@inproceedings{19421,
  author       = {{Holst, Stefan and Kampmann, Matthias and Sprenger, Alexander and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Weng, Xiaoqing}},
  booktitle    = {{IEEE International Test Conference (ITC'20), November 2020}},
  title        = {{{Logic Fault Diagnosis of Hidden Delay Defects}}},
  year         = {{2020}},
}

@article{13048,
  abstract     = {{Marginal hardware introduces severe reliability threats throughout the life cycle of a system. Although marginalities may not affect the functionality of a circuit immediately after manufacturing, they can degrade into hard failures and must be screened out during manufacturing test to prevent early life failures. Furthermore, their evolution in the field must be proactively monitored by periodic tests before actual failures occur. In recent years small delay faults have gained increasing attention as possible indicators of marginal hardware. However, small delay faults on short paths may be undetectable even with advanced timing aware ATPG. Faster-than-at-speed test (FAST) can detect such hidden delay faults, but so far FAST has mainly been restricted to manufacturing test.}},
  author       = {{Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Schneider, Eric and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  issn         = {{1937-4151}},
  journal      = {{IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)}},
  number       = {{10}},
  pages        = {{1956 -- 1968}},
  publisher    = {{IEEE}},
  title        = {{{Built-in Test for Hidden Delay Faults}}},
  volume       = {{38}},
  year         = {{2019}},
}

@article{13057,
  author       = {{Kampmann, Matthias and Hellebrand, Sybille}},
  journal      = {{Microelectronics Reliability}},
  pages        = {{124--133}},
  title        = {{{Design For Small Delay Test - A Simulation Study}}},
  volume       = {{80}},
  year         = {{2018}},
}

@misc{13072,
  author       = {{Kampmann, Matthias and Hellebrand, Sybille}},
  keywords     = {{WORKSHOP}},
  title        = {{{Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test}}},
  year         = {{2018}},
}

@inproceedings{10575,
  author       = {{Liu, Chang and Schneider, Eric and Kampmann, Matthias and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  booktitle    = {{27th IEEE Asian Test Symposium (ATS'18)}},
  isbn         = {{9781538694664}},
  title        = {{{Extending Aging Monitors for Early Life and Wear-Out Failure Prevention}}},
  doi          = {{10.1109/ats.2018.00028}},
  year         = {{2018}},
}

@misc{13078,
  author       = {{Kampmann, Matthias and Hellebrand, Sybille}},
  keywords     = {{WORKSHOP}},
  title        = {{{X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz}}},
  year         = {{2017}},
}

@inproceedings{10576,
  author       = {{Kampmann, Matthias and Hellebrand, Sybille}},
  booktitle    = {{20th IEEE International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS'17)}},
  isbn         = {{9781538604724}},
  publisher    = {{IEEE}},
  title        = {{{Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test}}},
  doi          = {{10.1109/ddecs.2017.7934564}},
  year         = {{2017}},
}

@inproceedings{12975,
  author       = {{Kampmann, Matthias and Hellebrand, Sybille}},
  booktitle    = {{25th IEEE Asian Test Symposium (ATS'16)}},
  pages        = {{1--6}},
  publisher    = {{IEEE}},
  title        = {{{X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test}}},
  doi          = {{10.1109/ats.2016.20}},
  year         = {{2016}},
}

@inproceedings{12976,
  author       = {{Kampmann, Matthias and A. Kochte, Michael and Schneider, Eric and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  booktitle    = {{24th IEEE Asian Test Symposium (ATS'15)}},
  pages        = {{109--114}},
  publisher    = {{IEEE}},
  title        = {{{Optimized Selection of Frequencies for Faster-Than-at-Speed Test}}},
  doi          = {{10.1109/ats.2015.26}},
  year         = {{2015}},
}

@misc{13077,
  author       = {{Hellebrand, Sybille and Indlekofer, Thomas and Kampmann, Matthias and Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim}},
  keywords     = {{Workshop}},
  title        = {{{Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler}}},
  year         = {{2015}},
}

@inproceedings{12977,
  author       = {{Hellebrand, Sybille and Indlekofer, Thomas and Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim}},
  booktitle    = {{IEEE International Test Conference (ITC'14)}},
  publisher    = {{IEEE}},
  title        = {{{FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects}}},
  doi          = {{10.1109/test.2014.7035360}},
  year         = {{2014}},
}