---
_id: '48063'
abstract:
- lang: eng
text: "Brainwaves have demonstrated to be unique enough across individuals
to be useful as biometrics. They also provide promising advantages over traditional
means of authentication, such as resistance to external observability, revocability,
and intrinsic liveness detection. However, most of the research so far has been
conducted with expensive, bulky, medical-grade helmets, which offer limited applicability
for everyday usage. With the aim to bring brainwave authentication and its benefits
closer to real world deployment, we investigate brain biometrics with consumer
devices. We conduct a comprehensive measurement experiment and user study that
compare five authentication tasks on a user sample up to 10 times larger than
those from previous studies, introducing three novel techniques based on cognitive
semantic processing. Furthermore, we apply our analysis on high-quality open brainwave
data obtained with a medical-grade headset, to assess the differences. We investigate
both the performance, security, and usability of the different options and use
this evidence to elicit design and research recommendations. Our results show
that it is possible to achieve Equal Error Rates as low as 7.2% (a reduction between
68–72% with respect to existing approaches) based on brain responses to images
with current inexpensive technology. We show that the common practice of testing
authentication systems only with known attacker data is unrealistic and may lead
to overly optimistic evaluations. With regard to adoption, users call for simpler
devices, faster authentication, and better privacy.\r\n "
author:
- first_name: Patricia
full_name: Arias-Cabarcos, Patricia
last_name: Arias-Cabarcos
- first_name: Matin
full_name: Fallahi, Matin
last_name: Fallahi
- first_name: Thilo
full_name: Habrich, Thilo
last_name: Habrich
- first_name: Karen
full_name: Schulze, Karen
last_name: Schulze
- first_name: Christian
full_name: Becker, Christian
last_name: Becker
- first_name: Thorsten
full_name: Strufe, Thorsten
last_name: Strufe
citation:
ama: Arias-Cabarcos P, Fallahi M, Habrich T, Schulze K, Becker C, Strufe T. Performance
and Usability Evaluation of Brainwave Authentication Techniques with Consumer
Devices. ACM Transactions on Privacy and Security. 2023;26(3):1-36. doi:10.1145/3579356
apa: Arias-Cabarcos, P., Fallahi, M., Habrich, T., Schulze, K., Becker, C., &
Strufe, T. (2023). Performance and Usability Evaluation of Brainwave Authentication
Techniques with Consumer Devices. ACM Transactions on Privacy and Security,
26(3), 1–36. https://doi.org/10.1145/3579356
bibtex: '@article{Arias-Cabarcos_Fallahi_Habrich_Schulze_Becker_Strufe_2023, title={Performance
and Usability Evaluation of Brainwave Authentication Techniques with Consumer
Devices}, volume={26}, DOI={10.1145/3579356},
number={3}, journal={ACM Transactions on Privacy and Security}, publisher={Association
for Computing Machinery (ACM)}, author={Arias-Cabarcos, Patricia and Fallahi,
Matin and Habrich, Thilo and Schulze, Karen and Becker, Christian and Strufe,
Thorsten}, year={2023}, pages={1–36} }'
chicago: 'Arias-Cabarcos, Patricia, Matin Fallahi, Thilo Habrich, Karen Schulze,
Christian Becker, and Thorsten Strufe. “Performance and Usability Evaluation of
Brainwave Authentication Techniques with Consumer Devices.” ACM Transactions
on Privacy and Security 26, no. 3 (2023): 1–36. https://doi.org/10.1145/3579356.'
ieee: 'P. Arias-Cabarcos, M. Fallahi, T. Habrich, K. Schulze, C. Becker, and T.
Strufe, “Performance and Usability Evaluation of Brainwave Authentication Techniques
with Consumer Devices,” ACM Transactions on Privacy and Security, vol.
26, no. 3, pp. 1–36, 2023, doi: 10.1145/3579356.'
mla: Arias-Cabarcos, Patricia, et al. “Performance and Usability Evaluation of Brainwave
Authentication Techniques with Consumer Devices.” ACM Transactions on Privacy
and Security, vol. 26, no. 3, Association for Computing Machinery (ACM), 2023,
pp. 1–36, doi:10.1145/3579356.
short: P. Arias-Cabarcos, M. Fallahi, T. Habrich, K. Schulze, C. Becker, T. Strufe,
ACM Transactions on Privacy and Security 26 (2023) 1–36.
date_created: 2023-10-14T12:11:55Z
date_updated: 2023-10-14T12:12:42Z
doi: 10.1145/3579356
intvolume: ' 26'
issue: '3'
keyword:
- Safety
- Risk
- Reliability and Quality
- General Computer Science
language:
- iso: eng
page: 1-36
publication: ACM Transactions on Privacy and Security
publication_identifier:
issn:
- 2471-2566
- 2471-2574
publication_status: published
publisher: Association for Computing Machinery (ACM)
status: public
title: Performance and Usability Evaluation of Brainwave Authentication Techniques
with Consumer Devices
type: journal_article
user_id: '92804'
volume: 26
year: '2023'
...
