---
_id: '33509'
abstract:
- lang: eng
  text: In this publication a novel method for far-field prediction from magnetic
    Huygens box data based on the boundary element method (BEM) is presented. Two
    examples are considered for the validation of this method. The first example represents
    an electric dipole so that the obtained calculations can be compared to an analytical
    solution. As a second example, a printed circuit board is considered and the calculated
    far-field is compared to a fullwave simulation. In both cases, the calculations
    for different field integral equations are under comparison, and the results indicate
    that the presented method performs very well with a combined field integral equation,
    for the specified problem, when only magnetic Huygens box data is given.
author:
- first_name: Christoph
  full_name: Marschalt, Christoph
  last_name: Marschalt
- first_name: Dominik
  full_name: Schroder, Dominik
  last_name: Schroder
- first_name: Sven
  full_name: Lange, Sven
  id: '38240'
  last_name: Lange
  orcid: '0009-0007-9150-2266 '
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  id: '20179'
  last_name: Hilleringmann
- first_name: Christian
  full_name: Hedayat, Christian
  last_name: Hedayat
- first_name: Harald
  full_name: Kuhn, Harald
  last_name: Kuhn
- first_name: Denis
  full_name: Sievers, Denis
  last_name: Sievers
- first_name: Jens
  full_name: Förstner, Jens
  id: '158'
  last_name: Förstner
  orcid: 0000-0001-7059-9862
citation:
  ama: 'Marschalt C, Schroder D, Lange S, et al. Far-field Calculation from magnetic
    Huygens Box Data using the Boundary Element Method. In: <i>2022 Smart Systems
    Integration (SSI)</i>. IEEE; 2022. doi:<a href="https://doi.org/10.1109/ssi56489.2022.9901431">10.1109/ssi56489.2022.9901431</a>'
  apa: Marschalt, C., Schroder, D., Lange, S., Hilleringmann, U., Hedayat, C., Kuhn,
    H., Sievers, D., &#38; Förstner, J. (2022). Far-field Calculation from magnetic
    Huygens Box Data using the Boundary Element Method. <i>2022 Smart Systems Integration
    (SSI)</i>. 2022 Smart Systems Integration (SSI), Grenoble, France. <a href="https://doi.org/10.1109/ssi56489.2022.9901431">https://doi.org/10.1109/ssi56489.2022.9901431</a>
  bibtex: '@inproceedings{Marschalt_Schroder_Lange_Hilleringmann_Hedayat_Kuhn_Sievers_Förstner_2022,
    place={Grenoble, France}, title={Far-field Calculation from magnetic Huygens Box
    Data using the Boundary Element Method}, DOI={<a href="https://doi.org/10.1109/ssi56489.2022.9901431">10.1109/ssi56489.2022.9901431</a>},
    booktitle={2022 Smart Systems Integration (SSI)}, publisher={IEEE}, author={Marschalt,
    Christoph and Schroder, Dominik and Lange, Sven and Hilleringmann, Ulrich and
    Hedayat, Christian and Kuhn, Harald and Sievers, Denis and Förstner, Jens}, year={2022}
    }'
  chicago: 'Marschalt, Christoph, Dominik Schroder, Sven Lange, Ulrich Hilleringmann,
    Christian Hedayat, Harald Kuhn, Denis Sievers, and Jens Förstner. “Far-Field Calculation
    from Magnetic Huygens Box Data Using the Boundary Element Method.” In <i>2022
    Smart Systems Integration (SSI)</i>. Grenoble, France: IEEE, 2022. <a href="https://doi.org/10.1109/ssi56489.2022.9901431">https://doi.org/10.1109/ssi56489.2022.9901431</a>.'
  ieee: 'C. Marschalt <i>et al.</i>, “Far-field Calculation from magnetic Huygens
    Box Data using the Boundary Element Method,” presented at the 2022 Smart Systems
    Integration (SSI), Grenoble, France, 2022, doi: <a href="https://doi.org/10.1109/ssi56489.2022.9901431">10.1109/ssi56489.2022.9901431</a>.'
  mla: Marschalt, Christoph, et al. “Far-Field Calculation from Magnetic Huygens Box
    Data Using the Boundary Element Method.” <i>2022 Smart Systems Integration (SSI)</i>,
    IEEE, 2022, doi:<a href="https://doi.org/10.1109/ssi56489.2022.9901431">10.1109/ssi56489.2022.9901431</a>.
