updated: 2023-04-20T14:18:36Z
department:
- _id: '15'
- _id: '170'
- _id: '295'
- _id: '230'
- _id: '35'
doi: 10.1002/pssb.202000463
intvolume: '       258'
issue: '2'
keyword:
- Condensed Matter Physics
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
project:
- _id: '52'
  name: 'PC2: Computing Resources Provided by the Paderborn Center for Parallel Computing'
publication: physica status solidi (b)
publication_identifier:
  issn:
  - 0370-1972
  - 1521-3951
publication_status: published
publisher: Wiley
status: public
title: Band Alignment at Ga            <sub>              <i>x</i>            </sub>            In            <sub>              1–              <i>x</i>            </sub>            P/Al            <sub>              <i>y</i>            </sub>            In            <sub>              1–              <i>y</i>            </sub>            P
  Alloy Interfaces from Hybrid Density Functional Theory Calculations
type: journal_article
user_id: '16199'
volume: 258
year: '2020'
...
---
_id: '40438'
abstract:
- lang: eng
  text: <jats:p>Semiconductor microcavities are frequently studied in the context
    of semiconductor lasers and in application-oriented fundamental research on topics
    such as linear and nonlinear polariton systems, polariton lasers, polariton pattern
    formation, and polaritonic Bose–Einstein condensates. A commonly used approach
    to describe theoretical properties includes a phenomenological single-mode equation
    that complements the equation for the nonlinear optical response (interband polarization)
    of the semiconductor. Here, we show how to replace the single-mode equation by
    a fully predictive transfer function method that, in contrast to the single-mode
    equation, accounts for propagation, retardation, and pulse-filtering effects of
    the incident light field traversing the distributed Bragg reflector (DBR) mirrors,
    without substantially increasing the numerical complexity of the solution. As
    examples, we use cavities containing GaAs quantum wells and transition-metal dichalcogenides
    (TMDs).</jats:p>
article_number: G112
author:
- first_name: M.
  full_name: Carcamo, M.
  last_name: Carcamo
- first_name: Stefan
  full_name: Schumacher, Stefan
  id: '27271'
  last_name: Schumacher
  orcid: 0000-0003-4042-4951
- first_name: R.
  full_name: Binder, R.
  last_name: Binder
citation:
  ama: Carcamo M, Schumacher S, Binder R. Transfer function replacement of phenomenological
    single-mode equations in semiconductor microcavity modeling. <i>Applied Optics</i>.
    2020;59(22). doi:<a href="https://doi.org/10.1364/ao.392014">10.1364/ao.392014</a>
  apa: Carcamo, M., Schumacher, S., &#38; Binder, R. (2020). Transfer function replacement
    of phenomenological single-mode equations in semiconductor microcavity modeling.
    <i>Applied Optics</i>, <i>59</i>(22), Article G112. <a href="https://doi.org/10.1364/ao.392014">https://doi.org/10.1364/ao.392014</a>
  bibtex: '@article{Carcamo_Schumacher_Binder_2020, title={Transfer function replacement
    of phenomenological single-mode equations in semiconductor microcavity modeling},
    volume={59}, DOI={<a href="https://doi.org/10.1364/ao.392014">10.1364/ao.392014</a>},
    number={22G112}, journal={Applied Optics}, publisher={Optica Publishing Group},
    author={Carcamo, M. and Schumacher, Stefan and Binder, R.}, year={2020} }'
  chicago: Carcamo, M., Stefan Schumacher, and R. Binder. “Transfer Function Replacement
    of Phenomenological Single-Mode Equations in Semiconductor Microcavity Modeling.”
    <i>Applied Optics</i> 59, no. 22 (2020). <a href="https://doi.org/10.1364/ao.392014">https://doi.org/10.1364/ao.392014</a>.
  ieee: 'M. Carcamo, S. Schumacher, and R. Binder, “Transfer function replacement
    of phenomenological single-mode equations in semiconductor microcavity modeling,”
    <i>Applied Optics</i>, vol. 59, no. 22, Art. no. G112, 2020, doi: <a href="https://doi.org/10.1364/ao.392014">10.1364/ao.392014</a>.'
  mla: Carcamo, M., et al. “Transfer Function Replacement of Phenomenological Single-Mode
    Equations in Semiconductor Microcavity Modeling.” <i>Applied Optics</i>, vol.
