---
_id: '39916'
author:
- first_name: S.
  full_name: Adams, S.
  last_name: Adams
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  id: '20179'
  last_name: Hilleringmann
- first_name: K.
  full_name: Goser, K.
  last_name: Goser
citation:
  ama: Adams S, Hilleringmann U, Goser K. CMOS compatible micromachining by dry silicon-etching
    techniques. <i>Microelectronic Engineering</i>. 2002;19(1-4):191-194. doi:<a href="https://doi.org/10.1016/0167-9317(92)90420-v">10.1016/0167-9317(92)90420-v</a>
  apa: Adams, S., Hilleringmann, U., &#38; Goser, K. (2002). CMOS compatible micromachining
    by dry silicon-etching techniques. <i>Microelectronic Engineering</i>, <i>19</i>(1–4),
    191–194. <a href="https://doi.org/10.1016/0167-9317(92)90420-v">https://doi.org/10.1016/0167-9317(92)90420-v</a>
  bibtex: '@article{Adams_Hilleringmann_Goser_2002, title={CMOS compatible micromachining
    by dry silicon-etching techniques}, volume={19}, DOI={<a href="https://doi.org/10.1016/0167-9317(92)90420-v">10.1016/0167-9317(92)90420-v</a>},
    number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV},
    author={Adams, S. and Hilleringmann, Ulrich and Goser, K.}, year={2002}, pages={191–194}
    }'
  chicago: 'Adams, S., Ulrich Hilleringmann, and K. Goser. “CMOS Compatible Micromachining
    by Dry Silicon-Etching Techniques.” <i>Microelectronic Engineering</i> 19, no.
    1–4 (2002): 191–94. <a href="https://doi.org/10.1016/0167-9317(92)90420-v">https://doi.org/10.1016/0167-9317(92)90420-v</a>.'
  ieee: 'S. Adams, U. Hilleringmann, and K. Goser, “CMOS compatible micromachining
    by dry silicon-etching techniques,” <i>Microelectronic Engineering</i>, vol. 19,
    no. 1–4, pp. 191–194, 2002, doi: <a href="https://doi.org/10.1016/0167-9317(92)90420-v">10.1016/0167-9317(92)90420-v</a>.'
  mla: Adams, S., et al. “CMOS Compatible Micromachining by Dry Silicon-Etching Techniques.”
    <i>Microelectronic Engineering</i>, vol. 19, no. 1–4, Elsevier BV, 2002, pp. 191–94,
    doi:<a href="https://doi.org/10.1016/0167-9317(92)90420-v">10.1016/0167-9317(92)90420-v</a>.
  short: S. Adams, U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002)
    191–194.
date_created: 2023-01-25T09:28:16Z
date_updated: 2023-03-21T09:48:55Z
department:
- _id: '59'
doi: 10.1016/0167-9317(92)90420-v
intvolume: '        19'
issue: 1-4
keyword:
- Electrical and Electronic Engineering
- Surfaces
- Coatings and Films
- Condensed Matter Physics
- Atomic and Molecular Physics
- and Optics
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
page: 191-194
publication: Microelectronic Engineering
publication_identifier:
  issn:
  - 0167-9317
publication_status: published
publisher: Elsevier BV
status: public
title: CMOS compatible micromachining by dry silicon-etching techniques
type: journal_article
user_id: '20179'
volume: 19
year: '2002'
...
---
_id: '39348'
author:
- first_name: J.T.
  full_name: Horstmann, J.T.
  last_name: Horstmann
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  id: '20179'
  last_name: Hilleringmann
- first_name: K.F.
  full_name: Goser, K.F.
  last_name: Goser
citation:
  ama: Horstmann JT, Hilleringmann U, Goser KF. Matching analysis of deposition defined
    50-nm MOSFET’s. <i>IEEE Transactions on Electron Devices</i>. 2002;45(1):299-306.
    doi:<a href="https://doi.org/10.1109/16.658845">10.1109/16.658845</a>
  apa: Horstmann, J. T., Hilleringmann, U., &#38; Goser, K. F. (2002). Matching analysis
    of deposition defined 50-nm MOSFET’s. <i>IEEE Transactions on Electron Devices</i>,
    <i>45</i>(1), 299–306. <a href="https://doi.org/10.1109/16.658845">https://doi.org/10.1109/16.658845</a>
  bibtex: '@article{Horstmann_Hilleringmann_Goser_2002, title={Matching analysis of
    deposition defined 50-nm MOSFET’s}, volume={45}, DOI={<a href="https://doi.org/10.1109/16.658845">10.1109/16.658845</a>},
    number={1}, journal={IEEE Transactions on Electron Devices}, publisher={Institute
    of Electrical and Electronics Engineers (IEEE)}, author={Horstmann, J.T. and Hilleringmann,
    Ulrich and Goser, K.F.}, year={2002}, pages={299–306} }'
  chicago: 'Horstmann, J.T., Ulrich Hilleringmann, and K.F. Goser. “Matching Analysis
    of Deposition Defined 50-Nm MOSFET’s.” <i>IEEE Transactions on Electron Devices</i>
    45, no. 1 (2002): 299–306. <a href="https://doi.org/10.1109/16.658845">https://doi.org/10.1109/16.658845</a>.'
  ieee: 'J. T. Horstmann, U. Hilleringmann, and K. F. Goser, “Matching analysis of
    deposition defined 50-nm MOSFET’s,” <i>IEEE Transactions on Electron Devices</i>,
    vol. 45, no. 1, pp. 299–306, 2002, doi: <a href="https://doi.org/10.1109/16.658845">10.1109/16.658845</a>.'
  mla: Horstmann, J. T., et al. “Matching Analysis of Deposition Defined 50-Nm MOSFET’s.”
    <i>IEEE Transactions on Electron Devices</i>, vol. 45, no. 1, Institute of Electrical
    and Electronics Engineers (IEEE), 2002, pp. 299–306, doi:<a href="https://doi.org/10.1109/16.658845">10.1109/16.658845</a>.
  short: J.T. Horstmann, U. Hilleringmann, K.F. Goser, IEEE Transactions on Electron
    Devices 45 (2002) 299–306.
date_created: 2023-01-24T09:23:56Z
date_updated: 2023-03-21T09:45:40Z
department:
- _id: '59'
doi: 10.1109/16.658845
intvolume: '        45'
issue: '1'
keyword:
- Electrical and Electronic Engineering
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
page: 299-306
publication: IEEE Transactions on Electron Devices
publication_identifier:
  issn:
  - 0018-9383
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: Matching analysis of deposition defined 50-nm MOSFET's
type: journal_article
user_id: '20179'
volume: 45
year: '2002'
...
---
_id: '39889'
author:
- first_name: V.
  full_name: Mankowski, V.
  last_name: Mankowski
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  id: '20179'
  last_name: Hilleringmann
- first_name: K.
  full_name: Schumacher, K.
  last_name: Schumacher
citation:
  ama: Mankowski V, Hilleringmann U, Schumacher K. 12 kV low current cascaded light
    triggered switch on one silicon chip. <i>Microelectronic Engineering</i>. 2002;46(1-4):413-417.
    doi:<a href="https://doi.org/10.1016/s0167-9317(99)00122-7">10.1016/s0167-9317(99)00122-7</a>
  apa: Mankowski, V., Hilleringmann, U., &#38; Schumacher, K. (2002). 12 kV low current
    cascaded light triggered switch on one silicon chip. <i>Microelectronic Engineering</i>,
    <i>46</i>(1–4), 413–417. <a href="https://doi.org/10.1016/s0167-9317(99)00122-7">https://doi.org/10.1016/s0167-9317(99)00122-7</a>
  bibtex: '@article{Mankowski_Hilleringmann_Schumacher_2002, title={12 kV low current
    cascaded light triggered switch on one silicon chip}, volume={46}, DOI={<a href="https://doi.org/10.1016/s0167-9317(99)00122-7">10.1016/s0167-9317(99)00122-7</a>},
    number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV},
    author={Mankowski, V. and Hilleringmann, Ulrich and Schumacher, K.}, year={2002},
    pages={413–417} }'
  chicago: 'Mankowski, V., Ulrich Hilleringmann, and K. Schumacher. “12 KV Low Current
    Cascaded Light Triggered Switch on One Silicon Chip.” <i>Microelectronic Engineering</i>
    46, no. 1–4 (2002): 413–17. <a href="https://doi.org/10.1016/s0167-9317(99)00122-7">https://doi.org/10.1016/s0167-9317(99)00122-7</a>.'
  ieee: 'V. Mankowski, U. Hilleringmann, and K. Schumacher, “12 kV low current cascaded
    light triggered switch on one silicon chip,” <i>Microelectronic Engineering</i>,
    vol. 46, no. 1–4, pp. 413–417, 2002, doi: <a href="https://doi.org/10.1016/s0167-9317(99)00122-7">10.1016/s0167-9317(99)00122-7</a>.'
  mla: Mankowski, V., et al. “12 KV Low Current Cascaded Light Triggered Switch on
    One Silicon Chip.” <i>Microelectronic Engineering</i>, vol. 46, no. 1–4, Elsevier
    BV, 2002, pp. 413–17, doi:<a href="https://doi.org/10.1016/s0167-9317(99)00122-7">10.1016/s0167-9317(99)00122-7</a>.
  short: V. Mankowski, U. Hilleringmann, K. Schumacher, Microelectronic Engineering
    46 (2002) 413–417.
date_created: 2023-01-25T09:13:17Z
date_updated: 2023-03-21T09:58:35Z
department:
- _id: '59'
doi: 10.1016/s0167-9317(99)00122-7
intvolume: '        46'
issue: 1-4
keyword:
- Electrical and Electronic Engineering
- Surfaces
- Coatings and Films
- Condensed Matter Physics
- Atomic and Molecular Physics
- and Optics
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
page: 413-417
publication: Microelectronic Engineering
publication_identifier:
  issn:
  - 0167-9317
publication_status: published
publisher: Elsevier BV
status: public
title: 12 kV low current cascaded light triggered switch on one silicon chip
type: journal_article
user_id: '20179'
volume: 46
year: '2002'
...
