[{"place":"9th IEEE European Test Symposium, Ajaccio, Corsica, France","date_created":"2019-08-28T12:21:58Z","department":[{"_id":"48"}],"keyword":["WORKSHOP"],"type":"misc","citation":{"chicago":"Hellebrand, Sybille, Armin Wuertenberger, and Christofer S. Tautermann. <i>Data Compression for Multiple Scan Chains Using Dictionaries with Corrections</i>. 9th IEEE European Test Symposium, Ajaccio, Corsica, France, 2004.","short":"S. Hellebrand, A. Wuertenberger, C. S. Tautermann, Data Compression for Multiple Scan Chains Using Dictionaries with Corrections, 9th IEEE European Test Symposium, Ajaccio, Corsica, France, 2004.","apa":"Hellebrand, S., Wuertenberger, A., &#38; S. Tautermann, C. (2004). <i>Data Compression for Multiple Scan Chains Using Dictionaries with Corrections</i>. 9th IEEE European Test Symposium, Ajaccio, Corsica, France.","ieee":"S. Hellebrand, A. Wuertenberger, and C. S. Tautermann, <i>Data Compression for Multiple Scan Chains Using Dictionaries with Corrections</i>. 9th IEEE European Test Symposium, Ajaccio, Corsica, France, 2004.","ama":"Hellebrand S, Wuertenberger A, S. Tautermann C. <i>Data Compression for Multiple Scan Chains Using Dictionaries with Corrections</i>. 9th IEEE European Test Symposium, Ajaccio, Corsica, France; 2004.","bibtex":"@book{Hellebrand_Wuertenberger_S. Tautermann_2004, place={9th IEEE European Test Symposium, Ajaccio, Corsica, France}, title={Data Compression for Multiple Scan Chains Using Dictionaries with Corrections}, author={Hellebrand, Sybille and Wuertenberger, Armin and S. Tautermann, Christofer}, year={2004} }","mla":"Hellebrand, Sybille, et al. <i>Data Compression for Multiple Scan Chains Using Dictionaries with Corrections</i>. 2004."},"extern":"1","_id":"13100","language":[{"iso":"eng"}],"user_id":"659","author":[{"id":"209","last_name":"Hellebrand","first_name":"Sybille","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille"},{"first_name":"Armin","last_name":"Wuertenberger","full_name":"Wuertenberger, Armin"},{"full_name":"S. Tautermann, Christofer","last_name":"S. Tautermann","first_name":"Christofer"}],"title":"Data Compression for Multiple Scan Chains Using Dictionaries with Corrections","status":"public","year":"2004","date_updated":"2022-01-06T06:51:28Z"},{"keyword":["WORKSHOP"],"type":"misc","department":[{"_id":"48"}],"date_created":"2019-08-28T12:19:54Z","place":"IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA","extern":"1","citation":{"apa":"Hellebrand, S., &#38; Wuertenberger, A. (2002). <i>Alternating Run-Length Coding: A Technique for Improved Test Data Compression</i>. IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA.","ieee":"S. Hellebrand and A. Wuertenberger, <i>Alternating Run-Length Coding: A Technique for Improved Test Data Compression</i>. IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA, 2002.","chicago":"Hellebrand, Sybille, and Armin Wuertenberger. <i>Alternating Run-Length Coding: A Technique for Improved Test Data Compression</i>. IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA, 2002.","short":"S. Hellebrand, A. Wuertenberger, Alternating Run-Length Coding: A Technique for Improved Test Data Compression, IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA, 2002.","mla":"Hellebrand, Sybille, and Armin Wuertenberger. <i>Alternating Run-Length Coding: A Technique for Improved Test Data Compression</i>. 2002.","ama":"Hellebrand S, Wuertenberger A. <i>Alternating Run-Length Coding: A Technique for Improved Test Data Compression</i>. IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA; 2002.","bibtex":"@book{Hellebrand_Wuertenberger_2002, place={IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA}, title={Alternating Run-Length Coding: A Technique for Improved Test Data Compression}, author={Hellebrand, Sybille and Wuertenberger, Armin}, year={2002} }"},"user_id":"659","language":[{"iso":"eng"}],"_id":"13097","date_updated":"2022-01-06T06:51:28Z","year":"2002","status":"public","title":"Alternating Run-Length Coding: A Technique for Improved Test Data Compression","author":[{"full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","first_name":"Sybille","last_name":"Hellebrand","id":"209"},{"last_name":"Wuertenberger","first_name":"Armin","full_name":"Wuertenberger, Armin"}]},{"language":[{"iso":"eng"}],"_id":"13096","user_id":"659","year":"2001","title":"Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST","status":"public","author":[{"first_name":"Hua-Guo","last_name":"Liang","full_name":"Liang, Hua-Guo"},{"id":"209","last_name":"Hellebrand","first_name":"Sybille","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"}],"date_updated":"2022-01-06T06:51:28Z","place":"IEEE European Test Workshop, Stockholm, Sweden","date_created":"2019-08-28T12:19:25Z","keyword":["WORKSHOP"],"type":"misc","department":[{"_id":"48"}],"citation":{"ama":"Liang H-G, Hellebrand S, Wunderlich H-J. <i>Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST</i>. IEEE European Test Workshop, Stockholm, Sweden; 2001.","bibtex":"@book{Liang_Hellebrand_Wunderlich_2001, place={IEEE European Test Workshop, Stockholm, Sweden}, title={Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}, author={Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2001} }","mla":"Liang, Hua-Guo, et al. <i>Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST</i>. 