[{"publisher":"35. Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\" (TuZ'23), Feb. 2023","date_updated":"2023-04-06T21:06:37Z","date_created":"2023-01-04T10:20:41Z","author":[{"full_name":"Ghazal, Abdulkarim","last_name":"Ghazal","first_name":"Abdulkarim"},{"first_name":"Somayeh","last_name":"Sadeghi-Kohan","id":"78614","full_name":"Sadeghi-Kohan, Somayeh"},{"first_name":"Jan Dennis","full_name":"Reimer, Jan Dennis","id":"36703","last_name":"Reimer"},{"last_name":"Hellebrand","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","id":"209","first_name":"Sybille"}],"title":"On Cryptography Effects on Interconnect Reliability","place":"Erfurt, Germany","year":"2023","page":"2","citation":{"apa":"Ghazal, A., Sadeghi-Kohan, S., Reimer, J. D., &#38; Hellebrand, S. (2023). <i>On Cryptography Effects on Interconnect Reliability</i>. 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023.","bibtex":"@book{Ghazal_Sadeghi-Kohan_Reimer_Hellebrand_2023, place={Erfurt, Germany}, title={On Cryptography Effects on Interconnect Reliability}, publisher={35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023}, author={Ghazal, Abdulkarim and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}, year={2023} }","short":"A. Ghazal, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, On Cryptography Effects on Interconnect Reliability, 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, Erfurt, Germany, 2023.","mla":"Ghazal, Abdulkarim, et al. <i>On Cryptography Effects on Interconnect Reliability</i>. 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, 2023.","ama":"Ghazal A, Sadeghi-Kohan S, Reimer JD, Hellebrand S. <i>On Cryptography Effects on Interconnect Reliability</i>. 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023; 2023.","chicago":"Ghazal, Abdulkarim, Somayeh Sadeghi-Kohan, Jan Dennis Reimer, and Sybille Hellebrand. <i>On Cryptography Effects on Interconnect Reliability</i>. Erfurt, Germany: 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, 2023.","ieee":"A. Ghazal, S. Sadeghi-Kohan, J. D. Reimer, and S. Hellebrand, <i>On Cryptography Effects on Interconnect Reliability</i>. Erfurt, Germany: 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, 2023."},"_id":"35204","department":[{"_id":"48"}],"user_id":"36703","keyword":["WORKSHOP"],"language":[{"iso":"eng"}],"type":"misc","status":"public"},{"author":[{"last_name":"Sadeghi-Kohan","full_name":"Sadeghi-Kohan, Somayeh","id":"78614","first_name":"Somayeh"},{"id":"209","full_name":"Hellebrand, Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","first_name":"Sybille"},{"last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim"}],"date_created":"2022-02-19T14:21:24Z","publisher":"European Workshop on Silicon Lifecycle Management, March 18, 2022","date_updated":"2022-05-11T17:07:24Z","title":"EM-Aware Interconnect BIST","publication_status":"published","citation":{"ieee":"S. Sadeghi-Kohan, S. Hellebrand, and H.-J. Wunderlich, <i>EM-Aware Interconnect BIST</i>. Online: European Workshop on Silicon Lifecycle Management, March 18, 2022, 2022.","chicago":"Sadeghi-Kohan, Somayeh, Sybille Hellebrand, and Hans-Joachim Wunderlich. <i>EM-Aware Interconnect BIST</i>. Online: European Workshop on Silicon Lifecycle Management, March 18, 2022, 2022.","ama":"Sadeghi-Kohan S, Hellebrand S, Wunderlich H-J. <i>EM-Aware Interconnect BIST</i>. European Workshop on Silicon Lifecycle Management, March 18, 2022; 2022.","short":"S. Sadeghi-Kohan, S. Hellebrand, H.-J. Wunderlich, EM-Aware Interconnect BIST, European Workshop on Silicon Lifecycle Management, March 18, 2022, Online, 2022.","mla":"Sadeghi-Kohan, Somayeh, et al. <i>EM-Aware Interconnect BIST</i>. European Workshop on Silicon Lifecycle Management, March 18, 2022, 2022.","bibtex":"@book{Sadeghi-Kohan_Hellebrand_Wunderlich_2022, place={Online}, title={EM-Aware Interconnect BIST}, publisher={European Workshop on Silicon Lifecycle Management, March 18, 2022}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2022} }","apa":"Sadeghi-Kohan, S., Hellebrand, S., &#38; Wunderlich, H.-J. (2022). <i>EM-Aware Interconnect BIST</i>. European Workshop on Silicon Lifecycle Management, March 18, 2022."},"page":"2","year":"2022","place":"Online","user_id":"209","department":[{"_id":"48"}],"_id":"29890","language":[{"iso":"eng"}],"keyword":["WORKSHOP"],"type":"misc","status":"public"},{"quality_controlled":"1","year":"2022","date_created":"2022-10-27T13:20:22Z","title":"Supporting Business Model Generation with Augmented Reality","publication":"LUT Scientific and Expertise Publications","abstract":[{"lang":"eng","text":"Workshops on business model generation lead to collaborative work phases and discussions on business models. Therefore, tools such as the Business Model Canvas are used, typically filled with sticky notes. Generated content needs to be digitized in a time-consuming manual follow-up as part of the documentation and basis for a further use of the results in the company. In addition, there are challenges, such as decentralized work and digital workshop formats. Augmented Reality offers a way to reduce the digitization effort and enables decentralized work. In this research, the potentials of the use of AR technology in workshops on business model generation is investigated. Therefore, functions are implemented and evaluated in a demonstrator that reduces digitization effort and enable distributed work."