---
_id: '57300'
abstract:
- lang: eng
  text: Engineering methodologies for Cyber-Physical Systems (CPS) call for planning
    simulations and physical testing in early phases of product creation. Even in
    Model-Based Systems Engineering, there is a lack of systematic support that results
    in avoidable costs and iterations in the engineering process. Planning test cases
    and test scenarios along the product engineering process is not sufficiently integrated
    in terms of support especially for verification and validation engineers. Based
    on a systematic literature review, concepts for model-based planning of testing
    are developed. Characteristics of test cases and test scenarios of CPS are systematically
    identified. Generic templates for the creation of test cases and scenarios are
    derived. Based on the templates, a System Modeling Language (SysML) profile extension
    is developed which enables intuitive modelling of test cases and scenarios. The
    SysML profile is evaluated in a sample System-of-Systems in Disaster Response.
    It subsumes various types of sensor systems like rescue robotics, data science
    algorithms and visualization technologies like Augmented Reality to support decisions
    in extreme weather events. The templates and SysML profile significantly add value
    for engineers in the early and systematic planning of verification and validation.
author:
- first_name: Iris
  full_name: Gräßler, Iris
  id: '47565'
  last_name: Gräßler
  orcid: 0000-0001-5765-971X
- first_name: Marcel
  full_name: Ebel, Marcel
  id: '81788'
  last_name: Ebel
  orcid: https://orcid.org/0009-0007-5400-4436
- first_name: Jens
  full_name: Pottebaum, Jens
  id: '405'
  last_name: Pottebaum
  orcid: http://orcid.org/0000-0001-8778-2989
citation:
  ama: 'Gräßler I, Ebel M, Pottebaum J. Model-based planning of test cases and test
    scenarios to support engineering of Cyber-Physical Systems. In: <i>2024 IEEE International
    Symposium on Systems Engineering (ISSE)</i>. IEEE; 2024. doi:<a href="https://doi.org/10.1109/isse63315.2024.10741135">10.1109/isse63315.2024.10741135</a>'
  apa: Gräßler, I., Ebel, M., &#38; Pottebaum, J. (2024). Model-based planning of
    test cases and test scenarios to support engineering of Cyber-Physical Systems.
    <i>2024 IEEE International Symposium on Systems Engineering (ISSE)</i>.  IEEE
    International Symposium on Systems Engineering 2024, Perugia. <a href="https://doi.org/10.1109/isse63315.2024.10741135">https://doi.org/10.1109/isse63315.2024.10741135</a>
  bibtex: '@inproceedings{Gräßler_Ebel_Pottebaum_2024, title={Model-based planning
    of test cases and test scenarios to support engineering of Cyber-Physical Systems},
    DOI={<a href="https://doi.org/10.1109/isse63315.2024.10741135">10.1109/isse63315.2024.10741135</a>},
    booktitle={2024 IEEE International Symposium on Systems Engineering (ISSE)}, publisher={IEEE},
    author={Gräßler, Iris and Ebel, Marcel and Pottebaum, Jens}, year={2024} }'
  chicago: Gräßler, Iris, Marcel Ebel, and Jens Pottebaum. “Model-Based Planning of
    Test Cases and Test Scenarios to Support Engineering of Cyber-Physical Systems.”
    In <i>2024 IEEE International Symposium on Systems Engineering (ISSE)</i>. IEEE,
    2024. <a href="https://doi.org/10.1109/isse63315.2024.10741135">https://doi.org/10.1109/isse63315.2024.10741135</a>.
  ieee: 'I. Gräßler, M. Ebel, and J. Pottebaum, “Model-based planning of test cases
    and test scenarios to support engineering of Cyber-Physical Systems,” presented
    at the  IEEE International Symposium on Systems Engineering 2024, Perugia, 2024,
    doi: <a href="https://doi.org/10.1109/isse63315.2024.10741135">10.1109/isse63315.2024.10741135</a>.'
