---
_id: '9968'
abstract:
- lang: eng
  text: To increase quality and reliability of copper wire bonds, self-optimization
    is a promising technique. For the implementation of self-optimization for ultrasonic
    heavy copper wire bonding machines, a model of stick-slip motion between tool
    and wire and between wire and substrate during the bonding process is essential.
    Investigations confirm that both of these contacts do indeed show stick-slip movement
    in each period oscillation. In a first step, this paper shows the importance of
    modeling the stick-slip effect by determining, monitoring and analyzing amplitudes
    and phase angles of tooltip, wire and substrate experimentally during bonding
    via laser measurements. In a second step, the paper presents a dynamic model which
    has been parameterized using an iterative numerical parameter identification method.
    This model includes Archard’s wear approach in order to compute the lost volume
    of tool tip due to wear over the entire process time. A validation of the model
    by comparing measured and calculated amplitudes of tool tip and wire reveals high
    model quality. Then it is then possible to calculate the lifetime of the tool
    for different process parameters, i.e. values of normal force and ultrasonic voltage.
author:
- first_name: Andreas
  full_name: Unger, Andreas
  last_name: Unger
- first_name: Reinhard
  full_name: Schemmel, Reinhard
  id: '28647'
  last_name: Schemmel
- first_name: Tobias
  full_name: Meyer, Tobias
  last_name: Meyer
- first_name: Florian
  full_name: Eacock, Florian
  last_name: Eacock
- first_name: Paul
  full_name: Eichwald, Paul
  last_name: Eichwald
- first_name: Simon
  full_name: Althoff, Simon
  last_name: Althoff
- first_name: Walter
  full_name: Sextro, Walter
  id: '21220'
  last_name: Sextro
- first_name: Michael
  full_name: Brökelmann, Michael
  last_name: Brökelmann
- first_name: Matthias
  full_name: Hunstig, Matthias
  last_name: Hunstig
- first_name: Karsten
  full_name: Guth, Karsten
  last_name: Guth
citation:
  ama: 'Unger A, Schemmel R, Meyer T, et al. Validated Simulation of the Ultrasonic
    Wire Bonding Process. In: <i>Wear Modeling in Copper Wire Wedge Bonding. IEEE
    CPMT Symposium Japan, 2016</i>. IEEE CPMT Symposium Japan; 2016:251-254.'
  apa: Unger, A., Schemmel, R., Meyer, T., Eacock, F., Eichwald, P., Althoff, S.,
    … Guth, K. (2016). Validated Simulation of the Ultrasonic Wire Bonding Process.
    In <i>Wear Modeling in Copper Wire Wedge Bonding. IEEE CPMT Symposium Japan, 2016</i>
    (pp. 251–254). IEEE CPMT Symposium Japan.
  bibtex: '@inproceedings{Unger_Schemmel_Meyer_Eacock_Eichwald_Althoff_Sextro_Brökelmann_Hunstig_Guth_2016,
    place={IEEE CPMT Symposium Japan}, title={Validated Simulation of the Ultrasonic
    Wire Bonding Process}, booktitle={Wear Modeling in Copper Wire Wedge Bonding.
    IEEE CPMT Symposium Japan, 2016}, author={Unger, Andreas and Schemmel, Reinhard
    and Meyer, Tobias and Eacock, Florian and Eichwald, Paul and Althoff, Simon and
    Sextro, Walter and Brökelmann, Michael and Hunstig, Matthias and Guth, Karsten},
    year={2016}, pages={251–254} }'
  chicago: Unger, Andreas, Reinhard Schemmel, Tobias Meyer, Florian Eacock, Paul Eichwald,
    Simon Althoff, Walter Sextro, Michael Brökelmann, Matthias Hunstig, and Karsten
    Guth. “Validated Simulation of the Ultrasonic Wire Bonding Process.” In <i>Wear
    Modeling in Copper Wire Wedge Bonding. IEEE CPMT Symposium Japan, 2016</i>, 251–54.
    IEEE CPMT Symposium Japan, 2016.
  ieee: A. Unger <i>et al.</i>, “Validated Simulation of the Ultrasonic Wire Bonding
    Process,” in <i>Wear Modeling in Copper Wire Wedge Bonding. IEEE CPMT Symposium
    Japan, 2016</i>, 2016, pp. 251–254.
  mla: Unger, Andreas, et al. “Validated Simulation of the Ultrasonic Wire Bonding
    Process.” <i>Wear Modeling in Copper Wire Wedge Bonding. IEEE CPMT Symposium Japan,
    2016</i>, 2016, pp. 251–54.
  short: 'A. Unger, R. Schemmel, T. Meyer, F. Eacock, P. Eichwald, S. Althoff, W.
    Sextro, M. Brökelmann, M. Hunstig, K. Guth, in: Wear Modeling in Copper Wire Wedge
    Bonding. IEEE CPMT Symposium Japan, 2016, IEEE CPMT Symposium Japan, 2016, pp.
    251–254.'
date_created: 2019-05-27T09:20:10Z
date_updated: 2020-05-07T05:33:53Z
department:
- _id: '151'
keyword:
- the Ultrasonic Wire Bonding Process
language:
- iso: eng
page: 251-254
place: IEEE CPMT Symposium Japan
project:
- _id: '92'
  grant_number: 02 PQ2210
  name: Intelligente Herstellung zuverlässiger Kupferbondverbindungen
publication: Wear Modeling in Copper Wire Wedge Bonding. IEEE CPMT Symposium Japan,
  2016
quality_controlled: '1'
status: public
title: Validated Simulation of the Ultrasonic Wire Bonding Process
type: conference
user_id: '210'
year: '2016'
...