--- _id: '39920' author: - first_name: A. full_name: Soennecken, A. last_name: Soennecken - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann - first_name: K. full_name: Goser, K. last_name: Goser citation: ama: Soennecken A, Hilleringmann U, Goser K. Floating gate structures as nonvolatile analog memory cells in 1.0μm-LOCOS-CMOS technology with PZT dielectrica. Microelectronic Engineering. 2002;15(1-4):633-636. doi:10.1016/0167-9317(91)90299-s apa: Soennecken, A., Hilleringmann, U., & Goser, K. (2002). Floating gate structures as nonvolatile analog memory cells in 1.0μm-LOCOS-CMOS technology with PZT dielectrica. Microelectronic Engineering, 15(1–4), 633–636. https://doi.org/10.1016/0167-9317(91)90299-s bibtex: '@article{Soennecken_Hilleringmann_Goser_2002, title={Floating gate structures as nonvolatile analog memory cells in 1.0μm-LOCOS-CMOS technology with PZT dielectrica}, volume={15}, DOI={10.1016/0167-9317(91)90299-s}, number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Soennecken, A. and Hilleringmann, Ulrich and Goser, K.}, year={2002}, pages={633–636} }' chicago: 'Soennecken, A., Ulrich Hilleringmann, and K. Goser. “Floating Gate Structures as Nonvolatile Analog Memory Cells in 1.0μm-LOCOS-CMOS Technology with PZT Dielectrica.” Microelectronic Engineering 15, no. 1–4 (2002): 633–36. https://doi.org/10.1016/0167-9317(91)90299-s.' ieee: 'A. Soennecken, U. Hilleringmann, and K. Goser, “Floating gate structures as nonvolatile analog memory cells in 1.0μm-LOCOS-CMOS technology with PZT dielectrica,” Microelectronic Engineering, vol. 15, no. 1–4, pp. 633–636, 2002, doi: 10.1016/0167-9317(91)90299-s.' mla: Soennecken, A., et al. “Floating Gate Structures as Nonvolatile Analog Memory Cells in 1.0μm-LOCOS-CMOS Technology with PZT Dielectrica.” Microelectronic Engineering, vol. 15, no. 1–4, Elsevier BV, 2002, pp. 633–36, doi:10.1016/0167-9317(91)90299-s. short: A. Soennecken, U. Hilleringmann, K. Goser, Microelectronic Engineering 15 (2002) 633–636. date_created: 2023-01-25T09:29:53Z date_updated: 2023-03-21T09:47:17Z department: - _id: '59' doi: 10.1016/0167-9317(91)90299-s intvolume: ' 15' issue: 1-4 keyword: - Electrical and Electronic Engineering - Surfaces - Coatings and Films - Condensed Matter Physics - Atomic and Molecular Physics - and Optics - Electronic - Optical and Magnetic Materials language: - iso: eng page: 633-636 publication: Microelectronic Engineering publication_identifier: issn: - 0167-9317 publication_status: published publisher: Elsevier BV status: public title: Floating gate structures as nonvolatile analog memory cells in 1.0μm-LOCOS-CMOS technology with PZT dielectrica type: journal_article user_id: '20179' volume: 15 year: '2002' ... --- _id: '39915' author: - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann - first_name: K. full_name: Goser, K. last_name: Goser citation: ama: Hilleringmann U, Goser K. Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon. Microelectronic Engineering. 2002;19(1-4):211-214. doi:10.1016/0167-9317(92)90425-q apa: Hilleringmann, U., & Goser, K. (2002). Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon. Microelectronic Engineering, 19(1–4), 211–214. https://doi.org/10.1016/0167-9317(92)90425-q bibtex: '@article{Hilleringmann_Goser_2002, title={Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon}, volume={19}, DOI={10.1016/0167-9317(92)90425-q}, number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Hilleringmann, Ulrich and Goser, K.}, year={2002}, pages={211–214} }' chicago: 'Hilleringmann, Ulrich, and K. Goser. “Results of Monolithic Integration of Optical Waveguides, Photodiodes and CMOS Circuits on Silicon.” Microelectronic Engineering 19, no. 1–4 (2002): 211–14. https://doi.org/10.1016/0167-9317(92)90425-q.' ieee: 'U. Hilleringmann and K. Goser, “Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon,” Microelectronic Engineering, vol. 19, no. 1–4, pp. 211–214, 2002, doi: 10.1016/0167-9317(92)90425-q.' mla: Hilleringmann, Ulrich, and K. Goser. “Results of Monolithic Integration of Optical Waveguides, Photodiodes and CMOS Circuits on Silicon.” Microelectronic Engineering, vol. 19, no. 1–4, Elsevier BV, 2002, pp. 211–14, doi:10.1016/0167-9317(92)90425-q. short: U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 211–214. date_created: 2023-01-25T09:27:51Z date_updated: 2023-03-21T09:49:09Z department: - _id: '59' doi: 10.1016/0167-9317(92)90425-q intvolume: ' 19' issue: 1-4 keyword: - Electrical and Electronic Engineering - Surfaces - Coatings and Films - Condensed Matter Physics - Atomic and Molecular Physics - and Optics - Electronic - Optical and Magnetic Materials language: - iso: eng page: 211-214 publication: Microelectronic Engineering publication_identifier: issn: - 0167-9317 publication_status: published publisher: Elsevier BV status: public title: Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon type: journal_article user_id: '20179' volume: 19 year: '2002' ... --- _id: '39916' author: - first_name: S. full_name: Adams, S. last_name: Adams - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann - first_name: K. full_name: Goser, K. last_name: Goser citation: ama: Adams S, Hilleringmann U, Goser K. CMOS compatible micromachining by dry silicon-etching techniques. Microelectronic Engineering. 2002;19(1-4):191-194. doi:10.1016/0167-9317(92)90420-v apa: Adams, S., Hilleringmann, U., & Goser, K. (2002). CMOS compatible micromachining by dry silicon-etching techniques. Microelectronic Engineering, 19(1–4), 191–194. https://doi.org/10.1016/0167-9317(92)90420-v bibtex: '@article{Adams_Hilleringmann_Goser_2002, title={CMOS compatible micromachining by dry silicon-etching techniques}, volume={19}, DOI={10.1016/0167-9317(92)90420-v}, number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Adams, S. and Hilleringmann, Ulrich and Goser, K.