  mla: Gräßler, Iris, et al. “Model-Based Planning of Test Cases and Test Scenarios
    to Support Engineering of Cyber-Physical Systems.” <i>2024 IEEE International
    Symposium on Systems Engineering (ISSE)</i>, IEEE, 2024, doi:<a href="https://doi.org/10.1109/isse63315.2024.10741135">10.1109/isse63315.2024.10741135</a>.
  short: 'I. Gräßler, M. Ebel, J. Pottebaum, in: 2024 IEEE International Symposium
    on Systems Engineering (ISSE), IEEE, 2024.'
conference:
  end_date: 2024-10-18
  location: Perugia
  name: ' IEEE International Symposium on Systems Engineering 2024'
  start_date: 2024-10-16
date_created: 2024-11-20T20:06:22Z
date_updated: 2025-01-17T16:20:14Z
department:
- _id: '152'
doi: 10.1109/isse63315.2024.10741135
has_accepted_license: '1'
keyword:
- Systems Engineering
- Systems verification
- System testing
language:
- iso: eng
main_file_link:
- open_access: '1'
  url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10741135&tag=1
oa: '1'
project:
- _id: '516'
  grant_number: '101092749'
  name: 'CREXDATA: CREXDATA: Kritische Maßnahmenplanung über extreme Datenmengen'
publication: 2024 IEEE International Symposium on Systems Engineering (ISSE)
publication_status: published
publisher: IEEE
quality_controlled: '1'
status: public
title: Model-based planning of test cases and test scenarios to support engineering
  of Cyber-Physical Systems
type: conference
user_id: '405'
year: '2024'
...
---
_id: '37037'
abstract:
- lang: eng
  text: Today we can identify a big gap between requirement specification and the
    generation of test environments. This article extends the Classification Tree
    Method for Embedded Systems (CTM/ES) to fill this gap by new concepts for the
    precise specification of stimuli for operational ranges of continuous control
    systems. It introduces novel means for continuous acceptance criteria definition
    and for functional coverage definition.
author:
- first_name: Alexander
  full_name: Krupp, Alexander
  last_name: Krupp
- first_name: Wolfgang
  full_name: Müller, Wolfgang
  id: '16243'
  last_name: Müller
citation:
  ama: 'Krupp A, Müller W. A Systematic Approach to Combined HW/SW System Test. In:
    <i>Proceedings of DATE’10</i>. IEEE; 2010. doi:<a href="https://doi.org/10.1109/DATE.2010.5457186">10.1109/DATE.2010.5457186</a>'
  apa: Krupp, A., &#38; Müller, W. (2010). A Systematic Approach to Combined HW/SW
    System Test. <i>Proceedings of DATE’10</i>. Design, Automation &#38; Test in Europe
    Conference &#38; Exhibition (DATE 2010), Dresden. <a href="https://doi.org/10.1109/DATE.2010.5457186">https://doi.org/10.1109/DATE.2010.5457186</a>
  bibtex: '@inproceedings{Krupp_Müller_2010, place={Dresden}, title={A Systematic
    Approach to Combined HW/SW System Test}, DOI={<a href="https://doi.org/10.1109/DATE.2010.5457186">10.1109/DATE.2010.5457186</a>},
    booktitle={Proceedings of DATE’10}, publisher={IEEE}, author={Krupp, Alexander
    and Müller, Wolfgang}, year={2010} }'
  chicago: 'Krupp, Alexander, and Wolfgang Müller. “A Systematic Approach to Combined
    HW/SW System Test.” In <i>Proceedings of DATE’10</i>. Dresden: IEEE, 2010. <a
    href="https://doi.org/10.1109/DATE.2010.5457186">https://doi.org/10.1109/DATE.2010.5457186</a>.'
  ieee: 'A. Krupp and W. Müller, “A Systematic Approach to Combined HW/SW System Test,”
    presented at the Design, Automation &#38; Test in Europe Conference &#38; Exhibition
    (DATE 2010), Dresden, 2010, doi: <a href="https://doi.org/10.1109/DATE.2010.5457186">10.1109/DATE.2010.5457186</a>.'