    59, no. 22, G112, Optica Publishing Group, 2020, doi:<a href="https://doi.org/10.1364/ao.392014">10.1364/ao.392014</a>.
  short: M. Carcamo, S. Schumacher, R. Binder, Applied Optics 59 (2020).
date_created: 2023-01-26T16:04:00Z
date_updated: 2023-04-20T15:42:52Z
department:
- _id: '15'
- _id: '170'
- _id: '297'
- _id: '230'
- _id: '35'
doi: 10.1364/ao.392014
intvolume: '        59'
issue: '22'
keyword:
- Atomic and Molecular Physics
- and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering
language:
- iso: eng
publication: Applied Optics
publication_identifier:
  issn:
  - 1559-128X
  - 2155-3165
publication_status: published
publisher: Optica Publishing Group
status: public
title: Transfer function replacement of phenomenological single-mode equations in
  semiconductor microcavity modeling
type: journal_article
user_id: '16199'
volume: 59
year: '2020'
...
---
_id: '40381'
abstract:
- lang: eng
  text: "<jats:title>Abstract</jats:title>\r\n               <jats:p>The phenomenon
    of entanglement is the basis of quantum information and quantum communication
    processes. Entangled systems with a large number of photons are of great interest
    at present because they provide a platform for streaming technologies based on
    photonics. In this paper we present a device which operates with four-photons
    and based on the Hong–Ou–Mandel interference. The presented device allows to maximize
    the degree of spatial entanglement and generate the highly entangled four-dimensional
    Bell states. Furthermore, the use of the interferometer in different regimes leads
    to fast interference fringes in the coincidence probability with period of oscillations
    twice smaller than the pump wavelength. We have a good agreement between theoretical
    simulations and experimental results.</jats:p>"
article_number: '045020'
author:
- first_name: A
  full_name: Ferreri, A
  last_name: Ferreri
- first_name: V
  full_name: Ansari, V
  last_name: Ansari
- first_name: Benjamin
  full_name: Brecht, Benjamin
  id: '27150'
  last_name: Brecht
  orcid: '0000-0003-4140-0556 '
- first_name: Christine
  full_name: Silberhorn, Christine
  id: '26263'
  last_name: Silberhorn
- first_name: Polina R.
  full_name: Sharapova, Polina R.
  id: '60286'
  last_name: Sharapova
citation:
  ama: Ferreri A, Ansari V, Brecht B, Silberhorn C, Sharapova PR. Spatial entanglement
    and state engineering via four-photon Hong–Ou–Mandel interference. <i>Quantum
    Science and Technology</i>. 2020;5(4). doi:<a href="https://doi.org/10.1088/2058-9565/abb411">10.1088/2058-9565/abb411</a>
  apa: Ferreri, A., Ansari, V., Brecht, B., Silberhorn, C., &#38; Sharapova, P. R.
    (2020). Spatial entanglement and state engineering via four-photon Hong–Ou–Mandel
    interference. <i>Quantum Science and Technology</i>, <i>5</i>(4), Article 045020.
    <a href="https://doi.org/10.1088/2058-9565/abb411">https://doi.org/10.1088/2058-9565/abb411</a>
  bibtex: '@article{Ferreri_Ansari_Brecht_Silberhorn_Sharapova_2020, title={Spatial
    entanglement and state engineering via four-photon Hong–Ou–Mandel interference},
    volume={5}, DOI={<a href="https://doi.org/10.1088/2058-9565/abb411">10.1088/2058-9565/abb411</a>},
    number={4045020}, journal={Quantum Science and Technology}, publisher={IOP Publishing},
    author={Ferreri, A and Ansari, V and Brecht, Benjamin and Silberhorn, Christine
    and Sharapova, Polina R.}, year={2020} }'
  chicago: Ferreri, A, V Ansari, Benjamin Brecht, Christine Silberhorn, and Polina
    R. Sharapova. “Spatial Entanglement and State Engineering via Four-Photon Hong–Ou–Mandel
    Interference.” <i>Quantum Science and Technology</i> 5, no. 4 (2020). <a href="https://doi.org/10.1088/2058-9565/abb411">https://doi.org/10.1088/2058-9565/abb411</a>.
  ieee: 'A. Ferreri, V. Ansari, B. Brecht, C. Silberhorn, and P. R. Sharapova, “Spatial
    entanglement and state engineering via four-photon Hong–Ou–Mandel interference,”
    <i>Quantum Science and Technology</i>, vol. 5, no. 4, Art. no. 045020, 2020, doi:
    <a href="https://doi.org/10.1088/2058-9565/abb411">10.1088/2058-9565/abb411</a>.'
  mla: Ferreri, A., et al. “Spatial Entanglement and State Engineering via Four-Photon
    Hong–Ou–Mandel Interference.” <i>Quantum Science and Technology</i>, vol. 5, no.
