---
_id: '34212'
abstract:
- lang: eng
text: "Force–displacement measurements and micrograph analyses are commonly used
methods to validate numerical models of clinching processes. However, these methods
often lead to resetting of elastic deformations and crack-\r\nclosing after unloading.
In contrast, the in situ computed tomography (CT) can provide three-dimensional
images of the clinch point under loading conditions. In this paper, the potential
of the in situ investigation of a clinching process as validation method is analyzed.
For the in situ testing, a tailored test set-up featuring a beryllium cylinder
for load-bearing and clinching tools made from ultra-high-strength titanium and
Si3N4 are used. In the experiments, the clinching of two aluminum sheets is interrupted
at specific process steps in order to perform the CT scans. It is shown that in
situ CT visualizes the inner geometry of the joint at high precision and that
this method is suitable to validate numerical models."
author:
- first_name: Daniel
full_name: Köhler, Daniel
last_name: Köhler
- first_name: Robert
full_name: Kupfer, Robert
last_name: Kupfer
- first_name: Juliane
full_name: Troschitz, Juliane
last_name: Troschitz
- first_name: Maik
full_name: Gude, Maik
last_name: Gude
citation:
ama: 'Köhler D, Kupfer R, Troschitz J, Gude M. Clinching in In Situ CT—A Novel Validation
Method for Mechanical Joining Processes. In: The Minerals, Metals & Materials
Series. Springer International Publishing; 2022. doi:10.1007/978-3-031-06212-4_75'
apa: Köhler, D., Kupfer, R., Troschitz, J., & Gude, M. (2022). Clinching in
In Situ CT—A Novel Validation Method for Mechanical Joining Processes. In The
Minerals, Metals & Materials Series. Springer International Publishing.
https://doi.org/10.1007/978-3-031-06212-4_75
bibtex: '@inbook{Köhler_Kupfer_Troschitz_Gude_2022, place={Cham}, title={Clinching
in In Situ CT—A Novel Validation Method for Mechanical Joining Processes}, DOI={10.1007/978-3-031-06212-4_75},
booktitle={The Minerals, Metals & Materials Series}, publisher={Springer International
Publishing}, author={Köhler, Daniel and Kupfer, Robert and Troschitz, Juliane
and Gude, Maik}, year={2022} }'
chicago: 'Köhler, Daniel, Robert Kupfer, Juliane Troschitz, and Maik Gude. “Clinching
in In Situ CT—A Novel Validation Method for Mechanical Joining Processes.” In
The Minerals, Metals & Materials Series. Cham: Springer International
Publishing, 2022. https://doi.org/10.1007/978-3-031-06212-4_75.'
ieee: 'D. Köhler, R. Kupfer, J. Troschitz, and M. Gude, “Clinching in In Situ CT—A
Novel Validation Method for Mechanical Joining Processes,” in The Minerals,
Metals & Materials Series, Cham: Springer International Publishing, 2022.'
mla: Köhler, Daniel, et al. “Clinching in In Situ CT—A Novel Validation Method for
Mechanical Joining Processes.” The Minerals, Metals & Materials Series,
Springer International Publishing, 2022, doi:10.1007/978-3-031-06212-4_75.
short: 'D. Köhler, R. Kupfer, J. Troschitz, M. Gude, in: The Minerals, Metals &
Materials Series, Springer International Publishing, Cham, 2022.'
date_created: 2022-12-05T21:06:21Z
date_updated: 2022-12-05T21:11:47Z
doi: 10.1007/978-3-031-06212-4_75
keyword:
- Clinching
- Non-destructive testing
- Computed tomography
- In situ CT
language:
- iso: eng
place: Cham
project:
- _id: '130'
grant_number: '418701707'
name: 'TRR 285: TRR 285'
- _id: '133'
name: 'TRR 285 - C: TRR 285 - Project Area C'
- _id: '148'
name: 'TRR 285 – C04: TRR 285 - Subproject C04'
publication: The Minerals, Metals & Materials Series
publication_identifier:
isbn:
- '9783031062117'
- '9783031062124'
issn:
- 2367-1181
- 2367-1696
publication_status: published
publisher: Springer International Publishing
status: public
title: Clinching in In Situ CT—A Novel Validation Method for Mechanical Joining Processes
type: book_chapter
user_id: '7850'
year: '2022'
...
---
_id: '20543'
author:
- first_name: Lisa
full_name: Nguyen Quang Do, Lisa
last_name: Nguyen Quang Do
- first_name: Stefan
full_name: Krüger, Stefan
last_name: Krüger
- first_name: Patrick
full_name: Hill, Patrick
last_name: Hill
- first_name: Karim
full_name: Ali, Karim
last_name: Ali
- first_name: Eric
full_name: Bodden, Eric
id: '59256'
last_name: Bodden
orcid: 0000-0003-3470-3647
citation:
ama: Nguyen Quang Do L, Krüger S, Hill P, Ali K, Bodden E. Debugging Static Analysis.
