@article{39916,
  author       = {{Adams, S. and Hilleringmann, Ulrich and Goser, K.}},
  issn         = {{0167-9317}},
  journal      = {{Microelectronic Engineering}},
  keywords     = {{Electrical and Electronic Engineering, Surfaces, Coatings and Films, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials}},
  number       = {{1-4}},
  pages        = {{191--194}},
  publisher    = {{Elsevier BV}},
  title        = {{{CMOS compatible micromachining by dry silicon-etching techniques}}},
  doi          = {{10.1016/0167-9317(92)90420-v}},
  volume       = {{19}},
  year         = {{2002}},
}

@article{39348,
  author       = {{Horstmann, J.T. and Hilleringmann, Ulrich and Goser, K.F.}},
  issn         = {{0018-9383}},
  journal      = {{IEEE Transactions on Electron Devices}},
  keywords     = {{Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials}},
  number       = {{1}},
  pages        = {{299--306}},
  publisher    = {{Institute of Electrical and Electronics Engineers (IEEE)}},
  title        = {{{Matching analysis of deposition defined 50-nm MOSFET's}}},
  doi          = {{10.1109/16.658845}},
  volume       = {{45}},
  year         = {{2002}},
}

@article{39889,
  author       = {{Mankowski, V. and Hilleringmann, Ulrich and Schumacher, K.}},
  issn         = {{0167-9317}},
  journal      = {{Microelectronic Engineering}},
  keywords     = {{Electrical and Electronic Engineering, Surfaces, Coatings and Films, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials}},
  number       = {{1-4}},
  pages        = {{413--417}},
  publisher    = {{Elsevier BV}},
  title        = {{{12 kV low current cascaded light triggered switch on one silicon chip}}},
  doi          = {{10.1016/s0167-9317(99)00122-7}},
  volume       = {{46}},
  year         = {{2002}},
}

@article{39891,
  author       = {{Horstmann, J.T. and Hilleringmann, Ulrich and Goser, K.F.}},
  issn         = {{0018-9383}},
  journal      = {{IEEE Transactions on Electron Devices}},
  keywords     = {{Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials}},
  number       = {{1}},
  pages        = {{299--306}},
  publisher    = {{Institute of Electrical and Electronics Engineers (IEEE)}},
  title        = {{{Matching analysis of deposition defined 50-nm MOSFET's}}},
  doi          = {{10.1109/16.658845}},
  volume       = {{45}},
  year         = {{2002}},
}

@article{39886,
  author       = {{Wirth, G and Hilleringmann, Ulrich and Horstmann, J.T and Goser, K}},
  issn         = {{0038-1101}},
  journal      = {{Solid-State Electronics}},
  keywords     = {{Materials Chemistry, Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials}},
  number       = {{7}},
  pages        = {{1245--1250}},
  publisher    = {{Elsevier BV}},
  title        = {{{Mesoscopic transport phenomena in ultrashort channel MOSFETs}}},
  doi          = {{10.1016/s0038-1101(99)00060-x}},
  volume       = {{43}},
  year         = {{2002}},
}

@article{39876,
  author       = {{Otterbach, R. and Hilleringmann, Ulrich and Horstmann, T.J. and Goser, K.}},
  issn         = {{0925-9635}},
  journal      = {{Diamond and Related Materials}},
  keywords     = {{Electrical and Electronic Engineering, Materials Chemistry, Mechanical Engineering, General Chemistry, Electronic, Optical and Magnetic Materials}},
  number       = {{3-7}},
  pages        = {{511--514}},
  publisher    = {{Elsevier BV}},
  title        = {{{Structures with a minimum feature size of less than 100 nm in CVD-diamond for sensor applications}}},
  doi          = {{10.1016/s0925-9635(01)00373-9}},
  volume       = {{10}},
  year         = {{2002}},
}

@article{39877,
  author       = {{Hilleringmann, Ulrich and Vieregge, T. and Horstmann, J.T.}},
  issn         = {{0167-9317}},
  journal      = {{Microelectronic Engineering}},
  keywords     = {{Electrical and Electronic Engineering, Surfaces, Coatings and Films, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials}},
  number       = {{1-4}},
  pages        = {{569--572}},
  publisher    = {{Elsevier BV}},
  title        = {{{A structure definition technique for 25 nm lines of silicon and related materials}}},
  doi          = {{10.1016/s0167-9317(00)00380-4}},
  volume       = {{53}},
  year         = {{2002}},
}

