[{"issue":"1-4","publication_identifier":{"issn":["0167-9317"]},"publication_status":"published","page":"191-194","intvolume":"        19","citation":{"apa":"Adams, S., Hilleringmann, U., &#38; Goser, K. (2002). CMOS compatible micromachining by dry silicon-etching techniques. <i>Microelectronic Engineering</i>, <i>19</i>(1–4), 191–194. <a href=\"https://doi.org/10.1016/0167-9317(92)90420-v\">https://doi.org/10.1016/0167-9317(92)90420-v</a>","short":"S. Adams, U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 191–194.","bibtex":"@article{Adams_Hilleringmann_Goser_2002, title={CMOS compatible micromachining by dry silicon-etching techniques}, volume={19}, DOI={<a href=\"https://doi.org/10.1016/0167-9317(92)90420-v\">10.1016/0167-9317(92)90420-v</a>}, number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Adams, S. and Hilleringmann, Ulrich and Goser, K.}, year={2002}, pages={191–194} }","mla":"Adams, S., et al. “CMOS Compatible Micromachining by Dry Silicon-Etching Techniques.” <i>Microelectronic Engineering</i>, vol. 19, no. 1–4, Elsevier BV, 2002, pp. 191–94, doi:<a href=\"https://doi.org/10.1016/0167-9317(92)90420-v\">10.1016/0167-9317(92)90420-v</a>.","ama":"Adams S, Hilleringmann U, Goser K. CMOS compatible micromachining by dry silicon-etching techniques. <i>Microelectronic Engineering</i>. 2002;19(1-4):191-194. doi:<a href=\"https://doi.org/10.1016/0167-9317(92)90420-v\">10.1016/0167-9317(92)90420-v</a>","ieee":"S. Adams, U. Hilleringmann, and K. Goser, “CMOS compatible micromachining by dry silicon-etching techniques,” <i>Microelectronic Engineering</i>, vol. 19, no. 1–4, pp. 191–194, 2002, doi: <a href=\"https://doi.org/10.1016/0167-9317(92)90420-v\">10.1016/0167-9317(92)90420-v</a>.","chicago":"Adams, S., Ulrich Hilleringmann, and K. Goser. “CMOS Compatible Micromachining by Dry Silicon-Etching Techniques.” <i>Microelectronic Engineering</i> 19, no. 1–4 (2002): 191–94. <a href=\"https://doi.org/10.1016/0167-9317(92)90420-v\">https://doi.org/10.1016/0167-9317(92)90420-v</a>."},"year":"2002","volume":19,"date_created":"2023-01-25T09:28:16Z","author":[{"full_name":"Adams, S.","last_name":"Adams","first_name":"S."},{"last_name":"Hilleringmann","full_name":"Hilleringmann, Ulrich","id":"20179","first_name":"Ulrich"},{"full_name":"Goser, K.","last_name":"Goser","first_name":"K."}],"publisher":"Elsevier BV","date_updated":"2023-03-21T09:48:55Z","doi":"10.1016/0167-9317(92)90420-v","title":"CMOS compatible micromachining by dry silicon-etching techniques","publication":"Microelectronic Engineering","type":"journal_article","status":"public","department":[{"_id":"59"}],"user_id":"20179","_id":"39916","language":[{"iso":"eng"}],"keyword":["Electrical and Electronic Engineering","Surfaces","Coatings and Films","Condensed Matter Physics","Atomic and Molecular Physics","and Optics","Electronic","Optical and Magnetic Materials"]},{"volume":46,"author":[{"last_name":"Mankowski","full_name":"Mankowski, V.","first_name":"V."},{"last_name":"Hilleringmann","full_name":"Hilleringmann, Ulrich","id":"20179","first_name":"Ulrich"},{"full_name":"Schumacher, K.","last_name":"Schumacher","first_name":"K."}],"date_updated":"2023-03-21T09:58:35Z","doi":"10.1016/s0167-9317(99)00122-7","publication_identifier":{"issn":["0167-9317"]},"publication_status":"published","page":"413-417","intvolume":"        46","citation":{"apa":"Mankowski, V., Hilleringmann, U., &#38; Schumacher, K. (2002). 12 kV low current cascaded light triggered switch on one silicon chip. <i>Microelectronic Engineering</i>, <i>46</i>(1–4), 413–417. <a href=\"https://doi.org/10.1016/s0167-9317(99)00122-7\">https://doi.org/10.1016/s0167-9317(99)00122-7</a>","short":"V. Mankowski, U. Hilleringmann, K. Schumacher, Microelectronic Engineering 46 (2002) 413–417.","bibtex":"@article{Mankowski_Hilleringmann_Schumacher_2002, title={12 kV low current cascaded light triggered switch on one silicon chip}, volume={46}, DOI={<a href=\"https://doi.org/10.1016/s0167-9317(99)00122-7\">10.1016/s0167-9317(99)00122-7</a>}, number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Mankowski, V. and Hilleringmann, Ulrich and Schumacher, K.}, year={2002}, pages={413–417} }","mla":"Mankowski, V., et al. “12 KV Low Current Cascaded Light Triggered Switch on One Silicon Chip.” <i>Microelectronic Engineering</i>, vol. 46, no. 1–4, Elsevier BV, 2002, pp. 413–17, doi:<a href=\"https://doi.org/10.1016/s0167-9317(99)00122-7\">10.1016/s0167-9317(99)00122-7</a>.","ama":"Mankowski V, Hilleringmann U, Schumacher K. 12 kV low current cascaded light triggered switch on one silicon chip. <i>Microelectronic Engineering</i>. 2002;46(1-4):413-417. doi:<a href=\"https://doi.org/10.1016/s0167-9317(99)00122-7\">10.1016/s0167-9317(99)00122-7</a>","chicago":"Mankowski, V., Ulrich Hilleringmann, and K. Schumacher. “12 KV Low Current Cascaded Light Triggered Switch on One Silicon Chip.” <i>Microelectronic Engineering</i> 46, no. 1–4 (2002): 413–17. <a href=\"https://doi.org/10.1016/s0167-9317(99)00122-7\">https://doi.org/10.1016/s0167-9317(99)00122-7</a>.","ieee":"V. Mankowski, U. Hilleringmann, and K. Schumacher, “12 kV low current cascaded light triggered switch on one silicon chip,” <i>Microelectronic Engineering</i>, vol. 46, no. 1–4, pp. 413–417, 2002, doi: <a href=\"https://doi.org/10.1016/s0167-9317(99)00122-7\">10.1016/s0167-9317(99)00122-7</a>."},"department":[{"_id":"59"}],"user_id":"20179","_id":"39889","type":"journal_article","status":"public","date_created":"2023-01-25T09:13:17Z","publisher":"Elsevier BV","title":"12 kV low current cascaded light triggered switch on one silicon chip","issue":"1-4","year":"2002","language":[{"iso":"eng"}],"keyword":["Electrical and Electronic Engineering","Surfaces","Coatings and Films","Condensed Matter Physics","Atomic and Molecular Physics","and Optics","Electronic","Optical and Magnetic Materials"],"publication":"Microelectronic Engineering"},{"status":"public","type":"journal_article","publication":"Solid-State Electronics","keyword":["Materials Chemistry","Electrical and Electronic Engineering","Condensed Matter Physics","Electronic","Optical and Magnetic Materials"],"language":[{"iso":"eng"}],"_id":"39886","user_id":"20179","department":[{"_id":"59"}],"year":"2002","citation":{"mla":"Wirth, G., et al. “Mesoscopic Transport Phenomena in Ultrashort Channel MOSFETs.” <i>Solid-State Electronics</i>, vol. 43, no. 7, Elsevier BV, 2002, pp. 1245–50, doi:<a href=\"https://doi.org/10.1016/s0038-1101(99)00060-x\">10.1016/s0038-1101(99)00060-x</a>.","bibtex":"@article{Wirth_Hilleringmann_Horstmann_Goser_2002, title={Mesoscopic transport phenomena in ultrashort channel MOSFETs}, volume={43}, DOI={<a href=\"https://doi.org/10.1016/s0038-1101(99)00060-x\">10.1016/s0038-1101(99)00060-x</a>}, number={7}, journal={Solid-State Electronics}, publisher={Elsevier BV}, author={Wirth, G and Hilleringmann, Ulrich and Horstmann, J.T and Goser, K}, year={2002}, pages={1245–1250} }","short":"G. Wirth, U. Hilleringmann, J.T. Horstmann, K. Goser, Solid-State Electronics 43 (2002) 1245–1250.","apa":"Wirth, G., Hilleringmann, U., Horstmann, J. T., &#38; Goser, K. (2002). Mesoscopic transport phenomena in ultrashort channel MOSFETs. <i>Solid-State Electronics</i>, <i>43</i>(7), 1245–1250. <a href=\"https://doi.org/10.1016/s0038-1101(99)00060-x\">https://doi.org/10.1016/s0038-1101(99)00060-x</a>","ama":"Wirth G, Hilleringmann U, Horstmann JT, Goser K. Mesoscopic transport phenomena in ultrashort channel MOSFETs. <i>Solid-State Electronics</i>. 