---
_id: '13100'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Armin
  full_name: Wuertenberger, Armin
  last_name: Wuertenberger
- first_name: Christofer
  full_name: S. Tautermann, Christofer
  last_name: S. Tautermann
citation:
  ama: Hellebrand S, Wuertenberger A, S. Tautermann C. <i>Data Compression for Multiple
    Scan Chains Using Dictionaries with Corrections</i>. 9th IEEE European Test Symposium,
    Ajaccio, Corsica, France; 2004.
  apa: Hellebrand, S., Wuertenberger, A., &#38; S. Tautermann, C. (2004). <i>Data
    Compression for Multiple Scan Chains Using Dictionaries with Corrections</i>.
    9th IEEE European Test Symposium, Ajaccio, Corsica, France.
  bibtex: '@book{Hellebrand_Wuertenberger_S. Tautermann_2004, place={9th IEEE European
    Test Symposium, Ajaccio, Corsica, France}, title={Data Compression for Multiple
    Scan Chains Using Dictionaries with Corrections}, author={Hellebrand, Sybille
    and Wuertenberger, Armin and S. Tautermann, Christofer}, year={2004} }'
  chicago: Hellebrand, Sybille, Armin Wuertenberger, and Christofer S. Tautermann.
    <i>Data Compression for Multiple Scan Chains Using Dictionaries with Corrections</i>.
    9th IEEE European Test Symposium, Ajaccio, Corsica, France, 2004.
  ieee: S. Hellebrand, A. Wuertenberger, and C. S. Tautermann, <i>Data Compression
    for Multiple Scan Chains Using Dictionaries with Corrections</i>. 9th IEEE European
    Test Symposium, Ajaccio, Corsica, France, 2004.
  mla: Hellebrand, Sybille, et al. <i>Data Compression for Multiple Scan Chains Using
    Dictionaries with Corrections</i>. 2004.
  short: S. Hellebrand, A. Wuertenberger, C. S. Tautermann, Data Compression for Multiple
    Scan Chains Using Dictionaries with Corrections, 9th IEEE European Test Symposium,
    Ajaccio, Corsica, France, 2004.
date_created: 2019-08-28T12:21:58Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: 9th IEEE European Test Symposium, Ajaccio, Corsica, France
status: public
title: Data Compression for Multiple Scan Chains Using Dictionaries with Corrections
type: misc
user_id: '659'
year: '2004'
...
---
_id: '13097'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Armin
  full_name: Wuertenberger, Armin
  last_name: Wuertenberger
citation:
  ama: 'Hellebrand S, Wuertenberger A. <i>Alternating Run-Length Coding: A Technique
    for Improved Test Data Compression</i>. IEEE International Workshop on Test Resource
    Partitioning, Baltimore, MD, USA; 2002.'
  apa: 'Hellebrand, S., &#38; Wuertenberger, A. (2002). <i>Alternating Run-Length
    Coding: A Technique for Improved Test Data Compression</i>. IEEE International
    Workshop on Test Resource Partitioning, Baltimore, MD, USA.'
  bibtex: '@book{Hellebrand_Wuertenberger_2002, place={IEEE International Workshop
    on Test Resource Partitioning, Baltimore, MD, USA}, title={Alternating Run-Length
    Coding: A Technique for Improved Test Data Compression}, author={Hellebrand, Sybille
    and Wuertenberger, Armin}, year={2002} }'
  chicago: 'Hellebrand, Sybille, and Armin Wuertenberger. <i>Alternating Run-Length
    Coding: A Technique for Improved Test Data Compression</i>. IEEE International
    Workshop on Test Resource Partitioning, Baltimore, MD, USA, 2002.'
  ieee: 'S. Hellebrand and A. Wuertenberger, <i>Alternating Run-Length Coding: A Technique
    for Improved Test Data Compression</i>. IEEE International Workshop on Test Resource
    Partitioning, Baltimore, MD, USA, 2002.'
  mla: 'Hellebrand, Sybille, and Armin Wuertenberger. <i>Alternating Run-Length Coding:
    A Technique for Improved Test Data Compression</i>. 2002.'
  short: 'S. Hellebrand, A. Wuertenberger, Alternating Run-Length Coding: A Technique
    for Improved Test Data Compression, IEEE International Workshop on Test Resource
    Partitioning, Baltimore, MD, USA, 2002.'
date_created: 2019-08-28T12:19:54Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA
status: public
title: 'Alternating Run-Length Coding: A Technique for Improved Test Data Compression'
type: misc
user_id: '659'
year: '2002'
...
---
_id: '13096'
author:
- first_name: Hua-Guo
  full_name: Liang, Hua-Guo
  last_name: Liang
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
citation:
  ama: Liang H-G, Hellebrand S, Wunderlich H-J. <i>Two-Dimensional Test Data Compression
    for Scan-Based Deterministic BIST</i>. IEEE European Test Workshop, Stockholm,
    Sweden; 2001.
  apa: Liang, H.-G., Hellebrand, S., &#38; Wunderlich, H.-J. (2001). <i>Two-Dimensional
    Test Data Compression for Scan-Based Deterministic BIST</i>. IEEE European Test
    Workshop, Stockholm, Sweden.