  mla: Krupp, Alexander, and Wolfgang Müller. “A Systematic Approach to Combined HW/SW
    System Test.” <i>Proceedings of DATE’10</i>, IEEE, 2010, doi:<a href="https://doi.org/10.1109/DATE.2010.5457186">10.1109/DATE.2010.5457186</a>.
  short: 'A. Krupp, W. Müller, in: Proceedings of DATE’10, IEEE, Dresden, 2010.'
conference:
  location: Dresden
  name: Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)
date_created: 2023-01-17T10:41:15Z
date_updated: 2023-01-17T10:41:25Z
department:
- _id: '672'
doi: 10.1109/DATE.2010.5457186
keyword:
- System testing
- Automatic testing
- Object oriented modeling
- Classification tree analysis
- Automotive engineering
- Mathematical model
- Embedded system
- Control systems
- Electronic equipment testing
- Software testing
language:
- iso: eng
place: Dresden
publication: Proceedings of DATE’10
publisher: IEEE
status: public
title: A Systematic Approach to Combined HW/SW System Test
type: conference
user_id: '5786'
year: '2010'
...
---
_id: '38784'
abstract:
- lang: eng
  text: This article presents the classification tree method for functional verification
    to close the gap from the specification of a test plan to SystemVerilog (Chandra
    and Chakrabarty, 2001) test bench generation. Our method supports the systematic
    development of test configurations and is based on the classification tree method
    for embedded systems (CTM/ES) (Chakrabarty et al., 2000) extending CTM/ES for
    random test generation as well as for functional coverage and property specification
author:
- first_name: Alexander
  full_name: Krupp, Alexander
  last_name: Krupp
- first_name: Wolfgang
  full_name: Müller, Wolfgang
  id: '16243'
  last_name: Müller
citation:
  ama: 'Krupp A, Müller W. Classification Trees for Functional Coverage and Random
    Test Generation. In: <i>Proceedings of the Design Automation &#38; Test in Europe
    Conference</i>. IEEE; 2006. doi:<a href="https://doi.org/10.1109/DATE.2006.243902">10.1109/DATE.2006.243902</a>'
  apa: Krupp, A., &#38; Müller, W. (2006). Classification Trees for Functional Coverage
    and Random Test Generation. <i>Proceedings of the Design Automation &#38; Test
    in Europe Conference</i>. <a href="https://doi.org/10.1109/DATE.2006.243902">https://doi.org/10.1109/DATE.2006.243902</a>
  bibtex: '@inproceedings{Krupp_Müller_2006, place={Munich, Germany}, title={Classification
    Trees for Functional Coverage and Random Test Generation}, DOI={<a href="https://doi.org/10.1109/DATE.2006.243902">10.1109/DATE.2006.243902</a>},
    booktitle={Proceedings of the Design Automation &#38; Test in Europe Conference},
    publisher={IEEE}, author={Krupp, Alexander and Müller, Wolfgang}, year={2006}
    }'
  chicago: 'Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional
    Coverage and Random Test Generation.” In <i>Proceedings of the Design Automation
    &#38; Test in Europe Conference</i>. Munich, Germany: IEEE, 2006. <a href="https://doi.org/10.1109/DATE.2006.243902">https://doi.org/10.1109/DATE.2006.243902</a>.'
  ieee: 'A. Krupp and W. Müller, “Classification Trees for Functional Coverage and
    Random Test Generation,” 2006, doi: <a href="https://doi.org/10.1109/DATE.2006.243902">10.1109/DATE.2006.243902</a>.'
  mla: Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional
    Coverage and Random Test Generation.” <i>Proceedings of the Design Automation
    &#38; Test in Europe Conference</i>, IEEE, 2006, doi:<a href="https://doi.org/10.1109/DATE.2006.243902">10.1109/DATE.2006.243902</a>.
  short: 'A. Krupp, W. Müller, in: Proceedings of the Design Automation &#38; Test
    in Europe Conference, IEEE, Munich, Germany, 2006.'
date_created: 2023-01-24T08:06:09Z
date_updated: 2023-01-24T08:06:14Z
department:
- _id: '672'
doi: 10.1109/DATE.2006.243902
keyword:
- Classification tree analysis
- System testing
- Embedded system
- Safety
- Automatic testing
- Automation
language:
- iso: eng
place: Munich, Germany
publication: Proceedings of the Design Automation & Test in Europe Conference
publication_identifier:
  isbn:
  - 3-9810801-1-4
publisher: IEEE
status: public
title: Classification Trees for Functional Coverage and Random Test Generation
type: conference
user_id: '5786'
year: '2006'
...