}],"language":[{"iso":"eng"}],"ddc":["620"],"keyword":["business model generation","augmented reality","workshop","collaborative work","digitization","AR-supported workshop concept","immersive technologies","decentralized work","business model canvas"],"publication_status":"published","has_accepted_license":"1","publication_identifier":{"unknown":["978-952-335-694-8"]},"citation":{"chicago":"Gräßler, Iris, Benedikt Grewe, and Hendrik Kramer. “Supporting Business Model Generation with Augmented Reality.” In <i>LUT Scientific and Expertise Publications</i>. Manchester, 2022.","ieee":"I. Gräßler, B. Grewe, and H. Kramer, “Supporting Business Model Generation with Augmented Reality,” presented at the 33. ISPIM Innovation Conference “Innovating in a Digital World,” Copenhagen, 2022.","ama":"Gräßler I, Grewe B, Kramer H. Supporting Business Model Generation with Augmented Reality. In: <i>LUT Scientific and Expertise Publications</i>. ; 2022.","apa":"Gräßler, I., Grewe, B., &#38; Kramer, H. (2022). Supporting Business Model Generation with Augmented Reality. <i>LUT Scientific and Expertise Publications</i>. 33. ISPIM Innovation Conference “Innovating in a Digital World,” Copenhagen.","short":"I. Gräßler, B. Grewe, H. Kramer, in: LUT Scientific and Expertise Publications, Manchester, 2022.","mla":"Gräßler, Iris, et al. “Supporting Business Model Generation with Augmented Reality.” <i>LUT Scientific and Expertise Publications</i>, 2022.","bibtex":"@inproceedings{Gräßler_Grewe_Kramer_2022, place={Manchester}, title={Supporting Business Model Generation with Augmented Reality}, booktitle={LUT Scientific and Expertise Publications}, author={Gräßler, Iris and Grewe, Benedikt and Kramer, Hendrik}, year={2022} }"},"place":"Manchester","author":[{"first_name":"Iris","full_name":"Gräßler, Iris","id":"47565","orcid":"0000-0001-5765-971X","last_name":"Gräßler"},{"id":"52359","full_name":"Grewe, Benedikt","last_name":"Grewe","first_name":"Benedikt"},{"full_name":"Kramer, Hendrik","last_name":"Kramer","first_name":"Hendrik"}],"date_updated":"2022-10-27T13:29:49Z","conference":{"end_date":"2022-06-08","location":"Copenhagen","name":"33. ISPIM Innovation Conference \"Innovating in a Digital World\"","start_date":"2022-06-05"},"type":"conference","status":"public","user_id":"52359","department":[{"_id":"152"}],"_id":"33914"},{"status":"public","type":"misc","keyword":["WORKSHOP"],"language":[{"iso":"eng"}],"_id":"15419","user_id":"209","department":[{"_id":"48"}],"place":"Ludwigsburg","year":"2020","citation":{"ama":"Sadeghi-Kohan S, Hellebrand S. <i>Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects</i>. 32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020; 2020.","ieee":"S. Sadeghi-Kohan and S. Hellebrand, <i>Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects</i>. Ludwigsburg: 32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020, 2020.","chicago":"Sadeghi-Kohan, Somayeh, and Sybille Hellebrand. <i>Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects</i>. Ludwigsburg: 32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020, 2020.","apa":"Sadeghi-Kohan, S., &#38; Hellebrand, S. (2020). <i>Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects</i>. 32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020.","short":"S. Sadeghi-Kohan, S. Hellebrand, Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects, 32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020, Ludwigsburg, 2020.","bibtex":"@book{Sadeghi-Kohan_Hellebrand_2020, place={Ludwigsburg}, title={Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects}, publisher={32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}, year={2020} }","mla":"Sadeghi-Kohan, Somayeh, and Sybille Hellebrand. <i>Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects</i>. 32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020, 2020."},"page":"4","publication_status":"published","title":"Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects","date_updated":"2022-04-04T12:30:02Z","publisher":"32. Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\" (TuZ'20), 16. - 18. Februar 2020","date_created":"2019-12-29T16:13:58Z","author":[{"first_name":"Somayeh","last_name":"Sadeghi-Kohan","id":"78614","full_name":"Sadeghi-Kohan, Somayeh"},{"first_name":"Sybille","id":"209","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand"}]},{"type":"misc","status":"public","user_id":"209","department":[{"_id":"48"}],"_id":"8112","language":[{"iso":"eng"}],"keyword":["WORKSHOP"],"citation":{"apa":"Maaz, M. U., Sprenger, A., &#38; Hellebrand, S. (2019). <i>A Hybrid Space Compactor for Varying X-Rates</i>. Prien am Chiemsee: 31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19).","bibtex":"@book{Maaz_Sprenger_Hellebrand_2019, place={Prien am Chiemsee}, title={A Hybrid Space Compactor for Varying X-Rates}, publisher={31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19)}, author={Maaz, Mohammad Urf and Sprenger, Alexander and Hellebrand, Sybille}, year={2019} }","short":"M.U. Maaz, A. Sprenger, S. Hellebrand, A Hybrid Space Compactor for Varying X-Rates, 31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19), Prien am Chiemsee, 2019.","mla":"Maaz, Mohammad Urf, et al. <i>A Hybrid Space Compactor for Varying X-Rates</i>. 