  bibtex: '@book{Liang_Hellebrand_Wunderlich_2001, place={IEEE European Test Workshop,
    Stockholm, Sweden}, title={Two-Dimensional Test Data Compression for Scan-Based
    Deterministic BIST}, author={Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich,
    Hans-Joachim}, year={2001} }'
  chicago: Liang, Hua-Guo, Sybille Hellebrand, and Hans-Joachim Wunderlich. <i>Two-Dimensional
    Test Data Compression for Scan-Based Deterministic BIST</i>. IEEE European Test
    Workshop, Stockholm, Sweden, 2001.
  ieee: H.-G. Liang, S. Hellebrand, and H.-J. Wunderlich, <i>Two-Dimensional Test
    Data Compression for Scan-Based Deterministic BIST</i>. IEEE European Test Workshop,
    Stockholm, Sweden, 2001.
  mla: Liang, Hua-Guo, et al. <i>Two-Dimensional Test Data Compression for Scan-Based
    Deterministic BIST</i>. 2001.
  short: H.-G. Liang, S. Hellebrand, H.-J. Wunderlich, Two-Dimensional Test Data Compression
    for Scan-Based Deterministic BIST, IEEE European Test Workshop, Stockholm, Sweden,
    2001.
date_created: 2019-08-28T12:19:25Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: IEEE European Test Workshop, Stockholm, Sweden
status: public
title: Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST
type: misc
user_id: '659'
year: '2001'
...
---
_id: '13095'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Hua-Guo
  full_name: Liang, Hua-Guo
  last_name: Liang
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
citation:
  ama: Hellebrand S, Liang H-G, Wunderlich H-J. <i>A Mixed Mode BIST Scheme Based
    on Reseeding of Folding Counters</i>. IEEE European Test Workshop, Cascais, Portugal;
    2000.
  apa: Hellebrand, S., Liang, H.-G., &#38; Wunderlich, H.-J. (2000). <i>A Mixed Mode
    BIST Scheme Based on Reseeding of Folding Counters</i>. IEEE European Test Workshop,
    Cascais, Portugal.
  bibtex: '@book{Hellebrand_Liang_Wunderlich_2000, place={IEEE European Test Workshop,
    Cascais, Portugal}, title={A Mixed Mode BIST Scheme Based on Reseeding of Folding
    Counters}, author={Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim},
    year={2000} }'
  chicago: Hellebrand, Sybille, Hua-Guo Liang, and Hans-Joachim Wunderlich. <i>A Mixed
    Mode BIST Scheme Based on Reseeding of Folding Counters</i>. IEEE European Test
    Workshop, Cascais, Portugal, 2000.
  ieee: S. Hellebrand, H.-G. Liang, and H.-J. Wunderlich, <i>A Mixed Mode BIST Scheme
    Based on Reseeding of Folding Counters</i>. IEEE European Test Workshop, Cascais,
    Portugal, 2000.
  mla: Hellebrand, Sybille, et al. <i>A Mixed Mode BIST Scheme Based on Reseeding
    of Folding Counters</i>. 2000.
  short: S. Hellebrand, H.-G. Liang, H.-J. Wunderlich, A Mixed Mode BIST Scheme Based
    on Reseeding of Folding Counters, IEEE European Test Workshop, Cascais, Portugal,
    2000.
date_created: 2019-08-28T12:18:56Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: IEEE European Test Workshop, Cascais, Portugal
status: public
title: A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters
type: misc
user_id: '659'
year: '2000'
...
---
_id: '13093'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
- first_name: Vyacheslav
  full_name: N. Yarmolik, Vyacheslav
  last_name: N. Yarmolik
citation:
  ama: Hellebrand S, Wunderlich H-J, N. Yarmolik V. <i>Exploiting Symmetries to Speed
    Up Transparent BIST</i>. 11th GI/ITG/GMM/IEEE Workshop; 1999.
  apa: Hellebrand, S., Wunderlich, H.-J., &#38; N. Yarmolik, V. (1999). <i>Exploiting
    Symmetries to Speed Up Transparent BIST</i>. 11th GI/ITG/GMM/IEEE Workshop.
  bibtex: '@book{Hellebrand_Wunderlich_N. Yarmolik_1999, place={11th GI/ITG/GMM/IEEE
    Workshop}, title={Exploiting Symmetries to Speed Up Transparent BIST}, author={Hellebrand,
    Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav}, year={1999}
    }'
  chicago: Hellebrand, Sybille, Hans-Joachim Wunderlich, and Vyacheslav N. Yarmolik.
    <i>Exploiting Symmetries to Speed Up Transparent BIST</i>. 11th GI/ITG/GMM/IEEE
    Workshop, 1999.
  ieee: S. Hellebrand, H.-J. Wunderlich, and V. N. Yarmolik, <i>Exploiting Symmetries
    to Speed Up Transparent BIST</i>. 11th GI/ITG/GMM/IEEE Workshop, 1999.
  mla: Hellebrand, Sybille, et al. <i>Exploiting Symmetries to Speed Up Transparent
    BIST</i>. 1999.
  short: S. Hellebrand, H.-J. Wunderlich, V. N. Yarmolik, Exploiting Symmetries to
    Speed Up Transparent BIST, 11th GI/ITG/GMM/IEEE Workshop, 1999.
date_created: 2019-08-28T12:17:07Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: 11th GI/ITG/GMM/IEEE Workshop
status: public
title: Exploiting Symmetries to Speed Up Transparent BIST
type: misc
user_id: '659'
year: '1999'
...