IEEE Transactions on Software Engineering. Published online 2018:1-1. doi:10.1109/TSE.2018.2868349
apa: Nguyen Quang Do, L., Krüger, S., Hill, P., Ali, K., & Bodden, E. (2018).
Debugging Static Analysis. IEEE Transactions on Software Engineering, 1–1.
https://doi.org/10.1109/TSE.2018.2868349
bibtex: '@article{Nguyen Quang Do_Krüger_Hill_Ali_Bodden_2018, title={Debugging
Static Analysis}, DOI={10.1109/TSE.2018.2868349},
journal={IEEE Transactions on Software Engineering}, author={Nguyen Quang Do,
Lisa and Krüger, Stefan and Hill, Patrick and Ali, Karim and Bodden, Eric}, year={2018},
pages={1–1} }'
chicago: Nguyen Quang Do, Lisa, Stefan Krüger, Patrick Hill, Karim Ali, and Eric
Bodden. “Debugging Static Analysis.” IEEE Transactions on Software Engineering,
2018, 1–1. https://doi.org/10.1109/TSE.2018.2868349.
ieee: 'L. Nguyen Quang Do, S. Krüger, P. Hill, K. Ali, and E. Bodden, “Debugging
Static Analysis,” IEEE Transactions on Software Engineering, pp. 1–1, 2018,
doi: 10.1109/TSE.2018.2868349.'
mla: Nguyen Quang Do, Lisa, et al. “Debugging Static Analysis.” IEEE Transactions
on Software Engineering, 2018, pp. 1–1, doi:10.1109/TSE.2018.2868349.
short: L. Nguyen Quang Do, S. Krüger, P. Hill, K. Ali, E. Bodden, IEEE Transactions
on Software Engineering (2018) 1–1.
date_created: 2020-11-30T09:32:12Z
date_updated: 2022-01-06T06:54:29Z
department:
- _id: '76'
doi: 10.1109/TSE.2018.2868349
keyword:
- Debugging
- Static analysis
- Tools
- Computer bugs
- Standards
- Writing
- Encoding
- Testing and Debugging
- Program analysis
- Development tools
- Integrated environments
- Graphical environments
- Usability testing
language:
- iso: eng
main_file_link:
- url: http://www.bodden.de/pubs/tse18debugging.pdf
page: 1-1
publication: IEEE Transactions on Software Engineering
publication_identifier:
issn:
- 2326-3881
status: public
title: Debugging Static Analysis
type: journal_article
user_id: '5786'
year: '2018'
...
---
_id: '36481'
abstract:
- lang: eng
text: 'Recent studies highlight early childhood teachers’ mathematics-related competence.
Developing this competence should be a main aspect of early childhood teachers’
education. This is, however, not the case in all countries. Consequently, high-quality
professional development courses are needed. Based on research results, we developed
a competence-oriented continuous professional development course ("EmMa") and
examined the effects of "EmMa" by asking: How does "EmMa" affect the development
of early childhood teachers’ i) mathematical content knowledge, ii) mathematical
pedagogical content knowledge and iii) beliefs towards mathematics in general?
To answer these questions, we conducted a pre-test/post-test study including a
control group with 99 in-service early childhood teachers. Results show that the
course affected teachers’ mathematical pedagogical content knowledge and static
orientation towards mathematics positively. From this we conclude that scaling-up
"EmMa" might be a suitable approach to bridge the gap between pre-service education
with nearly no mathematics and the challenges of early mathematics education.'
author:
- first_name: Julia
full_name: Bruns, Julia
id: '72183'
last_name: Bruns
orcid: https://orcid.org/0000-0002-6604-5864
- first_name: Lars
full_name: Eichen, Lars
last_name: Eichen
- first_name: Hedwig
full_name: Gasteiger, Hedwig
last_name: Gasteiger
citation:
ama: 'Bruns J, Eichen L, Gasteiger H. Mathematics-related Competence of Early Childhood
Teachers Visiting a Continuous Professional Development Course: An Intervention
Study. Mathematics Teacher Education and Development (MTED). 2017;19(3):76–93.'
apa: 'Bruns, J., Eichen, L., & Gasteiger, H. (2017). Mathematics-related Competence
of Early Childhood Teachers Visiting a Continuous Professional Development Course:
An Intervention Study. Mathematics Teacher Education and Development (MTED),
19(3), 76–93.'
