---
_id: '54548'
author:
- first_name: Raphael Patrick
full_name: Prager, Raphael Patrick
last_name: Prager
- first_name: Heike
full_name: Trautmann, Heike
id: '100740'
last_name: Trautmann
orcid: 0000-0002-9788-8282
citation:
ama: Prager RP, Trautmann H. Exploratory Landscape Analysis for Mixed-Variable Problems.
IEEE Transactions on Evolutionary Computation. Published online 2024:1-1.
doi:10.1109/TEVC.2024.3399560
apa: Prager, R. P., & Trautmann, H. (2024). Exploratory Landscape Analysis for
Mixed-Variable Problems. IEEE Transactions on Evolutionary Computation,
1–1. https://doi.org/10.1109/TEVC.2024.3399560
bibtex: '@article{Prager_Trautmann_2024, title={Exploratory Landscape Analysis for
Mixed-Variable Problems}, DOI={10.1109/TEVC.2024.3399560},
journal={IEEE Transactions on Evolutionary Computation}, author={Prager, Raphael
Patrick and Trautmann, Heike}, year={2024}, pages={1–1} }'
chicago: Prager, Raphael Patrick, and Heike Trautmann. “Exploratory Landscape Analysis
for Mixed-Variable Problems.” IEEE Transactions on Evolutionary Computation,
2024, 1–1. https://doi.org/10.1109/TEVC.2024.3399560.
ieee: 'R. P. Prager and H. Trautmann, “Exploratory Landscape Analysis for Mixed-Variable
Problems,” IEEE Transactions on Evolutionary Computation, pp. 1–1, 2024,
doi: 10.1109/TEVC.2024.3399560.'
mla: Prager, Raphael Patrick, and Heike Trautmann. “Exploratory Landscape Analysis
for Mixed-Variable Problems.” IEEE Transactions on Evolutionary Computation,
2024, pp. 1–1, doi:10.1109/TEVC.2024.3399560.
short: R.P. Prager, H. Trautmann, IEEE Transactions on Evolutionary Computation
(2024) 1–1.
date_created: 2024-06-03T06:16:33Z
date_updated: 2024-06-03T06:17:13Z
department:
- _id: '819'
doi: 10.1109/TEVC.2024.3399560
keyword:
- Optimization
- Evolutionary computation
- Benchmark testing
- Hyperparameter optimization
- Portfolios
- Extraterrestrial measurements
- Dispersion
- Exploratory landscape analysis
- mixed-variable problem
- mixed search spaces
- automated algorithm selection
language:
- iso: eng
page: 1-1
publication: IEEE Transactions on Evolutionary Computation
status: public
title: Exploratory Landscape Analysis for Mixed-Variable Problems
type: journal_article
user_id: '15504'
year: '2024'
...
---
_id: '56221'
author:
- first_name: Angel E.
full_name: Rodriguez-Fernandez, Angel E.
last_name: Rodriguez-Fernandez
- first_name: Lennart
full_name: Schäpermeier, Lennart
last_name: Schäpermeier
- first_name: Carlos
full_name: Hernández, Carlos
last_name: Hernández
- first_name: Pascal
full_name: Kerschke, Pascal
last_name: Kerschke
- first_name: Heike
full_name: Trautmann, Heike
id: '100740'
last_name: Trautmann
orcid: 0000-0002-9788-8282
- first_name: Oliver
full_name: Schütze, Oliver
last_name: Schütze
citation:
ama: Rodriguez-Fernandez AE, Schäpermeier L, Hernández C, Kerschke P, Trautmann
H, Schütze O. Finding ϵ-Locally Optimal Solutions for Multi-Objective Multimodal
Optimization. IEEE Transactions on Evolutionary Computation. Published
online 2024:1-1. doi:10.1109/TEVC.2024.3458855
apa: Rodriguez-Fernandez, A. E., Schäpermeier, L., Hernández, C., Kerschke, P.,
Trautmann, H., & Schütze, O. (2024). Finding ϵ-Locally Optimal Solutions for
Multi-Objective Multimodal Optimization. IEEE Transactions on Evolutionary
Computation, 1–1. https://doi.org/10.1109/TEVC.2024.3458855
bibtex: '@article{Rodriguez-Fernandez_Schäpermeier_Hernández_Kerschke_Trautmann_Schütze_2024,
title={Finding ϵ-Locally Optimal Solutions for Multi-Objective Multimodal Optimization},
DOI={10.1109/TEVC.2024.3458855},
journal={IEEE Transactions on Evolutionary Computation}, author={Rodriguez-Fernandez,
Angel E. and Schäpermeier, Lennart and Hernández, Carlos and Kerschke, Pascal
and Trautmann, Heike and Schütze, Oliver}, year={2024}, pages={1–1} }'
chicago: Rodriguez-Fernandez, Angel E., Lennart Schäpermeier, Carlos Hernández,
Pascal Kerschke, Heike Trautmann, and Oliver Schütze. “Finding ϵ-Locally Optimal
Solutions for Multi-Objective Multimodal Optimization.” IEEE Transactions on
Evolutionary Computation, 2024, 1–1. https://doi.org/10.1109/TEVC.2024.3458855.
ieee: 'A. E. Rodriguez-Fernandez, L. Schäpermeier, C. Hernández, P. Kerschke, H.
Trautmann, and O. Schütze, “Finding ϵ-Locally Optimal Solutions for Multi-Objective
Multimodal Optimization,” IEEE Transactions on Evolutionary Computation,
pp. 1–1, 2024, doi: 10.1109/TEVC.2024.3458855.'
mla: Rodriguez-Fernandez, Angel E., et al. “Finding ϵ-Locally Optimal Solutions
for Multi-Objective Multimodal Optimization.” IEEE Transactions on Evolutionary
Computation, 2024, pp. 1–1, doi:10.1109/TEVC.2024.3458855.
short: A.E. Rodriguez-Fernandez, L. Schäpermeier, C. Hernández, P. Kerschke, H.
Trautmann, O. Schütze, IEEE Transactions on Evolutionary Computation (2024) 1–1.
date_created: 2024-09-24T08:01:14Z
date_updated: 2024-09-24T08:01:47Z
doi: 10.1109/TEVC.2024.3458855
keyword:
- Optimization
- Evolutionary computation
- Approximation algorithms
- Benchmark testing
- Vectors
- Surveys
- Pareto optimization
- multi-objective optimization
- evolutionary computation
- multimodal optimization
- local solutions
language:
- iso: eng
page: 1-1
publication: IEEE Transactions on Evolutionary Computation
status: public
title: Finding ϵ-Locally Optimal Solutions for Multi-Objective Multimodal Optimization
type: journal_article
user_id: '15504'
year: '2024'
...
---
_id: '57300'
abstract:
- lang: eng
text: Engineering methodologies for Cyber-Physical Systems (CPS) call for planning
simulations and physical testing in early phases of product creation. Even in
Model-Based Systems Engineering, there is a lack of systematic support that results
in avoidable costs and iterations in the engineering process. Planning test cases
and test scenarios along the product engineering process is not sufficiently integrated
in terms of support especially for verification and validation engineers. Based
on a systematic literature review, concepts for model-based planning of testing
are developed. Characteristics of test cases and test scenarios of CPS are systematically
identified. Generic templates for the creation of test cases and scenarios are
derived. Based on the templates, a System Modeling Language (SysML) profile extension
is developed which enables intuitive modelling of test cases and scenarios. The
SysML profile is evaluated in a sample System-of-Systems in Disaster Response.