2002;43(7):1245-1250. doi:<a href=\"https://doi.org/10.1016/s0038-1101(99)00060-x\">10.1016/s0038-1101(99)00060-x</a>","ieee":"G. Wirth, U. Hilleringmann, J. T. Horstmann, and K. Goser, “Mesoscopic transport phenomena in ultrashort channel MOSFETs,” <i>Solid-State Electronics</i>, vol. 43, no. 7, pp. 1245–1250, 2002, doi: <a href=\"https://doi.org/10.1016/s0038-1101(99)00060-x\">10.1016/s0038-1101(99)00060-x</a>.","chicago":"Wirth, G, Ulrich Hilleringmann, J.T Horstmann, and K Goser. “Mesoscopic Transport Phenomena in Ultrashort Channel MOSFETs.” <i>Solid-State Electronics</i> 43, no. 7 (2002): 1245–50. <a href=\"https://doi.org/10.1016/s0038-1101(99)00060-x\">https://doi.org/10.1016/s0038-1101(99)00060-x</a>."},"intvolume":"        43","page":"1245-1250","publication_status":"published","publication_identifier":{"issn":["0038-1101"]},"issue":"7","title":"Mesoscopic transport phenomena in ultrashort channel MOSFETs","doi":"10.1016/s0038-1101(99)00060-x","publisher":"Elsevier BV","date_updated":"2023-03-21T09:59:22Z","date_created":"2023-01-25T09:11:50Z","author":[{"first_name":"G","full_name":"Wirth, G","last_name":"Wirth"},{"id":"20179","full_name":"Hilleringmann, Ulrich","last_name":"Hilleringmann","first_name":"Ulrich"},{"first_name":"J.T","last_name":"Horstmann","full_name":"Horstmann, J.T"},{"first_name":"K","full_name":"Goser, K","last_name":"Goser"}],"volume":43},{"status":"public","publication":"Microelectronic Engineering","type":"journal_article","keyword":["Electrical and Electronic Engineering","Surfaces","Coatings and Films","Condensed Matter Physics","Atomic and Molecular Physics","and Optics","Electronic","Optical and Magnetic Materials"],"language":[{"iso":"eng"}],"_id":"39877","department":[{"_id":"59"}],"user_id":"20179","year":"2002","page":"569-572","intvolume":"        53","citation":{"ama":"Hilleringmann U, Vieregge T, Horstmann JT. A structure definition technique for 25 nm lines of silicon and related materials. <i>Microelectronic Engineering</i>. 2002;53(1-4):569-572. doi:<a href=\"https://doi.org/10.1016/s0167-9317(00)00380-4\">10.1016/s0167-9317(00)00380-4</a>","chicago":"Hilleringmann, Ulrich, T. Vieregge, and J.T. Horstmann. “A Structure Definition Technique for 25 Nm Lines of Silicon and Related Materials.” <i>Microelectronic Engineering</i> 53, no. 1–4 (2002): 569–72. <a href=\"https://doi.org/10.1016/s0167-9317(00)00380-4\">https://doi.org/10.1016/s0167-9317(00)00380-4</a>.","ieee":"U. Hilleringmann, T. Vieregge, and J. T. Horstmann, “A structure definition technique for 25 nm lines of silicon and related materials,” <i>Microelectronic Engineering</i>, vol. 53, no. 1–4, pp. 569–572, 2002, doi: <a href=\"https://doi.org/10.1016/s0167-9317(00)00380-4\">10.1016/s0167-9317(00)00380-4</a>.","short":"U. Hilleringmann, T. Vieregge, J.T. Horstmann, Microelectronic Engineering 53 (2002) 569–572.","bibtex":"@article{Hilleringmann_Vieregge_Horstmann_2002, title={A structure definition technique for 25 nm lines of silicon and related materials}, volume={53}, DOI={<a href=\"https://doi.org/10.1016/s0167-9317(00)00380-4\">10.1016/s0167-9317(00)00380-4</a>}, number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Hilleringmann, Ulrich and Vieregge, T. and Horstmann, J.T.}, year={2002}, pages={569–572} }","mla":"Hilleringmann, Ulrich, et al. “A Structure Definition Technique for 25 Nm Lines of Silicon and Related Materials.” <i>Microelectronic Engineering</i>, vol. 53, no. 1–4, Elsevier BV, 2002, pp. 569–72, doi:<a href=\"https://doi.org/10.1016/s0167-9317(00)00380-4\">10.1016/s0167-9317(00)00380-4</a>.","apa":"Hilleringmann, U., Vieregge, T., &#38; Horstmann, J. T. (2002). A structure definition technique for 25 nm lines of silicon and related materials. <i>Microelectronic Engineering</i>, <i>53</i>(1–4), 569–572. <a href=\"https://doi.org/10.1016/s0167-9317(00)00380-4\">https://doi.org/10.1016/s0167-9317(00)00380-4</a>"},"publication_identifier":{"issn":["0167-9317"]},"publication_status":"published","issue":"1-4","title":"A structure definition technique for 25 nm lines of silicon and related materials","doi":"10.1016/s0167-9317(00)00380-4","date_updated":"2023-03-21T10:03:00Z","publisher":"Elsevier BV","volume":53,"author":[{"id":"20179","full_name":"Hilleringmann, Ulrich","last_name":"Hilleringmann","first_name":"Ulrich"},{"first_name":"T.","last_name":"Vieregge","full_name":"Vieregge, T."},{"first_name":"J.T.","full_name":"Horstmann, J.T.","last_name":"Horstmann"}],"date_created":"2023-01-25T09:08:13Z"},{"doi":"10.1016/s0045-7825(00)00364-9","date_updated":"2023-05-26T12:22:12Z","volume":190,"author":[{"last_name":"Mahnken","id":"335","full_name":"Mahnken, Rolf","first_name":"Rolf"}],"page":"5057-5080","intvolume":"       190","citation":{"ama":"Mahnken R. Strength difference in compression and tension and pressure dependence of yielding in elasto-plasticity. <i>Computer Methods in Applied Mechanics and Engineering</i>. 2002;190(39):5057-5080. doi:<a href=\"https://doi.org/10.1016/s0045-7825(00)00364-9\">10.1016/s0045-7825(00)00364-9</a>","chicago":"Mahnken, Rolf. “Strength Difference in Compression and Tension and Pressure Dependence of Yielding in Elasto-Plasticity.” <i>Computer Methods in Applied Mechanics and Engineering</i> 190, no. 39 (2002): 5057–80. <a href=\"https://doi.org/10.1016/s0045-7825(00)00364-9\">https://doi.org/10.1016/s0045-7825(00)00364-9</a>.","ieee":"R. Mahnken, “Strength difference in compression and tension and pressure dependence of yielding in elasto-plasticity,” <i>Computer Methods in Applied Mechanics and Engineering</i>, vol. 190, no. 39, pp. 5057–5080, 2002, doi: <a href=\"https://doi.org/10.1016/s0045-7825(00)00364-9\">10.1016/s0045-7825(00)00364-9</a>.","short":"R. Mahnken, Computer Methods in Applied Mechanics and Engineering 190 (2002) 5057–5080.","bibtex":"@article{Mahnken_2002, title={Strength difference in compression and tension and pressure dependence of yielding in elasto-plasticity}, volume={190}, DOI={<a href=\"https://doi.org/10.1016/s0045-7825(00)00364-9\">10.1016/s0045-7825(00)00364-9</a>}, number={39}, journal={Computer Methods in Applied Mechanics and Engineering}, publisher={Elsevier BV}, author={Mahnken, Rolf}, year={2002}, pages={5057–5080} }","mla":"Mahnken, Rolf. “Strength Difference in Compression and Tension and Pressure Dependence of Yielding in Elasto-Plasticity.” <i>Computer Methods in Applied Mechanics and Engineering</i>, vol. 190, no. 39, Elsevier BV, 2002, pp. 5057–80, doi:<a href=\"https://doi.org/10.1016/s0045-7825(00)00364-9\">10.1016/s0045-7825(00)00364-9</a>.","apa":"Mahnken, R. (2002). Strength difference in compression and tension and pressure dependence of yielding in elasto-plasticity. <i>Computer Methods in Applied Mechanics and Engineering</i>, <i>190</i>(39), 5057–5080. <a href=\"https://doi.org/10.1016/s0045-7825(00)00364-9\">https://doi.org/10.1016/s0045-7825(00)00364-9</a>"},"publication_identifier":{"issn":["0045-7825"]},"publication_status":"published","_id":"45307","department":[{"_id":"9"},{"_id":"154"}],"user_id":"335","status":"public","type":"journal_article","title":"Strength difference in compression and tension and pressure dependence of yielding in elasto-plasticity","publisher":"Elsevier BV","date_created":"2023-05-26T12:21:04Z","year":"2002","quality_controlled":"1","issue":"39","keyword":["Computer Science Applications","General Physics and Astronomy","Mechanical Engineering","Mechanics of Materials","Computational Mechanics"],"language":[{"iso":"eng"}],"publication":"Computer Methods in Applied Mechanics and Engineering"},{"language":[{"iso":"eng"}],"keyword":["Computer Science Applications","General Physics and Astronomy","Mechanical Engineering","Mechanics of Materials","Computational Mechanics"],"publication":"Computer Methods in Applied Mechanics and Engineering","date_created":"2023-05-31T11:52:51Z","publisher":"Elsevier BV","title":"Finite element simulation for rock salt with dilatancy boundary coupled to fluid permeation","issue":"32-33","quality_controlled":"1","year":"2002","department":[{"_id":"9"},{"_id":"154"}],"user_id":"335","_id":"45412","type":"journal_article","status":"public","volume":190,"author":[{"first_name":"Rolf","last_name":"Mahnken","full_name":"Mahnken, Rolf","id":"335"},{"last_name":"Kohlmeier","full_name":"Kohlmeier, M.","first_name":"M."