---
_id: '48058'
author:
- first_name: Fabian
full_name: Winkel, Fabian
last_name: Winkel
- first_name: Johannes
full_name: Deuse-Kleinsteuber, Johannes
last_name: Deuse-Kleinsteuber
- first_name: Joachim
full_name: Böcker, Joachim
id: '66'
last_name: Böcker
orcid: 0000-0002-8480-7295
citation:
ama: Winkel F, Deuse-Kleinsteuber J, Böcker J. Run-to-Failure Relay Dataset for
Predictive Maintenance Research With Machine Learning. IEEE Transactions on
Reliability. Published online 2023:1-14. doi:10.1109/tr.2023.3255786
apa: Winkel, F., Deuse-Kleinsteuber, J., & Böcker, J. (2023). Run-to-Failure
Relay Dataset for Predictive Maintenance Research With Machine Learning. IEEE
Transactions on Reliability, 1–14. https://doi.org/10.1109/tr.2023.3255786
bibtex: '@article{Winkel_Deuse-Kleinsteuber_Böcker_2023, title={Run-to-Failure Relay
Dataset for Predictive Maintenance Research With Machine Learning}, DOI={10.1109/tr.2023.3255786},
journal={IEEE Transactions on Reliability}, publisher={Institute of Electrical
and Electronics Engineers (IEEE)}, author={Winkel, Fabian and Deuse-Kleinsteuber,
Johannes and Böcker, Joachim}, year={2023}, pages={1–14} }'
chicago: Winkel, Fabian, Johannes Deuse-Kleinsteuber, and Joachim Böcker. “Run-to-Failure
Relay Dataset for Predictive Maintenance Research With Machine Learning.” IEEE
Transactions on Reliability, 2023, 1–14. https://doi.org/10.1109/tr.2023.3255786.
ieee: 'F. Winkel, J. Deuse-Kleinsteuber, and J. Böcker, “Run-to-Failure Relay Dataset
for Predictive Maintenance Research With Machine Learning,” IEEE Transactions
on Reliability, pp. 1–14, 2023, doi: 10.1109/tr.2023.3255786.'
mla: Winkel, Fabian, et al. “Run-to-Failure Relay Dataset for Predictive Maintenance
Research With Machine Learning.” IEEE Transactions on Reliability, Institute
of Electrical and Electronics Engineers (IEEE), 2023, pp. 1–14, doi:10.1109/tr.2023.3255786.
short: F. Winkel, J. Deuse-Kleinsteuber, J. Böcker, IEEE Transactions on Reliability
(2023) 1–14.
date_created: 2023-10-14T12:01:41Z
date_updated: 2023-10-14T12:16:48Z
department:
- _id: '52'
doi: 10.1109/tr.2023.3255786
keyword:
- Electrical and Electronic Engineering
- Safety
- Risk
- Reliability and Quality
language:
- iso: eng
page: 1-14
publication: IEEE Transactions on Reliability
publication_identifier:
issn:
- 0018-9529
- 1558-1721
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: Run-to-Failure Relay Dataset for Predictive Maintenance Research With Machine
Learning
type: journal_article
user_id: '66'
year: '2023'
...