It subsumes various types of sensor systems like rescue robotics, data science
algorithms and visualization technologies like Augmented Reality to support decisions
in extreme weather events. The templates and SysML profile significantly add value
for engineers in the early and systematic planning of verification and validation.
author:
- first_name: Iris
full_name: Gräßler, Iris
id: '47565'
last_name: Gräßler
orcid: 0000-0001-5765-971X
- first_name: Marcel
full_name: Ebel, Marcel
id: '81788'
last_name: Ebel
orcid: https://orcid.org/0009-0007-5400-4436
- first_name: Jens
full_name: Pottebaum, Jens
id: '405'
last_name: Pottebaum
orcid: http://orcid.org/0000-0001-8778-2989
citation:
ama: 'Gräßler I, Ebel M, Pottebaum J. Model-based planning of test cases and test
scenarios to support engineering of Cyber-Physical Systems. In: 2024 IEEE International
Symposium on Systems Engineering (ISSE). IEEE; 2024. doi:10.1109/isse63315.2024.10741135'
apa: Gräßler, I., Ebel, M., & Pottebaum, J. (2024). Model-based planning of
test cases and test scenarios to support engineering of Cyber-Physical Systems.
2024 IEEE International Symposium on Systems Engineering (ISSE). IEEE
International Symposium on Systems Engineering 2024, Perugia. https://doi.org/10.1109/isse63315.2024.10741135
bibtex: '@inproceedings{Gräßler_Ebel_Pottebaum_2024, title={Model-based planning
of test cases and test scenarios to support engineering of Cyber-Physical Systems},
DOI={10.1109/isse63315.2024.10741135},
booktitle={2024 IEEE International Symposium on Systems Engineering (ISSE)}, publisher={IEEE},
author={Gräßler, Iris and Ebel, Marcel and Pottebaum, Jens}, year={2024} }'
chicago: Gräßler, Iris, Marcel Ebel, and Jens Pottebaum. “Model-Based Planning of
Test Cases and Test Scenarios to Support Engineering of Cyber-Physical Systems.”
In 2024 IEEE International Symposium on Systems Engineering (ISSE). IEEE,
2024. https://doi.org/10.1109/isse63315.2024.10741135.
ieee: 'I. Gräßler, M. Ebel, and J. Pottebaum, “Model-based planning of test cases
and test scenarios to support engineering of Cyber-Physical Systems,” presented
at the IEEE International Symposium on Systems Engineering 2024, Perugia, 2024,
doi: 10.1109/isse63315.2024.10741135.'
mla: Gräßler, Iris, et al. “Model-Based Planning of Test Cases and Test Scenarios
to Support Engineering of Cyber-Physical Systems.” 2024 IEEE International
Symposium on Systems Engineering (ISSE), IEEE, 2024, doi:10.1109/isse63315.2024.10741135.
short: 'I. Gräßler, M. Ebel, J. Pottebaum, in: 2024 IEEE International Symposium
on Systems Engineering (ISSE), IEEE, 2024.'
conference:
end_date: 2024-10-18
location: Perugia
name: ' IEEE International Symposium on Systems Engineering 2024'
start_date: 2024-10-16
date_created: 2024-11-20T20:06:22Z
date_updated: 2025-01-17T16:20:14Z
department:
- _id: '152'
doi: 10.1109/isse63315.2024.10741135
has_accepted_license: '1'
keyword:
- Systems Engineering
- Systems verification
- System testing
language:
- iso: eng
main_file_link:
- open_access: '1'
url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10741135&tag=1
oa: '1'
project:
- _id: '516'
grant_number: '101092749'
name: 'CREXDATA: CREXDATA: Kritische Maßnahmenplanung über extreme Datenmengen'
publication: 2024 IEEE International Symposium on Systems Engineering (ISSE)
publication_status: published
publisher: IEEE
quality_controlled: '1'
status: public
title: Model-based planning of test cases and test scenarios to support engineering
of Cyber-Physical Systems
type: conference
user_id: '405'
year: '2024'
...
---
_id: '58348'
abstract:
- lang: eng
text: ' Clinching is a mechanical joining technology, in which a mainly
form-fit joint is created by means of local cold forming. To characterize the
load-bearing behavior of such joints, they are typically analyzed destructively,
for example by tensile-shear tests in combination with metallographic sections.
However, both the initiation and progress of failure can only be described to
a limited extent by this method. Furthermore, these tests allow only limited conclusions
about clinch points under in-service loading. More purposefully, clinch points
can be analyzed nondestructively by combining in-situ computed tomography (CT)
and transient dynamic analysis (TDA). The TDA continuously measures the dynamic
behavior of the specimen and indicates failure events like crack initiation, which
then can be evaluated thoroughly by stopping the test and performing a CT scan.
To qualify the TDA for this task, it is necessary to link the observed damage
behavior with specific dynamic characteristics. In this work, the complementation
of in-situ CT and TDA is investigated by testing a clinched single-lap tensile-shear
specimen made of aluminum. The testing procedure is stepwise: at certain displacement
levels, the specimen is investigated by in-situ CT and TDA. While the in-situ
CT provides the location, extent, and development of the failure phenomena, the
TDA uses this information to evaluate the dynamic signal and detect relevant frequency
ranges, which indicate damage events. The results demonstrate, that failure initiation
and progression can be analyzed efficiently by combining both measuring systems.
The TDA reliably detects relevant signal changes in the monitored frequency band.
By means of in-situ computed tomography, the corresponding failure phenomena can
be described in detail, enhancing the understanding of the load-bearing and deformation
behavior of clinch points. The concatenation of characteristic signal changes
and observed failure phenomena can henceforth be transferred to analyze complex
structures during operation nondestructively by TDA. '
article_type: original
author:
- first_name: Gregor
full_name: Reschke, Gregor
last_name: Reschke
- first_name: Daniel
full_name: Köhler, Daniel
last_name: Köhler
- first_name: Robert
full_name: Kupfer, Robert
last_name: Kupfer
- first_name: Juliane
full_name: Troschitz, Juliane
last_name: Troschitz
- first_name: Maik
full_name: Gude, Maik
last_name: Gude
- first_name: Alexander
full_name: Brosius, Alexander
last_name: Brosius
citation:
ama: 'Reschke G, Köhler D, Kupfer R, Troschitz J, Gude M, Brosius A. In-situ computed
tomography and transient dynamic analysis – failure analysis of a single-lap tensile-shear
test with clinch points. Proceedings of the Institution of Mechanical Engineers,
Part E: Journal of Process Mechanical Engineering. Published online 2024.
doi:10.1177/09544089241251646'
apa: 'Reschke, G., Köhler, D., Kupfer, R., Troschitz, J., Gude, M., & Brosius,
A. (2024). In-situ computed tomography and transient dynamic analysis – failure
analysis of a single-lap tensile-shear test with clinch points. Proceedings
of the Institution of Mechanical Engineers, Part E: Journal of Process Mechanical
Engineering. https://doi.org/10.1177/09544089241251646'
bibtex: '@article{Reschke_Köhler_Kupfer_Troschitz_Gude_Brosius_2024, title={In-situ
computed tomography and transient dynamic analysis – failure analysis of a single-lap
tensile-shear test with clinch points}, DOI={10.1177/09544089241251646},
journal={Proceedings of the Institution of Mechanical Engineers, Part E: Journal
of Process Mechanical Engineering}, publisher={SAGE Publications}, author={Reschke,
Gregor and Köhler, Daniel and Kupfer, Robert and Troschitz, Juliane and Gude,
Maik and Brosius, Alexander}, year={2024} }'
chicago: 'Reschke, Gregor, Daniel Köhler, Robert Kupfer, Juliane Troschitz, Maik
Gude, and Alexander Brosius. “In-Situ Computed Tomography and Transient Dynamic
Analysis – Failure Analysis of a Single-Lap Tensile-Shear Test with Clinch Points.”