}, year={2002}, pages={191–194} }' chicago: 'Adams, S., Ulrich Hilleringmann, and K. Goser. “CMOS Compatible Micromachining by Dry Silicon-Etching Techniques.” Microelectronic Engineering 19, no. 1–4 (2002): 191–94. https://doi.org/10.1016/0167-9317(92)90420-v.' ieee: 'S. Adams, U. Hilleringmann, and K. Goser, “CMOS compatible micromachining by dry silicon-etching techniques,” Microelectronic Engineering, vol. 19, no. 1–4, pp. 191–194, 2002, doi: 10.1016/0167-9317(92)90420-v.' mla: Adams, S., et al. “CMOS Compatible Micromachining by Dry Silicon-Etching Techniques.” Microelectronic Engineering, vol. 19, no. 1–4, Elsevier BV, 2002, pp. 191–94, doi:10.1016/0167-9317(92)90420-v. short: S. Adams, U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 191–194. date_created: 2023-01-25T09:28:16Z date_updated: 2023-03-21T09:48:55Z department: - _id: '59' doi: 10.1016/0167-9317(92)90420-v intvolume: ' 19' issue: 1-4 keyword: - Electrical and Electronic Engineering - Surfaces - Coatings and Films - Condensed Matter Physics - Atomic and Molecular Physics - and Optics - Electronic - Optical and Magnetic Materials language: - iso: eng page: 191-194 publication: Microelectronic Engineering publication_identifier: issn: - 0167-9317 publication_status: published publisher: Elsevier BV status: public title: CMOS compatible micromachining by dry silicon-etching techniques type: journal_article user_id: '20179' volume: 19 year: '2002' ... --- _id: '39889' author: - first_name: V. full_name: Mankowski, V. last_name: Mankowski - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann - first_name: K. full_name: Schumacher, K. last_name: Schumacher citation: ama: Mankowski V, Hilleringmann U, Schumacher K. 12 kV low current cascaded light triggered switch on one silicon chip. Microelectronic Engineering. 2002;46(1-4):413-417. doi:10.1016/s0167-9317(99)00122-7 apa: Mankowski, V., Hilleringmann, U., & Schumacher, K. (2002). 12 kV low current cascaded light triggered switch on one silicon chip. Microelectronic Engineering, 46(1–4), 413–417. https://doi.org/10.1016/s0167-9317(99)00122-7 bibtex: '@article{Mankowski_Hilleringmann_Schumacher_2002, title={12 kV low current cascaded light triggered switch on one silicon chip}, volume={46}, DOI={10.1016/s0167-9317(99)00122-7}, number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Mankowski, V. and Hilleringmann, Ulrich and Schumacher, K.}, year={2002}, pages={413–417} }' chicago: 'Mankowski, V., Ulrich Hilleringmann, and K. Schumacher. “12 KV Low Current Cascaded Light Triggered Switch on One Silicon Chip.” Microelectronic Engineering 46, no. 1–4 (2002): 413–17. https://doi.org/10.1016/s0167-9317(99)00122-7.' ieee: 'V. Mankowski, U. Hilleringmann, and K. Schumacher, “12 kV low current cascaded light triggered switch on one silicon chip,” Microelectronic Engineering, vol. 46, no. 1–4, pp. 413–417, 2002, doi: 10.1016/s0167-9317(99)00122-7.' mla: Mankowski, V., et al. “12 KV Low Current Cascaded Light Triggered Switch on One Silicon Chip.” Microelectronic Engineering, vol. 46, no. 1–4, Elsevier BV, 2002, pp. 413–17, doi:10.1016/s0167-9317(99)00122-7. short: V. Mankowski, U. Hilleringmann, K. Schumacher, Microelectronic Engineering 46 (2002) 413–417. date_created: 2023-01-25T09:13:17Z date_updated: 2023-03-21T09:58:35Z department: - _id: '59' doi: 10.1016/s0167-9317(99)00122-7 intvolume: ' 46' issue: 1-4 keyword: - Electrical and Electronic Engineering - Surfaces - Coatings and Films - Condensed Matter Physics - Atomic and Molecular Physics - and Optics - Electronic - Optical and Magnetic Materials language: - iso: eng page: 413-417 publication: Microelectronic Engineering publication_identifier: issn: - 0167-9317 publication_status: published publisher: Elsevier BV status: public title: 12 kV low current cascaded light triggered switch on one silicon chip type: journal_article user_id: '20179' volume: 46 year: '2002' ... --- _id: '39886' author: - first_name: G full_name: Wirth, G last_name: Wirth - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann - first_name: J.T full_name: Horstmann, J.T last_name: Horstmann - first_name: K full_name: Goser, K last_name: Goser citation: ama: Wirth G, Hilleringmann U, Horstmann JT, Goser K. Mesoscopic transport phenomena in ultrashort channel MOSFETs. Solid-State Electronics. 2002;43(7):1245-1250. doi:10.1016/s0038-1101(99)00060-x apa: Wirth, G., Hilleringmann, U., Horstmann, J. T., & Goser, K. (2002). Mesoscopic transport phenomena in ultrashort channel MOSFETs. Solid-State Electronics, 43(7), 1245–1250. https://doi.org/10.1016/s0038-1101(99)00060-x bibtex: '@article{Wirth_Hilleringmann_Horstmann_Goser_2002, title={Mesoscopic transport phenomena in ultrashort channel MOSFETs}, volume={43}, DOI={10.1016/s0038-1101(99)00060-x}, number={7}, journal={Solid-State Electronics}, publisher={Elsevier BV}, author={Wirth, G and Hilleringmann, Ulrich and Horstmann, J.T and Goser, K}, year={2002}, pages={1245–1250} }' chicago: 'Wirth, G, Ulrich Hilleringmann, J.T Horstmann, and K Goser. “Mesoscopic Transport Phenomena in Ultrashort Channel MOSFETs.” Solid-State Electronics 43, no. 7 (2002): 1245–50. https://doi.org/10.1016/s0038-1101(99)00060-x.' ieee: 'G. Wirth, U. Hilleringmann, J. T. Horstmann, and K. Goser, “Mesoscopic transport phenomena in ultrashort channel MOSFETs,” Solid-State Electronics, vol. 43, no. 7, pp. 1245–1250, 2002, doi: 10.1016/s0038-1101(99)00060-x.' mla: Wirth, G., et al. “Mesoscopic Transport Phenomena in Ultrashort Channel MOSFETs.” Solid-State Electronics, vol. 43, no. 7, Elsevier BV, 2002, pp. 1245–50, doi:10.1016/s0038-1101(99)00060-x. short: G. Wirth, U. Hilleringmann, J.T. Horstmann, K. Goser, Solid-State Electronics 43 (2002) 1245–1250. date_created: 2023-01-25T09:11:50Z date_updated: 2023-03-21T09:59:22Z department: - _id: '59' doi: 10.1016/s0038-1101(99)00060-x intvolume: ' 43' issue: '7' keyword: - Materials Chemistry - Electrical and Electronic Engineering - Condensed Matter Physics - Electronic - Optical and Magnetic Materials language: - iso: eng page: 1245-1250 publication: Solid-State Electronics publication_identifier: issn: - 0038-1101 publication_status: published publisher: Elsevier BV status: public title: Mesoscopic transport phenomena in ultrashort channel MOSFETs type: journal_article user_id: '20179' volume: 43 year: '2002' ... --- _id: '39877' author: - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann - first_name: T. full_name: Vieregge, T. last_name: Vieregge - first_name: J.T. full_name: Horstmann, J.T. last_name: Horstmann citation: ama: Hilleringmann U, Vieregge T, Horstmann JT. A structure definition technique for 25 nm lines of silicon and related materials. Microelectronic Engineering. 2002;53(1-4):569-572. doi:10.1016/s0167-9317(00)00380-4 apa: Hilleringmann, U., Vieregge, T., & Horstmann, J. T. (2002). A structure definition technique for 25 nm lines of silicon and related materials. Microelectronic Engineering, 53(1–4), 569–572. https://doi.org/10.1016/s0167-9317(00)00380-4 bibtex: '@article{Hilleringmann_Vieregge_Horstmann_2002, title={A structure definition technique for 25 nm lines of silicon and related materials}, volume={53}, DOI={10.1016/s0167-9317(00)00380-4}, number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Hilleringmann, Ulrich and Vieregge, T. and Horstmann, J.T.