---
_id: '46487'
article_number: '103936'
author:
- first_name: K.K.
full_name: Zander, K.K.
last_name: Zander
- first_name: D.
full_name: Nguyen, D.
last_name: Nguyen
- first_name: Milad
full_name: Mirbabaie, Milad
id: '88691'
last_name: Mirbabaie
- first_name: S.T.
full_name: Garnett, S.T.
last_name: Garnett
citation:
ama: 'Zander KK, Nguyen D, Mirbabaie M, Garnett ST. Aware but not prepared: understanding
situational awareness during the century flood in Germany in 2021. International
Journal of Disaster Risk Reduction. 2023;96. doi:10.1016/j.ijdrr.2023.103936'
apa: 'Zander, K. K., Nguyen, D., Mirbabaie, M., & Garnett, S. T. (2023). Aware
but not prepared: understanding situational awareness during the century flood
in Germany in 2021. International Journal of Disaster Risk Reduction, 96,
Article 103936. https://doi.org/10.1016/j.ijdrr.2023.103936'
bibtex: '@article{Zander_Nguyen_Mirbabaie_Garnett_2023, title={Aware but not prepared:
understanding situational awareness during the century flood in Germany in 2021},
volume={96}, DOI={10.1016/j.ijdrr.2023.103936},
number={103936}, journal={International Journal of Disaster Risk Reduction}, publisher={Elsevier
BV}, author={Zander, K.K. and Nguyen, D. and Mirbabaie, Milad and Garnett, S.T.},
year={2023} }'
chicago: 'Zander, K.K., D. Nguyen, Milad Mirbabaie, and S.T. Garnett. “Aware but
Not Prepared: Understanding Situational Awareness during the Century Flood in
Germany in 2021.” International Journal of Disaster Risk Reduction 96 (2023).
https://doi.org/10.1016/j.ijdrr.2023.103936.'
ieee: 'K. K. Zander, D. Nguyen, M. Mirbabaie, and S. T. Garnett, “Aware but not
prepared: understanding situational awareness during the century flood in Germany
in 2021,” International Journal of Disaster Risk Reduction, vol. 96, Art.
no. 103936, 2023, doi: 10.1016/j.ijdrr.2023.103936.'
mla: 'Zander, K. K., et al. “Aware but Not Prepared: Understanding Situational Awareness
during the Century Flood in Germany in 2021.” International Journal of Disaster
Risk Reduction, vol. 96, 103936, Elsevier BV, 2023, doi:10.1016/j.ijdrr.2023.103936.'
short: K.K. Zander, D. Nguyen, M. Mirbabaie, S.T. Garnett, International Journal
of Disaster Risk Reduction 96 (2023).
date_created: 2023-08-14T16:11:05Z
date_updated: 2023-08-28T16:50:17Z
doi: 10.1016/j.ijdrr.2023.103936
intvolume: ' 96'
keyword:
- Geology
- Safety Research
- Geotechnical Engineering and Engineering Geology
- Building and Construction
language:
- iso: eng
publication: International Journal of Disaster Risk Reduction
publication_identifier:
issn:
- 2212-4209
publication_status: published
publisher: Elsevier BV
status: public
title: 'Aware but not prepared: understanding situational awareness during the century
flood in Germany in 2021'
type: journal_article
user_id: '80546'
volume: 96
year: '2023'
...
---
_id: '31844'
abstract:
- lang: eng
text: "Encrypting data before sending it to the cloud ensures data confidentiality
but requires the cloud to compute on encrypted data. Trusted execution environments,
such as Intel SGX enclaves, promise to provide a secure environment in which data
can be decrypted and then processed. However, vulnerabilities in the executed
program give attackers ample opportunities to execute arbitrary code inside the
enclave. This code can modify the dataflow of the program and leak secrets via
SGX side channels. Fully homomorphic encryption would be an alternative to compute
on encrypted data without data leaks. However, due to its high computational complexity,
its applicability to general-purpose computing remains limited. Researchers have
made several proposals for transforming programs to perform encrypted computations
on less powerful encryption schemes. Yet current approaches do not support programs
making control-flow decisions based on encrypted data.\r\n \r\n
\ We introduce the concept of\r\n dataflow authentication\r\n
\ (DFAuth) to enable such programs. DFAuth prevents an adversary from
arbitrarily deviating from the dataflow of a program. Our technique hence offers
protections against the side-channel attacks described previously. We implemented
two flavors of DFAuth, a Java bytecode-to-bytecode compiler, and an SGX enclave
running a small and program-independent trusted code base. We applied DFAuth to
a neural network performing machine learning on sensitive medical data and a smart
charging scheduler for electric vehicles. Our transformation yields a neural network