Proceedings of the Institution of Mechanical Engineers, Part E: Journal of
Process Mechanical Engineering, 2024. https://doi.org/10.1177/09544089241251646.'
ieee: 'G. Reschke, D. Köhler, R. Kupfer, J. Troschitz, M. Gude, and A. Brosius,
“In-situ computed tomography and transient dynamic analysis – failure analysis
of a single-lap tensile-shear test with clinch points,” Proceedings of the
Institution of Mechanical Engineers, Part E: Journal of Process Mechanical Engineering,
2024, doi: 10.1177/09544089241251646.'
mla: 'Reschke, Gregor, et al. “In-Situ Computed Tomography and Transient Dynamic
Analysis – Failure Analysis of a Single-Lap Tensile-Shear Test with Clinch Points.”
Proceedings of the Institution of Mechanical Engineers, Part E: Journal of
Process Mechanical Engineering, SAGE Publications, 2024, doi:10.1177/09544089241251646.'
short: 'G. Reschke, D. Köhler, R. Kupfer, J. Troschitz, M. Gude, A. Brosius, Proceedings
of the Institution of Mechanical Engineers, Part E: Journal of Process Mechanical
Engineering (2024).'
date_created: 2025-01-23T19:21:45Z
date_updated: 2025-01-23T19:32:03Z
department:
- _id: '43'
- _id: '157'
doi: 10.1177/09544089241251646
keyword:
- Clinching
- Non-destructive testing
- Transient Dynamic Analysis
language:
- iso: eng
main_file_link:
- open_access: '1'
oa: '1'
project:
- _id: '133'
name: 'TRR 285 - C: TRR 285 - Project Area C'
- _id: '148'
name: 'TRR 285 – C04: TRR 285 - Subproject C04'
publication: 'Proceedings of the Institution of Mechanical Engineers, Part E: Journal
of Process Mechanical Engineering'
publication_identifier:
issn:
- 0954-4089
- 2041-3009
publication_status: published
publisher: SAGE Publications
quality_controlled: '1'
status: public
title: In-situ computed tomography and transient dynamic analysis – failure analysis
of a single-lap tensile-shear test with clinch points
type: journal_article
user_id: '98812'
year: '2024'
...
---
_id: '34212'
abstract:
- lang: eng
text: "Force–displacement measurements and micrograph analyses are commonly used
methods to validate numerical models of clinching processes. However, these methods
often lead to resetting of elastic deformations and crack-\r\nclosing after unloading.
In contrast, the in situ computed tomography (CT) can provide three-dimensional
images of the clinch point under loading conditions. In this paper, the potential
of the in situ investigation of a clinching process as validation method is analyzed.
For the in situ testing, a tailored test set-up featuring a beryllium cylinder
for load-bearing and clinching tools made from ultra-high-strength titanium and
Si3N4 are used. In the experiments, the clinching of two aluminum sheets is interrupted
at specific process steps in order to perform the CT scans. It is shown that in
situ CT visualizes the inner geometry of the joint at high precision and that
this method is suitable to validate numerical models."
author:
- first_name: Daniel
full_name: Köhler, Daniel
last_name: Köhler
- first_name: Robert
full_name: Kupfer, Robert
last_name: Kupfer
- first_name: Juliane
full_name: Troschitz, Juliane
last_name: Troschitz
- first_name: Maik
full_name: Gude, Maik
last_name: Gude
citation:
ama: 'Köhler D, Kupfer R, Troschitz J, Gude M. Clinching in In Situ CT—A Novel Validation
Method for Mechanical Joining Processes. In: The Minerals, Metals & Materials
Series. Springer International Publishing; 2022. doi:10.1007/978-3-031-06212-4_75'
apa: Köhler, D., Kupfer, R., Troschitz, J., & Gude, M. (2022). Clinching in
In Situ CT—A Novel Validation Method for Mechanical Joining Processes. In The
Minerals, Metals & Materials Series. Springer International Publishing.
https://doi.org/10.1007/978-3-031-06212-4_75
bibtex: '@inbook{Köhler_Kupfer_Troschitz_Gude_2022, place={Cham}, title={Clinching
in In Situ CT—A Novel Validation Method for Mechanical Joining Processes}, DOI={10.1007/978-3-031-06212-4_75},
booktitle={The Minerals, Metals & Materials Series}, publisher={Springer International
Publishing}, author={Köhler, Daniel and Kupfer, Robert and Troschitz, Juliane
and Gude, Maik}, year={2022} }'
chicago: 'Köhler, Daniel, Robert Kupfer, Juliane Troschitz, and Maik Gude. “Clinching
in In Situ CT—A Novel Validation Method for Mechanical Joining Processes.” In
The Minerals, Metals & Materials Series. Cham: Springer International
Publishing, 2022. https://doi.org/10.1007/978-3-031-06212-4_75.'
ieee: 'D. Köhler, R. Kupfer, J. Troschitz, and M. Gude, “Clinching in In Situ CT—A
Novel Validation Method for Mechanical Joining Processes,” in The Minerals,
Metals & Materials Series, Cham: Springer International Publishing, 2022.'
mla: Köhler, Daniel, et al. “Clinching in In Situ CT—A Novel Validation Method for
Mechanical Joining Processes.” The Minerals, Metals & Materials Series,
Springer International Publishing, 2022, doi:10.1007/978-3-031-06212-4_75.
short: 'D. Köhler, R. Kupfer, J. Troschitz, M. Gude, in: The Minerals, Metals &
Materials Series, Springer International Publishing, Cham, 2022.'
date_created: 2022-12-05T21:06:21Z
date_updated: 2022-12-05T21:11:47Z
doi: 10.1007/978-3-031-06212-4_75
keyword:
- Clinching
- Non-destructive testing
- Computed tomography
- In situ CT
language:
- iso: eng
place: Cham
project:
- _id: '130'
grant_number: '418701707'
name: 'TRR 285: TRR 285'
- _id: '133'
name: 'TRR 285 - C: TRR 285 - Project Area C'
- _id: '148'
name: 'TRR 285 – C04: TRR 285 - Subproject C04'
publication: The Minerals, Metals & Materials Series
publication_identifier:
isbn:
- '9783031062117'
- '9783031062124'
issn:
- 2367-1181
- 2367-1696
publication_status: published
publisher: Springer International Publishing
status: public
title: Clinching in In Situ CT—A Novel Validation Method for Mechanical Joining Processes
type: book_chapter
user_id: '7850'
year: '2022'
...
