---
_id: '48063'
abstract:
- lang: eng
text: "Brainwaves have demonstrated to be unique enough across individuals
to be useful as biometrics. They also provide promising advantages over traditional
means of authentication, such as resistance to external observability, revocability,
and intrinsic liveness detection. However, most of the research so far has been
conducted with expensive, bulky, medical-grade helmets, which offer limited applicability
for everyday usage. With the aim to bring brainwave authentication and its benefits
closer to real world deployment, we investigate brain biometrics with consumer
devices. We conduct a comprehensive measurement experiment and user study that
compare five authentication tasks on a user sample up to 10 times larger than
those from previous studies, introducing three novel techniques based on cognitive
semantic processing. Furthermore, we apply our analysis on high-quality open brainwave
data obtained with a medical-grade headset, to assess the differences. We investigate
both the performance, security, and usability of the different options and use
this evidence to elicit design and research recommendations. Our results show
that it is possible to achieve Equal Error Rates as low as 7.2% (a reduction between
68–72% with respect to existing approaches) based on brain responses to images
with current inexpensive technology. We show that the common practice of testing
authentication systems only with known attacker data is unrealistic and may lead
to overly optimistic evaluations. With regard to adoption, users call for simpler
devices, faster authentication, and better privacy.\r\n "
author:
- first_name: Patricia
full_name: Arias-Cabarcos, Patricia
last_name: Arias-Cabarcos
- first_name: Matin
full_name: Fallahi, Matin
last_name: Fallahi
- first_name: Thilo
full_name: Habrich, Thilo
last_name: Habrich
- first_name: Karen
full_name: Schulze, Karen
last_name: Schulze
- first_name: Christian
full_name: Becker, Christian
last_name: Becker
- first_name: Thorsten
full_name: Strufe, Thorsten
last_name: Strufe
citation:
ama: Arias-Cabarcos P, Fallahi M, Habrich T, Schulze K, Becker C, Strufe T. Performance
and Usability Evaluation of Brainwave Authentication Techniques with Consumer
Devices. ACM Transactions on Privacy and Security. 2023;26(3):1-36. doi:10.1145/3579356
apa: Arias-Cabarcos, P., Fallahi, M., Habrich, T., Schulze, K., Becker, C., &
Strufe, T. (2023). Performance and Usability Evaluation of Brainwave Authentication
Techniques with Consumer Devices. ACM Transactions on Privacy and Security,
26(3), 1–36. https://doi.org/10.1145/3579356
bibtex: '@article{Arias-Cabarcos_Fallahi_Habrich_Schulze_Becker_Strufe_2023, title={Performance
and Usability Evaluation of Brainwave Authentication Techniques with Consumer
Devices}, volume={26}, DOI={10.1145/3579356},
number={3}, journal={ACM Transactions on Privacy and Security}, publisher={Association
for Computing Machinery (ACM)}, author={Arias-Cabarcos, Patricia and Fallahi,
Matin and Habrich, Thilo and Schulze, Karen and Becker, Christian and Strufe,
Thorsten}, year={2023}, pages={1–36} }'
chicago: 'Arias-Cabarcos, Patricia, Matin Fallahi, Thilo Habrich, Karen Schulze,
Christian Becker, and Thorsten Strufe. “Performance and Usability Evaluation of
Brainwave Authentication Techniques with Consumer Devices.” ACM Transactions
on Privacy and Security 26, no. 3 (2023): 1–36. https://doi.org/10.1145/3579356.'
ieee: 'P. Arias-Cabarcos, M. Fallahi, T. Habrich, K. Schulze, C. Becker, and T.
Strufe, “Performance and Usability Evaluation of Brainwave Authentication Techniques
with Consumer Devices,” ACM Transactions on Privacy and Security, vol.
26, no. 3, pp. 1–36, 2023, doi: 10.1145/3579356.'
mla: Arias-Cabarcos, Patricia, et al. “Performance and Usability Evaluation of Brainwave
Authentication Techniques with Consumer Devices.” ACM Transactions on Privacy
and Security, vol. 26, no. 3, Association for Computing Machinery (ACM), 2023,
pp. 1–36, doi:10.1145/3579356.
short: P. Arias-Cabarcos, M. Fallahi, T. Habrich, K. Schulze, C. Becker, T. Strufe,
ACM Transactions on Privacy and Security 26 (2023) 1–36.
date_created: 2023-10-14T12:11:55Z
date_updated: 2023-10-14T12:12:42Z
doi: 10.1145/3579356
intvolume: ' 26'
issue: '3'
keyword:
- Safety
- Risk
- Reliability and Quality
- General Computer Science
language:
- iso: eng
page: 1-36
publication: ACM Transactions on Privacy and Security
publication_identifier:
issn:
- 2471-2566
- 2471-2574
publication_status: published
publisher: Association for Computing Machinery (ACM)
status: public
title: Performance and Usability Evaluation of Brainwave Authentication Techniques
with Consumer Devices
type: journal_article
user_id: '92804'
volume: 26
year: '2023'
...
---
_id: '48058'
author:
- first_name: Fabian
full_name: Winkel, Fabian
last_name: Winkel
- first_name: Johannes
full_name: Deuse-Kleinsteuber, Johannes
last_name: Deuse-Kleinsteuber
- first_name: Joachim
full_name: Böcker, Joachim
id: '66'
last_name: Böcker
orcid: 0000-0002-8480-7295
citation:
ama: Winkel F, Deuse-Kleinsteuber J, Böcker J. Run-to-Failure Relay Dataset for
Predictive Maintenance Research With Machine Learning. IEEE Transactions on
Reliability. Published online 2023:1-14. doi:10.1109/tr.2023.3255786
apa: Winkel, F., Deuse-Kleinsteuber, J., & Böcker, J. (2023). Run-to-Failure
Relay Dataset for Predictive Maintenance Research With Machine Learning. IEEE
Transactions on Reliability, 1–14. https://doi.org/10.1109/tr.2023.3255786
bibtex: '@article{Winkel_Deuse-Kleinsteuber_Böcker_2023, title={Run-to-Failure Relay
Dataset for Predictive Maintenance Research With Machine Learning}, DOI={10.1109/tr.2023.3255786},
journal={IEEE Transactions on Reliability}, publisher={Institute of Electrical
and Electronics Engineers (IEEE)}, author={Winkel, Fabian and Deuse-Kleinsteuber,
Johannes and Böcker, Joachim}, year={2023}, pages={1–14} }'
chicago: Winkel, Fabian, Johannes Deuse-Kleinsteuber, and Joachim Böcker. “Run-to-Failure
Relay Dataset for Predictive Maintenance Research With Machine Learning.” IEEE
Transactions on Reliability, 2023, 1–14. https://doi.org/10.1109/tr.2023.3255786.
ieee: 'F. Winkel, J. Deuse-Kleinsteuber, and J. Böcker, “Run-to-Failure Relay Dataset
for Predictive Maintenance Research With Machine Learning,” IEEE Transactions
on Reliability, pp. 1–14, 2023, doi: 10.1109/tr.2023.3255786.'
mla: Winkel, Fabian, et al. “Run-to-Failure Relay Dataset for Predictive Maintenance
Research With Machine Learning.” IEEE Transactions on Reliability, Institute
of Electrical and Electronics Engineers (IEEE), 2023, pp. 1–14, doi:10.1109/tr.2023.3255786.
short: F. Winkel, J. Deuse-Kleinsteuber, J. Böcker, IEEE Transactions on Reliability
(2023) 1–14.
date_created: 2023-10-14T12:01:41Z
date_updated: 2023-10-14T12:16:48Z
department:
- _id: '52'
doi: 10.1109/tr.2023.3255786
keyword:
- Electrical and Electronic Engineering
- Safety
- Risk
- Reliability and Quality
language:
- iso: eng
page: 1-14
publication: IEEE Transactions on Reliability
publication_identifier:
issn:
- 0018-9529
- 1558-1721
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: Run-to-Failure Relay Dataset for Predictive Maintenance Research With Machine
Learning
type: journal_article
user_id: '66'
year: '2023'
...
