[{"date_created":"2024-06-03T06:16:33Z","author":[{"full_name":"Prager, Raphael Patrick","last_name":"Prager","first_name":"Raphael Patrick"},{"full_name":"Trautmann, Heike","id":"100740","last_name":"Trautmann","orcid":"0000-0002-9788-8282","first_name":"Heike"}],"date_updated":"2024-06-03T06:17:13Z","doi":"10.1109/TEVC.2024.3399560","title":"Exploratory Landscape Analysis for Mixed-Variable Problems","page":"1-1","citation":{"chicago":"Prager, Raphael Patrick, and Heike Trautmann. “Exploratory Landscape Analysis for Mixed-Variable Problems.” <i>IEEE Transactions on Evolutionary Computation</i>, 2024, 1–1. <a href=\"https://doi.org/10.1109/TEVC.2024.3399560\">https://doi.org/10.1109/TEVC.2024.3399560</a>.","ieee":"R. P. Prager and H. Trautmann, “Exploratory Landscape Analysis for Mixed-Variable Problems,” <i>IEEE Transactions on Evolutionary Computation</i>, pp. 1–1, 2024, doi: <a href=\"https://doi.org/10.1109/TEVC.2024.3399560\">10.1109/TEVC.2024.3399560</a>.","ama":"Prager RP, Trautmann H. Exploratory Landscape Analysis for Mixed-Variable Problems. <i>IEEE Transactions on Evolutionary Computation</i>. Published online 2024:1-1. doi:<a href=\"https://doi.org/10.1109/TEVC.2024.3399560\">10.1109/TEVC.2024.3399560</a>","apa":"Prager, R. P., &#38; Trautmann, H. (2024). Exploratory Landscape Analysis for Mixed-Variable Problems. <i>IEEE Transactions on Evolutionary Computation</i>, 1–1. <a href=\"https://doi.org/10.1109/TEVC.2024.3399560\">https://doi.org/10.1109/TEVC.2024.3399560</a>","mla":"Prager, Raphael Patrick, and Heike Trautmann. “Exploratory Landscape Analysis for Mixed-Variable Problems.” <i>IEEE Transactions on Evolutionary Computation</i>, 2024, pp. 1–1, doi:<a href=\"https://doi.org/10.1109/TEVC.2024.3399560\">10.1109/TEVC.2024.3399560</a>.","bibtex":"@article{Prager_Trautmann_2024, title={Exploratory Landscape Analysis for Mixed-Variable Problems}, DOI={<a href=\"https://doi.org/10.1109/TEVC.2024.3399560\">10.1109/TEVC.2024.3399560</a>}, journal={IEEE Transactions on Evolutionary Computation}, author={Prager, Raphael Patrick and Trautmann, Heike}, year={2024}, pages={1–1} }","short":"R.P. Prager, H. Trautmann, IEEE Transactions on Evolutionary Computation (2024) 1–1."},"year":"2024","department":[{"_id":"819"}],"user_id":"15504","_id":"54548","language":[{"iso":"eng"}],"keyword":["Optimization","Evolutionary computation","Benchmark testing","Hyperparameter optimization","Portfolios","Extraterrestrial measurements","Dispersion","Exploratory landscape analysis","mixed-variable problem","mixed search spaces","automated algorithm selection"],"publication":"IEEE Transactions on Evolutionary Computation","type":"journal_article","status":"public"},{"user_id":"15504","_id":"56221","language":[{"iso":"eng"}],"keyword":["Optimization","Evolutionary computation","Approximation algorithms","Benchmark testing","Vectors","Surveys","Pareto optimization","multi-objective optimization","evolutionary computation","multimodal optimization","local solutions"],"type":"journal_article","publication":"IEEE Transactions on Evolutionary Computation","status":"public","date_created":"2024-09-24T08:01:14Z","author":[{"last_name":"Rodriguez-Fernandez","full_name":"Rodriguez-Fernandez, Angel E.","first_name":"Angel E."},{"full_name":"Schäpermeier, Lennart","last_name":"Schäpermeier","first_name":"Lennart"},{"last_name":"Hernández","full_name":"Hernández, Carlos","first_name":"Carlos"},{"last_name":"Kerschke","full_name":"Kerschke, Pascal","first_name":"Pascal"},{"id":"100740","full_name":"Trautmann, Heike","last_name":"Trautmann","orcid":"0000-0002-9788-8282","first_name":"Heike"},{"last_name":"Schütze","full_name":"Schütze, Oliver","first_name":"Oliver"}],"date_updated":"2024-09-24T08:01:47Z","doi":"10.1109/TEVC.2024.3458855","title":"Finding ϵ-Locally Optimal Solutions for Multi-Objective Multimodal Optimization","citation":{"chicago":"Rodriguez-Fernandez, Angel E., Lennart Schäpermeier, Carlos Hernández, Pascal Kerschke, Heike Trautmann, and Oliver Schütze. “Finding ϵ-Locally Optimal Solutions for Multi-Objective Multimodal Optimization.” <i>IEEE Transactions on Evolutionary Computation</i>, 2024, 1–1. <a href=\"https://doi.org/10.1109/TEVC.2024.3458855\">https://doi.org/10.1109/TEVC.2024.3458855</a>.","ieee":"A. E. Rodriguez-Fernandez, L. Schäpermeier, C. Hernández, P. Kerschke, H. Trautmann, and O. Schütze, “Finding ϵ-Locally Optimal Solutions for Multi-Objective Multimodal Optimization,” <i>IEEE Transactions on Evolutionary Computation</i>, pp. 1–1, 2024, doi: <a href=\"https://doi.org/10.1109/TEVC.2024.3458855\">10.1109/TEVC.2024.3458855</a>.","ama":"Rodriguez-Fernandez AE, Schäpermeier L, Hernández C, Kerschke P, Trautmann H, Schütze O. Finding ϵ-Locally Optimal Solutions for Multi-Objective Multimodal Optimization. <i>IEEE Transactions on Evolutionary Computation</i>. Published online 2024:1-1. doi:<a href=\"https://doi.org/10.1109/TEVC.2024.3458855\">10.1109/TEVC.2024.3458855</a>","short":"A.E. Rodriguez-Fernandez, L. Schäpermeier, C. Hernández, P. Kerschke, H. Trautmann, O. Schütze, IEEE Transactions on Evolutionary Computation (2024) 1–1.","mla":"Rodriguez-Fernandez, Angel E., et al. “Finding ϵ-Locally Optimal Solutions for Multi-Objective Multimodal Optimization.” <i>IEEE Transactions on Evolutionary Computation</i>, 2024, pp. 1–1, doi:<a href=\"https://doi.org/10.1109/TEVC.2024.3458855\">10.1109/TEVC.2024.3458855</a>.","bibtex":"@article{Rodriguez-Fernandez_Schäpermeier_Hernández_Kerschke_Trautmann_Schütze_2024, title={Finding ϵ-Locally Optimal Solutions for Multi-Objective Multimodal Optimization}, DOI={<a href=\"https://doi.org/10.1109/TEVC.2024.3458855\">10.1109/TEVC.2024.3458855</a>}, journal={IEEE Transactions on Evolutionary Computation}, author={Rodriguez-Fernandez, Angel E. and Schäpermeier, Lennart and Hernández, Carlos and Kerschke, Pascal and Trautmann, Heike and Schütze, Oliver}, year={2024}, pages={1–1} }","apa":"Rodriguez-Fernandez, A. E., Schäpermeier, L., Hernández, C., Kerschke, P., Trautmann, H., &#38; Schütze, O. (2024). Finding ϵ-Locally Optimal Solutions for Multi-Objective Multimodal Optimization. <i>IEEE Transactions on Evolutionary Computation</i>, 1–1. <a href=\"https://doi.org/10.1109/TEVC.2024.3458855\">https://doi.org/10.1109/TEVC.2024.3458855</a>"},"page":"1-1","year":"2024"},{"abstract":[{"text":"Engineering methodologies for Cyber-Physical Systems (CPS) call for planning simulations and physical testing in early phases of product creation. Even in Model-Based Systems Engineering, there is a lack of systematic support that results in avoidable costs and iterations in the engineering process. Planning test cases and test scenarios along the product engineering process is not sufficiently integrated in terms of support especially for verification and validation engineers. Based on a systematic literature review, concepts