---
_id: '20543'
author:
- first_name: Lisa
full_name: Nguyen Quang Do, Lisa
last_name: Nguyen Quang Do
- first_name: Stefan
full_name: Krüger, Stefan
last_name: Krüger
- first_name: Patrick
full_name: Hill, Patrick
last_name: Hill
- first_name: Karim
full_name: Ali, Karim
last_name: Ali
- first_name: Eric
full_name: Bodden, Eric
id: '59256'
last_name: Bodden
orcid: 0000-0003-3470-3647
citation:
ama: Nguyen Quang Do L, Krüger S, Hill P, Ali K, Bodden E. Debugging Static Analysis.
IEEE Transactions on Software Engineering. Published online 2018:1-1. doi:10.1109/TSE.2018.2868349
apa: Nguyen Quang Do, L., Krüger, S., Hill, P., Ali, K., & Bodden, E. (2018).
Debugging Static Analysis. IEEE Transactions on Software Engineering, 1–1.
https://doi.org/10.1109/TSE.2018.2868349
bibtex: '@article{Nguyen Quang Do_Krüger_Hill_Ali_Bodden_2018, title={Debugging
Static Analysis}, DOI={10.1109/TSE.2018.2868349},
journal={IEEE Transactions on Software Engineering}, author={Nguyen Quang Do,
Lisa and Krüger, Stefan and Hill, Patrick and Ali, Karim and Bodden, Eric}, year={2018},
pages={1–1} }'
chicago: Nguyen Quang Do, Lisa, Stefan Krüger, Patrick Hill, Karim Ali, and Eric
Bodden. “Debugging Static Analysis.” IEEE Transactions on Software Engineering,
2018, 1–1. https://doi.org/10.1109/TSE.2018.2868349.
ieee: 'L. Nguyen Quang Do, S. Krüger, P. Hill, K. Ali, and E. Bodden, “Debugging
Static Analysis,” IEEE Transactions on Software Engineering, pp. 1–1, 2018,
doi: 10.1109/TSE.2018.2868349.'
mla: Nguyen Quang Do, Lisa, et al. “Debugging Static Analysis.” IEEE Transactions
on Software Engineering, 2018, pp. 1–1, doi:10.1109/TSE.2018.2868349.
short: L. Nguyen Quang Do, S. Krüger, P. Hill, K. Ali, E. Bodden, IEEE Transactions
on Software Engineering (2018) 1–1.
date_created: 2020-11-30T09:32:12Z
date_updated: 2022-01-06T06:54:29Z
department:
- _id: '76'
doi: 10.1109/TSE.2018.2868349
keyword:
- Debugging
- Static analysis
- Tools
- Computer bugs
- Standards
- Writing
- Encoding
- Testing and Debugging
- Program analysis
- Development tools
- Integrated environments
- Graphical environments
- Usability testing
language:
- iso: eng
main_file_link:
- url: http://www.bodden.de/pubs/tse18debugging.pdf
page: 1-1
publication: IEEE Transactions on Software Engineering
publication_identifier:
issn:
- 2326-3881
status: public
title: Debugging Static Analysis
type: journal_article
user_id: '5786'
year: '2018'
...
---
_id: '36481'
abstract:
- lang: eng
text: 'Recent studies highlight early childhood teachers’ mathematics-related competence.
Developing this competence should be a main aspect of early childhood teachers’
education. This is, however, not the case in all countries. Consequently, high-quality
professional development courses are needed. Based on research results, we developed
a competence-oriented continuous professional development course ("EmMa") and
examined the effects of "EmMa" by asking: How does "EmMa" affect the development
of early childhood teachers’ i) mathematical content knowledge, ii) mathematical
pedagogical content knowledge and iii) beliefs towards mathematics in general?
To answer these questions, we conducted a pre-test/post-test study including a
control group with 99 in-service early childhood teachers. Results show that the
course affected teachers’ mathematical pedagogical content knowledge and static
orientation towards mathematics positively. From this we conclude that scaling-up
"EmMa" might be a suitable approach to bridge the gap between pre-service education
with nearly no mathematics and the challenges of early mathematics education.'
author:
- first_name: Julia
full_name: Bruns, Julia
id: '72183'
last_name: Bruns
orcid: https://orcid.org/0000-0002-6604-5864
- first_name: Lars
full_name: Eichen, Lars
last_name: Eichen
- first_name: Hedwig
full_name: Gasteiger, Hedwig
last_name: Gasteiger
citation:
ama: 'Bruns J, Eichen L, Gasteiger H. Mathematics-related Competence of Early Childhood
Teachers Visiting a Continuous Professional Development Course: An Intervention
Study. Mathematics Teacher Education and Development (MTED). 2017;19(3):76–93.'
apa: 'Bruns, J., Eichen, L., & Gasteiger, H. (2017). Mathematics-related Competence
of Early Childhood Teachers Visiting a Continuous Professional Development Course:
An Intervention Study. Mathematics Teacher Education and Development (MTED),
19(3), 76–93.'
bibtex: '@article{Bruns_Eichen_Gasteiger_2017, title={Mathematics-related Competence
of Early Childhood Teachers Visiting a Continuous Professional Development Course:
An Intervention Study}, volume={19}, number={3}, journal={Mathematics Teacher
Education and Development (MTED)}, author={Bruns, Julia and Eichen, Lars and Gasteiger,
Hedwig}, year={2017}, pages={76–93} }'
chicago: 'Bruns, Julia, Lars Eichen, and Hedwig Gasteiger. “Mathematics-Related
Competence of Early Childhood Teachers Visiting a Continuous Professional Development
Course: An Intervention Study.” Mathematics Teacher Education and Development
(MTED) 19, no. 3 (2017): 76–93.'
ieee: 'J. Bruns, L. Eichen, and H. Gasteiger, “Mathematics-related Competence of
Early Childhood Teachers Visiting a Continuous Professional Development Course:
An Intervention Study,” Mathematics Teacher Education and Development (MTED),
vol. 19, no. 3, pp. 76–93, 2017.'
mla: 'Bruns, Julia, et al. “Mathematics-Related Competence of Early Childhood Teachers
Visiting a Continuous Professional Development Course: An Intervention Study.”
Mathematics Teacher Education and Development (MTED), vol. 19, no. 3, 2017,
pp. 76–93.'
short: J. Bruns, L. Eichen, H. Gasteiger, Mathematics Teacher Education and Development
(MTED) 19 (2017) 76–93.
date_created: 2023-01-12T15:28:13Z
date_updated: 2023-06-20T19:01:36Z
department:
- _id: '611'
- _id: '97'
extern: '1'
intvolume: ' 19'
issue: '3'
keyword:
- Beliefs
- Competency Based Teacher Education
- Control Groups
- Early Childhood Education
- Faculty Development
- Foreign Countries
- Inservice Teacher Education
- Intervention
- Mathematical Aptitude
- Mathematics Skills
- Pedagogical Content Knowledge
- Preschool Teachers
- Pretests Posttests
- Professional Continuing Education
- Statistical Analysis
- Teacher Competency Testing
language:
- iso: eng
page: 76–93
publication: Mathematics Teacher Education and Development (MTED)
publication_status: published
quality_controlled: '1'
status: public
title: 'Mathematics-related Competence of Early Childhood Teachers Visiting a Continuous
Professional Development Course: An Intervention Study'
type: journal_article
user_id: '49063'
volume: 19
year: '2017'
...