---
_id: '13091'
author:
- first_name: Vyacheslav
  full_name: N. Yarmolik, Vyacheslav
  last_name: N. Yarmolik
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
citation:
  ama: N. Yarmolik V, Hellebrand S, Wunderlich H-J. <i>Efficient Consistency Checking
    for Embedded Memories</i>. 5th IEEE International Test Synthesis Workshop, Santa
    Barbara, CA, USA; 1998.
  apa: N. Yarmolik, V., Hellebrand, S., &#38; Wunderlich, H.-J. (1998). <i>Efficient
    Consistency Checking for Embedded Memories</i>. 5th IEEE International Test Synthesis
    Workshop, Santa Barbara, CA, USA.
  bibtex: '@book{N. Yarmolik_Hellebrand_Wunderlich_1998, place={5th IEEE International
    Test Synthesis Workshop, Santa Barbara, CA, USA}, title={Efficient Consistency
    Checking for Embedded Memories}, author={N. Yarmolik, Vyacheslav and Hellebrand,
    Sybille and Wunderlich, Hans-Joachim}, year={1998} }'
  chicago: N. Yarmolik, Vyacheslav, Sybille Hellebrand, and Hans-Joachim Wunderlich.
    <i>Efficient Consistency Checking for Embedded Memories</i>. 5th IEEE International
    Test Synthesis Workshop, Santa Barbara, CA, USA, 1998.
  ieee: V. N. Yarmolik, S. Hellebrand, and H.-J. Wunderlich, <i>Efficient Consistency
    Checking for Embedded Memories</i>. 5th IEEE International Test Synthesis Workshop,
    Santa Barbara, CA, USA, 1998.
  mla: N. Yarmolik, Vyacheslav, et al. <i>Efficient Consistency Checking for Embedded
    Memories</i>. 1998.
  short: V. N. Yarmolik, S. Hellebrand, H.-J. Wunderlich, Efficient Consistency Checking
    for Embedded Memories, 5th IEEE International Test Synthesis Workshop, Santa Barbara,
    CA, USA, 1998.
date_created: 2019-08-28T12:16:04Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: 5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA
status: public
title: Efficient Consistency Checking for Embedded Memories
type: misc
user_id: '659'
year: '1998'
...
---
_id: '13092'
author:
- first_name: Vyacheslav
  full_name: N. Yarmolik, Vyacheslav
  last_name: N. Yarmolik
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
citation:
  ama: N. Yarmolik V, Hellebrand S, Wunderlich H-J. <i>Efficient Consistency Checking
    for Embedded Memories</i>. 10th GI/ITG/GMM/IEEE Workshop; 1998.
  apa: N. Yarmolik, V., Hellebrand, S., &#38; Wunderlich, H.-J. (1998). <i>Efficient
    Consistency Checking for Embedded Memories</i>. 10th GI/ITG/GMM/IEEE Workshop.
  bibtex: '@book{N. Yarmolik_Hellebrand_Wunderlich_1998, place={10th GI/ITG/GMM/IEEE
    Workshop}, title={Efficient Consistency Checking for Embedded Memories}, author={N.
    Yarmolik, Vyacheslav and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1998}
    }'
  chicago: N. Yarmolik, Vyacheslav, Sybille Hellebrand, and Hans-Joachim Wunderlich.
    <i>Efficient Consistency Checking for Embedded Memories</i>. 10th GI/ITG/GMM/IEEE
    Workshop, 1998.
  ieee: V. N. Yarmolik, S. Hellebrand, and H.-J. Wunderlich, <i>Efficient Consistency
    Checking for Embedded Memories</i>. 10th GI/ITG/GMM/IEEE Workshop, 1998.
  mla: N. Yarmolik, Vyacheslav, et al. <i>Efficient Consistency Checking for Embedded
    Memories</i>. 1998.
  short: V. N. Yarmolik, S. Hellebrand, H.-J. Wunderlich, Efficient Consistency Checking
    for Embedded Memories, 10th GI/ITG/GMM/IEEE Workshop, 1998.
date_created: 2019-08-28T12:16:34Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: 10th GI/ITG/GMM/IEEE Workshop
status: public
title: Efficient Consistency Checking for Embedded Memories
type: misc
user_id: '659'
year: '1998'
...
---
_id: '13089'
author:
- first_name: Kun-Han
  full_name: Tsai, Kun-Han
  last_name: Tsai
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Janusz
  full_name: Rajski, Janusz
  last_name: Rajski
- first_name: Malgorzata
  full_name: Marek-Sadowska, Malgorzata
  last_name: Marek-Sadowska
citation:
  ama: 'Tsai K-H, Hellebrand S, Rajski J, Marek-Sadowska M. <i>STARBIST: Scan Autocorrelated
    Random Pattern Generation</i>. 4th IEEE International Test Synthesis Workshop,
    Santa Barbara, CA, USA; 1997.'
  apa: 'Tsai, K.-H., Hellebrand, S., Rajski, J., &#38; Marek-Sadowska, M. (1997).
    <i>STARBIST: Scan Autocorrelated Random Pattern Generation</i>. 4th IEEE International
    Test Synthesis Workshop, Santa Barbara, CA, USA.'
  bibtex: '@book{Tsai_Hellebrand_Rajski_Marek-Sadowska_1997, place={4th IEEE International
    Test Synthesis Workshop, Santa Barbara, CA, USA}, title={STARBIST: Scan Autocorrelated
    Random Pattern Generation}, author={Tsai, Kun-Han and Hellebrand, Sybille and
    Rajski, Janusz and Marek-Sadowska, Malgorzata}, year={1997} }'
  chicago: 'Tsai, Kun-Han, Sybille Hellebrand, Janusz Rajski, and Malgorzata Marek-Sadowska.