---
_id: '39891'
author:
- first_name: J.T.
  full_name: Horstmann, J.T.
  last_name: Horstmann
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  id: '20179'
  last_name: Hilleringmann
- first_name: K.F.
  full_name: Goser, K.F.
  last_name: Goser
citation:
  ama: Horstmann JT, Hilleringmann U, Goser KF. Matching analysis of deposition defined
    50-nm MOSFET’s. <i>IEEE Transactions on Electron Devices</i>. 2002;45(1):299-306.
    doi:<a href="https://doi.org/10.1109/16.658845">10.1109/16.658845</a>
  apa: Horstmann, J. T., Hilleringmann, U., &#38; Goser, K. F. (2002). Matching analysis
    of deposition defined 50-nm MOSFET’s. <i>IEEE Transactions on Electron Devices</i>,
    <i>45</i>(1), 299–306. <a href="https://doi.org/10.1109/16.658845">https://doi.org/10.1109/16.658845</a>
  bibtex: '@article{Horstmann_Hilleringmann_Goser_2002, title={Matching analysis of
    deposition defined 50-nm MOSFET’s}, volume={45}, DOI={<a href="https://doi.org/10.1109/16.658845">10.1109/16.658845</a>},
    number={1}, journal={IEEE Transactions on Electron Devices}, publisher={Institute
    of Electrical and Electronics Engineers (IEEE)}, author={Horstmann, J.T. and Hilleringmann,
    Ulrich and Goser, K.F.}, year={2002}, pages={299–306} }'
  chicago: 'Horstmann, J.T., Ulrich Hilleringmann, and K.F. Goser. “Matching Analysis
    of Deposition Defined 50-Nm MOSFET’s.” <i>IEEE Transactions on Electron Devices</i>
    45, no. 1 (2002): 299–306. <a href="https://doi.org/10.1109/16.658845">https://doi.org/10.1109/16.658845</a>.'
  ieee: 'J. T. Horstmann, U. Hilleringmann, and K. F. Goser, “Matching analysis of
    deposition defined 50-nm MOSFET’s,” <i>IEEE Transactions on Electron Devices</i>,
    vol. 45, no. 1, pp. 299–306, 2002, doi: <a href="https://doi.org/10.1109/16.658845">10.1109/16.658845</a>.'
  mla: Horstmann, J. T., et al. “Matching Analysis of Deposition Defined 50-Nm MOSFET’s.”
    <i>IEEE Transactions on Electron Devices</i>, vol. 45, no. 1, Institute of Electrical
    and Electronics Engineers (IEEE), 2002, pp. 299–306, doi:<a href="https://doi.org/10.1109/16.658845">10.1109/16.658845</a>.
  short: J.T. Horstmann, U. Hilleringmann, K.F. Goser, IEEE Transactions on Electron
    Devices 45 (2002) 299–306.
date_created: 2023-01-25T09:14:43Z
date_updated: 2023-03-21T09:58:01Z
department:
- _id: '59'
doi: 10.1109/16.658845
intvolume: '        45'
issue: '1'
keyword:
- Electrical and Electronic Engineering
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
page: 299-306
publication: IEEE Transactions on Electron Devices
publication_identifier:
  issn:
  - 0018-9383
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: Matching analysis of deposition defined 50-nm MOSFET's
type: journal_article
user_id: '20179'
volume: 45
year: '2002'
...
---
_id: '39886'
author:
- first_name: G
  full_name: Wirth, G
  last_name: Wirth
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  id: '20179'
  last_name: Hilleringmann
- first_name: J.T
  full_name: Horstmann, J.T
  last_name: Horstmann
- first_name: K
  full_name: Goser, K
  last_name: Goser
citation:
  ama: Wirth G, Hilleringmann U, Horstmann JT, Goser K. Mesoscopic transport phenomena
    in ultrashort channel MOSFETs. <i>Solid-State Electronics</i>. 2002;43(7):1245-1250.
    doi:<a href="https://doi.org/10.1016/s0038-1101(99)00060-x">10.1016/s0038-1101(99)00060-x</a>
  apa: Wirth, G., Hilleringmann, U., Horstmann, J. T., &#38; Goser, K. (2002). Mesoscopic
    transport phenomena in ultrashort channel MOSFETs. <i>Solid-State Electronics</i>,
    <i>43</i>(7), 1245–1250. <a href="https://doi.org/10.1016/s0038-1101(99)00060-x">https://doi.org/10.1016/s0038-1101(99)00060-x</a>
  bibtex: '@article{Wirth_Hilleringmann_Horstmann_Goser_2002, title={Mesoscopic transport
    phenomena in ultrashort channel MOSFETs}, volume={43}, DOI={<a href="https://doi.org/10.1016/s0038-1101(99)00060-x">10.1016/s0038-1101(99)00060-x</a>},
    number={7}, journal={Solid-State Electronics}, publisher={Elsevier BV}, author={Wirth,
    G and Hilleringmann, Ulrich and Horstmann, J.T and Goser, K}, year={2002}, pages={1245–1250}
    }'
  chicago: 'Wirth, G, Ulrich Hilleringmann, J.T Horstmann, and K Goser. “Mesoscopic
    Transport Phenomena in Ultrashort Channel MOSFETs.” <i>Solid-State Electronics</i>
    43, no. 7 (2002): 1245–50. <a href="https://doi.org/10.1016/s0038-1101(99)00060-x">https://doi.org/10.1016/s0038-1101(99)00060-x</a>.'
  ieee: 'G. Wirth, U. Hilleringmann, J. T. Horstmann, and K. Goser, “Mesoscopic transport
    phenomena in ultrashort channel MOSFETs,” <i>Solid-State Electronics</i>, vol.
    43, no. 7, pp. 1245–1250, 2002, doi: <a href="https://doi.org/10.1016/s0038-1101(99)00060-x">10.1016/s0038-1101(99)00060-x</a>.'
  mla: Wirth, G., et al. “Mesoscopic Transport Phenomena in Ultrashort Channel MOSFETs.”
    <i>Solid-State Electronics</i>, vol. 43, no. 7, Elsevier BV, 2002, pp. 1245–50,
    doi:<a href="https://doi.org/10.1016/s0038-1101(99)00060-x">10.1016/s0038-1101(99)00060-x</a>.
  short: G. Wirth, U. Hilleringmann, J.T. Horstmann, K. Goser, Solid-State Electronics
    43 (2002) 1245–1250.
date_created: 2023-01-25T09:11:50Z
date_updated: 2023-03-21T09:59:22Z
department:
- _id: '59'
doi: 10.1016/s0038-1101(99)00060-x
intvolume: '        43'
issue: '7'
keyword:
- Materials Chemistry
- Electrical and Electronic Engineering
- Condensed Matter Physics
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
page: 1245-1250
publication: Solid-State Electronics
publication_identifier:
  issn:
  - 0038-1101
publication_status: published
publisher: Elsevier BV
status: public
title: Mesoscopic transport phenomena in ultrashort channel MOSFETs
type: journal_article
user_id: '20179'
volume: 43
year: '2002'
...
---
_id: '39876'
author:
- first_name: R.
  full_name: Otterbach, R.
  last_name: Otterbach
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  id: '20179'
  last_name: Hilleringmann
- first_name: T.J.
  full_name: Horstmann, T.J.
  last_name: Horstmann
- first_name: K.
  full_name: Goser, K.
  last_name: Goser
citation:
  ama: Otterbach R, Hilleringmann U, Horstmann TJ, Goser K. Structures with a minimum
    feature size of less than 100 nm in CVD-diamond for sensor applications. <i>Diamond
    and Related Materials</i>. 2002;10(3-7):511-514. doi:<a href="https://doi.org/10.1016/s0925-9635(01)00373-9">10.1016/s0925-9635(01)00373-9</a>
  apa: Otterbach, R., Hilleringmann, U., Horstmann, T. J., &#38; Goser, K. (2002).