---
_id: '9889'
abstract:
- lang: eng
text: A measurement method is presented that combines the advantages of the multisine
measurement technique with a prediction method for peak bending behavior. This
combination allows the analysis of the dynamic behavior of mechanical structures
at distinctly reduced measurement durations and has the advantage of reducing
high excitation impacts on the structure under test.
author:
- first_name: Christian
full_name: Sprock, Christian
last_name: Sprock
- first_name: Walter
full_name: Sextro, Walter
id: '21220'
last_name: Sextro
citation:
ama: 'Sprock C, Sextro W. Time-efficient dynamic analysis of structures exhibiting
nonlinear peak bending. In: Instrumentation and Measurement Technology Conference
(I2MTC) Proceedings, 2014 IEEE International. ; 2014:320-324. doi:10.1109/I2MTC.2014.6860760'
apa: Sprock, C., & Sextro, W. (2014). Time-efficient dynamic analysis of structures
exhibiting nonlinear peak bending. In Instrumentation and Measurement Technology
Conference (I2MTC) Proceedings, 2014 IEEE International (pp. 320–324). https://doi.org/10.1109/I2MTC.2014.6860760
bibtex: '@inproceedings{Sprock_Sextro_2014, title={Time-efficient dynamic analysis
of structures exhibiting nonlinear peak bending}, DOI={10.1109/I2MTC.2014.6860760},
booktitle={Instrumentation and Measurement Technology Conference (I2MTC) Proceedings,
2014 IEEE International}, author={Sprock, Christian and Sextro, Walter}, year={2014},
pages={320–324} }'
chicago: Sprock, Christian, and Walter Sextro. “Time-Efficient Dynamic Analysis
of Structures Exhibiting Nonlinear Peak Bending.” In Instrumentation and Measurement
Technology Conference (I2MTC) Proceedings, 2014 IEEE International, 320–24,
2014. https://doi.org/10.1109/I2MTC.2014.6860760.
ieee: C. Sprock and W. Sextro, “Time-efficient dynamic analysis of structures exhibiting
nonlinear peak bending,” in Instrumentation and Measurement Technology Conference
(I2MTC) Proceedings, 2014 IEEE International, 2014, pp. 320–324.
mla: Sprock, Christian, and Walter Sextro. “Time-Efficient Dynamic Analysis of Structures
Exhibiting Nonlinear Peak Bending.” Instrumentation and Measurement Technology
Conference (I2MTC) Proceedings, 2014 IEEE International, 2014, pp. 320–24,
doi:10.1109/I2MTC.2014.6860760.
short: 'C. Sprock, W. Sextro, in: Instrumentation and Measurement Technology Conference
(I2MTC) Proceedings, 2014 IEEE International, 2014, pp. 320–324.'
date_created: 2019-05-20T13:25:22Z
date_updated: 2019-05-20T13:25:53Z
department:
- _id: '151'
doi: 10.1109/I2MTC.2014.6860760
keyword:
- bending
- dynamic testing
- measurement
- structural engineering
- vibrations
- measurement durations
- mechanical structures
- multisine measurement technique
- nonlinear peak bending behavior
- prediction method
- time-efficient dynamic analysis
- Heuristic algorithms
- Nonlinear systems
- Oscillators
- Time measurement
- Time-frequency analysis
- Vibrations
language:
- iso: eng
page: 320-324
publication: Instrumentation and Measurement Technology Conference (I2MTC) Proceedings,
2014 IEEE International
status: public
title: Time-efficient dynamic analysis of structures exhibiting nonlinear peak bending
type: conference
user_id: '55222'
year: '2014'
...
---
_id: '37002'
abstract:
- lang: eng
text: HDL-mutation based fault injection and analysis is considered as an important
coverage metric for measuring the quality of design simulation processes [20,
3, 1, 2]. In this work, we try to solve the problem of automatic simulation data
generation targeting HDL mutation faults. We follow a search based approach and
eliminate the need for symbolic execution and mathematical constraint solving
from existing work. An objective cost function is defined on the test input space
and serves the guidance of search for fault-detecting test data. This is done
by first mapping the simulation traces under a test onto a control and data flow
graph structure which is extracted from the design. Then the progress of fault
detection can be measured quantitatively on this graph to be the cost value. By
minimizing this cost we approach the target test data. The effectiveness of the
cost function is investigated under an example neighborhood search scheme. Case
study with a floating point arithmetic IP design has shown that the cost function
is able to guide effectively the search procedure towards a fault-detecting test.
The cost calculation time as the search overhead was also observed to be minor
compared to the actual design simulation time.
author:
- first_name: Tao
full_name: Xie, Tao
last_name: Xie
- first_name: Wolfgang
full_name: Müller, Wolfgang
id: '16243'
last_name: Müller
- first_name: Florian
full_name: Letombe, Florian
last_name: Letombe
citation:
ama: 'Xie T, Müller W, Letombe F. HDL-Mutation Based Simulation Data Generation
by Propagation Guided Search. In: Proceedings of Euromicro DSD 2011. IEEE;
2011. doi:10.1109/DSD.2011.83'
apa: Xie, T., Müller, W., & Letombe, F. (2011). HDL-Mutation Based Simulation
Data Generation by Propagation Guided Search. Proceedings of Euromicro DSD
2011. https://doi.org/10.1109/DSD.2011.83
bibtex: '@inproceedings{Xie_Müller_Letombe_2011, place={Oulu, Finnland}, title={HDL-Mutation
Based Simulation Data Generation by Propagation Guided Search}, DOI={10.1109/DSD.2011.83},
booktitle={Proceedings of Euromicro DSD 2011}, publisher={IEEE}, author={Xie,
Tao and Müller, Wolfgang and Letombe, Florian}, year={2011} }'
chicago: 'Xie, Tao, Wolfgang Müller, and Florian Letombe. “HDL-Mutation Based Simulation
Data Generation by Propagation Guided Search.” In Proceedings of Euromicro
DSD 2011. Oulu, Finnland: IEEE, 2011. https://doi.org/10.1109/DSD.2011.83.'
ieee: 'T. Xie, W. Müller, and F. Letombe, “HDL-Mutation Based Simulation Data Generation
by Propagation Guided Search,” 2011, doi: 10.1109/DSD.2011.83.'
mla: Xie, Tao, et al. “HDL-Mutation Based Simulation Data Generation by Propagation
Guided Search.” Proceedings of Euromicro DSD 2011, IEEE, 2011, doi:10.1109/DSD.2011.83.
short: 'T. Xie, W. Müller, F. Letombe, in: Proceedings of Euromicro DSD 2011, IEEE,
Oulu, Finnland, 2011.'
date_created: 2023-01-17T09:02:48Z
date_updated: 2025-02-26T14:44:15Z
department:
- _id: '672'
doi: 10.1109/DSD.2011.83
keyword:
- Hardware design languages
- Cost function
- Computational modeling
- Fault detection
- Data models
- Analytical models
- Testing
language:
- iso: eng
place: Oulu, Finnland
publication: Proceedings of Euromicro DSD 2011
publication_identifier:
isbn:
- 978-1-4577-1048-3
publisher: IEEE
status: public
title: HDL-Mutation Based Simulation Data Generation by Propagation Guided Search
type: conference
user_id: '5786'
year: '2011'
...