2001.","short":"H.-G. Liang, S. Hellebrand, H.-J. Wunderlich, Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST, IEEE European Test Workshop, Stockholm, Sweden, 2001.","chicago":"Liang, Hua-Guo, Sybille Hellebrand, and Hans-Joachim Wunderlich. <i>Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST</i>. IEEE European Test Workshop, Stockholm, Sweden, 2001.","apa":"Liang, H.-G., Hellebrand, S., &#38; Wunderlich, H.-J. (2001). <i>Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST</i>. IEEE European Test Workshop, Stockholm, Sweden.","ieee":"H.-G. Liang, S. Hellebrand, and H.-J. Wunderlich, <i>Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST</i>. IEEE European Test Workshop, Stockholm, Sweden, 2001."},"extern":"1"},{"department":[{"_id":"48"}],"keyword":["WORKSHOP"],"type":"misc","place":"IEEE European Test Workshop, Cascais, Portugal","date_created":"2019-08-28T12:18:56Z","extern":"1","citation":{"ama":"Hellebrand S, Liang H-G, Wunderlich H-J. <i>A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters</i>. IEEE European Test Workshop, Cascais, Portugal; 2000.","short":"S. Hellebrand, H.-G. Liang, H.-J. Wunderlich, A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters, IEEE European Test Workshop, Cascais, Portugal, 2000.","chicago":"Hellebrand, Sybille, Hua-Guo Liang, and Hans-Joachim Wunderlich. <i>A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters</i>. IEEE European Test Workshop, Cascais, Portugal, 2000.","bibtex":"@book{Hellebrand_Liang_Wunderlich_2000, place={IEEE European Test Workshop, Cascais, Portugal}, title={A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters}, author={Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}, year={2000} }","apa":"Hellebrand, S., Liang, H.-G., &#38; Wunderlich, H.-J. (2000). <i>A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters</i>. IEEE European Test Workshop, Cascais, Portugal.","mla":"Hellebrand, Sybille, et al. <i>A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters</i>. 2000.","ieee":"S. Hellebrand, H.-G. Liang, and H.-J. Wunderlich, <i>A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters</i>. IEEE European Test Workshop, Cascais, Portugal, 2000."},"user_id":"659","_id":"13095","language":[{"iso":"eng"}],"date_updated":"2022-01-06T06:51:28Z","author":[{"id":"209","first_name":"Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille"},{"first_name":"Hua-Guo","last_name":"Liang","full_name":"Liang, Hua-Guo"},{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"}],"year":"2000","status":"public","title":"A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters"},{"extern":"1","citation":{"short":"S. Hellebrand, H.-J. Wunderlich, V. N. Yarmolik, Exploiting Symmetries to Speed Up Transparent BIST, 11th GI/ITG/GMM/IEEE Workshop, 1999.","chicago":"Hellebrand, Sybille, Hans-Joachim Wunderlich, and Vyacheslav N. Yarmolik. <i>Exploiting Symmetries to Speed Up Transparent BIST</i>. 11th GI/ITG/GMM/IEEE Workshop, 1999.","ieee":"S. Hellebrand, H.-J. Wunderlich, and V. N. Yarmolik, <i>Exploiting Symmetries to Speed Up Transparent BIST</i>. 11th GI/ITG/GMM/IEEE Workshop, 1999.","apa":"Hellebrand, S., Wunderlich, H.-J., &#38; N. Yarmolik, V. (1999). <i>Exploiting Symmetries to Speed Up Transparent BIST</i>. 11th GI/ITG/GMM/IEEE Workshop.","bibtex":"@book{Hellebrand_Wunderlich_N. Yarmolik_1999, place={11th GI/ITG/GMM/IEEE Workshop}, title={Exploiting Symmetries to Speed Up Transparent BIST}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav}, year={1999} }","ama":"Hellebrand S, Wunderlich H-J, N. Yarmolik V. <i>Exploiting Symmetries to Speed Up Transparent BIST</i>. 11th GI/ITG/GMM/IEEE Workshop; 1999.","mla":"Hellebrand, Sybille, et al. <i>Exploiting Symmetries to Speed Up Transparent BIST</i>. 1999."},"type":"misc","keyword":["WORKSHOP"],"department":[{"_id":"48"}],"place":"11th GI/ITG/GMM/IEEE Workshop","date_created":"2019-08-28T12:17:07Z","date_updated":"2022-01-06T06:51:28Z","year":"1999","status":"public","title":"Exploiting Symmetries to Speed Up Transparent BIST","author":[{"full_name":"Hellebrand, Sybille","first_name":"Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","id":"209"},{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"},{"first_name":"Vyacheslav","last_name":"N. Yarmolik","full_name":"N. Yarmolik, Vyacheslav"}],"user_id":"659","language":[{"iso":"eng"}],"_id":"13093"},{"year":"1998","title":"Efficient Consistency Checking for Embedded Memories","status":"public","author":[{"first_name":"Vyacheslav","last_name":"N. Yarmolik","full_name":"N. Yarmolik, Vyacheslav"},{"id":"209","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","first_name":"Sybille","last_name":"Hellebrand"},{"full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim","last_name":"Wunderlich"}],"date_updated":"2022-01-06T06:51:28Z","language":[{"iso":"eng"}],"_id":"13091","user_id":"659","citation":{"short":"V. N. Yarmolik, S. Hellebrand, H.