[{"keyword":["Near-Field Scanning","Huygens Box","Boundary Element Method","Method of Moments","tet_topic_hf","tet_enas"],"language":[{"iso":"eng"}],"publication":"2022 Smart Systems Integration (SSI)","abstract":[{"text":"In this publication a novel method for far-field prediction from magnetic Huygens box data based on the boundary element method (BEM) is presented. Two examples are considered for the validation of this method. The first example represents an electric dipole so that the obtained calculations can be compared to an analytical solution. As a second example, a printed circuit board is considered and the calculated far-field is compared to a fullwave simulation. In both cases, the calculations for different field integral equations are under comparison, and the results indicate that the presented method performs very well with a combined field integral equation, for the specified problem, when only magnetic Huygens box data is given.","lang":"eng"}],"publisher":"IEEE","date_created":"2022-10-04T11:31:43Z","title":"Far-field Calculation from magnetic Huygens Box Data using the Boundary Element Method","year":"2022","_id":"33509","project":[{"_id":"52","name":"PC2: Computing Resources Provided by the Paderborn Center for Parallel Computing"}],"department":[{"_id":"59"},{"_id":"61"},{"_id":"485"}],"user_id":"158","type":"conference","status":"public","date_updated":"2024-11-30T19:32:14Z","author":[{"first_name":"Christoph","full_name":"Marschalt, Christoph","last_name":"Marschalt"},{"last_name":"Schroder","full_name":"Schroder, Dominik","first_name":"Dominik"},{"id":"38240","full_name":"Lange, Sven","orcid":"0009-0007-9150-2266 ","last_name":"Lange","first_name":"Sven"},{"id":"20179","full_name":"Hilleringmann, Ulrich","last_name":"Hilleringmann","first_name":"Ulrich"},{"full_name":"Hedayat, Christian","last_name":"Hedayat","first_name":"Christian"},{"last_name":"Kuhn","full_name":"Kuhn, Harald","first_name":"Harald"},{"first_name":"Denis","full_name":"Sievers, Denis","last_name":"Sievers"},{"first_name":"Jens","last_name":"Förstner","orcid":"0000-0001-7059-9862","id":"158","full_name":"Förstner, Jens"}],"doi":"10.1109/ssi56489.2022.9901431","conference":{"end_date":"2022-04-28","location":"Grenoble, France","name":"2022 Smart Systems Integration (SSI)","start_date":"2022-04-27"},"main_file_link":[{"url":"https://ieeexplore.ieee.org/document/9901431"}],"publication_identifier":{"eisbn":["978-1-6654-8849-5"]},"publication_status":"published","place":"Grenoble, France","citation":{"apa":"Marschalt, C., Schroder, D., Lange, S., Hilleringmann, U., Hedayat, C., Kuhn, H., Sievers, D., &#38; Förstner, J. (2022). Far-field Calculation from magnetic Huygens Box Data using the Boundary Element Method. <i>2022 Smart Systems Integration (SSI)</i>. 2022 Smart Systems Integration (SSI), Grenoble, France. <a href=\"https://doi.org/10.1109/ssi56489.2022.9901431\">https://doi.org/10.1109/ssi56489.2022.9901431</a>","mla":"Marschalt, Christoph, et al. “Far-Field Calculation from Magnetic Huygens Box Data Using the Boundary Element Method.” <i>2022 Smart Systems Integration (SSI)</i>, IEEE, 2022, doi:<a href=\"https://doi.org/10.1109/ssi56489.2022.9901431\">10.1109/ssi56489.2022.9901431</a>.","bibtex":"@inproceedings{Marschalt_Schroder_Lange_Hilleringmann_Hedayat_Kuhn_Sievers_Förstner_2022, place={Grenoble, France}, title={Far-field Calculation from magnetic Huygens Box Data using the Boundary Element Method}, DOI={<a href=\"https://doi.org/10.1109/ssi56489.2022.9901431\">10.1109/ssi56489.2022.9901431</a>}, booktitle={2022 Smart Systems Integration (SSI)}, publisher={IEEE}, author={Marschalt, Christoph and Schroder, Dominik and Lange, Sven and Hilleringmann, Ulrich and Hedayat, Christian and Kuhn, Harald and Sievers, Denis and Förstner, Jens}, year={2022} }","short":"C. Marschalt, D. Schroder, S. Lange, U. Hilleringmann, C. Hedayat, H. Kuhn, D. Sievers, J. Förstner, in: 2022 Smart Systems Integration (SSI), IEEE, Grenoble, France, 2022.","chicago":"Marschalt, Christoph, Dominik Schroder, Sven Lange, Ulrich Hilleringmann, Christian Hedayat, Harald Kuhn, Denis Sievers, and Jens Förstner. “Far-Field Calculation from Magnetic Huygens Box Data Using the Boundary Element Method.” In <i>2022 Smart Systems Integration (SSI)</i>. Grenoble, France: IEEE, 2022. <a href=\"https://doi.org/10.1109/ssi56489.2022.9901431\">https://doi.org/10.1109/ssi56489.2022.9901431</a>.","ieee":"C. Marschalt <i>et al.