}, year={2002}, pages={569–572} }' chicago: 'Hilleringmann, Ulrich, T. Vieregge, and J.T. Horstmann. “A Structure Definition Technique for 25 Nm Lines of Silicon and Related Materials.” Microelectronic Engineering 53, no. 1–4 (2002): 569–72. https://doi.org/10.1016/s0167-9317(00)00380-4.' ieee: 'U. Hilleringmann, T. Vieregge, and J. T. Horstmann, “A structure definition technique for 25 nm lines of silicon and related materials,” Microelectronic Engineering, vol. 53, no. 1–4, pp. 569–572, 2002, doi: 10.1016/s0167-9317(00)00380-4.' mla: Hilleringmann, Ulrich, et al. “A Structure Definition Technique for 25 Nm Lines of Silicon and Related Materials.” Microelectronic Engineering, vol. 53, no. 1–4, Elsevier BV, 2002, pp. 569–72, doi:10.1016/s0167-9317(00)00380-4. short: U. Hilleringmann, T. Vieregge, J.T. Horstmann, Microelectronic Engineering 53 (2002) 569–572. date_created: 2023-01-25T09:08:13Z date_updated: 2023-03-21T10:03:00Z department: - _id: '59' doi: 10.1016/s0167-9317(00)00380-4 intvolume: ' 53' issue: 1-4 keyword: - Electrical and Electronic Engineering - Surfaces - Coatings and Films - Condensed Matter Physics - Atomic and Molecular Physics - and Optics - Electronic - Optical and Magnetic Materials language: - iso: eng page: 569-572 publication: Microelectronic Engineering publication_identifier: issn: - 0167-9317 publication_status: published publisher: Elsevier BV status: public title: A structure definition technique for 25 nm lines of silicon and related materials type: journal_article user_id: '20179' volume: 53 year: '2002' ... --- _id: '45307' author: - first_name: Rolf full_name: Mahnken, Rolf id: '335' last_name: Mahnken citation: ama: Mahnken R. Strength difference in compression and tension and pressure dependence of yielding in elasto-plasticity. Computer Methods in Applied Mechanics and Engineering. 2002;190(39):5057-5080. doi:10.1016/s0045-7825(00)00364-9 apa: Mahnken, R. (2002). Strength difference in compression and tension and pressure dependence of yielding in elasto-plasticity. Computer Methods in Applied Mechanics and Engineering, 190(39), 5057–5080. https://doi.org/10.1016/s0045-7825(00)00364-9 bibtex: '@article{Mahnken_2002, title={Strength difference in compression and tension and pressure dependence of yielding in elasto-plasticity}, volume={190}, DOI={10.1016/s0045-7825(00)00364-9}, number={39}, journal={Computer Methods in Applied Mechanics and Engineering}, publisher={Elsevier BV}, author={Mahnken, Rolf}, year={2002}, pages={5057–5080} }' chicago: 'Mahnken, Rolf. “Strength Difference in Compression and Tension and Pressure Dependence of Yielding in Elasto-Plasticity.” Computer Methods in Applied Mechanics and Engineering 190, no. 39 (2002): 5057–80. https://doi.org/10.1016/s0045-7825(00)00364-9.' ieee: 'R. Mahnken, “Strength difference in compression and tension and pressure dependence of yielding in elasto-plasticity,” Computer Methods in Applied Mechanics and Engineering, vol. 190, no. 39, pp. 5057–5080, 2002, doi: 10.1016/s0045-7825(00)00364-9.' mla: Mahnken, Rolf. “Strength Difference in Compression and Tension and Pressure Dependence of Yielding in Elasto-Plasticity.” Computer Methods in Applied Mechanics and Engineering, vol. 190, no. 39, Elsevier BV, 2002, pp. 5057–80, doi:10.1016/s0045-7825(00)00364-9. short: R. Mahnken, Computer Methods in Applied Mechanics and Engineering 190 (2002) 5057–5080. date_created: 2023-05-26T12:21:04Z date_updated: 2023-05-26T12:22:12Z department: - _id: '9' - _id: '154' doi: 10.1016/s0045-7825(00)00364-9 intvolume: ' 190' issue: '39' keyword: - Computer Science Applications - General Physics and Astronomy - Mechanical Engineering - Mechanics of Materials - Computational Mechanics language: - iso: eng page: 5057-5080 publication: Computer Methods in Applied Mechanics and Engineering publication_identifier: issn: - 0045-7825 publication_status: published publisher: Elsevier BV quality_controlled: '1' status: public title: Strength difference in compression and tension and pressure dependence of yielding in elasto-plasticity type: journal_article user_id: '335' volume: 190 year: '2002' ... --- _id: '45412' author: - first_name: Rolf full_name: Mahnken, Rolf id: '335' last_name: Mahnken - first_name: M. full_name: Kohlmeier, M. last_name: Kohlmeier citation: ama: Mahnken R, Kohlmeier M. Finite element simulation for rock salt with dilatancy boundary coupled to fluid permeation. Computer Methods in Applied Mechanics and Engineering. 2002;190(32-33):4259-4278. doi:10.1016/s0045-7825(00)00317-0 apa: Mahnken, R., & Kohlmeier, M. (2002). Finite element simulation for rock salt with dilatancy boundary coupled to fluid permeation. Computer Methods in Applied Mechanics and Engineering, 190(32–33), 4259–4278. https://doi.org/10.1016/s0045-7825(00)00317-0 bibtex: '@article{Mahnken_Kohlmeier_2002, title={Finite element simulation for rock salt with dilatancy boundary coupled to fluid permeation}, volume={190}, DOI={10.1016/s0045-7825(00)00317-0}, number={32–33}, journal={Computer Methods in Applied Mechanics and Engineering}, publisher={Elsevier BV}, author={Mahnken, Rolf and Kohlmeier, M.}, year={2002}, pages={4259–4278} }' chicago: 'Mahnken, Rolf, and M. Kohlmeier. “Finite Element Simulation for Rock Salt with Dilatancy Boundary Coupled to Fluid Permeation.” Computer Methods in Applied Mechanics and Engineering 190, no. 32–33 (2002): 4259–78. https://doi.org/10.1016/s0045-7825(00)00317-0.' ieee: 'R. Mahnken and M. Kohlmeier, “Finite element simulation for rock salt with dilatancy boundary coupled to fluid permeation,” Computer Methods in Applied Mechanics and Engineering, vol. 190, no. 32–33, pp. 4259–4278, 2002, doi: 10.1016/s0045-7825(00)00317-0.' mla: Mahnken, Rolf, and M. Kohlmeier. “Finite Element Simulation for Rock Salt with Dilatancy Boundary Coupled to Fluid Permeation.” Computer Methods in Applied Mechanics and Engineering, vol. 190, no. 32–33, Elsevier BV, 2002, pp. 4259–78, doi:10.1016/s0045-7825(00)00317-0. short: R. Mahnken, M. Kohlmeier, Computer Methods in Applied Mechanics and Engineering 190 (2002) 4259–4278. date_created: 2023-05-31T11:52:51Z date_updated: 2023-05-31T11:53:38Z department: - _id: '9' - _id: '154' doi: 10.1016/s0045-7825(00)00317-0 intvolume: ' 190' issue: 32-33 keyword: - Computer Science Applications - General Physics and Astronomy - Mechanical Engineering - Mechanics of Materials - Computational Mechanics language: - iso: eng page: 4259-4278 publication: Computer Methods in Applied Mechanics and Engineering publication_identifier: issn: - 0045-7825 publication_status: published publisher: Elsevier BV quality_controlled: '1' status: public title: Finite element simulation for rock salt with dilatancy boundary coupled to fluid permeation type: journal_article user_id: '335' volume: 190 year: '2002' ... --- _id: '45424' author: - first_name: Rolf full_name: Mahnken, Rolf id: '335' last_name: Mahnken - first_name: Ellen full_name: Kuhl, Ellen last_name: Kuhl citation: ama: Mahnken R, Kuhl E. Parameter identification of gradient enhanced damage models with the finite element method. European Journal of Mechanics - A/Solids. 