    Structures with a minimum feature size of less than 100 nm in CVD-diamond for
    sensor applications. <i>Diamond and Related Materials</i>, <i>10</i>(3–7), 511–514.
    <a href="https://doi.org/10.1016/s0925-9635(01)00373-9">https://doi.org/10.1016/s0925-9635(01)00373-9</a>
  bibtex: '@article{Otterbach_Hilleringmann_Horstmann_Goser_2002, title={Structures
    with a minimum feature size of less than 100 nm in CVD-diamond for sensor applications},
    volume={10}, DOI={<a href="https://doi.org/10.1016/s0925-9635(01)00373-9">10.1016/s0925-9635(01)00373-9</a>},
    number={3–7}, journal={Diamond and Related Materials}, publisher={Elsevier BV},
    author={Otterbach, R. and Hilleringmann, Ulrich and Horstmann, T.J. and Goser,
    K.}, year={2002}, pages={511–514} }'
  chicago: 'Otterbach, R., Ulrich Hilleringmann, T.J. Horstmann, and K. Goser. “Structures
    with a Minimum Feature Size of Less than 100 Nm in CVD-Diamond for Sensor Applications.”
    <i>Diamond and Related Materials</i> 10, no. 3–7 (2002): 511–14. <a href="https://doi.org/10.1016/s0925-9635(01)00373-9">https://doi.org/10.1016/s0925-9635(01)00373-9</a>.'
  ieee: 'R. Otterbach, U. Hilleringmann, T. J. Horstmann, and K. Goser, “Structures
    with a minimum feature size of less than 100 nm in CVD-diamond for sensor applications,”
    <i>Diamond and Related Materials</i>, vol. 10, no. 3–7, pp. 511–514, 2002, doi:
    <a href="https://doi.org/10.1016/s0925-9635(01)00373-9">10.1016/s0925-9635(01)00373-9</a>.'
  mla: Otterbach, R., et al. “Structures with a Minimum Feature Size of Less than
    100 Nm in CVD-Diamond for Sensor Applications.” <i>Diamond and Related Materials</i>,
    vol. 10, no. 3–7, Elsevier BV, 2002, pp. 511–14, doi:<a href="https://doi.org/10.1016/s0925-9635(01)00373-9">10.1016/s0925-9635(01)00373-9</a>.
  short: R. Otterbach, U. Hilleringmann, T.J. Horstmann, K. Goser, Diamond and Related
    Materials 10 (2002) 511–514.
date_created: 2023-01-25T09:07:37Z
date_updated: 2023-03-21T10:03:16Z
department:
- _id: '59'
doi: 10.1016/s0925-9635(01)00373-9
intvolume: '        10'
issue: 3-7
keyword:
- Electrical and Electronic Engineering
- Materials Chemistry
- Mechanical Engineering
- General Chemistry
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
page: 511-514
publication: Diamond and Related Materials
publication_identifier:
  issn:
  - 0925-9635
publication_status: published
publisher: Elsevier BV
status: public
title: Structures with a minimum feature size of less than 100 nm in CVD-diamond for
  sensor applications
type: journal_article
user_id: '20179'
volume: 10
year: '2002'
...
---
_id: '39877'
author:
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  id: '20179'
  last_name: Hilleringmann
- first_name: T.
  full_name: Vieregge, T.
  last_name: Vieregge
- first_name: J.T.
  full_name: Horstmann, J.T.
  last_name: Horstmann
citation:
  ama: Hilleringmann U, Vieregge T, Horstmann JT. A structure definition technique
    for 25 nm lines of silicon and related materials. <i>Microelectronic Engineering</i>.
    2002;53(1-4):569-572. doi:<a href="https://doi.org/10.1016/s0167-9317(00)00380-4">10.1016/s0167-9317(00)00380-4</a>
  apa: Hilleringmann, U., Vieregge, T., &#38; Horstmann, J. T. (2002). A structure
    definition technique for 25 nm lines of silicon and related materials. <i>Microelectronic
    Engineering</i>, <i>53</i>(1–4), 569–572. <a href="https://doi.org/10.1016/s0167-9317(00)00380-4">https://doi.org/10.1016/s0167-9317(00)00380-4</a>
  bibtex: '@article{Hilleringmann_Vieregge_Horstmann_2002, title={A structure definition
    technique for 25 nm lines of silicon and related materials}, volume={53}, DOI={<a
    href="https://doi.org/10.1016/s0167-9317(00)00380-4">10.1016/s0167-9317(00)00380-4</a>},
    number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV},
    author={Hilleringmann, Ulrich and Vieregge, T. and Horstmann, J.T.}, year={2002},
    pages={569–572} }'
  chicago: 'Hilleringmann, Ulrich, T. Vieregge, and J.T. Horstmann. “A Structure Definition
    Technique for 25 Nm Lines of Silicon and Related Materials.” <i>Microelectronic
    Engineering</i> 53, no. 1–4 (2002): 569–72. <a href="https://doi.org/10.1016/s0167-9317(00)00380-4">https://doi.org/10.1016/s0167-9317(00)00380-4</a>.'
  ieee: 'U. Hilleringmann, T. Vieregge, and J. T. Horstmann, “A structure definition
    technique for 25 nm lines of silicon and related materials,” <i>Microelectronic
    Engineering</i>, vol. 53, no. 1–4, pp. 569–572, 2002, doi: <a href="https://doi.org/10.1016/s0167-9317(00)00380-4">10.1016/s0167-9317(00)00380-4</a>.'
  mla: Hilleringmann, Ulrich, et al. “A Structure Definition Technique for 25 Nm Lines
    of Silicon and Related Materials.” <i>Microelectronic Engineering</i>, vol. 53,
    no. 1–4, Elsevier BV, 2002, pp. 569–72, doi:<a href="https://doi.org/10.1016/s0167-9317(00)00380-4">10.1016/s0167-9317(00)00380-4</a>.
  short: U. Hilleringmann, T. Vieregge, J.T. Horstmann, Microelectronic Engineering
    53 (2002) 569–572.
date_created: 2023-01-25T09:08:13Z
date_updated: 2023-03-21T10:03:00Z
department:
- _id: '59'
doi: 10.1016/s0167-9317(00)00380-4
intvolume: '        53'
issue: 1-4
keyword:
- Electrical and Electronic Engineering
- Surfaces
- Coatings and Films
- Condensed Matter Physics
- Atomic and Molecular Physics
- and Optics
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
page: 569-572
publication: Microelectronic Engineering
publication_identifier:
  issn:
  - 0167-9317
publication_status: published
publisher: Elsevier BV
status: public
title: A structure definition technique for 25 nm lines of silicon and related materials
type: journal_article
user_id: '20179'
volume: 53
year: '2002'
...
---
_id: '39874'
author:
- first_name: R.
  full_name: Otterbach, R.
  last_name: Otterbach
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  id: '20179'
  last_name: Hilleringmann
citation:
  ama: Otterbach R, Hilleringmann U. Reactive ion etching of CVD-diamond for piezoresistive
    pressure sensors. <i>Diamond and Related Materials</i>. 2002;11(3-6):841-844.
    doi:<a href="https://doi.org/10.1016/s0925-9635(01)00703-8">10.1016/s0925-9635(01)00703-8</a>
  apa: Otterbach, R., &#38; Hilleringmann, U. (2002). Reactive ion etching of CVD-diamond
    for piezoresistive pressure sensors. <i>Diamond and Related Materials</i>, <i>11</i>(3–6),
    841–844. <a href="https://doi.org/10.1016/s0925-9635(01)00703-8">https://doi.org/10.1016/s0925-9635(01)00703-8</a>
  bibtex: '@article{Otterbach_Hilleringmann_2002, title={Reactive ion etching of CVD-diamond
    for piezoresistive pressure sensors}, volume={11}, DOI={<a href="https://doi.org/10.1016/s0925-9635(01)00703-8">10.1016/s0925-9635(01)00703-8</a>},
    number={3–6}, journal={Diamond and Related Materials}, publisher={Elsevier BV},
    author={Otterbach, R. and Hilleringmann, Ulrich}, year={2002}, pages={841–844}
    }'
  chicago: 'Otterbach, R., and Ulrich Hilleringmann. “Reactive Ion Etching of CVD-Diamond
    for Piezoresistive Pressure Sensors.” <i>Diamond and Related Materials</i> 11,
    no. 3–6 (2002): 841–44. <a href="https://doi.org/10.1016/s0925-9635(01)00703-8">https://doi.org/10.1016/s0925-9635(01)00703-8</a>.'
  ieee: 'R. Otterbach and U. Hilleringmann, “Reactive ion etching of CVD-diamond for
    piezoresistive pressure sensors,” <i>Diamond and Related Materials</i>, vol. 11,
    no. 3–6, pp. 841–844, 2002, doi: <a href="https://doi.org/10.1016/s0925-9635(01)00703-8">10.1016/s0925-9635(01)00703-8</a>.'
  mla: Otterbach, R., and Ulrich Hilleringmann. “Reactive Ion Etching of CVD-Diamond
    for Piezoresistive Pressure Sensors.” <i>Diamond and Related Materials</i>, vol.