31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19), 2019.","chicago":"Maaz, Mohammad Urf, Alexander Sprenger, and Sybille Hellebrand. <i>A Hybrid Space Compactor for Varying X-Rates</i>. Prien am Chiemsee: 31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19), 2019.","ieee":"M. U. Maaz, A. Sprenger, and S. Hellebrand, <i>A Hybrid Space Compactor for Varying X-Rates</i>. Prien am Chiemsee: 31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19), 2019.","ama":"Maaz MU, Sprenger A, Hellebrand S. <i>A Hybrid Space Compactor for Varying X-Rates</i>. Prien am Chiemsee: 31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19); 2019."},"place":"Prien am Chiemsee","year":"2019","author":[{"first_name":"Mohammad Urf","id":"49274","full_name":"Maaz, Mohammad Urf","last_name":"Maaz"},{"first_name":"Alexander","last_name":"Sprenger","full_name":"Sprenger, Alexander","id":"22707"},{"first_name":"Sybille","id":"209","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand"}],"date_created":"2019-02-26T15:11:02Z","publisher":"31. Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\" (TuZ'19)","date_updated":"2022-01-06T07:03:51Z","title":"A Hybrid Space Compactor for Varying X-Rates"},{"citation":{"chicago":"Sprenger, Alexander, and Sybille Hellebrand. <i>Stochastische Kompaktierung für den Hochgeschwindigkeitstest</i>. Freiburg, Germany: 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18), 2018.","ieee":"A. Sprenger and S. Hellebrand, <i>Stochastische Kompaktierung für den Hochgeschwindigkeitstest</i>. Freiburg, Germany: 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18), 2018.","ama":"Sprenger A, Hellebrand S. <i>Stochastische Kompaktierung für den Hochgeschwindigkeitstest</i>. Freiburg, Germany: 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18); 2018.","bibtex":"@book{Sprenger_Hellebrand_2018, place={Freiburg, Germany}, title={Stochastische Kompaktierung für den Hochgeschwindigkeitstest}, publisher={30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18)}, author={Sprenger, Alexander and Hellebrand, Sybille}, year={2018} }","short":"A. Sprenger, S. Hellebrand, Stochastische Kompaktierung für den Hochgeschwindigkeitstest, 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18), Freiburg, Germany, 2018.","mla":"Sprenger, Alexander, and Sybille Hellebrand. <i>Stochastische Kompaktierung für den Hochgeschwindigkeitstest</i>. 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18), 2018.","apa":"Sprenger, A., &#38; Hellebrand, S. (2018). <i>Stochastische Kompaktierung für den Hochgeschwindigkeitstest</i>. Freiburg, Germany: 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18)."},"year":"2018","place":"Freiburg, Germany","title":"Stochastische Kompaktierung für den Hochgeschwindigkeitstest","author":[{"first_name":"Alexander","last_name":"Sprenger","full_name":"Sprenger, Alexander","id":"22707"},{"first_name":"Sybille","full_name":"Hellebrand, Sybille","id":"209","orcid":"0000-0002-3717-3939","last_name":"Hellebrand"}],"date_created":"2018-10-02T12:29:44Z","publisher":"30. Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\" (TuZ'18)","date_updated":"2022-01-06T07:01:13Z","status":"public","type":"misc","language":[{"iso":"ger"}],"keyword":["WORKSHOP"],"department":[{"_id":"48"}],"user_id":"22707","_id":"4576"},{"type":"misc","status":"public","user_id":"659","department":[{"_id":"48"}],"_id":"13072","language":[{"iso":"eng"}],"keyword":["WORKSHOP"],"citation":{"chicago":"Kampmann, Matthias, and Sybille Hellebrand. <i>Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test</i>. 19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China, 2018.","ieee":"M. Kampmann and S. Hellebrand, <i>Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test</i>. 19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China, 2018.","ama":"Kampmann M, Hellebrand S. <i>Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test</i>. 19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China; 2018.","mla":"Kampmann, Matthias, and Sybille Hellebrand. <i>Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test</i>. 2018.","bibtex":"@book{Kampmann_Hellebrand_2018, place={19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China}, title={Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2018} }","short":"M. Kampmann, S. Hellebrand, Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test, 19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China, 2018.","apa":"Kampmann, M., &#38; Hellebrand, S. (2018). <i>Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test</i>. 19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China."},"place":"19th Workshop on RTL and High Level Testing (WRTLT'18), Hefei, Anhui, China","year":"2018","author":[{"last_name":"Kampmann","full_name":"Kampmann, Matthias","id":"10935","first_name":"Matthias"},{"first_name":"Sybille","last_name":"Hellebrand","full_name":"Hellebrand, Sybille"}],"date_created":"2019-08-28T12:00:28Z","date_updated":"2022-01-06T06:51:28Z","title":"Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test"},{"citation":{"short":"M. Kampmann, S. Hellebrand, X-Tolerante Prüfzellengruppierung Für Den Test Mit Erhöhter Betriebsfrequenz, 29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, 2017.","bibtex":"@book{Kampmann_Hellebrand_2017, place={29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany}, title={X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2017} }","mla":"Kampmann, Matthias, and Sybille Hellebrand. <i>X-Tolerante Prüfzellengruppierung Für Den Test Mit Erhöhter Betriebsfrequenz</i>. 