-J. Wunderlich, Efficient Consistency Checking for Embedded Memories, 5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1998.","chicago":"N. Yarmolik, Vyacheslav, Sybille Hellebrand, and Hans-Joachim Wunderlich. <i>Efficient Consistency Checking for Embedded Memories</i>. 5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1998.","apa":"N. Yarmolik, V., Hellebrand, S., &#38; Wunderlich, H.-J. (1998). <i>Efficient Consistency Checking for Embedded Memories</i>. 5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA.","ieee":"V. N. Yarmolik, S. Hellebrand, and H.-J. Wunderlich, <i>Efficient Consistency Checking for Embedded Memories</i>. 5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1998.","ama":"N. Yarmolik V, Hellebrand S, Wunderlich H-J. <i>Efficient Consistency Checking for Embedded Memories</i>. 5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA; 1998.","bibtex":"@book{N. Yarmolik_Hellebrand_Wunderlich_1998, place={5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA}, title={Efficient Consistency Checking for Embedded Memories}, author={N. Yarmolik, Vyacheslav and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1998} }","mla":"N. Yarmolik, Vyacheslav, et al. <i>Efficient Consistency Checking for Embedded Memories</i>. 1998."},"extern":"1","date_created":"2019-08-28T12:16:04Z","place":"5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA","type":"misc","keyword":["WORKSHOP"],"department":[{"_id":"48"}]},{"date_created":"2019-08-28T12:16:34Z","place":"10th GI/ITG/GMM/IEEE Workshop","department":[{"_id":"48"}],"type":"misc","keyword":["WORKSHOP"],"citation":{"apa":"N. Yarmolik, V., Hellebrand, S., &#38; Wunderlich, H.-J. (1998). <i>Efficient Consistency Checking for Embedded Memories</i>. 10th GI/ITG/GMM/IEEE Workshop.","ieee":"V. N. Yarmolik, S. Hellebrand, and H.-J. Wunderlich, <i>Efficient Consistency Checking for Embedded Memories</i>. 10th GI/ITG/GMM/IEEE Workshop, 1998.","short":"V. N. Yarmolik, S. Hellebrand, H.-J. Wunderlich, Efficient Consistency Checking for Embedded Memories, 10th GI/ITG/GMM/IEEE Workshop, 1998.","chicago":"N. Yarmolik, Vyacheslav, Sybille Hellebrand, and Hans-Joachim Wunderlich. <i>Efficient Consistency Checking for Embedded Memories</i>. 10th GI/ITG/GMM/IEEE Workshop, 1998.","mla":"N. Yarmolik, Vyacheslav, et al. <i>Efficient Consistency Checking for Embedded Memories</i>. 1998.","ama":"N. Yarmolik V, Hellebrand S, Wunderlich H-J. <i>Efficient Consistency Checking for Embedded Memories</i>. 10th GI/ITG/GMM/IEEE Workshop; 1998.","bibtex":"@book{N. Yarmolik_Hellebrand_Wunderlich_1998, place={10th GI/ITG/GMM/IEEE Workshop}, title={Efficient Consistency Checking for Embedded Memories}, author={N. Yarmolik, Vyacheslav and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1998} }"},"extern":"1","language":[{"iso":"eng"}],"_id":"13092","user_id":"659","author":[{"last_name":"N. Yarmolik","first_name":"Vyacheslav","full_name":"N. Yarmolik, Vyacheslav"},{"id":"209","full_name":"Hellebrand, Sybille","first_name":"Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939"},{"full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim","last_name":"Wunderlich"}],"status":"public","year":"1998","title":"Efficient Consistency Checking for Embedded Memories","date_updated":"2022-01-06T06:51:28Z"},{"language":[{"iso":"eng"}],"_id":"13089","user_id":"659","author":[{"full_name":"Tsai, Kun-Han","last_name":"Tsai","first_name":"Kun-Han"},{"full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","first_name":"Sybille","last_name":"Hellebrand","id":"209"},{"first_name":"Janusz","last_name":"Rajski","full_name":"Rajski, Janusz"},{"full_name":"Marek-Sadowska, Malgorzata","last_name":"Marek-Sadowska","first_name":"Malgorzata"}],"status":"public","title":"STARBIST: Scan Autocorrelated Random Pattern Generation","year":"1997","date_updated":"2022-01-06T06:51:28Z","date_created":"2019-08-28T12:15:05Z","place":"4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA","department":[{"_id":"48"}],"keyword":["WORKSHOP"],"type":"misc","citation":{"short":"K.-H. Tsai, S. Hellebrand, J. Rajski, M. Marek-Sadowska, STARBIST: Scan Autocorrelated Random Pattern Generation, 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1997.","chicago":"Tsai, Kun-Han, Sybille Hellebrand, Janusz Rajski, and Malgorzata Marek-Sadowska. <i>STARBIST: Scan Autocorrelated Random Pattern Generation</i>. 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1997.","ieee":"K.-H. Tsai, S. Hellebrand, J. Rajski, and M. Marek-Sadowska, <i>STARBIST: Scan Autocorrelated Random Pattern Generation</i>. 