    11, no. 3–6, Elsevier BV, 2002, pp. 841–44, doi:<a href="https://doi.org/10.1016/s0925-9635(01)00703-8">10.1016/s0925-9635(01)00703-8</a>.
  short: R. Otterbach, U. Hilleringmann, Diamond and Related Materials 11 (2002) 841–844.
date_created: 2023-01-25T09:05:52Z
date_updated: 2023-03-21T10:03:48Z
department:
- _id: '59'
doi: 10.1016/s0925-9635(01)00703-8
intvolume: '        11'
issue: 3-6
keyword:
- Electrical and Electronic Engineering
- Materials Chemistry
- Mechanical Engineering
- General Chemistry
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
page: 841-844
publication: Diamond and Related Materials
publication_identifier:
  issn:
  - 0925-9635
publication_status: published
publisher: Elsevier BV
status: public
title: Reactive ion etching of CVD-diamond for piezoresistive pressure sensors
type: journal_article
user_id: '20179'
volume: 11
year: '2002'
...
---
_id: '45307'
author:
- first_name: Rolf
  full_name: Mahnken, Rolf
  id: '335'
  last_name: Mahnken
citation:
  ama: Mahnken R. Strength difference in compression and tension and pressure dependence
    of yielding in elasto-plasticity. <i>Computer Methods in Applied Mechanics and
    Engineering</i>. 2002;190(39):5057-5080. doi:<a href="https://doi.org/10.1016/s0045-7825(00)00364-9">10.1016/s0045-7825(00)00364-9</a>
  apa: Mahnken, R. (2002). Strength difference in compression and tension and pressure
    dependence of yielding in elasto-plasticity. <i>Computer Methods in Applied Mechanics
    and Engineering</i>, <i>190</i>(39), 5057–5080. <a href="https://doi.org/10.1016/s0045-7825(00)00364-9">https://doi.org/10.1016/s0045-7825(00)00364-9</a>
  bibtex: '@article{Mahnken_2002, title={Strength difference in compression and tension
    and pressure dependence of yielding in elasto-plasticity}, volume={190}, DOI={<a
    href="https://doi.org/10.1016/s0045-7825(00)00364-9">10.1016/s0045-7825(00)00364-9</a>},
    number={39}, journal={Computer Methods in Applied Mechanics and Engineering},
    publisher={Elsevier BV}, author={Mahnken, Rolf}, year={2002}, pages={5057–5080}
    }'
  chicago: 'Mahnken, Rolf. “Strength Difference in Compression and Tension and Pressure
    Dependence of Yielding in Elasto-Plasticity.” <i>Computer Methods in Applied Mechanics
    and Engineering</i> 190, no. 39 (2002): 5057–80. <a href="https://doi.org/10.1016/s0045-7825(00)00364-9">https://doi.org/10.1016/s0045-7825(00)00364-9</a>.'
  ieee: 'R. Mahnken, “Strength difference in compression and tension and pressure
    dependence of yielding in elasto-plasticity,” <i>Computer Methods in Applied Mechanics
    and Engineering</i>, vol. 190, no. 39, pp. 5057–5080, 2002, doi: <a href="https://doi.org/10.1016/s0045-7825(00)00364-9">10.1016/s0045-7825(00)00364-9</a>.'
  mla: Mahnken, Rolf. “Strength Difference in Compression and Tension and Pressure
    Dependence of Yielding in Elasto-Plasticity.” <i>Computer Methods in Applied Mechanics
    and Engineering</i>, vol. 190, no. 39, Elsevier BV, 2002, pp. 5057–80, doi:<a
    href="https://doi.org/10.1016/s0045-7825(00)00364-9">10.1016/s0045-7825(00)00364-9</a>.
  short: R. Mahnken, Computer Methods in Applied Mechanics and Engineering 190 (2002)
    5057–5080.
date_created: 2023-05-26T12:21:04Z
date_updated: 2023-05-26T12:22:12Z
department:
- _id: '9'
- _id: '154'
doi: 10.1016/s0045-7825(00)00364-9
intvolume: '       190'
issue: '39'
keyword:
- Computer Science Applications
- General Physics and Astronomy
- Mechanical Engineering
- Mechanics of Materials
- Computational Mechanics
language:
- iso: eng
page: 5057-5080
publication: Computer Methods in Applied Mechanics and Engineering
publication_identifier:
  issn:
  - 0045-7825
publication_status: published
publisher: Elsevier BV
quality_controlled: '1'
status: public
title: Strength difference in compression and tension and pressure dependence of yielding
  in elasto-plasticity
type: journal_article
user_id: '335'
volume: 190
year: '2002'
...
---
_id: '45413'
author:
- first_name: Rolf
  full_name: Mahnken, Rolf
  id: '335'
  last_name: Mahnken
- first_name: P.
  full_name: Steinmann, P.
  last_name: Steinmann
citation:
  ama: Mahnken R, Steinmann P. A finite element algorithm for parameter identification
    of material models for fluid saturated porous media. <i>International Journal
    for Numerical and Analytical Methods in Geomechanics</i>. 2002;25(5):415-434.
    doi:<a href="https://doi.org/10.1002/nag.136">10.1002/nag.136</a>
  apa: Mahnken, R., &#38; Steinmann, P. (2002). A finite element algorithm for parameter
    identification of material models for fluid saturated porous media. <i>International
    Journal for Numerical and Analytical Methods in Geomechanics</i>, <i>25</i>(5),
    415–434. <a href="https://doi.org/10.1002/nag.136">https://doi.org/10.1002/nag.136</a>
  bibtex: '@article{Mahnken_Steinmann_2002, title={A finite element algorithm for
    parameter identification of material models for fluid saturated porous media},
    volume={25}, DOI={<a href="https://doi.org/10.1002/nag.136">10.1002/nag.136</a>},
    number={5}, journal={International Journal for Numerical and Analytical Methods
    in Geomechanics}, publisher={Wiley}, author={Mahnken, Rolf and Steinmann, P.},
    year={2002}, pages={415–434} }'
  chicago: 'Mahnken, Rolf, and P. Steinmann. “A Finite Element Algorithm for Parameter
    Identification of Material Models for Fluid Saturated Porous Media.” <i>International
    Journal for Numerical and Analytical Methods in Geomechanics</i> 25, no. 5 (2002):
    415–34. <a href="https://doi.org/10.1002/nag.136">https://doi.org/10.1002/nag.136</a>.'
  ieee: 'R. Mahnken and P. Steinmann, “A finite element algorithm for parameter identification
    of material models for fluid saturated porous media,” <i>International Journal
    for Numerical and Analytical Methods in Geomechanics</i>, vol. 25, no. 5, pp.
    415–434, 2002, doi: <a href="https://doi.org/10.1002/nag.136">10.1002/nag.136</a>.'
  mla: Mahnken, Rolf, and P. Steinmann. “A Finite Element Algorithm for Parameter
    Identification of Material Models for Fluid Saturated Porous Media.” <i>International
    Journal for Numerical and Analytical Methods in Geomechanics</i>, vol. 25, no.
    5, Wiley, 2002, pp. 415–34, doi:<a href="https://doi.org/10.1002/nag.136">10.1002/nag.136</a>.
  short: R. Mahnken, P. Steinmann, International Journal for Numerical and Analytical
    Methods in Geomechanics 25 (2002) 415–434.
date_created: 2023-05-31T11:55:35Z
date_updated: 2023-05-31T11:55:54Z
department:
- _id: '9'
- _id: '154'
doi: 10.1002/nag.136
intvolume: '        25'
issue: '5'
keyword:
- Mechanics of Materials
- Geotechnical Engineering and Engineering Geology
- General Materials Science
- Computational Mechanics
language:
- iso: eng
page: 415-434
publication: International Journal for Numerical and Analytical Methods in Geomechanics
publication_identifier:
  issn:
  - 0363-9061
  - 1096-9853
publication_status: published
publisher: Wiley
quality_controlled: '1'
status: public
title: A finite element algorithm for parameter identification of material models
  for fluid saturated porous media
type: journal_article
user_id: '335'
volume: 25
year: '2002'
...