bibtex: '@article{Bruns_Eichen_Gasteiger_2017, title={Mathematics-related Competence
of Early Childhood Teachers Visiting a Continuous Professional Development Course:
An Intervention Study}, volume={19}, number={3}, journal={Mathematics Teacher
Education and Development (MTED)}, author={Bruns, Julia and Eichen, Lars and Gasteiger,
Hedwig}, year={2017}, pages={76–93} }'
chicago: 'Bruns, Julia, Lars Eichen, and Hedwig Gasteiger. “Mathematics-Related
Competence of Early Childhood Teachers Visiting a Continuous Professional Development
Course: An Intervention Study.” Mathematics Teacher Education and Development
(MTED) 19, no. 3 (2017): 76–93.'
ieee: 'J. Bruns, L. Eichen, and H. Gasteiger, “Mathematics-related Competence of
Early Childhood Teachers Visiting a Continuous Professional Development Course:
An Intervention Study,” Mathematics Teacher Education and Development (MTED),
vol. 19, no. 3, pp. 76–93, 2017.'
mla: 'Bruns, Julia, et al. “Mathematics-Related Competence of Early Childhood Teachers
Visiting a Continuous Professional Development Course: An Intervention Study.”
Mathematics Teacher Education and Development (MTED), vol. 19, no. 3, 2017,
pp. 76–93.'
short: J. Bruns, L. Eichen, H. Gasteiger, Mathematics Teacher Education and Development
(MTED) 19 (2017) 76–93.
date_created: 2023-01-12T15:28:13Z
date_updated: 2023-06-20T19:01:36Z
department:
- _id: '611'
- _id: '97'
extern: '1'
intvolume: ' 19'
issue: '3'
keyword:
- Beliefs
- Competency Based Teacher Education
- Control Groups
- Early Childhood Education
- Faculty Development
- Foreign Countries
- Inservice Teacher Education
- Intervention
- Mathematical Aptitude
- Mathematics Skills
- Pedagogical Content Knowledge
- Preschool Teachers
- Pretests Posttests
- Professional Continuing Education
- Statistical Analysis
- Teacher Competency Testing
language:
- iso: eng
page: 76–93
publication: Mathematics Teacher Education and Development (MTED)
publication_status: published
quality_controlled: '1'
status: public
title: 'Mathematics-related Competence of Early Childhood Teachers Visiting a Continuous
Professional Development Course: An Intervention Study'
type: journal_article
user_id: '49063'
volume: 19
year: '2017'
...
---
_id: '9889'
abstract:
- lang: eng
text: A measurement method is presented that combines the advantages of the multisine
measurement technique with a prediction method for peak bending behavior. This
combination allows the analysis of the dynamic behavior of mechanical structures
at distinctly reduced measurement durations and has the advantage of reducing
high excitation impacts on the structure under test.
author:
- first_name: Christian
full_name: Sprock, Christian
last_name: Sprock
- first_name: Walter
full_name: Sextro, Walter
id: '21220'
last_name: Sextro
citation:
ama: 'Sprock C, Sextro W. Time-efficient dynamic analysis of structures exhibiting
nonlinear peak bending. In: Instrumentation and Measurement Technology Conference
(I2MTC) Proceedings, 2014 IEEE International. ; 2014:320-324. doi:10.1109/I2MTC.2014.6860760'
apa: Sprock, C., & Sextro, W. (2014). Time-efficient dynamic analysis of structures
exhibiting nonlinear peak bending. In Instrumentation and Measurement Technology
Conference (I2MTC) Proceedings, 2014 IEEE International (pp. 320–324). https://doi.org/10.1109/I2MTC.2014.6860760
bibtex: '@inproceedings{Sprock_Sextro_2014, title={Time-efficient dynamic analysis
of structures exhibiting nonlinear peak bending}, DOI={10.1109/I2MTC.2014.6860760},
booktitle={Instrumentation and Measurement Technology Conference (I2MTC) Proceedings,
2014 IEEE International}, author={Sprock, Christian and Sextro, Walter}, year={2014},
pages={320–324} }'
chicago: Sprock, Christian, and Walter Sextro. “Time-Efficient Dynamic Analysis
of Structures Exhibiting Nonlinear Peak Bending.” In Instrumentation and Measurement
Technology Conference (I2MTC) Proceedings, 2014 IEEE International, 320–24,
2014. https://doi.org/10.1109/I2MTC.2014.6860760.
ieee: C. Sprock and W. Sextro, “Time-efficient dynamic analysis of structures exhibiting
nonlinear peak bending,” in Instrumentation and Measurement Technology Conference
(I2MTC) Proceedings, 2014 IEEE International, 2014, pp. 320–324.
mla: Sprock, Christian, and Walter Sextro. “Time-Efficient Dynamic Analysis of Structures
Exhibiting Nonlinear Peak Bending.” Instrumentation and Measurement Technology
Conference (I2MTC) Proceedings, 2014 IEEE International, 2014, pp. 320–24,
doi:10.1109/I2MTC.2014.6860760.
