---
_id: '4555'
abstract:
- lang: eng
  text: Semiconductor microdiscs are promising for applications in photonics and quantum-information
    processing, such as efficient solid-state-based single-photon emitters. Strain
    in the multilayer structure of those devices has an important influence on their
    optical properties. We present measurements of the strain distribution in ZnMgSe/ZnSe
    microdiscs by means of micro-photoluminescence and micro-Raman imaging. Photoluminescence
    measurements of microdiscs reveal substantially broadened emission lines with
    a shift to lower energy at the undercut part of microdiscs, indicating local relaxation
    in this area. The distribution of the strain in the microdiscs is obtained from
    an imaging micro-Raman analysis, revealing that the freestanding part of the microdiscs
    is free of defects.
article_type: original
author:
- first_name: M.
  full_name: Panfilova, M.
  last_name: Panfilova
- first_name: A.
  full_name: Pawlis, A.
  last_name: Pawlis
- first_name: C.
  full_name: Arens, C.
  last_name: Arens
- first_name: S. Michaelis
  full_name: de Vasconcellos, S. Michaelis
  last_name: de Vasconcellos
- first_name: Gerhard
  full_name: Berth, Gerhard
  id: '53'
  last_name: Berth
- first_name: K.P.
  full_name: Hüsch, K.P.
  last_name: Hüsch
- first_name: V.
  full_name: Wiedemeier, V.
  last_name: Wiedemeier
- first_name: Artur
  full_name: Zrenner, Artur
  id: '606'
  last_name: Zrenner
  orcid: 0000-0002-5190-0944
- first_name: K.
  full_name: Lischka, K.
  last_name: Lischka
citation:
  ama: Panfilova M, Pawlis A, Arens C, et al. Micro-Raman imaging and micro-photoluminescence
    measurements of strain in ZnMgSe/ZnSe microdiscs. <i>Microelectronics Journal</i>.
    2008;40(2):221-223. doi:<a href="https://doi.org/10.1016/j.mejo.2008.07.056">10.1016/j.mejo.2008.07.056</a>
  apa: Panfilova, M., Pawlis, A., Arens, C., de Vasconcellos, S. M., Berth, G., Hüsch,
    K. P., … Lischka, K. (2008). Micro-Raman imaging and micro-photoluminescence measurements
    of strain in ZnMgSe/ZnSe microdiscs. <i>Microelectronics Journal</i>, <i>40</i>(2),
    221–223. <a href="https://doi.org/10.1016/j.mejo.2008.07.056">https://doi.org/10.1016/j.mejo.2008.07.056</a>
  bibtex: '@article{Panfilova_Pawlis_Arens_de Vasconcellos_Berth_Hüsch_Wiedemeier_Zrenner_Lischka_2008,
    title={Micro-Raman imaging and micro-photoluminescence measurements of strain
    in ZnMgSe/ZnSe microdiscs}, volume={40}, DOI={<a href="https://doi.org/10.1016/j.mejo.2008.07.056">10.1016/j.mejo.2008.07.056</a>},
    number={2}, journal={Microelectronics Journal}, publisher={Elsevier BV}, author={Panfilova,
    M. and Pawlis, A. and Arens, C. and de Vasconcellos, S. Michaelis and Berth, Gerhard
    and Hüsch, K.P. and Wiedemeier, V. and Zrenner, Artur and Lischka, K.}, year={2008},
    pages={221–223} }'
  chicago: 'Panfilova, M., A. Pawlis, C. Arens, S. Michaelis de Vasconcellos, Gerhard
    Berth, K.P. Hüsch, V. Wiedemeier, Artur Zrenner, and K. Lischka. “Micro-Raman
    Imaging and Micro-Photoluminescence Measurements of Strain in ZnMgSe/ZnSe Microdiscs.”
    <i>Microelectronics Journal</i> 40, no. 2 (2008): 221–23. <a href="https://doi.org/10.1016/j.mejo.2008.07.056">https://doi.org/10.1016/j.mejo.2008.07.056</a>.'
  ieee: M. Panfilova <i>et al.</i>, “Micro-Raman imaging and micro-photoluminescence
    measurements of strain in ZnMgSe/ZnSe microdiscs,” <i>Microelectronics Journal</i>,
    vol. 40, no. 2, pp. 221–223, 2008.
  mla: Panfilova, M., et al. “Micro-Raman Imaging and Micro-Photoluminescence Measurements
    of Strain in ZnMgSe/ZnSe Microdiscs.” <i>Microelectronics Journal</i>, vol. 40,
    no. 2, Elsevier BV, 2008, pp. 221–23, doi:<a href="https://doi.org/10.1016/j.mejo.2008.07.056">10.1016/j.mejo.2008.07.056</a>.
  short: M. Panfilova, A. Pawlis, C. Arens, S.M. de Vasconcellos, G. Berth, K.P. Hüsch,
    V. Wiedemeier, A. Zrenner, K. Lischka, Microelectronics Journal 40 (2008) 221–223.
date_created: 2018-09-20T13:39:35Z
date_updated: 2022-01-06T07:01:09Z
department:
- _id: '15'
- _id: '230'
- _id: '35'
doi: 10.1016/j.mejo.2008.07.056
intvolume: '        40'
issue: '2'
keyword:
- Raman
- Photoluminescence
- Microdisc
- ZnSe
language:
- iso: eng
page: 221-223
publication: Microelectronics Journal
publication_identifier:
  issn:
  - 0026-2692
publication_status: published
publisher: Elsevier BV
status: public
title: Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe
  microdiscs
type: journal_article
user_id: '49428'
volume: 40
year: '2008'
...