---
_id: '31844'
abstract:
- lang: eng
text: "Encrypting data before sending it to the cloud ensures data confidentiality
but requires the cloud to compute on encrypted data. Trusted execution environments,
such as Intel SGX enclaves, promise to provide a secure environment in which data
can be decrypted and then processed. However, vulnerabilities in the executed
program give attackers ample opportunities to execute arbitrary code inside the
enclave. This code can modify the dataflow of the program and leak secrets via
SGX side channels. Fully homomorphic encryption would be an alternative to compute
on encrypted data without data leaks. However, due to its high computational complexity,
its applicability to general-purpose computing remains limited. Researchers have
made several proposals for transforming programs to perform encrypted computations
on less powerful encryption schemes. Yet current approaches do not support programs
making control-flow decisions based on encrypted data.\r\n \r\n
\ We introduce the concept of\r\n dataflow authentication\r\n
\ (DFAuth) to enable such programs. DFAuth prevents an adversary from
arbitrarily deviating from the dataflow of a program. Our technique hence offers
protections against the side-channel attacks described previously. We implemented
two flavors of DFAuth, a Java bytecode-to-bytecode compiler, and an SGX enclave
running a small and program-independent trusted code base. We applied DFAuth to
a neural network performing machine learning on sensitive medical data and a smart
charging scheduler for electric vehicles. Our transformation yields a neural network
with encrypted weights, which can be evaluated on encrypted inputs in\r\n \r\n \\( 12.55 \\,\\mathrm{m}\\mathrm{s} \\)\r\n
\ \r\n . Our protected scheduler is
capable of updating the encrypted charging plan in approximately 1.06 seconds.\r\n
\ "
author:
- first_name: Andreas
full_name: Fischer, Andreas
last_name: Fischer
- first_name: Benny
full_name: Fuhry, Benny
last_name: Fuhry
- first_name: Jörn
full_name: Kußmaul, Jörn
last_name: Kußmaul
- first_name: Jonas
full_name: Janneck, Jonas
last_name: Janneck
- first_name: Florian
full_name: Kerschbaum, Florian
last_name: Kerschbaum
- first_name: Eric
full_name: Bodden, Eric
id: '59256'
last_name: Bodden
orcid: 0000-0003-3470-3647
citation:
ama: Fischer A, Fuhry B, Kußmaul J, Janneck J, Kerschbaum F, Bodden E. Computation
on Encrypted Data Using Dataflow Authentication. ACM Transactions on Privacy
and Security. 2022;25(3):1-36. doi:10.1145/3513005
apa: Fischer, A., Fuhry, B., Kußmaul, J., Janneck, J., Kerschbaum, F., & Bodden,
E. (2022). Computation on Encrypted Data Using Dataflow Authentication. ACM
Transactions on Privacy and Security, 25(3), 1–36. https://doi.org/10.1145/3513005
bibtex: '@article{Fischer_Fuhry_Kußmaul_Janneck_Kerschbaum_Bodden_2022, title={Computation
on Encrypted Data Using Dataflow Authentication}, volume={25}, DOI={10.1145/3513005},
number={3}, journal={ACM Transactions on Privacy and Security}, publisher={Association
for Computing Machinery (ACM)}, author={Fischer, Andreas and Fuhry, Benny and
Kußmaul, Jörn and Janneck, Jonas and Kerschbaum, Florian and Bodden, Eric}, year={2022},
pages={1–36} }'
chicago: 'Fischer, Andreas, Benny Fuhry, Jörn Kußmaul, Jonas Janneck, Florian Kerschbaum,
and Eric Bodden. “Computation on Encrypted Data Using Dataflow Authentication.”
ACM Transactions on Privacy and Security 25, no. 3 (2022): 1–36. https://doi.org/10.1145/3513005.'
ieee: 'A. Fischer, B. Fuhry, J. Kußmaul, J. Janneck, F. Kerschbaum, and E. Bodden,
“Computation on Encrypted Data Using Dataflow Authentication,” ACM Transactions
on Privacy and Security, vol. 25, no. 3, pp. 1–36, 2022, doi: 10.1145/3513005.'
mla: Fischer, Andreas, et al. “Computation on Encrypted Data Using Dataflow Authentication.”
ACM Transactions on Privacy and Security, vol. 25, no. 3, Association for
Computing Machinery (ACM), 2022, pp. 1–36, doi:10.1145/3513005.
short: A. Fischer, B. Fuhry, J. Kußmaul, J. Janneck, F. Kerschbaum, E. Bodden, ACM
Transactions on Privacy and Security 25 (2022) 1–36.
date_created: 2022-06-09T10:28:03Z
date_updated: 2022-06-09T10:29:19Z
department:
- _id: '76'
doi: 10.1145/3513005
intvolume: ' 25'
issue: '3'
keyword:
- Safety
- Risk
- Reliability and Quality
- General Computer Science
language:
- iso: eng
page: 1-36
publication: ACM Transactions on Privacy and Security
publication_identifier:
issn:
- 2471-2566
- 2471-2574
publication_status: published
publisher: Association for Computing Machinery (ACM)
status: public
title: Computation on Encrypted Data Using Dataflow Authentication
type: journal_article
user_id: '15249'
volume: 25
year: '2022'
...
---
_id: '9994'
abstract:
- lang: eng
text: Reliability-adaptive systems allow an adaptation of system behavior based
on current system reliability. They can extend their lifetime at the cost of lowered
performance or vice versa. This can be used to adapt failure behavior according
to a maintenance plan, thus increasing availability while using up system capability
fully. To facilitate setup, a control algorithm independent of a degradation model
is desired. A closed loop control technique for reliability based on a health
index, a measure for system degradation, is introduced. It uses self-optimization
as means to implement behavior adaptation. This is based on selecting the priorities
of objectives that the system pursues. Possible working points are computed beforehand
using model-based multiobjective optimization techniques. The controller selects
the priorities of objectives and this way balances reliability and performance.
As exemplary application, an automatically actuated single plate dry clutch is
introduced. The entire reliability control is setup and lifetime experiments are
conducted. Results show that the variance of time to failure is reduced greatly,
making the failure behavior more predictable. At the same time, the desired usable
lifetime can be extended at the cost of system performance to allow for changed
maintenance intervals. Together, these possibilities allow for greater system
usage and better planning of maintenance.
author:
- first_name: Tobias
full_name: Meyer, Tobias
last_name: Meyer
citation:
ama: Meyer T. Optimization-Based Reliability Control of Mechatronic Systems.
Shaker; 2018.
apa: Meyer, T. (2018). Optimization-based reliability control of mechatronic
systems. Shaker.
bibtex: '@book{Meyer_2018, title={Optimization-based reliability control of mechatronic
systems}, publisher={Shaker}, author={Meyer, Tobias}, year={2018} }'
chicago: Meyer, Tobias. Optimization-Based Reliability Control of Mechatronic
Systems. Shaker, 2018.
ieee: T. Meyer, Optimization-based reliability control of mechatronic systems.
Shaker, 2018.
mla: Meyer, Tobias. Optimization-Based Reliability Control of Mechatronic Systems.
Shaker, 2018.
short: T. Meyer, Optimization-Based Reliability Control of Mechatronic Systems,
Shaker, 2018.
date_created: 2019-05-27T10:21:17Z
date_updated: 2023-09-15T12:26:09Z
department:
- _id: '151'
keyword:
- dependability
- reliability
- behavior adaptation
- self-optimization
- multiobjective optimization
- optimal control
- automotive drivetrain
- clutch system
- reliability-adaptive system
language:
- iso: eng
publisher: Shaker
status: public
title: Optimization-based reliability control of mechatronic systems
type: dissertation
user_id: '210'
year: '2018'
...
---
_id: '9974'
abstract:
- lang: eng
text: The integrated modeling of behavior and reliability in system development
delivers a model-based approach for reliability investigation by taking into account
the dynamic system behavior as well as the system architecture at different phases
of the development process. This approach features an automated synthesis of a
reliability model out of a behavior model enabling for the closed loop modeling
of degradation of the system and its (dynamic) behavior. The approach is integrated
into the development process following Systems Engineering. It is based on standard
models used in model-based development methodologies i.e. SysML or Matlab/Simulink.
In addition to the theoretical description of the necessary steps the procedure
is validated by an application example at two stages of the development process.
author:
- first_name: Julian
full_name: Hentze, Julian
id: '13342'
last_name: Hentze
- first_name: Thorben
full_name: Kaul, Thorben
id: '14802'
last_name: Kaul
- first_name: Iris
full_name: Grässler, Iris
last_name: Grässler
- first_name: Walter
full_name: Sextro, Walter
id: '21220'
last_name: Sextro
citation:
ama: 'Hentze J, Kaul T, Grässler I, Sextro W. Integrated modeling og behavior and
reliability in system development. In: ICED17, 21st International Conference
on Enginieering Design. ; 2017:385-394.'
apa: Hentze, J., Kaul, T., Grässler, I., & Sextro, W. (2017). Integrated modeling
og behavior and reliability in system development. In ICED17, 21st International
conference on enginieering design (pp. 385–394).
bibtex: '@inproceedings{Hentze_Kaul_Grässler_Sextro_2017, title={Integrated modeling
og behavior and reliability in system development}, booktitle={ICED17, 21st International
conference on enginieering design}, author={Hentze, Julian and Kaul, Thorben and
Grässler, Iris and Sextro, Walter}, year={2017}, pages={385–394} }'
chicago: Hentze, Julian, Thorben Kaul, Iris Grässler, and Walter Sextro. “Integrated
Modeling Og Behavior and Reliability in System Development.” In ICED17, 21st
International Conference on Enginieering Design, 385–94, 2017.
ieee: J. Hentze, T. Kaul, I. Grässler, and W. Sextro, “Integrated modeling og behavior
and reliability in system development,” in ICED17, 21st International conference
on enginieering design, 2017, pp. 385–394.
mla: Hentze, Julian, et al. “Integrated Modeling Og Behavior and Reliability in
System Development.” ICED17, 21st International Conference on Enginieering
Design, 2017, pp. 385–94.
short: 'J. Hentze, T. Kaul, I. Grässler, W. Sextro, in: ICED17, 21st International
Conference on Enginieering Design, 2017, pp. 385–394.'
date_created: 2019-05-27T09:35:48Z
date_updated: 2019-09-30T08:04:38Z
department:
- _id: '151'
keyword:
- Design for X (DfX)
- Product modelling / models
- Robust design
- Systems Engineering (SE)
- Reliability
language:
- iso: eng
page: 385-394
publication: ICED17, 21st International conference on enginieering design
quality_controlled: '1'
status: public
title: Integrated modeling og behavior and reliability in system development
type: conference
user_id: '55222'
year: '2017'
...