  short: 'C. Marschalt, D. Schroder, S. Lange, U. Hilleringmann, C. Hedayat, H. Kuhn,
    D. Sievers, J. Förstner, in: 2022 Smart Systems Integration (SSI), IEEE, Grenoble,
    France, 2022.'
conference:
  end_date: 2022-04-28
  location: Grenoble, France
  name: 2022 Smart Systems Integration (SSI)
  start_date: 2022-04-27
date_created: 2022-10-04T11:31:43Z
date_updated: 2024-11-30T19:32:14Z
department:
- _id: '59'
- _id: '61'
- _id: '485'
doi: 10.1109/ssi56489.2022.9901431
keyword:
- Near-Field Scanning
- Huygens Box
- Boundary Element Method
- Method of Moments
- tet_topic_hf
- tet_enas
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/document/9901431
place: Grenoble, France
project:
- _id: '52'
  name: 'PC2: Computing Resources Provided by the Paderborn Center for Parallel Computing'
publication: 2022 Smart Systems Integration (SSI)
publication_identifier:
  eisbn:
  - 978-1-6654-8849-5
publication_status: published
publisher: IEEE
status: public
title: Far-field Calculation from magnetic Huygens Box Data using the Boundary Element
  Method
type: conference
user_id: '158'
year: '2022'
...
---
_id: '21541'
abstract:
- lang: eng
  text: In this publication, the near-field to far-field transformation using the
    self-built near-field scanner NFS3000 is examined with regard to its geometry.
    This device allows to measure electric and magnetic fields in small distances
    to the DUT (Device under Test) with high geometric precision and high sensitivity.
    Leading to a fast examination of EMC (Electromagnetic Compatibility) problems,
    because the electromagnetic properties are better understandable and therefore
    easier to solve than e.g. measurements in a far-field chamber. In addition, it
    is possible to extrapolate the near-fields into the far-field and to determine
    the radiation pattern of antennas and emitting objects. For this purpose, this
    paper deals with the basis of this transformation, the so-called surface equivalence
    theorem. This principle is then adapted to the measurement of near-field scanners
    and implemented accordingly. Due to the non-ideal design of the near-field scanner,
    the effects on a far-field transformation are finally presented and discussed.
author:
- first_name: Sven
  full_name: Lange, Sven
  id: '38240'
  last_name: Lange
- first_name: Dominik
  full_name: Schroder, Dominik
  last_name: Schroder
- first_name: Christian
  full_name: Hedayat, Christian
  last_name: Hedayat
- first_name: Christian
  full_name: Hangmann, Christian
  last_name: Hangmann
- first_name: Thomas
  full_name: Otto, Thomas
  last_name: Otto
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  last_name: Hilleringmann
citation:
  ama: 'Lange S, Schroder D, Hedayat C, Hangmann C, Otto T, Hilleringmann U. Investigation
    of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field
    Transformation by the NFS3000. In: <i>2020 International Symposium on Electromagnetic
    Compatibility - EMC EUROPE</i>. IEEE; 2020. doi:<a href="https://doi.org/10.1109/emceurope48519.2020.9245697">10.1109/emceurope48519.2020.9245697</a>'
  apa: 'Lange, S., Schroder, D., Hedayat, C., Hangmann, C., Otto, T., &#38; Hilleringmann,
    U. (2020). Investigation of the Surface Equivalence Principle on a Metal Surface
    for a Near-Field to Far-Field Transformation by the NFS3000. In <i>2020 International
    Symposium on Electromagnetic Compatibility - EMC EUROPE</i>. Rome, Italy : IEEE.
    <a href="https://doi.org/10.1109/emceurope48519.2020.9245697">https://doi.org/10.1109/emceurope48519.2020.9245697</a>'
  bibtex: '@inproceedings{Lange_Schroder_Hedayat_Hangmann_Otto_Hilleringmann_2020,
    title={Investigation of the Surface Equivalence Principle on a Metal Surface for
    a Near-Field to Far-Field Transformation by the NFS3000}, DOI={<a href="https://doi.org/10.1109/emceurope48519.2020.9245697">10.1109/emceurope48519.2020.9245697</a>},
    booktitle={2020 International Symposium on Electromagnetic Compatibility - EMC
    EUROPE}, publisher={IEEE}, author={Lange, Sven and Schroder, Dominik and Hedayat,
    Christian and Hangmann, Christian and Otto, Thomas and Hilleringmann, Ulrich},
    year={2020} }'
  chicago: Lange, Sven, Dominik Schroder, Christian Hedayat, Christian Hangmann, Thomas
    Otto, and Ulrich Hilleringmann. “Investigation of the Surface Equivalence Principle
    on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000.”