short: 'C. Sprock, W. Sextro, in: Instrumentation and Measurement Technology Conference
(I2MTC) Proceedings, 2014 IEEE International, 2014, pp. 320–324.'
date_created: 2019-05-20T13:25:22Z
date_updated: 2019-05-20T13:25:53Z
department:
- _id: '151'
doi: 10.1109/I2MTC.2014.6860760
keyword:
- bending
- dynamic testing
- measurement
- structural engineering
- vibrations
- measurement durations
- mechanical structures
- multisine measurement technique
- nonlinear peak bending behavior
- prediction method
- time-efficient dynamic analysis
- Heuristic algorithms
- Nonlinear systems
- Oscillators
- Time measurement
- Time-frequency analysis
- Vibrations
language:
- iso: eng
page: 320-324
publication: Instrumentation and Measurement Technology Conference (I2MTC) Proceedings,
2014 IEEE International
status: public
title: Time-efficient dynamic analysis of structures exhibiting nonlinear peak bending
type: conference
user_id: '55222'
year: '2014'
...
---
_id: '37037'
abstract:
- lang: eng
text: Today we can identify a big gap between requirement specification and the
generation of test environments. This article extends the Classification Tree
Method for Embedded Systems (CTM/ES) to fill this gap by new concepts for the
precise specification of stimuli for operational ranges of continuous control
systems. It introduces novel means for continuous acceptance criteria definition
and for functional coverage definition.
author:
- first_name: Alexander
full_name: Krupp, Alexander
last_name: Krupp
- first_name: Wolfgang
full_name: Müller, Wolfgang
id: '16243'
last_name: Müller
citation:
ama: 'Krupp A, Müller W. A Systematic Approach to Combined HW/SW System Test. In:
Proceedings of DATE’10. IEEE; 2010. doi:10.1109/DATE.2010.5457186'
apa: Krupp, A., & Müller, W. (2010). A Systematic Approach to Combined HW/SW
System Test. Proceedings of DATE’10. Design, Automation & Test in Europe
Conference & Exhibition (DATE 2010), Dresden. https://doi.org/10.1109/DATE.2010.5457186
bibtex: '@inproceedings{Krupp_Müller_2010, place={Dresden}, title={A Systematic
Approach to Combined HW/SW System Test}, DOI={10.1109/DATE.2010.5457186},
booktitle={Proceedings of DATE’10}, publisher={IEEE}, author={Krupp, Alexander
and Müller, Wolfgang}, year={2010} }'
chicago: 'Krupp, Alexander, and Wolfgang Müller. “A Systematic Approach to Combined
HW/SW System Test.” In Proceedings of DATE’10. Dresden: IEEE, 2010. https://doi.org/10.1109/DATE.2010.5457186.'
ieee: 'A. Krupp and W. Müller, “A Systematic Approach to Combined HW/SW System Test,”
presented at the Design, Automation & Test in Europe Conference & Exhibition
(DATE 2010), Dresden, 2010, doi: 10.1109/DATE.2010.5457186.'
mla: Krupp, Alexander, and Wolfgang Müller. “A Systematic Approach to Combined HW/SW
System Test.” Proceedings of DATE’10, IEEE, 2010, doi:10.1109/DATE.2010.5457186.
short: 'A. Krupp, W. Müller, in: Proceedings of DATE’10, IEEE, Dresden, 2010.'
conference:
location: Dresden
name: Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)
date_created: 2023-01-17T10:41:15Z
date_updated: 2023-01-17T10:41:25Z
department:
- _id: '672'
doi: 10.1109/DATE.2010.5457186
keyword:
- System testing
- Automatic testing
- Object oriented modeling
- Classification tree analysis
- Automotive engineering
- Mathematical model
- Embedded system
- Control systems
- Electronic equipment testing
- Software testing
language:
- iso: eng
place: Dresden
publication: Proceedings of DATE’10
publisher: IEEE
status: public
title: A Systematic Approach to Combined HW/SW System Test
type: conference
user_id: '5786'
year: '2010'
...
---
_id: '2353'
abstract:
- lang: eng
text: 'Wireless Sensor Networks (WSNs) are unique embedded computation systems for
distributed sensing of a dispersed phenomenon. While being a strongly concurrent
distributed system, its embedded aspects with severe resource limitations and
the wireless communication requires a fusion of technologies and methodologies
from very different fields. As WSNs are deployed in remote locations for long-term
unattended operation, assurance of correct functioning of the system is of prime
concern. Thus, the design and development of WSNs requires specialized tools to
allow for testing and debugging the system. To this end, we present a framework
for analyzing and checking WSNs based on collected events during system operation.
It allows for abstracting from the event trace by means of behavioral queries
and uses assertions for checking the accordance of an execution to its specification.
