--- _id: '34212' abstract: - lang: eng text: "Force–displacement measurements and micrograph analyses are commonly used methods to validate numerical models of clinching processes. However, these methods often lead to resetting of elastic deformations and crack-\r\nclosing after unloading. In contrast, the in situ computed tomography (CT) can provide three-dimensional images of the clinch point under loading conditions. In this paper, the potential of the in situ investigation of a clinching process as validation method is analyzed. For the in situ testing, a tailored test set-up featuring a beryllium cylinder for load-bearing and clinching tools made from ultra-high-strength titanium and Si3N4 are used. In the experiments, the clinching of two aluminum sheets is interrupted at specific process steps in order to perform the CT scans. It is shown that in situ CT visualizes the inner geometry of the joint at high precision and that this method is suitable to validate numerical models." author: - first_name: Daniel full_name: Köhler, Daniel last_name: Köhler - first_name: Robert full_name: Kupfer, Robert last_name: Kupfer - first_name: Juliane full_name: Troschitz, Juliane last_name: Troschitz - first_name: Maik full_name: Gude, Maik last_name: Gude citation: ama: 'Köhler D, Kupfer R, Troschitz J, Gude M. Clinching in In Situ CT—A Novel Validation Method for Mechanical Joining Processes. In: The Minerals, Metals & Materials Series. Springer International Publishing; 2022. doi:10.1007/978-3-031-06212-4_75' apa: Köhler, D., Kupfer, R., Troschitz, J., & Gude, M. (2022). Clinching in In Situ CT—A Novel Validation Method for Mechanical Joining Processes. In The Minerals, Metals & Materials Series. Springer International Publishing. https://doi.org/10.1007/978-3-031-06212-4_75 bibtex: '@inbook{Köhler_Kupfer_Troschitz_Gude_2022, place={Cham}, title={Clinching in In Situ CT—A Novel Validation Method for Mechanical Joining Processes}, DOI={10.1007/978-3-031-06212-4_75}, booktitle={The Minerals, Metals & Materials Series}, publisher={Springer International Publishing}, author={Köhler, Daniel and Kupfer, Robert and Troschitz, Juliane and Gude, Maik}, year={2022} }' chicago: 'Köhler, Daniel, Robert Kupfer, Juliane Troschitz, and Maik Gude. “Clinching in In Situ CT—A Novel Validation Method for Mechanical Joining Processes.” In The Minerals, Metals & Materials Series. Cham: Springer International Publishing, 2022. https://doi.org/10.1007/978-3-031-06212-4_75.' ieee: 'D. Köhler, R. Kupfer, J. Troschitz, and M. Gude, “Clinching in In Situ CT—A Novel Validation Method for Mechanical Joining Processes,” in The Minerals, Metals & Materials Series, Cham: Springer International Publishing, 2022.' mla: Köhler, Daniel, et al. “Clinching in In Situ CT—A Novel Validation Method for Mechanical Joining Processes.” The Minerals, Metals & Materials Series, Springer International Publishing, 2022, doi:10.1007/978-3-031-06212-4_75. short: 'D. Köhler, R. Kupfer, J. Troschitz, M. Gude, in: The Minerals, Metals & Materials Series, Springer International Publishing, Cham, 2022.' date_created: 2022-12-05T21:06:21Z date_updated: 2022-12-05T21:11:47Z doi: 10.1007/978-3-031-06212-4_75 keyword: - Clinching - Non-destructive testing - Computed tomography - In situ CT language: - iso: eng place: Cham project: - _id: '130' grant_number: '418701707' name: 'TRR 285: TRR 285' - _id: '133' name: 'TRR 285 - C: TRR 285 - Project Area C' - _id: '148' name: 'TRR 285 – C04: TRR 285 - Subproject C04' publication: The Minerals, Metals & Materials Series publication_identifier: isbn: - '9783031062117' - '9783031062124' issn: - 2367-1181 - 2367-1696 publication_status: published publisher: Springer International Publishing status: public title: Clinching in In Situ CT—A Novel Validation Method for Mechanical Joining Processes type: book_chapter user_id: '7850' year: '2022' ... --- _id: '20543' author: - first_name: Lisa full_name: Nguyen Quang Do, Lisa last_name: Nguyen Quang Do - first_name: Stefan full_name: Krüger, Stefan