    <i>STARBIST: Scan Autocorrelated Random Pattern Generation</i>. 4th IEEE International
    Test Synthesis Workshop, Santa Barbara, CA, USA, 1997.'
  ieee: 'K.-H. Tsai, S. Hellebrand, J. Rajski, and M. Marek-Sadowska, <i>STARBIST:
    Scan Autocorrelated Random Pattern Generation</i>. 4th IEEE International Test
    Synthesis Workshop, Santa Barbara, CA, USA, 1997.'
  mla: 'Tsai, Kun-Han, et al. <i>STARBIST: Scan Autocorrelated Random Pattern Generation</i>.
    1997.'
  short: 'K.-H. Tsai, S. Hellebrand, J. Rajski, M. Marek-Sadowska, STARBIST: Scan
    Autocorrelated Random Pattern Generation, 4th IEEE International Test Synthesis
    Workshop, Santa Barbara, CA, USA, 1997.'
date_created: 2019-08-28T12:15:05Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA
status: public
title: 'STARBIST: Scan Autocorrelated Random Pattern Generation'
type: misc
user_id: '659'
year: '1997'
...
---
_id: '13090'
author:
- first_name: Andre
  full_name: Hertwig, Andre
  last_name: Hertwig
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
citation:
  ama: Hertwig A, Hellebrand S, Wunderlich H-J. <i>Synthesis of Fast On-Line Testable
    Controllers for Data-Dominated Applications</i>. 3rd IEEE International On-Line
    Testing Workshop, Crete, Greece; 1997.
  apa: Hertwig, A., Hellebrand, S., &#38; Wunderlich, H.-J. (1997). <i>Synthesis of
    Fast On-Line Testable Controllers for Data-Dominated Applications</i>. 3rd IEEE
    International On-Line Testing Workshop, Crete, Greece.
  bibtex: '@book{Hertwig_Hellebrand_Wunderlich_1997, place={3rd IEEE International
    On-Line Testing Workshop, Crete, Greece}, title={Synthesis of Fast On-Line Testable
    Controllers for Data-Dominated Applications}, author={Hertwig, Andre and Hellebrand,
    Sybille and Wunderlich, Hans-Joachim}, year={1997} }'
  chicago: Hertwig, Andre, Sybille Hellebrand, and Hans-Joachim Wunderlich. <i>Synthesis
    of Fast On-Line Testable Controllers for Data-Dominated Applications</i>. 3rd
    IEEE International On-Line Testing Workshop, Crete, Greece, 1997.
  ieee: A. Hertwig, S. Hellebrand, and H.-J. Wunderlich, <i>Synthesis of Fast On-Line
    Testable Controllers for Data-Dominated Applications</i>. 3rd IEEE International
    On-Line Testing Workshop, Crete, Greece, 1997.
  mla: Hertwig, Andre, et al. <i>Synthesis of Fast On-Line Testable Controllers for
    Data-Dominated Applications</i>. 1997.
  short: A. Hertwig, S. Hellebrand, H.-J. Wunderlich, Synthesis of Fast On-Line Testable
    Controllers for Data-Dominated Applications, 3rd IEEE International On-Line Testing
    Workshop, Crete, Greece, 1997.
date_created: 2019-08-28T12:15:36Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: 3rd IEEE International On-Line Testing Workshop, Crete, Greece
status: public
title: Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications
type: misc
user_id: '659'
year: '1997'
...
---
_id: '13087'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
citation:
  ama: Hellebrand S, Wunderlich H-J. <i>Using Embedded Processors for BIST</i>. 3rd
    IEEE International Test Synthesis Workshop, Santa Barbara, CA; 1996.
  apa: Hellebrand, S., &#38; Wunderlich, H.-J. (1996). <i>Using Embedded Processors
    for BIST</i>. 3rd IEEE International Test Synthesis Workshop, Santa Barbara, CA.
  bibtex: '@book{Hellebrand_Wunderlich_1996, place={3rd IEEE International Test Synthesis
    Workshop, Santa Barbara, CA}, title={Using Embedded Processors for BIST}, author={Hellebrand,
    Sybille and Wunderlich, Hans-Joachim}, year={1996} }'
  chicago: Hellebrand, Sybille, and Hans-Joachim Wunderlich. <i>Using Embedded Processors
    for BIST</i>. 3rd IEEE International Test Synthesis Workshop, Santa Barbara, CA,
    1996.
  ieee: S. Hellebrand and H.-J. Wunderlich, <i>Using Embedded Processors for BIST</i>.
    3rd IEEE International Test Synthesis Workshop, Santa Barbara, CA, 1996.
  mla: Hellebrand, Sybille, and Hans-Joachim Wunderlich. <i>Using Embedded Processors
    for BIST</i>. 1996.
  short: S. Hellebrand, H.-J. Wunderlich, Using Embedded Processors for BIST, 3rd
    IEEE International Test Synthesis Workshop, Santa Barbara, CA, 1996.
date_created: 2019-08-28T12:14:03Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: 3rd IEEE International Test Synthesis Workshop, Santa Barbara, CA
status: public
title: Using Embedded Processors for BIST
type: misc
user_id: '659'
year: '1996'
...
