---
_id: '19421'
author:
- first_name: Stefan
full_name: Holst, Stefan
last_name: Holst
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Alexander
full_name: Sprenger, Alexander
id: '22707'
last_name: Sprenger
- first_name: Jan Dennis
full_name: Reimer, Jan Dennis
id: '36703'
last_name: Reimer
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
- first_name: Xiaoqing
full_name: Weng, Xiaoqing
last_name: Weng
citation:
ama: 'Holst S, Kampmann M, Sprenger A, et al. Logic Fault Diagnosis of Hidden Delay
Defects. In: IEEE International Test Conference (ITC’20), November 2020.
; 2020.'
apa: Holst, S., Kampmann, M., Sprenger, A., Reimer, J. D., Hellebrand, S., Wunderlich,
H.-J., & Weng, X. (2020). Logic Fault Diagnosis of Hidden Delay Defects. IEEE
International Test Conference (ITC’20), November 2020.
bibtex: '@inproceedings{Holst_Kampmann_Sprenger_Reimer_Hellebrand_Wunderlich_Weng_2020,
place={Virtual Conference - Originally Washington, DC, USA}, title={Logic Fault
Diagnosis of Hidden Delay Defects}, booktitle={IEEE International Test Conference
(ITC’20), November 2020}, author={Holst, Stefan and Kampmann, Matthias and Sprenger,
Alexander and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim
and Weng, Xiaoqing}, year={2020} }'
chicago: Holst, Stefan, Matthias Kampmann, Alexander Sprenger, Jan Dennis Reimer,
Sybille Hellebrand, Hans-Joachim Wunderlich, and Xiaoqing Weng. “Logic Fault Diagnosis
of Hidden Delay Defects.” In IEEE International Test Conference (ITC’20), November
2020. Virtual Conference - Originally Washington, DC, USA, 2020.
ieee: S. Holst et al., “Logic Fault Diagnosis of Hidden Delay Defects,” 2020.
mla: Holst, Stefan, et al. “Logic Fault Diagnosis of Hidden Delay Defects.” IEEE
International Test Conference (ITC’20), November 2020, 2020.
short: 'S. Holst, M. Kampmann, A. Sprenger, J.D. Reimer, S. Hellebrand, H.-J. Wunderlich,
X. Weng, in: IEEE International Test Conference (ITC’20), November 2020, Virtual
Conference - Originally Washington, DC, USA, 2020.'
date_created: 2020-09-15T13:56:08Z
date_updated: 2022-05-11T17:08:20Z
department:
- _id: '48'
language:
- iso: eng
place: Virtual Conference - Originally Washington, DC, USA
publication: IEEE International Test Conference (ITC'20), November 2020
publication_status: published
status: public
title: Logic Fault Diagnosis of Hidden Delay Defects
type: conference
user_id: '209'
year: '2020'
...
---
_id: '13048'
abstract:
- lang: eng
text: Marginal hardware introduces severe reliability threats throughout the life
cycle of a system. Although marginalities may not affect the functionality of
a circuit immediately after manufacturing, they can degrade into hard failures
and must be screened out during manufacturing test to prevent early life failures.
Furthermore, their evolution in the field must be proactively monitored by periodic
tests before actual failures occur. In recent years small delay faults have gained
increasing attention as possible indicators of marginal hardware. However, small
delay faults on short paths may be undetectable even with advanced timing aware
ATPG. Faster-than-at-speed test (FAST) can detect such hidden delay faults, but
so far FAST has mainly been restricted to manufacturing test.
author:
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Michael
full_name: A. Kochte, Michael
last_name: A. Kochte
- first_name: Chang
full_name: Liu, Chang
last_name: Liu
- first_name: Eric
full_name: Schneider, Eric
last_name: Schneider
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: Kampmann M, A. Kochte M, Liu C, Schneider E, Hellebrand S, Wunderlich H-J.