---
_id: '9976'
abstract:
- lang: eng
text: State-of-the-art mechatronic systems offer inherent intelligence that enables
them to autonomously adapt their behavior to current environmental conditions
and to their own system state. This autonomous behavior adaptation is made possible
by software in combination with complex sensor and actuator systems and by sophisticated
information processing, all of which make these systems increasingly complex.
This increasing complexity makes the design process a challenging task and brings
new complex possibilities for operation and maintenance. However, with the risk
of increased system complexity also comes the chance to adapt system behavior
based on current reliability, which in turn increases reliability. The development
of such an adaption strategy requires appropriate methods to evaluate reliability
based on currently selected system behavior. A common approach to implement such
adaptivity is to base system behavior on different working points that are obtained
using multiobjective optimization. During operation, selection among these allows
a changed operating strategy. To allow for multiobjective optimization, an accurate
system model including system reliability is required. This model is repeatedly
evaluated by the optimization algorithm. At present, modeling of system reliability
and synchronization of the models of behavior and reliability is a laborious manual
task and thus very error-prone. Since system behavior is crucial for system reliability,
an integrated model is introduced that integrates system behavior and system reliability.
The proposed approach is used to formulate reliability-related objective functions
for a clutch test rig that are used to compute feasible working points using multiobjective
optimization.
author:
- first_name: Thorben
full_name: Kaul, Thorben
id: '14802'
last_name: Kaul
- first_name: Tobias
full_name: Meyer, Tobias
last_name: Meyer
- first_name: Walter
full_name: Sextro, Walter
id: '21220'
last_name: Sextro
citation:
ama: Kaul T, Meyer T, Sextro W. Formulation of reliability-related objective functions
for design of intelligent mechatronic systems. SAGE Journals. 2017;Vol.
231(4):390-399. doi:10.1177/1748006X17709376
apa: Kaul, T., Meyer, T., & Sextro, W. (2017). Formulation of reliability-related
objective functions for design of intelligent mechatronic systems. SAGE Journals,
Vol. 231(4), 390–399. https://doi.org/10.1177/1748006X17709376
bibtex: '@article{Kaul_Meyer_Sextro_2017, title={Formulation of reliability-related
objective functions for design of intelligent mechatronic systems}, volume={Vol.
231(4)}, DOI={10.1177/1748006X17709376},
journal={SAGE Journals}, author={Kaul, Thorben and Meyer, Tobias and Sextro, Walter},
year={2017}, pages={390–399} }'
chicago: 'Kaul, Thorben, Tobias Meyer, and Walter Sextro. “Formulation of Reliability-Related
Objective Functions for Design of Intelligent Mechatronic Systems.” SAGE Journals
Vol. 231(4) (2017): 390–99. https://doi.org/10.1177/1748006X17709376.'
ieee: T. Kaul, T. Meyer, and W. Sextro, “Formulation of reliability-related objective
functions for design of intelligent mechatronic systems,” SAGE Journals,
vol. Vol. 231(4), pp. 390–399, 2017.
mla: Kaul, Thorben, et al. “Formulation of Reliability-Related Objective Functions
for Design of Intelligent Mechatronic Systems.” SAGE Journals, vol. Vol.
231(4), 2017, pp. 390–99, doi:10.1177/1748006X17709376.
short: T. Kaul, T. Meyer, W. Sextro, SAGE Journals Vol. 231(4) (2017) 390–399.
date_created: 2019-05-27T09:37:46Z
date_updated: 2019-09-16T10:20:49Z
department:
- _id: '151'
doi: 10.1177/1748006X17709376
keyword:
- Integrated model
- reliability
- system behavior
- Bayesian network
- multiobjective optimization
language:
- iso: eng
page: 390 - 399
publication: SAGE Journals
quality_controlled: '1'
status: public
title: Formulation of reliability-related objective functions for design of intelligent
mechatronic systems
type: journal_article
user_id: '55222'
volume: Vol. 231(4)
year: '2017'
...
---
_id: '57965'
author:
- first_name: Julia
full_name: Pieczewski, Julia
last_name: Pieczewski
- first_name: Charlotte
full_name: Nettekoven, Charlotte
last_name: Nettekoven
- first_name: Volker
full_name: Neuschmelting, Volker
last_name: Neuschmelting
- first_name: Kristina
full_name: Thiele, Kristina
id: '94540'
last_name: Thiele
orcid: 0000-0002-1067-9139
- first_name: Roland
full_name: Goldbrunner, Roland
last_name: Goldbrunner
- first_name: Carolin
full_name: Weiss Lucas, Carolin
last_name: Weiss Lucas
citation:
ama: 'Pieczewski J, Nettekoven C, Neuschmelting V, Thiele K, Goldbrunner R, Weiss
Lucas C. Retest-reliability and tolerability of 10, 30 and 50 Hz repetitive transcranial
magnetic stimulation (rTMS) for language mapping: a preclinical study. In: ; 2016.
doi:10.3205/16dgnc323'
apa: 'Pieczewski, J., Nettekoven, C., Neuschmelting, V., Thiele, K., Goldbrunner,
R., & Weiss Lucas, C. (2016). Retest-reliability and tolerability of 10,
30 and 50 Hz repetitive transcranial magnetic stimulation (rTMS) for language
mapping: a preclinical study. https://doi.org/10.3205/16dgnc323'
bibtex: '@inproceedings{Pieczewski_Nettekoven_Neuschmelting_Thiele_Goldbrunner_Weiss
Lucas_2016, title={Retest-reliability and tolerability of 10, 30 and 50 Hz repetitive
transcranial magnetic stimulation (rTMS) for language mapping: a preclinical study},
DOI={10.3205/16dgnc323}, author={Pieczewski,
Julia and Nettekoven, Charlotte and Neuschmelting, Volker and Thiele, Kristina
and Goldbrunner, Roland and Weiss Lucas, Carolin}, year={2016} }'
chicago: 'Pieczewski, Julia, Charlotte Nettekoven, Volker Neuschmelting, Kristina
Thiele, Roland Goldbrunner, and Carolin Weiss Lucas. “Retest-Reliability and Tolerability
of 10, 30 and 50 Hz Repetitive Transcranial Magnetic Stimulation (RTMS) for Language
Mapping: A Preclinical Study,” 2016. https://doi.org/10.3205/16dgnc323.'
ieee: 'J. Pieczewski, C. Nettekoven, V. Neuschmelting, K. Thiele, R. Goldbrunner,
and C. Weiss Lucas, “Retest-reliability and tolerability of 10, 30 and 50 Hz repetitive
transcranial magnetic stimulation (rTMS) for language mapping: a preclinical study,”
2016, doi: 10.3205/16dgnc323.'
mla: 'Pieczewski, Julia, et al. Retest-Reliability and Tolerability of 10, 30
and 50 Hz Repetitive Transcranial Magnetic Stimulation (RTMS) for Language Mapping:
A Preclinical Study. 2016, doi:10.3205/16dgnc323.'
short: 'J. Pieczewski, C. Nettekoven, V. Neuschmelting, K. Thiele, R. Goldbrunner,
C. Weiss Lucas, in: 2016.'
date_created: 2025-01-06T12:11:42Z
date_updated: 2026-04-20T11:01:16Z
department:
- _id: '890'
doi: 10.3205/16dgnc323
extern: '1'
keyword:
- 610 Medical sciences
- language mapping
- Medicine
- retest-reliability
- rTMS
language:
- iso: eng
status: public
title: 'Retest-reliability and tolerability of 10, 30 and 50 Hz repetitive transcranial
magnetic stimulation (rTMS) for language mapping: a preclinical study'
type: conference_abstract
user_id: '61071'
year: '2016'
...
---
_id: '9949'
abstract:
- lang: eng
text: Intelligent mechatronic systems other the possibility to adapt system behavior
to current dependability. This can be used to assure reliability by controlling
system behavior to reach a pre-defined lifetime. By using such closed loop control,
the margin of error of useful lifetime of an individual system is lowered. It
is also possible to change the pre-defined lifetime during operation, by adapting
system behavior to derate component usage. When planning maintenance actions,
the remaining useful lifetime of each individual system has to be taken into account.