The framework is independent from WSN test platforms, applications and logging
semantics and thus generally applicable for analyzing event logs of WSN test executions. '
author:
- first_name: Matthias
full_name: Woehrle, Matthias
last_name: Woehrle
- first_name: Christian
full_name: Plessl, Christian
id: '16153'
last_name: Plessl
orcid: 0000-0001-5728-9982
- first_name: Lothar
full_name: Thiele, Lothar
last_name: Thiele
citation:
ama: 'Woehrle M, Plessl C, Thiele L. Rupeas: Ruby Powered Event Analysis DSL.
Computer Engineering and Networks Lab, ETH Zurich; 2009.'
apa: 'Woehrle, M., Plessl, C., & Thiele, L. (2009). Rupeas: Ruby Powered
Event Analysis DSL. Computer Engineering and Networks Lab, ETH Zurich.'
bibtex: '@book{Woehrle_Plessl_Thiele_2009, place={Computer Engineering and Networks
Lab, ETH Zurich}, title={Rupeas: Ruby Powered Event Analysis DSL}, author={Woehrle,
Matthias and Plessl, Christian and Thiele, Lothar}, year={2009} }'
chicago: 'Woehrle, Matthias, Christian Plessl, and Lothar Thiele. Rupeas: Ruby
Powered Event Analysis DSL. Computer Engineering and Networks Lab, ETH Zurich,
2009.'
ieee: 'M. Woehrle, C. Plessl, and L. Thiele, Rupeas: Ruby Powered Event Analysis
DSL. Computer Engineering and Networks Lab, ETH Zurich, 2009.'
mla: 'Woehrle, Matthias, et al. Rupeas: Ruby Powered Event Analysis DSL.
2009.'
short: 'M. Woehrle, C. Plessl, L. Thiele, Rupeas: Ruby Powered Event Analysis DSL,
Computer Engineering and Networks Lab, ETH Zurich, 2009.'
date_created: 2018-04-16T15:09:19Z
date_updated: 2022-01-06T06:55:56Z
department:
- _id: '27'
- _id: '518'
extern: '1'
keyword:
- Rupeas
- DSL
- WSN
- testing
language:
- iso: eng
place: Computer Engineering and Networks Lab, ETH Zurich
report_number: TIK-Report 290
status: public
title: 'Rupeas: Ruby Powered Event Analysis DSL'
type: report
user_id: '16153'
year: '2009'
...
---
_id: '2370'
author:
- first_name: Matthias
full_name: Woehrle, Matthias
last_name: Woehrle
- first_name: Christian
full_name: Plessl, Christian
id: '16153'
last_name: Plessl
orcid: 0000-0001-5728-9982
- first_name: Roman
full_name: Lim, Roman
last_name: Lim
- first_name: Jan
full_name: Beutel, Jan
last_name: Beutel
- first_name: Lothar
full_name: Thiele, Lothar
last_name: Thiele
citation:
ama: 'Woehrle M, Plessl C, Lim R, Beutel J, Thiele L. EvAnT: Analysis and Checking
of event traces for Wireless Sensor Networks. In: IEEE Int. Conf. on Sensor
Networks, Ubiquitous, and Trustworthy Computing (SUTC). IEEE Computer Society;
2008:201-208. doi:10.1109/SUTC.2008.24'
apa: 'Woehrle, M., Plessl, C., Lim, R., Beutel, J., & Thiele, L. (2008). EvAnT:
Analysis and Checking of event traces for Wireless Sensor Networks. IEEE Int.
Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC), 201–208.
https://doi.org/10.1109/SUTC.2008.24'
bibtex: '@inproceedings{Woehrle_Plessl_Lim_Beutel_Thiele_2008, place={Los Alamitos,
CA, USA}, title={EvAnT: Analysis and Checking of event traces for Wireless Sensor
Networks}, DOI={10.1109/SUTC.2008.24},
booktitle={IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing
(SUTC)}, publisher={IEEE Computer Society}, author={Woehrle, Matthias and Plessl,
Christian and Lim, Roman and Beutel, Jan and Thiele, Lothar}, year={2008}, pages={201–208}
}'
chicago: 'Woehrle, Matthias, Christian Plessl, Roman Lim, Jan Beutel, and Lothar
Thiele. “EvAnT: Analysis and Checking of Event Traces for Wireless Sensor Networks.”
In IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing
(SUTC), 201–8. Los Alamitos, CA, USA: IEEE Computer Society, 2008. https://doi.org/10.1109/SUTC.2008.24.'
ieee: 'M. Woehrle, C. Plessl, R. Lim, J. Beutel, and L. Thiele, “EvAnT: Analysis
and Checking of event traces for Wireless Sensor Networks,” in IEEE Int. Conf.
on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC), 2008, pp.