@article{39874,
  author       = {{Otterbach, R. and Hilleringmann, Ulrich}},
  issn         = {{0925-9635}},
  journal      = {{Diamond and Related Materials}},
  keywords     = {{Electrical and Electronic Engineering, Materials Chemistry, Mechanical Engineering, General Chemistry, Electronic, Optical and Magnetic Materials}},
  number       = {{3-6}},
  pages        = {{841--844}},
  publisher    = {{Elsevier BV}},
  title        = {{{Reactive ion etching of CVD-diamond for piezoresistive pressure sensors}}},
  doi          = {{10.1016/s0925-9635(01)00703-8}},
  volume       = {{11}},
  year         = {{2002}},
}

@article{45307,
  author       = {{Mahnken, Rolf}},
  issn         = {{0045-7825}},
  journal      = {{Computer Methods in Applied Mechanics and Engineering}},
  keywords     = {{Computer Science Applications, General Physics and Astronomy, Mechanical Engineering, Mechanics of Materials, Computational Mechanics}},
  number       = {{39}},
  pages        = {{5057--5080}},
  publisher    = {{Elsevier BV}},
  title        = {{{Strength difference in compression and tension and pressure dependence of yielding in elasto-plasticity}}},
  doi          = {{10.1016/s0045-7825(00)00364-9}},
  volume       = {{190}},
  year         = {{2002}},
}

@article{45413,
  author       = {{Mahnken, Rolf and Steinmann, P.}},
  issn         = {{0363-9061}},
  journal      = {{International Journal for Numerical and Analytical Methods in Geomechanics}},
  keywords     = {{Mechanics of Materials, Geotechnical Engineering and Engineering Geology, General Materials Science, Computational Mechanics}},
  number       = {{5}},
  pages        = {{415--434}},
  publisher    = {{Wiley}},
  title        = {{{A finite element algorithm for parameter identification of material models for fluid saturated porous media}}},
  doi          = {{10.1002/nag.136}},
  volume       = {{25}},
  year         = {{2002}},
}

@article{45412,
  author       = {{Mahnken, Rolf and Kohlmeier, M.}},
  issn         = {{0045-7825}},
  journal      = {{Computer Methods in Applied Mechanics and Engineering}},
  keywords     = {{Computer Science Applications, General Physics and Astronomy, Mechanical Engineering, Mechanics of Materials, Computational Mechanics}},
  number       = {{32-33}},
  pages        = {{4259--4278}},
  publisher    = {{Elsevier BV}},
  title        = {{{Finite element simulation for rock salt with dilatancy boundary coupled to fluid permeation}}},
  doi          = {{10.1016/s0045-7825(00)00317-0}},
  volume       = {{190}},
  year         = {{2002}},
}

@article{45418,
  author       = {{Mahnken, Rolf and Tikhomirov, D. and Stein, E.}},
  issn         = {{0045-7949}},
  journal      = {{Computers & Structures}},
  keywords     = {{Computer Science Applications, Mechanical Engineering, General Materials Science, Modeling and Simulation, Civil and Structural Engineering}},
  number       = {{2}},
  pages        = {{135--143}},
  publisher    = {{Elsevier BV}},
  title        = {{{Implicit integration scheme and its consistent linearization for an elastoplastic-damage model with application to concrete}}},
  doi          = {{10.1016/s0045-7949(99)00089-9}},
  volume       = {{75}},
  year         = {{2002}},
}

@article{45422,
  author       = {{Mahnken, Rolf}},
  issn         = {{0045-7949}},
  journal      = {{Computers & Structures}},
  keywords     = {{Computer Science Applications, Mechanical Engineering, General Materials Science, Modeling and Simulation, Civil and Structural Engineering}},
  number       = {{2}},
  pages        = {{179--200}},
  publisher    = {{Elsevier BV}},
  title        = {{{A comprehensive study of a multiplicative elastoplasticity model coupled to damage including parameter identification}}},
  doi          = {{10.1016/s0045-7949(98)00296-x}},
  volume       = {{74}},
  year         = {{2002}},
}