---
_id: '45412'
author:
- first_name: Rolf
  full_name: Mahnken, Rolf
  id: '335'
  last_name: Mahnken
- first_name: M.
  full_name: Kohlmeier, M.
  last_name: Kohlmeier
citation:
  ama: Mahnken R, Kohlmeier M. Finite element simulation for rock salt with dilatancy
    boundary coupled to fluid permeation. <i>Computer Methods in Applied Mechanics
    and Engineering</i>. 2002;190(32-33):4259-4278. doi:<a href="https://doi.org/10.1016/s0045-7825(00)00317-0">10.1016/s0045-7825(00)00317-0</a>
  apa: Mahnken, R., &#38; Kohlmeier, M. (2002). Finite element simulation for rock
    salt with dilatancy boundary coupled to fluid permeation. <i>Computer Methods
    in Applied Mechanics and Engineering</i>, <i>190</i>(32–33), 4259–4278. <a href="https://doi.org/10.1016/s0045-7825(00)00317-0">https://doi.org/10.1016/s0045-7825(00)00317-0</a>
  bibtex: '@article{Mahnken_Kohlmeier_2002, title={Finite element simulation for rock
    salt with dilatancy boundary coupled to fluid permeation}, volume={190}, DOI={<a
    href="https://doi.org/10.1016/s0045-7825(00)00317-0">10.1016/s0045-7825(00)00317-0</a>},
    number={32–33}, journal={Computer Methods in Applied Mechanics and Engineering},
    publisher={Elsevier BV}, author={Mahnken, Rolf and Kohlmeier, M.}, year={2002},
    pages={4259–4278} }'
  chicago: 'Mahnken, Rolf, and M. Kohlmeier. “Finite Element Simulation for Rock Salt
    with Dilatancy Boundary Coupled to Fluid Permeation.” <i>Computer Methods in Applied
    Mechanics and Engineering</i> 190, no. 32–33 (2002): 4259–78. <a href="https://doi.org/10.1016/s0045-7825(00)00317-0">https://doi.org/10.1016/s0045-7825(00)00317-0</a>.'
  ieee: 'R. Mahnken and M. Kohlmeier, “Finite element simulation for rock salt with
    dilatancy boundary coupled to fluid permeation,” <i>Computer Methods in Applied
    Mechanics and Engineering</i>, vol. 190, no. 32–33, pp. 4259–4278, 2002, doi:
    <a href="https://doi.org/10.1016/s0045-7825(00)00317-0">10.1016/s0045-7825(00)00317-0</a>.'
  mla: Mahnken, Rolf, and M. Kohlmeier. “Finite Element Simulation for Rock Salt with
    Dilatancy Boundary Coupled to Fluid Permeation.” <i>Computer Methods in Applied
    Mechanics and Engineering</i>, vol. 190, no. 32–33, Elsevier BV, 2002, pp. 4259–78,
    doi:<a href="https://doi.org/10.1016/s0045-7825(00)00317-0">10.1016/s0045-7825(00)00317-0</a>.
  short: R. Mahnken, M. Kohlmeier, Computer Methods in Applied Mechanics and Engineering
    190 (2002) 4259–4278.
date_created: 2023-05-31T11:52:51Z
date_updated: 2023-05-31T11:53:38Z
department:
- _id: '9'
- _id: '154'
doi: 10.1016/s0045-7825(00)00317-0
intvolume: '       190'
issue: 32-33
keyword:
- Computer Science Applications
- General Physics and Astronomy
- Mechanical Engineering
- Mechanics of Materials
- Computational Mechanics
language:
- iso: eng
page: 4259-4278
publication: Computer Methods in Applied Mechanics and Engineering
publication_identifier:
  issn:
  - 0045-7825
publication_status: published
publisher: Elsevier BV
quality_controlled: '1'
status: public
title: Finite element simulation for rock salt with dilatancy boundary coupled to
  fluid permeation
type: journal_article
user_id: '335'
volume: 190
year: '2002'
...
---
_id: '45418'
author:
- first_name: Rolf
  full_name: Mahnken, Rolf
  id: '335'
  last_name: Mahnken
- first_name: D.
  full_name: Tikhomirov, D.
  last_name: Tikhomirov
- first_name: E.
  full_name: Stein, E.
  last_name: Stein
citation:
  ama: Mahnken R, Tikhomirov D, Stein E. Implicit integration scheme and its consistent
    linearization for an elastoplastic-damage model with application to concrete.
    <i>Computers &#38;amp; Structures</i>. 2002;75(2):135-143. doi:<a href="https://doi.org/10.1016/s0045-7949(99)00089-9">10.1016/s0045-7949(99)00089-9</a>
  apa: Mahnken, R., Tikhomirov, D., &#38; Stein, E. (2002). Implicit integration scheme
    and its consistent linearization for an elastoplastic-damage model with application
    to concrete. <i>Computers &#38;amp; Structures</i>, <i>75</i>(2), 135–143. <a
    href="https://doi.org/10.1016/s0045-7949(99)00089-9">https://doi.org/10.1016/s0045-7949(99)00089-9</a>
  bibtex: '@article{Mahnken_Tikhomirov_Stein_2002, title={Implicit integration scheme
    and its consistent linearization for an elastoplastic-damage model with application
    to concrete}, volume={75}, DOI={<a href="https://doi.org/10.1016/s0045-7949(99)00089-9">10.1016/s0045-7949(99)00089-9</a>},
    number={2}, journal={Computers &#38;amp; Structures}, publisher={Elsevier BV},
    author={Mahnken, Rolf and Tikhomirov, D. and Stein, E.}, year={2002}, pages={135–143}
    }'
  chicago: 'Mahnken, Rolf, D. Tikhomirov, and E. Stein. “Implicit Integration Scheme
    and Its Consistent Linearization for an Elastoplastic-Damage Model with Application
    to Concrete.” <i>Computers &#38;amp; Structures</i> 75, no. 2 (2002): 135–43.
    <a href="https://doi.org/10.1016/s0045-7949(99)00089-9">https://doi.org/10.1016/s0045-7949(99)00089-9</a>.'
  ieee: 'R. Mahnken, D. Tikhomirov, and E. Stein, “Implicit integration scheme and
    its consistent linearization for an elastoplastic-damage model with application
    to concrete,” <i>Computers &#38;amp; Structures</i>, vol. 75, no. 2, pp. 135–143,
    2002, doi: <a href="https://doi.org/10.1016/s0045-7949(99)00089-9">10.1016/s0045-7949(99)00089-9</a>.'
  mla: Mahnken, Rolf, et al. “Implicit Integration Scheme and Its Consistent Linearization
    for an Elastoplastic-Damage Model with Application to Concrete.” <i>Computers
    &#38;amp; Structures</i>, vol. 75, no. 2, Elsevier BV, 2002, pp. 135–43, doi:<a
    href="https://doi.org/10.1016/s0045-7949(99)00089-9">10.1016/s0045-7949(99)00089-9</a>.
  short: R. Mahnken, D. Tikhomirov, E. Stein, Computers &#38;amp; Structures 75 (2002)
    135–143.
date_created: 2023-05-31T12:05:43Z
date_updated: 2023-05-31T12:06:27Z
department:
- _id: '9'
- _id: '154'
doi: 10.1016/s0045-7949(99)00089-9
intvolume: '        75'
issue: '2'
keyword:
- Computer Science Applications
- Mechanical Engineering
- General Materials Science
- Modeling and Simulation
- Civil and Structural Engineering
language:
- iso: eng
page: 135-143
publication: Computers &amp; Structures
publication_identifier:
  issn:
  - 0045-7949
publication_status: published
publisher: Elsevier BV
quality_controlled: '1'
status: public
title: Implicit integration scheme and its consistent linearization for an elastoplastic-damage
  model with application to concrete
type: journal_article
user_id: '335'
volume: 75
year: '2002'
...
---
_id: '45422'
author:
- first_name: Rolf
  full_name: Mahnken, Rolf
  id: '335'
  last_name: Mahnken
citation:
  ama: Mahnken R. A comprehensive study of a multiplicative elastoplasticity model
    coupled to damage including parameter identification. <i>Computers &#38;amp; Structures</i>.
    2002;74(2):179-200. doi:<a href="https://doi.org/10.1016/s0045-7949(98)00296-x">10.1016/s0045-7949(98)00296-x</a>
  apa: Mahnken, R. (2002). A comprehensive study of a multiplicative elastoplasticity
    model coupled to damage including parameter identification. <i>Computers &#38;amp;
    Structures</i>, <i>74</i>(2), 179–200. <a href="https://doi.org/10.1016/s0045-7949(98)00296-x">https://doi.org/10.1016/s0045-7949(98)00296-x</a>
  bibtex: '@article{Mahnken_2002, title={A comprehensive study of a multiplicative
    elastoplasticity model coupled to damage including parameter identification},
    volume={74}, DOI={<a href="https://doi.org/10.1016/s0045-7949(98)00296-x">10.1016/s0045-7949(98)00296-x</a>},
    number={2}, journal={Computers &#38;amp; Structures}, publisher={Elsevier BV},
    author={Mahnken, Rolf}, year={2002}, pages={179–200} }'
  chicago: 'Mahnken, Rolf. “A Comprehensive Study of a Multiplicative Elastoplasticity
    Model Coupled to Damage Including Parameter Identification.” <i>Computers &#38;amp;
    Structures</i> 74, no. 2 (2002): 179–200. <a href="https://doi.org/10.1016/s0045-7949(98)00296-x">https://doi.org/10.1016/s0045-7949(98)00296-x</a>.'