2017.","apa":"Kampmann, M., &#38; Hellebrand, S. (2017). <i>X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz</i>.","chicago":"Kampmann, Matthias, and Sybille Hellebrand. <i>X-Tolerante Prüfzellengruppierung Für Den Test Mit Erhöhter Betriebsfrequenz</i>. 29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, 2017.","ieee":"M. Kampmann and S. Hellebrand, <i>X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz</i>. 29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, 2017.","ama":"Kampmann M, Hellebrand S. <i>X-Tolerante Prüfzellengruppierung Für Den Test Mit Erhöhter Betriebsfrequenz</i>.; 2017."},"year":"2017","place":"29. Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\" (TuZ'17), Lübeck, Germany","title":"X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz","author":[{"last_name":"Kampmann","id":"10935","full_name":"Kampmann, Matthias","first_name":"Matthias"},{"full_name":"Hellebrand, Sybille","id":"209","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","first_name":"Sybille"}],"date_created":"2019-08-28T12:06:26Z","date_updated":"2022-05-11T16:17:41Z","status":"public","type":"misc","language":[{"iso":"eng"}],"keyword":["WORKSHOP"],"department":[{"_id":"48"}],"user_id":"209","_id":"13078"},{"language":[{"iso":"eng"}],"keyword":["Workshop"],"department":[{"_id":"48"}],"user_id":"659","_id":"13077","status":"public","type":"misc","title":"Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler","author":[{"full_name":"Hellebrand, Sybille","id":"209","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","first_name":"Sybille"},{"first_name":"Thomas","last_name":"Indlekofer","full_name":"Indlekofer, Thomas"},{"id":"10935","full_name":"Kampmann, Matthias","last_name":"Kampmann","first_name":"Matthias"},{"first_name":"Michael","full_name":"Kochte, Michael","last_name":"Kochte"},{"full_name":"Liu, Chang","last_name":"Liu","first_name":"Chang"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"}],"date_created":"2019-08-28T12:05:44Z","date_updated":"2022-01-06T06:51:28Z","citation":{"ama":"Hellebrand S, Indlekofer T, Kampmann M, Kochte M, Liu C, Wunderlich H-J. <i>Effiziente Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler</i>. 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany; 2015.","chicago":"Hellebrand, Sybille, Thomas Indlekofer, Matthias Kampmann, Michael Kochte, Chang Liu, and Hans-Joachim Wunderlich. <i>Effiziente Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler</i>. 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, 2015.","ieee":"S. Hellebrand, T. Indlekofer, M. Kampmann, M. Kochte, C. Liu, and H.-J. Wunderlich, <i>Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler</i>. 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, 2015.","short":"S. Hellebrand, T. Indlekofer, M. Kampmann, M. Kochte, C. Liu, H.-J. Wunderlich, Effiziente Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler, 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, 2015.","bibtex":"@book{Hellebrand_Indlekofer_Kampmann_Kochte_Liu_Wunderlich_2015, place={27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany}, title={Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler}, author={Hellebrand, Sybille and Indlekofer, Thomas and Kampmann, Matthias and Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim}, year={2015} }","mla":"Hellebrand, Sybille, et al. <i>Effiziente Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler</i>. 2015.","apa":"Hellebrand, S., Indlekofer, T., Kampmann, M., Kochte, M., Liu, C., &#38; Wunderlich, H.-J. (2015). <i>Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler</i>. 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany."},"place":"27. Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\" (TuZ'15), Bad Urach, Germany","year":"2015"},{"year":"2013","place":"14th Latin American Test Workshop, Cordoba, Argentina","citation":{"ama":"Cook A, Rodriguez Gomez L, Hellebrand S, Indlekofer T, Wunderlich H-J. <i>Adaptive Test and Diagnosis of Intermittent Faults</i>. 14th Latin American Test Workshop, Cordoba, Argentina; 2013.","ieee":"A. Cook, L. Rodriguez Gomez, S. Hellebrand, T. Indlekofer, and H.-J. Wunderlich, <i>Adaptive Test and Diagnosis of Intermittent Faults</i>. 14th Latin American Test Workshop, Cordoba, Argentina, 2013.","chicago":"Cook, Alejandro, Laura Rodriguez Gomez, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. <i>Adaptive Test and Diagnosis of Intermittent Faults</i>. 14th Latin American Test Workshop, Cordoba, Argentina, 2013.","bibtex":"@book{Cook_Rodriguez Gomez_Hellebrand_Indlekofer_Wunderlich_2013, place={14th Latin American Test Workshop, Cordoba, Argentina}, title={Adaptive Test and Diagnosis of Intermittent Faults}, author={Cook, Alejandro and Rodriguez Gomez, Laura and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}, year={2013} }","short":"A. Cook, L. Rodriguez Gomez, S. Hellebrand, T. Indlekofer, H.-J. Wunderlich, Adaptive Test and Diagnosis of Intermittent Faults, 14th Latin American Test Workshop, Cordoba, Argentina, 2013.","mla":"Cook, Alejandro, et al. <i>Adaptive Test and Diagnosis of Intermittent Faults</i>. 