@article{45424,
  author       = {{Mahnken, Rolf and Kuhl, Ellen}},
  issn         = {{0997-7538}},
  journal      = {{European Journal of Mechanics - A/Solids}},
  keywords     = {{General Physics and Astronomy, Mechanical Engineering, Mechanics of Materials, General Materials Science}},
  number       = {{5}},
  pages        = {{819--835}},
  publisher    = {{Elsevier BV}},
  title        = {{{Parameter identification of gradient enhanced damage models with the finite element method}}},
  doi          = {{10.1016/s0997-7538(99)00127-8}},
  volume       = {{18}},
  year         = {{2002}},
}

@article{45429,
  author       = {{Mahnken, Rolf and Stein, Erwin}},
  issn         = {{0045-7825}},
  journal      = {{Computer Methods in Applied Mechanics and Engineering}},
  keywords     = {{Computer Science Applications, General Physics and Astronomy, Mechanical Engineering, Mechanics of Materials, Computational Mechanics}},
  number       = {{3-4}},
  pages        = {{225--258}},
  publisher    = {{Elsevier BV}},
  title        = {{{A unified approach for parameter identification of inelastic material models in the frame of the finite element method}}},
  doi          = {{10.1016/0045-7825(96)00991-7}},
  volume       = {{136}},
  year         = {{2002}},
}

@article{45432,
  author       = {{Mahnken, Rolf and Stein, E}},
  issn         = {{0965-0393}},
  journal      = {{Modelling and Simulation in Materials Science and Engineering}},
  keywords     = {{Computer Science Applications, Mechanics of Materials, Condensed Matter Physics, General Materials Science, Modeling and Simulation}},
  number       = {{3A}},
  pages        = {{597--616}},
  publisher    = {{IOP Publishing}},
  title        = {{{The identification of parameters for visco-plastic models via finite-element methods and gradient methods}}},
  doi          = {{10.1088/0965-0393/2/3a/013}},
  volume       = {{2}},
  year         = {{2002}},
}

@article{45430,
  author       = {{Mahnken, Rolf and Stein, Erwin}},
  issn         = {{0749-6419}},
  journal      = {{International Journal of Plasticity}},
  keywords     = {{Mechanical Engineering, Mechanics of Materials, General Materials Science}},
  number       = {{4}},
  pages        = {{451--479}},
  publisher    = {{Elsevier BV}},
  title        = {{{Parameter identification for viscoplastic models based on analytical derivatives of a least-squares functional and stability investigations}}},
  doi          = {{10.1016/s0749-6419(95)00016-x}},
  volume       = {{12}},
  year         = {{2002}},
}

@article{45428,
  author       = {{Mahnken, Rolf and Stein, Erwin}},
  issn         = {{0045-7825}},
  journal      = {{Computer Methods in Applied Mechanics and Engineering}},
  keywords     = {{Computer Science Applications, General Physics and Astronomy, Mechanical Engineering, Mechanics of Materials, Computational Mechanics}},
  number       = {{1-2}},
  pages        = {{17--39}},
  publisher    = {{Elsevier BV}},
  title        = {{{Parameter identification for finite deformation elasto-plasticity in principal directions}}},
  doi          = {{10.1016/s0045-7825(97)00008-x}},
  volume       = {{147}},
  year         = {{2002}},
}

@article{45426,
  author       = {{Mahnken, Rolf}},
  issn         = {{0749-6419}},
  journal      = {{International Journal of Plasticity}},
  keywords     = {{Mechanical Engineering, Mechanics of Materials, General Materials Science}},
  number       = {{11}},
  pages        = {{1111--1137}},
  publisher    = {{Elsevier BV}},
  title        = {{{Aspects on the finite-element implementation of the Gurson model including parameter identification}}},
  doi          = {{10.1016/s0749-6419(99)00029-7}},
  volume       = {{15}},
  year         = {{2002}},
}

@article{35365,
  author       = {{Thiele, Thomas and Berret, J.-F. and Müller, Stefan and Schmidt, Claudia}},
  issn         = {{0148-6055}},
  journal      = {{Journal of Rheology}},
  keywords     = {{Mechanical Engineering, Mechanics of Materials, Condensed Matter Physics, General Materials Science}},
  number       = {{1}},
  pages        = {{29--48}},
  publisher    = {{Society of Rheology}},
  title        = {{{Rheology and nuclear magnetic resonance measurements under shear of sodium dodecyl sulfate/decanol/water nematics}}},
  doi          = {{10.1122/1.1332387}},
  volume       = {{45}},
  year         = {{2001}},
}