---
_id: '13088'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
- first_name: Andre
  full_name: Hertwig, Andre
  last_name: Hertwig
citation:
  ama: Hellebrand S, Wunderlich H-J, Hertwig A. <i>Mixed-Mode BIST Using Embedded
    Processors</i>. 2nd IEEE International On-Line Testing Workshop. Biarritz, France;
    1996.
  apa: Hellebrand, S., Wunderlich, H.-J., &#38; Hertwig, A. (1996). <i>Mixed-Mode
    BIST Using Embedded Processors</i>. 2nd IEEE International On-Line Testing Workshop.
    Biarritz, France.
  bibtex: '@book{Hellebrand_Wunderlich_Hertwig_1996, place={2nd IEEE International
    On-Line Testing Workshop. Biarritz, France}, title={Mixed-Mode BIST Using Embedded
    Processors}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig,
    Andre}, year={1996} }'
  chicago: Hellebrand, Sybille, Hans-Joachim Wunderlich, and Andre Hertwig. <i>Mixed-Mode
    BIST Using Embedded Processors</i>. 2nd IEEE International On-Line Testing Workshop.
    Biarritz, France, 1996.
  ieee: S. Hellebrand, H.-J. Wunderlich, and A. Hertwig, <i>Mixed-Mode BIST Using
    Embedded Processors</i>. 2nd IEEE International On-Line Testing Workshop. Biarritz,
    France, 1996.
  mla: Hellebrand, Sybille, et al. <i>Mixed-Mode BIST Using Embedded Processors</i>.
    1996.
  short: S. Hellebrand, H.-J. Wunderlich, A. Hertwig, Mixed-Mode BIST Using Embedded
    Processors, 2nd IEEE International On-Line Testing Workshop. Biarritz, France,
    1996.
date_created: 2019-08-28T12:14:35Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: 2nd IEEE International On-Line Testing Workshop. Biarritz, France
status: public
title: Mixed-Mode BIST Using Embedded Processors
type: misc
user_id: '659'
year: '1996'
...
---
_id: '13086'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Birgit
  full_name: Reeb, Birgit
  last_name: Reeb
- first_name: Steffen
  full_name: Tarnick, Steffen
  last_name: Tarnick
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
citation:
  ama: Hellebrand S, Reeb B, Tarnick S, Wunderlich H-J. <i>Pattern Generation for
    a Deterministic BIST Scheme</i>. 2nd IEEE International Test Synthesis Workshop,
    Santa Barbara, CA; 1995.
  apa: Hellebrand, S., Reeb, B., Tarnick, S., &#38; Wunderlich, H.-J. (1995). <i>Pattern
    Generation for a Deterministic BIST Scheme</i>. 2nd IEEE International Test Synthesis
    Workshop, Santa Barbara, CA.
  bibtex: '@book{Hellebrand_Reeb_Tarnick_Wunderlich_1995, place={2nd IEEE International
    Test Synthesis Workshop, Santa Barbara, CA}, title={Pattern Generation for a Deterministic
    BIST Scheme}, author={Hellebrand, Sybille and Reeb, Birgit and Tarnick, Steffen
    and Wunderlich, Hans-Joachim}, year={1995} }'
  chicago: Hellebrand, Sybille, Birgit Reeb, Steffen Tarnick, and Hans-Joachim Wunderlich.
    <i>Pattern Generation for a Deterministic BIST Scheme</i>. 2nd IEEE International
    Test Synthesis Workshop, Santa Barbara, CA, 1995.
  ieee: S. Hellebrand, B. Reeb, S. Tarnick, and H.-J. Wunderlich, <i>Pattern Generation
    for a Deterministic BIST Scheme</i>. 2nd IEEE International Test Synthesis Workshop,
    Santa Barbara, CA, 1995.
  mla: Hellebrand, Sybille, et al. <i>Pattern Generation for a Deterministic BIST
    Scheme</i>. 1995.
  short: S. Hellebrand, B. Reeb, S. Tarnick, H.-J. Wunderlich, Pattern Generation
    for a Deterministic BIST Scheme, 2nd IEEE International Test Synthesis Workshop,
    Santa Barbara, CA, 1995.
date_created: 2019-08-28T12:13:37Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: 2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA
status: public
title: Pattern Generation for a Deterministic BIST Scheme
type: misc
user_id: '659'
year: '1995'
...
---
_id: '13083'
author:
- first_name: Srikanth
  full_name: Venkataraman, Srikanth
  last_name: Venkataraman
- first_name: Janusz
  full_name: Rajski, Janusz
  last_name: Rajski
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Steffen
  full_name: Tarnick, Steffen
  last_name: Tarnick
citation:
  ama: Venkataraman S, Rajski J, Hellebrand S, Tarnick S. <i>Effiziente Testsatzkodierung
    Für Prüfpfad-Basierte Selbsttestarchitekturen</i>. 6th ITG/GI/GME Workshop “Testmethoden
    und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands; 1994.
  apa: Venkataraman, S., Rajski, J., Hellebrand, S., &#38; Tarnick, S. (1994). <i>Effiziente
    Testsatzkodierung für Prüfpfad-basierte Selbsttestarchitekturen</i>. 6th ITG/GI/GME
    Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals,
    The Netherlands.
  bibtex: '@book{Venkataraman_Rajski_Hellebrand_Tarnick_1994, place={6th ITG/GI/GME
    Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals,
    The Netherlands}, title={Effiziente Testsatzkodierung für Prüfpfad-basierte Selbsttestarchitekturen},
    author={Venkataraman, Srikanth and Rajski, Janusz and Hellebrand, Sybille and
    Tarnick, Steffen}, year={1994} }'
  chicago: Venkataraman, Srikanth, Janusz Rajski, Sybille Hellebrand, and Steffen
    Tarnick. <i>Effiziente Testsatzkodierung Für Prüfpfad-Basierte Selbsttestarchitekturen</i>.