201–208, doi: 10.1109/SUTC.2008.24.'
mla: 'Woehrle, Matthias, et al. “EvAnT: Analysis and Checking of Event Traces for
Wireless Sensor Networks.” IEEE Int. Conf. on Sensor Networks, Ubiquitous,
and Trustworthy Computing (SUTC), IEEE Computer Society, 2008, pp. 201–08,
doi:10.1109/SUTC.2008.24.'
short: 'M. Woehrle, C. Plessl, R. Lim, J. Beutel, L. Thiele, in: IEEE Int. Conf.
on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC), IEEE Computer
Society, Los Alamitos, CA, USA, 2008, pp. 201–208.'
date_created: 2018-04-17T12:03:20Z
date_updated: 2023-09-26T13:55:02Z
department:
- _id: '27'
- _id: '518'
doi: 10.1109/SUTC.2008.24
keyword:
- WSN
- testing
- verification
language:
- iso: eng
page: 201-208
place: Los Alamitos, CA, USA
publication: IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing
(SUTC)
publication_identifier:
isbn:
- 978-0-7695-3158-8
publisher: IEEE Computer Society
quality_controlled: '1'
status: public
title: 'EvAnT: Analysis and Checking of event traces for Wireless Sensor Networks'
type: conference
user_id: '15278'
year: '2008'
...
---
_id: '2392'
author:
- first_name: Matthias
full_name: Woehrle, Matthias
last_name: Woehrle
- first_name: Christian
full_name: Plessl, Christian
id: '16153'
last_name: Plessl
orcid: 0000-0001-5728-9982
- first_name: Jan
full_name: Beutel, Jan
last_name: Beutel
- first_name: Lothar
full_name: Thiele, Lothar
last_name: Thiele
citation:
ama: 'Woehrle M, Plessl C, Beutel J, Thiele L. Increasing the Reliability of Wireless
Sensor Networks with a Distributed Testing Framework. In: Proc. Workshop on
Embedded Networked Sensors (EmNets). ACM; 2007:93-97. doi:10.1145/1278972.1278996'
apa: Woehrle, M., Plessl, C., Beutel, J., & Thiele, L. (2007). Increasing the
Reliability of Wireless Sensor Networks with a Distributed Testing Framework.
Proc. Workshop on Embedded Networked Sensors (EmNets), 93–97. https://doi.org/10.1145/1278972.1278996
bibtex: '@inproceedings{Woehrle_Plessl_Beutel_Thiele_2007, place={New York, NY,
USA}, title={Increasing the Reliability of Wireless Sensor Networks with a Distributed
Testing Framework}, DOI={10.1145/1278972.1278996},
booktitle={Proc. Workshop on Embedded Networked Sensors (EmNets)}, publisher={ACM},
author={Woehrle, Matthias and Plessl, Christian and Beutel, Jan and Thiele, Lothar},
year={2007}, pages={93–97} }'
chicago: 'Woehrle, Matthias, Christian Plessl, Jan Beutel, and Lothar Thiele. “Increasing
the Reliability of Wireless Sensor Networks with a Distributed Testing Framework.”
In Proc. Workshop on Embedded Networked Sensors (EmNets), 93–97. New York,
NY, USA: ACM, 2007. https://doi.org/10.1145/1278972.1278996.'
ieee: 'M. Woehrle, C. Plessl, J. Beutel, and L. Thiele, “Increasing the Reliability
of Wireless Sensor Networks with a Distributed Testing Framework,” in Proc.
Workshop on Embedded Networked Sensors (EmNets), 2007, pp. 93–97, doi: 10.1145/1278972.1278996.'
mla: Woehrle, Matthias, et al. “Increasing the Reliability of Wireless Sensor Networks
with a Distributed Testing Framework.” Proc. Workshop on Embedded Networked
Sensors (EmNets), ACM, 2007, pp. 93–97, doi:10.1145/1278972.1278996.
short: 'M. Woehrle, C. Plessl, J. Beutel, L. Thiele, in: Proc. Workshop on Embedded
Networked Sensors (EmNets), ACM, New York, NY, USA, 2007, pp. 93–97.'
date_created: 2018-04-17T13:34:42Z
date_updated: 2023-09-26T14:00:38Z
department:
- _id: '27'
- _id: '518'
doi: 10.1145/1278972.1278996
keyword:
- WSN
- testing
- distributed
- embedded
language:
- iso: eng
page: 93-97
place: New York, NY, USA
publication: Proc. Workshop on Embedded Networked Sensors (EmNets)
publication_identifier:
isbn:
- 978-1-59593-694-3
publisher: ACM
quality_controlled: '1'
status: public
title: Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing
Framework
type: conference
user_id: '15278'
year: '2007'
...