last_name: Krüger - first_name: Patrick full_name: Hill, Patrick last_name: Hill - first_name: Karim full_name: Ali, Karim last_name: Ali - first_name: Eric full_name: Bodden, Eric id: '59256' last_name: Bodden orcid: 0000-0003-3470-3647 citation: ama: Nguyen Quang Do L, Krüger S, Hill P, Ali K, Bodden E. Debugging Static Analysis. IEEE Transactions on Software Engineering. Published online 2018:1-1. doi:10.1109/TSE.2018.2868349 apa: Nguyen Quang Do, L., Krüger, S., Hill, P., Ali, K., & Bodden, E. (2018). Debugging Static Analysis. IEEE Transactions on Software Engineering, 1–1. https://doi.org/10.1109/TSE.2018.2868349 bibtex: '@article{Nguyen Quang Do_Krüger_Hill_Ali_Bodden_2018, title={Debugging Static Analysis}, DOI={10.1109/TSE.2018.2868349}, journal={IEEE Transactions on Software Engineering}, author={Nguyen Quang Do, Lisa and Krüger, Stefan and Hill, Patrick and Ali, Karim and Bodden, Eric}, year={2018}, pages={1–1} }' chicago: Nguyen Quang Do, Lisa, Stefan Krüger, Patrick Hill, Karim Ali, and Eric Bodden. “Debugging Static Analysis.” IEEE Transactions on Software Engineering, 2018, 1–1. https://doi.org/10.1109/TSE.2018.2868349. ieee: 'L. Nguyen Quang Do, S. Krüger, P. Hill, K. Ali, and E. Bodden, “Debugging Static Analysis,” IEEE Transactions on Software Engineering, pp. 1–1, 2018, doi: 10.1109/TSE.2018.2868349.' mla: Nguyen Quang Do, Lisa, et al. “Debugging Static Analysis.” IEEE Transactions on Software Engineering, 2018, pp. 1–1, doi:10.1109/TSE.2018.2868349. short: L. Nguyen Quang Do, S. Krüger, P. Hill, K. Ali, E. Bodden, IEEE Transactions on Software Engineering (2018) 1–1. date_created: 2020-11-30T09:32:12Z date_updated: 2022-01-06T06:54:29Z department: - _id: '76' doi: 10.1109/TSE.2018.2868349 keyword: - Debugging - Static analysis - Tools - Computer bugs - Standards - Writing - Encoding - Testing and Debugging - Program analysis - Development tools - Integrated environments - Graphical environments - Usability testing language: - iso: eng main_file_link: - url: http://www.bodden.de/pubs/tse18debugging.pdf page: 1-1 publication: IEEE Transactions on Software Engineering publication_identifier: issn: - 2326-3881 status: public title: Debugging Static Analysis type: journal_article user_id: '5786' year: '2018' ... --- _id: '36481' abstract: - lang: eng text: 'Recent studies highlight early childhood teachers’ mathematics-related competence. Developing this competence should be a main aspect of early childhood teachers’ education. This is, however, not the case in all countries. Consequently, high-quality professional development courses are needed. Based on research results, we developed a competence-oriented continuous professional development course ("EmMa") and examined the effects of "EmMa" by asking: How does "EmMa" affect the development of early childhood teachers’ i) mathematical content knowledge, ii) mathematical pedagogical content knowledge and iii) beliefs towards mathematics in general? To answer these questions, we conducted a pre-test/post-test study including a control group with 99 in-service early childhood teachers. Results show that the course affected teachers’ mathematical pedagogical content knowledge and static orientation towards mathematics positively. From this we conclude that scaling-up "EmMa" might be a suitable approach to bridge the gap between pre-service education with nearly no mathematics and the challenges of early mathematics education.' author: - first_name: Julia full_name: Bruns, Julia id: '72183' last_name: Bruns orcid: https://orcid.org/0000-0002-6604-5864 - first_name: Lars full_name: Eichen, Lars last_name: Eichen - first_name: Hedwig full_name: Gasteiger, Hedwig last_name: Gasteiger citation: ama: 'Bruns J, Eichen L, Gasteiger H. Mathematics-related Competence of Early Childhood Teachers Visiting a Continuous Professional Development Course: An Intervention Study. Mathematics Teacher Education and Development (MTED). 