    4, 045020, IOP Publishing, 2020, doi:<a href="https://doi.org/10.1088/2058-9565/abb411">10.1088/2058-9565/abb411</a>.
  short: A. Ferreri, V. Ansari, B. Brecht, C. Silberhorn, P.R. Sharapova, Quantum
    Science and Technology 5 (2020).
date_created: 2023-01-26T14:06:23Z
date_updated: 2025-12-16T11:27:56Z
department:
- _id: '15'
- _id: '569'
- _id: '170'
- _id: '288'
- _id: '230'
- _id: '429'
- _id: '35'
doi: 10.1088/2058-9565/abb411
intvolume: '         5'
issue: '4'
keyword:
- Electrical and Electronic Engineering
- Physics and Astronomy (miscellaneous)
- Materials Science (miscellaneous)
- Atomic and Molecular Physics
- and Optics
language:
- iso: eng
project:
- _id: '53'
  name: 'TRR 142: TRR 142'
- _id: '56'
  name: 'TRR 142 - C: TRR 142 - Project Area C'
- _id: '72'
  name: 'TRR 142 - C2: TRR 142 - Subproject C2'
publication: Quantum Science and Technology
publication_identifier:
  issn:
  - 2058-9565
publication_status: published
publisher: IOP Publishing
status: public
title: Spatial entanglement and state engineering via four-photon Hong–Ou–Mandel interference
type: journal_article
user_id: '16199'
volume: 5
year: '2020'
...
---
_id: '35566'
abstract:
- lang: eng
  text: "<jats:title>Zusammenfassung</jats:title>\r\n               <jats:p>Zukünftige
    Regelungskonzepte werden verstärkt auf Cloud-Computing und verteiltes Rechnen
    setzen. In den resultierenden vernetzten Regelungssystemen werden sensible Daten
    über öffentliche Netzwerke kommuniziert und auf Plattformen Dritter verarbeitet.
    Verschlüsselte Regelungen zielen darauf ab, die Vertraulichkeit dieser Daten im
    gesamten Regelkreis zu sichern. Um dieses Ziel zu erreichen, werden klassische
    Regelungsalgorithmen so modifiziert, dass sie verschlüsselte Regeleingriffe basierend
    auf verschlüsselten Systemzuständen berechnen. Zum Einsatz kommen dabei homomorphe
    Verschlüsselungsverfahren, die einfache mathematische Operationen auf verschlüsselten
    Daten ermöglichen. Der Artikel erläutert die Implementierung verschlüsselter Regelungen
    anhand von drei wegweisenden Realisierungen in der Cloud.</jats:p>"
author:
- first_name: Moritz
  full_name: Schulze Darup, Moritz
  last_name: Schulze Darup
citation:
  ama: Schulze Darup M. Verschlüsselte Regelung in der Cloud – Stand der Technik und
    offene Probleme. <i>at - Automatisierungstechnik</i>. 2019;67(8):668-681. doi:<a
    href="https://doi.org/10.1515/auto-2019-0022">10.1515/auto-2019-0022</a>
  apa: Schulze Darup, M. (2019). Verschlüsselte Regelung in der Cloud – Stand der
    Technik und offene Probleme. <i>At - Automatisierungstechnik</i>, <i>67</i>(8),
    668–681. <a href="https://doi.org/10.1515/auto-2019-0022">https://doi.org/10.1515/auto-2019-0022</a>
  bibtex: '@article{Schulze Darup_2019, title={Verschlüsselte Regelung in der Cloud
    – Stand der Technik und offene Probleme}, volume={67}, DOI={<a href="https://doi.org/10.1515/auto-2019-0022">10.1515/auto-2019-0022</a>},
    number={8}, journal={at - Automatisierungstechnik}, publisher={Walter de Gruyter
    GmbH}, author={Schulze Darup, Moritz}, year={2019}, pages={668–681} }'
  chicago: 'Schulze Darup, Moritz. “Verschlüsselte Regelung in Der Cloud – Stand Der
    Technik Und Offene Probleme.” <i>At - Automatisierungstechnik</i> 67, no. 8 (2019):
    668–81. <a href="https://doi.org/10.1515/auto-2019-0022">https://doi.org/10.1515/auto-2019-0022</a>.'
  ieee: 'M. Schulze Darup, “Verschlüsselte Regelung in der Cloud – Stand der Technik
    und offene Probleme,” <i>at - Automatisierungstechnik</i>, vol. 67, no. 8, pp.