2002;18(5):819-835. doi:10.1016/s0997-7538(99)00127-8 apa: Mahnken, R., & Kuhl, E. (2002). Parameter identification of gradient enhanced damage models with the finite element method. European Journal of Mechanics - A/Solids, 18(5), 819–835. https://doi.org/10.1016/s0997-7538(99)00127-8 bibtex: '@article{Mahnken_Kuhl_2002, title={Parameter identification of gradient enhanced damage models with the finite element method}, volume={18}, DOI={10.1016/s0997-7538(99)00127-8}, number={5}, journal={European Journal of Mechanics - A/Solids}, publisher={Elsevier BV}, author={Mahnken, Rolf and Kuhl, Ellen}, year={2002}, pages={819–835} }' chicago: 'Mahnken, Rolf, and Ellen Kuhl. “Parameter Identification of Gradient Enhanced Damage Models with the Finite Element Method.” European Journal of Mechanics - A/Solids 18, no. 5 (2002): 819–35. https://doi.org/10.1016/s0997-7538(99)00127-8.' ieee: 'R. Mahnken and E. Kuhl, “Parameter identification of gradient enhanced damage models with the finite element method,” European Journal of Mechanics - A/Solids, vol. 18, no. 5, pp. 819–835, 2002, doi: 10.1016/s0997-7538(99)00127-8.' mla: Mahnken, Rolf, and Ellen Kuhl. “Parameter Identification of Gradient Enhanced Damage Models with the Finite Element Method.” European Journal of Mechanics - A/Solids, vol. 18, no. 5, Elsevier BV, 2002, pp. 819–35, doi:10.1016/s0997-7538(99)00127-8. short: R. Mahnken, E. Kuhl, European Journal of Mechanics - A/Solids 18 (2002) 819–835. date_created: 2023-05-31T12:15:51Z date_updated: 2023-05-31T12:17:11Z department: - _id: '9' - _id: '154' doi: 10.1016/s0997-7538(99)00127-8 intvolume: ' 18' issue: '5' keyword: - General Physics and Astronomy - Mechanical Engineering - Mechanics of Materials - General Materials Science language: - iso: eng page: 819-835 publication: European Journal of Mechanics - A/Solids publication_identifier: issn: - 0997-7538 publication_status: published publisher: Elsevier BV quality_controlled: '1' status: public title: Parameter identification of gradient enhanced damage models with the finite element method type: journal_article user_id: '335' volume: 18 year: '2002' ... --- _id: '45429' author: - first_name: Rolf full_name: Mahnken, Rolf id: '335' last_name: Mahnken - first_name: Erwin full_name: Stein, Erwin last_name: Stein citation: ama: Mahnken R, Stein E. A unified approach for parameter identification of inelastic material models in the frame of the finite element method. Computer Methods in Applied Mechanics and Engineering. 2002;136(3-4):225-258. doi:10.1016/0045-7825(96)00991-7 apa: Mahnken, R., & Stein, E. (2002). A unified approach for parameter identification of inelastic material models in the frame of the finite element method. Computer Methods in Applied Mechanics and Engineering, 136(3–4), 225–258. https://doi.org/10.1016/0045-7825(96)00991-7 bibtex: '@article{Mahnken_Stein_2002, title={A unified approach for parameter identification of inelastic material models in the frame of the finite element method}, volume={136}, DOI={10.1016/0045-7825(96)00991-7}, number={3–4}, journal={Computer Methods in Applied Mechanics and Engineering}, publisher={Elsevier BV}, author={Mahnken, Rolf and Stein, Erwin}, year={2002}, pages={225–258} }' chicago: 'Mahnken, Rolf, and Erwin Stein. “A Unified Approach for Parameter Identification of Inelastic Material Models in the Frame of the Finite Element Method.” Computer Methods in Applied Mechanics and Engineering 136, no. 3–4 (2002): 225–58. https://doi.org/10.1016/0045-7825(96)00991-7.' ieee: 'R. Mahnken and E. Stein, “A unified approach for parameter identification of inelastic material models in the frame of the finite element method,” Computer Methods in Applied Mechanics and Engineering, vol. 136, no. 3–4, pp. 225–258, 2002, doi: 10.1016/0045-7825(96)00991-7.' mla: Mahnken, Rolf, and Erwin Stein. “A Unified Approach for Parameter Identification of Inelastic Material Models in the Frame of the Finite Element Method.” Computer Methods in Applied Mechanics and Engineering, vol. 136, no. 3–4, Elsevier BV, 2002, pp. 225–58, doi:10.1016/0045-7825(96)00991-7. short: R. Mahnken, E. Stein, Computer Methods in Applied Mechanics and Engineering 136 (2002) 225–258. date_created: 2023-05-31T12:22:58Z date_updated: 2023-05-31T12:23:36Z department: - _id: '9' - _id: '154' doi: 10.1016/0045-7825(96)00991-7 intvolume: ' 136' issue: 3-4 keyword: - Computer Science Applications - General Physics and Astronomy - Mechanical Engineering - Mechanics of Materials - Computational Mechanics language: - iso: eng page: 225-258 publication: Computer Methods in Applied Mechanics and Engineering publication_identifier: issn: - 0045-7825 publication_status: published publisher: Elsevier BV quality_controlled: '1' status: public title: A unified approach for parameter identification of inelastic material models in the frame of the finite element method type: journal_article user_id: '335' volume: 136 year: '2002' ... --- _id: '45432' author: - first_name: Rolf full_name: Mahnken, Rolf id: '335' last_name: Mahnken - first_name: E full_name: Stein, E last_name: Stein citation: ama: Mahnken R, Stein E. The identification of parameters for visco-plastic models via finite-element methods and gradient methods. Modelling and Simulation in Materials Science and Engineering. 