  ieee: 'R. Mahnken, “A comprehensive study of a multiplicative elastoplasticity model
    coupled to damage including parameter identification,” <i>Computers &#38;amp;
    Structures</i>, vol. 74, no. 2, pp. 179–200, 2002, doi: <a href="https://doi.org/10.1016/s0045-7949(98)00296-x">10.1016/s0045-7949(98)00296-x</a>.'
  mla: Mahnken, Rolf. “A Comprehensive Study of a Multiplicative Elastoplasticity
    Model Coupled to Damage Including Parameter Identification.” <i>Computers &#38;amp;
    Structures</i>, vol. 74, no. 2, Elsevier BV, 2002, pp. 179–200, doi:<a href="https://doi.org/10.1016/s0045-7949(98)00296-x">10.1016/s0045-7949(98)00296-x</a>.
  short: R. Mahnken, Computers &#38;amp; Structures 74 (2002) 179–200.
date_created: 2023-05-31T12:13:28Z
date_updated: 2023-05-31T12:13:59Z
department:
- _id: '9'
- _id: '154'
doi: 10.1016/s0045-7949(98)00296-x
intvolume: '        74'
issue: '2'
keyword:
- Computer Science Applications
- Mechanical Engineering
- General Materials Science
- Modeling and Simulation
- Civil and Structural Engineering
language:
- iso: eng
page: 179-200
publication: Computers &amp; Structures
publication_identifier:
  issn:
  - 0045-7949
publication_status: published
publisher: Elsevier BV
quality_controlled: '1'
status: public
title: A comprehensive study of a multiplicative elastoplasticity model coupled to
  damage including parameter identification
type: journal_article
user_id: '335'
volume: 74
year: '2002'
...
---
_id: '45424'
author:
- first_name: Rolf
  full_name: Mahnken, Rolf
  id: '335'
  last_name: Mahnken
- first_name: Ellen
  full_name: Kuhl, Ellen
  last_name: Kuhl
citation:
  ama: Mahnken R, Kuhl E. Parameter identification of gradient enhanced damage models
    with the finite element method. <i>European Journal of Mechanics - A/Solids</i>.
    2002;18(5):819-835. doi:<a href="https://doi.org/10.1016/s0997-7538(99)00127-8">10.1016/s0997-7538(99)00127-8</a>
  apa: Mahnken, R., &#38; Kuhl, E. (2002). Parameter identification of gradient enhanced
    damage models with the finite element method. <i>European Journal of Mechanics
    - A/Solids</i>, <i>18</i>(5), 819–835. <a href="https://doi.org/10.1016/s0997-7538(99)00127-8">https://doi.org/10.1016/s0997-7538(99)00127-8</a>
  bibtex: '@article{Mahnken_Kuhl_2002, title={Parameter identification of gradient
    enhanced damage models with the finite element method}, volume={18}, DOI={<a href="https://doi.org/10.1016/s0997-7538(99)00127-8">10.1016/s0997-7538(99)00127-8</a>},
    number={5}, journal={European Journal of Mechanics - A/Solids}, publisher={Elsevier
    BV}, author={Mahnken, Rolf and Kuhl, Ellen}, year={2002}, pages={819–835} }'
  chicago: 'Mahnken, Rolf, and Ellen Kuhl. “Parameter Identification of Gradient Enhanced
    Damage Models with the Finite Element Method.” <i>European Journal of Mechanics
    - A/Solids</i> 18, no. 5 (2002): 819–35. <a href="https://doi.org/10.1016/s0997-7538(99)00127-8">https://doi.org/10.1016/s0997-7538(99)00127-8</a>.'
  ieee: 'R. Mahnken and E. Kuhl, “Parameter identification of gradient enhanced damage
    models with the finite element method,” <i>European Journal of Mechanics - A/Solids</i>,
    vol. 18, no. 5, pp. 819–835, 2002, doi: <a href="https://doi.org/10.1016/s0997-7538(99)00127-8">10.1016/s0997-7538(99)00127-8</a>.'
  mla: Mahnken, Rolf, and Ellen Kuhl. “Parameter Identification of Gradient Enhanced
    Damage Models with the Finite Element Method.” <i>European Journal of Mechanics
    - A/Solids</i>, vol. 18, no. 5, Elsevier BV, 2002, pp. 819–35, doi:<a href="https://doi.org/10.1016/s0997-7538(99)00127-8">10.1016/s0997-7538(99)00127-8</a>.
  short: R. Mahnken, E. Kuhl, European Journal of Mechanics - A/Solids 18 (2002) 819–835.
date_created: 2023-05-31T12:15:51Z
date_updated: 2023-05-31T12:17:11Z
department:
- _id: '9'
- _id: '154'
doi: 10.1016/s0997-7538(99)00127-8
intvolume: '        18'
issue: '5'
keyword:
- General Physics and Astronomy
- Mechanical Engineering
- Mechanics of Materials
- General Materials Science
language:
- iso: eng
page: 819-835
publication: European Journal of Mechanics - A/Solids
publication_identifier:
  issn:
  - 0997-7538
publication_status: published
publisher: Elsevier BV
quality_controlled: '1'
status: public
title: Parameter identification of gradient enhanced damage models with the finite
  element method
type: journal_article
user_id: '335'
volume: 18
year: '2002'
...
---
_id: '45429'
author:
- first_name: Rolf
  full_name: Mahnken, Rolf
  id: '335'
  last_name: Mahnken
- first_name: Erwin
  full_name: Stein, Erwin
  last_name: Stein
citation:
  ama: Mahnken R, Stein E. A unified approach for parameter identification of inelastic
    material models in the frame of the finite element method. <i>Computer Methods
    in Applied Mechanics and Engineering</i>. 2002;136(3-4):225-258. doi:<a href="https://doi.org/10.1016/0045-7825(96)00991-7">10.1016/0045-7825(96)00991-7</a>
  apa: Mahnken, R., &#38; Stein, E. (2002). A unified approach for parameter identification
    of inelastic material models in the frame of the finite element method. <i>Computer
    Methods in Applied Mechanics and Engineering</i>, <i>136</i>(3–4), 225–258. <a
    href="https://doi.org/10.1016/0045-7825(96)00991-7">https://doi.org/10.1016/0045-7825(96)00991-7</a>
  bibtex: '@article{Mahnken_Stein_2002, title={A unified approach for parameter identification
    of inelastic material models in the frame of the finite element method}, volume={136},
    DOI={<a href="https://doi.org/10.1016/0045-7825(96)00991-7">10.1016/0045-7825(96)00991-7</a>},
    number={3–4}, journal={Computer Methods in Applied Mechanics and Engineering},
    publisher={Elsevier BV}, author={Mahnken, Rolf and Stein, Erwin}, year={2002},
    pages={225–258} }'
  chicago: 'Mahnken, Rolf, and Erwin Stein. “A Unified Approach for Parameter Identification
    of Inelastic Material Models in the Frame of the Finite Element Method.” <i>Computer
    Methods in Applied Mechanics and Engineering</i> 136, no. 3–4 (2002): 225–58.
    <a href="https://doi.org/10.1016/0045-7825(96)00991-7">https://doi.org/10.1016/0045-7825(96)00991-7</a>.'
  ieee: 'R. Mahnken and E. Stein, “A unified approach for parameter identification
    of inelastic material models in the frame of the finite element method,” <i>Computer
    Methods in Applied Mechanics and Engineering</i>, vol. 136, no. 3–4, pp. 225–258,
    2002, doi: <a href="https://doi.org/10.1016/0045-7825(96)00991-7">10.1016/0045-7825(96)00991-7</a>.'
  mla: Mahnken, Rolf, and Erwin Stein. “A Unified Approach for Parameter Identification
    of Inelastic Material Models in the Frame of the Finite Element Method.” <i>Computer
    Methods in Applied Mechanics and Engineering</i>, vol. 136, no. 3–4, Elsevier
    BV, 2002, pp. 225–58, doi:<a href="https://doi.org/10.1016/0045-7825(96)00991-7">10.1016/0045-7825(96)00991-7</a>.
  short: R. Mahnken, E. Stein, Computer Methods in Applied Mechanics and Engineering
    136 (2002) 225–258.
date_created: 2023-05-31T12:22:58Z
date_updated: 2023-05-31T12:23:36Z
department:
- _id: '9'
- _id: '154'
doi: 10.1016/0045-7825(96)00991-7
intvolume: '       136'
issue: 3-4
keyword:
- Computer Science Applications
- General Physics and Astronomy
- Mechanical Engineering
- Mechanics of Materials
- Computational Mechanics
language:
- iso: eng
page: 225-258
publication: Computer Methods in Applied Mechanics and Engineering
publication_identifier:
  issn:
  - 0045-7825
publication_status: published
publisher: Elsevier BV
quality_controlled: '1'
status: public
title: A unified approach for parameter identification of inelastic material models
  in the frame of the finite element method
type: journal_article
user_id: '335'
volume: 136
year: '2002'
...