for model-based planning of testing are developed. Characteristics of test cases and test scenarios of CPS are systematically identified. Generic templates for the creation of test cases and scenarios are derived. Based on the templates, a System Modeling Language (SysML) profile extension is developed which enables intuitive modelling of test cases and scenarios. The SysML profile is evaluated in a sample System-of-Systems in Disaster Response. It subsumes various types of sensor systems like rescue robotics, data science algorithms and visualization technologies like Augmented Reality to support decisions in extreme weather events. The templates and SysML profile significantly add value for engineers in the early and systematic planning of verification and validation.","lang":"eng"}],"publication":"2024 IEEE International Symposium on Systems Engineering (ISSE)","keyword":["Systems Engineering","Systems verification","System testing"],"language":[{"iso":"eng"}],"year":"2024","quality_controlled":"1","title":"Model-based planning of test cases and test scenarios to support engineering of Cyber-Physical Systems","publisher":"IEEE","date_created":"2024-11-20T20:06:22Z","status":"public","type":"conference","project":[{"grant_number":"101092749","name":"CREXDATA: CREXDATA: Kritische Maßnahmenplanung über extreme Datenmengen","_id":"516"}],"_id":"57300","user_id":"405","department":[{"_id":"152"}],"citation":{"short":"I. Gräßler, M. Ebel, J. Pottebaum, in: 2024 IEEE International Symposium on Systems Engineering (ISSE), IEEE, 2024.","bibtex":"@inproceedings{Gräßler_Ebel_Pottebaum_2024, title={Model-based planning of test cases and test scenarios to support engineering of Cyber-Physical Systems}, DOI={<a href=\"https://doi.org/10.1109/isse63315.2024.10741135\">10.1109/isse63315.2024.10741135</a>}, booktitle={2024 IEEE International Symposium on Systems Engineering (ISSE)}, publisher={IEEE}, author={Gräßler, Iris and Ebel, Marcel and Pottebaum, Jens}, year={2024} }","mla":"Gräßler, Iris, et al. “Model-Based Planning of Test Cases and Test Scenarios to Support Engineering of Cyber-Physical Systems.” <i>2024 IEEE International Symposium on Systems Engineering (ISSE)</i>, IEEE, 2024, doi:<a href=\"https://doi.org/10.1109/isse63315.2024.10741135\">10.1109/isse63315.2024.10741135</a>.","apa":"Gräßler, I., Ebel, M., &#38; Pottebaum, J. (2024). Model-based planning of test cases and test scenarios to support engineering of Cyber-Physical Systems. <i>2024 IEEE International Symposium on Systems Engineering (ISSE)</i>.  IEEE International Symposium on Systems Engineering 2024, Perugia. <a href=\"https://doi.org/10.1109/isse63315.2024.10741135\">https://doi.org/10.1109/isse63315.2024.10741135</a>","chicago":"Gräßler, Iris, Marcel Ebel, and Jens Pottebaum. “Model-Based Planning of Test Cases and Test Scenarios to Support Engineering of Cyber-Physical Systems.” In <i>2024 IEEE International Symposium on Systems Engineering (ISSE)</i>. IEEE, 2024. <a href=\"https://doi.org/10.1109/isse63315.2024.10741135\">https://doi.org/10.1109/isse63315.2024.10741135</a>.","ieee":"I. Gräßler, M. Ebel, and J. Pottebaum, “Model-based planning of test cases and test scenarios to support engineering of Cyber-Physical Systems,” presented at the  IEEE International Symposium on Systems Engineering 2024, Perugia, 2024, doi: <a href=\"https://doi.org/10.1109/isse63315.2024.10741135\">10.1109/isse63315.2024.10741135</a>.","ama":"Gräßler I, Ebel M, Pottebaum J. Model-based planning of test cases and test scenarios to support engineering of Cyber-Physical Systems. In: <i>2024 IEEE International Symposium on Systems Engineering (ISSE)</i>. IEEE; 2024. doi:<a href=\"https://doi.org/10.1109/isse63315.2024.10741135\">10.1109/isse63315.2024.10741135</a>"},"publication_status":"published","has_accepted_license":"1","main_file_link":[{"url":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10741135&tag=1","open_access":"1"}],"doi":"10.1109/isse63315.2024.10741135","conference":{"name":" IEEE International Symposium on Systems Engineering 2024","start_date":"2024-10-16","end_date":"2024-10-18","location":"Perugia"},"oa":"1","date_updated":"2025-01-17T16:20:14Z","author":[{"full_name":"Gräßler, Iris","id":"47565","orcid":"0000-0001-5765-971X","last_name":"Gräßler","first_name":"Iris"},{"first_name":"Marcel","orcid":"https://orcid.org/0009-0007-5400-4436","last_name":"Ebel","full_name":"Ebel, Marcel","id":"81788"},{"first_name":"Jens","full_name":"Pottebaum, Jens","id":"405","last_name":"Pottebaum","orcid":"http://orcid.org/0000-0001-8778-2989"}]},{"author":[{"first_name":"Gregor","full_name":"Reschke, Gregor","last_name":"Reschke"},{"first_name":"Daniel","full_name":"Köhler, Daniel","last_name":"Köhler"},{"last_name":"Kupfer","full_name":"Kupfer, Robert","first_name":"Robert"},{"full_name":"Troschitz, Juliane","last_name":"Troschitz","first_name":"Juliane"},{"full_name":"Gude, Maik","last_name":"Gude","first_name":"Maik"},{"last_name":"Brosius","full_name":"Brosius, Alexander","first_name":"Alexander"}],"oa":"1","date_updated":"2025-01-23T19:32:03Z","main_file_link":[{"open_access":"1"}],"doi":"10.1177/09544089241251646","publication_status":"published","publication_identifier":{"issn":["0954-4089","2041-3009"]},"citation":{"ama":"Reschke G, Köhler D, Kupfer R, Troschitz J, Gude M, Brosius A. In-situ computed tomography and transient dynamic analysis – failure analysis of a single-lap tensile-shear test with clinch points. <i>Proceedings of the Institution of Mechanical Engineers, Part E: Journal of Process Mechanical Engineering</i>. Published online 2024. doi:<a href=\"https://doi.org/10.1177/09544089241251646\">10.1177/09544089241251646</a>","chicago":"Reschke, Gregor, Daniel Köhler, Robert Kupfer, Juliane Troschitz, Maik Gude, and Alexander Brosius. “In-Situ Computed Tomography and Transient Dynamic Analysis – Failure Analysis of a Single-Lap Tensile-Shear Test with Clinch Points.” <i>Proceedings of the Institution of Mechanical Engineers, Part E: Journal of Process Mechanical Engineering</i>, 2024. <a href=\"https://doi.org/10.1177/09544089241251646\">https://doi.org/10.1177/09544089241251646</a>.","ieee":"G. Reschke, D. Köhler, R. Kupfer, J. Troschitz, M. Gude, and A. Brosius, “In-situ computed tomography and transient dynamic analysis – failure analysis of a single-lap tensile-shear test with clinch points,” <i>Proceedings of the Institution of Mechanical Engineers, Part E: Journal of Process Mechanical Engineering</i>, 2024, doi: <a href=\"https://doi.org/10.1177/09544089241251646\">10.1177/09544089241251646</a>.","mla":"Reschke, Gregor, et al. “In-Situ Computed Tomography and Transient Dynamic Analysis – Failure Analysis of a Single-Lap Tensile-Shear Test with Clinch Points.” <i>Proceedings of the Institution of Mechanical Engineers, Part E: Journal of Process Mechanical