2002;2(3A):597-616. doi:10.1088/0965-0393/2/3a/013 apa: Mahnken, R., & Stein, E. (2002). The identification of parameters for visco-plastic models via finite-element methods and gradient methods. Modelling and Simulation in Materials Science and Engineering, 2(3A), 597–616. https://doi.org/10.1088/0965-0393/2/3a/013 bibtex: '@article{Mahnken_Stein_2002, title={The identification of parameters for visco-plastic models via finite-element methods and gradient methods}, volume={2}, DOI={10.1088/0965-0393/2/3a/013}, number={3A}, journal={Modelling and Simulation in Materials Science and Engineering}, publisher={IOP Publishing}, author={Mahnken, Rolf and Stein, E}, year={2002}, pages={597–616} }' chicago: 'Mahnken, Rolf, and E Stein. “The Identification of Parameters for Visco-Plastic Models via Finite-Element Methods and Gradient Methods.” Modelling and Simulation in Materials Science and Engineering 2, no. 3A (2002): 597–616. https://doi.org/10.1088/0965-0393/2/3a/013.' ieee: 'R. Mahnken and E. Stein, “The identification of parameters for visco-plastic models via finite-element methods and gradient methods,” Modelling and Simulation in Materials Science and Engineering, vol. 2, no. 3A, pp. 597–616, 2002, doi: 10.1088/0965-0393/2/3a/013.' mla: Mahnken, Rolf, and E. Stein. “The Identification of Parameters for Visco-Plastic Models via Finite-Element Methods and Gradient Methods.” Modelling and Simulation in Materials Science and Engineering, vol. 2, no. 3A, IOP Publishing, 2002, pp. 597–616, doi:10.1088/0965-0393/2/3a/013. short: R. Mahnken, E. Stein, Modelling and Simulation in Materials Science and Engineering 2 (2002) 597–616. date_created: 2023-05-31T12:28:01Z date_updated: 2023-05-31T12:28:27Z department: - _id: '9' - _id: '154' doi: 10.1088/0965-0393/2/3a/013 intvolume: ' 2' issue: 3A keyword: - Computer Science Applications - Mechanics of Materials - Condensed Matter Physics - General Materials Science - Modeling and Simulation language: - iso: eng page: 597-616 publication: Modelling and Simulation in Materials Science and Engineering publication_identifier: issn: - 0965-0393 - 1361-651X publication_status: published publisher: IOP Publishing quality_controlled: '1' status: public title: The identification of parameters for visco-plastic models via finite-element methods and gradient methods type: journal_article user_id: '335' volume: 2 year: '2002' ... --- _id: '45428' author: - first_name: Rolf full_name: Mahnken, Rolf id: '335' last_name: Mahnken - first_name: Erwin full_name: Stein, Erwin last_name: Stein citation: ama: Mahnken R, Stein E. Parameter identification for finite deformation elasto-plasticity in principal directions. Computer Methods in Applied Mechanics and Engineering. 2002;147(1-2):17-39. doi:10.1016/s0045-7825(97)00008-x apa: Mahnken, R., & Stein, E. (2002). Parameter identification for finite deformation elasto-plasticity in principal directions. Computer Methods in Applied Mechanics and Engineering, 147(1–2), 17–39. https://doi.org/10.1016/s0045-7825(97)00008-x bibtex: '@article{Mahnken_Stein_2002, title={Parameter identification for finite deformation elasto-plasticity in principal directions}, volume={147}, DOI={10.1016/s0045-7825(97)00008-x}, number={1–2}, journal={Computer Methods in Applied Mechanics and Engineering}, publisher={Elsevier BV}, author={Mahnken, Rolf and Stein, Erwin}, year={2002}, pages={17–39} }' chicago: 'Mahnken, Rolf, and Erwin Stein. “Parameter Identification for Finite Deformation Elasto-Plasticity in Principal Directions.” Computer Methods in Applied Mechanics and Engineering 147, no. 1–2 (2002): 17–39. https://doi.org/10.1016/s0045-7825(97)00008-x.' ieee: 'R. Mahnken and E. Stein, “Parameter identification for finite deformation elasto-plasticity in principal directions,” Computer Methods in Applied Mechanics and Engineering, vol. 147, no. 1–2, pp. 17–39, 2002, doi: 10.1016/s0045-7825(97)00008-x.' mla: Mahnken, Rolf, and Erwin Stein. “Parameter Identification for Finite Deformation Elasto-Plasticity in Principal Directions.” Computer Methods in Applied Mechanics and Engineering, vol. 147, no. 1–2, Elsevier BV, 2002, pp. 17–39, doi:10.1016/s0045-7825(97)00008-x. short: R. Mahnken, E. Stein, Computer Methods in Applied Mechanics and Engineering 147 (2002) 17–39. date_created: 2023-05-31T12:21:53Z date_updated: 2023-05-31T12:22:12Z department: - _id: '9' - _id: '154' doi: 10.1016/s0045-7825(97)00008-x intvolume: ' 147' issue: 1-2 keyword: - Computer Science Applications - General Physics and Astronomy - Mechanical Engineering - Mechanics of Materials - Computational Mechanics language: - iso: eng page: 17-39 publication: Computer Methods in Applied Mechanics and Engineering publication_identifier: issn: - 0045-7825 publication_status: published publisher: Elsevier BV quality_controlled: '1' status: public title: Parameter identification for finite deformation elasto-plasticity in principal directions type: journal_article user_id: '335' volume: 147 year: '2002' ... --- _id: '35365' article_type: original author: - first_name: Thomas full_name: Thiele, Thomas last_name: Thiele - first_name: J.-F. full_name: Berret, J.-F. last_name: Berret - first_name: Stefan full_name: Müller, Stefan last_name: Müller - first_name: Claudia full_name: Schmidt, Claudia id: '466' last_name: Schmidt orcid: 0000-0003-3179-9997 citation: ama: Thiele T, Berret J-F, Müller S, Schmidt C. Rheology and nuclear magnetic resonance measurements under shear of sodium dodecyl sulfate/decanol/water nematics. Journal of Rheology. 2001;45(1):29-48. doi:10.1122/1.1332387 apa: Thiele, T., Berret, J.-F., Müller, S., & Schmidt, C. (2001). Rheology and nuclear magnetic resonance measurements under shear of sodium dodecyl sulfate/decanol/water nematics. Journal of Rheology, 45(1), 29–48. https://doi.org/10.1122/1.1332387 bibtex: '@article{Thiele_Berret_Müller_Schmidt_2001, title={Rheology and nuclear magnetic resonance measurements under shear of sodium dodecyl sulfate/decanol/water nematics}, volume={45}, DOI={10.1122/1.1332387}, number={1}, journal={Journal of Rheology}, publisher={Society of Rheology}, author={Thiele, Thomas and Berret, J.-F. and Müller, Stefan and Schmidt, Claudia}, year={2001}, pages={29–48} }' chicago: 'Thiele, Thomas, J.-F. Berret, Stefan Müller, and Claudia Schmidt. “Rheology and Nuclear Magnetic Resonance Measurements under Shear of Sodium Dodecyl Sulfate/Decanol/Water Nematics.” Journal of Rheology 45, no. 1 (2001): 29–48. https://doi.org/10.1122/1.1332387.' ieee: 'T. Thiele, J.-F. Berret, S. Müller, and C. Schmidt, “Rheology and nuclear magnetic resonance measurements under shear of sodium dodecyl sulfate/decanol/water nematics,” Journal of Rheology, vol. 45, no. 1, pp. 29–48, 2001, doi: 10.1122/1.1332387.' mla: Thiele, Thomas, et al. “Rheology and Nuclear Magnetic Resonance Measurements under Shear of Sodium Dodecyl Sulfate/Decanol/Water Nematics.” Journal of Rheology, vol. 45, no. 1, Society of Rheology, 2001, pp. 29–48, doi:10.1122/1.1332387. short: T. Thiele, J.