    668–681, 2019, doi: <a href="https://doi.org/10.1515/auto-2019-0022">10.1515/auto-2019-0022</a>.'
  mla: Schulze Darup, Moritz. “Verschlüsselte Regelung in Der Cloud – Stand Der Technik
    Und Offene Probleme.” <i>At - Automatisierungstechnik</i>, vol. 67, no. 8, Walter
    de Gruyter GmbH, 2019, pp. 668–81, doi:<a href="https://doi.org/10.1515/auto-2019-0022">10.1515/auto-2019-0022</a>.
  short: M. Schulze Darup, At - Automatisierungstechnik 67 (2019) 668–681.
date_created: 2023-01-09T16:22:39Z
date_updated: 2023-01-09T16:22:54Z
department:
- _id: '622'
doi: 10.1515/auto-2019-0022
intvolume: '        67'
issue: '8'
keyword:
- Electrical and Electronic Engineering
- Computer Science Applications
- Control and Systems Engineering
language:
- iso: eng
page: 668-681
publication: at - Automatisierungstechnik
publication_identifier:
  issn:
  - 2196-677X
  - 0178-2312
publication_status: published
publisher: Walter de Gruyter GmbH
status: public
title: Verschlüsselte Regelung in der Cloud – Stand der Technik und offene Probleme
type: journal_article
user_id: '158'
volume: 67
year: '2019'
...
---
_id: '35583'
article_number: '108759'
author:
- first_name: Alex S.
  full_name: Leong, Alex S.
  last_name: Leong
- first_name: Arunselvan
  full_name: Ramaswamy, Arunselvan
  last_name: Ramaswamy
- first_name: Daniel E.
  full_name: Quevedo, Daniel E.
  last_name: Quevedo
- first_name: Holger
  full_name: Karl, Holger
  last_name: Karl
- first_name: Ling
  full_name: Shi, Ling
  last_name: Shi
citation:
  ama: Leong AS, Ramaswamy A, Quevedo DE, Karl H, Shi L. Deep reinforcement learning
    for wireless sensor scheduling in cyber–physical systems. <i>Automatica</i>. 2019;113.
    doi:<a href="https://doi.org/10.1016/j.automatica.2019.108759">10.1016/j.automatica.2019.108759</a>
  apa: Leong, A. S., Ramaswamy, A., Quevedo, D. E., Karl, H., &#38; Shi, L. (2019).
    Deep reinforcement learning for wireless sensor scheduling in cyber–physical systems.
    <i>Automatica</i>, <i>113</i>, Article 108759. <a href="https://doi.org/10.1016/j.automatica.2019.108759">https://doi.org/10.1016/j.automatica.2019.108759</a>
  bibtex: '@article{Leong_Ramaswamy_Quevedo_Karl_Shi_2019, title={Deep reinforcement
    learning for wireless sensor scheduling in cyber–physical systems}, volume={113},
    DOI={<a href="https://doi.org/10.1016/j.automatica.2019.108759">10.1016/j.automatica.2019.108759</a>},
    number={108759}, journal={Automatica}, publisher={Elsevier BV}, author={Leong,
    Alex S. and Ramaswamy, Arunselvan and Quevedo, Daniel E. and Karl, Holger and
    Shi, Ling}, year={2019} }'
  chicago: Leong, Alex S., Arunselvan Ramaswamy, Daniel E. Quevedo, Holger Karl, and
    Ling Shi. “Deep Reinforcement Learning for Wireless Sensor Scheduling in Cyber–Physical
    Systems.” <i>Automatica</i> 113 (2019). <a href="https://doi.org/10.1016/j.automatica.2019.108759">https://doi.org/10.1016/j.automatica.2019.108759</a>.
  ieee: 'A. S. Leong, A. Ramaswamy, D. E. Quevedo, H. Karl, and L. Shi, “Deep reinforcement
    learning for wireless sensor scheduling in cyber–physical systems,” <i>Automatica</i>,
    vol. 113, Art. no. 108759, 2019, doi: <a href="https://doi.org/10.1016/j.automatica.2019.108759">10.1016/j.automatica.2019.108759</a>.'