}],"date_updated":"2023-05-31T11:53:38Z","doi":"10.1016/s0045-7825(00)00317-0","publication_identifier":{"issn":["0045-7825"]},"publication_status":"published","intvolume":"       190","page":"4259-4278","citation":{"ama":"Mahnken R, Kohlmeier M. Finite element simulation for rock salt with dilatancy boundary coupled to fluid permeation. <i>Computer Methods in Applied Mechanics and Engineering</i>. 2002;190(32-33):4259-4278. doi:<a href=\"https://doi.org/10.1016/s0045-7825(00)00317-0\">10.1016/s0045-7825(00)00317-0</a>","ieee":"R. Mahnken and M. Kohlmeier, “Finite element simulation for rock salt with dilatancy boundary coupled to fluid permeation,” <i>Computer Methods in Applied Mechanics and Engineering</i>, vol. 190, no. 32–33, pp. 4259–4278, 2002, doi: <a href=\"https://doi.org/10.1016/s0045-7825(00)00317-0\">10.1016/s0045-7825(00)00317-0</a>.","chicago":"Mahnken, Rolf, and M. Kohlmeier. “Finite Element Simulation for Rock Salt with Dilatancy Boundary Coupled to Fluid Permeation.” <i>Computer Methods in Applied Mechanics and Engineering</i> 190, no. 32–33 (2002): 4259–78. <a href=\"https://doi.org/10.1016/s0045-7825(00)00317-0\">https://doi.org/10.1016/s0045-7825(00)00317-0</a>.","apa":"Mahnken, R., &#38; Kohlmeier, M. (2002). Finite element simulation for rock salt with dilatancy boundary coupled to fluid permeation. <i>Computer Methods in Applied Mechanics and Engineering</i>, <i>190</i>(32–33), 4259–4278. <a href=\"https://doi.org/10.1016/s0045-7825(00)00317-0\">https://doi.org/10.1016/s0045-7825(00)00317-0</a>","bibtex":"@article{Mahnken_Kohlmeier_2002, title={Finite element simulation for rock salt with dilatancy boundary coupled to fluid permeation}, volume={190}, DOI={<a href=\"https://doi.org/10.1016/s0045-7825(00)00317-0\">10.1016/s0045-7825(00)00317-0</a>}, number={32–33}, journal={Computer Methods in Applied Mechanics and Engineering}, publisher={Elsevier BV}, author={Mahnken, Rolf and Kohlmeier, M.}, year={2002}, pages={4259–4278} }","mla":"Mahnken, Rolf, and M. Kohlmeier. “Finite Element Simulation for Rock Salt with Dilatancy Boundary Coupled to Fluid Permeation.” <i>Computer Methods in Applied Mechanics and Engineering</i>, vol. 190, no. 32–33, Elsevier BV, 2002, pp. 4259–78, doi:<a href=\"https://doi.org/10.1016/s0045-7825(00)00317-0\">10.1016/s0045-7825(00)00317-0</a>.","short":"R. Mahnken, M. Kohlmeier, Computer Methods in Applied Mechanics and Engineering 190 (2002) 4259–4278."}},{"publication":"European Journal of Mechanics - A/Solids","keyword":["General Physics and Astronomy","Mechanical Engineering","Mechanics of Materials","General Materials Science"],"language":[{"iso":"eng"}],"year":"2002","quality_controlled":"1","issue":"5","title":"Parameter identification of gradient enhanced damage models with the finite element method","publisher":"Elsevier BV","date_created":"2023-05-31T12:15:51Z","status":"public","type":"journal_article","_id":"45424","department":[{"_id":"9"},{"_id":"154"}],"user_id":"335","intvolume":"        18","page":"819-835","citation":{"short":"R. Mahnken, E. Kuhl, European Journal of Mechanics - A/Solids 18 (2002) 819–835.","bibtex":"@article{Mahnken_Kuhl_2002, title={Parameter identification of gradient enhanced damage models with the finite element method}, volume={18}, DOI={<a href=\"https://doi.org/10.1016/s0997-7538(99)00127-8\">10.1016/s0997-7538(99)00127-8</a>}, number={5}, journal={European Journal of Mechanics - A/Solids}, publisher={Elsevier BV}, author={Mahnken, Rolf and Kuhl, Ellen}, year={2002}, pages={819–835} }","mla":"Mahnken, Rolf, and Ellen Kuhl. “Parameter Identification of Gradient Enhanced Damage Models with the Finite Element Method.” <i>European Journal of Mechanics - A/Solids</i>, vol. 18, no. 5, Elsevier BV, 2002, pp. 819–35, doi:<a href=\"https://doi.org/10.1016/s0997-7538(99)00127-8\">10.1016/s0997-7538(99)00127-8</a>.","apa":"Mahnken, R., &#38; Kuhl, E. (2002). Parameter identification of gradient enhanced damage models with the finite element method. <i>European Journal of Mechanics - A/Solids</i>, <i>18</i>(5), 819–835. <a href=\"https://doi.org/10.1016/s0997-7538(99)00127-8\">https://doi.org/10.1016/s0997-7538(99)00127-8</a>","ama":"Mahnken R, Kuhl E. Parameter identification of gradient enhanced damage models with the finite element method. <i>European Journal of Mechanics - A/Solids</i>. 2002;18(5):819-835. doi:<a href=\"https://doi.org/10.1016/s0997-7538(99)00127-8\">10.1016/s0997-7538(99)00127-8</a>","ieee":"R. Mahnken and E. Kuhl, “Parameter identification of gradient enhanced damage models with the finite element method,” <i>European Journal of Mechanics - A/Solids</i>, vol. 18, no. 5, pp. 819–835, 2002, doi: <a href=\"https://doi.org/10.1016/s0997-7538(99)00127-8\">10.1016/s0997-7538(99)00127-8</a>.","chicago":"Mahnken, Rolf, and Ellen Kuhl. “Parameter Identification of Gradient Enhanced Damage Models with the Finite Element Method.” <i>European Journal of Mechanics - A/Solids</i> 18, no. 5 (2002): 819–35. <a href=\"https://doi.org/10.1016/s0997-7538(99)00127-8\">https://doi.org/10.1016/s0997-7538(99)00127-8</a>."},"publication_identifier":{"issn":["0997-7538"]},"publication_status":"published","doi":"10.1016/s0997-7538(99)00127-8","date_updated":"2023-05-31T12:17:11Z","volume":18,"author":[{"first_name":"Rolf","id":"335","full_name":"Mahnken, Rolf","last_name":"Mahnken"},{"first_name":"Ellen","full_name":"Kuhl, Ellen","last_name":"Kuhl"}]},{"doi":"10.1016/0045-7825(96)00991-7","date_updated":"2023-05-31T12:23:36Z","volume":136,"author":[{"first_name":"Rolf","full_name":"Mahnken, Rolf","id":"335","last_name":"Mahnken"},{"first_name":"Erwin","full_name":"Stein, Erwin","last_name":"Stein"}],"intvolume":"       136","page":"225-258","citation":{"chicago":"Mahnken, Rolf, and Erwin Stein. “A Unified Approach for Parameter Identification of Inelastic Material Models in the Frame of the Finite Element Method.” <i>Computer Methods in Applied Mechanics and Engineering</i> 136, no. 3–4 (2002): 225–58. <a href=\"https://doi.org/10.1016/0045-7825(96)00991-7\">https://doi.org/10.1016/0045-7825(96)00991-7</a>.","ieee":"R. Mahnken and E. Stein, “A unified approach for parameter identification of inelastic material models in the frame of the finite element method,” <i>Computer Methods in Applied Mechanics and Engineering</i>, vol. 136, no. 3–4, pp. 225–258, 2002, doi: <a href=\"https://doi.org/10.1016/0045-7825(96)00991-7\">10.1016/0045-7825(96)00991-7</a>.","ama":"Mahnken R, Stein E. A unified approach for parameter identification of inelastic material models in the frame of the finite element method. <i>Computer Methods in Applied Mechanics and Engineering</i>. 