[{"title":"Resonant photocurrent-spectroscopy of individual CdSe quantum dots","publisher":"Elsevier BV","date_created":"2018-09-20T12:45:46Z","year":"2010","issue":"10","keyword":["CdSe/ZnSe quantum dots","Photodiode","Quantum confined Stark Effect","Photocurrent","II–VI Semiconductors"],"language":[{"iso":"eng"}],"abstract":[{"text":"Here we report on investigations on CdSe quantum dots incorporated in ZnSe based Schottky photodiodes with near-field shadow masks. Photoluminescence and photocurrent of individual quantum dots were studied as a function of the applied bias voltage. The exciton energy of the quantum dot ground state transition was shifted to the excitation energy by using the Stark effect tuning via an external bias voltage. Under the condition of resonance with the laser excitation energy we observed a resonant photocurrent signal due to the tunnelling of carriers out of the quantum dots at electric fields above 500 kV/cm.","lang":"eng"}],"publication":"Physica E: Low-dimensional Systems and Nanostructures","doi":"10.1016/j.physe.2010.01.013","date_updated":"2022-01-06T07:01:09Z","author":[{"first_name":"M.","last_name":"Panfilova","full_name":"Panfilova, M."},{"first_name":"S.","last_name":"Michaelis de Vasconcellos","full_name":"Michaelis de Vasconcellos, S."},{"full_name":"Pawlis, A.","last_name":"Pawlis","first_name":"A."},{"first_name":"K.","full_name":"Lischka, K.","last_name":"Lischka"},{"first_name":"Artur","full_name":"Zrenner, Artur","id":"606","orcid":"0000-0002-5190-0944","last_name":"Zrenner"}],"volume":42,"citation":{"ama":"Panfilova M, Michaelis de Vasconcellos S, Pawlis A, Lischka K, Zrenner A. Resonant photocurrent-spectroscopy of individual CdSe quantum dots. <i>Physica E: Low-dimensional Systems and Nanostructures</i>. 2010;42(10):2521-2523. doi:<a href=\"https://doi.org/10.1016/j.physe.2010.01.013\">10.1016/j.physe.2010.01.013</a>","chicago":"Panfilova, M., S. Michaelis de Vasconcellos, A. Pawlis, K. Lischka, and Artur Zrenner. “Resonant Photocurrent-Spectroscopy of Individual CdSe Quantum Dots.” <i>Physica E: Low-Dimensional Systems and Nanostructures</i> 42, no. 10 (2010): 2521–23. <a href=\"https://doi.org/10.1016/j.physe.2010.01.013\">https://doi.org/10.1016/j.physe.2010.01.013</a>.","ieee":"M. Panfilova, S. Michaelis de Vasconcellos, A. Pawlis, K. Lischka, and A. Zrenner, “Resonant photocurrent-spectroscopy of individual CdSe quantum dots,” <i>Physica E: Low-dimensional Systems and Nanostructures</i>, vol. 42, no. 10, pp. 2521–2523, 2010.","bibtex":"@article{Panfilova_Michaelis de Vasconcellos_Pawlis_Lischka_Zrenner_2010, title={Resonant photocurrent-spectroscopy of individual CdSe quantum dots}, volume={42}, DOI={<a href=\"https://doi.org/10.1016/j.physe.2010.01.013\">10.1016/j.physe.2010.01.013</a>}, number={10}, journal={Physica E: Low-dimensional Systems and Nanostructures}, publisher={Elsevier BV}, author={Panfilova, M. and Michaelis de Vasconcellos, S. and Pawlis, A. and Lischka, K. and Zrenner, Artur}, year={2010}, pages={2521–2523} }","mla":"Panfilova, M., et al. “Resonant Photocurrent-Spectroscopy of Individual CdSe Quantum Dots.” <i>Physica E: Low-Dimensional Systems and Nanostructures</i>, vol. 42, no. 10, Elsevier BV, 2010, pp. 2521–23, doi:<a href=\"https://doi.org/10.1016/j.physe.2010.01.013\">10.1016/j.physe.2010.01.013</a>.","short":"M. Panfilova, S. Michaelis de Vasconcellos, A. Pawlis, K. Lischka, A. Zrenner, Physica E: Low-Dimensional Systems and Nanostructures 42 (2010) 2521–2523.","apa":"Panfilova, M., Michaelis de Vasconcellos, S., Pawlis, A., Lischka, K., &#38; Zrenner, A. (2010). Resonant photocurrent-spectroscopy of individual CdSe quantum dots. <i>Physica E: Low-Dimensional Systems and Nanostructures</i>, <i>42</i>(10), 2521–2523. <a href=\"https://doi.org/10.1016/j.physe.2010.01.013\">https://doi.org/10.1016/j.physe.2010.01.013</a>"},"page":"2521-2523","intvolume":"        42","publication_status":"published","publication_identifier":{"issn":["1386-9477"]},"article_type":"original","_id":"4552","user_id":"49428","department":[{"_id":"15"},{"_id":"230"},{"_id":"35"}],"status":"public","type":"journal_article"},{"keyword":["Raman","Photoluminescence","Microdisc","ZnSe"],"language":[{"iso":"eng"}],"abstract":[{"text":"Semiconductor