---
_id: '38784'
abstract:
- lang: eng
text: This article presents the classification tree method for functional verification
to close the gap from the specification of a test plan to SystemVerilog (Chandra
and Chakrabarty, 2001) test bench generation. Our method supports the systematic
development of test configurations and is based on the classification tree method
for embedded systems (CTM/ES) (Chakrabarty et al., 2000) extending CTM/ES for
random test generation as well as for functional coverage and property specification
author:
- first_name: Alexander
full_name: Krupp, Alexander
last_name: Krupp
- first_name: Wolfgang
full_name: Müller, Wolfgang
id: '16243'
last_name: Müller
citation:
ama: 'Krupp A, Müller W. Classification Trees for Functional Coverage and Random
Test Generation. In: Proceedings of the Design Automation & Test in Europe
Conference. IEEE; 2006. doi:10.1109/DATE.2006.243902'
apa: Krupp, A., & Müller, W. (2006). Classification Trees for Functional Coverage
and Random Test Generation. Proceedings of the Design Automation & Test
in Europe Conference. https://doi.org/10.1109/DATE.2006.243902
bibtex: '@inproceedings{Krupp_Müller_2006, place={Munich, Germany}, title={Classification
Trees for Functional Coverage and Random Test Generation}, DOI={10.1109/DATE.2006.243902},
booktitle={Proceedings of the Design Automation & Test in Europe Conference},
publisher={IEEE}, author={Krupp, Alexander and Müller, Wolfgang}, year={2006}
}'
chicago: 'Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional
Coverage and Random Test Generation.” In Proceedings of the Design Automation
& Test in Europe Conference. Munich, Germany: IEEE, 2006. https://doi.org/10.1109/DATE.2006.243902.'
ieee: 'A. Krupp and W. Müller, “Classification Trees for Functional Coverage and
Random Test Generation,” 2006, doi: 10.1109/DATE.2006.243902.'
mla: Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional
Coverage and Random Test Generation.” Proceedings of the Design Automation
& Test in Europe Conference, IEEE, 2006, doi:10.1109/DATE.2006.243902.
short: 'A. Krupp, W. Müller, in: Proceedings of the Design Automation & Test
in Europe Conference, IEEE, Munich, Germany, 2006.'
date_created: 2023-01-24T08:06:09Z
date_updated: 2023-01-24T08:06:14Z
department:
- _id: '672'
doi: 10.1109/DATE.2006.243902
keyword:
- Classification tree analysis
- System testing
- Embedded system
- Safety
- Automatic testing
- Automation
language:
- iso: eng
place: Munich, Germany
publication: Proceedings of the Design Automation & Test in Europe Conference
publication_identifier:
isbn:
- 3-9810801-1-4
publisher: IEEE
status: public
title: Classification Trees for Functional Coverage and Random Test Generation
type: conference
user_id: '5786'
year: '2006'
...
---
_id: '11870'
abstract:
- lang: eng
text: We derive a class of computationally inexpensive linear dimension reduction
criteria by introducing a weighted variant of the well-known K-class Fisher criterion
associated with linear discriminant analysis (LDA). It can be seen that LDA weights
contributions of individual class pairs according to the Euclidean distance of
the respective class means. We generalize upon LDA by introducing a different
weighting function
author:
- first_name: M.
full_name: Loog, M.
last_name: Loog
- first_name: R.P.W.
full_name: Duin, R.P.W.
last_name: Duin
- first_name: Reinhold
full_name: Haeb-Umbach, Reinhold
id: '242'
last_name: Haeb-Umbach
citation:
ama: Loog M, Duin RPW, Haeb-Umbach R. Multiclass linear dimension reduction by weighted
pairwise Fisher criteria. IEEE Transactions on Pattern Analysis and Machine
Intelligence. 2001;23(7):762-766. doi:10.1109/34.935849
apa: Loog, M., Duin, R. P. W., & Haeb-Umbach, R. (2001). Multiclass linear dimension
reduction by weighted pairwise Fisher criteria. IEEE Transactions on Pattern
Analysis and Machine Intelligence, 23(7), 762–766. https://doi.org/10.1109/34.935849
bibtex: '@article{Loog_Duin_Haeb-Umbach_2001, title={Multiclass linear dimension
reduction by weighted pairwise Fisher criteria}, volume={23}, DOI={10.1109/34.935849},
number={7}, journal={IEEE Transactions on Pattern Analysis and Machine Intelligence},
author={Loog, M. and Duin, R.P.W. and Haeb-Umbach, Reinhold}, year={2001}, pages={762–766}
}'
chicago: 'Loog, M., R.P.W. Duin, and Reinhold Haeb-Umbach. “Multiclass Linear Dimension
Reduction by Weighted Pairwise Fisher Criteria.” IEEE Transactions on Pattern
Analysis and Machine Intelligence 23, no. 7 (2001): 762–66. https://doi.org/10.1109/34.935849.'
ieee: M. Loog, R. P. W. Duin, and R. Haeb-Umbach, “Multiclass linear dimension reduction
by weighted pairwise Fisher criteria,” IEEE Transactions on Pattern Analysis
and Machine Intelligence, vol. 23, no. 7, pp. 762–766, 2001.
mla: Loog, M., et al. “Multiclass Linear Dimension Reduction by Weighted Pairwise
Fisher Criteria.” IEEE Transactions on Pattern Analysis and Machine Intelligence,
vol. 23, no. 7, 2001, pp. 762–66, doi:10.1109/34.935849.
short: M. Loog, R.P.W. Duin, R. Haeb-Umbach, IEEE Transactions on Pattern Analysis
and Machine Intelligence 23 (2001) 762–766.
date_created: 2019-07-12T05:29:51Z
date_updated: 2022-01-06T06:51:11Z
department:
- _id: '54'
doi: 10.1109/34.935849
intvolume: ' 23'
issue: '7'
keyword:
- approximate pairwise accuracy
- Bayes error
- Bayes methods
- error statistics
- Euclidean distance
- Fisher criterion
- linear dimension reduction
- linear discriminant analysis
- pattern classification
- statistical analysis
- statistical pattern classification
- weighting function
language:
- iso: eng
main_file_link:
- open_access: '1'
url: https://groups.uni-paderborn.de/nt/pubs/2001/LoDuHa01.pdf
oa: '1'
page: 762-766
publication: IEEE Transactions on Pattern Analysis and Machine Intelligence
status: public
title: Multiclass linear dimension reduction by weighted pairwise Fisher criteria
type: journal_article
user_id: '44006'
volume: 23
year: '2001'
...