Engineering</i>, SAGE Publications, 2024, doi:<a href=\"https://doi.org/10.1177/09544089241251646\">10.1177/09544089241251646</a>.","short":"G. Reschke, D. Köhler, R. Kupfer, J. Troschitz, M. Gude, A. Brosius, Proceedings of the Institution of Mechanical Engineers, Part E: Journal of Process Mechanical Engineering (2024).","bibtex":"@article{Reschke_Köhler_Kupfer_Troschitz_Gude_Brosius_2024, title={In-situ computed tomography and transient dynamic analysis – failure analysis of a single-lap tensile-shear test with clinch points}, DOI={<a href=\"https://doi.org/10.1177/09544089241251646\">10.1177/09544089241251646</a>}, journal={Proceedings of the Institution of Mechanical Engineers, Part E: Journal of Process Mechanical Engineering}, publisher={SAGE Publications}, author={Reschke, Gregor and Köhler, Daniel and Kupfer, Robert and Troschitz, Juliane and Gude, Maik and Brosius, Alexander}, year={2024} }","apa":"Reschke, G., Köhler, D., Kupfer, R., Troschitz, J., Gude, M., &#38; Brosius, A. (2024). In-situ computed tomography and transient dynamic analysis – failure analysis of a single-lap tensile-shear test with clinch points. <i>Proceedings of the Institution of Mechanical Engineers, Part E: Journal of Process Mechanical Engineering</i>. <a href=\"https://doi.org/10.1177/09544089241251646\">https://doi.org/10.1177/09544089241251646</a>"},"user_id":"98812","department":[{"_id":"43"},{"_id":"157"}],"project":[{"name":"TRR 285 - C: TRR 285 - Project Area C","_id":"133"},{"name":"TRR 285 – C04: TRR 285 - Subproject C04","_id":"148"}],"_id":"58348","article_type":"original","type":"journal_article","status":"public","date_created":"2025-01-23T19:21:45Z","publisher":"SAGE Publications","title":"In-situ computed tomography and transient dynamic analysis – failure analysis of a single-lap tensile-shear test with clinch points","quality_controlled":"1","year":"2024","language":[{"iso":"eng"}],"keyword":["Clinching","Non-destructive testing","Transient Dynamic Analysis"],"publication":"Proceedings of the Institution of Mechanical Engineers, Part E: Journal of Process Mechanical Engineering","abstract":[{"text":"<jats:p> Clinching is a mechanical joining technology, in which a mainly form-fit joint is created by means of local cold forming. To characterize the load-bearing behavior of such joints, they are typically analyzed destructively, for example by tensile-shear tests in combination with metallographic sections. However, both the initiation and progress of failure can only be described to a limited extent by this method. Furthermore, these tests allow only limited conclusions about clinch points under in-service loading. More purposefully, clinch points can be analyzed nondestructively by combining in-situ computed tomography (CT) and transient dynamic analysis (TDA). The TDA continuously measures the dynamic behavior of the specimen and indicates failure events like crack initiation, which then can be evaluated thoroughly by stopping the test and performing a CT scan. To qualify the TDA for this task, it is necessary to link the observed damage behavior with specific dynamic characteristics. In this work, the complementation of in-situ CT and TDA is investigated by testing a clinched single-lap tensile-shear specimen made of aluminum. The testing procedure is stepwise: at certain displacement levels, the specimen is investigated by in-situ CT and TDA. While the in-situ CT provides the location, extent, and development of the failure phenomena, the TDA uses this information to evaluate the dynamic signal and detect relevant frequency ranges, which indicate damage events. The results demonstrate, that failure initiation and progression can be analyzed efficiently by combining both measuring systems. The TDA reliably detects relevant signal changes in the monitored frequency band. By means of in-situ computed tomography, the corresponding failure phenomena can be described in detail, enhancing the understanding of the load-bearing and deformation behavior of clinch points. The concatenation of characteristic signal changes and observed failure phenomena can henceforth be transferred to analyze complex structures during operation nondestructively by TDA. </jats:p>","lang":"eng"}]},{"_id":"34212","project":[{"_id":"130","name":"TRR 285: TRR 285","grant_number":"418701707"},{"_id":"133","name":"TRR 285 - C: TRR 285 - Project Area C"},{"name":"TRR 285 – C04: TRR 285 - Subproject C04","_id":"148"}],"user_id":"7850","keyword":["Clinching","Non-destructive testing","Computed tomography","In situ CT"],"language":[{"iso":"eng"}],"publication":"The Minerals, Metals & Materials Series","type":"book_chapter","abstract":[{"lang":"eng","text":"Force–displacement measurements and micrograph analyses are commonly used methods to validate numerical models of clinching processes. However, these methods often lead to resetting of elastic deformations and crack-\r\nclosing after unloading. In contrast, the in situ computed tomography (CT) can provide three-dimensional images of the clinch point under loading conditions. In this paper, the potential of the in situ investigation of a clinching process as validation method is analyzed. For the in situ testing, a tailored test set-up featuring a beryllium cylinder for load-bearing and clinching tools made from ultra-high-strength titanium and Si3N4 are used. In the experiments, the clinching of two aluminum sheets is interrupted at specific process steps in order to perform the CT scans. It is shown that in situ CT visualizes the inner geometry of the joint at high precision and that this method is suitable to validate numerical models."}],"status":"public","date_updated":"2022-12-05T21:11:47Z","publisher":"Springer International Publishing","author":[{"first_name":"Daniel","full_name":"Köhler, Daniel","last_name":"Köhler"},{"first_name":"Robert","last_name":"Kupfer","full_name":"Kupfer, Robert"},{"first_name":"Juliane","full_name":"Troschitz, Juliane","last_name":"Troschitz"},{"last_name":"Gude","full_name":"Gude, Maik","first_name":"Maik"}],"date_created":"2022-12-05T21:06:21Z","title":"Clinching in In Situ CT—A Novel Validation Method for Mechanical Joining Processes","doi":"10.1007/978-3-031-06212-4_75","publication_identifier":{"issn":["2367-1181","2367-1696"],"isbn":["9783031062117","9783031062124"]},"publication_status":"published","year":"2022","place":"Cham","citation":{"apa":"Köhler, D., Kupfer, R., Troschitz, J., &#38; Gude, M. (2022). Clinching in In Situ CT—A Novel Validation Method for Mechanical Joining Processes. In <i>The Minerals, Metals &#38; Materials Series</i>. Springer International Publishing. <a href=\"https://doi.org/10.1007/978-3-031-06212-4_75\">https://doi.org/10.1007/978-3-031-06212-4_75</a>","bibtex":"@inbook{Köhler_Kupfer_Troschitz_Gude_2022, place={Cham}, title={Clinching in In Situ CT—A Novel