2002;136(3-4):225-258. doi:<a href=\"https://doi.org/10.1016/0045-7825(96)00991-7\">10.1016/0045-7825(96)00991-7</a>","bibtex":"@article{Mahnken_Stein_2002, title={A unified approach for parameter identification of inelastic material models in the frame of the finite element method}, volume={136}, DOI={<a href=\"https://doi.org/10.1016/0045-7825(96)00991-7\">10.1016/0045-7825(96)00991-7</a>}, number={3–4}, journal={Computer Methods in Applied Mechanics and Engineering}, publisher={Elsevier BV}, author={Mahnken, Rolf and Stein, Erwin}, year={2002}, pages={225–258} }","short":"R. Mahnken, E. Stein, Computer Methods in Applied Mechanics and Engineering 136 (2002) 225–258.","mla":"Mahnken, Rolf, and Erwin Stein. “A Unified Approach for Parameter Identification of Inelastic Material Models in the Frame of the Finite Element Method.” <i>Computer Methods in Applied Mechanics and Engineering</i>, vol. 136, no. 3–4, Elsevier BV, 2002, pp. 225–58, doi:<a href=\"https://doi.org/10.1016/0045-7825(96)00991-7\">10.1016/0045-7825(96)00991-7</a>.","apa":"Mahnken, R., &#38; Stein, E. (2002). A unified approach for parameter identification of inelastic material models in the frame of the finite element method. <i>Computer Methods in Applied Mechanics and Engineering</i>, <i>136</i>(3–4), 225–258. <a href=\"https://doi.org/10.1016/0045-7825(96)00991-7\">https://doi.org/10.1016/0045-7825(96)00991-7</a>"},"publication_identifier":{"issn":["0045-7825"]},"publication_status":"published","_id":"45429","department":[{"_id":"9"},{"_id":"154"}],"user_id":"335","status":"public","type":"journal_article","title":"A unified approach for parameter identification of inelastic material models in the frame of the finite element method","publisher":"Elsevier BV","date_created":"2023-05-31T12:22:58Z","year":"2002","quality_controlled":"1","issue":"3-4","keyword":["Computer Science Applications","General Physics and Astronomy","Mechanical Engineering","Mechanics of Materials","Computational Mechanics"],"language":[{"iso":"eng"}],"publication":"Computer Methods in Applied Mechanics and Engineering"},{"keyword":["Computer Science Applications","Mechanics of Materials","Condensed Matter Physics","General Materials Science","Modeling and Simulation"],"language":[{"iso":"eng"}],"_id":"45432","department":[{"_id":"9"},{"_id":"154"}],"user_id":"335","status":"public","publication":"Modelling and Simulation in Materials Science and Engineering","type":"journal_article","title":"The identification of parameters for visco-plastic models via finite-element methods and gradient methods","doi":"10.1088/0965-0393/2/3a/013","date_updated":"2023-05-31T12:28:27Z","publisher":"IOP Publishing","volume":2,"date_created":"2023-05-31T12:28:01Z","author":[{"first_name":"Rolf","id":"335","full_name":"Mahnken, Rolf","last_name":"Mahnken"},{"first_name":"E","last_name":"Stein","full_name":"Stein, E"}],"year":"2002","page":"597-616","intvolume":"         2","citation":{"ieee":"R. Mahnken and E. Stein, “The identification of parameters for visco-plastic models via finite-element methods and gradient methods,” <i>Modelling and Simulation in Materials Science and Engineering</i>, vol. 2, no. 3A, pp. 597–616, 2002, doi: <a href=\"https://doi.org/10.1088/0965-0393/2/3a/013\">10.1088/0965-0393/2/3a/013</a>.","chicago":"Mahnken, Rolf, and E Stein. “The Identification of Parameters for Visco-Plastic Models via Finite-Element Methods and Gradient Methods.” <i>Modelling and Simulation in Materials Science and Engineering</i> 2, no. 3A (2002): 597–616. <a href=\"https://doi.org/10.1088/0965-0393/2/3a/013\">https://doi.org/10.1088/0965-0393/2/3a/013</a>.","ama":"Mahnken R, Stein E. The identification of parameters for visco-plastic models via finite-element methods and gradient methods. <i>Modelling and Simulation in Materials Science and Engineering</i>. 2002;2(3A):597-616. doi:<a href=\"https://doi.org/10.1088/0965-0393/2/3a/013\">10.1088/0965-0393/2/3a/013</a>","mla":"Mahnken, Rolf, and E. Stein. “The Identification of Parameters for Visco-Plastic Models via Finite-Element Methods and Gradient Methods.” <i>Modelling and Simulation in Materials Science and Engineering</i>, vol. 2, no. 3A, IOP Publishing, 2002, pp. 597–616, doi:<a href=\"https://doi.org/10.1088/0965-0393/2/3a/013\">10.1088/0965-0393/2/3a/013</a>.","short":"R. Mahnken, E. Stein, Modelling and Simulation in Materials Science and Engineering 2 (2002) 597–616.","bibtex":"@article{Mahnken_Stein_2002, title={The identification of parameters for visco-plastic models via finite-element methods and gradient methods}, volume={2}, DOI={<a href=\"https://doi.org/10.1088/0965-0393/2/3a/013\">10.1088/0965-0393/2/3a/013</a>}, number={3A}, journal={Modelling and Simulation in Materials Science and Engineering}, publisher={IOP Publishing}, author={Mahnken, Rolf and Stein, E}, year={2002}, pages={597–616} }","apa":"Mahnken, R., &#38; Stein, E. (2002). The identification of parameters for visco-plastic models via finite-element methods and gradient methods. <i>Modelling and Simulation in Materials Science and Engineering</i>, <i>2</i>(3A), 597–616. <a href=\"https://doi.org/10.1088/0965-0393/2/3a/013\">https://doi.org/10.1088/0965-0393/2/3a/013</a>"},"publication_identifier":{"issn":["0965-0393","1361-651X"]},"quality_controlled":"1","publication_status":"published","issue":"3A"},{"language":[{"iso":"eng"}],"keyword":["Computer Science Applications","General Physics and Astronomy","Mechanical Engineering","Mechanics of Materials","Computational Mechanics"],"user_id":"335","department":[{"_id":"9"},{"_id":"154"}],"_id":"45428","status":"public","type":"journal_article","publication":"Computer Methods in Applied Mechanics and Engineering","doi":"10.1016/s0045-7825(97)00008-x","title":"Parameter identification for finite deformation elasto-plasticity in principal directions","date_created":"2023-05-31T12:21:53Z","author":[{"last_name":"Mahnken","full_name":"Mahnken, Rolf","id":"335","first_name":"Rolf"},{"last_name":"Stein","full_name":"Stein, Erwin","first_name":"Erwin"}],"volume":147,"publisher":"Elsevier BV","date_updated":"2023-05-31T12:22:12Z","citation":{"chicago":"Mahnken, Rolf, and Erwin Stein. “Parameter Identification for Finite Deformation Elasto-Plasticity in Principal Directions.” <i>Computer Methods in Applied Mechanics and Engineering</i> 147, no. 1–2 (2002): 17–39. <a href=\"https://doi.org/10.1016/s0045-7825(97)00008-x\">https://doi.org/10.1016/s0045-7825(97)00008-x</a>.","ieee":"R. Mahnken and E. Stein, “Parameter identification for finite deformation elasto-plasticity in principal directions,” <i>Computer Methods in Applied Mechanics and Engineering</i>, vol. 147, no. 1–2, pp. 17–39, 2002, doi: <a href=\"https://doi.org/10.1016/s0045-7825(97)00008-x\">10.1016/s0045-7825(97)00008-x</a>.","ama":"Mahnken R, Stein E. Parameter identification for finite deformation elasto-plasticity in principal directions. <i>Computer Methods in Applied Mechanics and Engineering</i>. 2002;147(1-2):17-39. doi:<a href=\"https://doi.org/10.1016/s0045-7825(97)00008-x\">10.1016/s0045-7825(97)00008-x</a>","apa":"Mahnken, R., &#38; Stein, E. (2002). Parameter identification for finite deformation elasto-plasticity in principal directions. <i>Computer Methods in Applied Mechanics and Engineering</i>, <i>147</i>(1–2), 17–39. <a href=\"https://doi.org/10.1016/s0045-7825(97)00008-x\">https://doi.org/10.1016/s0045-7825(97)00008-x</a>","mla":"Mahnken, Rolf, and Erwin Stein. “Parameter Identification for Finite Deformation Elasto-Plasticity in Principal Directions.” <i>Computer Methods in Applied Mechanics and Engineering</i>, vol. 147, no. 1–2, Elsevier BV, 2002, pp. 17–39, doi:<a href=\"https://doi.org/10.1016/s0045-7825(97)00008-x\">10.1016/s0045-7825(97)00008-x</a>.","short":"R. Mahnken, E. Stein, Computer Methods in Applied Mechanics and Engineering 147 (2002) 17–39.","bibtex":"@article{Mahnken_Stein_2002, title={Parameter identification for finite deformation elasto-plasticity in principal directions}, volume={147}, DOI={<a href=\"https://doi.org/10.1016/s0045-7825(97)00008-x\">10.1016/s0045-7825(97)00008-x</a>}, number={1–2}, journal={Computer Methods in Applied Mechanics and Engineering}, publisher={Elsevier BV}, author={Mahnken, Rolf and Stein, Erwin}, year={2002}, pages={17–39} }"},"page":"17-39","intvolume":"       147","year":"2002","issue":"1-2","publication_status":"published","publication_identifier":{"issn":["0045-7825"]},"quality_controlled":"1"},{"extern":"1","article_type":"original","department":[{"_id":"2"},{"_id":"315"}],"user_id":"466","_id":"35365","status":"public","type":"journal_article","doi":"10.1122/1.1332387","volume":45,"author":[{"first_name":"Thomas","full_name":"Thiele, Thomas","last_name":"Thiele"},{"last_name":"Berret","full_name":"Berret, J.-F.","first_name":"J.-F."