2013.","apa":"Cook, A., Rodriguez Gomez, L., Hellebrand, S., Indlekofer, T., &#38; Wunderlich, H.-J. (2013). <i>Adaptive Test and Diagnosis of Intermittent Faults</i>. 14th Latin American Test Workshop, Cordoba, Argentina."},"title":"Adaptive Test and Diagnosis of Intermittent Faults","date_updated":"2022-01-06T06:51:28Z","date_created":"2019-08-28T12:04:38Z","author":[{"full_name":"Cook, Alejandro","last_name":"Cook","first_name":"Alejandro"},{"first_name":"Laura","full_name":"Rodriguez Gomez, Laura","last_name":"Rodriguez Gomez"},{"id":"209","full_name":"Hellebrand, Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","first_name":"Sybille"},{"full_name":"Indlekofer, Thomas","last_name":"Indlekofer","first_name":"Thomas"},{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"}],"status":"public","type":"misc","keyword":["WORKSHOP"],"language":[{"iso":"eng"}],"_id":"13075","user_id":"659","department":[{"_id":"48"}]},{"citation":{"apa":"Cook, A., Hellebrand, S., &#38; Wunderlich, H.-J. (2012). <i>Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern</i>. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany.","bibtex":"@book{Cook_Hellebrand_Wunderlich_2012, place={24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany}, title={Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern}, author={Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2012} }","mla":"Cook, Alejandro, et al. <i>Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern</i>. 2012.","short":"A. Cook, S. Hellebrand, H.-J. Wunderlich, Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern, 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, 2012.","ama":"Cook A, Hellebrand S, Wunderlich H-J. <i>Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern</i>. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany; 2012.","ieee":"A. Cook, S. Hellebrand, and H.-J. Wunderlich, <i>Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern</i>. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, 2012.","chicago":"Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. <i>Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern</i>. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, 2012."},"year":"2012","place":"24. Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\" (TuZ'12), Cottbus, Germany","title":"Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern","author":[{"first_name":"Alejandro","last_name":"Cook","full_name":"Cook, Alejandro"},{"id":"209","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","first_name":"Sybille"},{"last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim"}],"date_created":"2019-08-28T12:02:54Z","date_updated":"2022-01-06T06:51:28Z","status":"public","type":"misc","language":[{"iso":"eng"}],"keyword":["WORKSHOP"],"user_id":"659","department":[{"_id":"48"}],"_id":"13074"},{"type":"misc","status":"public","_id":"10670","user_id":"659","department":[{"_id":"48"}],"keyword":["WORKSHOP"],"language":[{"iso":"eng"}],"place":"22. Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\" (TuZ'10), Paderborn, Germany","year":"2010","citation":{"bibtex":"@book{Fröse_Ibers_Hellebrand_2010, place={22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany}, title={Testdatenkompression mit Hilfe der Netzwerkinfrastruktur}, author={Fröse, Viktor and Ibers, Rüdiger and Hellebrand, Sybille}, year={2010} }","short":"V. Fröse, R. Ibers, S. Hellebrand, Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur, 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010.","mla":"Fröse, Viktor, et al. <i>Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur</i>. 2010.","apa":"Fröse, V., Ibers, R., &#38; Hellebrand, S. (2010). <i>Testdatenkompression mit Hilfe der Netzwerkinfrastruktur</i>. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany.","ama":"Fröse V, Ibers R, Hellebrand S. <i>Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur</i>. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany; 2010.","chicago":"Fröse, Viktor, Rüdiger Ibers, and Sybille Hellebrand. <i>Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur</i>. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010.","ieee":"V. Fröse, R. Ibers, and S. Hellebrand, <i>Testdatenkompression mit Hilfe der Netzwerkinfrastruktur</i>. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010."},"date_updated":"2022-01-06T06:50:49Z","date_created":"2019-07-10T11:17:36Z","author":[{"first_name":"Viktor","full_name":"Fröse, Viktor","last_name":"Fröse"},{"last_name":"Ibers","id":"659","full_name":"Ibers, Rüdiger","first_name":"Rüdiger"},{"first_name":"Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","id":"209"}],"title":"Testdatenkompression mit Hilfe der Netzwerkinfrastruktur"},{"user_id":"659","department":[{"_id":"48"}],"_id":"13033","language":[{"iso":"eng"}],"keyword":["WORKSHOP"],"type":"misc","status":"public","date_created":"2019-08-28T10:37:06Z","author":[{"first_name":"Torsten","last_name":"Coym","full_name":"Coym, Torsten"},{"last_name":"Hellebrand","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","id":"209","first_name":"Sybille"},{"last_name":"Ludwig","full_name":"Ludwig, Stefan","first_name":"Stefan"},{"first_name":"Bernd","last_name":"Straube","full_name":"Straube, Bernd"},{"first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich"},{"first_name":"Christian","last_name":"G. Zoellin","full_name":"G. Zoellin, Christian"}],"date_updated":"2022-01-06T06:51:27Z","title":"Ein verfeinertes elektrisches Modell für Teilchentreffer und dessen Auswirkung auf die Bewertung der Schaltungsempfindlichkeit","citation":{"ama":"Coym T, Hellebrand S, Ludwig S, Straube B, Wunderlich H-J, G. Zoellin C. <i>Ein Verfeinertes Elektrisches Modell Für Teilchentreffer Und Dessen Auswirkung Auf Die Bewertung Der Schaltungsempfindlichkeit</i>. 