2017;19(3):76–93.' apa: 'Bruns, J., Eichen, L., & Gasteiger, H. (2017). Mathematics-related Competence of Early Childhood Teachers Visiting a Continuous Professional Development Course: An Intervention Study. Mathematics Teacher Education and Development (MTED), 19(3), 76–93.' bibtex: '@article{Bruns_Eichen_Gasteiger_2017, title={Mathematics-related Competence of Early Childhood Teachers Visiting a Continuous Professional Development Course: An Intervention Study}, volume={19}, number={3}, journal={Mathematics Teacher Education and Development (MTED)}, author={Bruns, Julia and Eichen, Lars and Gasteiger, Hedwig}, year={2017}, pages={76–93} }' chicago: 'Bruns, Julia, Lars Eichen, and Hedwig Gasteiger. “Mathematics-Related Competence of Early Childhood Teachers Visiting a Continuous Professional Development Course: An Intervention Study.” Mathematics Teacher Education and Development (MTED) 19, no. 3 (2017): 76–93.' ieee: 'J. Bruns, L. Eichen, and H. Gasteiger, “Mathematics-related Competence of Early Childhood Teachers Visiting a Continuous Professional Development Course: An Intervention Study,” Mathematics Teacher Education and Development (MTED), vol. 19, no. 3, pp. 76–93, 2017.' mla: 'Bruns, Julia, et al. “Mathematics-Related Competence of Early Childhood Teachers Visiting a Continuous Professional Development Course: An Intervention Study.” Mathematics Teacher Education and Development (MTED), vol. 19, no. 3, 2017, pp. 76–93.' short: J. Bruns, L. Eichen, H. Gasteiger, Mathematics Teacher Education and Development (MTED) 19 (2017) 76–93. date_created: 2023-01-12T15:28:13Z date_updated: 2023-06-20T19:01:36Z department: - _id: '611' - _id: '97' extern: '1' intvolume: ' 19' issue: '3' keyword: - Beliefs - Competency Based Teacher Education - Control Groups - Early Childhood Education - Faculty Development - Foreign Countries - Inservice Teacher Education - Intervention - Mathematical Aptitude - Mathematics Skills - Pedagogical Content Knowledge - Preschool Teachers - Pretests Posttests - Professional Continuing Education - Statistical Analysis - Teacher Competency Testing language: - iso: eng page: 76–93 publication: Mathematics Teacher Education and Development (MTED) publication_status: published quality_controlled: '1' status: public title: 'Mathematics-related Competence of Early Childhood Teachers Visiting a Continuous Professional Development Course: An Intervention Study' type: journal_article user_id: '49063' volume: 19 year: '2017' ... --- _id: '9889' abstract: - lang: eng text: A measurement method is presented that combines the advantages of the multisine measurement technique with a prediction method for peak bending behavior. This combination allows the analysis of the dynamic behavior of mechanical structures at distinctly reduced measurement durations and has the advantage of reducing high excitation impacts on the structure under test. author: - first_name: Christian full_name: Sprock, Christian last_name: Sprock - first_name: Walter full_name: Sextro, Walter id: '21220' last_name: Sextro citation: ama: 'Sprock C, Sextro W. Time-efficient dynamic analysis of structures exhibiting nonlinear peak bending. In: Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International. ; 2014:320-324. doi:10.1109/I2MTC.2014.6860760' apa: Sprock, C., & Sextro, W. (2014). Time-efficient dynamic analysis of structures exhibiting nonlinear peak bending. In Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International (pp. 320–324). https://doi.org/10.1109/I2MTC.2014.6860760 bibtex: '@inproceedings{Sprock_Sextro_2014, title={Time-efficient dynamic analysis of structures exhibiting nonlinear peak bending}, DOI={10.1109/I2MTC.2014.6860760}, booktitle={Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International}, author={Sprock, Christian and Sextro, Walter}, year={2014}, pages={320–324} }' chicago: Sprock, Christian, and Walter Sextro. “Time-Efficient Dynamic Analysis of Structures Exhibiting Nonlinear Peak Bending.” In Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International, 320–24, 2014. https://doi.org/10.1109/I2MTC.2014.6860760. ieee: C. Sprock and W. Sextro, “Time-efficient dynamic analysis of structures exhibiting nonlinear peak bending,” in Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International, 2014, pp. 320–324. mla: Sprock, Christian, and Walter Sextro. “Time-Efficient Dynamic Analysis of Structures Exhibiting Nonlinear Peak Bending.” Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International, 2014, pp. 320–24, doi:10.1109/I2MTC.2014.6860760. short: 'C. Sprock, W. Sextro, in: Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International, 2014, pp. 320–324.' date_created: 2019-05-20T13:25:22Z date_updated: 2019-05-20T13:25:53Z department: - _id: '151' doi: 10.1109/I2MTC.2014.6860760 keyword: - bending - dynamic testing - measurement - structural engineering - vibrations - measurement durations - mechanical structures - multisine measurement technique - nonlinear peak bending behavior - prediction method - time-efficient dynamic analysis - Heuristic algorithms - Nonlinear systems - Oscillators - Time measurement - Time-frequency analysis - Vibrations language: - iso: eng page: 320-324 publication: Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International status: public title: Time-efficient dynamic analysis of structures exhibiting nonlinear peak bending type: conference user_id: '55222' year: '2014' ... --- _id: '37037' abstract: - lang: eng text: Today we can identify a big gap between requirement specification and the generation of test environments. This article extends the Classification Tree Method for Embedded Systems (CTM/ES) to fill this gap by new concepts for the precise specification of stimuli for operational ranges of continuous control systems. It introduces novel means for continuous acceptance criteria definition and for functional coverage definition. author: - first_name: Alexander full_name: Krupp, Alexander last_name: Krupp - first_name: Wolfgang full_name: Müller, Wolfgang id: '16243' last_name: Müller citation: ama: 'Krupp A, Müller W. A Systematic Approach to Combined HW/SW System Test. In: Proceedings of DATE’10. IEEE; 2010. doi:10.1109/DATE.2010.5457186' apa: Krupp, A., & Müller, W. (2010). A Systematic Approach to Combined HW/SW System Test. Proceedings of DATE’10. Design, Automation & Test in Europe Conference & Exhibition (DATE 2010), Dresden. https://doi.org/10.1109/DATE.2010.5457186 bibtex: '@inproceedings{Krupp_Müller_2010, place={Dresden}, title={A Systematic Approach to Combined HW/SW System Test}, DOI={10.1109/DATE.2010.5457186}, booktitle={Proceedings of DATE’10}, publisher={IEEE}, author={Krupp, Alexander and Müller, Wolfgang}, year={2010} }' chicago: 'Krupp, Alexander, and Wolfgang Müller. “A Systematic Approach to Combined HW/SW System Test.” In Proceedings of DATE’10. Dresden: IEEE, 2010. https://doi.org/10.1109/DATE.2010.5457186.' ieee: 'A. Krupp and W. Müller, “A Systematic Approach to Combined HW/SW System Test,” presented at the Design, Automation & Test in Europe Conference & Exhibition (DATE 2010), Dresden, 2010, doi: 10.1109/DATE.2010.5457186.' mla: Krupp, Alexander, and Wolfgang Müller. “A Systematic Approach to Combined HW/SW System Test.” Proceedings of DATE’10, IEEE, 2010, doi:10.1109/DATE.2010.5457186. short: 'A. Krupp, W. Müller, in: Proceedings of DATE’10, IEEE, Dresden, 2010.' conference: location: Dresden name: Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) date_created: 2023-01-17T10:41:15Z date_updated: 2023-01-17T10:41:25Z department: - _id: '672' doi: 10.1109/DATE.2010.5457186 keyword: - System testing - Automatic testing - Object oriented modeling - Classification tree analysis - Automotive engineering - Mathematical model - Embedded system - Control systems - Electronic equipment testing - Software testing language: - iso: eng place: Dresden publication: Proceedings of DATE’10 publisher: IEEE status: public title: A Systematic Approach to Combined HW/SW System Test type: conference user_id: '5786' year: '2010' ... --- _id: '2353' abstract: - lang: eng text: 'Wireless Sensor