Validation Method for Mechanical Joining Processes}, DOI={<a href=\"https://doi.org/10.1007/978-3-031-06212-4_75\">10.1007/978-3-031-06212-4_75</a>}, booktitle={The Minerals, Metals &#38; Materials Series}, publisher={Springer International Publishing}, author={Köhler, Daniel and Kupfer, Robert and Troschitz, Juliane and Gude, Maik}, year={2022} }","short":"D. Köhler, R. Kupfer, J. Troschitz, M. Gude, in: The Minerals, Metals &#38; Materials Series, Springer International Publishing, Cham, 2022.","mla":"Köhler, Daniel, et al. “Clinching in In Situ CT—A Novel Validation Method for Mechanical Joining Processes.” <i>The Minerals, Metals &#38; Materials Series</i>, Springer International Publishing, 2022, doi:<a href=\"https://doi.org/10.1007/978-3-031-06212-4_75\">10.1007/978-3-031-06212-4_75</a>.","ieee":"D. Köhler, R. Kupfer, J. Troschitz, and M. Gude, “Clinching in In Situ CT—A Novel Validation Method for Mechanical Joining Processes,” in <i>The Minerals, Metals &#38; Materials Series</i>, Cham: Springer International Publishing, 2022.","chicago":"Köhler, Daniel, Robert Kupfer, Juliane Troschitz, and Maik Gude. “Clinching in In Situ CT—A Novel Validation Method for Mechanical Joining Processes.” In <i>The Minerals, Metals &#38; Materials Series</i>. Cham: Springer International Publishing, 2022. <a href=\"https://doi.org/10.1007/978-3-031-06212-4_75\">https://doi.org/10.1007/978-3-031-06212-4_75</a>.","ama":"Köhler D, Kupfer R, Troschitz J, Gude M. Clinching in In Situ CT—A Novel Validation Method for Mechanical Joining Processes. In: <i>The Minerals, Metals &#38; Materials Series</i>. Springer International Publishing; 2022. doi:<a href=\"https://doi.org/10.1007/978-3-031-06212-4_75\">10.1007/978-3-031-06212-4_75</a>"}},{"citation":{"chicago":"Nguyen Quang Do, Lisa, Stefan Krüger, Patrick Hill, Karim Ali, and Eric Bodden. “Debugging Static Analysis.” <i>IEEE Transactions on Software Engineering</i>, 2018, 1–1. <a href=\"https://doi.org/10.1109/TSE.2018.2868349\">https://doi.org/10.1109/TSE.2018.2868349</a>.","ieee":"L. Nguyen Quang Do, S. Krüger, P. Hill, K. Ali, and E. Bodden, “Debugging Static Analysis,” <i>IEEE Transactions on Software Engineering</i>, pp. 1–1, 2018, doi: <a href=\"https://doi.org/10.1109/TSE.2018.2868349\">10.1109/TSE.2018.2868349</a>.","ama":"Nguyen Quang Do L, Krüger S, Hill P, Ali K, Bodden E. Debugging Static Analysis. <i>IEEE Transactions on Software Engineering</i>. Published online 2018:1-1. doi:<a href=\"https://doi.org/10.1109/TSE.2018.2868349\">10.1109/TSE.2018.2868349</a>","mla":"Nguyen Quang Do, Lisa, et al. “Debugging Static Analysis.” <i>IEEE Transactions on Software Engineering</i>, 2018, pp. 1–1, doi:<a href=\"https://doi.org/10.1109/TSE.2018.2868349\">10.1109/TSE.2018.2868349</a>.","bibtex":"@article{Nguyen Quang Do_Krüger_Hill_Ali_Bodden_2018, title={Debugging Static Analysis}, DOI={<a href=\"https://doi.org/10.1109/TSE.2018.2868349\">10.1109/TSE.2018.2868349</a>}, journal={IEEE Transactions on Software Engineering}, author={Nguyen Quang Do, Lisa and Krüger, Stefan and Hill, Patrick and Ali, Karim and Bodden, Eric}, year={2018}, pages={1–1} }","short":"L. Nguyen Quang Do, S. Krüger, P. Hill, K. Ali, E. Bodden, IEEE Transactions on Software Engineering (2018) 1–1.","apa":"Nguyen Quang Do, L., Krüger, S., Hill, P., Ali, K., &#38; Bodden, E. (2018). Debugging Static Analysis. <i>IEEE Transactions on Software Engineering</i>, 1–1. <a href=\"https://doi.org/10.1109/TSE.2018.2868349\">https://doi.org/10.1109/TSE.2018.2868349</a>"},"page":"1-1","year":"2018","publication_identifier":{"issn":["2326-3881"]},"main_file_link":[{"url":"http://www.bodden.de/pubs/tse18debugging.pdf"}],"doi":"10.1109/TSE.2018.2868349","title":"Debugging Static Analysis","date_created":"2020-11-30T09:32:12Z","author":[{"full_name":"Nguyen Quang Do, Lisa","last_name":"Nguyen Quang Do","first_name":"Lisa"},{"last_name":"Krüger","full_name":"Krüger, Stefan","first_name":"Stefan"},{"last_name":"Hill","full_name":"Hill, Patrick","first_name":"Patrick"},{"last_name":"Ali","full_name":"Ali, Karim","first_name":"Karim"},{"last_name":"Bodden","orcid":"0000-0003-3470-3647","full_name":"Bodden, Eric","id":"59256","first_name":"Eric"}],"date_updated":"2022-01-06T06:54:29Z","status":"public","type":"journal_article","publication":"IEEE Transactions on Software Engineering","language":[{"iso":"eng"}],"keyword":["Debugging","Static analysis","Tools","Computer bugs","Standards","Writing","Encoding","Testing and Debugging","Program analysis","Development tools","Integrated environments","Graphical environments","Usability testing"],"user_id":"5786","department":[{"_id":"76"}],"_id":"20543"},{"language":[{"iso":"eng"}],"extern":"1","keyword":["Beliefs","Competency Based Teacher Education","Control Groups","Early Childhood Education","Faculty Development","Foreign Countries","Inservice Teacher Education","Intervention","Mathematical Aptitude","Mathematics Skills","Pedagogical Content Knowledge","Preschool Teachers","Pretests Posttests","Professional Continuing Education","Statistical Analysis","Teacher Competency Testing"],"department":[{"_id":"611"},{"_id":"97"}],"user_id":"49063","_id":"36481","status":"public","abstract":[{"text":"Recent studies highlight early childhood teachers’ mathematics-related competence. Developing this competence should be a main aspect of early childhood teachers’ education. This is, however, not the case in all countries. Consequently, high-quality professional development courses are needed. Based on research results, we developed a competence-oriented continuous professional development course (\"EmMa\") and examined the effects of \"EmMa\" by asking: How does \"EmMa\" affect the development of early childhood teachers’ i) mathematical content knowledge, ii) mathematical pedagogical content knowledge and iii) beliefs towards mathematics in general? To answer these questions, we conducted a pre-test/post-test study including a control group with 99 in-service early childhood teachers. Results show that the course affected teachers’ mathematical pedagogical content knowledge and static orientation towards mathematics positively. From this we conclude that scaling-up \"EmMa\" might be a suitable approach to bridge the gap between pre-service education with nearly no mathematics and the challenges of early mathematics education.","lang":"eng"}],"publication":"Mathematics Teacher Education and Development (MTED)","type":"journal_article","title":"Mathematics-related Competence of Early Childhood Teachers Visiting a Continuous Professional Development Course: An Intervention Study","volume":19,"date_created":"2023-01-12T15:28:13Z","author":[{"last_name":"Bruns","orcid":"https://orcid.org/0000-0002-6604-5864","full_name":"Bruns, Julia","id":"72183","first_name":"Julia"},{"full_name":"Eichen, Lars","last_name":"Eichen","first_name":"Lars"},{"first_name":"Hedwig","last_name":"Gasteiger","full_name":"Gasteiger, Hedwig"}],"date_updated":"2023-06-20T19:01:36Z","intvolume":"        