  mla: Leong, Alex S., et al. “Deep Reinforcement Learning for Wireless Sensor Scheduling
    in Cyber–Physical Systems.” <i>Automatica</i>, vol. 113, 108759, Elsevier BV,
    2019, doi:<a href="https://doi.org/10.1016/j.automatica.2019.108759">10.1016/j.automatica.2019.108759</a>.
  short: A.S. Leong, A. Ramaswamy, D.E. Quevedo, H. Karl, L. Shi, Automatica 113 (2019).
date_created: 2023-01-09T16:44:58Z
date_updated: 2023-01-09T16:45:15Z
department:
- _id: '57'
doi: 10.1016/j.automatica.2019.108759
intvolume: '       113'
keyword:
- Electrical and Electronic Engineering
- Control and Systems Engineering
language:
- iso: eng
publication: Automatica
publication_identifier:
  issn:
  - 0005-1098
publication_status: published
publisher: Elsevier BV
status: public
title: Deep reinforcement learning for wireless sensor scheduling in cyber–physical
  systems
type: journal_article
user_id: '158'
volume: 113
year: '2019'
...
---
_id: '35584'
article_number: '108680'
author:
- first_name: Kemi
  full_name: Ding, Kemi
  last_name: Ding
- first_name: Xiaoqiang
  full_name: Ren, Xiaoqiang
  last_name: Ren
- first_name: Daniel E.
  full_name: Quevedo, Daniel E.
  last_name: Quevedo
- first_name: Subhrakanti
  full_name: Dey, Subhrakanti
  last_name: Dey
- first_name: Ling
  full_name: Shi, Ling
  last_name: Shi
citation:
  ama: Ding K, Ren X, Quevedo DE, Dey S, Shi L. Defensive deception against reactive
    jamming attacks in remote state estimation. <i>Automatica</i>. 2019;113. doi:<a
    href="https://doi.org/10.1016/j.automatica.2019.108680">10.1016/j.automatica.2019.108680</a>
  apa: Ding, K., Ren, X., Quevedo, D. E., Dey, S., &#38; Shi, L. (2019). Defensive
    deception against reactive jamming attacks in remote state estimation. <i>Automatica</i>,
    <i>113</i>, Article 108680. <a href="https://doi.org/10.1016/j.automatica.2019.108680">https://doi.org/10.1016/j.automatica.2019.108680</a>
  bibtex: '@article{Ding_Ren_Quevedo_Dey_Shi_2019, title={Defensive deception against
    reactive jamming attacks in remote state estimation}, volume={113}, DOI={<a href="https://doi.org/10.1016/j.automatica.2019.108680">10.1016/j.automatica.2019.108680</a>},
    number={108680}, journal={Automatica}, publisher={Elsevier BV}, author={Ding,
    Kemi and Ren, Xiaoqiang and Quevedo, Daniel E. and Dey, Subhrakanti and Shi, Ling},
    year={2019} }'
  chicago: Ding, Kemi, Xiaoqiang Ren, Daniel E. Quevedo, Subhrakanti Dey, and Ling
    Shi. “Defensive Deception against Reactive Jamming Attacks in Remote State Estimation.”
    <i>Automatica</i> 113 (2019). <a href="https://doi.org/10.1016/j.automatica.2019.108680">https://doi.org/10.1016/j.automatica.2019.108680</a>.
  ieee: 'K. Ding, X. Ren, D. E. Quevedo, S. Dey, and L. Shi, “Defensive deception
    against reactive jamming attacks in remote state estimation,” <i>Automatica</i>,
    vol. 113, Art. no. 108680, 2019, doi: <a href="https://doi.org/10.1016/j.automatica.2019.108680">10.1016/j.automatica.2019.108680</a>.'
  mla: Ding, Kemi, et al. “Defensive Deception against Reactive Jamming Attacks in
    Remote State Estimation.” <i>Automatica</i>, vol. 113, 108680, Elsevier BV, 2019,
    doi:<a href="https://doi.org/10.1016/j.automatica.2019.108680">10.1016/j.automatica.2019.108680</a>.
  short: K. Ding, X. Ren, D.E. Quevedo, S. Dey, L. Shi, Automatica 113 (2019).
date_created: 2023-01-09T16:45:46Z
date_updated: 2023-01-09T16:45:59Z
department:
- _id: '57'
doi: 10.1016/j.automatica.2019.108680
intvolume: '       113'
keyword:
- Electrical and Electronic Engineering
- Control and Systems Engineering
language:
- iso: eng
publication: Automatica
publication_identifier:
  issn:
  - 0005-1098
publication_status: published
publisher: Elsevier BV
status: public
title: Defensive deception against reactive jamming attacks in remote state estimation
type: journal_article
user_id: '158'
volume: 113
year: '2019'
...