Networks (WSNs) are unique embedded computation systems for distributed sensing of a dispersed phenomenon. While being a strongly concurrent distributed system, its embedded aspects with severe resource limitations and the wireless communication requires a fusion of technologies and methodologies from very different fields. As WSNs are deployed in remote locations for long-term unattended operation, assurance of correct functioning of the system is of prime concern. Thus, the design and development of WSNs requires specialized tools to allow for testing and debugging the system. To this end, we present a framework for analyzing and checking WSNs based on collected events during system operation. It allows for abstracting from the event trace by means of behavioral queries and uses assertions for checking the accordance of an execution to its specification. The framework is independent from WSN test platforms, applications and logging semantics and thus generally applicable for analyzing event logs of WSN test executions. ' author: - first_name: Matthias full_name: Woehrle, Matthias last_name: Woehrle - first_name: Christian full_name: Plessl, Christian id: '16153' last_name: Plessl orcid: 0000-0001-5728-9982 - first_name: Lothar full_name: Thiele, Lothar last_name: Thiele citation: ama: 'Woehrle M, Plessl C, Thiele L. Rupeas: Ruby Powered Event Analysis DSL. Computer Engineering and Networks Lab, ETH Zurich; 2009.' apa: 'Woehrle, M., Plessl, C., & Thiele, L. (2009). Rupeas: Ruby Powered Event Analysis DSL. Computer Engineering and Networks Lab, ETH Zurich.' bibtex: '@book{Woehrle_Plessl_Thiele_2009, place={Computer Engineering and Networks Lab, ETH Zurich}, title={Rupeas: Ruby Powered Event Analysis DSL}, author={Woehrle, Matthias and Plessl, Christian and Thiele, Lothar}, year={2009} }' chicago: 'Woehrle, Matthias, Christian Plessl, and Lothar Thiele. Rupeas: Ruby Powered Event Analysis DSL. Computer Engineering and Networks Lab, ETH Zurich, 2009.' ieee: 'M. Woehrle, C. Plessl, and L. Thiele, Rupeas: Ruby Powered Event Analysis DSL. Computer Engineering and Networks Lab, ETH Zurich, 2009.' mla: 'Woehrle, Matthias, et al. Rupeas: Ruby Powered Event Analysis DSL. 2009.' short: 'M. Woehrle, C. Plessl, L. Thiele, Rupeas: Ruby Powered Event Analysis DSL, Computer Engineering and Networks Lab, ETH Zurich, 2009.' date_created: 2018-04-16T15:09:19Z date_updated: 2022-01-06T06:55:56Z department: - _id: '27' - _id: '518' extern: '1' keyword: - Rupeas - DSL - WSN - testing language: - iso: eng place: Computer Engineering and Networks Lab, ETH Zurich report_number: TIK-Report 290 status: public title: 'Rupeas: Ruby Powered Event Analysis DSL' type: report user_id: '16153' year: '2009' ... --- _id: '2370' author: - first_name: Matthias full_name: Woehrle, Matthias last_name: Woehrle - first_name: Christian full_name: Plessl, Christian id: '16153' last_name: Plessl orcid: 0000-0001-5728-9982 - first_name: Roman full_name: Lim, Roman last_name: Lim - first_name: Jan full_name: Beutel, Jan last_name: Beutel - first_name: Lothar full_name: Thiele, Lothar last_name: Thiele citation: ama: 'Woehrle M, Plessl C, Lim R, Beutel J, Thiele L. EvAnT: Analysis and Checking of event traces for Wireless Sensor Networks. In: IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC). IEEE Computer Society; 2008:201-208. doi:10.1109/SUTC.2008.24' apa: 'Woehrle, M., Plessl, C., Lim, R., Beutel, J., & Thiele, L. (2008). EvAnT: Analysis and Checking of event traces for Wireless Sensor Networks. IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC), 201–208. https://doi.org/10.1109/SUTC.2008.24' bibtex: '@inproceedings{Woehrle_Plessl_Lim_Beutel_Thiele_2008, place={Los Alamitos, CA, USA}, title={EvAnT: Analysis and Checking of event traces for Wireless Sensor Networks}, DOI={10.1109/SUTC.2008.24}, booktitle={IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC)}, publisher={IEEE Computer Society}, author={Woehrle, Matthias and Plessl, Christian and Lim, Roman and Beutel, Jan and