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1997.","apa":"Tsai, K.-H., Hellebrand, S., Rajski, J., &#38; Marek-Sadowska, M. (1997). <i>STARBIST: Scan Autocorrelated Random Pattern Generation</i>. 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA.","bibtex":"@book{Tsai_Hellebrand_Rajski_Marek-Sadowska_1997, place={4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA}, title={STARBIST: Scan Autocorrelated Random Pattern Generation}, author={Tsai, Kun-Han and Hellebrand, Sybille and Rajski, Janusz and Marek-Sadowska, Malgorzata}, year={1997} }","ama":"Tsai K-H, Hellebrand S, Rajski J, Marek-Sadowska M. <i>STARBIST: Scan Autocorrelated Random Pattern Generation</i>. 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA; 1997.","mla":"Tsai, Kun-Han, et al. <i>STARBIST: Scan Autocorrelated Random Pattern Generation</i>. 1997."},"extern":"1"},{"date_updated":"2022-01-06T06:51:28Z","author":[{"full_name":"Hertwig, Andre","last_name":"Hertwig","first_name":"Andre"},{"orcid":"0000-0002-3717-3939","last_name":"Hellebrand","first_name":"Sybille","full_name":"Hellebrand, Sybille","id":"209"},{"last_name":"Wunderlich","first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim"}],"status":"public","year":"1997","title":"Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications","user_id":"659","_id":"13090","language":[{"iso":"eng"}],"extern":"1","citation":{"apa":"Hertwig, A., Hellebrand, S., &#38; Wunderlich, H.-J. (1997). <i>Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications</i>. 3rd IEEE International On-Line Testing Workshop, Crete, Greece.","ieee":"A. Hertwig, S. Hellebrand, and H.-J. Wunderlich, <i>Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications</i>. 3rd IEEE International On-Line Testing Workshop, Crete, Greece, 1997.","chicago":"Hertwig, Andre, Sybille Hellebrand, and Hans-Joachim Wunderlich. <i>Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications</i>. 3rd IEEE International On-Line Testing Workshop, Crete, Greece, 1997.","short":"A. Hertwig, S. Hellebrand, H.-J. Wunderlich, Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications, 3rd IEEE International On-Line Testing Workshop, Crete, Greece, 1997.","mla":"Hertwig, Andre, et al. <i>Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications</i>. 1997.","ama":"Hertwig A, Hellebrand S, Wunderlich H-J. <i>Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications</i>. 3rd IEEE International On-Line Testing Workshop, Crete, Greece; 1997.","bibtex":"@book{Hertwig_Hellebrand_Wunderlich_1997, place={3rd IEEE International On-Line Testing Workshop, Crete, Greece}, title={Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications}, author={Hertwig, Andre and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1997} }"},"department":[{"_id":"48"}],"keyword":["WORKSHOP"],"type":"misc","date_created":"2019-08-28T12:15:36Z","place":"3rd IEEE International On-Line Testing Workshop, Crete, Greece"},{"user_id":"659","_id":"13087","language":[{"iso":"eng"}],"date_updated":"2022-01-06T06:51:28Z","author":[{"first_name":"Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","id":"209"},{"last_name":"Wunderlich","first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim"}],"status":"public","year":"1996","title":"Using Embedded Processors for BIST","department":[{"_id":"48"}],"keyword":["WORKSHOP"],"type":"misc","place":"3rd IEEE International Test Synthesis Workshop, Santa Barbara, CA","date_created":"2019-08-28T12:14:03Z","extern":"1","citation":{"ama":"Hellebrand S, Wunderlich H-J. <i>Using Embedded Processors for BIST</i>. 3rd IEEE International Test Synthesis Workshop, Santa Barbara, CA; 1996.","bibtex":"@book{Hellebrand_Wunderlich_1996, place={3rd IEEE International Test Synthesis Workshop, Santa Barbara, CA}, title={Using Embedded Processors for BIST}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1996} }","mla":"Hellebrand, Sybille, and Hans-Joachim Wunderlich. <i>Using Embedded Processors for BIST</i>. 1996.","short":"S. Hellebrand, H.-J. Wunderlich, Using Embedded Processors for BIST, 3rd IEEE International Test Synthesis Workshop, Santa Barbara, CA, 1996.","chicago":"Hellebrand, Sybille, and Hans-Joachim Wunderlich. <i>Using Embedded Processors for BIST</i>. 3rd IEEE International Test Synthesis Workshop, Santa Barbara, CA, 1996.","apa":"Hellebrand, S., &#38; Wunderlich, H.-J. (1996). <i>Using Embedded Processors for BIST</i>. 3rd IEEE International Test Synthesis Workshop, Santa Barbara, CA.","ieee":"S. Hellebrand and H.-J. Wunderlich, <i>Using Embedded Processors for BIST</i>. 3rd IEEE International Test Synthesis Workshop, Santa Barbara, CA, 1996."}},{"date_updated":"2022-01-06T06:51:28Z","author":[{"full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","first_name":"Sybille","last_name":"Hellebrand","id":"209"},{"full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim","last_name":"Wunderlich"},{"full_name":"Hertwig, Andre","first_name":"Andre","last_name":"Hertwig"}],"title":"Mixed-Mode BIST Using Embedded Processors","status":"public","year":"1996","user_id":"659","language":[{"iso":"eng"}],"_id":"13088","extern":"1","citation":{"chicago":"Hellebrand, Sybille, Hans-Joachim Wunderlich, and Andre Hertwig. <i>Mixed-Mode BIST Using Embedded Processors</i>. 