Usually, stochastic properties of a fleet of systems are analyzed to create maintenance
plans. Among these, the main factor is the probability of an individual system
to last until maintenance. If condition-based maintenance is used, this is updated
for each individual system using available information about its current state.
By lowering the margin of error of useful lifetime, which directly corresponds
to the time until maintenance, extended maintenance periods are made possible.
Also using reliability-adaptive operation, a reversal of degradation driven maintenance
planning is possible where a maintenance plan is setup not only according to system
properties, but mainly to requirements imposed by maintenance personnel or infrastructure.
Each system then adapts its behavior accordingly and fails according to the maintenance
plan, making better use of maintenance personnel and system capabilities at the
same time. In this contribution, the potential of maintenance plan driven system
behavior adaptation is shown. A model including adaptation process and maintenance
actions is simulated over full system lifetime to assess the advantages gained.
author:
- first_name: Tobias
full_name: Meyer, Tobias
last_name: Meyer
- first_name: Thorben
full_name: Kaul, Thorben
id: '14802'
last_name: Kaul
- first_name: Walter
full_name: Sextro, Walter
id: '21220'
last_name: Sextro
citation:
ama: 'Meyer T, Kaul T, Sextro W. Advantages of reliability-adaptive system operation
for maintenance planning. In: Proceedings of the 9th IFAC Symposium on Fault
Detection, Supervision and Safety for Technical Processes. ; 2015:940-945.
doi:10.1016/j.ifacol.2015.09.647'
apa: Meyer, T., Kaul, T., & Sextro, W. (2015). Advantages of reliability-adaptive
system operation for maintenance planning. In Proceedings of the 9th IFAC Symposium
on Fault Detection, Supervision and Safety for Technical Processes (pp. 940–945).
https://doi.org/10.1016/j.ifacol.2015.09.647
bibtex: '@inproceedings{Meyer_Kaul_Sextro_2015, title={Advantages of reliability-adaptive
system operation for maintenance planning}, DOI={10.1016/j.ifacol.2015.09.647},
booktitle={Proceedings of the 9th IFAC Symposium on Fault Detection, Supervision
and Safety for Technical Processes}, author={Meyer, Tobias and Kaul, Thorben and
Sextro, Walter}, year={2015}, pages={940–945} }'
chicago: Meyer, Tobias, Thorben Kaul, and Walter Sextro. “Advantages of Reliability-Adaptive
System Operation for Maintenance Planning.” In Proceedings of the 9th IFAC
Symposium on Fault Detection, Supervision and Safety for Technical Processes,
940–45, 2015. https://doi.org/10.1016/j.ifacol.2015.09.647.
ieee: T. Meyer, T. Kaul, and W. Sextro, “Advantages of reliability-adaptive system
operation for maintenance planning,” in Proceedings of the 9th IFAC Symposium
on Fault Detection, Supervision and Safety for Technical Processes, 2015,
pp. 940–945.
mla: Meyer, Tobias, et al. “Advantages of Reliability-Adaptive System Operation
for Maintenance Planning.” Proceedings of the 9th IFAC Symposium on Fault Detection,
Supervision and Safety for Technical Processes, 2015, pp. 940–45, doi:10.1016/j.ifacol.2015.09.647.
short: 'T. Meyer, T. Kaul, W. Sextro, in: Proceedings of the 9th IFAC Symposium
on Fault Detection, Supervision and Safety for Technical Processes, 2015, pp.
940–945.'
date_created: 2019-05-27T08:29:40Z
date_updated: 2019-09-16T10:43:42Z
department:
- _id: '151'
doi: 10.1016/j.ifacol.2015.09.647
keyword:
- Adaptive systems
- Reliability analysis
- Availability
- Adaptive control
- Maintenance
- Self-optimizing systems
- Self-optimizing control
- Stochastic Petri-nets
language:
- iso: eng
page: 940-945
publication: Proceedings of the 9th IFAC Symposium on Fault Detection, Supervision
and Safety for Technical Processes
quality_controlled: '1'
status: public
title: Advantages of reliability-adaptive system operation for maintenance planning
type: conference
user_id: '55222'
year: '2015'
...
---
_id: '57964'
author:
- first_name: Julia
full_name: Pieczewski, Julia
last_name: Pieczewski
- first_name: Volker
full_name: Neuschmelting, Volker
last_name: Neuschmelting
- first_name: Kristina
full_name: Thiele, Kristina
id: '94540'
last_name: Thiele
orcid: 0000-0002-1067-9139
- first_name: Christian
full_name: Grefkes, Christian
last_name: Grefkes
- first_name: Roland
full_name: Goldbrunner, Roland
last_name: Goldbrunner
- first_name: 'Carolin '
full_name: 'Weiss Lucas, Carolin '
last_name: Weiss Lucas
citation:
ama: 'Pieczewski J, Neuschmelting V, Thiele K, Grefkes C, Goldbrunner R, Weiss Lucas
C. Good retest reliability of the rate of speech errors evoked by 10 Hz navigated
repetitive transcranial magnetic stimulation in healthy volunteers: German Medical
Science GMS Publishing House. In: ; 2015. doi:10.3205/15dgnc394'
apa: 'Pieczewski, J., Neuschmelting, V., Thiele, K., Grefkes, C., Goldbrunner, R.,
& Weiss Lucas, C. (2015). Good retest reliability of the rate of speech
errors evoked by 10 Hz navigated repetitive transcranial magnetic stimulation
in healthy volunteers: German Medical Science GMS Publishing House. https://doi.org/10.3205/15dgnc394'
bibtex: '@inproceedings{Pieczewski_Neuschmelting_Thiele_Grefkes_Goldbrunner_Weiss
Lucas_2015, title={Good retest reliability of the rate of speech errors evoked
by 10 Hz navigated repetitive transcranial magnetic stimulation in healthy volunteers:
German Medical Science GMS Publishing House}, DOI={10.3205/15dgnc394},
author={Pieczewski, Julia and Neuschmelting, Volker and Thiele, Kristina and Grefkes,
Christian and Goldbrunner, Roland and Weiss Lucas, Carolin }, year={2015} }'
chicago: 'Pieczewski, Julia, Volker Neuschmelting, Kristina Thiele, Christian Grefkes,
Roland Goldbrunner, and Carolin Weiss Lucas. “Good Retest Reliability of the
Rate of Speech Errors Evoked by 10 Hz Navigated Repetitive Transcranial Magnetic
Stimulation in Healthy Volunteers: German Medical Science GMS Publishing House,”
2015. https://doi.org/10.3205/15dgnc394.'
ieee: 'J. Pieczewski, V. Neuschmelting, K. Thiele, C. Grefkes, R. Goldbrunner, and
C. Weiss Lucas, “Good retest reliability of the rate of speech errors evoked by
10 Hz navigated repetitive transcranial magnetic stimulation in healthy volunteers:
German Medical Science GMS Publishing House,” 2015, doi: 10.3205/15dgnc394.'
mla: 'Pieczewski, Julia, et al. Good Retest Reliability of the Rate of Speech
Errors Evoked by 10 Hz Navigated Repetitive Transcranial Magnetic Stimulation
in Healthy Volunteers: German Medical Science GMS Publishing House. 2015,
doi:10.3205/15dgnc394.'
short: 'J. Pieczewski, V. Neuschmelting, K. Thiele, C. Grefkes, R. Goldbrunner,
C. Weiss Lucas, in: 2015.'
date_created: 2025-01-06T12:11:42Z
date_updated: 2026-04-20T11:02:37Z
department:
- _id: '890'
doi: 10.3205/15dgnc394
extern: '1'
keyword:
- 610 Medical sciences
- Medicine
- reliability
- speech mapping
- TMS
language:
- iso: eng
status: public
title: 'Good retest reliability of the rate of speech errors evoked by 10 Hz navigated
repetitive transcranial magnetic stimulation in healthy volunteers: German Medical
Science GMS Publishing House'
type: conference_abstract
user_id: '61071'
year: '2015'
...