with encrypted weights, which can be evaluated on encrypted inputs in\r\n \r\n \\( 12.55 \\,\\mathrm{m}\\mathrm{s} \\)\r\n
\ \r\n . Our protected scheduler is
capable of updating the encrypted charging plan in approximately 1.06 seconds.\r\n
\ "
author:
- first_name: Andreas
full_name: Fischer, Andreas
last_name: Fischer
- first_name: Benny
full_name: Fuhry, Benny
last_name: Fuhry
- first_name: Jörn
full_name: Kußmaul, Jörn
last_name: Kußmaul
- first_name: Jonas
full_name: Janneck, Jonas
last_name: Janneck
- first_name: Florian
full_name: Kerschbaum, Florian
last_name: Kerschbaum
- first_name: Eric
full_name: Bodden, Eric
id: '59256'
last_name: Bodden
orcid: 0000-0003-3470-3647
citation:
ama: Fischer A, Fuhry B, Kußmaul J, Janneck J, Kerschbaum F, Bodden E. Computation
on Encrypted Data Using Dataflow Authentication. ACM Transactions on Privacy
and Security. 2022;25(3):1-36. doi:10.1145/3513005
apa: Fischer, A., Fuhry, B., Kußmaul, J., Janneck, J., Kerschbaum, F., & Bodden,
E. (2022). Computation on Encrypted Data Using Dataflow Authentication. ACM
Transactions on Privacy and Security, 25(3), 1–36. https://doi.org/10.1145/3513005
bibtex: '@article{Fischer_Fuhry_Kußmaul_Janneck_Kerschbaum_Bodden_2022, title={Computation
on Encrypted Data Using Dataflow Authentication}, volume={25}, DOI={10.1145/3513005},
number={3}, journal={ACM Transactions on Privacy and Security}, publisher={Association
for Computing Machinery (ACM)}, author={Fischer, Andreas and Fuhry, Benny and
Kußmaul, Jörn and Janneck, Jonas and Kerschbaum, Florian and Bodden, Eric}, year={2022},
pages={1–36} }'
chicago: 'Fischer, Andreas, Benny Fuhry, Jörn Kußmaul, Jonas Janneck, Florian Kerschbaum,
and Eric Bodden. “Computation on Encrypted Data Using Dataflow Authentication.”
ACM Transactions on Privacy and Security 25, no. 3 (2022): 1–36. https://doi.org/10.1145/3513005.'
ieee: 'A. Fischer, B. Fuhry, J. Kußmaul, J. Janneck, F. Kerschbaum, and E. Bodden,
“Computation on Encrypted Data Using Dataflow Authentication,” ACM Transactions
on Privacy and Security, vol. 25, no. 3, pp. 1–36, 2022, doi: 10.1145/3513005.'
mla: Fischer, Andreas, et al. “Computation on Encrypted Data Using Dataflow Authentication.”
ACM Transactions on Privacy and Security, vol. 25, no. 3, Association for
Computing Machinery (ACM), 2022, pp. 1–36, doi:10.1145/3513005.
short: A. Fischer, B. Fuhry, J. Kußmaul, J. Janneck, F. Kerschbaum, E. Bodden, ACM
Transactions on Privacy and Security 25 (2022) 1–36.
date_created: 2022-06-09T10:28:03Z
date_updated: 2022-06-09T10:29:19Z
department:
- _id: '76'
doi: 10.1145/3513005
intvolume: ' 25'
issue: '3'
keyword:
- Safety
- Risk
- Reliability and Quality
- General Computer Science
language:
- iso: eng
page: 1-36
publication: ACM Transactions on Privacy and Security
publication_identifier:
issn:
- 2471-2566
- 2471-2574
publication_status: published
publisher: Association for Computing Machinery (ACM)
status: public
title: Computation on Encrypted Data Using Dataflow Authentication
type: journal_article
user_id: '15249'
volume: 25
year: '2022'
...
---
_id: '10779'
author:
- first_name: Zakarya
full_name: Guettatfi, Zakarya
last_name: Guettatfi
- first_name: Omar
full_name: Kermia, Omar
last_name: Kermia
- first_name: Abdelhakim
full_name: Khouas, Abdelhakim
last_name: Khouas
citation:
ama: 'Guettatfi Z, Kermia O, Khouas A. Over effective hard real-time hardware tasks
scheduling and allocation. In: 25th International Conference on Field Programmable
Logic and Applications (FPL). Imperial College; 2015. doi:10.1109/FPL.2015.7293994'
apa: Guettatfi, Z., Kermia, O., & Khouas, A. (2015). Over effective hard real-time
hardware tasks scheduling and allocation. In 25th International Conference
on Field Programmable Logic and Applications (FPL). Imperial College. https://doi.org/10.1109/FPL.2015.7293994
bibtex: '@inproceedings{Guettatfi_Kermia_Khouas_2015, title={Over effective hard
real-time hardware tasks scheduling and allocation}, DOI={10.1109/FPL.2015.7293994},
booktitle={25th International Conference on Field Programmable Logic and Applications
(FPL)}, publisher={Imperial College}, author={Guettatfi, Zakarya and Kermia, Omar
and Khouas, Abdelhakim}, year={2015} }'
chicago: Guettatfi, Zakarya, Omar Kermia, and Abdelhakim Khouas. “Over Effective
Hard Real-Time Hardware Tasks Scheduling and Allocation.” In 25th International
Conference on Field Programmable Logic and Applications (FPL). Imperial College,
2015. https://doi.org/10.1109/FPL.2015.7293994.
