[{"user_id":"5786","department":[{"_id":"672"}],"_id":"36994","language":[{"iso":"eng"}],"keyword":["Analytical models","Hardware design languages","Microprocessors","Cost function","Data models","Search problems","IP networks"],"type":"conference","publication":"Proceedings of SOCC2012","status":"public","abstract":[{"lang":"eng","text":"This paper proposes a quality driven, simulation based approach to functional design verification, which applies mainly to IP-level HDL designs with well specified test instruction format and is evaluated on a soft microprocessor core MB-LITE [5]. The approach utilizes mutation analysis as the quality metric to steer an automated simulation data generation process. It leads to a simulation flow with two phases towards an enhanced mutation analysis result. First in a random simulation phase, an in-loop heuristics is deployed and adjusts dynamically the test probability distribution so as to improve the coverage efficiency. Next, for each remaining hard-to-kill mutant, a search heuristics on test input space is developed to iteratively locate a target test, using a specific objective cost function for the goal of killing HDL mutant. The effectiveness of this integrated two-phase simulation flow is demonstrated by the results with the MB-LITE microprocessor IP."}],"author":[{"first_name":"Tao ","full_name":"Xie, Tao ","last_name":"Xie"},{"full_name":"Müller, Wolfgang","id":"16243","last_name":"Müller","first_name":"Wolfgang"},{"last_name":"Letombe","full_name":"Letombe, Florian","first_name":"Florian"}],"date_created":"2023-01-17T08:46:14Z","publisher":"IEEE","date_updated":"2023-01-17T08:46:29Z","doi":"10.1109/SOCC.2012.6398362","title":"Mutation-Analysis Driven Functional Verification of a Soft Microprocessor","publication_identifier":{"eisbn":["978-1-4673-1295-0"]},"citation":{"ama":"Xie T, Müller W, Letombe F. Mutation-Analysis Driven Functional Verification of a Soft Microprocessor. In: <i>Proceedings of SOCC2012</i>. IEEE; 2012. doi:<a href=\"https://doi.org/10.1109/SOCC.2012.6398362\">10.1109/SOCC.2012.6398362</a>","ieee":"T. Xie, W. Müller, and F. Letombe, “Mutation-Analysis Driven Functional Verification of a Soft Microprocessor,” 2012, doi: <a href=\"https://doi.org/10.1109/SOCC.2012.6398362\">10.1109/SOCC.2012.6398362</a>.","chicago":"Xie, Tao , Wolfgang Müller, and Florian Letombe. “Mutation-Analysis Driven Functional Verification of a Soft Microprocessor.” In <i>Proceedings of SOCC2012</i>.  Niagara Falls, NY, USA : IEEE, 2012. <a href=\"https://doi.org/10.1109/SOCC.2012.6398362\">https://doi.org/10.1109/SOCC.2012.6398362</a>.","bibtex":"@inproceedings{Xie_Müller_Letombe_2012, place={ Niagara Falls, NY, USA }, title={Mutation-Analysis Driven Functional Verification of a Soft Microprocessor}, DOI={<a href=\"https://doi.org/10.1109/SOCC.2012.6398362\">10.1109/SOCC.2012.6398362</a>}, booktitle={Proceedings of SOCC2012}, publisher={IEEE}, author={Xie, Tao  and Müller, Wolfgang and Letombe, Florian}, year={2012} }","mla":"Xie, Tao, et al. “Mutation-Analysis Driven Functional Verification of a Soft Microprocessor.” <i>Proceedings of SOCC2012</i>, IEEE, 2012, doi:<a href=\"https://doi.org/10.1109/SOCC.2012.6398362\">10.1109/SOCC.2012.6398362</a>.","short":"T. Xie, W. Müller, F. Letombe, in: Proceedings of SOCC2012, IEEE,  Niagara Falls, NY, USA , 2012.","apa":"Xie, T., Müller, W., &#38; Letombe, F. (2012). Mutation-Analysis Driven Functional Verification of a Soft Microprocessor. <i>Proceedings of SOCC2012</i>. <a href=\"https://doi.org/10.1109/SOCC.2012.6398362\">https://doi.org/10.1109/SOCC.2012.6398362</a>"},"place":" Niagara Falls, NY, USA ","year":"2012"}]