20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (Poster), Wien, Österreich; 2008.","chicago":"Coym, Torsten, Sybille Hellebrand, Stefan Ludwig, Bernd Straube, Hans-Joachim Wunderlich, and Christian G. Zoellin. <i>Ein Verfeinertes Elektrisches Modell Für Teilchentreffer Und Dessen Auswirkung Auf Die Bewertung Der Schaltungsempfindlichkeit</i>. 20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (Poster), Wien, Österreich, 2008.","ieee":"T. Coym, S. Hellebrand, S. Ludwig, B. Straube, H.-J. Wunderlich, and C. G. Zoellin, <i>Ein verfeinertes elektrisches Modell für Teilchentreffer und dessen Auswirkung auf die Bewertung der Schaltungsempfindlichkeit</i>. 20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (Poster), Wien, Österreich, 2008.","short":"T. Coym, S. Hellebrand, S. Ludwig, B. Straube, H.-J. Wunderlich, C. G. Zoellin, Ein Verfeinertes Elektrisches Modell Für Teilchentreffer Und Dessen Auswirkung Auf Die Bewertung Der Schaltungsempfindlichkeit, 20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (Poster), Wien, Österreich, 2008.","bibtex":"@book{Coym_Hellebrand_Ludwig_Straube_Wunderlich_G. Zoellin_2008, place={20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (Poster), Wien, Österreich}, title={Ein verfeinertes elektrisches Modell für Teilchentreffer und dessen Auswirkung auf die Bewertung der Schaltungsempfindlichkeit}, author={Coym, Torsten and Hellebrand, Sybille and Ludwig, Stefan and Straube, Bernd and Wunderlich, Hans-Joachim and G. Zoellin, Christian}, year={2008} }","mla":"Coym, Torsten, et al. <i>Ein Verfeinertes Elektrisches Modell Für Teilchentreffer Und Dessen Auswirkung Auf Die Bewertung Der Schaltungsempfindlichkeit</i>. 2008.","apa":"Coym, T., Hellebrand, S., Ludwig, S., Straube, B., Wunderlich, H.-J., &#38; G. Zoellin, C. (2008). <i>Ein verfeinertes elektrisches Modell für Teilchentreffer und dessen Auswirkung auf die Bewertung der Schaltungsempfindlichkeit</i>. 20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (Poster), Wien, Österreich."},"year":"2008","place":"20. ITG/GI/GMM Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\" (Poster), Wien, Österreich"},{"year":"2008","place":"20. ITG/GI/GMM Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\", Wien, Österreich","citation":{"bibtex":"@book{Amgalan_Hachmann_Hellebrand_Wunderlich_2008, place={20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Wien, Österreich}, title={Testen mit Rücksetzpunkten - ein Ansatz zur Verbesserung der Ausbeute bei robusten Schaltungen}, author={Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2008} }","short":"U. Amgalan, C. Hachmann, S. Hellebrand, H.-J. Wunderlich, Testen Mit Rücksetzpunkten - Ein Ansatz Zur Verbesserung Der Ausbeute Bei Robusten Schaltungen, 20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Wien, Österreich, 2008.","mla":"Amgalan, Uranmandakh, et al. <i>Testen Mit Rücksetzpunkten - Ein Ansatz Zur Verbesserung Der Ausbeute Bei Robusten Schaltungen</i>. 2008.","apa":"Amgalan, U., Hachmann, C., Hellebrand, S., &#38; Wunderlich, H.-J. (2008). <i>Testen mit Rücksetzpunkten - ein Ansatz zur Verbesserung der Ausbeute bei robusten Schaltungen</i>. 20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Wien, Österreich.","ieee":"U. Amgalan, C. Hachmann, S. Hellebrand, and H.-J. Wunderlich, <i>Testen mit Rücksetzpunkten - ein Ansatz zur Verbesserung der Ausbeute bei robusten Schaltungen</i>. 20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Wien, Österreich, 2008.","chicago":"Amgalan, Uranmandakh, Christian Hachmann, Sybille Hellebrand, and Hans-Joachim Wunderlich. <i>Testen Mit Rücksetzpunkten - Ein Ansatz Zur Verbesserung Der Ausbeute Bei Robusten Schaltungen</i>. 20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Wien, Österreich, 2008.","ama":"Amgalan U, Hachmann C, Hellebrand S, Wunderlich H-J. <i>Testen Mit Rücksetzpunkten - Ein Ansatz Zur Verbesserung Der Ausbeute Bei Robusten Schaltungen</i>. 20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Wien, Österreich; 2008."},"date_updated":"2022-01-06T06:51:27Z","author":[{"full_name":"Amgalan, Uranmandakh","last_name":"Amgalan","first_name":"Uranmandakh"},{"first_name":"Christian","full_name":"Hachmann, Christian","last_name":"Hachmann"},{"first_name":"Sybille","id":"209","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand"},{"first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich"}],"date_created":"2019-08-28T10:37:09Z","title":"Testen mit Rücksetzpunkten - ein Ansatz zur Verbesserung der Ausbeute bei robusten Schaltungen","type":"misc","status":"public","_id":"13035","user_id":"659","department":[{"_id":"48"}],"keyword":["WORKSHOP"],"language":[{"iso":"eng"}]},{"citation":{"apa":"Hellebrand, S. (2007). <i>Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing</i>. 