-F. Berret, S. Müller, C. Schmidt, Journal of Rheology 45 (2001) 29–48. date_created: 2023-01-06T13:17:10Z date_updated: 2023-01-07T11:18:40Z department: - _id: '2' - _id: '315' doi: 10.1122/1.1332387 extern: '1' intvolume: ' 45' issue: '1' keyword: - Mechanical Engineering - Mechanics of Materials - Condensed Matter Physics - General Materials Science language: - iso: eng page: 29-48 publication: Journal of Rheology publication_identifier: issn: - 0148-6055 - 1520-8516 publication_status: published publisher: Society of Rheology quality_controlled: '1' status: public title: Rheology and nuclear magnetic resonance measurements under shear of sodium dodecyl sulfate/decanol/water nematics type: journal_article user_id: '466' volume: 45 year: '2001' ... --- _id: '40083' author: - first_name: Jochen full_name: Glossmann, Jochen last_name: Glossmann - first_name: Andreas full_name: Hoischen, Andreas last_name: Hoischen - first_name: Thorsten full_name: Roder, Thorsten last_name: Roder - first_name: Heinz-Siegfried full_name: Kitzerow, Heinz-Siegfried id: '254' last_name: Kitzerow citation: ama: Glossmann J, Hoischen A, Roder T, Kitzerow H-S. Asymmetric switching and storage effects in ferroelectric and antiferroelectric gels and polymers. Ferroelectrics. 2000;243(1):95-106. doi:10.1080/00150190008008011 apa: Glossmann, J., Hoischen, A., Roder, T., & Kitzerow, H.-S. (2000). Asymmetric switching and storage effects in ferroelectric and antiferroelectric gels and polymers. Ferroelectrics, 243(1), 95–106. https://doi.org/10.1080/00150190008008011 bibtex: '@article{Glossmann_Hoischen_Roder_Kitzerow_2000, title={Asymmetric switching and storage effects in ferroelectric and antiferroelectric gels and polymers}, volume={243}, DOI={10.1080/00150190008008011}, number={1}, journal={Ferroelectrics}, publisher={Informa UK Limited}, author={Glossmann, Jochen and Hoischen, Andreas and Roder, Thorsten and Kitzerow, Heinz-Siegfried}, year={2000}, pages={95–106} }' chicago: 'Glossmann, Jochen, Andreas Hoischen, Thorsten Roder, and Heinz-Siegfried Kitzerow. “Asymmetric Switching and Storage Effects in Ferroelectric and Antiferroelectric Gels and Polymers.” Ferroelectrics 243, no. 1 (2000): 95–106. https://doi.org/10.1080/00150190008008011.' ieee: 'J. Glossmann, A. Hoischen, T. Roder, and H.-S. Kitzerow, “Asymmetric switching and storage effects in ferroelectric and antiferroelectric gels and polymers,” Ferroelectrics, vol. 243, no. 1, pp. 95–106, 2000, doi: 10.1080/00150190008008011.' mla: Glossmann, Jochen, et al. “Asymmetric Switching and Storage Effects in Ferroelectric and Antiferroelectric Gels and Polymers.” Ferroelectrics, vol. 243, no. 1, Informa UK Limited, 2000, pp. 95–106, doi:10.1080/00150190008008011. short: J. Glossmann, A. Hoischen, T. Roder, H.-S. Kitzerow, Ferroelectrics 243 (2000) 95–106. date_created: 2023-01-25T16:34:10Z date_updated: 2023-01-25T16:41:08Z department: - _id: '313' - _id: '638' doi: 10.1080/00150190008008011 intvolume: ' 243' issue: '1' keyword: - Condensed Matter Physics - Electronic - Optical and Magnetic Materials language: - iso: eng page: 95-106 publication: Ferroelectrics publication_identifier: issn: - 0015-0193 - 1563-5112 publication_status: published publisher: Informa UK Limited status: public title: Asymmetric switching and storage effects in ferroelectric and antiferroelectric gels and polymers type: journal_article user_id: '254' volume: 243 year: '2000' ... --- _id: '42051' author: - first_name: Sergio Escudero full_name: Inglés, Sergio Escudero last_name: Inglés - first_name: Armin full_name: Katzenstein, Armin last_name: Katzenstein - first_name: Wolfgang full_name: Schlenker, Wolfgang last_name: Schlenker - first_name: Klaus full_name: Huber, Klaus id: '237' last_name: Huber citation: ama: Inglés SE, Katzenstein A, Schlenker W, Huber K. Time-Resolved Recording of Ionic Dyestuff Aggregation by Static Light Scattering. Langmuir. 2000;16(7):3010-3018. doi:10.1021/la9903649 apa: Inglés, S. E., Katzenstein, A., Schlenker, W., & Huber, K. (2000). Time-Resolved Recording of Ionic Dyestuff Aggregation by Static Light Scattering. Langmuir, 16(7), 3010–3018. https://doi.org/10.1021/la9903649 bibtex: '@article{Inglés_Katzenstein_Schlenker_Huber_2000, title={Time-Resolved Recording of Ionic Dyestuff Aggregation by Static Light Scattering}, volume={16}, DOI={10.1021/la9903649}, number={7}, journal={Langmuir}, publisher={American Chemical Society (ACS)}, author={Inglés, Sergio Escudero and Katzenstein, Armin and Schlenker, Wolfgang and Huber, Klaus}, year={2000}, pages={3010–3018} }' chicago: 'Inglés, Sergio Escudero, Armin Katzenstein, Wolfgang Schlenker, and Klaus Huber. “Time-Resolved Recording of Ionic Dyestuff Aggregation by Static Light Scattering.” Langmuir 16, no. 7 (2000): 3010–18. https://doi.org/10.1021/la9903649.' ieee: 'S. E. Inglés, A. Katzenstein, W. Schlenker, and K. Huber, “Time-Resolved Recording of Ionic Dyestuff Aggregation by Static Light Scattering,” Langmuir, vol. 16, no. 7, pp. 3010–3018, 2000, doi: 10.1021/la9903649.' mla: Inglés, Sergio Escudero, et al. “Time-Resolved Recording of Ionic Dyestuff Aggregation by Static Light Scattering.” Langmuir, vol. 16, no. 7, American Chemical Society (ACS), 2000, pp. 3010–18, doi:10.1021/la9903649. short: S.E. Inglés, A. Katzenstein, W. Schlenker, K. Huber, Langmuir 16 (2000) 3010–3018. date_created: 2023-02-13T13:02:06Z date_updated: 2023-02-13T13:15:20Z department: - _id: '314' doi: 10.1021/la9903649 intvolume: ' 16' issue: '7' keyword: - Electrochemistry - Spectroscopy - Surfaces and Interfaces - Condensed Matter Physics - General Materials Science language: - iso: eng page: 3010-3018 publication: Langmuir publication_identifier: issn: - 0743-7463 - 1520-5827 publication_status: published publisher: American Chemical Society (ACS) status: public title: Time-Resolved Recording of Ionic Dyestuff Aggregation by Static Light Scattering type: journal_article user_id: '237' volume: 16 year: '2000' ... --- _id: '35370' article_type: original author: - first_name: Gudrun full_name: Schmidt, Gudrun last_name: Schmidt - first_name: Stefan full_name: Müller, Stefan last_name: Müller - first_name: Claudia full_name: Schmidt, Claudia id: '466' last_name: Schmidt orcid: 0000-0003-3179-9997 - first_name: Walter full_name: Richtering, Walter last_name: Richtering