</i>, “Far-field Calculation from magnetic Huygens Box Data using the Boundary Element Method,” presented at the 2022 Smart Systems Integration (SSI), Grenoble, France, 2022, doi: <a href=\"https://doi.org/10.1109/ssi56489.2022.9901431\">10.1109/ssi56489.2022.9901431</a>.","ama":"Marschalt C, Schroder D, Lange S, et al. Far-field Calculation from magnetic Huygens Box Data using the Boundary Element Method. In: <i>2022 Smart Systems Integration (SSI)</i>. IEEE; 2022. doi:<a href=\"https://doi.org/10.1109/ssi56489.2022.9901431\">10.1109/ssi56489.2022.9901431</a>"}},{"_id":"21541","project":[{"_id":"52","name":"Computing Resources Provided by the Paderborn Center for Parallel Computing"}],"department":[{"_id":"59"},{"_id":"485"}],"user_id":"38240","type":"conference","status":"public","date_updated":"2022-01-06T06:55:03Z","author":[{"full_name":"Lange, Sven","id":"38240","last_name":"Lange","first_name":"Sven"},{"full_name":"Schroder, Dominik","last_name":"Schroder","first_name":"Dominik"},{"first_name":"Christian","full_name":"Hedayat, Christian","last_name":"Hedayat"},{"first_name":"Christian","last_name":"Hangmann","full_name":"Hangmann, Christian"},{"full_name":"Otto, Thomas","last_name":"Otto","first_name":"Thomas"},{"full_name":"Hilleringmann, Ulrich","last_name":"Hilleringmann","first_name":"Ulrich"}],"doi":"10.1109/emceurope48519.2020.9245697","conference":{"name":"2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE","start_date":"2020-09-23","end_date":"2020-09-25","location":"Rome, Italy "},"main_file_link":[{"url":"https://ieeexplore.ieee.org/document/9245697"}],"publication_identifier":{"eisbn":["978-1-7281-5579-1"],"isbn":["978-1-7281-5580-7"],"issn":["2325-0364 "]},"publication_status":"published","related_material":{"record":[{"status":"public","id":"21541","relation":"original"}]},"citation":{"chicago":"Lange, Sven, Dominik Schroder, Christian Hedayat, Christian Hangmann, Thomas Otto, and Ulrich Hilleringmann. “Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000.” In <i>2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE</i>. IEEE, 2020. <a href=\"https://doi.org/10.1109/emceurope48519.2020.9245697\">https://doi.org/10.1109/emceurope48519.2020.9245697</a>.","ieee":"S. Lange, D. Schroder, C. Hedayat, C. Hangmann, T. Otto, and U. Hilleringmann, “Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000,” in <i>2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE</i>, Rome, Italy , 2020.","ama":"Lange S, Schroder D, Hedayat C, Hangmann C, Otto T, Hilleringmann U. Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000. In: <i>2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE</i>. IEEE; 2020. doi:<a href=\"https://doi.org/10.1109/emceurope48519.2020.9245697\">10.1109/emceurope48519.2020.9245697</a>","apa":"Lange, S., Schroder, D., Hedayat, C., Hangmann, C., Otto, T., &#38; Hilleringmann, U. (2020). Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000. In <i>2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE</i>. Rome, Italy : IEEE. <a href=\"https://doi.org/10.1109/emceurope48519.2020.9245697\">https://doi.org/10.1109/emceurope48519.2020.9245697</a>","mla":"Lange, Sven, et al. “Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000.” <i>2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE</i>, IEEE, 2020, doi:<a href=\"https://doi.org/10.1109/emceurope48519.2020.9245697\">10.1109/emceurope48519.2020.9245697</a>.","bibtex":"@inproceedings{Lange_Schroder_Hedayat_Hangmann_Otto_Hilleringmann_2020, title={Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000}, DOI={<a href=\"https://doi.org/10.1109/emceurope48519.2020.9245697\">10.1109/emceurope48519.2020.9245697</a>}, booktitle={2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE}, publisher={IEEE}, author={Lange, Sven and Schroder, Dominik and Hedayat, Christian and Hangmann, Christian and Otto, Thomas and Hilleringmann, Ulrich}, year={2020} }","short":"S. Lange, D. Schroder, C. Hedayat, C. Hangmann, T. Otto, U. Hilleringmann, in: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, IEEE, 2020."},"keyword":["Near-Field Scanner","Near-Field to Far-Field Transformation","Directivity","Surface Equivalence Theorem","Huygens’ Box"],"language":[{"iso":"eng"}],"publication":"2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE","abstract":[{"text":"In this publication, the near-field to far-field transformation using the self-built near-field scanner NFS3000 is examined with regard to its geometry. This device allows to measure electric and magnetic fields in small distances to the DUT (Device under Test) with high geometric precision and high sensitivity. Leading to a fast examination of EMC (Electromagnetic Compatibility) problems, because the electromagnetic properties are better understandable and therefore easier to solve than e.g. measurements in a far-field chamber. In addition, it is possible to extrapolate the near-fields into the far-field and to determine the radiation pattern of antennas and emitting objects. For this purpose, this paper deals with the basis of this transformation, the so-called surface equivalence theorem. This principle is then adapted to the measurement of near-field scanners and implemented accordingly. Due to the non-ideal design of the near-field scanner, the effects on a far-field transformation are finally presented and discussed.","lang":"eng"}],"publisher":"IEEE","date_created":"2021-03-18T13:43:53Z","title":"Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000","year":"2020"},{"citation":{"apa":"Schröder, D., Lange, S., Hangmann, C., &#38; Hedayat, C. (2020). Far-field prediction combining simulations with near-field measurements for EMI assessment of PCBs. In <i>Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis</i> (1st ed., pp. 315-346 (32)). Croyton, UK:  The Institution of Engineering and Technology (IET). <a href=\"https://doi.org/10.1049/pbcs072e_ch14\">https://doi.org/10.1049/pbcs072e_ch14</a>","short":"D. Schröder, S. Lange, C. Hangmann, C. Hedayat, in: Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis, 1st ed.,  The Institution of Engineering and Technology (IET), Croyton, UK, 2020, pp. 315-346 (32).","bibtex":"@inbook{Schröder_Lange_Hangmann_Hedayat_2020, place={Croyton, UK}, edition={1}, title={Far-field prediction combining simulations with near-field measurements for EMI assessment of PCBs}, DOI={<a href=\"https://doi.org/10.1049/pbcs072e_ch14\">10.1049/pbcs072e_ch14</a>}, booktitle={Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis}, publisher={ The Institution of Engineering and Technology (IET)}, author={Schröder, Dominik and Lange, Sven and Hangmann, Christian and Hedayat, Christian}, year={2020}, pages={315-346 (32)} }","mla":"Schröder, Dominik, et al. “Far-Field Prediction Combining Simulations with near-Field Measurements for EMI Assessment of PCBs.” <i>Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis</i>, 1st ed.,  The Institution of Engineering and Technology (IET), 2020, pp. 315-346 (32), doi:<a href=\"https://doi.org/10.1049/pbcs072e_ch14\">10.1049/pbcs072e_ch14</a>.","ieee":"D. Schröder, S. Lange, C. Hangmann, and C. Hedayat, “Far-field prediction combining simulations with near-field measurements for EMI assessment of PCBs,” in <i>Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis</i>, 1st ed., Croyton, UK:  The Institution