ieee: Z. Guettatfi, O. Kermia, and A. Khouas, “Over effective hard real-time hardware
tasks scheduling and allocation,” in 25th International Conference on Field
Programmable Logic and Applications (FPL), 2015.
mla: Guettatfi, Zakarya, et al. “Over Effective Hard Real-Time Hardware Tasks Scheduling
and Allocation.” 25th International Conference on Field Programmable Logic
and Applications (FPL), Imperial College, 2015, doi:10.1109/FPL.2015.7293994.
short: 'Z. Guettatfi, O. Kermia, A. Khouas, in: 25th International Conference on
Field Programmable Logic and Applications (FPL), Imperial College, 2015.'
date_created: 2019-07-10T12:11:36Z
date_updated: 2022-01-06T06:50:50Z
department:
- _id: '78'
doi: 10.1109/FPL.2015.7293994
extern: '1'
keyword:
- embedded systems
- field programmable gate arrays
- operating systems (computers)
- scheduling
- μC/OS-II
- FPGAs
- OS foundation
- SafeRTOS
- Xenomai
- chip utilization ration
- complex time constraints
- embedded systems
- hard real-time hardware task allocation
- hard real-time hardware task scheduling
- hardware-software real-time operating systems
- partially reconfigurable field-programmable gate arrays
- resource constraints
- safety-critical RTOS
- Field programmable gate arrays
- Hardware
- Job shop scheduling
- Real-time systems
- Shape
- Software
language:
- iso: eng
publication: 25th International Conference on Field Programmable Logic and Applications
(FPL)
publication_identifier:
issn:
- 1946-147X
publisher: Imperial College
status: public
title: Over effective hard real-time hardware tasks scheduling and allocation
type: conference
user_id: '398'
year: '2015'
...
---
_id: '39483'
author:
- first_name: F.F.
full_name: Vidor, F.F.
last_name: Vidor
- first_name: G.I.
full_name: Wirth, G.I.
last_name: Wirth
- first_name: Ulrich
full_name: Hilleringmann, Ulrich
id: '20179'
last_name: Hilleringmann
citation:
ama: Vidor FF, Wirth GI, Hilleringmann U. Low temperature fabrication of a ZnO nanoparticle
thin-film transistor suitable for flexible electronics. Microelectronics Reliability.
2014;54(12):2760-2765. doi:10.1016/j.microrel.2014.07.147
apa: Vidor, F. F., Wirth, G. I., & Hilleringmann, U. (2014). Low temperature
fabrication of a ZnO nanoparticle thin-film transistor suitable for flexible electronics.
Microelectronics Reliability, 54(12), 2760–2765. https://doi.org/10.1016/j.microrel.2014.07.147
bibtex: '@article{Vidor_Wirth_Hilleringmann_2014, title={Low temperature fabrication
of a ZnO nanoparticle thin-film transistor suitable for flexible electronics},
volume={54}, DOI={10.1016/j.microrel.2014.07.147},
number={12}, journal={Microelectronics Reliability}, publisher={Elsevier BV},
author={Vidor, F.F. and Wirth, G.I. and Hilleringmann, Ulrich}, year={2014}, pages={2760–2765}
}'
chicago: 'Vidor, F.F., G.I. Wirth, and Ulrich Hilleringmann. “Low Temperature Fabrication
of a ZnO Nanoparticle Thin-Film Transistor Suitable for Flexible Electronics.”