    In <i>2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE</i>.
    IEEE, 2020. <a href="https://doi.org/10.1109/emceurope48519.2020.9245697">https://doi.org/10.1109/emceurope48519.2020.9245697</a>.
  ieee: S. Lange, D. Schroder, C. Hedayat, C. Hangmann, T. Otto, and U. Hilleringmann,
    “Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field
    to Far-Field Transformation by the NFS3000,” in <i>2020 International Symposium
    on Electromagnetic Compatibility - EMC EUROPE</i>, Rome, Italy , 2020.
  mla: Lange, Sven, et al. “Investigation of the Surface Equivalence Principle on
    a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000.”
    <i>2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE</i>,
    IEEE, 2020, doi:<a href="https://doi.org/10.1109/emceurope48519.2020.9245697">10.1109/emceurope48519.2020.9245697</a>.
  short: 'S. Lange, D. Schroder, C. Hedayat, C. Hangmann, T. Otto, U. Hilleringmann,
    in: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE,
    IEEE, 2020.'
conference:
  end_date: 2020-09-25
  location: 'Rome, Italy '
  name: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE
  start_date: 2020-09-23
date_created: 2021-03-18T13:43:53Z
date_updated: 2022-01-06T06:55:03Z
department:
- _id: '59'
- _id: '485'
doi: 10.1109/emceurope48519.2020.9245697
keyword:
- Near-Field Scanner
- Near-Field to Far-Field Transformation
- Directivity
- Surface Equivalence Theorem
- Huygens’ Box
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/document/9245697
project:
- _id: '52'
  name: Computing Resources Provided by the Paderborn Center for Parallel Computing
publication: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE
publication_identifier:
  eisbn:
  - 978-1-7281-5579-1
  isbn:
  - 978-1-7281-5580-7
  issn:
  - '2325-0364 '
publication_status: published
publisher: IEEE
related_material:
  record:
  - id: '21541'
    relation: original
    status: public
status: public
title: Investigation of the Surface Equivalence Principle on a Metal Surface for a
  Near-Field to Far-Field Transformation by the NFS3000
type: conference
user_id: '38240'
year: '2020'
...
---
_id: '21542'
abstract:
- lang: eng
  text: Using near-field (NF) scan data to predict the far-field (FF) behaviour of
    radiating electronic systems represents a novel method to accompany the whole
    RF design process. This approach involves so-called Huygens' box as an efficient
    radiation model inside an electromagnetic (EM) simulation tool and then transforms
    the scanned NF measured data into the FF. For this, the basic idea of the Huygens'box
    principle and the NF-to-FF transformation are briefly presented. The NF is measured
    on the Huygens' box around a device under test using anNF scanner, recording the
    magnitude and phase of the site-related magnetic and electric components. A comparison
    between a fullwave simulation and the measurement results shows a good similarity
    in both the NF and the simulated and transformed FF.Thus, this method is applicable
    to predict the FF behaviour of any electronic system by measuring the NF. With
    this knowledge, the RF design can be improved due to allowing a significant reduction
    of EM compatibility failure at the end of the development flow. In addition, the
    very efficient FF radiation model can be used for detailed investigations in various
    environments and the impact of such an equivalent radiation source on other electronic
    systems can be assessed.
author:
- first_name: Dominik
  full_name: Schröder, Dominik
  last_name: Schröder
- first_name: Sven
  full_name: Lange, Sven
  id: '38240'
  last_name: Lange
- first_name: Christian
  full_name: Hangmann, Christian
  last_name: Hangmann
- first_name: Christian
  full_name: Hedayat, Christian
  last_name: Hedayat
citation:
  ama: 'Schröder D, Lange S, Hangmann C, Hedayat C. Far-field prediction combining
    simulations with near-field measurements for EMI assessment of PCBs. In: <i>Tensorial
    Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis</i>.