---
_id: '2393'
author:
- first_name: Jan
full_name: Beutel, Jan
last_name: Beutel
- first_name: Matthias
full_name: Dyer, Matthias
last_name: Dyer
- first_name: Roman
full_name: Lim, Roman
last_name: Lim
- first_name: Christian
full_name: Plessl, Christian
id: '16153'
last_name: Plessl
orcid: 0000-0001-5728-9982
- first_name: Matthias
full_name: Woehrle, Matthias
last_name: Woehrle
- first_name: Mustafa
full_name: Yuecel, Mustafa
last_name: Yuecel
- first_name: Lothar
full_name: Thiele, Lothar
last_name: Thiele
citation:
ama: 'Beutel J, Dyer M, Lim R, et al. Automated Wireless Sensor Network Testing.
In: Proc. Int. Conf. Networked Sensing Systems (INSS). IEEE; 2007:303-303.
doi:10.1109/INSS.2007.4297445'
apa: Beutel, J., Dyer, M., Lim, R., Plessl, C., Woehrle, M., Yuecel, M., & Thiele,
L. (2007). Automated Wireless Sensor Network Testing. Proc. Int. Conf. Networked
Sensing Systems (INSS), 303–303. https://doi.org/10.1109/INSS.2007.4297445
bibtex: '@inproceedings{Beutel_Dyer_Lim_Plessl_Woehrle_Yuecel_Thiele_2007, place={Piscataway,
NJ, USA}, title={Automated Wireless Sensor Network Testing}, DOI={10.1109/INSS.2007.4297445},
booktitle={Proc. Int. Conf. Networked Sensing Systems (INSS)}, publisher={IEEE},
author={Beutel, Jan and Dyer, Matthias and Lim, Roman and Plessl, Christian and
Woehrle, Matthias and Yuecel, Mustafa and Thiele, Lothar}, year={2007}, pages={303–303}
}'
chicago: 'Beutel, Jan, Matthias Dyer, Roman Lim, Christian Plessl, Matthias Woehrle,
Mustafa Yuecel, and Lothar Thiele. “Automated Wireless Sensor Network Testing.”
In Proc. Int. Conf. Networked Sensing Systems (INSS), 303–303. Piscataway,
NJ, USA: IEEE, 2007. https://doi.org/10.1109/INSS.2007.4297445.'
ieee: 'J. Beutel et al., “Automated Wireless Sensor Network Testing,” in
Proc. Int. Conf. Networked Sensing Systems (INSS), 2007, pp. 303–303, doi:
10.1109/INSS.2007.4297445.'
mla: Beutel, Jan, et al. “Automated Wireless Sensor Network Testing.” Proc. Int.
Conf. Networked Sensing Systems (INSS), IEEE, 2007, pp. 303–303, doi:10.1109/INSS.2007.4297445.
short: 'J. Beutel, M. Dyer, R. Lim, C. Plessl, M. Woehrle, M. Yuecel, L. Thiele,
in: Proc. Int. Conf. Networked Sensing Systems (INSS), IEEE, Piscataway, NJ, USA,
2007, pp. 303–303.'
date_created: 2018-04-17T13:35:55Z
date_updated: 2023-09-26T14:00:58Z
department:
- _id: '27'
- _id: '518'
doi: 10.1109/INSS.2007.4297445
keyword:
- WSN
- testing
- verification
language:
- iso: eng
page: 303-303
place: Piscataway, NJ, USA
publication: Proc. Int. Conf. Networked Sensing Systems (INSS)
publication_identifier:
isbn:
- 1-4244-1231-5
publisher: IEEE
quality_controlled: '1'
status: public
title: Automated Wireless Sensor Network Testing
type: conference
user_id: '15278'
year: '2007'
...
---
_id: '38784'
abstract:
- lang: eng
text: This article presents the classification tree method for functional verification
to close the gap from the specification of a test plan to SystemVerilog (Chandra
and Chakrabarty, 2001) test bench generation. Our method supports the systematic
development of test configurations and is based on the classification tree method
for embedded systems (CTM/ES) (Chakrabarty et al., 2000) extending CTM/ES for
random test generation as well as for functional coverage and property specification
author:
- first_name: Alexander
full_name: Krupp, Alexander
last_name: Krupp
- first_name: Wolfgang
full_name: Müller, Wolfgang
id: '16243'
last_name: Müller
citation:
ama: 'Krupp A, Müller W. Classification Trees for Functional Coverage and Random
Test Generation. In: Proceedings of the Design Automation & Test in Europe
Conference. IEEE; 2006. doi:10.1109/DATE.2006.243902'
apa: Krupp, A., & Müller, W. (2006). Classification Trees for Functional Coverage
and Random Test Generation. Proceedings of the Design Automation & Test
in Europe Conference. https://doi.org/10.1109/DATE.2006.243902
bibtex: '@inproceedings{Krupp_Müller_2006, place={Munich, Germany}, title={Classification
Trees for Functional Coverage and Random Test Generation}, DOI={10.1109/DATE.2006.243902},
booktitle={Proceedings of the Design Automation & Test in Europe Conference},
publisher={IEEE}, author={Krupp, Alexander and Müller, Wolfgang}, year={2006}
}'
chicago: 'Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional
Coverage and Random Test Generation.” In Proceedings of the Design Automation
& Test in Europe Conference. Munich, Germany: IEEE, 2006. https://doi.org/10.1109/DATE.2006.243902.'
