---
_id: '45575'
abstract:
- lang: eng
  text: In this work, we discuss the possibility of improving charge neutralization
    in near ambient pressure X-ray photoelectron spectroscopy by co-irradiating the
    sample with He I photons of 21.2 eV. This UV-enhanced neutralization of charges
    is a variation of the so-called environmental charge compensation, which uses
    the electrons produced by the photoionization of the ambient gas to neutralize
    the positive charges built at the sample surface. Adding an additional ionization
    source generates more charges at the sample but also larger amounts of electrons
    available for neutralization. The final surface charge equilibrium depends on
    different aspects of the experiment, such as the sample composition and geometry,
    the total ionization cross sections of the gas compared to the surface materials,
    the gas used, the luminosity and spot size of the sources used for photoionization,
    and the energy of the electrons present in the gas phase. Here we illustrate the
    efficiency of the UV-enhanced neutralization using three different dielectric
    samples with different geometries (a porous SiO2 monolith with an irregular surface,
    a flat mica sample, and a thin SiO2 film deposited onto a Si substrate), different
    X-ray spot sizes, and two different gases (N2 and Ar). The effect of biasing on
    the efficiency of the sample surface to attract electrons produced in the gas
    phase is also discussed.
article_number: '147317'
article_type: original
author:
- first_name: Teresa de los
  full_name: Arcos, Teresa de los
  last_name: Arcos
- first_name: Hendrik
  full_name: Müller, Hendrik
  last_name: Müller
- first_name: Christian
  full_name: Weinberger, Christian
  last_name: Weinberger
- first_name: Guido
  full_name: Grundmeier, Guido
  last_name: Grundmeier
citation:
  ama: Arcos T de los, Müller H, Weinberger C, Grundmeier G. UV-enhanced environmental
    charge compensation in near ambient pressure XPS. <i>Journal of Electron Spectroscopy
    and Related Phenomena</i>. 2023;264(264). doi:<a href="https://doi.org/10.1016/j.elspec.2023.147317">10.1016/j.elspec.2023.147317</a>
  apa: Arcos, T. de los, Müller, H., Weinberger, C., &#38; Grundmeier, G. (2023).
    UV-enhanced environmental charge compensation in near ambient pressure XPS. <i>Journal
    of Electron Spectroscopy and Related Phenomena</i>, <i>264</i>(264), Article 147317.
    <a href="https://doi.org/10.1016/j.elspec.2023.147317">https://doi.org/10.1016/j.elspec.2023.147317</a>
  bibtex: '@article{Arcos_Müller_Weinberger_Grundmeier_2023, title={UV-enhanced environmental
    charge compensation in near ambient pressure XPS}, volume={264}, DOI={<a href="https://doi.org/10.1016/j.elspec.2023.147317">10.1016/j.elspec.2023.147317</a>},
    number={264147317}, journal={Journal of Electron Spectroscopy and Related Phenomena},
    publisher={Elsevier}, author={Arcos, Teresa de los and Müller, Hendrik and Weinberger,
    Christian and Grundmeier, Guido}, year={2023} }'
  chicago: Arcos, Teresa de los, Hendrik Müller, Christian Weinberger, and Guido Grundmeier.
    “UV-Enhanced Environmental Charge Compensation in near Ambient Pressure XPS.”
    <i>Journal of Electron Spectroscopy and Related Phenomena</i> 264, no. 264 (2023).
    <a href="https://doi.org/10.1016/j.elspec.2023.147317">https://doi.org/10.1016/j.elspec.2023.147317</a>.
  ieee: 'T. de los Arcos, H. Müller, C. Weinberger, and G. Grundmeier, “UV-enhanced
    environmental charge compensation in near ambient pressure XPS,” <i>Journal of
    Electron Spectroscopy and Related Phenomena</i>, vol. 264, no. 264, Art. no. 147317,
    2023, doi: <a href="https://doi.org/10.1016/j.elspec.2023.147317">10.1016/j.elspec.2023.147317</a>.'
  mla: Arcos, Teresa de los, et al. “UV-Enhanced Environmental Charge Compensation
    in near Ambient Pressure XPS.” <i>Journal of Electron Spectroscopy and Related
    Phenomena</i>, vol. 264, no. 264, 147317, Elsevier, 2023, doi:<a href="https://doi.org/10.1016/j.elspec.2023.147317">10.1016/j.elspec.2023.147317</a>.
  short: T. de los Arcos, H. Müller, C. Weinberger, G. Grundmeier, Journal of Electron
    Spectroscopy and Related Phenomena 264 (2023).
date_created: 2023-06-12T08:09:57Z
date_updated: 2023-06-12T08:12:42Z
doi: 10.1016/j.elspec.2023.147317
intvolume: '       264'
issue: '264'
keyword:
- XPS
- Near ambient pressure
- Environmental charge compensation
- UV
language:
- iso: eng
publication: Journal of Electron Spectroscopy and Related Phenomena
publication_identifier:
  issn:
  - 0368-2048
publication_status: published
publisher: Elsevier
status: public
title: UV-enhanced environmental charge compensation in near ambient pressure XPS
type: journal_article
user_id: '11848'
volume: 264
year: '2023'
...