microdiscs are promising for applications in photonics and quantum-information processing, such as efficient solid-state-based single-photon emitters. Strain in the multilayer structure of those devices has an important influence on their optical properties. We present measurements of the strain distribution in ZnMgSe/ZnSe microdiscs by means of micro-photoluminescence and micro-Raman imaging. Photoluminescence measurements of microdiscs reveal substantially broadened emission lines with a shift to lower energy at the undercut part of microdiscs, indicating local relaxation in this area. The distribution of the strain in the microdiscs is obtained from an imaging micro-Raman analysis, revealing that the freestanding part of the microdiscs is free of defects.","lang":"eng"}],"publication":"Microelectronics Journal","title":"Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs","publisher":"Elsevier BV","date_created":"2018-09-20T13:39:35Z","year":"2008","issue":"2","article_type":"original","_id":"4555","user_id":"49428","department":[{"_id":"15"},{"_id":"230"},{"_id":"35"}],"status":"public","type":"journal_article","doi":"10.1016/j.mejo.2008.07.056","date_updated":"2022-01-06T07:01:09Z","author":[{"full_name":"Panfilova, M.","last_name":"Panfilova","first_name":"M."},{"first_name":"A.","full_name":"Pawlis, A.","last_name":"Pawlis"},{"first_name":"C.","full_name":"Arens, C.","last_name":"Arens"},{"first_name":"S. Michaelis","full_name":"de Vasconcellos, S. Michaelis","last_name":"de Vasconcellos"},{"full_name":"Berth, Gerhard","id":"53","last_name":"Berth","first_name":"Gerhard"},{"first_name":"K.P.","last_name":"Hüsch","full_name":"Hüsch, K.P."},{"last_name":"Wiedemeier","full_name":"Wiedemeier, V.","first_name":"V."},{"orcid":"0000-0002-5190-0944","last_name":"Zrenner","full_name":"Zrenner, Artur","id":"606","first_name":"Artur"},{"first_name":"K.","last_name":"Lischka","full_name":"Lischka, K."}],"volume":40,"citation":{"apa":"Panfilova, M., Pawlis, A., Arens, C., de Vasconcellos, S. M., Berth, G., Hüsch, K. P., … Lischka, K. (2008). Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs. <i>Microelectronics Journal</i>, <i>40</i>(2), 221–223. <a href=\"https://doi.org/10.1016/j.mejo.2008.07.056\">https://doi.org/10.1016/j.mejo.2008.07.056</a>","mla":"Panfilova, M., et al. “Micro-Raman Imaging and Micro-Photoluminescence Measurements of Strain in ZnMgSe/ZnSe Microdiscs.” <i>Microelectronics Journal</i>, vol. 40, no. 2, Elsevier BV, 2008, pp. 221–23, doi:<a href=\"https://doi.org/10.1016/j.mejo.2008.07.056\">10.1016/j.mejo.2008.07.056</a>.","bibtex":"@article{Panfilova_Pawlis_Arens_de Vasconcellos_Berth_Hüsch_Wiedemeier_Zrenner_Lischka_2008, title={Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs}, volume={40}, DOI={<a href=\"https://doi.org/10.1016/j.mejo.2008.07.056\">10.1016/j.mejo.2008.07.056</a>}, number={2}, journal={Microelectronics Journal}, publisher={Elsevier BV}, author={Panfilova, M. and Pawlis, A. and Arens, C. and de Vasconcellos, S. Michaelis and Berth, Gerhard and Hüsch, K.P. and Wiedemeier, V. and Zrenner, Artur and Lischka, K.}, year={2008}, pages={221–223} }","short":"M. Panfilova, A. Pawlis, C. Arens, S.M. de Vasconcellos, G. Berth, K.P. Hüsch, V. Wiedemeier, A. Zrenner, K. Lischka, Microelectronics Journal 40 (2008) 221–223.","ama":"Panfilova M, Pawlis A, Arens C, et al. Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs. <i>Microelectronics Journal</i>. 2008;40(2):221-223. doi:<a href=\"https://doi.org/10.1016/j.mejo.2008.07.056\">10.1016/j.mejo.2008.07.056</a>","chicago":"Panfilova, M., A. Pawlis, C. Arens, S. Michaelis de Vasconcellos, Gerhard Berth, K.P. Hüsch, V. Wiedemeier, Artur Zrenner, and K. Lischka. “Micro-Raman Imaging and Micro-Photoluminescence Measurements of Strain in ZnMgSe/ZnSe Microdiscs.” <i>Microelectronics Journal</i> 40, no. 2 (2008): 221–23. <a href=\"https://doi.org/10.1016/j.mejo.2008.07.056\">https://doi.org/10.1016/j.mejo.2008.07.056</a>.","ieee":"M. Panfilova <i>et al.</i>, “Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs,” <i>Microelectronics Journal</i>, vol. 40, no. 2, pp. 221–223, 2008."},"page":"221-223","intvolume":"        40","publication_status":"published","publication_identifier":{"issn":["0026-2692"]}}]