    1st ed. Croyton, UK:  The Institution of Engineering and Technology (IET); 2020:315-346
    (32). doi:<a href="https://doi.org/10.1049/pbcs072e_ch14">10.1049/pbcs072e_ch14</a>'
  apa: 'Schröder, D., Lange, S., Hangmann, C., &#38; Hedayat, C. (2020). Far-field
    prediction combining simulations with near-field measurements for EMI assessment
    of PCBs. In <i>Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity
    and EMC Analysis</i> (1st ed., pp. 315-346 (32)). Croyton, UK:  The Institution
    of Engineering and Technology (IET). <a href="https://doi.org/10.1049/pbcs072e_ch14">https://doi.org/10.1049/pbcs072e_ch14</a>'
  bibtex: '@inbook{Schröder_Lange_Hangmann_Hedayat_2020, place={Croyton, UK}, edition={1},
    title={Far-field prediction combining simulations with near-field measurements
    for EMI assessment of PCBs}, DOI={<a href="https://doi.org/10.1049/pbcs072e_ch14">10.1049/pbcs072e_ch14</a>},
    booktitle={Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity
    and EMC Analysis}, publisher={ The Institution of Engineering and Technology (IET)},
    author={Schröder, Dominik and Lange, Sven and Hangmann, Christian and Hedayat,
    Christian}, year={2020}, pages={315-346 (32)} }'
  chicago: 'Schröder, Dominik, Sven Lange, Christian Hangmann, and Christian Hedayat.
    “Far-Field Prediction Combining Simulations with near-Field Measurements for EMI
    Assessment of PCBs.” In <i>Tensorial Analysis of Networks (TAN) Modelling for
    PCB Signal Integrity and EMC Analysis</i>, 1st ed., 315-346 (32). Croyton, UK:  The
    Institution of Engineering and Technology (IET), 2020. <a href="https://doi.org/10.1049/pbcs072e_ch14">https://doi.org/10.1049/pbcs072e_ch14</a>.'
  ieee: 'D. Schröder, S. Lange, C. Hangmann, and C. Hedayat, “Far-field prediction
    combining simulations with near-field measurements for EMI assessment of PCBs,”
    in <i>Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity
    and EMC Analysis</i>, 1st ed., Croyton, UK:  The Institution of Engineering and
    Technology (IET), 2020, pp. 315-346 (32).'
  mla: Schröder, Dominik, et al. “Far-Field Prediction Combining Simulations with
    near-Field Measurements for EMI Assessment of PCBs.” <i>Tensorial Analysis of
    Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis</i>, 1st ed.,  The
    Institution of Engineering and Technology (IET), 2020, pp. 315-346 (32), doi:<a
    href="https://doi.org/10.1049/pbcs072e_ch14">10.1049/pbcs072e_ch14</a>.
  short: 'D. Schröder, S. Lange, C. Hangmann, C. Hedayat, in: Tensorial Analysis
    of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis, 1st ed.,  The
    Institution of Engineering and Technology (IET), Croyton, UK, 2020, pp. 315-346
    (32).'
date_created: 2021-03-18T13:49:49Z
date_updated: 2022-01-06T06:55:03Z
department:
- _id: '485'
doi: 10.1049/pbcs072e_ch14
edition: '1'
keyword:
- Huygens' box
- NF-to-FF transformation
- efficient FF radiation model
- FF behaviour
- EMI assessment
- PCB
- near-field measurements
- efficient radiation model
- far-field behaviour
- RF design process
- far-field prediction
- Huygens'box principle
- fullwave simulation
- electronic system radiation
- equivalent radiation source
- electromagnetic simulation tool
- near-field scan data
- EM compatibility failure reduction
language:
- iso: eng
main_file_link:
- url: https://digital-library.theiet.org/content/books/10.1049/pbcs072e_ch14
page: 315-346 (32)
place: Croyton, UK
project:
- _id: '52'
  name: Computing Resources Provided by the Paderborn Center for Parallel Computing
publication: Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity
  and EMC Analysis
publication_identifier:
  isbn:
  - '9781839530494'
  - '9781839530500'
publication_status: published
publisher: ' The Institution of Engineering and Technology (IET)'
related_material:
  record:
  - id: '21542'
    relation: other
    status: public
status: public
title: Far-field prediction combining simulations with near-field measurements for
  EMI assessment of PCBs
type: book_chapter
user_id: '38240'
year: '2020'
...