},{"full_name":"Müller, Stefan","last_name":"Müller","first_name":"Stefan"},{"id":"466","full_name":"Schmidt, Claudia","orcid":"0000-0003-3179-9997","last_name":"Schmidt","first_name":"Claudia"}],"date_updated":"2023-01-07T11:18:40Z","page":"29-48","intvolume":"        45","citation":{"apa":"Thiele, T., Berret, J.-F., Müller, S., &#38; Schmidt, C. (2001). Rheology and nuclear magnetic resonance measurements under shear of sodium dodecyl sulfate/decanol/water nematics. <i>Journal of Rheology</i>, <i>45</i>(1), 29–48. <a href=\"https://doi.org/10.1122/1.1332387\">https://doi.org/10.1122/1.1332387</a>","mla":"Thiele, Thomas, et al. “Rheology and Nuclear Magnetic Resonance Measurements under Shear of Sodium Dodecyl Sulfate/Decanol/Water Nematics.” <i>Journal of Rheology</i>, vol. 45, no. 1, Society of Rheology, 2001, pp. 29–48, doi:<a href=\"https://doi.org/10.1122/1.1332387\">10.1122/1.1332387</a>.","short":"T. Thiele, J.-F. Berret, S. Müller, C. Schmidt, Journal of Rheology 45 (2001) 29–48.","bibtex":"@article{Thiele_Berret_Müller_Schmidt_2001, title={Rheology and nuclear magnetic resonance measurements under shear of sodium dodecyl sulfate/decanol/water nematics}, volume={45}, DOI={<a href=\"https://doi.org/10.1122/1.1332387\">10.1122/1.1332387</a>}, number={1}, journal={Journal of Rheology}, publisher={Society of Rheology}, author={Thiele, Thomas and Berret, J.-F. and Müller, Stefan and Schmidt, Claudia}, year={2001}, pages={29–48} }","ama":"Thiele T, Berret J-F, Müller S, Schmidt C. Rheology and nuclear magnetic resonance measurements under shear of sodium dodecyl sulfate/decanol/water nematics. <i>Journal of Rheology</i>. 2001;45(1):29-48. doi:<a href=\"https://doi.org/10.1122/1.1332387\">10.1122/1.1332387</a>","chicago":"Thiele, Thomas, J.-F. Berret, Stefan Müller, and Claudia Schmidt. “Rheology and Nuclear Magnetic Resonance Measurements under Shear of Sodium Dodecyl Sulfate/Decanol/Water Nematics.” <i>Journal of Rheology</i> 45, no. 1 (2001): 29–48. <a href=\"https://doi.org/10.1122/1.1332387\">https://doi.org/10.1122/1.1332387</a>.","ieee":"T. Thiele, J.-F. Berret, S. Müller, and C. Schmidt, “Rheology and nuclear magnetic resonance measurements under shear of sodium dodecyl sulfate/decanol/water nematics,” <i>Journal of Rheology</i>, vol. 45, no. 1, pp. 29–48, 2001, doi: <a href=\"https://doi.org/10.1122/1.1332387\">10.1122/1.1332387</a>."},"publication_identifier":{"issn":["0148-6055","1520-8516"]},"publication_status":"published","language":[{"iso":"eng"}],"keyword":["Mechanical Engineering","Mechanics of Materials","Condensed Matter Physics","General Materials Science"],"publication":"Journal of Rheology","title":"Rheology and nuclear magnetic resonance measurements under shear of sodium dodecyl sulfate/decanol/water nematics","date_created":"2023-01-06T13:17:10Z","publisher":"Society of Rheology","year":"2001","issue":"1","quality_controlled":"1"},{"year":"2000","page":"95-106","intvolume":"       243","citation":{"ama":"Glossmann J, Hoischen A, Roder T, Kitzerow H-S. Asymmetric switching and storage effects in ferroelectric and antiferroelectric gels and polymers. <i>Ferroelectrics</i>. 2000;243(1):95-106. doi:<a href=\"https://doi.org/10.1080/00150190008008011\">10.1080/00150190008008011</a>","ieee":"J. Glossmann, A. Hoischen, T. Roder, and H.-S. Kitzerow, “Asymmetric switching and storage effects in ferroelectric and antiferroelectric gels and polymers,” <i>Ferroelectrics</i>, vol. 243, no. 1, pp. 95–106, 2000, doi: <a href=\"https://doi.org/10.1080/00150190008008011\">10.1080/00150190008008011</a>.","chicago":"Glossmann, Jochen, Andreas Hoischen, Thorsten Roder, and Heinz-Siegfried Kitzerow. “Asymmetric Switching and Storage Effects in Ferroelectric and Antiferroelectric Gels and Polymers.” <i>Ferroelectrics</i> 243, no. 1 (2000): 95–106. <a href=\"https://doi.org/10.1080/00150190008008011\">https://doi.org/10.1080/00150190008008011</a>.","mla":"Glossmann, Jochen, et al. “Asymmetric Switching and Storage Effects in Ferroelectric and Antiferroelectric Gels and Polymers.” <i>Ferroelectrics</i>, vol. 243, no. 1, Informa UK Limited, 2000, pp. 95–106, doi:<a href=\"https://doi.org/10.1080/00150190008008011\">10.1080/00150190008008011</a>.","short":"J. Glossmann, A. Hoischen, T. Roder, H.-S. Kitzerow, Ferroelectrics 243 (2000) 95–106.","bibtex":"@article{Glossmann_Hoischen_Roder_Kitzerow_2000, title={Asymmetric switching and storage effects in ferroelectric and antiferroelectric gels and polymers}, volume={243}, DOI={<a href=\"https://doi.org/10.1080/00150190008008011\">10.1080/00150190008008011</a>}, number={1}, journal={Ferroelectrics}, publisher={Informa UK Limited}, author={Glossmann, Jochen and Hoischen, Andreas and Roder, Thorsten and Kitzerow, Heinz-Siegfried}, year={2000}, pages={95–106} }","apa":"Glossmann, J., Hoischen, A., Roder, T., &#38; Kitzerow, H.-S. (2000). Asymmetric switching and storage effects in ferroelectric and antiferroelectric gels and polymers. <i>Ferroelectrics</i>, <i>243</i>(1), 95–106. <a href=\"https://doi.org/10.1080/00150190008008011\">https://doi.org/10.1080/00150190008008011</a>"},"publication_identifier":{"issn":["0015-0193","1563-5112"]},"publication_status":"published","issue":"1","title":"Asymmetric switching and storage effects in ferroelectric and antiferroelectric gels and polymers","doi":"10.1080/00150190008008011","publisher":"Informa UK Limited","date_updated":"2023-01-25T16:41:08Z","volume":243,"date_created":"2023-01-25T16:34:10Z","author":[{"full_name":"Glossmann, Jochen","last_name":"Glossmann","first_name":"Jochen"},{"first_name":"Andreas","last_name":"Hoischen","full_name":"Hoischen, Andreas"},{"first_name":"Thorsten","full_name":"Roder, Thorsten","last_name":"Roder"},{"id":"254","full_name":"Kitzerow, Heinz-Siegfried","last_name":"Kitzerow","first_name":"Heinz-Siegfried"}],"status":"public","publication":"Ferroelectrics","type":"journal_article","keyword":["Condensed Matter Physics","Electronic","Optical and Magnetic Materials"],"language":[{"iso":"eng"}],"_id":"40083","department":[{"_id":"313"},{"_id":"638"}],"user_id":"254"},{"doi":"10.1021/la9903649","title":"Time-Resolved Recording of Ionic Dyestuff Aggregation by Static Light Scattering","date_created":"2023-02-13T13:02:06Z","author":[{"first_name":"Sergio Escudero","last_name":"Inglés","full_name":"Inglés, Sergio Escudero"},{"full_name":"Katzenstein, Armin","last_name":"Katzenstein","first_name":"Armin"},{"last_name":"Schlenker","full_name":"Schlenker, Wolfgang","first_name":"Wolfgang"},{"full_name":"Huber, Klaus","id":"237","last_name":"Huber","first_name":"Klaus"}],"volume":16,"date_updated":"2023-02-13T13:15:20Z","publisher":"American Chemical Society (ACS)","citation":{"ieee":"S. E. Inglés, A. Katzenstein, W. Schlenker, and K. Huber, “Time-Resolved Recording of Ionic Dyestuff Aggregation by Static Light Scattering,” <i>Langmuir</i>, vol. 16, no. 7, pp. 3010–3018, 2000, doi: <a href=\"https://doi.org/10.1021/la9903649\">10.1021/la9903649</a>.","chicago":"Inglés, Sergio Escudero, Armin Katzenstein, Wolfgang Schlenker, and Klaus Huber. “Time-Resolved Recording of Ionic Dyestuff Aggregation by Static Light Scattering.” <i>Langmuir</i> 16, no. 7 (2000): 3010–18. <a href=\"https://doi.org/10.1021/la9903649\">https://doi.org/10.1021/la9903649</a>.","ama":"Inglés SE, Katzenstein A, Schlenker W, Huber K. Time-Resolved Recording of Ionic Dyestuff Aggregation by Static Light Scattering. <i>Langmuir</i>. 