---
_id: '9868'
abstract:
- lang: eng
text: In order to increase mechanical strength, heat dissipation and ampacity and
to decrease failure through fatigue fracture, wedge copper wire bonding is being
introduced as a standard interconnection method for mass production. To achieve
the same process stability when using copper wire instead of aluminum wire a profound
understanding of the bonding process is needed. Due to the higher hardness of
copper compared to aluminum wire it is more difficult to approach the surfaces
of wire and substrate to a level where van der Waals forces are able to arise
between atoms. Also, enough friction energy referred to the total contact area
has to be generated to activate the surfaces. Therefore, a friction model is used
to simulate the joining process. This model calculates the resulting energy of
partial areas in the contact surface and provides information about the adhesion
process of each area. The focus here is on the arising of micro joints in the
contact area depending on the location in the contact and time. To validate the
model, different touchdown forces are used to vary the initial contact areas of
wire and substrate. Additionally, a piezoelectric tri-axial force sensor is built
up to identify the known phases of pre-deforming, cleaning, adhering and diffusing
for the real bonding process to map with the model. Test substrates as DBC and
copper plate are used to show the different formations of a wedge bond connection
due to hardness and reaction propensity. The experiments were done by using 500
$\mu$m copper wire and a standard V-groove tool.
author:
- first_name: Simon
full_name: Althoff, Simon
last_name: Althoff
- first_name: Jan
full_name: Neuhaus, Jan
last_name: Neuhaus
- first_name: Tobias
full_name: Hemsel, Tobias
id: '210'
last_name: Hemsel
- first_name: Walter
full_name: Sextro, Walter
id: '21220'
last_name: Sextro
citation:
ama: 'Althoff S, Neuhaus J, Hemsel T, Sextro W. Improving the bond quality of copper
wire bonds using a friction model approach. In: Electronic Components and Technology
Conference (ECTC), 2014 IEEE 64th. ; 2014:1549-1555. doi:10.1109/ECTC.2014.6897500'
apa: Althoff, S., Neuhaus, J., Hemsel, T., & Sextro, W. (2014). Improving the
bond quality of copper wire bonds using a friction model approach. In Electronic
Components and Technology Conference (ECTC), 2014 IEEE 64th (pp. 1549–1555).
https://doi.org/10.1109/ECTC.2014.6897500
bibtex: '@inproceedings{Althoff_Neuhaus_Hemsel_Sextro_2014, title={Improving the
bond quality of copper wire bonds using a friction model approach}, DOI={10.1109/ECTC.2014.6897500},
booktitle={Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th},
author={Althoff, Simon and Neuhaus, Jan and Hemsel, Tobias and Sextro, Walter},
year={2014}, pages={1549–1555} }'
chicago: Althoff, Simon, Jan Neuhaus, Tobias Hemsel, and Walter Sextro. “Improving
the Bond Quality of Copper Wire Bonds Using a Friction Model Approach.” In Electronic
Components and Technology Conference (ECTC), 2014 IEEE 64th, 1549–55, 2014.
https://doi.org/10.1109/ECTC.2014.6897500.
ieee: S. Althoff, J. Neuhaus, T. Hemsel, and W. Sextro, “Improving the bond quality
of copper wire bonds using a friction model approach,” in Electronic Components
and Technology Conference (ECTC), 2014 IEEE 64th, 2014, pp. 1549–1555.
mla: Althoff, Simon, et al. “Improving the Bond Quality of Copper Wire Bonds Using
a Friction Model Approach.” Electronic Components and Technology Conference
(ECTC), 2014 IEEE 64th, 2014, pp. 1549–55, doi:10.1109/ECTC.2014.6897500.
short: 'S. Althoff, J. Neuhaus, T. Hemsel, W. Sextro, in: Electronic Components
and Technology Conference (ECTC), 2014 IEEE 64th, 2014, pp. 1549–1555.'
date_created: 2019-05-20T12:11:44Z
date_updated: 2019-09-16T10:57:58Z
department:
- _id: '151'
doi: 10.1109/ECTC.2014.6897500
keyword:
- adhesion
- circuit reliability
- deformation
- diffusion
- fatigue cracks
- friction
- interconnections
- lead bonding
- van der Waals forces
- Cu
- adhering process
- adhesion process
- ampacity improvement
- bond quality improvement
- cleaning process
- diffusing process
- fatigue fracture failure
- friction energy
- friction model
- heat dissipation
- mechanical strength
- piezoelectric triaxial force sensor
- predeforming process
- size 500 mum
- total contact area
- van der Waals forces
- wedge copper wire bonding
- Bonding
- Copper
- Finite element analysis
- Force
- Friction
- Substrates
- Wires
language:
- iso: eng
page: 1549-1555
publication: Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
quality_controlled: '1'
status: public
title: Improving the bond quality of copper wire bonds using a friction model approach
type: conference
user_id: '55222'
year: '2014'
...
---
_id: '9874'
author:
- first_name: Tobias
full_name: Hemsel, Tobias
id: '210'
last_name: Hemsel
- first_name: Peter
full_name: Bornmann, Peter
last_name: Bornmann
- first_name: Takeshi
full_name: Morita, Takeshi
last_name: Morita
- first_name: Christoph
full_name: Sondermann-Wölke, Christoph
last_name: Sondermann-Wölke
- first_name: Walter
full_name: Sextro, Walter
id: '21220'
last_name: Sextro
citation:
ama: Hemsel T, Bornmann P, Morita T, Sondermann-Wölke C, Sextro W. Reliability analysis
of ultrasonic power transducers. Archive of Applied Mechanics. 2014:1-7.
doi:10.1007/s00419-014-0965-4
apa: Hemsel, T., Bornmann, P., Morita, T., Sondermann-Wölke, C., & Sextro, W.
(2014). Reliability analysis of ultrasonic power transducers. Archive of Applied
Mechanics, 1–7. https://doi.org/10.1007/s00419-014-0965-4
bibtex: '@article{Hemsel_Bornmann_Morita_Sondermann-Wölke_Sextro_2014, title={Reliability
analysis of ultrasonic power transducers}, DOI={10.1007/s00419-014-0965-4},
journal={Archive of Applied Mechanics}, publisher={Springer Berlin Heidelberg},
author={Hemsel, Tobias and Bornmann, Peter and Morita, Takeshi and Sondermann-Wölke,
Christoph and Sextro, Walter}, year={2014}, pages={1–7} }'
chicago: Hemsel, Tobias, Peter Bornmann, Takeshi Morita, Christoph Sondermann-Wölke,
and Walter Sextro. “Reliability Analysis of Ultrasonic Power Transducers.” Archive
of Applied Mechanics, 2014, 1–7. https://doi.org/10.1007/s00419-014-0965-4.
ieee: T. Hemsel, P. Bornmann, T. Morita, C. Sondermann-Wölke, and W. Sextro, “Reliability
analysis of ultrasonic power transducers,” Archive of Applied Mechanics,
pp. 1–7, 2014.
mla: Hemsel, Tobias, et al. “Reliability Analysis of Ultrasonic Power Transducers.”
Archive of Applied Mechanics, Springer Berlin Heidelberg, 2014, pp. 1–7,
doi:10.1007/s00419-014-0965-4.
short: T. Hemsel, P. Bornmann, T. Morita, C. Sondermann-Wölke, W. Sextro, Archive
of Applied Mechanics (2014) 1–7.
date_created: 2019-05-20T13:01:25Z
date_updated: 2019-09-16T10:57:23Z
department:
- _id: '151'
doi: 10.1007/s00419-014-0965-4
keyword:
- Reliability
- Ultrasonic power transducers
- FMEA
language:
- iso: eng
page: 1-7
publication: Archive of Applied Mechanics
publication_identifier:
issn:
- 0939-1533
publisher: Springer Berlin Heidelberg
quality_controlled: '1'
status: public
title: Reliability analysis of ultrasonic power transducers
type: journal_article
user_id: '55222'
year: '2014'
...
---
_id: '9884'
abstract:
- lang: eng
text: So-called reliability adaptive systems are able to adapt their system behavior
based on the current reliability of the system. This allows them to react to changed
operating conditions or faults within the system that change the degradation behavior.
To implement such reliability adaptation, self-optimization can be used. A self-optimizing
system pursues objectives, of which the priorities can be changed at runtime,
in turn changing the system behavior. When including system reliability as an
objective of the system, it becomes possible to change the system based on the
current reliability as well. This capability can be used to control the reliability
of the system throughout its operation period in order to achieve a pre-defined
or user-selectable system lifetime. This way, optimal planning of maintenance
intervals is possible while also using the system capabilities to their full extent.
Our proposed control system makes it possible to react to changed degradation
behavior by selecting objectives of the self-optimizing system and in turn changing
the operating parameters in a closed loop. A two-stage controller is designed
which is used to select the currently required priorities of the objectives in
order to fulfill the desired usable lifetime. Investigations using a model of
an automotive clutch system serve to demonstrate the feasibility of our controller.
