---
_id: '54966'
abstract:
- lang: eng
text: Piezoresponse force microscopy (PFM) is one of the most widespread methods
for investigating and visualizing ferroelectric domain structures down to the
nanometer length scale. PFM makes use of the direct coupling of the piezoelectric
response to the crystal lattice, and hence, it is most often applied to spatially
map the three-dimensional (3D) near-surface domain distribution of any polar or
ferroic sample. Nonetheless, since most samples investigated by PFM are at least
semiconducting or fully insulating, the electric ac field emerging from the conductive
scanning force microscopy (SFM) tip penetrates the sample and, hence, may also
couple to polar features that are deeply buried into the bulk of the sample under
investigation. Thus, in the work presented here, we experimentally and theoretically
explore the contrast and depth resolution capabilities of PFM, by analyzing the
dependence of several key parameters. These key parameters include the depth of
the buried feature, i.e., here a domain wall (DW), as well as PFM-relevant technical
parameters such as the tip radius, the PFM drive voltage and frequency, and the
signal-to-noise ratio. The theoretical predictions are experimentally verified
using x-cut periodically poled lithium niobate single crystals that are specially
prepared into wedge-shaped samples, in order to allow the buried feature, here
the DW, to be “positioned” at any depth into the bulk. This inspection essentially
contributes to the fundamental understanding in PFM contrast analysis and to the
reconstruction of 3D domain structures down to a 1 μm-penetration depth into the
sample.
article_type: original
author:
- first_name: Matthias
full_name: Roeper, Matthias
last_name: Roeper
- first_name: Samuel D.
full_name: Seddon, Samuel D.
last_name: Seddon
- first_name: Zeeshan H.
full_name: Amber, Zeeshan H.
last_name: Amber
- first_name: Michael
full_name: Rüsing, Michael
id: '22501'
last_name: Rüsing
orcid: 0000-0003-4682-4577
- first_name: Lukas M.
full_name: Eng, Lukas M.
last_name: Eng
citation:
ama: Roeper M, Seddon SD, Amber ZH, Rüsing M, Eng LM. Depth resolution in piezoresponse
force microscopy. Journal of Applied Physics. 2024;135(22). doi:10.1063/5.0206784
apa: Roeper, M., Seddon, S. D., Amber, Z. H., Rüsing, M., & Eng, L. M. (2024).
Depth resolution in piezoresponse force microscopy. Journal of Applied Physics,
135(22). https://doi.org/10.1063/5.0206784
bibtex: '@article{Roeper_Seddon_Amber_Rüsing_Eng_2024, title={Depth resolution in
piezoresponse force microscopy}, volume={135}, DOI={10.1063/5.0206784},
number={22}, journal={Journal of Applied Physics}, publisher={AIP Publishing},
author={Roeper, Matthias and Seddon, Samuel D. and Amber, Zeeshan H. and Rüsing,
Michael and Eng, Lukas M.}, year={2024} }'
chicago: Roeper, Matthias, Samuel D. Seddon, Zeeshan H. Amber, Michael Rüsing, and
Lukas M. Eng. “Depth Resolution in Piezoresponse Force Microscopy.” Journal
of Applied Physics 135, no. 22 (2024). https://doi.org/10.1063/5.0206784.
ieee: 'M. Roeper, S. D. Seddon, Z. H. Amber, M. Rüsing, and L. M. Eng, “Depth resolution
in piezoresponse force microscopy,” Journal of Applied Physics, vol. 135,
no. 22, 2024, doi: 10.1063/5.0206784.'
mla: Roeper, Matthias, et al. “Depth Resolution in Piezoresponse Force Microscopy.”
Journal of Applied Physics, vol. 135, no. 22, AIP Publishing, 2024, doi:10.1063/5.0206784.
short: M. Roeper, S.D. Seddon, Z.H. Amber, M. Rüsing, L.M. Eng, Journal of Applied
Physics 135 (2024).
date_created: 2024-07-01T21:00:43Z
date_updated: 2025-04-03T12:35:34Z
department:
- _id: '15'
- _id: '169'
- _id: '288'
- _id: '623'
doi: 10.1063/5.0206784
intvolume: ' 135'
issue: '22'
keyword:
- Ferroelectrics
- lithium niobate
- piezoresponse force microscopy
language:
- iso: eng
main_file_link:
- open_access: '1'
url: https://doi.org/10.1063/5.0206784
oa: '1'
publication: Journal of Applied Physics
publication_identifier:
issn:
- 0021-8979
- 1089-7550
publication_status: published
publisher: AIP Publishing
quality_controlled: '1'
status: public
title: Depth resolution in piezoresponse force microscopy
type: journal_article
user_id: '22501'
volume: 135
year: '2024'
...