Built-in Test for Hidden Delay Faults. IEEE Transactions on Computer-Aided
Design of Integrated Circuits and Systems (TCAD). 2019;38(10):1956-1968.
apa: Kampmann, M., A. Kochte, M., Liu, C., Schneider, E., Hellebrand, S., &
Wunderlich, H.-J. (2019). Built-in Test for Hidden Delay Faults. IEEE Transactions
on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 38(10),
1956–1968.
bibtex: '@article{Kampmann_A. Kochte_Liu_Schneider_Hellebrand_Wunderlich_2019, title={Built-in
Test for Hidden Delay Faults}, volume={38}, number={10}, journal={IEEE Transactions
on Computer-Aided Design of Integrated Circuits and Systems (TCAD)}, publisher={IEEE},
author={Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Schneider,
Eric and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2019}, pages={1956–1968}
}'
chicago: 'Kampmann, Matthias, Michael A. Kochte, Chang Liu, Eric Schneider, Sybille
Hellebrand, and Hans-Joachim Wunderlich. “Built-in Test for Hidden Delay Faults.”
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
(TCAD) 38, no. 10 (2019): 1956–68.'
ieee: M. Kampmann, M. A. Kochte, C. Liu, E. Schneider, S. Hellebrand, and H.-J.
Wunderlich, “Built-in Test for Hidden Delay Faults,” IEEE Transactions on Computer-Aided
Design of Integrated Circuits and Systems (TCAD), vol. 38, no. 10, pp. 1956–1968,
2019.
mla: Kampmann, Matthias, et al. “Built-in Test for Hidden Delay Faults.” IEEE
Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD),
vol. 38, no. 10, IEEE, 2019, pp. 1956–68.
short: M. Kampmann, M. A. Kochte, C. Liu, E. Schneider, S. Hellebrand, H.-J. Wunderlich,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
(TCAD) 38 (2019) 1956–1968.
date_created: 2019-08-28T11:44:25Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
intvolume: ' 38'
issue: '10'
language:
- iso: eng
page: 1956 - 1968
publication: IEEE Transactions on Computer-Aided Design of Integrated Circuits and
Systems (TCAD)
publication_identifier:
eissn:
- 1937-4151
publication_status: published
publisher: IEEE
status: public
title: Built-in Test for Hidden Delay Faults
type: journal_article
user_id: '209'
volume: 38
year: '2019'
...
---
_id: '13057'
author:
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: Kampmann M, Hellebrand S. Design For Small Delay Test - A Simulation Study.
Microelectronics Reliability. 2018;80:124-133.
apa: Kampmann, M., & Hellebrand, S. (2018). Design For Small Delay Test - A
Simulation Study. Microelectronics Reliability, 80, 124–133.
bibtex: '@article{Kampmann_Hellebrand_2018, title={Design For Small Delay Test -
A Simulation Study}, volume={80}, journal={Microelectronics Reliability}, author={Kampmann,
Matthias and Hellebrand, Sybille}, year={2018}, pages={124–133} }'
chicago: 'Kampmann, Matthias, and Sybille Hellebrand. “Design For Small Delay Test
- A Simulation Study.” Microelectronics Reliability 80 (2018): 124–33.'
ieee: M. Kampmann and S. Hellebrand, “Design For Small Delay Test - A Simulation
Study,” Microelectronics Reliability, vol. 80, pp. 124–133, 2018.
mla: Kampmann, Matthias, and Sybille Hellebrand. “Design For Small Delay Test -
A Simulation Study.” Microelectronics Reliability, vol. 80, 2018, pp. 124–33.
short: M. Kampmann, S. Hellebrand, Microelectronics Reliability 80 (2018) 124–133.
date_created: 2019-08-28T11:49:25Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
intvolume: ' 80'
language:
- iso: eng
page: 124-133
publication: Microelectronics Reliability
status: public
title: Design For Small Delay Test - A Simulation Study
type: journal_article
user_id: '659'
volume: 80
year: '2018'
...