2000;16(7):3010-3018. doi:<a href=\"https://doi.org/10.1021/la9903649\">10.1021/la9903649</a>","mla":"Inglés, Sergio Escudero, et al. “Time-Resolved Recording of Ionic Dyestuff Aggregation by Static Light Scattering.” <i>Langmuir</i>, vol. 16, no. 7, American Chemical Society (ACS), 2000, pp. 3010–18, doi:<a href=\"https://doi.org/10.1021/la9903649\">10.1021/la9903649</a>.","short":"S.E. Inglés, A. Katzenstein, W. Schlenker, K. Huber, Langmuir 16 (2000) 3010–3018.","bibtex":"@article{Inglés_Katzenstein_Schlenker_Huber_2000, title={Time-Resolved Recording of Ionic Dyestuff Aggregation by Static Light Scattering}, volume={16}, DOI={<a href=\"https://doi.org/10.1021/la9903649\">10.1021/la9903649</a>}, number={7}, journal={Langmuir}, publisher={American Chemical Society (ACS)}, author={Inglés, Sergio Escudero and Katzenstein, Armin and Schlenker, Wolfgang and Huber, Klaus}, year={2000}, pages={3010–3018} }","apa":"Inglés, S. E., Katzenstein, A., Schlenker, W., &#38; Huber, K. (2000). Time-Resolved Recording of Ionic Dyestuff Aggregation by Static Light Scattering. <i>Langmuir</i>, <i>16</i>(7), 3010–3018. <a href=\"https://doi.org/10.1021/la9903649\">https://doi.org/10.1021/la9903649</a>"},"page":"3010-3018","intvolume":"        16","year":"2000","issue":"7","publication_status":"published","publication_identifier":{"issn":["0743-7463","1520-5827"]},"language":[{"iso":"eng"}],"keyword":["Electrochemistry","Spectroscopy","Surfaces and Interfaces","Condensed Matter Physics","General Materials Science"],"user_id":"237","department":[{"_id":"314"}],"_id":"42051","status":"public","type":"journal_article","publication":"Langmuir"},{"status":"public","type":"journal_article","publication":"Rheologica Acta","article_type":"original","keyword":["Condensed Matter Physics","General Materials Science"],"language":[{"iso":"eng"}],"_id":"35370","user_id":"466","department":[{"_id":"2"},{"_id":"315"}],"year":"1999","citation":{"apa":"Schmidt, G., Müller, S., Schmidt, C., &#38; Richtering, W. (1999). Rheo-optical investigations of lyotropic mesophases of polymeric surfactants. <i>Rheologica Acta</i>, <i>38</i>(6), 486–494. <a href=\"https://doi.org/10.1007/s003970050201\">https://doi.org/10.1007/s003970050201</a>","bibtex":"@article{Schmidt_Müller_Schmidt_Richtering_1999, title={Rheo-optical investigations of lyotropic mesophases of polymeric surfactants}, volume={38}, DOI={<a href=\"https://doi.org/10.1007/s003970050201\">10.1007/s003970050201</a>}, number={6}, journal={Rheologica Acta}, publisher={Springer Science and Business Media LLC}, author={Schmidt, Gudrun and Müller, Stefan and Schmidt, Claudia and Richtering, Walter}, year={1999}, pages={486–494} }","short":"G. Schmidt, S. Müller, C. Schmidt, W. Richtering, Rheologica Acta 38 (1999) 486–494.","mla":"Schmidt, Gudrun, et al. “Rheo-Optical Investigations of Lyotropic Mesophases of Polymeric Surfactants.” <i>Rheologica Acta</i>, vol. 38, no. 6, Springer Science and Business Media LLC, 1999, pp. 486–94, doi:<a href=\"https://doi.org/10.1007/s003970050201\">10.1007/s003970050201</a>.","chicago":"Schmidt, Gudrun, Stefan Müller, Claudia Schmidt, and Walter Richtering. “Rheo-Optical Investigations of Lyotropic Mesophases of Polymeric Surfactants.” <i>Rheologica Acta</i> 38, no. 6 (1999): 486–94. <a href=\"https://doi.org/10.1007/s003970050201\">https://doi.org/10.1007/s003970050201</a>.","ieee":"G. Schmidt, S. Müller, C. Schmidt, and W. Richtering, “Rheo-optical investigations of lyotropic mesophases of polymeric surfactants,” <i>Rheologica Acta</i>, vol. 38, no. 6, pp. 486–494, 1999, doi: <a href=\"https://doi.org/10.1007/s003970050201\">10.1007/s003970050201</a>.","ama":"Schmidt G, Müller S, Schmidt C, Richtering W. Rheo-optical investigations of lyotropic mesophases of polymeric surfactants. <i>Rheologica Acta</i>. 1999;38(6):486-494. doi:<a href=\"https://doi.org/10.1007/s003970050201\">10.1007/s003970050201</a>"},"intvolume":"        38","page":"486-494","publication_status":"published","quality_controlled":"1","publication_identifier":{"issn":["0035-4511","1435-1528"]},"issue":"6","title":"Rheo-optical investigations of lyotropic mesophases of polymeric surfactants","doi":"10.1007/s003970050201","date_updated":"2023-01-07T11:15:09Z","publisher":"Springer Science and Business Media LLC","author":[{"full_name":"Schmidt, Gudrun","last_name":"Schmidt","first_name":"Gudrun"},{"first_name":"Stefan","last_name":"Müller","full_name":"Müller, Stefan"},{"last_name":"Schmidt","orcid":"0000-0003-3179-9997","id":"466","full_name":"Schmidt, Claudia","first_name":"Claudia"},{"full_name":"Richtering, Walter","last_name":"Richtering","first_name":"Walter"}],"date_created":"2023-01-06T13:18:58Z","volume":38},{"extern":"1","language":[{"iso":"eng"}],"keyword":["Condensed Matter Physics","General Materials Science"],"user_id":"466","department":[{"_id":"2"},{"_id":"315"}],"_id":"35368","status":"public","editor":[{"orcid":"0000-0003-3179-9997","last_name":"Schmidt","full_name":"Schmidt, Claudia","id":"466","first_name":"Claudia"},{"full_name":"Navard, Patrick","last_name":"Navard","first_name":"Patrick"}],"type":"conference_editor","doi":"10.1007/s003970050200","title":"EURORHEO 99-1 in Sophia-Antipolis, France","date_created":"2023-01-06T13:18:26Z","volume":38,"date_updated":"2023-01-07T11:14:26Z","publisher":"Springer Science and Business Media LLC","citation":{"chicago":"Schmidt, Claudia, and Patrick Navard, eds. <i>EURORHEO 99-1 in Sophia-Antipolis, France</i>. Vol. 38. Springer Science and Business Media LLC, 1999. <a href=\"https://doi.org/10.1007/s003970050200\">https://doi.org/10.1007/s003970050200</a>.","ieee":"C. Schmidt and P. Navard, Eds., <i>EURORHEO 99-1 in Sophia-Antipolis, France</i>, vol. 38, no. 6. Springer Science and Business Media LLC, 1999, pp. 485–485.","ama":"Schmidt C, Navard P, eds. <i>EURORHEO 99-1 in Sophia-Antipolis, France</i>. Vol 38. Springer Science and Business Media LLC; 1999:485-485. doi:<a href=\"https://doi.org/10.1007/s003970050200\">10.1007/s003970050200</a>","apa":"Schmidt, C., &#38; Navard, P. (Eds.). (1999). <i>EURORHEO 99-1 in Sophia-Antipolis, France</i> (Vol. 38, Issue 6, pp. 485–485). Springer Science and Business Media LLC. <a href=\"https://doi.org/10.1007/s003970050200\">https://doi.org/10.1007/s003970050200</a>","bibtex":"@book{Schmidt_Navard_1999, title={EURORHEO 99-1 in Sophia-Antipolis, France}, volume={38}, DOI={<a href=\"https://doi.org/10.1007/s003970050200\">10.1007/s003970050200</a>}, number={6}, publisher={Springer Science and Business Media LLC}, year={1999}, pages={485–485} }","mla":"Schmidt, Claudia, and Patrick Navard, editors. <i>EURORHEO 99-1 in Sophia-Antipolis, France</i>. no. 6, Springer Science and Business Media LLC, 1999, pp. 485–485, doi:<a href=\"https://doi.org/10.1007/s003970050200\">10.1007/s003970050200</a>.","short":"C. Schmidt, P. Navard, eds., EURORHEO 99-1 in Sophia-Antipolis, France, Springer Science and Business Media LLC, 1999."},"page":"485-485","intvolume":"        38","year":"1999","issue":"6","publication_status":"published","publication_identifier":{"issn":["0035-4511","1435-1528"]}},{"department":[{"_id":"2"},{"_id":"315"}],"user_id":"466","_id":"35371","extern":"1","article_type":"original","type":"journal_article","status":"public","volume":15,"author":[{"first_name":"Stefan","full_name":"Müller, Stefan","last_name":"Müller"},{"full_name":"Börschig, Claus","last_name":"Börschig","first_name":"Claus"},{"last_name":"Gronski","full_name":"Gronski, Wolfram","first_name":"Wolfram"},{"first_name":"Claudia","orcid":"0000-0003-3179-9997","last_name":"Schmidt","id":"466","full_name":"Schmidt, Claudia"},{"first_name":"Didier","last_name":"Roux","full_name":"Roux, Didier"}],"date_updated":"2023-01-07T11:16:35Z","doi":"10.1021/la9904105","publication_identifier":{"issn":["0743-7463","1520-5827"]},"publication_status":"published","intvolume":"        15","page":"7558-7564","citation":{"chicago":"Müller, Stefan, Claus Börschig, Wolfram Gronski, Claudia Schmidt, and Didier Roux. “Shear-Induced States of Orientation of the Lamellar Phase of C<sub>12</sub>E<sub>4</sub>/Water.” <i>Langmuir</i> 15, no. 22 (1999): 7558–64. <a href=\"https://doi.org/10.1021/la9904105\">https://doi.org/10.1021/la9904105</a>.","ieee":"S. Müller, C. Börschig, W. Gronski, C. Schmidt, and D. Roux, “Shear-Induced States of Orientation of the Lamellar Phase of C<sub>12</sub>E<sub>4</sub>/Water,” <i>Langmuir</i>, vol. 15, no. 22, pp. 7558–7564, 1999, doi: <a href=\"https://doi.org/10.1021/la9904105\">10.1021/la9904105</a>.","ama":"Müller S, Börschig C, Gronski W, Schmidt C, Roux D. Shear-Induced States of Orientation of the Lamellar Phase of C<sub>12</sub>E<sub>4</sub>/Water. <i>Langmuir</i>. 