19","page":"76–93","citation":{"apa":"Bruns, J., Eichen, L., &#38; Gasteiger, H. (2017). Mathematics-related Competence of Early Childhood Teachers Visiting a Continuous Professional Development Course: An Intervention Study. <i>Mathematics Teacher Education and Development (MTED)</i>, <i>19</i>(3), 76–93.","bibtex":"@article{Bruns_Eichen_Gasteiger_2017, title={Mathematics-related Competence of Early Childhood Teachers Visiting a Continuous Professional Development Course: An Intervention Study}, volume={19}, number={3}, journal={Mathematics Teacher Education and Development (MTED)}, author={Bruns, Julia and Eichen, Lars and Gasteiger, Hedwig}, year={2017}, pages={76–93} }","short":"J. Bruns, L. Eichen, H. Gasteiger, Mathematics Teacher Education and Development (MTED) 19 (2017) 76–93.","mla":"Bruns, Julia, et al. “Mathematics-Related Competence of Early Childhood Teachers Visiting a Continuous Professional Development Course: An Intervention Study.” <i>Mathematics Teacher Education and Development (MTED)</i>, vol. 19, no. 3, 2017, pp. 76–93.","ama":"Bruns J, Eichen L, Gasteiger H. Mathematics-related Competence of Early Childhood Teachers Visiting a Continuous Professional Development Course: An Intervention Study. <i>Mathematics Teacher Education and Development (MTED)</i>. 2017;19(3):76–93.","ieee":"J. Bruns, L. Eichen, and H. Gasteiger, “Mathematics-related Competence of Early Childhood Teachers Visiting a Continuous Professional Development Course: An Intervention Study,” <i>Mathematics Teacher Education and Development (MTED)</i>, vol. 19, no. 3, pp. 76–93, 2017.","chicago":"Bruns, Julia, Lars Eichen, and Hedwig Gasteiger. “Mathematics-Related Competence of Early Childhood Teachers Visiting a Continuous Professional Development Course: An Intervention Study.” <i>Mathematics Teacher Education and Development (MTED)</i> 19, no. 3 (2017): 76–93."},"year":"2017","issue":"3","quality_controlled":"1","publication_status":"published"},{"status":"public","abstract":[{"lang":"eng","text":"A measurement method is presented that combines the advantages of the multisine measurement technique with a prediction method for peak bending behavior. This combination allows the analysis of the dynamic behavior of mechanical structures at distinctly reduced measurement durations and has the advantage of reducing high excitation impacts on the structure under test."}],"type":"conference","publication":"Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International","language":[{"iso":"eng"}],"keyword":["bending","dynamic testing","measurement","structural engineering","vibrations","measurement durations","mechanical structures","multisine measurement technique","nonlinear peak bending behavior","prediction method","time-efficient dynamic analysis","Heuristic algorithms","Nonlinear systems","Oscillators","Time measurement","Time-frequency analysis","Vibrations"],"user_id":"55222","department":[{"_id":"151"}],"_id":"9889","citation":{"ama":"Sprock C, Sextro W. Time-efficient dynamic analysis of structures exhibiting nonlinear peak bending. In: <i>Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International</i>. ; 2014:320-324. doi:<a href=\"https://doi.org/10.1109/I2MTC.2014.6860760\">10.1109/I2MTC.2014.6860760</a>","ieee":"C. Sprock and W. Sextro, “Time-efficient dynamic analysis of structures exhibiting nonlinear peak bending,” in <i>Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International</i>, 2014, pp. 320–324.","chicago":"Sprock, Christian, and Walter Sextro. “Time-Efficient Dynamic Analysis of Structures Exhibiting Nonlinear Peak Bending.” In <i>Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International</i>, 320–24, 2014. <a href=\"https://doi.org/10.1109/I2MTC.2014.6860760\">https://doi.org/10.1109/I2MTC.2014.6860760</a>.","mla":"Sprock, Christian, and Walter Sextro. “Time-Efficient Dynamic Analysis of Structures Exhibiting Nonlinear Peak Bending.” <i>Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International</i>, 2014, pp. 320–24, doi:<a href=\"https://doi.org/10.1109/I2MTC.2014.6860760\">10.1109/I2MTC.2014.6860760</a>.","bibtex":"@inproceedings{Sprock_Sextro_2014, title={Time-efficient dynamic analysis of structures exhibiting nonlinear peak bending}, DOI={<a href=\"https://doi.org/10.1109/I2MTC.2014.6860760\">10.1109/I2MTC.2014.6860760</a>}, booktitle={Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International}, author={Sprock, Christian and Sextro, Walter}, year={2014}, pages={320–324} }","short":"C. Sprock, W. Sextro, in: Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International, 2014, pp. 320–324.","apa":"Sprock, C., &#38; Sextro, W. (2014). Time-efficient dynamic analysis of structures exhibiting nonlinear peak bending. In <i>Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International</i> (pp. 320–324). <a href=\"https://doi.org/10.1109/I2MTC.2014.6860760\">https://doi.org/10.1109/I2MTC.2014.6860760</a>"},"page":"320-324","year":"2014","doi":"10.1109/I2MTC.2014.6860760","title":"Time-efficient dynamic analysis of structures exhibiting nonlinear peak bending","date_created":"2019-05-20T13:25:22Z","author":[{"first_name":"Christian","full_name":"Sprock, Christian","last_name":"Sprock"},{"first_name":"Walter","full_name":"Sextro, Walter","id":"21220","last_name":"Sextro"}],"date_updated":"2019-05-20T13:25:53Z"},{"publication":"Proceedings of Euromicro DSD 2011","type":"conference","abstract":[{"lang":"eng","text":"HDL-mutation based fault injection and analysis is considered as an important coverage metric for measuring the quality of design simulation processes [20, 3, 1, 2]. In this work, we try to solve the problem of automatic simulation data generation targeting HDL mutation faults. We follow a search based approach and eliminate the need for symbolic execution and mathematical constraint solving from existing work. An objective cost function is defined on the test input space and serves the guidance of search for fault-detecting test data. This is done by first mapping the simulation traces under a test onto a control and data flow graph structure which is extracted from the design. Then the progress of fault detection can be measured quantitatively on this graph to be the cost value. By minimizing this cost we approach the target test data. The effectiveness of the cost function is investigated under an example neighborhood search scheme. Case study with a floating point arithmetic IP design has shown that the cost function is able to guide effectively the search procedure towards a fault-detecting test. The cost calculation time as the search overhead was also observed to be minor compared to the actual design simulation time."