Thiele, Lothar}, year={2008}, pages={201–208} }' chicago: 'Woehrle, Matthias, Christian Plessl, Roman Lim, Jan Beutel, and Lothar Thiele. “EvAnT: Analysis and Checking of Event Traces for Wireless Sensor Networks.” In IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC), 201–8. Los Alamitos, CA, USA: IEEE Computer Society, 2008. https://doi.org/10.1109/SUTC.2008.24.' ieee: 'M. Woehrle, C. Plessl, R. Lim, J. Beutel, and L. Thiele, “EvAnT: Analysis and Checking of event traces for Wireless Sensor Networks,” in IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC), 2008, pp. 201–208, doi: 10.1109/SUTC.2008.24.' mla: 'Woehrle, Matthias, et al. “EvAnT: Analysis and Checking of Event Traces for Wireless Sensor Networks.” IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC), IEEE Computer Society, 2008, pp. 201–08, doi:10.1109/SUTC.2008.24.' short: 'M. Woehrle, C. Plessl, R. Lim, J. Beutel, L. Thiele, in: IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC), IEEE Computer Society, Los Alamitos, CA, USA, 2008, pp. 201–208.' date_created: 2018-04-17T12:03:20Z date_updated: 2023-09-26T13:55:02Z department: - _id: '27' - _id: '518' doi: 10.1109/SUTC.2008.24 keyword: - WSN - testing - verification language: - iso: eng page: 201-208 place: Los Alamitos, CA, USA publication: IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC) publication_identifier: isbn: - 978-0-7695-3158-8 publisher: IEEE Computer Society quality_controlled: '1' status: public title: 'EvAnT: Analysis and Checking of event traces for Wireless Sensor Networks' type: conference user_id: '15278' year: '2008' ... --- _id: '2392' author: - first_name: Matthias full_name: Woehrle, Matthias last_name: Woehrle - first_name: Christian full_name: Plessl, Christian id: '16153' last_name: Plessl orcid: 0000-0001-5728-9982 - first_name: Jan full_name: Beutel, Jan last_name: Beutel - first_name: Lothar full_name: Thiele, Lothar last_name: Thiele citation: ama: 'Woehrle M, Plessl C, Beutel J, Thiele L. Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework. In: Proc. Workshop on Embedded Networked Sensors (EmNets). ACM; 2007:93-97. doi:10.1145/1278972.1278996' apa: Woehrle, M., Plessl, C., Beutel, J., & Thiele, L. (2007). Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework. Proc. Workshop on Embedded Networked Sensors (EmNets), 93–97. https://doi.org/10.1145/1278972.1278996 bibtex: '@inproceedings{Woehrle_Plessl_Beutel_Thiele_2007, place={New York, NY, USA}, title={Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework}, DOI={10.1145/1278972.1278996}, booktitle={Proc. Workshop on Embedded Networked Sensors (EmNets)}, publisher={ACM}, author={Woehrle, Matthias and Plessl, Christian and Beutel, Jan and Thiele, Lothar}, year={2007}, pages={93–97} }' chicago: 'Woehrle, Matthias, Christian Plessl, Jan Beutel, and Lothar Thiele. “Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework.” In Proc. Workshop on Embedded Networked Sensors (EmNets), 93–97. New York, NY, USA: ACM, 2007. https://doi.org/10.1145/1278972.1278996.' ieee: 'M. Woehrle, C. Plessl, J. Beutel, and L. Thiele, “Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework,” in Proc. Workshop on Embedded Networked Sensors (EmNets), 2007, pp. 93–97, doi: 10.1145/1278972.1278996.' mla: Woehrle, Matthias, et al. “Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework.” Proc. Workshop on Embedded Networked Sensors (EmNets), ACM, 2007, pp. 93–97, doi:10.1145/1278972.1278996. short: 'M. Woehrle, C. Plessl, J. Beutel, L. Thiele, in: Proc. Workshop on Embedded Networked Sensors (EmNets), ACM, New York, NY, USA, 2007, pp. 93–97.' date_created: 2018-04-17T13:34:42Z date_updated: 2023-09-26T14:00:38Z department: - _id: '27' - _id: '518' doi: 10.1145/1278972.1278996 keyword: - WSN - testing - distributed - embedded language: - iso: eng page: 93-97 place: New York, NY, USA publication: Proc. Workshop on Embedded Networked Sensors (EmNets) publication_identifier: isbn: - 978-1-59593-694-3 publisher: ACM quality_controlled: '1' status: public