It is shown that the desired lifetime can be achieved reliably.
author:
- first_name: Tobias
full_name: Meyer , Tobias
last_name: 'Meyer '
- first_name: Walter
full_name: Sextro, Walter
last_name: Sextro
citation:
ama: 'Meyer T, Sextro W. Closed-loop Control System for the Reliability of Intelligent
Mechatronic Systems. In: Proceedings of the Second European Conference of the
Prognostics and Health Management Society 2014. Vol 5. ; 2014.'
apa: Meyer , T., & Sextro, W. (2014). Closed-loop Control System for the Reliability
of Intelligent Mechatronic Systems. In Proceedings of the Second European Conference
of the Prognostics and Health Management Society 2014 (Vol. 5).
bibtex: '@inproceedings{Meyer _Sextro_2014, title={Closed-loop Control System for
the Reliability of Intelligent Mechatronic Systems}, volume={5}, booktitle={Proceedings
of the Second European Conference of the Prognostics and Health Management Society
2014}, author={Meyer , Tobias and Sextro, Walter}, year={2014} }'
chicago: Meyer , Tobias, and Walter Sextro. “Closed-Loop Control System for the
Reliability of Intelligent Mechatronic Systems.” In Proceedings of the Second
European Conference of the Prognostics and Health Management Society 2014,
Vol. 5, 2014.
ieee: T. Meyer and W. Sextro, “Closed-loop Control System for the Reliability of
Intelligent Mechatronic Systems,” in Proceedings of the Second European Conference
of the Prognostics and Health Management Society 2014, 2014, vol. 5.
mla: Meyer , Tobias, and Walter Sextro. “Closed-Loop Control System for the Reliability
of Intelligent Mechatronic Systems.” Proceedings of the Second European Conference
of the Prognostics and Health Management Society 2014, vol. 5, 2014.
short: 'T. Meyer , W. Sextro, in: Proceedings of the Second European Conference
of the Prognostics and Health Management Society 2014, 2014.'
date_created: 2019-05-20T13:18:20Z
date_updated: 2019-05-20T13:19:08Z
department:
- _id: '151'
intvolume: ' 5'
keyword:
- self-optimization reliability adaptive
language:
- iso: eng
publication: Proceedings of the Second European Conference of the Prognostics and
Health Management Society 2014
status: public
title: Closed-loop Control System for the Reliability of Intelligent Mechatronic Systems
type: conference
user_id: '55222'
volume: 5
year: '2014'
...
---
_id: '39483'
author:
- first_name: F.F.
full_name: Vidor, F.F.
last_name: Vidor
- first_name: G.I.
full_name: Wirth, G.I.
last_name: Wirth
- first_name: Ulrich
full_name: Hilleringmann, Ulrich
id: '20179'
last_name: Hilleringmann
citation:
ama: Vidor FF, Wirth GI, Hilleringmann U. Low temperature fabrication of a ZnO nanoparticle
thin-film transistor suitable for flexible electronics. Microelectronics Reliability.
2014;54(12):2760-2765. doi:10.1016/j.microrel.2014.07.147
apa: Vidor, F. F., Wirth, G. I., & Hilleringmann, U. (2014). Low temperature
fabrication of a ZnO nanoparticle thin-film transistor suitable for flexible electronics.
Microelectronics Reliability, 54(12), 2760–2765. https://doi.org/10.1016/j.microrel.2014.07.147
bibtex: '@article{Vidor_Wirth_Hilleringmann_2014, title={Low temperature fabrication
of a ZnO nanoparticle thin-film transistor suitable for flexible electronics},
volume={54}, DOI={10.1016/j.microrel.2014.07.147},
number={12}, journal={Microelectronics Reliability}, publisher={Elsevier BV},
author={Vidor, F.F. and Wirth, G.I. and Hilleringmann, Ulrich}, year={2014}, pages={2760–2765}
}'
chicago: 'Vidor, F.F., G.I. Wirth, and Ulrich Hilleringmann. “Low Temperature Fabrication
of a ZnO Nanoparticle Thin-Film Transistor Suitable for Flexible Electronics.”
Microelectronics Reliability 54, no. 12 (2014): 2760–65. https://doi.org/10.1016/j.microrel.2014.07.147.'
ieee: 'F. F. Vidor, G. I. Wirth, and U. Hilleringmann, “Low temperature fabrication
of a ZnO nanoparticle thin-film transistor suitable for flexible electronics,”
Microelectronics Reliability, vol. 54, no. 12, pp. 2760–2765, 2014, doi:
10.1016/j.microrel.2014.07.147.'
mla: Vidor, F. F., et al. “Low Temperature Fabrication of a ZnO Nanoparticle Thin-Film
Transistor Suitable for Flexible Electronics.” Microelectronics Reliability,
vol. 54, no. 12, Elsevier BV, 2014, pp. 2760–65, doi:10.1016/j.microrel.2014.07.147.
short: F.F. Vidor, G.I. Wirth, U. Hilleringmann, Microelectronics Reliability 54
(2014) 2760–2765.
date_created: 2023-01-24T11:25:42Z
date_updated: 2023-03-22T10:15:06Z
department:
- _id: '59'
doi: 10.1016/j.microrel.2014.07.147
intvolume: ' 54'
issue: '12'
keyword:
- Electrical and Electronic Engineering
- Surfaces
- Coatings and Films
- Safety
- Risk
- Reliability and Quality
- Condensed Matter Physics
- Atomic and Molecular Physics
- and Optics
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
page: 2760-2765
publication: Microelectronics Reliability
publication_identifier:
issn:
- 0026-2714
publication_status: published
publisher: Elsevier BV
status: public
title: Low temperature fabrication of a ZnO nanoparticle thin-film transistor suitable
for flexible electronics
type: journal_article
user_id: '20179'
volume: 54
year: '2014'
...
---
_id: '10620'
author:
- first_name: Jahanzeb
full_name: Anwer, Jahanzeb
last_name: Anwer
- first_name: Sebastian
full_name: Meisner, Sebastian
last_name: Meisner
- first_name: Marco
full_name: Platzner, Marco
id: '398'
last_name: Platzner
citation:
ama: 'Anwer J, Meisner S, Platzner M. Dynamic reliability management: Reconfiguring
reliability-levels of hardware designs at runtime. In: Reconfigurable Computing
and FPGAs (ReConFig), 2013 International Conference On. ; 2013:1-6. doi:10.1109/ReConFig.2013.6732280'
apa: 'Anwer, J., Meisner, S., & Platzner, M. (2013). Dynamic reliability management:
Reconfiguring reliability-levels of hardware designs at runtime. In Reconfigurable
Computing and FPGAs (ReConFig), 2013 International Conference on (pp. 1–6).
https://doi.org/10.1109/ReConFig.2013.6732280'
bibtex: '@inproceedings{Anwer_Meisner_Platzner_2013, title={Dynamic reliability
management: Reconfiguring reliability-levels of hardware designs at runtime},
DOI={10.1109/ReConFig.2013.6732280},
booktitle={Reconfigurable Computing and FPGAs (ReConFig), 2013 International Conference
on}, author={Anwer, Jahanzeb and Meisner, Sebastian and Platzner, Marco}, year={2013},
pages={1–6} }'
chicago: 'Anwer, Jahanzeb, Sebastian Meisner, and Marco Platzner. “Dynamic Reliability
Management: Reconfiguring Reliability-Levels of Hardware Designs at Runtime.”
In Reconfigurable Computing and FPGAs (ReConFig), 2013 International Conference
On, 1–6, 2013. https://doi.org/10.1109/ReConFig.2013.6732280.'
ieee: 'J. Anwer, S. Meisner, and M. Platzner, “Dynamic reliability management: Reconfiguring
reliability-levels of hardware designs at runtime,” in Reconfigurable Computing
and FPGAs (ReConFig), 2013 International Conference on, 2013, pp. 1–6.'
mla: 'Anwer, Jahanzeb, et al. “Dynamic Reliability Management: Reconfiguring Reliability-Levels
of Hardware Designs at Runtime.” Reconfigurable Computing and FPGAs (ReConFig),
2013 International Conference On, 2013, pp. 1–6, doi:10.1109/ReConFig.2013.6732280.'
short: 'J. Anwer, S. Meisner, M. Platzner, in: Reconfigurable Computing and FPGAs
(ReConFig), 2013 International Conference On, 2013, pp. 1–6.'
date_created: 2019-07-10T09:32:57Z
date_updated: 2022-01-06T06:50:48Z
department:
- _id: '78'
doi: 10.1109/ReConFig.2013.6732280
keyword:
- fault tolerant computing
- field programmable gate arrays
- logic design
- reliability
- BYU-LANL tool
- DRM tool flow
- FPGA based hardware designs
- avionic application
- device technologies
- dynamic reliability management
- fault-tolerant operation
- hardware designs
- reconfiguring reliability levels
- space applications
- Field programmable gate arrays
- Hardware
- Redundancy
- Reliability engineering
- Runtime
- Tunneling magnetoresistance
language:
- iso: eng
page: 1-6
publication: Reconfigurable Computing and FPGAs (ReConFig), 2013 International Conference
on
status: public
title: 'Dynamic reliability management: Reconfiguring reliability-levels of hardware
designs at runtime'
type: conference
user_id: '3118'
year: '2013'
...
---
_id: '9783'
abstract:
- lang: eng
text: To optimize the ultrasound irradiation for cavitation based ultrasound applications
like sonochemistry or ultrasound cleaning, the correlation between cavitation
intensity and the resulting effect on the process is of interest. Furthermore,
changing conditions like temperature and pressure result in varying acoustic properties
of the liquid. That might necessitate an adaption of the ultrasound irradiation.
