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Transport properties of magnetic tunnel junctions withCo2MnSielectrodes: The influence of temperature-dependent interface magnetization and electronic band structure. <i>Physical Review B</i>, <i>75</i>(1), Article 014403. <a href=\"https://doi.org/10.1103/physrevb.75.014403\">https://doi.org/10.1103/physrevb.75.014403</a>","mla":"Schmalhorst, J., et al. “Transport Properties of Magnetic Tunnel Junctions WithCo2MnSielectrodes: The Influence of Temperature-Dependent Interface Magnetization and Electronic Band Structure.” <i>Physical Review B</i>, vol. 75, no. 1, 014403, American Physical Society (APS), 2007, doi:<a href=\"https://doi.org/10.1103/physrevb.75.014403\">10.1103/physrevb.75.014403</a>.","bibtex":"@article{Schmalhorst_Thomas_Kämmerer_Schebaum_Ebke_Sacher_Reiss_Hütten_Turchanin_Gölzhäuser_et al._2007, title={Transport properties of magnetic tunnel junctions withCo2MnSielectrodes: The influence of temperature-dependent interface magnetization and electronic band structure}, volume={75}, DOI={<a href=\"https://doi.org/10.1103/physrevb.75.014403\">10.1103/physrevb.75.014403</a>}, number={1014403}, journal={Physical Review B}, publisher={American Physical Society (APS)}, author={Schmalhorst, J. and Thomas, A. and Kämmerer, S. and Schebaum, O. and Ebke, D. and Sacher, Marc and Reiss, G. and Hütten, A. and Turchanin, A. and Gölzhäuser, A. and et al.}, year={2007} }","short":"J. Schmalhorst, A. Thomas, S. Kämmerer, O. Schebaum, D. Ebke, M. Sacher, G. Reiss, A. Hütten, A. Turchanin, A. Gölzhäuser, E. Arenholz, Physical Review B 75 (2007).","chicago":"Schmalhorst, J., A. Thomas, S. Kämmerer, O. Schebaum, D. Ebke, Marc Sacher, G. Reiss, et al. “Transport Properties of Magnetic Tunnel Junctions WithCo2MnSielectrodes: The Influence of Temperature-Dependent Interface Magnetization and Electronic Band Structure.” <i>Physical Review B</i> 75, no. 1 (2007). <a href=\"https://doi.org/10.1103/physrevb.75.014403\">https://doi.org/10.1103/physrevb.75.014403</a>.","ieee":"J. Schmalhorst <i>et al.</i>, “Transport properties of magnetic tunnel junctions withCo2MnSielectrodes: The influence of temperature-dependent interface magnetization and electronic band structure,” <i>Physical Review B</i>, vol. 75, no. 1, Art. no. 014403, 2007, doi: <a href=\"https://doi.org/10.1103/physrevb.75.014403\">10.1103/physrevb.75.014403</a>.","ama":"Schmalhorst J, Thomas A, Kämmerer S, et al. Transport properties of magnetic tunnel junctions withCo2MnSielectrodes: The influence of temperature-dependent interface magnetization and electronic band structure. <i>Physical Review B</i>. 2007;75(1). doi:<a href=\"https://doi.org/10.1103/physrevb.75.014403\">10.1103/physrevb.75.014403</a>"},"year":"2007","department":[{"_id":"15"}],"user_id":"26883","_id":"29680","extern":"1","language":[{"iso":"eng"}],"keyword":["Condensed Matter Physics","Electronic","Optical and Magnetic Materials"],"article_number":"014403","publication":"Physical Review B","type":"journal_article","status":"public"},{"keyword":["Electrical and Electronic Engineering","Electronic","Optical and Magnetic Materials"],"language":[{"iso":"eng"}],"publication":"IEEE Transactions on Magnetics","title":"Chemical and Magnetic Interface Properties of Tunnel Junctions With Co$_2$MnSi/Co$_2$FeSi Multilayer Electrode Showing Large Tunneling Magnetoresistance","publisher":"Institute of Electrical and Electronics Engineers (IEEE)","date_created":"2022-01-31T10:13:16Z","year":"2007","issue":"6","extern":"1","_id":"29679","user_id":"26883","department":[{"_id":"15"}],"status":"public","type":"journal_article","doi":"10.1109/tmag.2007.893475","date_updated":"2024-04-23T12:19:34Z","author":[{"last_name":"Schmalhorst","full_name":"Schmalhorst, Jan","first_name":"Jan"},{"first_name":"Daniel","last_name":"Ebke","full_name":"Ebke, Daniel"},{"first_name":"Marc","full_name":"Sacher, Marc","id":"26883","orcid":"0000-0001-6217-336X","last_name":"Sacher"},{"last_name":"Liu","full_name":"Liu, Ning-Ning","first_name":"Ning-Ning"},{"last_name":"Thomas","full_name":"Thomas, Andy","first_name":"Andy"},{"first_name":"Gnter","full_name":"Reiss, Gnter","last_name":"Reiss"},{"last_name":"Htten","full_name":"Htten, Andreas","first_name":"Andreas"},{"last_name":"Arenholz","full_name":"Arenholz, Elke","first_name":"Elke"}],"volume":43,"citation":{"ieee":"J. Schmalhorst <i>et al.</i>, “Chemical and Magnetic Interface Properties of Tunnel Junctions With Co$_2$MnSi/Co$_2$FeSi Multilayer Electrode Showing Large Tunneling Magnetoresistance,” <i>IEEE Transactions on Magnetics</i>, vol. 43, no. 6, pp. 2806–2808, 2007, doi: <a href=\"https://doi.org/10.1109/tmag.2007.893475\">10.1109/tmag.2007.893475</a>.","chicago":"Schmalhorst, Jan, Daniel Ebke, Marc Sacher, Ning-Ning Liu, Andy Thomas, Gnter Reiss, Andreas Htten, and Elke Arenholz. “Chemical and Magnetic Interface Properties of Tunnel Junctions With Co$_2$MnSi/Co$_2$FeSi Multilayer Electrode Showing Large Tunneling Magnetoresistance.” <i>IEEE Transactions on Magnetics</i> 43, no. 6 (2007): 2806–8. <a href=\"https://doi.org/10.1109/tmag.2007.893475\">https://doi.org/10.1109/tmag.2007.893475</a>.","ama":"Schmalhorst J, Ebke D, Sacher M, et al. Chemical and Magnetic Interface Properties of Tunnel Junctions With Co$_2$MnSi/Co$_2$FeSi Multilayer Electrode Showing Large Tunneling Magnetoresistance. <i>IEEE Transactions on Magnetics</i>. 2007;43(6):2806-2808. doi:<a href=\"https://doi.org/10.1109/tmag.2007.893475\">10.1109/tmag.2007.893475</a>","apa":"Schmalhorst, J., Ebke, D., Sacher, M., Liu, N.-N., Thomas, A., Reiss, G., Htten, A., &#38; Arenholz, E. (2007). Chemical and Magnetic Interface Properties of Tunnel Junctions With Co$_2$MnSi/Co$_2$FeSi Multilayer Electrode Showing Large Tunneling Magnetoresistance. <i>IEEE Transactions on Magnetics</i>, <i>43</i>(6), 2806–2808. <a href=\"https://doi.org/10.1109/tmag.2007.893475\">https://doi.org/10.1109/tmag.2007.893475</a>","mla":"Schmalhorst, Jan, et al. “Chemical and Magnetic Interface Properties of Tunnel Junctions With Co$_2$MnSi/Co$_2$FeSi Multilayer Electrode Showing Large Tunneling Magnetoresistance.” <i>IEEE Transactions on Magnetics</i>, vol. 43, no. 6, Institute of Electrical and Electronics Engineers (IEEE), 2007, pp. 2806–08, doi:<a href=\"https://doi.org/10.1109/tmag.2007.893475\">10.1109/tmag.2007.893475</a>.","bibtex":"@article{Schmalhorst_Ebke_Sacher_Liu_Thomas_Reiss_Htten_Arenholz_2007, title={Chemical and Magnetic Interface Properties of Tunnel Junctions With Co$_2$MnSi/Co$_2$FeSi Multilayer Electrode Showing Large Tunneling Magnetoresistance}, volume={43}, DOI={<a href=\"https://doi.org/10.1109/tmag.2007.893475\">10.1109/tmag.2007.893475</a>}, number={6}, journal={IEEE Transactions on Magnetics}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Schmalhorst, Jan and Ebke, Daniel and Sacher, Marc and Liu, Ning-Ning and Thomas, Andy and Reiss, Gnter and Htten, Andreas and Arenholz, Elke}, year={2007}, pages={2806–2808} }","short":"J. Schmalhorst, D. Ebke, M. Sacher, N.-N. Liu, A. Thomas, G. Reiss, A. Htten, E. Arenholz, IEEE Transactions on Magnetics 43 (2007) 2806–2808."},"intvolume":"        43","page":"2806-2808","publication_status":"published","publication_identifier":{"issn":["0018-9464"]}}]