---
_id: '37037'
abstract:
- lang: eng
text: Today we can identify a big gap between requirement specification and the
generation of test environments. This article extends the Classification Tree
Method for Embedded Systems (CTM/ES) to fill this gap by new concepts for the
precise specification of stimuli for operational ranges of continuous control
systems. It introduces novel means for continuous acceptance criteria definition
and for functional coverage definition.
author:
- first_name: Alexander
full_name: Krupp, Alexander
last_name: Krupp
- first_name: Wolfgang
full_name: Müller, Wolfgang
id: '16243'
last_name: Müller
citation:
ama: 'Krupp A, Müller W. A Systematic Approach to Combined HW/SW System Test. In:
Proceedings of DATE’10. IEEE; 2010. doi:10.1109/DATE.2010.5457186'
apa: Krupp, A., & Müller, W. (2010). A Systematic Approach to Combined HW/SW
System Test. Proceedings of DATE’10. Design, Automation & Test in Europe
Conference & Exhibition (DATE 2010), Dresden. https://doi.org/10.1109/DATE.2010.5457186
bibtex: '@inproceedings{Krupp_Müller_2010, place={Dresden}, title={A Systematic
Approach to Combined HW/SW System Test}, DOI={10.1109/DATE.2010.5457186},
booktitle={Proceedings of DATE’10}, publisher={IEEE}, author={Krupp, Alexander
and Müller, Wolfgang}, year={2010} }'
chicago: 'Krupp, Alexander, and Wolfgang Müller. “A Systematic Approach to Combined
HW/SW System Test.” In Proceedings of DATE’10. Dresden: IEEE, 2010. https://doi.org/10.1109/DATE.2010.5457186.'
ieee: 'A. Krupp and W. Müller, “A Systematic Approach to Combined HW/SW System Test,”
presented at the Design, Automation & Test in Europe Conference & Exhibition
(DATE 2010), Dresden, 2010, doi: 10.1109/DATE.2010.5457186.'
mla: Krupp, Alexander, and Wolfgang Müller. “A Systematic Approach to Combined HW/SW
System Test.” Proceedings of DATE’10, IEEE, 2010, doi:10.1109/DATE.2010.5457186.
short: 'A. Krupp, W. Müller, in: Proceedings of DATE’10, IEEE, Dresden, 2010.'
conference:
location: Dresden
name: Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)
date_created: 2023-01-17T10:41:15Z
date_updated: 2023-01-17T10:41:25Z
department:
- _id: '672'
doi: 10.1109/DATE.2010.5457186
keyword:
- System testing
- Automatic testing
- Object oriented modeling
- Classification tree analysis
- Automotive engineering
- Mathematical model
- Embedded system
- Control systems
- Electronic equipment testing
- Software testing
language:
- iso: eng
place: Dresden
publication: Proceedings of DATE’10
publisher: IEEE
status: public
title: A Systematic Approach to Combined HW/SW System Test
type: conference
user_id: '5786'
year: '2010'
...
---
_id: '2353'
abstract:
- lang: eng
text: 'Wireless Sensor Networks (WSNs) are unique embedded computation systems for
distributed sensing of a dispersed phenomenon. While being a strongly concurrent
distributed system, its embedded aspects with severe resource limitations and
the wireless communication requires a fusion of technologies and methodologies
from very different fields. As WSNs are deployed in remote locations for long-term
unattended operation, assurance of correct functioning of the system is of prime
concern. Thus, the design and development of WSNs requires specialized tools to
allow for testing and debugging the system. To this end, we present a framework
for analyzing and checking WSNs based on collected events during system operation.
It allows for abstracting from the event trace by means of behavioral queries
and uses assertions for checking the accordance of an execution to its specification.
The framework is independent from WSN test platforms, applications and logging
semantics and thus generally applicable for analyzing event logs of WSN test executions. '
author:
- first_name: Matthias
full_name: Woehrle, Matthias
last_name: Woehrle
- first_name: Christian
full_name: Plessl, Christian
id: '16153'
last_name: Plessl
orcid: 0000-0001-5728-9982
- first_name: Lothar
full_name: Thiele, Lothar
last_name: Thiele
citation:
ama: 'Woehrle M, Plessl C, Thiele L. Rupeas: Ruby Powered Event Analysis DSL.
Computer Engineering and Networks Lab, ETH Zurich; 2009.'
apa: 'Woehrle, M., Plessl, C., & Thiele, L. (2009). Rupeas: Ruby Powered
Event Analysis DSL. Computer Engineering and Networks Lab, ETH Zurich.'
bibtex: '@book{Woehrle_Plessl_Thiele_2009, place={Computer Engineering and Networks
Lab, ETH Zurich}, title={Rupeas: Ruby Powered Event Analysis DSL}, author={Woehrle,
Matthias and Plessl, Christian and Thiele, Lothar}, year={2009} }'
chicago: 'Woehrle, Matthias, Christian Plessl, and Lothar Thiele. Rupeas: Ruby
Powered Event Analysis DSL. Computer Engineering and Networks Lab, ETH Zurich,
2009.'
ieee: 'M. Woehrle, C. Plessl, and L. Thiele, Rupeas: Ruby Powered Event Analysis
DSL. Computer Engineering and Networks Lab, ETH Zurich, 2009.'
mla: 'Woehrle, Matthias, et al. Rupeas: Ruby Powered Event Analysis DSL.
2009.'
short: 'M. Woehrle, C. Plessl, L. Thiele, Rupeas: Ruby Powered Event Analysis DSL,
Computer Engineering and Networks Lab, ETH Zurich, 2009.'
date_created: 2018-04-16T15:09:19Z
date_updated: 2022-01-06T06:55:56Z
department:
- _id: '27'
- _id: '518'
extern: '1'
keyword:
- Rupeas
- DSL
- WSN
- testing
language:
- iso: eng
place: Computer Engineering and Networks Lab, ETH Zurich
report_number: TIK-Report 290
status: public
title: 'Rupeas: Ruby Powered Event Analysis DSL'
type: report
user_id: '16153'
year: '2009'
...
---
_id: '2370'
author:
- first_name: Matthias
full_name: Woehrle, Matthias
last_name: Woehrle
- first_name: Christian
full_name: Plessl, Christian
id: '16153'
last_name: Plessl
orcid: 0000-0001-5728-9982
- first_name: Roman
full_name: Lim, Roman
last_name: Lim
- first_name: Jan
full_name: Beutel, Jan
last_name: Beutel
- first_name: Lothar
full_name: Thiele, Lothar
last_name: Thiele
citation:
ama: 'Woehrle M, Plessl C, Lim R, Beutel J, Thiele L. EvAnT: Analysis and Checking
of event traces for Wireless Sensor Networks. In: IEEE Int. Conf. on Sensor
Networks, Ubiquitous, and Trustworthy Computing (SUTC). IEEE Computer Society;
2008:201-208. doi:10.1109/SUTC.2008.24'
apa: 'Woehrle, M., Plessl, C., Lim, R., Beutel, J., & Thiele, L. (2008). EvAnT:
Analysis and Checking of event traces for Wireless Sensor Networks. IEEE Int.
Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC), 201–208.
https://doi.org/10.1109/SUTC.2008.24'
bibtex: '@inproceedings{Woehrle_Plessl_Lim_Beutel_Thiele_2008, place={Los Alamitos,
CA, USA}, title={EvAnT: Analysis and Checking of event traces for Wireless Sensor
Networks}, DOI={10.1109/SUTC.2008.24},
booktitle={IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing
(SUTC)}, publisher={IEEE Computer Society}, author={Woehrle, Matthias and Plessl,
Christian and Lim, Roman and Beutel, Jan and Thiele, Lothar}, year={2008}, pages={201–208}
}'
chicago: 'Woehrle, Matthias, Christian Plessl, Roman Lim, Jan Beutel, and Lothar
Thiele. “EvAnT: Analysis and Checking of Event Traces for Wireless Sensor Networks.”
In IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing
(SUTC), 201–8. Los Alamitos, CA, USA: IEEE Computer Society, 2008. https://doi.org/10.1109/SUTC.2008.24.'
ieee: 'M. Woehrle, C. Plessl, R. Lim, J. Beutel, and L. Thiele, “EvAnT: Analysis
and Checking of event traces for Wireless Sensor Networks,” in IEEE Int. Conf.
on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC), 2008, pp.
201–208, doi: 10.1109/SUTC.2008.24.'
mla: 'Woehrle, Matthias, et al. “EvAnT: Analysis and Checking of Event Traces for
Wireless Sensor Networks.” IEEE Int. Conf. on Sensor Networks, Ubiquitous,
and Trustworthy Computing (SUTC), IEEE Computer Society, 2008, pp. 201–08,
doi:10.1109/SUTC.2008.24.'
short: 'M. Woehrle, C. Plessl, R. Lim, J. Beutel, L. Thiele, in: IEEE Int. Conf.
on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC), IEEE Computer
Society, Los Alamitos, CA, USA, 2008, pp. 201–208.'
date_created: 2018-04-17T12:03:20Z
date_updated: 2023-09-26T13:55:02Z
department:
- _id: '27'
- _id: '518'
doi: 10.1109/SUTC.2008.24
keyword:
- WSN
- testing
- verification
language:
- iso: eng
page: 201-208
place: Los Alamitos, CA, USA
publication: IEEE Int. Conf. on Sensor Networks, Ubiquitous, and Trustworthy Computing
(SUTC)
publication_identifier:
isbn:
- 978-0-7695-3158-8
publisher: IEEE Computer Society
quality_controlled: '1'
status: public
title: 'EvAnT: Analysis and Checking of event traces for Wireless Sensor Networks'
type: conference
user_id: '15278'
year: '2008'
...
---
_id: '2392'
author:
- first_name: Matthias
full_name: Woehrle, Matthias
last_name: Woehrle
- first_name: Christian
full_name: Plessl, Christian
id: '16153'
last_name: Plessl
orcid: 0000-0001-5728-9982
- first_name: Jan
full_name: Beutel, Jan
last_name: Beutel
- first_name: Lothar
full_name: Thiele, Lothar
last_name: Thiele
citation:
ama: 'Woehrle M, Plessl C, Beutel J, Thiele L. Increasing the Reliability of Wireless
Sensor Networks with a Distributed Testing Framework. In: Proc. Workshop on
Embedded Networked Sensors (EmNets). ACM; 2007:93-97. doi:10.1145/1278972.1278996'
apa: Woehrle, M., Plessl, C., Beutel, J., & Thiele, L. (2007). Increasing the
Reliability of Wireless Sensor Networks with a Distributed Testing Framework.
Proc. Workshop on Embedded Networked Sensors (EmNets), 93–97. https://doi.org/10.1145/1278972.1278996
bibtex: '@inproceedings{Woehrle_Plessl_Beutel_Thiele_2007, place={New York, NY,
USA}, title={Increasing the Reliability of Wireless Sensor Networks with a Distributed
Testing Framework}, DOI={10.1145/1278972.1278996},
booktitle={Proc. Workshop on Embedded Networked Sensors (EmNets)}, publisher={ACM},
author={Woehrle, Matthias and Plessl, Christian and Beutel, Jan and Thiele, Lothar},
year={2007}, pages={93–97} }'
chicago: 'Woehrle, Matthias, Christian Plessl, Jan Beutel, and Lothar Thiele. “Increasing
the Reliability of Wireless Sensor Networks with a Distributed Testing Framework.”
In Proc. Workshop on Embedded Networked Sensors (EmNets), 93–97. New York,
NY, USA: ACM, 2007. https://doi.org/10.1145/1278972.1278996.'
ieee: 'M. Woehrle, C. Plessl, J. Beutel, and L. Thiele, “Increasing the Reliability
of Wireless Sensor Networks with a Distributed Testing Framework,” in Proc.
Workshop on Embedded Networked Sensors (EmNets), 2007, pp. 93–97, doi: 10.1145/1278972.1278996.'
mla: Woehrle, Matthias, et al. “Increasing the Reliability of Wireless Sensor Networks
with a Distributed Testing Framework.” Proc. Workshop on Embedded Networked
Sensors (EmNets), ACM, 2007, pp. 93–97, doi:10.1145/1278972.1278996.
short: 'M. Woehrle, C. Plessl, J. Beutel, L. Thiele, in: Proc. Workshop on Embedded
Networked Sensors (EmNets), ACM, New York, NY, USA, 2007, pp. 93–97.'
date_created: 2018-04-17T13:34:42Z
date_updated: 2023-09-26T14:00:38Z
department:
- _id: '27'
- _id: '518'
doi: 10.1145/1278972.1278996
keyword:
- WSN
- testing
- distributed
- embedded
language:
- iso: eng
page: 93-97
place: New York, NY, USA
publication: Proc. Workshop on Embedded Networked Sensors (EmNets)
publication_identifier:
isbn:
- 978-1-59593-694-3
publisher: ACM
quality_controlled: '1'
status: public
title: Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing
Framework
type: conference
user_id: '15278'
year: '2007'
...
---
_id: '2393'
author:
- first_name: Jan
full_name: Beutel, Jan
last_name: Beutel
- first_name: Matthias
full_name: Dyer, Matthias
last_name: Dyer
- first_name: Roman
full_name: Lim, Roman
last_name: Lim
- first_name: Christian
full_name: Plessl, Christian
id: '16153'
last_name: Plessl
orcid: 0000-0001-5728-9982
- first_name: Matthias
full_name: Woehrle, Matthias
last_name: Woehrle
- first_name: Mustafa
full_name: Yuecel, Mustafa
last_name: Yuecel
- first_name: Lothar
full_name: Thiele, Lothar
last_name: Thiele
citation:
ama: 'Beutel J, Dyer M, Lim R, et al. Automated Wireless Sensor Network Testing.
In: Proc. Int. Conf. Networked Sensing Systems (INSS). IEEE; 2007:303-303.
doi:10.1109/INSS.2007.4297445'
apa: Beutel, J., Dyer, M., Lim, R., Plessl, C., Woehrle, M., Yuecel, M., & Thiele,
L. (2007). Automated Wireless Sensor Network Testing. Proc. Int. Conf. Networked
Sensing Systems (INSS), 303–303. https://doi.org/10.1109/INSS.2007.4297445
bibtex: '@inproceedings{Beutel_Dyer_Lim_Plessl_Woehrle_Yuecel_Thiele_2007, place={Piscataway,
NJ, USA}, title={Automated Wireless Sensor Network Testing}, DOI={10.1109/INSS.2007.4297445},
booktitle={Proc. Int. Conf. Networked Sensing Systems (INSS)}, publisher={IEEE},
author={Beutel, Jan and Dyer, Matthias and Lim, Roman and Plessl, Christian and
Woehrle, Matthias and Yuecel, Mustafa and Thiele, Lothar}, year={2007}, pages={303–303}
}'
chicago: 'Beutel, Jan, Matthias Dyer, Roman Lim, Christian Plessl, Matthias Woehrle,
Mustafa Yuecel, and Lothar Thiele. “Automated Wireless Sensor Network Testing.”