To detect such changes during operation, process monitoring is desired. Labor
intensive processes, that might be carried out for several hours, also require
process monitoring to increase their reliability by detection of changes or malfunctions
during operation. In some applications cavitation detection and monitoring can
be achieved by the application of sensors in the sound field. Though the application
of sensors is possible, this necessitates modifications on the system and the
sensor might disturb the sound field. In other applications harsh, process conditions
prohibit the application of sensors in the sound field. Therefore alternative
techniques for cavitation detection and monitoring are desired. The applicability
of an external microphone and a self-sensing ultrasound transducer for cavitation
detection were experimentally investigated. Both methods were found to be suitable
and easily applicable.
author:
- first_name: Peter
full_name: Bornmann, Peter
last_name: Bornmann
- first_name: Tobias
full_name: Hemsel, Tobias
id: '210'
last_name: Hemsel
- first_name: Walter
full_name: Sextro, Walter
id: '21220'
last_name: Sextro
- first_name: Takafumi
full_name: Maeda, Takafumi
last_name: Maeda
- first_name: Takeshi
full_name: Morita, Takeshi
last_name: Morita
citation:
ama: 'Bornmann P, Hemsel T, Sextro W, Maeda T, Morita T. Non-perturbing cavitation
detection / monitoring in sonochemical reactors. In: Ultrasonics Symposium
(IUS), 2012 IEEE International. ; 2012:1141-1144. doi:10.1109/ULTSYM.2012.0284'
apa: Bornmann, P., Hemsel, T., Sextro, W., Maeda, T., & Morita, T. (2012). Non-perturbing
cavitation detection / monitoring in sonochemical reactors. In Ultrasonics
Symposium (IUS), 2012 IEEE International (pp. 1141–1144). https://doi.org/10.1109/ULTSYM.2012.0284
bibtex: '@inproceedings{Bornmann_Hemsel_Sextro_Maeda_Morita_2012, title={Non-perturbing
cavitation detection / monitoring in sonochemical reactors}, DOI={10.1109/ULTSYM.2012.0284},
booktitle={Ultrasonics Symposium (IUS), 2012 IEEE International}, author={Bornmann,
Peter and Hemsel, Tobias and Sextro, Walter and Maeda, Takafumi and Morita, Takeshi},
year={2012}, pages={1141–1144} }'
chicago: Bornmann, Peter, Tobias Hemsel, Walter Sextro, Takafumi Maeda, and Takeshi
Morita. “Non-Perturbing Cavitation Detection / Monitoring in Sonochemical Reactors.”
In Ultrasonics Symposium (IUS), 2012 IEEE International, 1141–44, 2012.
https://doi.org/10.1109/ULTSYM.2012.0284.
ieee: P. Bornmann, T. Hemsel, W. Sextro, T. Maeda, and T. Morita, “Non-perturbing
cavitation detection / monitoring in sonochemical reactors,” in Ultrasonics
Symposium (IUS), 2012 IEEE International, 2012, pp. 1141–1144.
mla: Bornmann, Peter, et al. “Non-Perturbing Cavitation Detection / Monitoring in
Sonochemical Reactors.” Ultrasonics Symposium (IUS), 2012 IEEE International,
2012, pp. 1141–44, doi:10.1109/ULTSYM.2012.0284.
short: 'P. Bornmann, T. Hemsel, W. Sextro, T. Maeda, T. Morita, in: Ultrasonics
Symposium (IUS), 2012 IEEE International, 2012, pp. 1141–1144.'
date_created: 2019-05-13T13:18:49Z
date_updated: 2022-01-06T07:04:20Z
department:
- _id: '151'
doi: 10.1109/ULTSYM.2012.0284
keyword:
- cavitation
- chemical reactors
- microphones
- process monitoring
- reliability
- ultrasonic applications
- ultrasonic waves
- acoustic properties
- cavitation based ultrasound applications
- cavitation intensity
- change detection reliability
- external microphone
- malfunction detection reliability
- nonperturbing cavitation detection
- nonperturbing cavitation monitoring
- process monitoring
- self-sensing ultrasound transducer
- sonochemical reactors
- sonochemistry
- ultrasound cleaning
- ultrasound irradiation
- Acoustics
- Liquids
- Monitoring
- Sensors
- Sonar equipment
- Transducers
- Ultrasonic imaging
language:
- iso: eng
page: 1141-1144
publication: Ultrasonics Symposium (IUS), 2012 IEEE International
publication_identifier:
issn:
- 1948-5719
quality_controlled: '1'
status: public
title: Non-perturbing cavitation detection / monitoring in sonochemical reactors
type: conference
user_id: '55222'
year: '2012'
...
---
_id: '9763'
abstract:
- lang: eng
text: Recent advances in information processing enable new kinds of technical systems,
called self-optimizing systems. These systems are able to adapt their objectives
and their behavior according to the current situation and influences autonomously.
This behavior adaptation is non-deterministic and hence self-optimization is a
risk to the system, e.g. if the result of the self-optimization process does not
match the suddenly changed situation. In contrary, self-optimization could be
used to increase the dependability by pursuing objectives like reliability and
availability. In our preceding publications we introduced the so called multi-level
dependability concept to cope with this new kind of systems (cf. [6]). This concept
comprises the monitoring of the system behavior, the classification of the current
situation, and the selection of the appropriate measure, if reliability limits
are exceeded. In this paper we present for the first time experimental results.
The dependability concept is implemented in the self-optimizing active guidance
system of a railway vehicle. The test drives illustrate clearly that the proposed
concept is able to cope with, e.g., sensor failures, and is able to increase the
reliability and availability of the active guidance module.
author:
- first_name: Christoph
full_name: Sondermann-Wölke, Christoph
last_name: Sondermann-Wölke
- first_name: Jens
full_name: Geisler, Jens
last_name: Geisler
- first_name: Walter
full_name: Sextro, Walter
id: '21220'
last_name: Sextro
citation:
ama: 'Sondermann-Wölke C, Geisler J, Sextro W. Increasing the reliability of a self-optimizing
railway guidance system. In: Reliability and Maintainability Symposium (RAMS),
2010 Proceedings - Annual. ; 2010:1-6. doi:10.1109/RAMS.2010.5448080'
apa: Sondermann-Wölke, C., Geisler, J., & Sextro, W. (2010). Increasing the
reliability of a self-optimizing railway guidance system. In Reliability and
Maintainability Symposium (RAMS), 2010 Proceedings - Annual (pp. 1–6). https://doi.org/10.1109/RAMS.2010.5448080
bibtex: '@inproceedings{Sondermann-Wölke_Geisler_Sextro_2010, title={Increasing
the reliability of a self-optimizing railway guidance system}, DOI={10.1109/RAMS.2010.5448080},
booktitle={Reliability and Maintainability Symposium (RAMS), 2010 Proceedings
- Annual}, author={Sondermann-Wölke, Christoph and Geisler, Jens and Sextro, Walter},
year={2010}, pages={1–6} }'
chicago: Sondermann-Wölke, Christoph, Jens Geisler, and Walter Sextro. “Increasing
the Reliability of a Self-Optimizing Railway Guidance System.” In Reliability
and Maintainability Symposium (RAMS), 2010 Proceedings - Annual, 1–6, 2010.
https://doi.org/10.1109/RAMS.2010.5448080.
ieee: C. Sondermann-Wölke, J. Geisler, and W. Sextro, “Increasing the reliability
of a self-optimizing railway guidance system,” in Reliability and Maintainability
Symposium (RAMS), 2010 Proceedings - Annual, 2010, pp. 1–6.
mla: Sondermann-Wölke, Christoph, et al. “Increasing the Reliability of a Self-Optimizing
Railway Guidance System.” Reliability and Maintainability Symposium (RAMS),
2010 Proceedings - Annual, 2010, pp. 1–6, doi:10.1109/RAMS.2010.5448080.
short: 'C. Sondermann-Wölke, J. Geisler, W. Sextro, in: Reliability and Maintainability
Symposium (RAMS), 2010 Proceedings - Annual, 2010, pp. 1–6.'
date_created: 2019-05-13T10:35:39Z
date_updated: 2022-01-06T07:04:19Z
department:
- _id: '151'
doi: 10.1109/RAMS.2010.5448080
keyword:
- availability
- dependability concept
- multilevel dependability concept
- railway vehicle
- reliability
- self optimizing active guidance system
- self optimizing railway guidance system
- situation classification
- system behavior monitoring
- optimal control
- railways
- reliability theory
- self-adjusting systems
language:
- iso: eng
page: 1 -6
publication: Reliability and Maintainability Symposium (RAMS), 2010 Proceedings -
Annual
publication_identifier:
issn:
- 0149-144X
quality_controlled: '1'
status: public
title: Increasing the reliability of a self-optimizing railway guidance system
type: conference
user_id: '55222'
year: '2010'
...
---
_id: '9736'
abstract:
- lang: eng
text: Self-optimizing mechatronic systems are a new class of technical systems.