---
_id: '47947'
article_type: review
author:
- first_name: Michael
  full_name: Rüsing, Michael
  id: '22501'
  last_name: Rüsing
  orcid: 0000-0003-4682-4577
- first_name: Peter O.
  full_name: Weigel, Peter O.
  last_name: Weigel
- first_name: Jie
  full_name: Zhao, Jie
  last_name: Zhao
- first_name: Shayan
  full_name: Mookherjea, Shayan
  last_name: Mookherjea
citation:
  ama: 'Rüsing M, Weigel PO, Zhao J, Mookherjea S. Toward 3D Integrated Photonics
    Including Lithium Niobate Thin Films: A Bridge Between Electronics, Radio Frequency,
    and Optical Technology. <i>IEEE Nanotechnology Magazine</i>. 2019;13(4):18-33.
    doi:<a href="https://doi.org/10.1109/mnano.2019.2916115">10.1109/mnano.2019.2916115</a>'
  apa: 'Rüsing, M., Weigel, P. O., Zhao, J., &#38; Mookherjea, S. (2019). Toward 3D
    Integrated Photonics Including Lithium Niobate Thin Films: A Bridge Between Electronics,
    Radio Frequency, and Optical Technology. <i>IEEE Nanotechnology Magazine</i>,
    <i>13</i>(4), 18–33. <a href="https://doi.org/10.1109/mnano.2019.2916115">https://doi.org/10.1109/mnano.2019.2916115</a>'
  bibtex: '@article{Rüsing_Weigel_Zhao_Mookherjea_2019, title={Toward 3D Integrated
    Photonics Including Lithium Niobate Thin Films: A Bridge Between Electronics,
    Radio Frequency, and Optical Technology}, volume={13}, DOI={<a href="https://doi.org/10.1109/mnano.2019.2916115">10.1109/mnano.2019.2916115</a>},
    number={4}, journal={IEEE Nanotechnology Magazine}, publisher={Institute of Electrical
    and Electronics Engineers (IEEE)}, author={Rüsing, Michael and Weigel, Peter O.
    and Zhao, Jie and Mookherjea, Shayan}, year={2019}, pages={18–33} }'
  chicago: 'Rüsing, Michael, Peter O. Weigel, Jie Zhao, and Shayan Mookherjea. “Toward
    3D Integrated Photonics Including Lithium Niobate Thin Films: A Bridge Between
    Electronics, Radio Frequency, and Optical Technology.” <i>IEEE Nanotechnology
    Magazine</i> 13, no. 4 (2019): 18–33. <a href="https://doi.org/10.1109/mnano.2019.2916115">https://doi.org/10.1109/mnano.2019.2916115</a>.'
  ieee: 'M. Rüsing, P. O. Weigel, J. Zhao, and S. Mookherjea, “Toward 3D Integrated
    Photonics Including Lithium Niobate Thin Films: A Bridge Between Electronics,
    Radio Frequency, and Optical Technology,” <i>IEEE Nanotechnology Magazine</i>,
    vol. 13, no. 4, pp. 18–33, 2019, doi: <a href="https://doi.org/10.1109/mnano.2019.2916115">10.1109/mnano.2019.2916115</a>.'
  mla: 'Rüsing, Michael, et al. “Toward 3D Integrated Photonics Including Lithium
    Niobate Thin Films: A Bridge Between Electronics, Radio Frequency, and Optical
    Technology.” <i>IEEE Nanotechnology Magazine</i>, vol. 13, no. 4, Institute of
    Electrical and Electronics Engineers (IEEE), 2019, pp. 18–33, doi:<a href="https://doi.org/10.1109/mnano.2019.2916115">10.1109/mnano.2019.2916115</a>.'
  short: M. Rüsing, P.O. Weigel, J. Zhao, S. Mookherjea, IEEE Nanotechnology Magazine
    13 (2019) 18–33.