citation: ama: Schmidt G, Müller S, Schmidt C, Richtering W. Rheo-optical investigations of lyotropic mesophases of polymeric surfactants. Rheologica Acta. 1999;38(6):486-494. doi:10.1007/s003970050201 apa: Schmidt, G., Müller, S., Schmidt, C., & Richtering, W. (1999). Rheo-optical investigations of lyotropic mesophases of polymeric surfactants. Rheologica Acta, 38(6), 486–494. https://doi.org/10.1007/s003970050201 bibtex: '@article{Schmidt_Müller_Schmidt_Richtering_1999, title={Rheo-optical investigations of lyotropic mesophases of polymeric surfactants}, volume={38}, DOI={10.1007/s003970050201}, number={6}, journal={Rheologica Acta}, publisher={Springer Science and Business Media LLC}, author={Schmidt, Gudrun and Müller, Stefan and Schmidt, Claudia and Richtering, Walter}, year={1999}, pages={486–494} }' chicago: 'Schmidt, Gudrun, Stefan Müller, Claudia Schmidt, and Walter Richtering. “Rheo-Optical Investigations of Lyotropic Mesophases of Polymeric Surfactants.” Rheologica Acta 38, no. 6 (1999): 486–94. https://doi.org/10.1007/s003970050201.' ieee: 'G. Schmidt, S. Müller, C. Schmidt, and W. Richtering, “Rheo-optical investigations of lyotropic mesophases of polymeric surfactants,” Rheologica Acta, vol. 38, no. 6, pp. 486–494, 1999, doi: 10.1007/s003970050201.' mla: Schmidt, Gudrun, et al. “Rheo-Optical Investigations of Lyotropic Mesophases of Polymeric Surfactants.” Rheologica Acta, vol. 38, no. 6, Springer Science and Business Media LLC, 1999, pp. 486–94, doi:10.1007/s003970050201. short: G. Schmidt, S. Müller, C. Schmidt, W. Richtering, Rheologica Acta 38 (1999) 486–494. date_created: 2023-01-06T13:18:58Z date_updated: 2023-01-07T11:15:09Z department: - _id: '2' - _id: '315' doi: 10.1007/s003970050201 intvolume: ' 38' issue: '6' keyword: - Condensed Matter Physics - General Materials Science language: - iso: eng page: 486-494 publication: Rheologica Acta publication_identifier: issn: - 0035-4511 - 1435-1528 publication_status: published publisher: Springer Science and Business Media LLC quality_controlled: '1' status: public title: Rheo-optical investigations of lyotropic mesophases of polymeric surfactants type: journal_article user_id: '466' volume: 38 year: '1999' ... --- _id: '35368' citation: ama: Schmidt C, Navard P, eds. EURORHEO 99-1 in Sophia-Antipolis, France. Vol 38. Springer Science and Business Media LLC; 1999:485-485. doi:10.1007/s003970050200 apa: Schmidt, C., & Navard, P. (Eds.). (1999). EURORHEO 99-1 in Sophia-Antipolis, France (Vol. 38, Issue 6, pp. 485–485). Springer Science and Business Media LLC. https://doi.org/10.1007/s003970050200 bibtex: '@book{Schmidt_Navard_1999, title={EURORHEO 99-1 in Sophia-Antipolis, France}, volume={38}, DOI={10.1007/s003970050200}, number={6}, publisher={Springer Science and Business Media LLC}, year={1999}, pages={485–485} }' chicago: Schmidt, Claudia, and Patrick Navard, eds. EURORHEO 99-1 in Sophia-Antipolis, France. Vol. 38. Springer Science and Business Media LLC, 1999. https://doi.org/10.1007/s003970050200. ieee: C. Schmidt and P. Navard, Eds., EURORHEO 99-1 in Sophia-Antipolis, France, vol. 38, no. 6. Springer Science and Business Media LLC, 1999, pp. 485–485. mla: Schmidt, Claudia, and Patrick Navard, editors. EURORHEO 99-1 in Sophia-Antipolis, France. no. 6, Springer Science and Business Media LLC, 1999, pp. 485–485, doi:10.1007/s003970050200. short: C. Schmidt, P. Navard, eds., EURORHEO 99-1 in Sophia-Antipolis, France, Springer Science and Business Media LLC, 1999. date_created: 2023-01-06T13:18:26Z date_updated: 2023-01-07T11:14:26Z department: - _id: '2' - _id: '315' doi: 10.1007/s003970050200 editor: - first_name: Claudia full_name: Schmidt, Claudia id: '466' last_name: Schmidt orcid: 0000-0003-3179-9997 - first_name: Patrick full_name: Navard, Patrick last_name: Navard extern: '1' intvolume: ' 38' issue: '6' keyword: - Condensed Matter Physics - General Materials Science language: - iso: eng page: 485-485 publication_identifier: issn: - 0035-4511 - 1435-1528 publication_status: published publisher: Springer Science and Business Media LLC status: public title: EURORHEO 99-1 in Sophia-Antipolis, France type: conference_editor user_id: '466' volume: 38 year: '1999' ... --- _id: '35371' article_type: original author: - first_name: Stefan full_name: Müller, Stefan last_name: Müller - first_name: Claus full_name: Börschig, Claus last_name: Börschig - first_name: Wolfram full_name: Gronski, Wolfram last_name: Gronski - first_name: Claudia full_name: Schmidt, Claudia id: '466' last_name: Schmidt orcid: 0000-0003-3179-9997 - first_name: Didier full_name: Roux, Didier last_name: Roux citation: ama: Müller S, Börschig C, Gronski W, Schmidt C, Roux D. Shear-Induced States of Orientation of the Lamellar Phase of C₁₂E₄/Water. Langmuir. 1999;15(22):7558-7564. doi:10.1021/la9904105 apa: Müller, S., Börschig, C., Gronski, W., Schmidt, C., & Roux, D. (1999). Shear-Induced States of Orientation of the Lamellar Phase of C₁₂E₄/Water. Langmuir, 15(22), 7558–7564. https://doi.org/10.1021/la9904105 bibtex: '@article{Müller_Börschig_Gronski_Schmidt_Roux_1999, title={Shear-Induced States of Orientation of the Lamellar Phase of C₁₂E₄/Water}, volume={15}, DOI={10.1021/la9904105}, number={22}, journal={Langmuir}, publisher={American Chemical Society (ACS)}, author={Müller, Stefan and Börschig, Claus and Gronski, Wolfram and Schmidt, Claudia and Roux, Didier}, year={1999}, pages={7558–7564} }' chicago: 'Müller, Stefan, Claus Börschig, Wolfram Gronski, Claudia Schmidt, and Didier Roux. “Shear-Induced States of Orientation of the Lamellar Phase of C₁₂E₄/Water.” Langmuir 15, no. 22 (1999): 7558–64. https://doi.org/10.1021/la9904105.' ieee: 'S. Müller, C. Börschig, W. Gronski, C. Schmidt, and D. Roux, “Shear-Induced States of Orientation of the Lamellar Phase of C₁₂E₄/Water,” Langmuir, vol. 15, no. 22, pp. 7558–7564, 1999, doi: 10.1021/la9904105.' mla: Müller, Stefan, et al. “Shear-Induced States of Orientation of the Lamellar Phase of C₁₂E₄/Water.” Langmuir, vol. 15, no. 22, American Chemical Society (ACS), 1999, pp. 7558–64, doi:10.1021/la9904105. short: S. Müller, C. Börschig, W. Gronski, C. Schmidt, D. Roux, Langmuir 15 (1999) 7558–7564. date_created: 2023-01-06T13:19:10Z date_updated: 2023-01-07T11:16:35Z department: - _id: '2' - _id: '315' doi: 10.1021/la9904105 extern: '1' intvolume: ' 15' issue: '22' keyword: - Electrochemistry - Spectroscopy - Surfaces and Interfaces - Condensed Matter Physics - General Materials Science language: - iso: eng page: 7558-7564 publication: Langmuir publication_identifier: issn: - 0743-7463 - 1520-5827 publication_status: published publisher: American Chemical Society (ACS) quality_controlled: '1' status: public title: Shear-Induced States of Orientation of the Lamellar Phase of C₁₂E₄/Water type: journal_article user_id: '466' volume: 15 year: '1999' ... --- _id: '35367' article_type: original author: - first_name: J. full_name: Winterhalter, J. last_name: Winterhalter - first_name: D. full_name: Maier, D. last_name: Maier - first_name: D. A. full_name: Grabowski, D. A. last_name: Grabowski - first_name: J. full_name: Honerkamp, J. last_name: Honerkamp - first_name: S. full_name: Müller, S. last_name: Müller - first_name: Claudia full_name: Schmidt, Claudia id: '466' last_name: Schmidt orcid: 0000-0003-3179-9997 citation: ama: Winterhalter J, Maier D, Grabowski DA, Honerkamp J, Müller S, Schmidt C. Determination of orientational distributions from 2H NMR data by a regularization method. The Journal of Chemical Physics. 1999;110(8):4035-4046. doi:10.1063/1.478285 apa: Winterhalter, J., Maier, D., Grabowski, D. A., Honerkamp, J., Müller, S., & Schmidt, C. (1999). Determination of orientational distributions from 2H NMR data by a regularization method. The Journal of Chemical Physics, 110(8), 4035–4046. https://doi.org/10.1063/1.478285 bibtex: '@article{Winterhalter_Maier_Grabowski_Honerkamp_Müller_Schmidt_1999, title={Determination of orientational distributions from 2H NMR data by a regularization method}, volume={110}, DOI={10.1063/1.478285}, number={8}, journal={The Journal of Chemical Physics}, publisher={AIP Publishing}, author={Winterhalter, J. and Maier, D. and Grabowski, D. A. and Honerkamp, J. and Müller, S. and Schmidt, Claudia}, year={1999}, pages={4035–4046} }' chicago: 'Winterhalter, J., D. Maier, D. A. Grabowski, J. Honerkamp, S. Müller, and Claudia Schmidt. “Determination of Orientational Distributions from 2H NMR Data by a Regularization Method.” The Journal of Chemical Physics 110, no. 8 (1999): 4035–46. https://doi.org/10.1063/1.478285.' ieee: 'J. Winterhalter, D. Maier, D. A. Grabowski, J. Honerkamp, S. Müller, and C. Schmidt, “Determination of orientational distributions from 2H NMR data by a regularization method,” The Journal of Chemical Physics, vol. 110, no. 8, pp. 4035–4046, 1999, doi: 10.1063/1.478285.' mla: Winterhalter, J., et al. “Determination of Orientational Distributions from 2H NMR Data by a Regularization Method.” The Journal of Chemical Physics, vol. 110, no. 8, AIP Publishing, 1999, pp. 4035–46, doi:10.1063/1.478285. short: J. Winterhalter, D. Maier, D.A. Grabowski, J. Honerkamp, S. Müller, C. Schmidt, The Journal of Chemical Physics 110 (1999) 4035–4046. date_created: 2023-01-06T13:18:12Z date_updated: 2023-01-07T11:15:48Z department: - _id: '2' - _id: '315' doi: 10.1063/1.478285 extern: '1' intvolume: ' 110' issue: '8' keyword: - Physical and Theoretical Chemistry - General Physics and Astronomy language: - iso: eng page: 4035-4046 publication: The Journal of Chemical Physics publication_identifier: issn: - 0021-9606 - 1089-7690 publication_status: published publisher: AIP Publishing quality_controlled: '1' status: public title: Determination of orientational distributions from 2H NMR data by a regularization method type: journal_article user_id: '466' volume: 110 year: '1999' ... --- _id: '35372' article_type: original author: - first_name: Isabel full_name: Quijada-Garrido, Isabel last_name: Quijada-Garrido - first_name: Hartmut full_name: Siebert, Hartmut last_name: Siebert - first_name: Patrick full_name: Becker, Patrick last_name: Becker - first_name: Christian full_name: Friedrich, Christian last_name: Friedrich - first_name: Claudia full_name: Schmidt, Claudia id: '466' last_name: Schmidt orcid: 0000-0003-3179-9997 citation: ama: Quijada-Garrido I, Siebert H, Becker P, Friedrich C, Schmidt C. Transient rheological behavior of tumbling side-chain liquid crystal polymers and determination of their λ parameters. Rheologica Acta. 1999;38(6):495-502. doi:10.1007/s003970050202 apa: Quijada-Garrido, I., Siebert, H., Becker, P., Friedrich, C., & Schmidt, C. (1999). Transient rheological behavior of tumbling side-chain liquid crystal polymers and determination of their λ parameters. Rheologica Acta, 38(6), 495–502. https://doi.org/10.1007/s003970050202 bibtex: '@article{Quijada-Garrido_Siebert_Becker_Friedrich_Schmidt_1999, title={Transient rheological behavior of tumbling side-chain liquid crystal polymers and determination of their λ parameters}, volume={38}, DOI={10.1007/s003970050202}, number={6}, journal={Rheologica Acta}, publisher={Springer Science and Business Media LLC}, author={Quijada-Garrido, Isabel and Siebert, Hartmut and Becker, Patrick and Friedrich, Christian and Schmidt, Claudia}, year={1999}, pages={495–502} }' chicago: 'Quijada-Garrido, Isabel, Hartmut Siebert, Patrick Becker, Christian Friedrich, and Claudia Schmidt. “Transient Rheological Behavior of Tumbling Side-Chain Liquid Crystal Polymers and Determination of Their λ Parameters.” Rheologica Acta 38, no. 6 (1999): 495–502. https://doi.org/10.1007/s003970050202.' ieee: 'I. Quijada-Garrido, H. Siebert, P. Becker, C. Friedrich, and C. Schmidt, “Transient rheological behavior of tumbling side-chain liquid crystal polymers and determination of their λ parameters,” Rheologica Acta, vol. 38, no. 6, pp. 495–502, 1999, doi: 10.1007/s003970050202.' mla: Quijada-Garrido, Isabel, et al. “Transient Rheological Behavior of Tumbling Side-Chain Liquid Crystal Polymers and Determination of Their λ Parameters.” Rheologica Acta, vol. 38, no. 6, Springer Science and Business Media LLC, 1999, pp. 495–502, doi:10.1007/s003970050202. short: I. Quijada-Garrido, H. Siebert, P. Becker, C. Friedrich, C. Schmidt, Rheologica Acta 38 (1999) 495–502. date_created: 2023-01-06T13:19:25Z date_updated: 2023-01-07T11:44:32Z department: - _id: '2' - _id: '315' doi: 10.1007/s003970050202 extern: '1' intvolume: ' 38' issue: '6' keyword: - Condensed Matter Physics - General Materials Science language: - iso: eng page: 495-502 publication: Rheologica Acta publication_identifier: issn: - 0035-4511 - 1435-1528 publication_status: published publisher: Springer Science and Business Media LLC quality_controlled: '1' status: public title: Transient rheological behavior of tumbling side-chain liquid crystal polymers and determination of their λ parameters type: journal_article user_id: '466' volume: 38 year: '1999' ...