ieee: 'A. Krupp and W. Müller, “Classification Trees for Functional Coverage and
Random Test Generation,” 2006, doi: 10.1109/DATE.2006.243902.'
mla: Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional
Coverage and Random Test Generation.” Proceedings of the Design Automation
& Test in Europe Conference, IEEE, 2006, doi:10.1109/DATE.2006.243902.
short: 'A. Krupp, W. Müller, in: Proceedings of the Design Automation & Test
in Europe Conference, IEEE, Munich, Germany, 2006.'
date_created: 2023-01-24T08:06:09Z
date_updated: 2023-01-24T08:06:14Z
department:
- _id: '672'
doi: 10.1109/DATE.2006.243902
keyword:
- Classification tree analysis
- System testing
- Embedded system
- Safety
- Automatic testing
- Automation
language:
- iso: eng
place: Munich, Germany
publication: Proceedings of the Design Automation & Test in Europe Conference
publication_identifier:
isbn:
- 3-9810801-1-4
publisher: IEEE
status: public
title: Classification Trees for Functional Coverage and Random Test Generation
type: conference
user_id: '5786'
year: '2006'
...
---
_id: '38107'
abstract:
- lang: eng
text: TestML is an XML-based language for the exchange of test descriptions in automotive
systems design and mainly introduced through the structural definition of an XML
schema as an independent exchange format for existing tools and methods covering
a wide range of different test technologies. In this paper, we present a rigorous
formal behavioral semantics for TestML by means of Abstract State Machines (ASMs).
Our semantics is a concise, unambiguous, high-level specification for TestML-based
implementations and serves as a basis to define exact and well-defined mappings
between existing test languages and TestML.
author:
- first_name: Jürgen
full_name: Großmann, Jürgen
last_name: Großmann
- first_name: Wolfgang
full_name: Müller, Wolfgang
id: '16243'
last_name: Müller
citation:
ama: 'Großmann J, Müller W. A Formal Behavioral Semantics for TestML. In: Proc.
of ISOLA 06. ; 2006. doi:10.1109/ISoLA.2006.37'
apa: Großmann, J., & Müller, W. (2006). A Formal Behavioral Semantics for TestML.
Proc. of ISOLA 06. https://doi.org/10.1109/ISoLA.2006.37
bibtex: '@inproceedings{Großmann_Müller_2006, place={Paphos, Cyprus}, title={A Formal
Behavioral Semantics for TestML}, DOI={10.1109/ISoLA.2006.37},
booktitle={Proc. of ISOLA 06}, author={Großmann, Jürgen and Müller, Wolfgang},
year={2006} }'
chicago: Großmann, Jürgen, and Wolfgang Müller. “A Formal Behavioral Semantics for
TestML.” In Proc. of ISOLA 06. Paphos, Cyprus, 2006. https://doi.org/10.1109/ISoLA.2006.37.
ieee: 'J. Großmann and W. Müller, “A Formal Behavioral Semantics for TestML,” Paphos,
Cyprus, 2006, doi: 10.1109/ISoLA.2006.37.'
mla: Großmann, Jürgen, and Wolfgang Müller. “A Formal Behavioral Semantics for TestML.”
Proc. of ISOLA 06, 2006, doi:10.1109/ISoLA.2006.37.
short: 'J. Großmann, W. Müller, in: Proc. of ISOLA 06, Paphos, Cyprus, 2006.'
conference:
location: Paphos, Cyprus
date_created: 2023-01-23T12:00:06Z
date_updated: 2023-01-23T12:06:26Z
department:
- _id: '672'
doi: 10.1109/ISoLA.2006.37
keyword:
- System testing
- Software testing
- Automotive engineering
- Automatic testing
- Machinery production industries
- Protocols
- Hardware design languages
- Samarium
- XML
- Computer industry
language:
- iso: eng
place: Paphos, Cyprus
publication: Proc. of ISOLA 06
publication_identifier:
isbn:
- 978-0-7695-3071-0
status: public
title: A Formal Behavioral Semantics for TestML
type: conference
user_id: '5786'
year: '2006'
...