date_created: 2023-10-11T07:39:07Z
date_updated: 2023-10-11T07:39:53Z
doi: 10.1109/mnano.2019.2916115
extern: '1'
intvolume: '        13'
issue: '4'
keyword:
- Electrical and Electronic Engineering
- Mechanical Engineering
language:
- iso: eng
page: 18-33
publication: IEEE Nanotechnology Magazine
publication_identifier:
  issn:
  - 1932-4510
  - 1942-7808
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
quality_controlled: '1'
status: public
title: 'Toward 3D Integrated Photonics Including Lithium Niobate Thin Films: A Bridge
  Between Electronics, Radio Frequency, and Optical Technology'
type: journal_article
user_id: '22501'
volume: 13
year: '2019'
...
---
_id: '53276'
author:
- first_name: Mohammad
  full_name: Soleymani, Mohammad
  last_name: Soleymani
- first_name: Christian
  full_name: Lameiro, Christian
  last_name: Lameiro
- first_name: Ignacio
  full_name: Santamaria, Ignacio
  last_name: Santamaria
- first_name: Peter J.
  full_name: Schreier, Peter J.
  last_name: Schreier
citation:
  ama: Soleymani M, Lameiro C, Santamaria I, Schreier PJ. Robust Improper Signaling
    for Two-User SISO Interference Channels. <i>IEEE Transactions on Communications</i>.
    2019;67(7):4709-4723. doi:<a href="https://doi.org/10.1109/tcomm.2019.2910549">10.1109/tcomm.2019.2910549</a>
  apa: Soleymani, M., Lameiro, C., Santamaria, I., &#38; Schreier, P. J. (2019). Robust
    Improper Signaling for Two-User SISO Interference Channels. <i>IEEE Transactions
    on Communications</i>, <i>67</i>(7), 4709–4723. <a href="https://doi.org/10.1109/tcomm.2019.2910549">https://doi.org/10.1109/tcomm.2019.2910549</a>
  bibtex: '@article{Soleymani_Lameiro_Santamaria_Schreier_2019, title={Robust Improper
    Signaling for Two-User SISO Interference Channels}, volume={67}, DOI={<a href="https://doi.org/10.1109/tcomm.2019.2910549">10.1109/tcomm.2019.2910549</a>},
    number={7}, journal={IEEE Transactions on Communications}, publisher={Institute
    of Electrical and Electronics Engineers (IEEE)}, author={Soleymani, Mohammad and
    Lameiro, Christian and Santamaria, Ignacio and Schreier, Peter J.}, year={2019},
    pages={4709–4723} }'
  chicago: 'Soleymani, Mohammad, Christian Lameiro, Ignacio Santamaria, and Peter
    J. Schreier. “Robust Improper Signaling for Two-User SISO Interference Channels.”
    <i>IEEE Transactions on Communications</i> 67, no. 7 (2019): 4709–23. <a href="https://doi.org/10.1109/tcomm.2019.2910549">https://doi.org/10.1109/tcomm.2019.2910549</a>.'
  ieee: 'M. Soleymani, C. Lameiro, I. Santamaria, and P. J. Schreier, “Robust Improper
    Signaling for Two-User SISO Interference Channels,” <i>IEEE Transactions on Communications</i>,
    vol. 67, no. 7, pp. 4709–4723, 2019, doi: <a href="https://doi.org/10.1109/tcomm.2019.2910549">10.1109/tcomm.2019.2910549</a>.'
  mla: Soleymani, Mohammad, et al. “Robust Improper Signaling for Two-User SISO Interference
    Channels.” <i>IEEE Transactions on Communications</i>, vol. 67, no. 7, Institute
    of Electrical and Electronics Engineers (IEEE), 2019, pp. 4709–23, doi:<a href="https://doi.org/10.1109/tcomm.2019.2910549">10.1109/tcomm.2019.2910549</a>.
  short: M. Soleymani, C. Lameiro, I. Santamaria, P.J. Schreier, IEEE Transactions
    on Communications 67 (2019) 4709–4723.
date_created: 2024-04-05T09:07:44Z
date_updated: 2024-04-05T13:19:18Z
department:
- _id: '263'
doi: 10.1109/tcomm.2019.2910549
intvolume: '        67'
issue: '7'
keyword:
- Electrical and Electronic Engineering
language:
- iso: eng
page: 4709-4723
publication: IEEE Transactions on Communications
publication_identifier:
  issn:
  - 0090-6778
  - 1558-0857
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: Robust Improper Signaling for Two-User SISO Interference Channels
type: journal_article
user_id: '67076'
volume: 67
year: '2019'
...