---
_id: '9744'
abstract:
- lang: eng
text: Direct ultrasound irradiation is advantageous to increase the efficiency of
the hydrothermal method which can be used for the production of piezoelectric
thin films and lead free piezoelectric ceramics. To apply ultrasound directly
to the process transducer prototypes were developed regarding the boundary conditions
of the hydrothermal method. LiNbO$_{3}$ and PIC 181 were proven as feasible materials
for high temperature resistant transducers ($\geq 200^\circ C$). Resistance of
the transducers horn against the corrosive mineralizer was achieved by using Hastelloy
C-22. The efficiency of the ultrasound assisted hydrothermal method depends on
the generated sound field. Impedance and sound field measurements have shown that
the sound field depends on the filling level and the position and design of the
transducer.
author:
- first_name: Peter
full_name: Bornmann, Peter
last_name: Bornmann
- first_name: Tobias
full_name: Hemsel, Tobias
id: '210'
last_name: Hemsel
- first_name: Walter
full_name: Littmann, Walter
last_name: Littmann
- first_name: Ryo
full_name: Ageba, Ryo
last_name: Ageba
- first_name: Yoishi
full_name: Kadota, Yoishi
last_name: Kadota
- first_name: Takeshi
full_name: Morita, Takeshi
last_name: Morita
citation:
ama: Bornmann P, Hemsel T, Littmann W, Ageba R, Kadota Y, Morita T. Ultrasonic Transducer
for the Hydrothermal Method. Journal of Korean Physical Society. 2010;57(4):1122.
doi:10.3938/jkps.57.1122
apa: Bornmann, P., Hemsel, T., Littmann, W., Ageba, R., Kadota, Y., & Morita,
T. (2010). Ultrasonic Transducer for the Hydrothermal Method. Journal of Korean
Physical Society, 57(4), 1122. https://doi.org/10.3938/jkps.57.1122
bibtex: '@article{Bornmann_Hemsel_Littmann_Ageba_Kadota_Morita_2010, title={Ultrasonic
Transducer for the Hydrothermal Method}, volume={57}, DOI={10.3938/jkps.57.1122},
number={4}, journal={Journal of Korean Physical Society}, author={Bornmann, Peter
and Hemsel, Tobias and Littmann, Walter and Ageba, Ryo and Kadota, Yoishi and
Morita, Takeshi}, year={2010}, pages={1122} }'
chicago: 'Bornmann, Peter, Tobias Hemsel, Walter Littmann, Ryo Ageba, Yoishi Kadota,
and Takeshi Morita. “Ultrasonic Transducer for the Hydrothermal Method.” Journal
of Korean Physical Society 57, no. 4 (2010): 1122. https://doi.org/10.3938/jkps.57.1122.'
ieee: P. Bornmann, T. Hemsel, W. Littmann, R. Ageba, Y. Kadota, and T. Morita, “Ultrasonic
Transducer for the Hydrothermal Method,” Journal of Korean Physical Society,
vol. 57, no. 4, p. 1122, 2010.
mla: Bornmann, Peter, et al. “Ultrasonic Transducer for the Hydrothermal Method.”
Journal of Korean Physical Society, vol. 57, no. 4, 2010, p. 1122, doi:10.3938/jkps.57.1122.
short: P. Bornmann, T. Hemsel, W. Littmann, R. Ageba, Y. Kadota, T. Morita, Journal
of Korean Physical Society 57 (2010) 1122.
date_created: 2019-05-13T09:37:56Z
date_updated: 2022-01-06T07:04:19Z
department:
- _id: '151'
doi: 10.3938/jkps.57.1122
intvolume: ' 57'
issue: '4'
keyword:
- High-temperature transducer
- Hydrothermal method
- Lithium-niobate transducer
language:
- iso: eng
page: '1122'
publication: Journal of Korean Physical Society
publication_identifier:
issn:
- 1948-5719
quality_controlled: '1'
status: public
title: Ultrasonic Transducer for the Hydrothermal Method
type: journal_article
user_id: '55222'
volume: 57
year: '2010'
...