---
_id: '13072'
author:
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Sybille
full_name: Hellebrand, Sybille
last_name: Hellebrand
citation:
ama: Kampmann M, Hellebrand S. Optimized Constraints for Scan-Chain Insertion
for Faster-than-at-Speed Test. 19th Workshop on RTL and High Level Testing
(WRTLT’18), Hefei, Anhui, China; 2018.
apa: Kampmann, M., & Hellebrand, S. (2018). Optimized Constraints for Scan-Chain
Insertion for Faster-than-at-Speed Test. 19th Workshop on RTL and High Level
Testing (WRTLT’18), Hefei, Anhui, China.
bibtex: '@book{Kampmann_Hellebrand_2018, place={19th Workshop on RTL and High Level
Testing (WRTLT’18), Hefei, Anhui, China}, title={Optimized Constraints for Scan-Chain
Insertion for Faster-than-at-Speed Test}, author={Kampmann, Matthias and Hellebrand,
Sybille}, year={2018} }'
chicago: Kampmann, Matthias, and Sybille Hellebrand. Optimized Constraints for
Scan-Chain Insertion for Faster-than-at-Speed Test. 19th Workshop on RTL and
High Level Testing (WRTLT’18), Hefei, Anhui, China, 2018.
ieee: M. Kampmann and S. Hellebrand, Optimized Constraints for Scan-Chain Insertion
for Faster-than-at-Speed Test. 19th Workshop on RTL and High Level Testing
(WRTLT’18), Hefei, Anhui, China, 2018.
mla: Kampmann, Matthias, and Sybille Hellebrand. Optimized Constraints for Scan-Chain
Insertion for Faster-than-at-Speed Test. 2018.
short: M. Kampmann, S. Hellebrand, Optimized Constraints for Scan-Chain Insertion
for Faster-than-at-Speed Test, 19th Workshop on RTL and High Level Testing (WRTLT’18),
Hefei, Anhui, China, 2018.
date_created: 2019-08-28T12:00:28Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
keyword:
- WORKSHOP
language:
- iso: eng
place: 19th Workshop on RTL and High Level Testing (WRTLT'18), Hefei, Anhui, China
status: public
title: Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test
type: misc
user_id: '659'
year: '2018'
...
---
_id: '10575'
author:
- first_name: Chang
full_name: Liu, Chang
last_name: Liu
- first_name: Eric
full_name: Schneider, Eric
last_name: Schneider
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: 'Liu C, Schneider E, Kampmann M, Hellebrand S, Wunderlich H-J. Extending Aging
Monitors for Early Life and Wear-Out Failure Prevention. In: 27th IEEE Asian
Test Symposium (ATS’18). ; 2018. doi:10.1109/ats.2018.00028'
apa: Liu, C., Schneider, E., Kampmann, M., Hellebrand, S., & Wunderlich, H.-J.
(2018). Extending Aging Monitors for Early Life and Wear-Out Failure Prevention.
27th IEEE Asian Test Symposium (ATS’18). https://doi.org/10.1109/ats.2018.00028
bibtex: '@inproceedings{Liu_Schneider_Kampmann_Hellebrand_Wunderlich_2018, title={Extending
Aging Monitors for Early Life and Wear-Out Failure Prevention}, DOI={10.1109/ats.2018.00028},
booktitle={27th IEEE Asian Test Symposium (ATS’18)}, author={Liu, Chang and Schneider,
Eric and Kampmann, Matthias and Hellebrand, Sybille and Wunderlich, Hans-Joachim},
year={2018} }'
chicago: Liu, Chang, Eric Schneider, Matthias Kampmann, Sybille Hellebrand, and
Hans-Joachim Wunderlich. “Extending Aging Monitors for Early Life and Wear-Out
Failure Prevention.” In 27th IEEE Asian Test Symposium (ATS’18), 2018.
https://doi.org/10.1109/ats.2018.00028.
ieee: 'C. Liu, E. Schneider, M. Kampmann, S. Hellebrand, and H.-J. Wunderlich, “Extending
Aging Monitors for Early Life and Wear-Out Failure Prevention,” 2018, doi: 10.1109/ats.2018.00028.'
mla: Liu, Chang, et al. “Extending Aging Monitors for Early Life and Wear-Out Failure
Prevention.” 27th IEEE Asian Test Symposium (ATS’18), 2018, doi:10.1109/ats.2018.00028.
short: 'C. Liu, E. Schneider, M. Kampmann, S. Hellebrand, H.-J. Wunderlich, in:
27th IEEE Asian Test Symposium (ATS’18), 2018.'
date_created: 2019-07-05T08:14:58Z
date_updated: 2022-05-11T17:11:53Z
department:
- _id: '48'
doi: 10.1109/ats.2018.00028
language:
- iso: eng
publication: 27th IEEE Asian Test Symposium (ATS'18)
publication_identifier:
isbn:
- '9781538694664'
publication_status: published
status: public
title: Extending Aging Monitors for Early Life and Wear-Out Failure Prevention
type: conference
user_id: '209'
year: '2018'
...