1999;15(22):7558-7564. doi:<a href=\"https://doi.org/10.1021/la9904105\">10.1021/la9904105</a>","short":"S. Müller, C. Börschig, W. Gronski, C. Schmidt, D. Roux, Langmuir 15 (1999) 7558–7564.","bibtex":"@article{Müller_Börschig_Gronski_Schmidt_Roux_1999, title={Shear-Induced States of Orientation of the Lamellar Phase of C<sub>12</sub>E<sub>4</sub>/Water}, volume={15}, DOI={<a href=\"https://doi.org/10.1021/la9904105\">10.1021/la9904105</a>}, number={22}, journal={Langmuir}, publisher={American Chemical Society (ACS)}, author={Müller, Stefan and Börschig, Claus and Gronski, Wolfram and Schmidt, Claudia and Roux, Didier}, year={1999}, pages={7558–7564} }","mla":"Müller, Stefan, et al. “Shear-Induced States of Orientation of the Lamellar Phase of C<sub>12</sub>E<sub>4</sub>/Water.” <i>Langmuir</i>, vol. 15, no. 22, American Chemical Society (ACS), 1999, pp. 7558–64, doi:<a href=\"https://doi.org/10.1021/la9904105\">10.1021/la9904105</a>.","apa":"Müller, S., Börschig, C., Gronski, W., Schmidt, C., &#38; Roux, D. (1999). Shear-Induced States of Orientation of the Lamellar Phase of C<sub>12</sub>E<sub>4</sub>/Water. <i>Langmuir</i>, <i>15</i>(22), 7558–7564. <a href=\"https://doi.org/10.1021/la9904105\">https://doi.org/10.1021/la9904105</a>"},"language":[{"iso":"eng"}],"keyword":["Electrochemistry","Spectroscopy","Surfaces and Interfaces","Condensed Matter Physics","General Materials Science"],"publication":"Langmuir","date_created":"2023-01-06T13:19:10Z","publisher":"American Chemical Society (ACS)","title":"Shear-Induced States of Orientation of the Lamellar Phase of C<sub>12</sub>E<sub>4</sub>/Water","issue":"22","quality_controlled":"1","year":"1999"},{"language":[{"iso":"eng"}],"keyword":["Physical and Theoretical Chemistry","General Physics and Astronomy"],"publication":"The Journal of Chemical Physics","date_created":"2023-01-06T13:18:12Z","publisher":"AIP Publishing","title":"Determination of orientational distributions from 2H NMR data by a regularization method","issue":"8","quality_controlled":"1","year":"1999","user_id":"466","department":[{"_id":"2"},{"_id":"315"}],"_id":"35367","extern":"1","article_type":"original","type":"journal_article","status":"public","author":[{"first_name":"J.","last_name":"Winterhalter","full_name":"Winterhalter, J."},{"last_name":"Maier","full_name":"Maier, D.","first_name":"D."},{"full_name":"Grabowski, D. A.","last_name":"Grabowski","first_name":"D. A."},{"full_name":"Honerkamp, J.","last_name":"Honerkamp","first_name":"J."},{"last_name":"Müller","full_name":"Müller, S.","first_name":"S."},{"first_name":"Claudia","id":"466","full_name":"Schmidt, Claudia","last_name":"Schmidt","orcid":"0000-0003-3179-9997"}],"volume":110,"date_updated":"2023-01-07T11:15:48Z","doi":"10.1063/1.478285","publication_status":"published","publication_identifier":{"issn":["0021-9606","1089-7690"]},"citation":{"ama":"Winterhalter J, Maier D, Grabowski DA, Honerkamp J, Müller S, Schmidt C. Determination of orientational distributions from 2H NMR data by a regularization method. <i>The Journal of Chemical Physics</i>. 1999;110(8):4035-4046. doi:<a href=\"https://doi.org/10.1063/1.478285\">10.1063/1.478285</a>","ieee":"J. Winterhalter, D. Maier, D. A. Grabowski, J. Honerkamp, S. Müller, and C. Schmidt, “Determination of orientational distributions from 2H NMR data by a regularization method,” <i>The Journal of Chemical Physics</i>, vol. 110, no. 8, pp. 4035–4046, 1999, doi: <a href=\"https://doi.org/10.1063/1.478285\">10.1063/1.478285</a>.","chicago":"Winterhalter, J., D. Maier, D. A. Grabowski, J. Honerkamp, S. Müller, and Claudia Schmidt. “Determination of Orientational Distributions from 2H NMR Data by a Regularization Method.” <i>The Journal of Chemical Physics</i> 110, no. 8 (1999): 4035–46. <a href=\"https://doi.org/10.1063/1.478285\">https://doi.org/10.1063/1.478285</a>.","bibtex":"@article{Winterhalter_Maier_Grabowski_Honerkamp_Müller_Schmidt_1999, title={Determination of orientational distributions from 2H NMR data by a regularization method}, volume={110}, DOI={<a href=\"https://doi.org/10.1063/1.478285\">10.1063/1.478285</a>}, number={8}, journal={The Journal of Chemical Physics}, publisher={AIP Publishing}, author={Winterhalter, J. and Maier, D. and Grabowski, D. A. and Honerkamp, J. and Müller, S. and Schmidt, Claudia}, year={1999}, pages={4035–4046} }","short":"J. Winterhalter, D. Maier, D.A. Grabowski, J. Honerkamp, S. Müller, C. Schmidt, The Journal of Chemical Physics 110 (1999) 4035–4046.","mla":"Winterhalter, J., et al. “Determination of Orientational Distributions from 2H NMR Data by a Regularization Method.” <i>The Journal of Chemical Physics</i>, vol. 110, no. 8, AIP Publishing, 1999, pp. 4035–46, doi:<a href=\"https://doi.org/10.1063/1.478285\">10.1063/1.478285</a>.","apa":"Winterhalter, J., Maier, D., Grabowski, D. A., Honerkamp, J., Müller, S., &#38; Schmidt, C. (1999). Determination of orientational distributions from 2H NMR data by a regularization method. <i>The Journal of Chemical Physics</i>, <i>110</i>(8), 4035–4046. <a href=\"https://doi.org/10.1063/1.478285\">https://doi.org/10.1063/1.478285</a>"},"page":"4035-4046","intvolume":"       110"},{"status":"public","type":"journal_article","article_type":"original","extern":"1","_id":"35372","department":[{"_id":"2"},{"_id":"315"}],"user_id":"466","intvolume":"        38","page":"495-502","citation":{"ieee":"I. Quijada-Garrido, H. Siebert, P. Becker, C. Friedrich, and C. Schmidt, “Transient rheological behavior of tumbling side-chain liquid crystal polymers and determination of their λ parameters,” <i>Rheologica Acta</i>, vol. 38, no. 6, pp. 495–502, 1999, doi: <a href=\"https://doi.org/10.1007/s003970050202\">10.1007/s003970050202</a>.","chicago":"Quijada-Garrido, Isabel, Hartmut Siebert, Patrick Becker, Christian Friedrich, and Claudia Schmidt. “Transient Rheological Behavior of Tumbling Side-Chain Liquid Crystal Polymers and Determination of Their λ Parameters.” <i>Rheologica Acta</i> 38, no. 6 (1999): 495–502. <a href=\"https://doi.org/10.1007/s003970050202\">https://doi.org/10.1007/s003970050202</a>.","ama":"Quijada-Garrido I, Siebert H, Becker P, Friedrich C, Schmidt C. Transient rheological behavior of tumbling side-chain liquid crystal polymers and determination of their λ parameters. <i>Rheologica Acta</i>. 1999;38(6):495-502. doi:<a href=\"https://doi.org/10.1007/s003970050202\">10.1007/s003970050202</a>","apa":"Quijada-Garrido, I., Siebert, H., Becker, P., Friedrich, C., &#38; Schmidt, C. (1999). Transient rheological behavior of tumbling side-chain liquid crystal polymers and determination of their λ parameters. <i>Rheologica Acta</i>, <i>38</i>(6), 495–502. <a href=\"https://doi.org/10.1007/s003970050202\">https://doi.org/10.1007/s003970050202</a>","bibtex":"@article{Quijada-Garrido_Siebert_Becker_Friedrich_Schmidt_1999, title={Transient rheological behavior of tumbling side-chain liquid crystal polymers and determination of their λ parameters}, volume={38}, DOI={<a href=\"https://doi.org/10.1007/s003970050202\">10.1007/s003970050202</a>}, number={6}, journal={Rheologica Acta}, publisher={Springer Science and Business Media LLC}, author={Quijada-Garrido, Isabel and Siebert, Hartmut and Becker, Patrick and Friedrich, Christian and Schmidt, Claudia}, year={1999}, pages={495–502} }","mla":"Quijada-Garrido, Isabel, et al. “Transient Rheological Behavior of Tumbling Side-Chain Liquid Crystal Polymers and Determination of Their λ Parameters.” <i>Rheologica Acta</i>, vol. 38, no. 6, Springer Science and Business Media LLC, 1999, pp. 495–502, doi:<a href=\"https://doi.org/10.1007/s003970050202\">10.1007/s003970050202</a>.","short":"I. Quijada-Garrido, H. Siebert, P. Becker, C. Friedrich, C. Schmidt, Rheologica Acta 38 (1999) 495–502."