2nd IEEE International On-Line Testing Workshop. Biarritz, France, 1996.","short":"S. Hellebrand, H.-J. Wunderlich, A. Hertwig, Mixed-Mode BIST Using Embedded Processors, 2nd IEEE International On-Line Testing Workshop. Biarritz, France, 1996.","ieee":"S. Hellebrand, H.-J. Wunderlich, and A. Hertwig, <i>Mixed-Mode BIST Using Embedded Processors</i>. 2nd IEEE International On-Line Testing Workshop. Biarritz, France, 1996.","apa":"Hellebrand, S., Wunderlich, H.-J., &#38; Hertwig, A. (1996). <i>Mixed-Mode BIST Using Embedded Processors</i>. 2nd IEEE International On-Line Testing Workshop. Biarritz, France.","bibtex":"@book{Hellebrand_Wunderlich_Hertwig_1996, place={2nd IEEE International On-Line Testing Workshop. Biarritz, France}, title={Mixed-Mode BIST Using Embedded Processors}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre}, year={1996} }","ama":"Hellebrand S, Wunderlich H-J, Hertwig A. <i>Mixed-Mode BIST Using Embedded Processors</i>. 2nd IEEE International On-Line Testing Workshop. Biarritz, France; 1996.","mla":"Hellebrand, Sybille, et al. <i>Mixed-Mode BIST Using Embedded Processors</i>. 1996."},"department":[{"_id":"48"}],"keyword":["WORKSHOP"],"type":"misc","place":"2nd IEEE International On-Line Testing Workshop. Biarritz, France","date_created":"2019-08-28T12:14:35Z"},{"keyword":["WORKSHOP"],"type":"misc","department":[{"_id":"48"}],"place":"2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA","date_created":"2019-08-28T12:13:37Z","extern":"1","citation":{"chicago":"Hellebrand, Sybille, Birgit Reeb, Steffen Tarnick, and Hans-Joachim Wunderlich. <i>Pattern Generation for a Deterministic BIST Scheme</i>. 2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA, 1995.","short":"S. Hellebrand, B. Reeb, S. Tarnick, H.-J. Wunderlich, Pattern Generation for a Deterministic BIST Scheme, 2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA, 1995.","ieee":"S. Hellebrand, B. Reeb, S. Tarnick, and H.-J. Wunderlich, <i>Pattern Generation for a Deterministic BIST Scheme</i>. 2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA, 1995.","apa":"Hellebrand, S., Reeb, B., Tarnick, S., &#38; Wunderlich, H.-J. (1995). <i>Pattern Generation for a Deterministic BIST Scheme</i>. 2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA.","bibtex":"@book{Hellebrand_Reeb_Tarnick_Wunderlich_1995, place={2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA}, title={Pattern Generation for a Deterministic BIST Scheme}, author={Hellebrand, Sybille and Reeb, Birgit and Tarnick, Steffen and Wunderlich, Hans-Joachim}, year={1995} }","ama":"Hellebrand S, Reeb B, Tarnick S, Wunderlich H-J. <i>Pattern Generation for a Deterministic BIST Scheme</i>. 2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA; 1995.","mla":"Hellebrand, Sybille, et al. <i>Pattern Generation for a Deterministic BIST Scheme</i>. 1995."},"user_id":"659","_id":"13086","language":[{"iso":"eng"}],"date_updated":"2022-01-06T06:51:28Z","title":"Pattern Generation for a Deterministic BIST Scheme","year":"1995","status":"public","author":[{"id":"209","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","first_name":"Sybille","full_name":"Hellebrand, Sybille"},{"full_name":"Reeb, Birgit","last_name":"Reeb","first_name":"Birgit"},{"first_name":"Steffen","last_name":"Tarnick","full_name":"Tarnick, Steffen"},{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"}]},{"_id":"13083","language":[{"iso":"eng"}],"user_id":"659","status":"public","year":"1994","title":"Effiziente Testsatzkodierung für Prüfpfad-basierte Selbsttestarchitekturen","author":[{"full_name":"Venkataraman, Srikanth","first_name":"Srikanth","last_name":"Venkataraman"},{"full_name":"Rajski, Janusz","last_name":"Rajski","first_name":"Janusz"},{"id":"209","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","first_name":"Sybille","last_name":"Hellebrand"},{"first_name":"Steffen","last_name":"Tarnick","full_name":"Tarnick, Steffen"}],"date_updated":"2022-01-06T06:51:28Z","place":"6th ITG/GI/GME Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\", Vaals, The Netherlands","date_created":"2019-08-28T12:11:20Z","keyword":["WORKSHOP"],"type":"misc","department":[{"_id":"48"}],"citation":{"short":"S. Venkataraman, J. Rajski, S. Hellebrand, S. Tarnick, Effiziente Testsatzkodierung Für Prüfpfad-Basierte Selbsttestarchitekturen, 6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands, 1994.","chicago":"Venkataraman, Srikanth, Janusz Rajski, Sybille Hellebrand, and Steffen Tarnick. <i>Effiziente Testsatzkodierung Für Prüfpfad-Basierte Selbsttestarchitekturen</i>. 