---
_id: '37037'
abstract:
- lang: eng
  text: Today we can identify a big gap between requirement specification and the
    generation of test environments. This article extends the Classification Tree
    Method for Embedded Systems (CTM/ES) to fill this gap by new concepts for the
    precise specification of stimuli for operational ranges of continuous control
    systems. It introduces novel means for continuous acceptance criteria definition
    and for functional coverage definition.
author:
- first_name: Alexander
  full_name: Krupp, Alexander
  last_name: Krupp
- first_name: Wolfgang
  full_name: Müller, Wolfgang
  id: '16243'
  last_name: Müller
citation:
  ama: 'Krupp A, Müller W. A Systematic Approach to Combined HW/SW System Test. In:
    <i>Proceedings of DATE’10</i>. IEEE; 2010. doi:<a href="https://doi.org/10.1109/DATE.2010.5457186">10.1109/DATE.2010.5457186</a>'
  apa: Krupp, A., &#38; Müller, W. (2010). A Systematic Approach to Combined HW/SW
    System Test. <i>Proceedings of DATE’10</i>. Design, Automation &#38; Test in Europe
    Conference &#38; Exhibition (DATE 2010), Dresden. <a href="https://doi.org/10.1109/DATE.2010.5457186">https://doi.org/10.1109/DATE.2010.5457186</a>
  bibtex: '@inproceedings{Krupp_Müller_2010, place={Dresden}, title={A Systematic
    Approach to Combined HW/SW System Test}, DOI={<a href="https://doi.org/10.1109/DATE.2010.5457186">10.1109/DATE.2010.5457186</a>},
    booktitle={Proceedings of DATE’10}, publisher={IEEE}, author={Krupp, Alexander
    and Müller, Wolfgang}, year={2010} }'
  chicago: 'Krupp, Alexander, and Wolfgang Müller. “A Systematic Approach to Combined
    HW/SW System Test.” In <i>Proceedings of DATE’10</i>. Dresden: IEEE, 2010. <a
    href="https://doi.org/10.1109/DATE.2010.5457186">https://doi.org/10.1109/DATE.2010.5457186</a>.'
  ieee: 'A. Krupp and W. Müller, “A Systematic Approach to Combined HW/SW System Test,”
    presented at the Design, Automation &#38; Test in Europe Conference &#38; Exhibition
    (DATE 2010), Dresden, 2010, doi: <a href="https://doi.org/10.1109/DATE.2010.5457186">10.1109/DATE.2010.5457186</a>.'
  mla: Krupp, Alexander, and Wolfgang Müller. “A Systematic Approach to Combined HW/SW
    System Test.” <i>Proceedings of DATE’10</i>, IEEE, 2010, doi:<a href="https://doi.org/10.1109/DATE.2010.5457186">10.1109/DATE.2010.5457186</a>.
  short: 'A. Krupp, W. Müller, in: Proceedings of DATE’10, IEEE, Dresden, 2010.'
conference:
  location: Dresden
  name: Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)
date_created: 2023-01-17T10:41:15Z
date_updated: 2023-01-17T10:41:25Z
department:
- _id: '672'
doi: 10.1109/DATE.2010.5457186
keyword:
- System testing
- Automatic testing
- Object oriented modeling
- Classification tree analysis
- Automotive engineering
- Mathematical model
- Embedded system
- Control systems
- Electronic equipment testing
- Software testing
language:
- iso: eng
place: Dresden
publication: Proceedings of DATE’10
publisher: IEEE
status: public
title: A Systematic Approach to Combined HW/SW System Test
type: conference
user_id: '5786'
year: '2010'
...