---
_id: '53271'
author:
- first_name: Mohammad
  full_name: Soleymani, Mohammad
  last_name: Soleymani
- first_name: Christian
  full_name: Lameiro, Christian
  last_name: Lameiro
- first_name: Ignacio
  full_name: Santamaria, Ignacio
  last_name: Santamaria
- first_name: Peter J.
  full_name: Schreier, Peter J.
  last_name: Schreier
citation:
  ama: Soleymani M, Lameiro C, Santamaria I, Schreier PJ. Improper Signaling for SISO
    Two-User Interference Channels With Additive Asymmetric Hardware Distortion. <i>IEEE
    Transactions on Communications</i>. 2019;67(12):8624-8638. doi:<a href="https://doi.org/10.1109/tcomm.2019.2939310">10.1109/tcomm.2019.2939310</a>
  apa: Soleymani, M., Lameiro, C., Santamaria, I., &#38; Schreier, P. J. (2019). Improper
    Signaling for SISO Two-User Interference Channels With Additive Asymmetric Hardware
    Distortion. <i>IEEE Transactions on Communications</i>, <i>67</i>(12), 8624–8638.
    <a href="https://doi.org/10.1109/tcomm.2019.2939310">https://doi.org/10.1109/tcomm.2019.2939310</a>
  bibtex: '@article{Soleymani_Lameiro_Santamaria_Schreier_2019, title={Improper Signaling
    for SISO Two-User Interference Channels With Additive Asymmetric Hardware Distortion},
    volume={67}, DOI={<a href="https://doi.org/10.1109/tcomm.2019.2939310">10.1109/tcomm.2019.2939310</a>},
    number={12}, journal={IEEE Transactions on Communications}, publisher={Institute
    of Electrical and Electronics Engineers (IEEE)}, author={Soleymani, Mohammad and
    Lameiro, Christian and Santamaria, Ignacio and Schreier, Peter J.}, year={2019},
    pages={8624–8638} }'
  chicago: 'Soleymani, Mohammad, Christian Lameiro, Ignacio Santamaria, and Peter
    J. Schreier. “Improper Signaling for SISO Two-User Interference Channels With
    Additive Asymmetric Hardware Distortion.” <i>IEEE Transactions on Communications</i>
    67, no. 12 (2019): 8624–38. <a href="https://doi.org/10.1109/tcomm.2019.2939310">https://doi.org/10.1109/tcomm.2019.2939310</a>.'
  ieee: 'M. Soleymani, C. Lameiro, I. Santamaria, and P. J. Schreier, “Improper Signaling
    for SISO Two-User Interference Channels With Additive Asymmetric Hardware Distortion,”
    <i>IEEE Transactions on Communications</i>, vol. 67, no. 12, pp. 8624–8638, 2019,
    doi: <a href="https://doi.org/10.1109/tcomm.2019.2939310">10.1109/tcomm.2019.2939310</a>.'
  mla: Soleymani, Mohammad, et al. “Improper Signaling for SISO Two-User Interference
    Channels With Additive Asymmetric Hardware Distortion.” <i>IEEE Transactions on
    Communications</i>, vol. 67, no. 12, Institute of Electrical and Electronics Engineers
    (IEEE), 2019, pp. 8624–38, doi:<a href="https://doi.org/10.1109/tcomm.2019.2939310">10.1109/tcomm.2019.2939310</a>.
  short: M. Soleymani, C. Lameiro, I. Santamaria, P.J. Schreier, IEEE Transactions
    on Communications 67 (2019) 8624–8638.
date_created: 2024-04-05T09:05:39Z
date_updated: 2024-04-05T13:22:54Z
department:
- _id: '263'
doi: 10.1109/tcomm.2019.2939310
intvolume: '        67'
issue: '12'
keyword:
- Electrical and Electronic Engineering
language:
- iso: eng
page: 8624-8638
publication: IEEE Transactions on Communications
publication_identifier:
  issn:
  - 0090-6778
  - 1558-0857
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: Improper Signaling for SISO Two-User Interference Channels With Additive Asymmetric
  Hardware Distortion
type: journal_article
user_id: '67076'
volume: 67
year: '2019'
...