    6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und
    Systemen”, Vaals, The Netherlands, 1994.
  ieee: S. Venkataraman, J. Rajski, S. Hellebrand, and S. Tarnick, <i>Effiziente Testsatzkodierung
    für Prüfpfad-basierte Selbsttestarchitekturen</i>. 6th ITG/GI/GME Workshop “Testmethoden
    und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands, 1994.
  mla: Venkataraman, Srikanth, et al. <i>Effiziente Testsatzkodierung Für Prüfpfad-Basierte
    Selbsttestarchitekturen</i>. 1994.
  short: S. Venkataraman, J. Rajski, S. Hellebrand, S. Tarnick, Effiziente Testsatzkodierung
    Für Prüfpfad-Basierte Selbsttestarchitekturen, 6th ITG/GI/GME Workshop “Testmethoden
    und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands, 1994.
date_created: 2019-08-28T12:11:20Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: 6th ITG/GI/GME Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und
  Systemen", Vaals, The Netherlands
status: public
title: Effiziente Testsatzkodierung für Prüfpfad-basierte Selbsttestarchitekturen
type: misc
user_id: '659'
year: '1994'
...
---
_id: '13084'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
citation:
  ama: Hellebrand S, Wunderlich H-J. <i>Ein Verfahren Zur Testfreundlichen Steuerwerkssynthese</i>.
    6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und
    Systemen”, Vaals, The Netherlands; 1994.
  apa: Hellebrand, S., &#38; Wunderlich, H.-J. (1994). <i>Ein Verfahren zur testfreundlichen
    Steuerwerkssynthese</i>. 6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit
    von Schaltungen und Systemen”, Vaals, The Netherlands.
  bibtex: '@book{Hellebrand_Wunderlich_1994, place={6th ITG/GI/GME Workshop “Testmethoden
    und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands}, title={Ein
    Verfahren zur testfreundlichen Steuerwerkssynthese}, author={Hellebrand, Sybille
    and Wunderlich, Hans-Joachim}, year={1994} }'
  chicago: Hellebrand, Sybille, and Hans-Joachim Wunderlich. <i>Ein Verfahren Zur
    Testfreundlichen Steuerwerkssynthese</i>. 6th ITG/GI/GME Workshop “Testmethoden
    und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands, 1994.
  ieee: S. Hellebrand and H.-J. Wunderlich, <i>Ein Verfahren zur testfreundlichen
    Steuerwerkssynthese</i>. 6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit
    von Schaltungen und Systemen”, Vaals, The Netherlands, 1994.
  mla: Hellebrand, Sybille, and Hans-Joachim Wunderlich. <i>Ein Verfahren Zur Testfreundlichen
    Steuerwerkssynthese</i>. 1994.
  short: S. Hellebrand, H.-J. Wunderlich, Ein Verfahren Zur Testfreundlichen Steuerwerkssynthese,
    6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und
    Systemen”, Vaals, The Netherlands, 1994.
date_created: 2019-08-28T12:11:57Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: 6th ITG/GI/GME Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und
  Systemen", Vaals, The Netherlands
status: public
title: Ein Verfahren zur testfreundlichen Steuerwerkssynthese
type: misc
user_id: '659'
year: '1994'
...
---
_id: '13085'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Joao
  full_name: Paulo Teixeira, Joao
  last_name: Paulo Teixeira
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
citation:
  ama: Hellebrand S, Paulo Teixeira J, Wunderlich H-J. <i>Synthesis for Testability
    - the ARCHIMEDES Approach</i>. 1st IEEE International Test Synthesis Workshop,
    Santa Barbara, CA, USA; 1994.
  apa: Hellebrand, S., Paulo Teixeira, J., &#38; Wunderlich, H.-J. (1994). <i>Synthesis
    for Testability - the ARCHIMEDES Approach</i>. 1st IEEE International Test Synthesis
    Workshop, Santa Barbara, CA, USA.
  bibtex: '@book{Hellebrand_Paulo Teixeira_Wunderlich_1994, place={1st IEEE International
    Test Synthesis Workshop, Santa Barbara, CA, USA}, title={Synthesis for Testability
    - the ARCHIMEDES Approach}, author={Hellebrand, Sybille and Paulo Teixeira, Joao
    and Wunderlich, Hans-Joachim}, year={1994} }'
  chicago: Hellebrand, Sybille, Joao Paulo Teixeira, and Hans-Joachim Wunderlich.
    <i>Synthesis for Testability - the ARCHIMEDES Approach</i>. 1st IEEE International
    Test Synthesis Workshop, Santa Barbara, CA, USA, 1994.
  ieee: S. Hellebrand, J. Paulo Teixeira, and H.-J. Wunderlich, <i>Synthesis for Testability
    - the ARCHIMEDES Approach</i>. 1st IEEE International Test Synthesis Workshop,
    Santa Barbara, CA, USA, 1994.
  mla: Hellebrand, Sybille, et al. <i>Synthesis for Testability - the ARCHIMEDES Approach</i>.