6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands, 1994.","apa":"Venkataraman, S., Rajski, J., Hellebrand, S., &#38; Tarnick, S. (1994). <i>Effiziente Testsatzkodierung für Prüfpfad-basierte Selbsttestarchitekturen</i>. 6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands.","ieee":"S. Venkataraman, J. Rajski, S. Hellebrand, and S. Tarnick, <i>Effiziente Testsatzkodierung für Prüfpfad-basierte Selbsttestarchitekturen</i>. 6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands, 1994.","ama":"Venkataraman S, Rajski J, Hellebrand S, Tarnick S. <i>Effiziente Testsatzkodierung Für Prüfpfad-Basierte Selbsttestarchitekturen</i>. 6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands; 1994.","bibtex":"@book{Venkataraman_Rajski_Hellebrand_Tarnick_1994, place={6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands}, title={Effiziente Testsatzkodierung für Prüfpfad-basierte Selbsttestarchitekturen}, author={Venkataraman, Srikanth and Rajski, Janusz and Hellebrand, Sybille and Tarnick, Steffen}, year={1994} }","mla":"Venkataraman, Srikanth, et al. <i>Effiziente Testsatzkodierung Für Prüfpfad-Basierte Selbsttestarchitekturen</i>. 1994."},"extern":"1"},{"date_created":"2019-08-28T12:11:57Z","place":"6th ITG/GI/GME Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\", Vaals, The Netherlands","keyword":["WORKSHOP"],"type":"misc","department":[{"_id":"48"}],"citation":{"mla":"Hellebrand, Sybille, and Hans-Joachim Wunderlich. <i>Ein Verfahren Zur Testfreundlichen Steuerwerkssynthese</i>. 1994.","ama":"Hellebrand S, Wunderlich H-J. <i>Ein Verfahren Zur Testfreundlichen Steuerwerkssynthese</i>. 6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands; 1994.","bibtex":"@book{Hellebrand_Wunderlich_1994, place={6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands}, title={Ein Verfahren zur testfreundlichen Steuerwerkssynthese}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1994} }","apa":"Hellebrand, S., &#38; Wunderlich, H.-J. (1994). <i>Ein Verfahren zur testfreundlichen Steuerwerkssynthese</i>. 6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands.","ieee":"S. Hellebrand and H.-J. Wunderlich, <i>Ein Verfahren zur testfreundlichen Steuerwerkssynthese</i>. 6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands, 1994.","chicago":"Hellebrand, Sybille, and Hans-Joachim Wunderlich. <i>Ein Verfahren Zur Testfreundlichen Steuerwerkssynthese</i>. 6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands, 1994.","short":"S. Hellebrand, H.-J. Wunderlich, Ein Verfahren Zur Testfreundlichen Steuerwerkssynthese, 6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands, 1994."},"extern":"1","_id":"13084","language":[{"iso":"eng"}],"user_id":"659","year":"1994","title":"Ein Verfahren zur testfreundlichen Steuerwerkssynthese","status":"public","author":[{"full_name":"Hellebrand, Sybille","last_name":"Hellebrand","first_name":"Sybille","orcid":"0000-0002-3717-3939","id":"209"},{"full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim","last_name":"Wunderlich"}],"date_updated":"2022-01-06T06:51:28Z"},{"citation":{"bibtex":"@book{Hellebrand_Paulo Teixeira_Wunderlich_1994, place={1st IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA}, title={Synthesis for Testability - the ARCHIMEDES Approach}, author={Hellebrand, Sybille and Paulo Teixeira, Joao and Wunderlich, Hans-Joachim}, year={1994} }","ama":"Hellebrand S, Paulo Teixeira J, Wunderlich H-J. <i>Synthesis for Testability - the ARCHIMEDES Approach</i>. 1st IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA; 1994.","mla":"Hellebrand, Sybille, et al. <i>Synthesis for Testability - the ARCHIMEDES Approach</i>. 1994.","chicago":"Hellebrand, Sybille, Joao Paulo Teixeira, and Hans-Joachim Wunderlich. <i>Synthesis for Testability - the ARCHIMEDES Approach</i>. 1st IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1994.","short":"S. Hellebrand, J. Paulo Teixeira, H.-J. Wunderlich, Synthesis for Testability - the ARCHIMEDES Approach, 1st IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1994.","ieee":"S. Hellebrand, J. Paulo Teixeira, and H.-J. Wunderlich, <i>Synthesis for Testability - the ARCHIMEDES Approach</i>. 1st IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1994.","apa":"Hellebrand, S., Paulo Teixeira, J., &#38; Wunderlich, H.-J. (1994). <i>Synthesis for Testability - the ARCHIMEDES Approach</i>. 1st IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA."},"extern":"1","date_created":"2019-08-28T12:13:01Z","place":"1st IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA","department":[{"_id":"48"}],"keyword":["WORKSHOP"],"type":"misc","author":[{"id":"209","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","first_name":"Sybille","full_name":"Hellebrand, Sybille"},{"full_name":"Paulo Teixeira, Joao","last_name":"Paulo Teixeira","first_name":"Joao"},{"full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim","last_name":"Wunderlich"}],"status":"public","year":"1994","title":"Synthesis for Testability - the ARCHIMEDES Approach","date_updated":"2022-01-06T06:51:28Z","language":[{"iso":"eng"}],"_id":"13085","user_id":"659"},{"author":[{"first_name":"Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","full_name":"Hellebrand, Sybille","id":"209"},{"full_name":"Tarnick, Steffen","first_name":"Steffen","last_name":"Tarnick"},{"last_name":"Rajski","first_name":"Janusz","full_name":"Rajski, Janusz"},{"full_name":"Courtois, Bernard","first_name":"Bernard","last_name":"Courtois"}],"title":"Effiziente Erzeugung deterministischer Muster im Selbsttest","year":"1993","status":"public","date_updated":"2022-01-06T06:51:28Z","language":[{"iso":"eng"}],"_id":"13081","user_id":"659","citation":{"apa":"Hellebrand, S., Tarnick, S., Rajski, J., &#38; Courtois, B. (1993). <i>Effiziente Erzeugung deterministischer Muster im Selbsttest</i>. 5th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Holzhau, Germany.","ieee":"S. Hellebrand, S. Tarnick, J. Rajski, and B. Courtois, <i>Effiziente Erzeugung deterministischer Muster im Selbsttest</i>. 5th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Holzhau, Germany, 1993.","chicago":"Hellebrand, Sybille, Steffen Tarnick, Janusz Rajski, and Bernard Courtois. <i>Effiziente Erzeugung Deterministischer Muster Im Selbsttest</i>. 5th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Holzhau, Germany, 1993.","short":"S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, Effiziente Erzeugung Deterministischer Muster Im Selbsttest, 5th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Holzhau, Germany, 1993.","mla":"Hellebrand, Sybille, et al. <i>Effiziente Erzeugung Deterministischer Muster Im Selbsttest</i>. 1993.","ama":"Hellebrand S, Tarnick S, Rajski J, Courtois B. <i>Effiziente Erzeugung Deterministischer Muster Im Selbsttest</i>. 5th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Holzhau, Germany; 1993.","bibtex":"@book{Hellebrand_Tarnick_Rajski_Courtois_1993, place={5th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Holzhau, Germany}, title={Effiziente Erzeugung deterministischer Muster im Selbsttest}, author={Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard}, year={1993} }"},"extern":"1","place":"5th ITG/GI/GME Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\", Holzhau, Germany","date_created":"2019-08-28T12:10:08Z","department":[{"_id":"48"}],"type":"misc","keyword":["WORKSHOP"]},{"status":"public","title":"Synthesis of Self-Testable Controllers","year":"1993","author":[{"id":"209","full_name":"Hellebrand, Sybille","last_name":"Hellebrand","first_name":"Sybille","orcid":"0000-0002-3717-3939"},{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"}],"date_updated":"2022-01-06T06:51:28Z","language":[{"iso":"eng"}],"_id":"13082","user_id":"659","citation":{"short":"S. Hellebrand, H.-J. Wunderlich, Synthesis of Self-Testable Controllers, ARCHIMEDES Open Workshop on “Synthesis - Architectural Testability Support”, Montpellier, France, 1993.","chicago":"Hellebrand, Sybille, and Hans-Joachim Wunderlich. <i>Synthesis of Self-Testable Controllers</i>. ARCHIMEDES Open Workshop on “Synthesis - Architectural Testability Support”, Montpellier, France, 1993.","ieee":"S. Hellebrand and H.-J. Wunderlich, <i>Synthesis of Self-Testable Controllers</i>. ARCHIMEDES Open Workshop on “Synthesis - Architectural Testability Support”, Montpellier, France, 1993.","apa":"Hellebrand, S., &#38; Wunderlich, H.-J. (1993). <i>Synthesis of Self-Testable Controllers</i>. ARCHIMEDES Open Workshop on “Synthesis - Architectural Testability Support”, Montpellier, France.","bibtex":"@book{Hellebrand_Wunderlich_1993, place={ARCHIMEDES Open Workshop on “Synthesis - Architectural Testability Support”, Montpellier, France}, title={Synthesis of Self-Testable Controllers}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1993} }","ama":"Hellebrand S, Wunderlich H-J. <i>Synthesis of Self-Testable Controllers</i>. ARCHIMEDES Open Workshop on “Synthesis - Architectural Testability Support”, Montpellier, France; 1993.","mla":"Hellebrand, Sybille, and Hans-Joachim Wunderlich. <i>Synthesis of Self-Testable Controllers</i>. 1993."},"extern":"1","date_created":"2019-08-28T12:10:50Z","place":"ARCHIMEDES Open Workshop on \"Synthesis - Architectural Testability Support\", Montpellier, France","type":"misc","keyword":["WORKSHOP"],"department":[{"_id":"48"}]},{"date_created":"2019-08-28T12:05:09Z","place":"IEEE Design for Testability Workshop, Vail, CO, USA","type":"misc","keyword":["WORKSHOP"],"department":[{"_id":"48"}],"citation":{"short":"S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs, IEEE Design for Testability Workshop, Vail, CO, USA, 1992.","ama":"Hellebrand S, Tarnick S, Rajski J, Courtois B. <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. IEEE Design for Testability Workshop, Vail, CO, USA; 1992.","chicago":"Hellebrand, Sybille, Steffen Tarnick, Janusz Rajski, and Bernard Courtois. <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. IEEE Design for Testability Workshop, Vail, CO, USA, 1992.","bibtex":"@book{Hellebrand_Tarnick_Rajski_Courtois_1992, place={IEEE Design for Testability Workshop, Vail, CO, USA}, title={Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs}, author={Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard}, year={1992} }","apa":"Hellebrand, S., Tarnick, S., Rajski, J., &#38; Courtois, B. (1992). <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. IEEE Design for Testability Workshop, Vail, CO, USA.","mla":"Hellebrand, Sybille, et al. <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. 