},"publication_identifier":{"issn":["0035-4511","1435-1528"]},"publication_status":"published","doi":"10.1007/s003970050202","date_updated":"2023-01-07T11:44:32Z","volume":38,"author":[{"last_name":"Quijada-Garrido","full_name":"Quijada-Garrido, Isabel","first_name":"Isabel"},{"first_name":"Hartmut","full_name":"Siebert, Hartmut","last_name":"Siebert"},{"full_name":"Becker, Patrick","last_name":"Becker","first_name":"Patrick"},{"full_name":"Friedrich, Christian","last_name":"Friedrich","first_name":"Christian"},{"last_name":"Schmidt","orcid":"0000-0003-3179-9997","id":"466","full_name":"Schmidt, Claudia","first_name":"Claudia"}],"publication":"Rheologica Acta","keyword":["Condensed Matter Physics","General Materials Science"],"language":[{"iso":"eng"}],"year":"1999","quality_controlled":"1","issue":"6","title":"Transient rheological behavior of tumbling side-chain liquid crystal polymers and determination of their λ parameters","publisher":"Springer Science and Business Media LLC","date_created":"2023-01-06T13:19:25Z"},{"title":"Scalable System for 3D Audio Raytracing","doi":"10.1109/MMCS.1999.778592","date_updated":"2023-01-24T11:24:18Z","date_created":"2023-01-24T11:24:14Z","author":[{"full_name":"Müller, Wolfgang","id":"16243","last_name":"Müller","first_name":"Wolfgang"},{"full_name":"Ullmann, F.","last_name":"Ullmann","first_name":"F."}],"place":"Florence, Italy","year":"1999","citation":{"short":"W. Müller, F. Ullmann, in:  Proceedings IEEE International Conference on Multimedia Computing and Systems, Florence, Italy, 1999.","mla":"Müller, Wolfgang, and F. Ullmann. “Scalable System for 3D Audio Raytracing.” <i> Proceedings IEEE International Conference on Multimedia Computing and Systems</i>, 1999, doi:<a href=\"https://doi.org/10.1109/MMCS.1999.778592\">10.1109/MMCS.1999.778592</a>.","bibtex":"@inproceedings{Müller_Ullmann_1999, place={Florence, Italy}, title={Scalable System for 3D Audio Raytracing}, DOI={<a href=\"https://doi.org/10.1109/MMCS.1999.778592\">10.1109/MMCS.1999.778592</a>}, booktitle={ Proceedings IEEE International Conference on Multimedia Computing and Systems}, author={Müller, Wolfgang and Ullmann, F.}, year={1999} }","apa":"Müller, W., &#38; Ullmann, F. (1999). Scalable System for 3D Audio Raytracing. <i> Proceedings IEEE International Conference on Multimedia Computing and Systems</i>. <a href=\"https://doi.org/10.1109/MMCS.1999.778592\">https://doi.org/10.1109/MMCS.1999.778592</a>","ieee":"W. Müller and F. Ullmann, “Scalable System for 3D Audio Raytracing,” 1999, doi: <a href=\"https://doi.org/10.1109/MMCS.1999.778592\">10.1109/MMCS.1999.778592</a>.","chicago":"Müller, Wolfgang, and F. Ullmann. “Scalable System for 3D Audio Raytracing.” In <i> Proceedings IEEE International Conference on Multimedia Computing and Systems</i>. Florence, Italy, 1999. <a href=\"https://doi.org/10.1109/MMCS.1999.778592\">https://doi.org/10.1109/MMCS.1999.778592</a>.","ama":"Müller W, Ullmann F. Scalable System for 3D Audio Raytracing. In: <i> Proceedings IEEE International Conference on Multimedia Computing and Systems</i>. ; 1999. doi:<a href=\"https://doi.org/10.1109/MMCS.1999.778592\">10.1109/MMCS.1999.778592</a>"},"publication_identifier":{"isbn":["0-7695-0253-9"]},"keyword":["Ray tracing","Loudspeakers","Motion pictures","Acoustic reflection","Ear","Digital filters","Parallel processing","Humans","Physics","Crosstalk"],"language":[{"iso":"eng"}],"_id":"39477","department":[{"_id":"672"}],"user_id":"5786","abstract":[{"lang":"eng","text":"Though several approaches in sound processing are denoted as 3D audio very few of them generate high quality 3D audio information which allows listeners to exactly locate sound sources in three dimensional space. We present an approach to enhance sound by high quality 3D audio information through acoustic ray tracing where 3D audio is offline processed with digital filters of a head-related transfer function. The basic approach computes a fixed sound source for fixed listener. This approach is extended to generate 3D audio for moving listeners in interactive environments."}],"status":"public","publication":" Proceedings IEEE International Conference on Multimedia Computing and Systems","type":"conference"},{"publication":"Applied Physics B: Lasers and Optics","keyword":["General Physics and Astronomy","Physics and Astronomy (miscellaneous)","General Engineering"],"language":[{"iso":"eng"}],"issue":"3","year":"1998","publisher":"Springer Science and Business Media LLC","date_created":"2023-01-26T09:26:24Z","title":"Optical storage effect in a platinum orthometalated liquid crystal","type":"journal_article","status":"public","_id":"40226","department":[{"_id":"313"}],"user_id":"254","extern":"1","publication_identifier":{"issn":["0946-2171","1432-0649"]},"publication_status":"published","page":"355-358","intvolume":"        66","citation":{"ama":"Buey J, Díez L, Espinet P, Kitzerow H-S, Miguel JA. Optical storage effect in a platinum orthometalated liquid crystal. <i>Applied Physics B: Lasers and Optics</i>. 1998;66(3):355-358. doi:<a href=\"https://doi.org/10.1007/s003400050400\">10.1007/s003400050400</a>","ieee":"J. Buey, L. Díez, P. Espinet, H.-S. Kitzerow, and J. A. Miguel, “Optical storage effect in a platinum orthometalated liquid crystal,” <i>Applied Physics B: Lasers and Optics</i>, vol. 66, no. 3, pp. 355–358, 1998, doi: <a href=\"https://doi.org/10.1007/s003400050400\">10.1007/s003400050400</a>.","chicago":"Buey, J., L. Díez, P. Espinet, Heinz-Siegfried Kitzerow, and J.A. Miguel. “Optical Storage Effect in a Platinum Orthometalated Liquid Crystal.” <i>Applied Physics B: Lasers and Optics</i> 66, no. 3 (1998): 355–58. <a href=\"https://doi.org/10.1007/s003400050400\">https://doi.org/10.1007/s003400050400</a>.","mla":"Buey, J., et al. “Optical Storage Effect in a Platinum Orthometalated Liquid Crystal.” <i>Applied Physics B: Lasers and Optics</i>, vol. 66, no. 3, Springer Science and Business Media LLC, 1998, pp. 355–58, doi:<a href=\"https://doi.org/10.1007/s003400050400\">10.1007/s003400050400</a>.","bibtex":"@article{Buey_Díez_Espinet_Kitzerow_Miguel_1998, title={Optical storage effect in a platinum orthometalated liquid crystal}, volume={66}, DOI={<a href=\"https://doi.org/10.1007/s003400050400\">10.1007/s003400050400</a>}, number={3}, journal={Applied Physics B: Lasers and Optics}, publisher={Springer Science and Business Media LLC}, author={Buey, J. and Díez, L. and Espinet, P. and Kitzerow, Heinz-Siegfried and Miguel, J.A.}, year={1998}, pages={355–358} }","short":"J. Buey, L. Díez, P. Espinet, H.-S. Kitzerow, J.A. Miguel, Applied Physics B: Lasers and Optics 66 (1998) 355–358.","apa":"Buey, J., Díez, L., Espinet, P., Kitzerow, H.-S., &#38; Miguel, J. A. (1998). Optical storage effect in a platinum orthometalated liquid crystal. <i>Applied Physics B: Lasers and Optics</i>, <i>66</i>(3), 355–358. <a href=\"https://doi.org/10.1007/s003400050400\">https://doi.org/10.1007/s003400050400</a>"},"date_updated":"2023-01-26T10:30:44Z","volume":66,"author":[{"first_name":"J.","full_name":"Buey, J.","last_name":"Buey"},{"full_name":"Díez, L.","last_name":"Díez","first_name":"L."},{"full_name":"Espinet, P.","last_name":"Espinet","first_name":"P."},{"first_name":"Heinz-Siegfried","last_name":"Kitzerow","full_name":"Kitzerow, Heinz-Siegfried","id":"254"},{"full_name":"Miguel, J.A.","last_name":"Miguel","first_name":"J.A."}],"doi":"10.1007/s003400050400"}]