of Engineering and Technology (IET), 2020, pp. 315-346 (32).","chicago":"Schröder, Dominik, Sven Lange, Christian Hangmann, and Christian Hedayat. “Far-Field Prediction Combining Simulations with near-Field Measurements for EMI Assessment of PCBs.” In <i>Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis</i>, 1st ed., 315-346 (32). Croyton, UK:  The Institution of Engineering and Technology (IET), 2020. <a href=\"https://doi.org/10.1049/pbcs072e_ch14\">https://doi.org/10.1049/pbcs072e_ch14</a>.","ama":"Schröder D, Lange S, Hangmann C, Hedayat C. Far-field prediction combining simulations with near-field measurements for EMI assessment of PCBs. In: <i>Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis</i>. 1st ed. Croyton, UK:  The Institution of Engineering and Technology (IET); 2020:315-346 (32). doi:<a href=\"https://doi.org/10.1049/pbcs072e_ch14\">10.1049/pbcs072e_ch14</a>"},"page":"315-346 (32)","place":"Croyton, UK","related_material":{"record":[{"status":"public","relation":"other","id":"21542"}]},"publication_status":"published","publication_identifier":{"isbn":["9781839530494","9781839530500"]},"main_file_link":[{"url":"https://digital-library.theiet.org/content/books/10.1049/pbcs072e_ch14"}],"doi":"10.1049/pbcs072e_ch14","author":[{"full_name":"Schröder, Dominik","last_name":"Schröder","first_name":"Dominik"},{"last_name":"Lange","full_name":"Lange, Sven","id":"38240","first_name":"Sven"},{"full_name":"Hangmann, Christian","last_name":"Hangmann","first_name":"Christian"},{"last_name":"Hedayat","full_name":"Hedayat, Christian","first_name":"Christian"}],"date_updated":"2022-01-06T06:55:03Z","status":"public","type":"book_chapter","user_id":"38240","department":[{"_id":"485"}],"project":[{"name":"Computing Resources Provided by the Paderborn Center for Parallel Computing","_id":"52"}],"_id":"21542","year":"2020","edition":"1","title":"Far-field prediction combining simulations with near-field measurements for EMI assessment of PCBs","date_created":"2021-03-18T13:49:49Z","publisher":" The Institution of Engineering and Technology (IET)","abstract":[{"lang":"eng","text":"Using near-field (NF) scan data to predict the far-field (FF) behaviour of radiating electronic systems represents a novel method to accompany the whole RF design process. This approach involves so-called Huygens' box as an efficient radiation model inside an electromagnetic (EM) simulation tool and then transforms the scanned NF measured data into the FF. For this, the basic idea of the Huygens'box principle and the NF-to-FF transformation are briefly presented. The NF is measured on the Huygens' box around a device under test using anNF scanner, recording the magnitude and phase of the site-related magnetic and electric components. A comparison between a fullwave simulation and the measurement results shows a good similarity in both the NF and the simulated and transformed FF.Thus, this method is applicable to predict the FF behaviour of any electronic system by measuring the NF. With this knowledge, the RF design can be improved due to allowing a significant reduction of EM compatibility failure at the end of the development flow. In addition, the very efficient FF radiation model can be used for detailed investigations in various environments and the impact of such an equivalent radiation source on other electronic systems can be assessed."}],"publication":"Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis","language":[{"iso":"eng"}],"keyword":["Huygens' box","NF-to-FF transformation","efficient FF radiation model","FF behaviour","EMI assessment","PCB","near-field measurements","efficient radiation model","far-field behaviour","RF design process","far-field prediction","Huygens'box principle","fullwave simulation","electronic system radiation","equivalent radiation source","electromagnetic simulation tool","near-field scan data","EM compatibility failure reduction"]}]