---
_id: '45432'
author:
- first_name: Rolf
  full_name: Mahnken, Rolf
  id: '335'
  last_name: Mahnken
- first_name: E
  full_name: Stein, E
  last_name: Stein
citation:
  ama: Mahnken R, Stein E. The identification of parameters for visco-plastic models
    via finite-element methods and gradient methods. <i>Modelling and Simulation in
    Materials Science and Engineering</i>. 2002;2(3A):597-616. doi:<a href="https://doi.org/10.1088/0965-0393/2/3a/013">10.1088/0965-0393/2/3a/013</a>
  apa: Mahnken, R., &#38; Stein, E. (2002). The identification of parameters for visco-plastic
    models via finite-element methods and gradient methods. <i>Modelling and Simulation
    in Materials Science and Engineering</i>, <i>2</i>(3A), 597–616. <a href="https://doi.org/10.1088/0965-0393/2/3a/013">https://doi.org/10.1088/0965-0393/2/3a/013</a>
  bibtex: '@article{Mahnken_Stein_2002, title={The identification of parameters for
    visco-plastic models via finite-element methods and gradient methods}, volume={2},
    DOI={<a href="https://doi.org/10.1088/0965-0393/2/3a/013">10.1088/0965-0393/2/3a/013</a>},
    number={3A}, journal={Modelling and Simulation in Materials Science and Engineering},
    publisher={IOP Publishing}, author={Mahnken, Rolf and Stein, E}, year={2002},
    pages={597–616} }'
  chicago: 'Mahnken, Rolf, and E Stein. “The Identification of Parameters for Visco-Plastic
    Models via Finite-Element Methods and Gradient Methods.” <i>Modelling and Simulation
    in Materials Science and Engineering</i> 2, no. 3A (2002): 597–616. <a href="https://doi.org/10.1088/0965-0393/2/3a/013">https://doi.org/10.1088/0965-0393/2/3a/013</a>.'
  ieee: 'R. Mahnken and E. Stein, “The identification of parameters for visco-plastic
    models via finite-element methods and gradient methods,” <i>Modelling and Simulation
    in Materials Science and Engineering</i>, vol. 2, no. 3A, pp. 597–616, 2002, doi:
    <a href="https://doi.org/10.1088/0965-0393/2/3a/013">10.1088/0965-0393/2/3a/013</a>.'
  mla: Mahnken, Rolf, and E. Stein. “The Identification of Parameters for Visco-Plastic
    Models via Finite-Element Methods and Gradient Methods.” <i>Modelling and Simulation
    in Materials Science and Engineering</i>, vol. 2, no. 3A, IOP Publishing, 2002,
    pp. 597–616, doi:<a href="https://doi.org/10.1088/0965-0393/2/3a/013">10.1088/0965-0393/2/3a/013</a>.
  short: R. Mahnken, E. Stein, Modelling and Simulation in Materials Science and Engineering
    2 (2002) 597–616.
date_created: 2023-05-31T12:28:01Z
date_updated: 2023-05-31T12:28:27Z
department:
- _id: '9'
- _id: '154'
doi: 10.1088/0965-0393/2/3a/013
intvolume: '         2'
issue: 3A
keyword:
- Computer Science Applications
- Mechanics of Materials
- Condensed Matter Physics
- General Materials Science
- Modeling and Simulation
language:
- iso: eng
page: 597-616
publication: Modelling and Simulation in Materials Science and Engineering
publication_identifier:
  issn:
  - 0965-0393
  - 1361-651X
publication_status: published
publisher: IOP Publishing
quality_controlled: '1'
status: public
title: The identification of parameters for visco-plastic models via finite-element
  methods and gradient methods
type: journal_article
user_id: '335'
volume: 2
year: '2002'
...
---
_id: '45430'
author:
- first_name: Rolf
  full_name: Mahnken, Rolf
  id: '335'
  last_name: Mahnken
- first_name: Erwin
  full_name: Stein, Erwin
  last_name: Stein
citation:
  ama: Mahnken R, Stein E. Parameter identification for viscoplastic models based
    on analytical derivatives of a least-squares functional and stability investigations.
    <i>International Journal of Plasticity</i>. 2002;12(4):451-479. doi:<a href="https://doi.org/10.1016/s0749-6419(95)00016-x">10.1016/s0749-6419(95)00016-x</a>
  apa: Mahnken, R., &#38; Stein, E. (2002). Parameter identification for viscoplastic
    models based on analytical derivatives of a least-squares functional and stability
    investigations. <i>International Journal of Plasticity</i>, <i>12</i>(4), 451–479.
    <a href="https://doi.org/10.1016/s0749-6419(95)00016-x">https://doi.org/10.1016/s0749-6419(95)00016-x</a>
  bibtex: '@article{Mahnken_Stein_2002, title={Parameter identification for viscoplastic
    models based on analytical derivatives of a least-squares functional and stability
    investigations}, volume={12}, DOI={<a href="https://doi.org/10.1016/s0749-6419(95)00016-x">10.1016/s0749-6419(95)00016-x</a>},
    number={4}, journal={International Journal of Plasticity}, publisher={Elsevier
    BV}, author={Mahnken, Rolf and Stein, Erwin}, year={2002}, pages={451–479} }'
  chicago: 'Mahnken, Rolf, and Erwin Stein. “Parameter Identification for Viscoplastic
    Models Based on Analytical Derivatives of a Least-Squares Functional and Stability
    Investigations.” <i>International Journal of Plasticity</i> 12, no. 4 (2002):
    451–79. <a href="https://doi.org/10.1016/s0749-6419(95)00016-x">https://doi.org/10.1016/s0749-6419(95)00016-x</a>.'
  ieee: 'R. Mahnken and E. Stein, “Parameter identification for viscoplastic models
    based on analytical derivatives of a least-squares functional and stability investigations,”
    <i>International Journal of Plasticity</i>, vol. 12, no. 4, pp. 451–479, 2002,
    doi: <a href="https://doi.org/10.1016/s0749-6419(95)00016-x">10.1016/s0749-6419(95)00016-x</a>.'
  mla: Mahnken, Rolf, and Erwin Stein. “Parameter Identification for Viscoplastic
    Models Based on Analytical Derivatives of a Least-Squares Functional and Stability
    Investigations.” <i>International Journal of Plasticity</i>, vol. 12, no. 4, Elsevier
    BV, 2002, pp. 451–79, doi:<a href="https://doi.org/10.1016/s0749-6419(95)00016-x">10.1016/s0749-6419(95)00016-x</a>.
  short: R. Mahnken, E. Stein, International Journal of Plasticity 12 (2002) 451–479.
date_created: 2023-05-31T12:24:47Z
date_updated: 2023-05-31T12:25:19Z
department:
- _id: '9'
- _id: '154'
doi: 10.1016/s0749-6419(95)00016-x
intvolume: '        12'
issue: '4'
keyword:
- Mechanical Engineering
- Mechanics of Materials
- General Materials Science
language:
- iso: eng
page: 451-479
publication: International Journal of Plasticity
publication_identifier:
  issn:
  - 0749-6419
publication_status: published
publisher: Elsevier BV
quality_controlled: '1'
status: public
title: Parameter identification for viscoplastic models based on analytical derivatives
  of a least-squares functional and stability investigations
type: journal_article
user_id: '335'
volume: 12
year: '2002'
...
---
_id: '45428'
author:
- first_name: Rolf
  full_name: Mahnken, Rolf
  id: '335'
  last_name: Mahnken
- first_name: Erwin
  full_name: Stein, Erwin
  last_name: Stein
citation:
  ama: Mahnken R, Stein E. Parameter identification for finite deformation elasto-plasticity
    in principal directions. <i>Computer Methods in Applied Mechanics and Engineering</i>.
    2002;147(1-2):17-39. doi:<a href="https://doi.org/10.1016/s0045-7825(97)00008-x">10.1016/s0045-7825(97)00008-x</a>
  apa: Mahnken, R., &#38; Stein, E. (2002). Parameter identification for finite deformation
    elasto-plasticity in principal directions. <i>Computer Methods in Applied Mechanics
    and Engineering</i>, <i>147</i>(1–2), 17–39. <a href="https://doi.org/10.1016/s0045-7825(97)00008-x">https://doi.org/10.1016/s0045-7825(97)00008-x</a>
  bibtex: '@article{Mahnken_Stein_2002, title={Parameter identification for finite
    deformation elasto-plasticity in principal directions}, volume={147}, DOI={<a
    href="https://doi.org/10.1016/s0045-7825(97)00008-x">10.1016/s0045-7825(97)00008-x</a>},
    number={1–2}, journal={Computer Methods in Applied Mechanics and Engineering},
    publisher={Elsevier BV}, author={Mahnken, Rolf and Stein, Erwin}, year={2002},
    pages={17–39} }'
  chicago: 'Mahnken, Rolf, and Erwin Stein. “Parameter Identification for Finite Deformation
    Elasto-Plasticity in Principal Directions.” <i>Computer Methods in Applied Mechanics
    and Engineering</i> 147, no. 1–2 (2002): 17–39. <a href="https://doi.org/10.1016/s0045-7825(97)00008-x">https://doi.org/10.1016/s0045-7825(97)00008-x</a>.'