5th IEEE East-West Design \\&#38; Test Symposium, Yerevan, Armenia (Invited Talk).","bibtex":"@book{Hellebrand_2007, place={5th IEEE East-West Design \\&#38; Test Symposium, Yerevan, Armenia (Invited Talk)}, title={Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing}, author={Hellebrand, Sybille}, year={2007} }","mla":"Hellebrand, Sybille. <i>Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing</i>. 2007.","short":"S. Hellebrand, Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing, 5th IEEE East-West Design \\&#38; Test Symposium, Yerevan, Armenia (Invited Talk), 2007.","ama":"Hellebrand S. <i>Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing</i>. 5th IEEE East-West Design \\&#38; Test Symposium, Yerevan, Armenia (Invited Talk); 2007.","chicago":"Hellebrand, Sybille. <i>Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing</i>. 5th IEEE East-West Design \\&#38; Test Symposium, Yerevan, Armenia (Invited Talk), 2007.","ieee":"S. Hellebrand, <i>Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing</i>. 5th IEEE East-West Design \\&#38; Test Symposium, Yerevan, Armenia (Invited Talk), 2007."},"place":"5th IEEE East-West Design \\& Test Symposium, Yerevan, Armenia (Invited Talk)","year":"2007","author":[{"first_name":"Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","id":"209"}],"date_created":"2019-08-28T10:40:47Z","date_updated":"2022-01-06T06:51:27Z","title":"Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing","type":"misc","status":"public","department":[{"_id":"48"}],"user_id":"659","_id":"13038","language":[{"iso":"eng"}],"keyword":["WORKSHOP"]},{"type":"misc","status":"public","_id":"13039","department":[{"_id":"48"}],"user_id":"659","keyword":["WORKSHOP"],"language":[{"iso":"eng"}],"place":"DATE 2007 Friday Workshop on Diagnostic Services in Network-on-Chips, Nice, France, (Poster)","year":"2007","citation":{"mla":"Ali, Muhammad, et al. <i>An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips</i>. 2007.","bibtex":"@book{Ali_Welzl_Hessler_Hellebrand_2007, place={DATE 2007 Friday Workshop on Diagnostic Services in Network-on-Chips, Nice, France, (Poster)}, title={An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips}, author={Ali, Muhammad and Welzl, Michael and Hessler, Sven and Hellebrand, Sybille}, year={2007} }","short":"M. Ali, M. Welzl, S. Hessler, S. Hellebrand, An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips, DATE 2007 Friday Workshop on Diagnostic Services in Network-on-Chips, Nice, France, (Poster), 2007.","apa":"Ali, M., Welzl, M., Hessler, S., &#38; Hellebrand, S. (2007). <i>An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips</i>. DATE 2007 Friday Workshop on Diagnostic Services in Network-on-Chips, Nice, France, (Poster).","ieee":"M. Ali, M. Welzl, S. Hessler, and S. Hellebrand, <i>An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips</i>. DATE 2007 Friday Workshop on Diagnostic Services in Network-on-Chips, Nice, France, (Poster), 2007.","chicago":"Ali, Muhammad, Michael Welzl, Sven Hessler, and Sybille Hellebrand. <i>An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips</i>. DATE 2007 Friday Workshop on Diagnostic Services in Network-on-Chips, Nice, France, (Poster), 2007.","ama":"Ali M, Welzl M, Hessler S, Hellebrand S. <i>An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips</i>. DATE 2007 Friday Workshop on Diagnostic Services in Network-on-Chips, Nice, France, (Poster); 2007."},"date_updated":"2022-01-06T06:51:27Z","date_created":"2019-08-28T10:41:29Z","author":[{"first_name":"Muhammad","last_name":"Ali","full_name":"Ali, Muhammad"},{"first_name":"Michael","full_name":"Welzl, Michael","last_name":"Welzl"},{"first_name":"Sven","last_name":"Hessler","full_name":"Hessler, Sven"},{"id":"209","full_name":"Hellebrand, Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","first_name":"Sybille"}],"title":"An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips"},{"_id":"13042","department":[{"_id":"48"}],"user_id":"659","keyword":["WORKSHOP"],"language":[{"iso":"eng"}],"type":"misc","status":"public","date_updated":"2022-01-06T06:51:27Z","date_created":"2019-08-28T10:43:12Z","author":[{"full_name":"Oehler, Philipp","last_name":"Oehler","first_name":"Philipp"},{"last_name":"Hellebrand","orcid":"0000-0002-3717-3939","id":"209","full_name":"Hellebrand, Sybille","first_name":"Sybille"},{"first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich"}],"title":"An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy","year":"2007","place":"17th GI/ITG/GMM Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\", Erlangen, Germany","citation":{"ieee":"P. Oehler, S. Hellebrand, and H.-J. Wunderlich, <i>An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany, 2007.","chicago":"Oehler, Philipp, Sybille Hellebrand, and Hans-Joachim Wunderlich. <i>An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany, 2007.","ama":"Oehler P, Hellebrand S, Wunderlich H-J. <i>An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany; 2007.","bibtex":"@book{Oehler_Hellebrand_Wunderlich_2007, place={17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany}, title={An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy}, author={Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2007} }","short":"P. Oehler, S. Hellebrand, H.-J. Wunderlich, An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy, 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany, 2007.","mla":"Oehler, Philipp, et al. <i>An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy</i>. 