    1994.
  short: S. Hellebrand, J. Paulo Teixeira, H.-J. Wunderlich, Synthesis for Testability
    - the ARCHIMEDES Approach, 1st IEEE International Test Synthesis Workshop, Santa
    Barbara, CA, USA, 1994.
date_created: 2019-08-28T12:13:01Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: 1st IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA
status: public
title: Synthesis for Testability - the ARCHIMEDES Approach
type: misc
user_id: '659'
year: '1994'
...
---
_id: '13081'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Steffen
  full_name: Tarnick, Steffen
  last_name: Tarnick
- first_name: Janusz
  full_name: Rajski, Janusz
  last_name: Rajski
- first_name: Bernard
  full_name: Courtois, Bernard
  last_name: Courtois
citation:
  ama: Hellebrand S, Tarnick S, Rajski J, Courtois B. <i>Effiziente Erzeugung Deterministischer
    Muster Im Selbsttest</i>. 5th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit
    von Schaltungen und Systemen”, Holzhau, Germany; 1993.
  apa: Hellebrand, S., Tarnick, S., Rajski, J., &#38; Courtois, B. (1993). <i>Effiziente
    Erzeugung deterministischer Muster im Selbsttest</i>. 5th ITG/GI/GME Workshop
    “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Holzhau, Germany.
  bibtex: '@book{Hellebrand_Tarnick_Rajski_Courtois_1993, place={5th ITG/GI/GME Workshop
    “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Holzhau, Germany},
    title={Effiziente Erzeugung deterministischer Muster im Selbsttest}, author={Hellebrand,
    Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard}, year={1993}
    }'
  chicago: Hellebrand, Sybille, Steffen Tarnick, Janusz Rajski, and Bernard Courtois.
    <i>Effiziente Erzeugung Deterministischer Muster Im Selbsttest</i>. 5th ITG/GI/GME
    Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Holzhau,
    Germany, 1993.
  ieee: S. Hellebrand, S. Tarnick, J. Rajski, and B. Courtois, <i>Effiziente Erzeugung
    deterministischer Muster im Selbsttest</i>. 5th ITG/GI/GME Workshop “Testmethoden
    und Zuverlässigkeit von Schaltungen und Systemen”, Holzhau, Germany, 1993.
  mla: Hellebrand, Sybille, et al. <i>Effiziente Erzeugung Deterministischer Muster
    Im Selbsttest</i>. 1993.
  short: S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, Effiziente Erzeugung Deterministischer
    Muster Im Selbsttest, 5th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit
    von Schaltungen und Systemen”, Holzhau, Germany, 1993.
date_created: 2019-08-28T12:10:08Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: 5th ITG/GI/GME Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und
  Systemen", Holzhau, Germany
status: public
title: Effiziente Erzeugung deterministischer Muster im Selbsttest
type: misc
user_id: '659'
year: '1993'
...
---
_id: '13082'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
citation:
  ama: Hellebrand S, Wunderlich H-J. <i>Synthesis of Self-Testable Controllers</i>.
    ARCHIMEDES Open Workshop on “Synthesis - Architectural Testability Support”, Montpellier,
    France; 1993.
  apa: Hellebrand, S., &#38; Wunderlich, H.-J. (1993). <i>Synthesis of Self-Testable
    Controllers</i>. ARCHIMEDES Open Workshop on “Synthesis - Architectural Testability
    Support”, Montpellier, France.
  bibtex: '@book{Hellebrand_Wunderlich_1993, place={ARCHIMEDES Open Workshop on “Synthesis
    - Architectural Testability Support”, Montpellier, France}, title={Synthesis of
    Self-Testable Controllers}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim},
    year={1993} }'
  chicago: Hellebrand, Sybille, and Hans-Joachim Wunderlich. <i>Synthesis of Self-Testable
    Controllers</i>. ARCHIMEDES Open Workshop on “Synthesis - Architectural Testability
    Support”, Montpellier, France, 1993.
  ieee: S. Hellebrand and H.-J. Wunderlich, <i>Synthesis of Self-Testable Controllers</i>.
    ARCHIMEDES Open Workshop on “Synthesis - Architectural Testability Support”, Montpellier,
    France, 1993.
  mla: Hellebrand, Sybille, and Hans-Joachim Wunderlich. <i>Synthesis of Self-Testable
    Controllers</i>. 1993.
  short: S. Hellebrand, H.-J. Wunderlich, Synthesis of Self-Testable Controllers,
    ARCHIMEDES Open Workshop on “Synthesis - Architectural Testability Support”, Montpellier,
    France, 1993.
date_created: 2019-08-28T12:10:50Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: ARCHIMEDES Open Workshop on "Synthesis - Architectural Testability Support",
  Montpellier, France
status: public
title: Synthesis of Self-Testable Controllers
type: misc
user_id: '659'
year: '1993'
...