title: Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework type: conference user_id: '15278' year: '2007' ... --- _id: '2393' author: - first_name: Jan full_name: Beutel, Jan last_name: Beutel - first_name: Matthias full_name: Dyer, Matthias last_name: Dyer - first_name: Roman full_name: Lim, Roman last_name: Lim - first_name: Christian full_name: Plessl, Christian id: '16153' last_name: Plessl orcid: 0000-0001-5728-9982 - first_name: Matthias full_name: Woehrle, Matthias last_name: Woehrle - first_name: Mustafa full_name: Yuecel, Mustafa last_name: Yuecel - first_name: Lothar full_name: Thiele, Lothar last_name: Thiele citation: ama: 'Beutel J, Dyer M, Lim R, et al. Automated Wireless Sensor Network Testing. In: Proc. Int. Conf. Networked Sensing Systems (INSS). IEEE; 2007:303-303. doi:10.1109/INSS.2007.4297445' apa: Beutel, J., Dyer, M., Lim, R., Plessl, C., Woehrle, M., Yuecel, M., & Thiele, L. (2007). Automated Wireless Sensor Network Testing. Proc. Int. Conf. Networked Sensing Systems (INSS), 303–303. https://doi.org/10.1109/INSS.2007.4297445 bibtex: '@inproceedings{Beutel_Dyer_Lim_Plessl_Woehrle_Yuecel_Thiele_2007, place={Piscataway, NJ, USA}, title={Automated Wireless Sensor Network Testing}, DOI={10.1109/INSS.2007.4297445}, booktitle={Proc. Int. Conf. Networked Sensing Systems (INSS)}, publisher={IEEE}, author={Beutel, Jan and Dyer, Matthias and Lim, Roman and Plessl, Christian and Woehrle, Matthias and Yuecel, Mustafa and Thiele, Lothar}, year={2007}, pages={303–303} }' chicago: 'Beutel, Jan, Matthias Dyer, Roman Lim, Christian Plessl, Matthias Woehrle, Mustafa Yuecel, and Lothar Thiele. “Automated Wireless Sensor Network Testing.” In Proc. Int. Conf. Networked Sensing Systems (INSS), 303–303. Piscataway, NJ, USA: IEEE, 2007. https://doi.org/10.1109/INSS.2007.4297445.' ieee: 'J. Beutel et al., “Automated Wireless Sensor Network Testing,” in Proc. Int. Conf. Networked Sensing Systems (INSS), 2007, pp. 303–303, doi: 10.1109/INSS.2007.4297445.' mla: Beutel, Jan, et al. “Automated Wireless Sensor Network Testing.” Proc. Int. Conf. Networked Sensing Systems (INSS), IEEE, 2007, pp. 303–303, doi:10.1109/INSS.2007.4297445. short: 'J. Beutel, M. Dyer, R. Lim, C. Plessl, M. Woehrle, M. Yuecel, L. Thiele, in: Proc. Int. Conf. Networked Sensing Systems (INSS), IEEE, Piscataway, NJ, USA, 2007, pp. 303–303.' date_created: 2018-04-17T13:35:55Z date_updated: 2023-09-26T14:00:58Z department: - _id: '27' - _id: '518' doi: 10.1109/INSS.2007.4297445 keyword: - WSN - testing - verification language: - iso: eng page: 303-303 place: Piscataway, NJ, USA publication: Proc. Int. Conf. Networked Sensing Systems (INSS) publication_identifier: isbn: - 1-4244-1231-5 publisher: IEEE quality_controlled: '1' status: public title: Automated Wireless Sensor Network Testing type: conference user_id: '15278' year: '2007' ... --- _id: '38784' abstract: - lang: eng text: This article presents the classification tree method for functional verification to close the gap from the specification of a test plan to SystemVerilog (Chandra and Chakrabarty, 2001) test bench generation. Our method supports the systematic development of test configurations and is based on the classification tree method for embedded systems (CTM/ES) (Chakrabarty et al., 2000) extending CTM/ES for random test generation as well as for functional coverage and property specification author: - first_name: Alexander full_name: Krupp, Alexander last_name: Krupp - first_name: Wolfgang full_name: Müller, Wolfgang id: '16243' last_name: Müller citation: ama: 'Krupp A, Müller W. Classification Trees for Functional Coverage and Random Test Generation. In: Proceedings of the Design Automation & Test in Europe Conference. IEEE; 2006. doi:10.1109/DATE.2006.243902' apa: Krupp, A., & Müller, W. (2006). Classification Trees for Functional Coverage and Random Test Generation. Proceedings of the Design Automation & Test in Europe Conference. https://doi.org/10.1109/DATE.2006.243902 bibtex: '@inproceedings{Krupp_Müller_2006, place={Munich, Germany}, title={Classification