2007.","apa":"Oehler, P., Hellebrand, S., &#38; Wunderlich, H.-J. (2007). <i>An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany."}},{"date_created":"2019-08-28T10:45:55Z","author":[{"last_name":"Oehler","full_name":"Oehler, Philipp","first_name":"Philipp"},{"first_name":"Sybille","last_name":"Hellebrand","full_name":"Hellebrand, Sybille"}],"date_updated":"2022-01-06T06:51:27Z","title":"A Low Power Design for Embedded DRAMs with Online Consistency Checking","citation":{"ama":"Oehler P, Hellebrand S. <i>A Low Power Design for Embedded DRAMs with Online Consistency Checking</i>. Kleinheubachertagung 2005, Miltenberg, Germany; 2005.","ieee":"P. Oehler and S. Hellebrand, <i>A Low Power Design for Embedded DRAMs with Online Consistency Checking</i>. Kleinheubachertagung 2005, Miltenberg, Germany, 2005.","chicago":"Oehler, Philipp, and Sybille Hellebrand. <i>A Low Power Design for Embedded DRAMs with Online Consistency Checking</i>. Kleinheubachertagung 2005, Miltenberg, Germany, 2005.","short":"P. Oehler, S. Hellebrand, A Low Power Design for Embedded DRAMs with Online Consistency Checking, Kleinheubachertagung 2005, Miltenberg, Germany, 2005.","mla":"Oehler, Philipp, and Sybille Hellebrand. <i>A Low Power Design for Embedded DRAMs with Online Consistency Checking</i>. 2005.","bibtex":"@book{Oehler_Hellebrand_2005, place={Kleinheubachertagung 2005, Miltenberg, Germany}, title={A Low Power Design for Embedded DRAMs with Online Consistency Checking}, author={Oehler, Philipp and Hellebrand, Sybille}, year={2005} }","apa":"Oehler, P., &#38; Hellebrand, S. (2005). <i>A Low Power Design for Embedded DRAMs with Online Consistency Checking</i>. Kleinheubachertagung 2005, Miltenberg, Germany."},"place":"Kleinheubachertagung 2005, Miltenberg, Germany","year":"2005","user_id":"659","department":[{"_id":"48"}],"_id":"13046","language":[{"iso":"eng"}],"keyword":["WORKSHOP"],"type":"misc","status":"public"},{"title":"Dynamic Routing: A Prerequisite for Reliable NoCs","author":[{"full_name":"Ali, Muhammad","last_name":"Ali","first_name":"Muhammad"},{"last_name":"Welzl","full_name":"Welzl, Michael","first_name":"Michael"},{"full_name":"Hellebrand, Sybille","id":"209","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","first_name":"Sybille"}],"date_created":"2019-08-28T12:22:23Z","date_updated":"2022-01-06T06:51:28Z","citation":{"apa":"Ali, M., Welzl, M., &#38; Hellebrand, S. (2005). <i>Dynamic Routing: A Prerequisite for Reliable NoCs</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria.","bibtex":"@book{Ali_Welzl_Hellebrand_2005, place={17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria}, title={Dynamic Routing: A Prerequisite for Reliable NoCs}, author={Ali, Muhammad and Welzl, Michael and Hellebrand, Sybille}, year={2005} }","mla":"Ali, Muhammad, et al. <i>Dynamic Routing: A Prerequisite for Reliable NoCs</i>. 2005.","short":"M. Ali, M. Welzl, S. Hellebrand, Dynamic Routing: A Prerequisite for Reliable NoCs, 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.","ieee":"M. Ali, M. Welzl, and S. Hellebrand, <i>Dynamic Routing: A Prerequisite for Reliable NoCs</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.","chicago":"Ali, Muhammad, Michael Welzl, and Sybille Hellebrand. <i>Dynamic Routing: A Prerequisite for Reliable NoCs</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.","ama":"Ali M, Welzl M, Hellebrand S. <i>Dynamic Routing: A Prerequisite for Reliable NoCs</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria; 2005."},"year":"2005","place":"17th GI/ITG/GMM Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\", Innsbruck, Austria","extern":"1","language":[{"iso":"eng"}],"keyword":["WORKSHOP"],"department":[{"_id":"48"}],"user_id":"659","_id":"13101","status":"public","type":"misc"},{"place":"17th GI/ITG/GMM Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\", Innsbruck, Austria","year":"2005","citation":{"chicago":"Oehler, Philipp, and Sybille Hellebrand. <i>Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.","ieee":"P. Oehler and S. Hellebrand, <i>Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.","ama":"Oehler P, Hellebrand S. <i>Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria; 2005.","apa":"Oehler, P., &#38; Hellebrand, S. (2005). <i>Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria.","mla":"Oehler, Philipp, and Sybille Hellebrand. <i>Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study</i>. 2005.","short":"P. Oehler, S. Hellebrand, Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study, 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.","bibtex":"@book{Oehler_Hellebrand_2005, place={17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria}, title={Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study}, author={Oehler, Philipp and Hellebrand, Sybille}, year={2005} }"},"title":"Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study","date_updated":"2022-01-06T06:51:28Z","date_created":"2019-08-28T12:23:10Z","author":[{"full_name":"Oehler, Philipp","last_name":"Oehler","first_name":"Philipp"},{"first_name":"Sybille","full_name":"Hellebrand, Sybille","id":"209","orcid":"0000-0002-3717-3939","last_name":"Hellebrand"}],"status":"public","type":"misc","keyword":["WORKSHOP"],"language":[{"iso":"eng"}],"_id":"13102","department":[{"_id":"48"}],"user_id":"659"}]