---
_id: '13076'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Steffen
  full_name: Tarnick, Steffen
  last_name: Tarnick
- first_name: Janusz
  full_name: Rajski, Janusz
  last_name: Rajski
- first_name: Bernard
  full_name: Courtois, Bernard
  last_name: Courtois
citation:
  ama: Hellebrand S, Tarnick S, Rajski J, Courtois B. <i>Generation of Vector Patterns
    through Reseeding of Multiple-Polynomial LFSRs</i>. IEEE Design for Testability
    Workshop, Vail, CO, USA; 1992.
  apa: Hellebrand, S., Tarnick, S., Rajski, J., &#38; Courtois, B. (1992). <i>Generation
    of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. IEEE Design
    for Testability Workshop, Vail, CO, USA.
  bibtex: '@book{Hellebrand_Tarnick_Rajski_Courtois_1992, place={IEEE Design for Testability
    Workshop, Vail, CO, USA}, title={Generation of Vector Patterns through Reseeding
    of Multiple-Polynomial LFSRs}, author={Hellebrand, Sybille and Tarnick, Steffen
    and Rajski, Janusz and Courtois, Bernard}, year={1992} }'
  chicago: Hellebrand, Sybille, Steffen Tarnick, Janusz Rajski, and Bernard Courtois.
    <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>.
    IEEE Design for Testability Workshop, Vail, CO, USA, 1992.
  ieee: S. Hellebrand, S. Tarnick, J. Rajski, and B. Courtois, <i>Generation of Vector
    Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. IEEE Design for Testability
    Workshop, Vail, CO, USA, 1992.
  mla: Hellebrand, Sybille, et al. <i>Generation of Vector Patterns through Reseeding
    of Multiple-Polynomial LFSRs</i>. 1992.
  short: S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, Generation of Vector Patterns
    through Reseeding of Multiple-Polynomial LFSRs, IEEE Design for Testability Workshop,
    Vail, CO, USA, 1992.
date_created: 2019-08-28T12:05:09Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: IEEE Design for Testability Workshop, Vail, CO, USA
status: public
title: Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs
type: misc
user_id: '659'
year: '1992'
...
---
_id: '13080'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Steffen
  full_name: Tarnick, Steffen
  last_name: Tarnick
- first_name: Janusz
  full_name: Rajski, Janusz
  last_name: Rajski
- first_name: Bernard
  full_name: Courtois, Bernard
  last_name: Courtois
citation:
  ama: Hellebrand S, Tarnick S, Rajski J, Courtois B. <i>Generation of Vector Patterns
    through Reseeding of Multiple-Polynomial LFSRs</i>. Workshop on New Directions
    for Testing, Montreal, Canada; 1992.
  apa: Hellebrand, S., Tarnick, S., Rajski, J., &#38; Courtois, B. (1992). <i>Generation
    of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. Workshop
    on New Directions for Testing, Montreal, Canada.
  bibtex: '@book{Hellebrand_Tarnick_Rajski_Courtois_1992, place={Workshop on New Directions
    for Testing, Montreal, Canada}, title={Generation of Vector Patterns through Reseeding
    of Multiple-Polynomial LFSRs}, author={Hellebrand, Sybille and Tarnick, Steffen
    and Rajski, Janusz and Courtois, Bernard}, year={1992} }'
  chicago: Hellebrand, Sybille, Steffen Tarnick, Janusz Rajski, and Bernard Courtois.
    <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>.
    Workshop on New Directions for Testing, Montreal, Canada, 1992.
  ieee: S. Hellebrand, S. Tarnick, J. Rajski, and B. Courtois, <i>Generation of Vector
    Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. Workshop on New Directions
    for Testing, Montreal, Canada, 1992.
  mla: Hellebrand, Sybille, et al. <i>Generation of Vector Patterns through Reseeding
    of Multiple-Polynomial LFSRs</i>. 1992.
  short: S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, Generation of Vector Patterns
    through Reseeding of Multiple-Polynomial LFSRs, Workshop on New Directions for
    Testing, Montreal, Canada, 1992.
date_created: 2019-08-28T12:09:07Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: Workshop on New Directions for Testing, Montreal, Canada
status: public
title: Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs
type: misc
user_id: '659'
year: '1992'
...
---
_id: '13103'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
- first_name: Oliver
  full_name: F. Haberl, Oliver
  last_name: F. Haberl
citation:
  ama: Hellebrand S, Wunderlich H-J, F. Haberl O. <i>Generating Pseudo-Exhaustive
    Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail,
    CO, USA; 1990.
  apa: Hellebrand, S., Wunderlich, H.-J., &#38; F. Haberl, O. (1990). <i>Generating
    Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability
    Workshop, Vail, CO, USA.
  bibtex: '@book{Hellebrand_Wunderlich_F. Haberl_1990, place={IEEE Design for Testability
    Workshop, Vail, CO, USA}, title={Generating Pseudo-Exhaustive Vectors for External
    Testing}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and F. Haberl,
    Oliver}, year={1990} }'
  chicago: Hellebrand, Sybille, Hans-Joachim Wunderlich, and Oliver F. Haberl. <i>Generating
    Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability
    Workshop, Vail, CO, USA, 1990.
  ieee: S. Hellebrand, H.-J. Wunderlich, and O. F. Haberl, <i>Generating Pseudo-Exhaustive
    Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail,
    CO, USA, 1990.
  mla: Hellebrand, Sybille, et al. <i>Generating Pseudo-Exhaustive Vectors for External
    Testing</i>. 1990.
  short: S. Hellebrand, H.-J. Wunderlich, O. F. Haberl, Generating Pseudo-Exhaustive
    Vectors for External Testing, IEEE Design for Testability Workshop, Vail, CO,
    USA, 1990.
date_created: 2019-08-28T12:23:40Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: IEEE Design for Testability Workshop, Vail, CO, USA
status: public
title: Generating Pseudo-Exhaustive Vectors for External Testing
type: misc
user_id: '659'
year: '1990'
...