Trees for Functional Coverage and Random Test Generation}, DOI={10.1109/DATE.2006.243902}, booktitle={Proceedings of the Design Automation & Test in Europe Conference}, publisher={IEEE}, author={Krupp, Alexander and Müller, Wolfgang}, year={2006} }' chicago: 'Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional Coverage and Random Test Generation.” In Proceedings of the Design Automation & Test in Europe Conference. Munich, Germany: IEEE, 2006. https://doi.org/10.1109/DATE.2006.243902.' ieee: 'A. Krupp and W. Müller, “Classification Trees for Functional Coverage and Random Test Generation,” 2006, doi: 10.1109/DATE.2006.243902.' mla: Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional Coverage and Random Test Generation.” Proceedings of the Design Automation & Test in Europe Conference, IEEE, 2006, doi:10.1109/DATE.2006.243902. short: 'A. Krupp, W. Müller, in: Proceedings of the Design Automation & Test in Europe Conference, IEEE, Munich, Germany, 2006.' date_created: 2023-01-24T08:06:09Z date_updated: 2023-01-24T08:06:14Z department: - _id: '672' doi: 10.1109/DATE.2006.243902 keyword: - Classification tree analysis - System testing - Embedded system - Safety - Automatic testing - Automation language: - iso: eng place: Munich, Germany publication: Proceedings of the Design Automation & Test in Europe Conference publication_identifier: isbn: - 3-9810801-1-4 publisher: IEEE status: public title: Classification Trees for Functional Coverage and Random Test Generation type: conference user_id: '5786' year: '2006' ... --- _id: '38107' abstract: - lang: eng text: TestML is an XML-based language for the exchange of test descriptions in automotive systems design and mainly introduced through the structural definition of an XML schema as an independent exchange format for existing tools and methods covering a wide range of different test technologies. In this paper, we present a rigorous formal behavioral semantics for TestML by means of Abstract State Machines (ASMs). Our semantics is a concise, unambiguous, high-level specification for TestML-based implementations and serves as a basis to define exact and well-defined mappings between existing test languages and TestML. author: - first_name: Jürgen full_name: Großmann, Jürgen last_name: Großmann - first_name: Wolfgang full_name: Müller, Wolfgang id: '16243' last_name: Müller citation: ama: 'Großmann J, Müller W. A Formal Behavioral Semantics for TestML. In: Proc. of ISOLA 06. ; 2006. doi:10.1109/ISoLA.2006.37' apa: Großmann, J., & Müller, W. (2006). A Formal Behavioral Semantics for TestML. Proc. of ISOLA 06. https://doi.org/10.1109/ISoLA.2006.37 bibtex: '@inproceedings{Großmann_Müller_2006, place={Paphos, Cyprus}, title={A Formal Behavioral Semantics for TestML}, DOI={10.1109/ISoLA.2006.37}, booktitle={Proc. of ISOLA 06}, author={Großmann, Jürgen and Müller, Wolfgang}, year={2006} }' chicago: Großmann, Jürgen, and Wolfgang Müller. “A Formal Behavioral Semantics for TestML.” In Proc. of ISOLA 06. Paphos, Cyprus, 2006. https://doi.org/10.1109/ISoLA.2006.37. ieee: 'J. Großmann and W. Müller, “A Formal Behavioral Semantics for TestML,” Paphos, Cyprus, 2006, doi: 10.1109/ISoLA.2006.37.' mla: Großmann, Jürgen, and Wolfgang Müller. “A Formal Behavioral Semantics for TestML.” Proc. of ISOLA 06, 2006, doi:10.1109/ISoLA.2006.37. short: 'J. Großmann, W. Müller, in: Proc. of ISOLA 06, Paphos, Cyprus, 2006.' conference: location: Paphos, Cyprus date_created: 2023-01-23T12:00:06Z date_updated: 2023-01-23T12:06:26Z department: - _id: '672' doi: 10.1109/ISoLA.2006.37 keyword: - System testing - Software testing - Automotive engineering - Automatic testing - Machinery production industries - Protocols - Hardware design languages - Samarium - XML - Computer industry language: - iso: eng place: Paphos, Cyprus publication: Proc. of ISOLA 06 publication_identifier: isbn: - 978-0-7695-3071-0 status: public title: A Formal Behavioral Semantics for TestML type: conference user_id: '5786' year: '2006' ...