}],"status":"public","_id":"37002","department":[{"_id":"672"}],"user_id":"5786","keyword":["Hardware design languages","Cost function","Computational modeling","Fault detection","Data models","Analytical models","Testing"],"language":[{"iso":"eng"}],"publication_identifier":{"isbn":["978-1-4577-1048-3"]},"year":"2011","place":"Oulu, Finnland","citation":{"bibtex":"@inproceedings{Xie_Müller_Letombe_2011, place={Oulu, Finnland}, title={HDL-Mutation Based Simulation Data Generation by Propagation Guided Search}, DOI={<a href=\"https://doi.org/10.1109/DSD.2011.83\">10.1109/DSD.2011.83</a>}, booktitle={Proceedings of Euromicro DSD 2011}, publisher={IEEE}, author={Xie, Tao and Müller, Wolfgang and Letombe, Florian}, year={2011} }","mla":"Xie, Tao, et al. “HDL-Mutation Based Simulation Data Generation by Propagation Guided Search.” <i>Proceedings of Euromicro DSD 2011</i>, IEEE, 2011, doi:<a href=\"https://doi.org/10.1109/DSD.2011.83\">10.1109/DSD.2011.83</a>.","short":"T. Xie, W. Müller, F. Letombe, in: Proceedings of Euromicro DSD 2011, IEEE, Oulu, Finnland, 2011.","apa":"Xie, T., Müller, W., &#38; Letombe, F. (2011). HDL-Mutation Based Simulation Data Generation by Propagation Guided Search. <i>Proceedings of Euromicro DSD 2011</i>. <a href=\"https://doi.org/10.1109/DSD.2011.83\">https://doi.org/10.1109/DSD.2011.83</a>","ama":"Xie T, Müller W, Letombe F. HDL-Mutation Based Simulation Data Generation by Propagation Guided Search. In: <i>Proceedings of Euromicro DSD 2011</i>. IEEE; 2011. doi:<a href=\"https://doi.org/10.1109/DSD.2011.83\">10.1109/DSD.2011.83</a>","chicago":"Xie, Tao, Wolfgang Müller, and Florian Letombe. “HDL-Mutation Based Simulation Data Generation by Propagation Guided Search.” In <i>Proceedings of Euromicro DSD 2011</i>. Oulu, Finnland: IEEE, 2011. <a href=\"https://doi.org/10.1109/DSD.2011.83\">https://doi.org/10.1109/DSD.2011.83</a>.","ieee":"T. Xie, W. Müller, and F. Letombe, “HDL-Mutation Based Simulation Data Generation by Propagation Guided Search,” 2011, doi: <a href=\"https://doi.org/10.1109/DSD.2011.83\">10.1109/DSD.2011.83</a>."},"date_updated":"2025-02-26T14:44:15Z","publisher":"IEEE","author":[{"first_name":"Tao","last_name":"Xie","full_name":"Xie, Tao"},{"full_name":"Müller, Wolfgang","id":"16243","last_name":"Müller","first_name":"Wolfgang"},{"first_name":"Florian","last_name":"Letombe","full_name":"Letombe, Florian"}],"date_created":"2023-01-17T09:02:48Z","title":"HDL-Mutation Based Simulation Data Generation by Propagation Guided Search","doi":"10.1109/DSD.2011.83"},{"date_updated":"2023-01-17T10:41:25Z","publisher":"IEEE","author":[{"full_name":"Krupp, Alexander","last_name":"Krupp","first_name":"Alexander"},{"first_name":"Wolfgang","last_name":"Müller","full_name":"Müller, Wolfgang","id":"16243"}],"date_created":"2023-01-17T10:41:15Z","title":"A Systematic Approach to Combined HW/SW System Test","doi":"10.1109/DATE.2010.5457186","conference":{"name":"Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","location":"Dresden"},"place":"Dresden","year":"2010","citation":{"ama":"Krupp A, Müller W. A Systematic Approach to Combined HW/SW System Test. In: <i>Proceedings of DATE’10</i>. IEEE; 2010. doi:<a href=\"https://doi.org/10.1109/DATE.2010.5457186\">10.1109/DATE.2010.5457186</a>","chicago":"Krupp, Alexander, and Wolfgang Müller. “A Systematic Approach to Combined HW/SW System Test.” In <i>Proceedings of DATE’10</i>. Dresden: IEEE, 2010. <a href=\"https://doi.org/10.1109/DATE.2010.5457186\">https://doi.org/10.1109/DATE.2010.5457186</a>.","ieee":"A. Krupp and W. Müller, “A Systematic Approach to Combined HW/SW System Test,” presented at the Design, Automation &#38; Test in Europe Conference &#38; Exhibition (DATE 2010), Dresden, 2010, doi: <a href=\"https://doi.org/10.1109/DATE.2010.5457186\">10.1109/DATE.2010.5457186</a>.","mla":"Krupp, Alexander, and Wolfgang Müller. “A Systematic Approach to Combined HW/SW System Test.” <i>Proceedings of DATE’10</i>, IEEE, 2010, doi:<a href=\"https://doi.org/10.1109/DATE.2010.5457186\">10.1109/DATE.2010.5457186</a>.","bibtex":"@inproceedings{Krupp_Müller_2010, place={Dresden}, title={A Systematic Approach to Combined HW/SW System Test}, DOI={<a href=\"https://doi.org/10.1109/DATE.2010.5457186\">10.1109/DATE.2010.5457186</a>}, booktitle={Proceedings of DATE’10}, publisher={IEEE}, author={Krupp, Alexander and Müller, Wolfgang}, year={2010} }","short":"A. Krupp, W. Müller, in: Proceedings of DATE’10, IEEE, Dresden, 2010.","apa":"Krupp, A., &#38; Müller, W. (2010). A Systematic Approach to Combined HW/SW System Test. <i>Proceedings of DATE’10</i>. Design, Automation &#38; Test in Europe Conference &#38; Exhibition (DATE 2010), Dresden. <a href=\"https://doi.org/10.1109/DATE.2010.5457186\">https://doi.org/10.1109/DATE.2010.5457186</a>"},"_id":"37037","user_id":"5786","department":[{"_id":"672"}],"keyword":["System testing","Automatic testing","Object oriented modeling","Classification tree analysis","Automotive engineering","Mathematical model","Embedded system","Control systems","Electronic equipment testing","Software testing"],"language":[{"iso":"eng"}],"type":"conference","publication":"Proceedings of DATE’10","abstract":[{"lang":"eng","text":"Today we can identify a big gap between requirement specification and the generation of test environments. This article extends the Classification Tree Method for Embedded Systems (CTM/ES) to fill this gap by new concepts for the precise specification of stimuli for operational ranges of continuous control systems. It introduces novel means for continuous acceptance criteria definition and for functional coverage definition."}],"status":"public"},{"place":"Computer Engineering and Networks Lab, ETH Zurich","year":"2009","citation":{"ama":"Woehrle M, Plessl C, Thiele L. <i>Rupeas: Ruby Powered Event Analysis DSL</i>. Computer Engineering and Networks Lab, ETH Zurich; 2009.","ieee":"M. Woehrle, C. Plessl, and L. Thiele, <i>Rupeas: Ruby Powered Event Analysis DSL</i>. Computer Engineering and Networks Lab, ETH Zurich, 2009.","chicago":"Woehrle, Matthias, Christian Plessl, and Lothar Thiele. <i>Rupeas: Ruby Powered Event Analysis DSL</i>. Computer Engineering and Networks Lab, ETH Zurich, 2009.","mla":"Woehrle, Matthias, et al. <i>Rupeas: Ruby Powered Event Analysis DSL</i>. 2009.","short":"M. Woehrle, C. Plessl, L. Thiele, Rupeas: Ruby Powered Event Analysis DSL, Computer Engineering and Networks Lab, ETH Zurich, 2009.","bibtex":"@book{Woehrle_Plessl_Thiele_2009, place={Computer Engineering and Networks Lab, ETH Zurich}, title={Rupeas: Ruby Powered Event Analysis DSL}, author={Woehrle, Matthias and Plessl, Christian and Thiele, Lothar}, year={2009} }","apa":"Woehrle, M., Plessl, C., &#38; Thiele, L. (2009). <i>Rupeas: Ruby Powered Event Analysis DSL</i>. Computer Engineering and Networks Lab, ETH Zurich."