Microelectronics Reliability 54, no. 12 (2014): 2760–65. https://doi.org/10.1016/j.microrel.2014.07.147.'
ieee: 'F. F. Vidor, G. I. Wirth, and U. Hilleringmann, “Low temperature fabrication
of a ZnO nanoparticle thin-film transistor suitable for flexible electronics,”
Microelectronics Reliability, vol. 54, no. 12, pp. 2760–2765, 2014, doi:
10.1016/j.microrel.2014.07.147.'
mla: Vidor, F. F., et al. “Low Temperature Fabrication of a ZnO Nanoparticle Thin-Film
Transistor Suitable for Flexible Electronics.” Microelectronics Reliability,
vol. 54, no. 12, Elsevier BV, 2014, pp. 2760–65, doi:10.1016/j.microrel.2014.07.147.
short: F.F. Vidor, G.I. Wirth, U. Hilleringmann, Microelectronics Reliability 54
(2014) 2760–2765.
date_created: 2023-01-24T11:25:42Z
date_updated: 2023-03-22T10:15:06Z
department:
- _id: '59'
doi: 10.1016/j.microrel.2014.07.147
intvolume: ' 54'
issue: '12'
keyword:
- Electrical and Electronic Engineering
- Surfaces
- Coatings and Films
- Safety
- Risk
- Reliability and Quality
- Condensed Matter Physics
- Atomic and Molecular Physics
- and Optics
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
page: 2760-2765
publication: Microelectronics Reliability
publication_identifier:
issn:
- 0026-2714
publication_status: published
publisher: Elsevier BV
status: public
title: Low temperature fabrication of a ZnO nanoparticle thin-film transistor suitable
for flexible electronics
type: journal_article
user_id: '20179'
volume: 54
year: '2014'
...
---
_id: '38784'
abstract:
- lang: eng
text: This article presents the classification tree method for functional verification
to close the gap from the specification of a test plan to SystemVerilog (Chandra
and Chakrabarty, 2001) test bench generation. Our method supports the systematic
development of test configurations and is based on the classification tree method
for embedded systems (CTM/ES) (Chakrabarty et al., 2000) extending CTM/ES for
random test generation as well as for functional coverage and property specification
author:
- first_name: Alexander
full_name: Krupp, Alexander
last_name: Krupp
- first_name: Wolfgang
full_name: Müller, Wolfgang
id: '16243'
last_name: Müller
citation:
ama: 'Krupp A, Müller W. Classification Trees for Functional Coverage and Random
Test Generation. In: Proceedings of the Design Automation & Test in Europe
Conference. IEEE; 2006. doi:10.1109/DATE.2006.243902'
apa: Krupp, A., & Müller, W. (2006). Classification Trees for Functional Coverage
and Random Test Generation. Proceedings of the Design Automation & Test
in Europe Conference. https://doi.org/10.1109/DATE.2006.243902
bibtex: '@inproceedings{Krupp_Müller_2006, place={Munich, Germany}, title={Classification
Trees for Functional Coverage and Random Test Generation}, DOI={10.1109/DATE.2006.243902},
booktitle={Proceedings of the Design Automation & Test in Europe Conference},
publisher={IEEE}, author={Krupp, Alexander and Müller, Wolfgang}, year={2006}
}'
chicago: 'Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional
Coverage and Random Test Generation.” In Proceedings of the Design Automation
& Test in Europe Conference. Munich, Germany: IEEE, 2006. https://doi.org/10.1109/DATE.2006.243902.'
ieee: 'A. Krupp and W. Müller, “Classification Trees for Functional Coverage and
Random Test Generation,” 2006, doi: 10.1109/DATE.2006.243902.'
mla: Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional
Coverage and Random Test Generation.” Proceedings of the Design Automation
& Test in Europe Conference, IEEE, 2006, doi:10.1109/DATE.2006.243902.
short: 'A. Krupp, W. Müller, in: Proceedings of the Design Automation & Test
in Europe Conference, IEEE, Munich, Germany, 2006.'
date_created: 2023-01-24T08:06:09Z
date_updated: 2023-01-24T08:06:14Z
department:
- _id: '672'
doi: 10.1109/DATE.2006.243902
keyword:
- Classification tree analysis
- System testing
- Embedded system
- Safety
- Automatic testing
- Automation
language:
- iso: eng
place: Munich, Germany
publication: Proceedings of the Design Automation & Test in Europe Conference
publication_identifier:
isbn:
- 3-9810801-1-4
publisher: IEEE
status: public
title: Classification Trees for Functional Coverage and Random Test Generation
type: conference
user_id: '5786'
year: '2006'
...