---
_id: '38107'
abstract:
- lang: eng
  text: TestML is an XML-based language for the exchange of test descriptions in automotive
    systems design and mainly introduced through the structural definition of an XML
    schema as an independent exchange format for existing tools and methods covering
    a wide range of different test technologies. In this paper, we present a rigorous
    formal behavioral semantics for TestML by means of Abstract State Machines (ASMs).
    Our semantics is a concise, unambiguous, high-level specification for TestML-based
    implementations and serves as a basis to define exact and well-defined mappings
    between existing test languages and TestML.
author:
- first_name: Jürgen
  full_name: Großmann, Jürgen
  last_name: Großmann
- first_name: Wolfgang
  full_name: Müller, Wolfgang
  id: '16243'
  last_name: Müller
citation:
  ama: 'Großmann J, Müller W. A Formal Behavioral Semantics for TestML. In: <i>Proc.
    of ISOLA 06</i>. ; 2006. doi:<a href="https://doi.org/10.1109/ISoLA.2006.37">10.1109/ISoLA.2006.37</a>'
  apa: Großmann, J., &#38; Müller, W. (2006). A Formal Behavioral Semantics for TestML.
    <i>Proc. of ISOLA 06</i>. <a href="https://doi.org/10.1109/ISoLA.2006.37">https://doi.org/10.1109/ISoLA.2006.37</a>
  bibtex: '@inproceedings{Großmann_Müller_2006, place={Paphos, Cyprus}, title={A Formal
    Behavioral Semantics for TestML}, DOI={<a href="https://doi.org/10.1109/ISoLA.2006.37">10.1109/ISoLA.2006.37</a>},
    booktitle={Proc. of ISOLA 06}, author={Großmann, Jürgen and Müller, Wolfgang},
    year={2006} }'
  chicago: Großmann, Jürgen, and Wolfgang Müller. “A Formal Behavioral Semantics for
    TestML.” In <i>Proc. of ISOLA 06</i>. Paphos, Cyprus, 2006. <a href="https://doi.org/10.1109/ISoLA.2006.37">https://doi.org/10.1109/ISoLA.2006.37</a>.
  ieee: 'J. Großmann and W. Müller, “A Formal Behavioral Semantics for TestML,” Paphos,
    Cyprus, 2006, doi: <a href="https://doi.org/10.1109/ISoLA.2006.37">10.1109/ISoLA.2006.37</a>.'
  mla: Großmann, Jürgen, and Wolfgang Müller. “A Formal Behavioral Semantics for TestML.”
    <i>Proc. of ISOLA 06</i>, 2006, doi:<a href="https://doi.org/10.1109/ISoLA.2006.37">10.1109/ISoLA.2006.37</a>.
  short: 'J. Großmann, W. Müller, in: Proc. of ISOLA 06, Paphos, Cyprus, 2006.'
conference:
  location: Paphos, Cyprus
date_created: 2023-01-23T12:00:06Z
date_updated: 2023-01-23T12:06:26Z
department:
- _id: '672'
doi: 10.1109/ISoLA.2006.37
keyword:
- System testing
- Software testing
- Automotive engineering
- Automatic testing
- Machinery production industries
- Protocols
- Hardware design languages
- Samarium
- XML
- Computer industry
language:
- iso: eng
place: Paphos, Cyprus
publication: Proc. of ISOLA 06
publication_identifier:
  isbn:
  - 978-0-7695-3071-0
status: public
title: A Formal Behavioral Semantics for TestML
type: conference
user_id: '5786'
year: '2006'
...