  ieee: 'R. Mahnken and E. Stein, “Parameter identification for finite deformation
    elasto-plasticity in principal directions,” <i>Computer Methods in Applied Mechanics
    and Engineering</i>, vol. 147, no. 1–2, pp. 17–39, 2002, doi: <a href="https://doi.org/10.1016/s0045-7825(97)00008-x">10.1016/s0045-7825(97)00008-x</a>.'
  mla: Mahnken, Rolf, and Erwin Stein. “Parameter Identification for Finite Deformation
    Elasto-Plasticity in Principal Directions.” <i>Computer Methods in Applied Mechanics
    and Engineering</i>, vol. 147, no. 1–2, Elsevier BV, 2002, pp. 17–39, doi:<a href="https://doi.org/10.1016/s0045-7825(97)00008-x">10.1016/s0045-7825(97)00008-x</a>.
  short: R. Mahnken, E. Stein, Computer Methods in Applied Mechanics and Engineering
    147 (2002) 17–39.
date_created: 2023-05-31T12:21:53Z
date_updated: 2023-05-31T12:22:12Z
department:
- _id: '9'
- _id: '154'
doi: 10.1016/s0045-7825(97)00008-x
intvolume: '       147'
issue: 1-2
keyword:
- Computer Science Applications
- General Physics and Astronomy
- Mechanical Engineering
- Mechanics of Materials
- Computational Mechanics
language:
- iso: eng
page: 17-39
publication: Computer Methods in Applied Mechanics and Engineering
publication_identifier:
  issn:
  - 0045-7825
publication_status: published
publisher: Elsevier BV
quality_controlled: '1'
status: public
title: Parameter identification for finite deformation elasto-plasticity in principal
  directions
type: journal_article
user_id: '335'
volume: 147
year: '2002'
...
---
_id: '45426'
author:
- first_name: Rolf
  full_name: Mahnken, Rolf
  id: '335'
  last_name: Mahnken
citation:
  ama: Mahnken R. Aspects on the finite-element implementation of the Gurson model
    including parameter identification. <i>International Journal of Plasticity</i>.
    2002;15(11):1111-1137. doi:<a href="https://doi.org/10.1016/s0749-6419(99)00029-7">10.1016/s0749-6419(99)00029-7</a>
  apa: Mahnken, R. (2002). Aspects on the finite-element implementation of the Gurson
    model including parameter identification. <i>International Journal of Plasticity</i>,
    <i>15</i>(11), 1111–1137. <a href="https://doi.org/10.1016/s0749-6419(99)00029-7">https://doi.org/10.1016/s0749-6419(99)00029-7</a>
  bibtex: '@article{Mahnken_2002, title={Aspects on the finite-element implementation
    of the Gurson model including parameter identification}, volume={15}, DOI={<a
    href="https://doi.org/10.1016/s0749-6419(99)00029-7">10.1016/s0749-6419(99)00029-7</a>},
    number={11}, journal={International Journal of Plasticity}, publisher={Elsevier
    BV}, author={Mahnken, Rolf}, year={2002}, pages={1111–1137} }'
  chicago: 'Mahnken, Rolf. “Aspects on the Finite-Element Implementation of the Gurson
    Model Including Parameter Identification.” <i>International Journal of Plasticity</i>
    15, no. 11 (2002): 1111–37. <a href="https://doi.org/10.1016/s0749-6419(99)00029-7">https://doi.org/10.1016/s0749-6419(99)00029-7</a>.'
  ieee: 'R. Mahnken, “Aspects on the finite-element implementation of the Gurson model
    including parameter identification,” <i>International Journal of Plasticity</i>,
    vol. 15, no. 11, pp. 1111–1137, 2002, doi: <a href="https://doi.org/10.1016/s0749-6419(99)00029-7">10.1016/s0749-6419(99)00029-7</a>.'
  mla: Mahnken, Rolf. “Aspects on the Finite-Element Implementation of the Gurson
    Model Including Parameter Identification.” <i>International Journal of Plasticity</i>,
    vol. 15, no. 11, Elsevier BV, 2002, pp. 1111–37, doi:<a href="https://doi.org/10.1016/s0749-6419(99)00029-7">10.1016/s0749-6419(99)00029-7</a>.
  short: R. Mahnken, International Journal of Plasticity 15 (2002) 1111–1137.
date_created: 2023-05-31T12:18:49Z
date_updated: 2023-05-31T12:20:03Z
department:
- _id: '9'
- _id: '154'
doi: 10.1016/s0749-6419(99)00029-7
intvolume: '        15'
issue: '11'
keyword:
- Mechanical Engineering
- Mechanics of Materials
- General Materials Science
language:
- iso: eng
page: 1111-1137
publication: International Journal of Plasticity
publication_identifier:
  issn:
  - 0749-6419
publication_status: published
publisher: Elsevier BV
quality_controlled: '1'
status: public
title: Aspects on the finite-element implementation of the Gurson model including
  parameter identification
type: journal_article
user_id: '335'
volume: 15
year: '2002'
...
---
_id: '35365'
article_type: original
author:
- first_name: Thomas
  full_name: Thiele, Thomas
  last_name: Thiele
- first_name: J.-F.
  full_name: Berret, J.-F.
  last_name: Berret
- first_name: Stefan
  full_name: Müller, Stefan
  last_name: Müller
- first_name: Claudia
  full_name: Schmidt, Claudia
  id: '466'
  last_name: Schmidt
  orcid: 0000-0003-3179-9997
citation:
  ama: Thiele T, Berret J-F, Müller S, Schmidt C. Rheology and nuclear magnetic resonance
    measurements under shear of sodium dodecyl sulfate/decanol/water nematics. <i>Journal
    of Rheology</i>. 2001;45(1):29-48. doi:<a href="https://doi.org/10.1122/1.1332387">10.1122/1.1332387</a>
  apa: Thiele, T., Berret, J.-F., Müller, S., &#38; Schmidt, C. (2001). Rheology and
    nuclear magnetic resonance measurements under shear of sodium dodecyl sulfate/decanol/water
    nematics. <i>Journal of Rheology</i>, <i>45</i>(1), 29–48. <a href="https://doi.org/10.1122/1.1332387">https://doi.org/10.1122/1.1332387</a>
  bibtex: '@article{Thiele_Berret_Müller_Schmidt_2001, title={Rheology and nuclear
    magnetic resonance measurements under shear of sodium dodecyl sulfate/decanol/water
    nematics}, volume={45}, DOI={<a href="https://doi.org/10.1122/1.1332387">10.1122/1.1332387</a>},
    number={1}, journal={Journal of Rheology}, publisher={Society of Rheology}, author={Thiele,
    Thomas and Berret, J.-F. and Müller, Stefan and Schmidt, Claudia}, year={2001},
    pages={29–48} }'
  chicago: 'Thiele, Thomas, J.-F. Berret, Stefan Müller, and Claudia Schmidt. “Rheology
    and Nuclear Magnetic Resonance Measurements under Shear of Sodium Dodecyl Sulfate/Decanol/Water
    Nematics.” <i>Journal of Rheology</i> 45, no. 1 (2001): 29–48. <a href="https://doi.org/10.1122/1.1332387">https://doi.org/10.1122/1.1332387</a>.'
  ieee: 'T. Thiele, J.-F. Berret, S. Müller, and C. Schmidt, “Rheology and nuclear
    magnetic resonance measurements under shear of sodium dodecyl sulfate/decanol/water
    nematics,” <i>Journal of Rheology</i>, vol. 45, no. 1, pp. 29–48, 2001, doi: <a
    href="https://doi.org/10.1122/1.1332387">10.1122/1.1332387</a>.'
  mla: Thiele, Thomas, et al. “Rheology and Nuclear Magnetic Resonance Measurements
    under Shear of Sodium Dodecyl Sulfate/Decanol/Water Nematics.” <i>Journal of Rheology</i>,
    vol. 45, no. 1, Society of Rheology, 2001, pp. 29–48, doi:<a href="https://doi.org/10.1122/1.1332387">10.1122/1.1332387</a>.
  short: T. Thiele, J.-F. Berret, S. Müller, C. Schmidt, Journal of Rheology 45 (2001)
    29–48.
date_created: 2023-01-06T13:17:10Z
date_updated: 2023-01-07T11:18:40Z
department:
- _id: '2'
- _id: '315'
doi: 10.1122/1.1332387
extern: '1'
intvolume: '        45'
issue: '1'
keyword:
- Mechanical Engineering
- Mechanics of Materials
- Condensed Matter Physics
- General Materials Science
language:
- iso: eng
page: 29-48
publication: Journal of Rheology
publication_identifier:
  issn:
  - 0148-6055
  - 1520-8516
publication_status: published
publisher: Society of Rheology
quality_controlled: '1'
status: public
title: Rheology and nuclear magnetic resonance measurements under shear of sodium
  dodecyl sulfate/decanol/water nematics
type: journal_article
user_id: '466'
volume: 45
year: '2001'
...