On the one hand, new challenges regarding dependability arise from their additional
complexity and adaptivity. On the other hand, their abilities enable new concepts
and methods to improve the dependability of mechatronic systems. This paper introduces
a multi-level dependability concept for self-optimizing mechatronic systems and
shows how planning can be used to improve the availability and reliability of
systems in the operating stages.
author:
- first_name: Benjamin
full_name: Klöpper, Benjamin
last_name: Klöpper
- first_name: Christoph
full_name: Sondermann-Wölke, Christoph
last_name: Sondermann-Wölke
- first_name: Christoph
full_name: Romaus, Christoph
last_name: Romaus
- first_name: Henner
full_name: Vöcking, Henner
last_name: Vöcking
citation:
ama: 'Klöpper B, Sondermann-Wölke C, Romaus C, Vöcking H. Probabilistic planning
integrated in a multi-level dependability concept for mechatronic systems. In:
Computational Intelligence in Control and Automation, 2009. CICA 2009. IEEE
Symposium On. ; 2009:104-111. doi:10.1109/CICA.2009.4982790'
apa: Klöpper, B., Sondermann-Wölke, C., Romaus, C., & Vöcking, H. (2009). Probabilistic
planning integrated in a multi-level dependability concept for mechatronic systems.
In Computational Intelligence in Control and Automation, 2009. CICA 2009. IEEE
Symposium on (pp. 104–111). https://doi.org/10.1109/CICA.2009.4982790
bibtex: '@inproceedings{Klöpper_Sondermann-Wölke_Romaus_Vöcking_2009, title={Probabilistic
planning integrated in a multi-level dependability concept for mechatronic systems},
DOI={10.1109/CICA.2009.4982790},
booktitle={Computational Intelligence in Control and Automation, 2009. CICA 2009.
IEEE Symposium on}, author={Klöpper, Benjamin and Sondermann-Wölke, Christoph
and Romaus, Christoph and Vöcking, Henner}, year={2009}, pages={104–111} }'
chicago: Klöpper, Benjamin, Christoph Sondermann-Wölke, Christoph Romaus, and Henner
Vöcking. “Probabilistic Planning Integrated in a Multi-Level Dependability Concept
for Mechatronic Systems.” In Computational Intelligence in Control and Automation,
2009. CICA 2009. IEEE Symposium On, 104–11, 2009. https://doi.org/10.1109/CICA.2009.4982790.
ieee: B. Klöpper, C. Sondermann-Wölke, C. Romaus, and H. Vöcking, “Probabilistic
planning integrated in a multi-level dependability concept for mechatronic systems,”
in Computational Intelligence in Control and Automation, 2009. CICA 2009. IEEE
Symposium on, 2009, pp. 104–111.
mla: Klöpper, Benjamin, et al. “Probabilistic Planning Integrated in a Multi-Level
Dependability Concept for Mechatronic Systems.” Computational Intelligence
in Control and Automation, 2009. CICA 2009. IEEE Symposium On, 2009, pp. 104–11,
doi:10.1109/CICA.2009.4982790.
short: 'B. Klöpper, C. Sondermann-Wölke, C. Romaus, H. Vöcking, in: Computational
Intelligence in Control and Automation, 2009. CICA 2009. IEEE Symposium On, 2009,
pp. 104–111.'
date_created: 2019-05-13T09:03:57Z
date_updated: 2022-01-06T07:04:19Z
department:
- _id: '151'
doi: 10.1109/CICA.2009.4982790
keyword:
- multilevel dependability concept
- probabilistic planning
- self-optimizing mechatronic systems
- systems reliability
- mechatronics
- planning (artificial intelligence)
- self-adjusting systems
language:
- iso: eng
page: 104 -111
publication: Computational Intelligence in Control and Automation, 2009. CICA 2009.
IEEE Symposium on
quality_controlled: '1'
status: public
title: Probabilistic planning integrated in a multi-level dependability concept for
mechatronic systems
type: conference
user_id: '55222'
year: '2009'
...
---
_id: '9570'
abstract:
- lang: eng
text: "EN: Although the use of new actuator technologies is quite enthusiastic,
the realization of innovative systems based on these principles fails because
of doubts in dependability. Until now, new working principles for actuators have
not been systematically investigated in the means of dependability. Therefore
we developed a proceeding for a dependability-oriented evaluation of technologies.
This is shown in the case of shape memory alloy actuators. \r\nDE: Die Realisierung
von Systemen mittels innovativer Aktortechnologien scheitert oftmals an der Skepsis
gegenüber der Verlässlichkeit (Vertrauen in die zuverlässige und sichere Funktionalität
der Technologie). Diese liegt darin begründet, dass neue Aktortechnologien bzw.
die Integration von innovativen physikalischen Wirkprinzipen innerhalb neuer Aktorkonzepte
bisher noch nicht systematisch im Kontext der Verlässlichkeit untersucht werden.
Daher haben wir ein Vorgehen zur verlässlichkeitsorientierten Technologiebewertung
entwickelt. Neben der detaillierten Darstellung des Vorgehensmodells wird es exemplarisch
anhand von Formgedächtnislegierungen zur Entwicklung innovativer Antriebslösungen
angewendet."
author:
- first_name: Thomas
full_name: Müller, Thomas
last_name: Müller
- first_name: Florian
full_name: Schiedeck, Florian
last_name: Schiedeck
- first_name: Tobias
full_name: Hemsel, Tobias
id: '210'
last_name: Hemsel
citation:
ama: 'Müller T, Schiedeck F, Hemsel T. Verlässlichkeitorientierte Technologiebewertung
innovativer Aktortechnologien am Beispiel von Formgedächtnislegierungen. In: 2.
Tagung Des DVM -- Arbeitskreis Zuverlässigkeit Mechatronischer Und Adaptronischer
Systeme: Absicherung Der Systemzuverlässigkeit, Koblenz. ; 2008.'
apa: 'Müller, T., Schiedeck, F., & Hemsel, T. (2008). Verlässlichkeitorientierte
Technologiebewertung innovativer Aktortechnologien am Beispiel von Formgedächtnislegierungen.
In 2. Tagung des DVM -- Arbeitskreis Zuverlässigkeit mechatronischer und adaptronischer
Systeme: Absicherung der Systemzuverlässigkeit, Koblenz.'
bibtex: '@inproceedings{Müller_Schiedeck_Hemsel_2008, title={Verlässlichkeitorientierte
Technologiebewertung innovativer Aktortechnologien am Beispiel von Formgedächtnislegierungen},
booktitle={2. Tagung des DVM -- Arbeitskreis Zuverlässigkeit mechatronischer und
adaptronischer Systeme: Absicherung der Systemzuverlässigkeit, Koblenz}, author={Müller,
Thomas and Schiedeck, Florian and Hemsel, Tobias}, year={2008} }'
chicago: 'Müller, Thomas, Florian Schiedeck, and Tobias Hemsel. “Verlässlichkeitorientierte
Technologiebewertung Innovativer Aktortechnologien Am Beispiel von Formgedächtnislegierungen.”
In 2. Tagung Des DVM -- Arbeitskreis Zuverlässigkeit Mechatronischer Und Adaptronischer
Systeme: Absicherung Der Systemzuverlässigkeit, Koblenz, 2008.'
ieee: 'T. Müller, F. Schiedeck, and T. Hemsel, “Verlässlichkeitorientierte Technologiebewertung
innovativer Aktortechnologien am Beispiel von Formgedächtnislegierungen,” in 2.
Tagung des DVM -- Arbeitskreis Zuverlässigkeit mechatronischer und adaptronischer
Systeme: Absicherung der Systemzuverlässigkeit, Koblenz, 2008.'
mla: 'Müller, Thomas, et al. “Verlässlichkeitorientierte Technologiebewertung Innovativer
Aktortechnologien Am Beispiel von Formgedächtnislegierungen.” 2. Tagung Des
DVM -- Arbeitskreis Zuverlässigkeit Mechatronischer Und Adaptronischer Systeme:
Absicherung Der Systemzuverlässigkeit, Koblenz, 2008.'
short: 'T. Müller, F. Schiedeck, T. Hemsel, in: 2. Tagung Des DVM -- Arbeitskreis
Zuverlässigkeit Mechatronischer Und Adaptronischer Systeme: Absicherung Der Systemzuverlässigkeit,
Koblenz, 2008.'
date_created: 2019-04-29T11:57:41Z
date_updated: 2022-01-06T07:04:16Z
department:
- _id: '151'
keyword:
- 'EN: Dependability'
- Reliability
- Evaluation of Technology
- Actuators
- 'Shape Memory Alloys DE: Verl{\'
language:
- iso: eng
publication: '2. Tagung des DVM -- Arbeitskreis Zuverlässigkeit mechatronischer und
adaptronischer Systeme: Absicherung der Systemzuverlässigkeit, Koblenz'
status: public
title: Verlässlichkeitorientierte Technologiebewertung innovativer Aktortechnologien
am Beispiel von Formgedächtnislegierungen
type: conference
user_id: '55222'
year: '2008'
...