[{"abstract":[{"lang":"eng","text":"This article presents the classification tree method for functional verification to close the gap from the specification of a test plan to SystemVerilog (Chandra and Chakrabarty, 2001) test bench generation. Our method supports the systematic development of test configurations and is based on the classification tree method for embedded systems (CTM/ES) (Chakrabarty et al., 2000) extending CTM/ES for random test generation as well as for functional coverage and property specification"}],"status":"public","publication":"Proceedings of the Design Automation & Test in Europe Conference","type":"conference","keyword":["Classification tree analysis","System testing","Embedded system","Safety","Automatic testing","Automation"],"language":[{"iso":"eng"}],"_id":"38784","department":[{"_id":"672"}],"user_id":"5786","year":"2006","place":"Munich, Germany","citation":{"chicago":"Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional Coverage and Random Test Generation.” In <i>Proceedings of the Design Automation &#38; Test in Europe Conference</i>. Munich, Germany: IEEE, 2006. <a href=\"https://doi.org/10.1109/DATE.2006.243902\">https://doi.org/10.1109/DATE.2006.243902</a>.","ieee":"A. Krupp and W. Müller, “Classification Trees for Functional Coverage and Random Test Generation,” 2006, doi: <a href=\"https://doi.org/10.1109/DATE.2006.243902\">10.1109/DATE.2006.243902</a>.","ama":"Krupp A, Müller W. Classification Trees for Functional Coverage and Random Test Generation. In: <i>Proceedings of the Design Automation &#38; Test in Europe Conference</i>. IEEE; 2006. doi:<a href=\"https://doi.org/10.1109/DATE.2006.243902\">10.1109/DATE.2006.243902</a>","short":"A. Krupp, W. Müller, in: Proceedings of the Design Automation &#38; Test in Europe Conference, IEEE, Munich, Germany, 2006.","bibtex":"@inproceedings{Krupp_Müller_2006, place={Munich, Germany}, title={Classification Trees for Functional Coverage and Random Test Generation}, DOI={<a href=\"https://doi.org/10.1109/DATE.2006.243902\">10.1109/DATE.2006.243902</a>}, booktitle={Proceedings of the Design Automation &#38; Test in Europe Conference}, publisher={IEEE}, author={Krupp, Alexander and Müller, Wolfgang}, year={2006} }","mla":"Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional Coverage and Random Test Generation.” <i>Proceedings of the Design Automation &#38; Test in Europe Conference</i>, IEEE, 2006, doi:<a href=\"https://doi.org/10.1109/DATE.2006.243902\">10.1109/DATE.2006.243902</a>.","apa":"Krupp, A., &#38; Müller, W. (2006). Classification Trees for Functional Coverage and Random Test Generation. <i>Proceedings of the Design Automation &#38; Test in Europe Conference</i>. <a href=\"https://doi.org/10.1109/DATE.2006.243902\">https://doi.org/10.1109/DATE.2006.243902</a>"},"publication_identifier":{"isbn":["3-9810801-1-4"]},"title":"Classification Trees for Functional Coverage and Random Test Generation","doi":"10.1109/DATE.2006.243902","date_updated":"2023-01-24T08:06:14Z","publisher":"IEEE","date_created":"2023-01-24T08:06:09Z","author":[{"last_name":"Krupp","full_name":"Krupp, Alexander","first_name":"Alexander"},{"last_name":"Müller","id":"16243","full_name":"Müller, Wolfgang","first_name":"Wolfgang"}]},{"author":[{"first_name":"M.","full_name":"Loog, M.","last_name":"Loog"},{"full_name":"Duin, R.P.W.","last_name":"Duin","first_name":"R.P.W."},{"last_name":"Haeb-Umbach","id":"242","full_name":"Haeb-Umbach, Reinhold","first_name":"Reinhold"}],"volume":23,"oa":"1","date_updated":"2022-01-06T06:51:11Z","main_file_link":[{"open_access":"1","url":"https://groups.uni-paderborn.de/nt/pubs/2001/LoDuHa01.pdf"}],"doi":"10.1109/34.935849","citation":{"bibtex":"@article{Loog_Duin_Haeb-Umbach_2001, title={Multiclass linear dimension reduction by weighted pairwise Fisher criteria}, volume={23}, DOI={<a href=\"https://doi.org/10.1109/34.935849\">10.1109/34.935849</a>}, number={7}, journal={IEEE Transactions on Pattern Analysis and Machine Intelligence}, author={Loog, M. and Duin, R.P.W. and Haeb-Umbach, Reinhold}, year={2001}, pages={762–766} }","mla":"Loog, M., et al. “Multiclass Linear Dimension Reduction by Weighted Pairwise Fisher Criteria.” <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>, vol. 23, no. 7, 2001, pp. 762–66, doi:<a href=\"https://doi.org/10.1109/34.935849\">10.1109/34.935849</a>.","short":"M. Loog, R.P.W. Duin, R. Haeb-Umbach, IEEE Transactions on Pattern Analysis and Machine Intelligence 23 (2001) 762–766.","apa":"Loog, M., Duin, R. P. W., &#38; Haeb-Umbach, R. (2001). Multiclass linear dimension reduction by weighted pairwise Fisher criteria. <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>, <i>23</i>(7), 762–766. <a href=\"https://doi.org/10.1109/34.935849\">https://doi.org/10.1109/34.935849</a>","chicago":"Loog, M., R.P.W. Duin, and Reinhold Haeb-Umbach. “Multiclass Linear Dimension Reduction by Weighted Pairwise Fisher Criteria.” <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i> 23, no. 7 (2001): 762–66. <a href=\"https://doi.org/10.1109/34.935849\">https://doi.org/10.1109/34.935849</a>.","ieee":"M. Loog, R. P. W. Duin, and R. Haeb-Umbach, “Multiclass linear dimension reduction by weighted pairwise Fisher criteria,” <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>, vol. 23, no. 7, pp. 762–766, 2001.","ama":"Loog M, Duin RPW, Haeb-Umbach R. Multiclass linear dimension reduction by weighted pairwise Fisher criteria. <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>. 2001;23(7):762-766. doi:<a href=\"https://doi.org/10.1109/34.935849\">10.1109/34.935849</a>"},"page":"762-766","intvolume":"        23","user_id":"44006","department":[{"_id":"54"}],"_id":"11870","type":"journal_article","status":"public","date_created":"2019-07-12T05:29:51Z","title":"Multiclass linear dimension reduction by weighted pairwise Fisher criteria","issue":"7","year":"2001","language":[{"iso":"eng"}],"keyword":["approximate pairwise accuracy","Bayes error","Bayes methods","error statistics","Euclidean distance","Fisher criterion","linear dimension reduction","linear discriminant analysis","pattern classification","statistical analysis","statistical pattern classification","weighting function"],"publication":"IEEE Transactions on Pattern Analysis and Machine Intelligence","abstract":[{"text":"We derive a class of computationally inexpensive linear dimension reduction criteria by introducing a weighted variant of the well-known K-class Fisher criterion associated with linear discriminant analysis (LDA). It can be seen that LDA weights contributions of individual class pairs according to the Euclidean distance of the respective class means. We generalize upon LDA by introducing a different weighting function","lang":"eng"}]}]