1992.","ieee":"S. Hellebrand, S. Tarnick, J. Rajski, and B. Courtois, <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. IEEE Design for Testability Workshop, Vail, CO, USA, 1992."},"extern":"1","_id":"13076","language":[{"iso":"eng"}],"user_id":"659","status":"public","title":"Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs","year":"1992","author":[{"id":"209","first_name":"Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille"},{"full_name":"Tarnick, Steffen","first_name":"Steffen","last_name":"Tarnick"},{"full_name":"Rajski, Janusz","first_name":"Janusz","last_name":"Rajski"},{"full_name":"Courtois, Bernard","last_name":"Courtois","first_name":"Bernard"}],"date_updated":"2022-01-06T06:51:28Z"},{"date_updated":"2022-01-06T06:51:28Z","author":[{"first_name":"Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","id":"209"},{"last_name":"Tarnick","first_name":"Steffen","full_name":"Tarnick, Steffen"},{"full_name":"Rajski, Janusz","last_name":"Rajski","first_name":"Janusz"},{"last_name":"Courtois","first_name":"Bernard","full_name":"Courtois, Bernard"}],"title":"Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs","year":"1992","status":"public","user_id":"659","_id":"13080","language":[{"iso":"eng"}],"extern":"1","citation":{"chicago":"Hellebrand, Sybille, Steffen Tarnick, Janusz Rajski, and Bernard Courtois. <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. Workshop on New Directions for Testing, Montreal, Canada, 1992.","short":"S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs, Workshop on New Directions for Testing, Montreal, Canada, 1992.","apa":"Hellebrand, S., Tarnick, S., Rajski, J., &#38; Courtois, B. (1992). <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. Workshop on New Directions for Testing, Montreal, Canada.","ieee":"S. Hellebrand, S. Tarnick, J. Rajski, and B. Courtois, <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. Workshop on New Directions for Testing, Montreal, Canada, 1992.","ama":"Hellebrand S, Tarnick S, Rajski J, Courtois B. <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. Workshop on New Directions for Testing, Montreal, Canada; 1992.","bibtex":"@book{Hellebrand_Tarnick_Rajski_Courtois_1992, place={Workshop on New Directions for Testing, Montreal, Canada}, title={Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs}, author={Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard}, year={1992} }","mla":"Hellebrand, Sybille, et al. <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. 1992."},"department":[{"_id":"48"}],"type":"misc","keyword":["WORKSHOP"],"date_created":"2019-08-28T12:09:07Z","place":"Workshop on New Directions for Testing, Montreal, Canada"},{"user_id":"659","language":[{"iso":"eng"}],"_id":"13103","date_updated":"2022-01-06T06:51:28Z","author":[{"id":"209","full_name":"Hellebrand, Sybille","last_name":"Hellebrand","first_name":"Sybille","orcid":"0000-0002-3717-3939"},{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"},{"full_name":"F. Haberl, Oliver","first_name":"Oliver","last_name":"F. Haberl"}],"title":"Generating Pseudo-Exhaustive Vectors for External Testing","status":"public","year":"1990","department":[{"_id":"48"}],"type":"misc","keyword":["WORKSHOP"],"date_created":"2019-08-28T12:23:40Z","place":"IEEE Design for Testability Workshop, Vail, CO, USA","extern":"1","citation":{"chicago":"Hellebrand, Sybille, Hans-Joachim Wunderlich, and Oliver F. Haberl. <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail, CO, USA, 1990.","short":"S. Hellebrand, H.-J. Wunderlich, O. F. Haberl, Generating Pseudo-Exhaustive Vectors for External Testing, IEEE Design for Testability Workshop, Vail, CO, USA, 1990.","apa":"Hellebrand, S., Wunderlich, H.-J., &#38; F. Haberl, O. (1990). <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail, CO, USA.","ieee":"S. Hellebrand, H.-J. Wunderlich, and O. F. Haberl, <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail, CO, USA, 1990.","ama":"Hellebrand S, Wunderlich H-J, F. Haberl O. <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail, CO, USA; 1990.","bibtex":"@book{Hellebrand_Wunderlich_F. Haberl_1990, place={IEEE Design for Testability Workshop, Vail, CO, USA}, title={Generating Pseudo-Exhaustive Vectors for External Testing}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and F. Haberl, Oliver}, year={1990} }","mla":"Hellebrand, Sybille, et al. <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. 1990."}}]