In Proc. Int. Conf. Networked Sensing Systems (INSS), 303–303. Piscataway,
NJ, USA: IEEE, 2007. https://doi.org/10.1109/INSS.2007.4297445.'
ieee: 'J. Beutel et al., “Automated Wireless Sensor Network Testing,” in
Proc. Int. Conf. Networked Sensing Systems (INSS), 2007, pp. 303–303, doi:
10.1109/INSS.2007.4297445.'
mla: Beutel, Jan, et al. “Automated Wireless Sensor Network Testing.” Proc. Int.
Conf. Networked Sensing Systems (INSS), IEEE, 2007, pp. 303–303, doi:10.1109/INSS.2007.4297445.
short: 'J. Beutel, M. Dyer, R. Lim, C. Plessl, M. Woehrle, M. Yuecel, L. Thiele,
in: Proc. Int. Conf. Networked Sensing Systems (INSS), IEEE, Piscataway, NJ, USA,
2007, pp. 303–303.'
date_created: 2018-04-17T13:35:55Z
date_updated: 2023-09-26T14:00:58Z
department:
- _id: '27'
- _id: '518'
doi: 10.1109/INSS.2007.4297445
keyword:
- WSN
- testing
- verification
language:
- iso: eng
page: 303-303
place: Piscataway, NJ, USA
publication: Proc. Int. Conf. Networked Sensing Systems (INSS)
publication_identifier:
isbn:
- 1-4244-1231-5
publisher: IEEE
quality_controlled: '1'
status: public
title: Automated Wireless Sensor Network Testing
type: conference
user_id: '15278'
year: '2007'
...
---
_id: '38784'
abstract:
- lang: eng
text: This article presents the classification tree method for functional verification
to close the gap from the specification of a test plan to SystemVerilog (Chandra
and Chakrabarty, 2001) test bench generation. Our method supports the systematic
development of test configurations and is based on the classification tree method
for embedded systems (CTM/ES) (Chakrabarty et al., 2000) extending CTM/ES for
random test generation as well as for functional coverage and property specification
author:
- first_name: Alexander
full_name: Krupp, Alexander
last_name: Krupp
- first_name: Wolfgang
full_name: Müller, Wolfgang
id: '16243'
last_name: Müller
citation:
ama: 'Krupp A, Müller W. Classification Trees for Functional Coverage and Random
Test Generation. In: Proceedings of the Design Automation & Test in Europe
Conference. IEEE; 2006. doi:10.1109/DATE.2006.243902'
apa: Krupp, A., & Müller, W. (2006). Classification Trees for Functional Coverage
and Random Test Generation. Proceedings of the Design Automation & Test
in Europe Conference. https://doi.org/10.1109/DATE.2006.243902
bibtex: '@inproceedings{Krupp_Müller_2006, place={Munich, Germany}, title={Classification
Trees for Functional Coverage and Random Test Generation}, DOI={10.1109/DATE.2006.243902},
booktitle={Proceedings of the Design Automation & Test in Europe Conference},
publisher={IEEE}, author={Krupp, Alexander and Müller, Wolfgang}, year={2006}
}'
chicago: 'Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional
Coverage and Random Test Generation.” In Proceedings of the Design Automation
& Test in Europe Conference. Munich, Germany: IEEE, 2006. https://doi.org/10.1109/DATE.2006.243902.'
ieee: 'A. Krupp and W. Müller, “Classification Trees for Functional Coverage and
Random Test Generation,” 2006, doi: 10.1109/DATE.2006.243902.'
mla: Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional
Coverage and Random Test Generation.” Proceedings of the Design Automation
& Test in Europe Conference, IEEE, 2006, doi:10.1109/DATE.2006.243902.
short: 'A. Krupp, W. Müller, in: Proceedings of the Design Automation & Test
in Europe Conference, IEEE, Munich, Germany, 2006.'
date_created: 2023-01-24T08:06:09Z
date_updated: 2023-01-24T08:06:14Z
department:
- _id: '672'
doi: 10.1109/DATE.2006.243902
keyword:
- Classification tree analysis
- System testing
- Embedded system
- Safety
- Automatic testing
- Automation
language:
- iso: eng
place: Munich, Germany
publication: Proceedings of the Design Automation & Test in Europe Conference
publication_identifier:
isbn:
- 3-9810801-1-4
publisher: IEEE
status: public
title: Classification Trees for Functional Coverage and Random Test Generation
type: conference
user_id: '5786'
year: '2006'
...
---
_id: '38107'
abstract:
- lang: eng
text: TestML is an XML-based language for the exchange of test descriptions in automotive
systems design and mainly introduced through the structural definition of an XML
schema as an independent exchange format for existing tools and methods covering
a wide range of different test technologies. In this paper, we present a rigorous
formal behavioral semantics for TestML by means of Abstract State Machines (ASMs).
Our semantics is a concise, unambiguous, high-level specification for TestML-based
implementations and serves as a basis to define exact and well-defined mappings
between existing test languages and TestML.
author:
- first_name: Jürgen
full_name: Großmann, Jürgen
last_name: Großmann
- first_name: Wolfgang
full_name: Müller, Wolfgang
id: '16243'
last_name: Müller
citation:
ama: 'Großmann J, Müller W. A Formal Behavioral Semantics for TestML. In: Proc.
of ISOLA 06. ; 2006. doi:10.1109/ISoLA.2006.37'
apa: Großmann, J., & Müller, W. (2006). A Formal Behavioral Semantics for TestML.
Proc. of ISOLA 06. https://doi.org/10.1109/ISoLA.2006.37
bibtex: '@inproceedings{Großmann_Müller_2006, place={Paphos, Cyprus}, title={A Formal
Behavioral Semantics for TestML}, DOI={10.1109/ISoLA.2006.37},
booktitle={Proc. of ISOLA 06}, author={Großmann, Jürgen and Müller, Wolfgang},
year={2006} }'
chicago: Großmann, Jürgen, and Wolfgang Müller. “A Formal Behavioral Semantics for
TestML.” In Proc. of ISOLA 06. Paphos, Cyprus, 2006. https://doi.org/10.1109/ISoLA.2006.37.
ieee: 'J. Großmann and W. Müller, “A Formal Behavioral Semantics for TestML,” Paphos,
Cyprus, 2006, doi: 10.1109/ISoLA.2006.37.'
mla: Großmann, Jürgen, and Wolfgang Müller. “A Formal Behavioral Semantics for TestML.”
Proc. of ISOLA 06, 2006, doi:10.1109/ISoLA.2006.37.
short: 'J. Großmann, W. Müller, in: Proc. of ISOLA 06, Paphos, Cyprus, 2006.'
conference:
location: Paphos, Cyprus
date_created: 2023-01-23T12:00:06Z
date_updated: 2023-01-23T12:06:26Z
department:
- _id: '672'
doi: 10.1109/ISoLA.2006.37
keyword:
- System testing
- Software testing
- Automotive engineering
- Automatic testing
- Machinery production industries
- Protocols
- Hardware design languages
- Samarium
- XML
- Computer industry
language:
- iso: eng
place: Paphos, Cyprus
publication: Proc. of ISOLA 06
publication_identifier:
isbn:
- 978-0-7695-3071-0
status: public
title: A Formal Behavioral Semantics for TestML
type: conference
user_id: '5786'
year: '2006'
...