},"title":"Rupeas: Ruby Powered Event Analysis DSL","date_updated":"2022-01-06T06:55:56Z","date_created":"2018-04-16T15:09:19Z","author":[{"last_name":"Woehrle","full_name":"Woehrle, Matthias","first_name":"Matthias"},{"id":"16153","full_name":"Plessl, Christian","orcid":"0000-0001-5728-9982","last_name":"Plessl","first_name":"Christian"},{"full_name":"Thiele, Lothar","last_name":"Thiele","first_name":"Lothar"}],"abstract":[{"lang":"eng","text":"Wireless Sensor Networks (WSNs) are unique embedded computation systems for distributed sensing of a dispersed phenomenon. While being a strongly concurrent distributed system, its embedded aspects with severe resource limitations and the wireless communication requires a fusion of technologies and methodologies from very different fields. As WSNs are deployed in remote locations for long-term unattended operation, assurance of correct functioning of the system is of prime concern. Thus, the design and development of WSNs requires specialized tools to allow for testing and debugging the system. To this end, we present a framework for analyzing and checking WSNs based on collected events during system operation. It allows for abstracting from the event trace by means of behavioral queries and uses assertions for checking the accordance of an execution to its specification. The framework is independent from WSN test platforms, applications and logging semantics and thus generally applicable for analyzing event logs of WSN test executions. "}],"status":"public","report_number":"TIK-Report 290","type":"report","keyword":["Rupeas","DSL","WSN","testing"],"language":[{"iso":"eng"}],"extern":"1","_id":"2353","user_id":"16153","department":[{"_id":"27"},{"_id":"518"}]},{"doi":"10.1109/SUTC.2008.24","title":"EvAnT: Analysis and Checking of event traces for Wireless Sensor Networks","author":[{"full_name":"Woehrle, Matthias","last_name":"Woehrle","first_name":"Matthias"},{"first_name":"Christian","id":"16153","full_name":"Plessl, Christian","orcid":"0000-0001-5728-9982","last_name":"Plessl"},{"full_name":"Lim, Roman","last_name":"Lim","first_name":"Roman"},{"first_name":"Jan","last_name":"Beutel","full_name":"Beutel, Jan"},{"first_name":"Lothar","full_name":"Thiele, Lothar","last_name":"Thiele"}],"date_created":"2018-04-17T12:03:20Z","date_updated":"2023-09-26T13:55:02Z","publisher":"IEEE Computer Society","page":"201-208","citation":{"ama":"Woehrle M, Plessl C, Lim R, Beutel J, Thiele L. EvAnT: Analysis and Checking of event traces for Wireless Sensor Networks. In: <i>IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC)</i>. IEEE Computer Society; 2008:201-208. doi:<a href=\"https://doi.org/10.1109/SUTC.2008.24\">10.1109/SUTC.2008.24</a>","ieee":"M. Woehrle, C. Plessl, R. Lim, J. Beutel, and L. Thiele, “EvAnT: Analysis and Checking of event traces for Wireless Sensor Networks,” in <i>IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC)</i>, 2008, pp. 201–208, doi: <a href=\"https://doi.org/10.1109/SUTC.2008.24\">10.1109/SUTC.2008.24</a>.","chicago":"Woehrle, Matthias, Christian Plessl, Roman Lim, Jan Beutel, and Lothar Thiele. “EvAnT: Analysis and Checking of Event Traces for Wireless Sensor Networks.” In <i>IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC)</i>, 201–8. Los Alamitos, CA, USA: IEEE Computer Society, 2008. <a href=\"https://doi.org/10.1109/SUTC.2008.24\">https://doi.org/10.1109/SUTC.2008.24</a>.","short":"M. Woehrle, C. Plessl, R. Lim, J. Beutel, L. Thiele, in: IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC), IEEE Computer Society, Los Alamitos, CA, USA, 2008, pp. 201–208.","bibtex":"@inproceedings{Woehrle_Plessl_Lim_Beutel_Thiele_2008, place={Los Alamitos, CA, USA}, title={EvAnT: Analysis and Checking of event traces for Wireless Sensor Networks}, DOI={<a href=\"https://doi.org/10.1109/SUTC.2008.24\">10.1109/SUTC.2008.24</a>}, booktitle={IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC)}, publisher={IEEE Computer Society}, author={Woehrle, Matthias and Plessl, Christian and Lim, Roman and Beutel, Jan and Thiele, Lothar}, year={2008}, pages={201–208} }","mla":"Woehrle, Matthias, et al. “EvAnT: Analysis and Checking of Event Traces for Wireless Sensor Networks.” <i>IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC)</i>, IEEE Computer Society, 2008, pp. 201–08, doi:<a href=\"https://doi.org/10.1109/SUTC.2008.24\">10.1109/SUTC.2008.24</a>.","apa":"Woehrle, M., Plessl, C., Lim, R., Beutel, J., &#38; Thiele, L. (2008). EvAnT: Analysis and Checking of event traces for Wireless Sensor Networks. <i>IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC)</i>, 201–208. <a href=\"https://doi.org/10.1109/SUTC.2008.24\">https://doi.org/10.1109/SUTC.2008.24</a>"},"year":"2008","place":"Los Alamitos, CA, USA","quality_controlled":"1","publication_identifier":{"isbn":["978-0-7695-3158-8"]},"language":[{"iso":"eng"}],"keyword":["WSN","testing","verification"],"department":[{"_id":"27"},{"_id":"518"}],"user_id":"15278","_id":"2370","status":"public","publication":"IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC)","type":"conference"},{"type":"conference","publication":"Proc. Workshop on Embedded Networked Sensors (EmNets)","status":"public","user_id":"15278","department":[{"_id":"27"},{"_id":"518"}],"_id":"2392","language":[{"iso":"eng"}],"keyword":["WSN","testing","distributed","embedded"],"publication_identifier":{"isbn":["978-1-59593-694-3"]},"quality_controlled":"1","citation":{"ama":"Woehrle M, Plessl C, Beutel J, Thiele L. Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework. In: <i>Proc. Workshop on Embedded Networked Sensors (EmNets)</i>. ACM; 2007:93-97. doi:<a href=\"https://doi.org/10.1145/1278972.1278996\">10.1145/1278972.1278996</a>","chicago":"Woehrle, Matthias, Christian Plessl, Jan Beutel, and Lothar Thiele. “Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework.” In <i>Proc. Workshop on Embedded Networked Sensors (EmNets)</i>, 93–97. New York, NY, USA: ACM, 2007. <a href=\"https://doi.org/10.1145/1278972.1278996\">https://doi.org/10.1145/1278972.1278996</a>.","ieee":"M. Woehrle, C. Plessl, J. Beutel, and L. Thiele, “Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework,” in <i>Proc. Workshop on Embedded Networked Sensors (EmNets)</i>, 2007, pp. 93–97, doi: <a href=\"https://doi.org/10.1145/1278972.1278996\">10.1145/1278972.1278996</a>.","mla":"Woehrle, Matthias, et al. “Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework.” <i>Proc. Workshop on Embedded Networked Sensors (EmNets)</i>, ACM, 2007, pp. 93–97, doi:<a href=\"https://doi.org/10.1145/1278972.1278996\">10.1145/1278972.1278996</a>.","short":"M. Woehrle, C. Plessl, J. Beutel, L. Thiele, in: Proc. Workshop on Embedded Networked Sensors (EmNets), ACM, New York, NY, USA, 2007, pp. 93–97.","bibtex":"@inproceedings{Woehrle_Plessl_Beutel_Thiele_2007, place={New York, NY, USA}, title={Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework}, DOI={<a href=\"https://doi.org/10.1145/1278972.1278996\">10.1145/1278972.1278996</a>}, booktitle={Proc. Workshop on Embedded Networked Sensors (EmNets)}, publisher={ACM}, author={Woehrle, Matthias and Plessl, Christian and Beutel, Jan and Thiele, Lothar}, year={2007}, pages={93–97} }","apa":"Woehrle, M., Plessl, C., Beutel, J., &#38; Thiele, L. (2007). Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework. <i>Proc. Workshop on Embedded Networked Sensors (EmNets)</i>, 93–97. <a href=\"https://doi.org/10.1145/1278972.1278996\">https://doi.org/10.1145/1278972.1278996</a>"},"page":"93-97","place":"New York, NY, USA","year":"2007","author":[{"last_name":"Woehrle","full_name":"Woehrle, Matthias","first_name":"Matthias"},{"first_name":"Christian","id":"16153","full_name":"Plessl, Christian","last_name":"Plessl","orcid":"0000-0001-5728-9982"},{"first_name":"Jan","last_name":"Beutel","full_name":"Beutel, Jan"},{"full_name":"Thiele, Lothar","last_name":"Thiele","first_name":"Lothar"}],"date_created":"2018-04-17T13:34:42Z","date_updated":"2023-09-26T14:00:38Z","publisher":"ACM","doi":"10.1145/1278972.1278996","title":"Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework"},{"status":"public","type":"conference","publication":"Proc. Int. Conf. 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Networked Sensing Systems (INSS)</i>, 303–303. <a href=\"https://doi.org/10.1109/INSS.2007.4297445\">https://doi.org/10.1109/INSS.2007.4297445</a>"},"page":"303-303","year":"2007","place":"Piscataway, NJ, USA","publication_identifier":{"isbn":["1-4244-1231-5"]},"quality_controlled":"1","doi":"10.1109/INSS.2007.4297445","title":"Automated Wireless Sensor Network Testing","date_created":"2018-04-17T13:35:55Z","author":[{"first_name":"Jan","last_name":"Beutel","full_name":"Beutel, Jan"},{"full_name":"Dyer, Matthias","last_name":"Dyer","first_name":"Matthias"},{"first_name":"Roman","full_name":"Lim, Roman","last_name":"Lim"},{"orcid":"0000-0001-5728-9982","last_name":"Plessl","full_name":"Plessl, Christian","id":"16153","first_name":"Christian"},{"first_name":"Matthias","full_name":"Woehrle, Matthias","last_name":"Woehrle"},{"last_name":"Yuecel","full_name":"Yuecel, Mustafa","first_name":"Mustafa"},{"first_name":"Lothar","full_name":"Thiele, Lothar","last_name":"Thiele"}],"date_updated":"2023-09-26T14:00:58Z","publisher":"IEEE"},{"type":"conference","publication":"Proceedings of the Design Automation & Test in Europe Conference","status":"public","abstract":[{"text":"This article presents the classification tree method for functional verification to close the gap from the specification of a test plan to SystemVerilog (Chandra and Chakrabarty, 2001) test bench generation. Our method supports the systematic development of test configurations and is based on the classification tree method for embedded systems (CTM/ES) (Chakrabarty et al., 2000) extending CTM/ES for random test generation as well as for functional coverage and property specification","lang":"eng"}],"user_id":"5786","department":[{"_id":"672"}],"_id":"38784","language":[{"iso":"eng"}],"keyword":["Classification tree analysis","System testing","Embedded system","Safety","Automatic testing","Automation"],"publication_identifier":{"isbn":["3-9810801-1-4"]},"citation":{"ama":"Krupp A, Müller W. Classification Trees for Functional Coverage and Random Test Generation. In: <i>Proceedings of the Design Automation &#38; Test in Europe Conference</i>. IEEE; 2006. doi:<a href=\"https://doi.org/10.1109/DATE.2006.243902\">10.1109/DATE.2006.243902</a>","ieee":"A. Krupp and W. 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Classification Trees for Functional Coverage and Random Test Generation. <i>Proceedings of the Design Automation &#38; Test in Europe Conference</i>. <a href=\"https://doi.org/10.1109/DATE.2006.243902\">https://doi.org/10.1109/DATE.2006.243902</a>","bibtex":"@inproceedings{Krupp_Müller_2006, place={Munich, Germany}, title={Classification Trees for Functional Coverage and Random Test Generation}, DOI={<a href=\"https://doi.org/10.1109/DATE.2006.243902\">10.1109/DATE.2006.243902</a>}, booktitle={Proceedings of the Design Automation &#38; Test in Europe Conference}, publisher={IEEE}, author={Krupp, Alexander and Müller, Wolfgang}, year={2006} }","short":"A. Krupp, W. 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Großmann and W. Müller, “A Formal Behavioral Semantics for TestML,” Paphos, Cyprus, 2006, doi: <a href=\"https://doi.org/10.1109/ISoLA.2006.37\">10.1109/ISoLA.2006.37</a>.","chicago":"Großmann, Jürgen, and Wolfgang Müller. “A Formal Behavioral Semantics for TestML.” In <i>Proc. of ISOLA 06</i>. Paphos, Cyprus, 2006. <a href=\"https://doi.org/10.1109/ISoLA.2006.37\">https://doi.org/10.1109/ISoLA.2006.37</a>.","ama":"Großmann J, Müller W. A Formal Behavioral Semantics for TestML. In: <i>Proc. of ISOLA 06</i>. ; 2006. doi:<a href=\"https://doi.org/10.1109/ISoLA.2006.37\">10.1109/ISoLA.2006.37</a>","mla":"Großmann, Jürgen, and Wolfgang Müller. “A Formal Behavioral Semantics for TestML.” <i>Proc. of ISOLA 06</i>, 2006, doi:<a href=\"https://doi.org/10.1109/ISoLA.2006.37\">10.1109/ISoLA.2006.37</a>.","bibtex":"@inproceedings{Großmann_Müller_2006, place={Paphos, Cyprus}, title={A Formal Behavioral Semantics for TestML}, DOI={<a href=\"https://doi.org/10.1109/ISoLA.2006.37\">10.1109/ISoLA.2006.37</a>}, booktitle={Proc. of ISOLA 06}, author={Großmann, Jürgen and Müller, Wolfgang}, year={2006} }","short":"J. Großmann, W. Müller, in: Proc. of ISOLA 06, Paphos, Cyprus, 2006.","apa":"Großmann, J., &#38; Müller, W. (2006). A Formal Behavioral Semantics for TestML. <i>Proc. of ISOLA 06</i>. <a href=\"https://doi.org/10.1109/ISoLA.2006.37\">https://doi.org/10.1109/ISoLA.2006.37</a>"},"year":"2006","place":"Paphos, Cyprus","publication_identifier":{"isbn":["978-0-7695-3071-0"]},"language":[{"iso":"eng"}],"keyword":["System testing","Software testing","Automotive engineering","Automatic testing","Machinery production industries","Protocols","Hardware design languages","Samarium","XML","Computer industry"],"user_id":"5786","department":[{"_id":"672"}],"_id":"38107","status":"public","abstract":[{"text":"TestML is an XML-based language for the exchange of test descriptions in automotive systems design and mainly introduced through the structural definition of an XML schema as an independent exchange format for existing tools and methods covering a wide range of different test technologies. In this paper, we present a rigorous formal behavioral semantics for TestML by means of Abstract State Machines (ASMs). Our semantics is a concise, unambiguous, high-level specification for TestML-based implementations and serves as a basis to define exact and well-defined mappings between existing test languages and TestML.","lang":"eng"}],"type":"conference","publication":"Proc. of ISOLA 06"}]