---
_id: '13078'
author:
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: Kampmann M, Hellebrand S. X-Tolerante Prüfzellengruppierung Für Den Test
Mit Erhöhter Betriebsfrequenz.; 2017.
apa: Kampmann, M., & Hellebrand, S. (2017). X-tolerante Prüfzellengruppierung
für den Test mit erhöhter Betriebsfrequenz.
bibtex: '@book{Kampmann_Hellebrand_2017, place={29. Workshop “Testmethoden und Zuverlässigkeit
von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany}, title={X-tolerante Prüfzellengruppierung
für den Test mit erhöhter Betriebsfrequenz}, author={Kampmann, Matthias and Hellebrand,
Sybille}, year={2017} }'
chicago: Kampmann, Matthias, and Sybille Hellebrand. X-Tolerante Prüfzellengruppierung
Für Den Test Mit Erhöhter Betriebsfrequenz. 29. Workshop “Testmethoden und
Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, 2017.
ieee: M. Kampmann and S. Hellebrand, X-tolerante Prüfzellengruppierung für den
Test mit erhöhter Betriebsfrequenz. 29. Workshop “Testmethoden und Zuverlässigkeit
von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, 2017.
mla: Kampmann, Matthias, and Sybille Hellebrand. X-Tolerante Prüfzellengruppierung
Für Den Test Mit Erhöhter Betriebsfrequenz. 2017.
short: M. Kampmann, S. Hellebrand, X-Tolerante Prüfzellengruppierung Für Den Test
Mit Erhöhter Betriebsfrequenz, 29. Workshop “Testmethoden und Zuverlässigkeit
von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, 2017.
date_created: 2019-08-28T12:06:26Z
date_updated: 2022-05-11T16:17:41Z
department:
- _id: '48'
keyword:
- WORKSHOP
language:
- iso: eng
place: 29. Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen"
(TuZ'17), Lübeck, Germany
status: public
title: X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz
type: misc
user_id: '209'
year: '2017'
...
---
_id: '10576'
author:
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: 'Kampmann M, Hellebrand S. Design-for-FAST: Supporting X-tolerant compaction
during Faster-than-at-Speed Test. In: 20th IEEE International Symposium on
Design & Diagnostics of Electronic Circuits & Systems (DDECS’17).
IEEE; 2017. doi:10.1109/ddecs.2017.7934564'
apa: 'Kampmann, M., & Hellebrand, S. (2017). Design-for-FAST: Supporting X-tolerant
compaction during Faster-than-at-Speed Test. 20th IEEE International Symposium
on Design & Diagnostics of Electronic Circuits & Systems (DDECS’17).
https://doi.org/10.1109/ddecs.2017.7934564'
bibtex: '@inproceedings{Kampmann_Hellebrand_2017, title={Design-for-FAST: Supporting
X-tolerant compaction during Faster-than-at-Speed Test}, DOI={10.1109/ddecs.2017.7934564},
booktitle={20th IEEE International Symposium on Design & Diagnostics of Electronic
Circuits & Systems (DDECS’17)}, publisher={IEEE}, author={Kampmann, Matthias
and Hellebrand, Sybille}, year={2017} }'
chicago: 'Kampmann, Matthias, and Sybille Hellebrand. “Design-for-FAST: Supporting
X-Tolerant Compaction during Faster-than-at-Speed Test.” In 20th IEEE International
Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS’17).
IEEE, 2017. https://doi.org/10.1109/ddecs.2017.7934564.'
ieee: 'M. Kampmann and S. Hellebrand, “Design-for-FAST: Supporting X-tolerant compaction
during Faster-than-at-Speed Test,” 2017, doi: 10.1109/ddecs.2017.7934564.'
mla: 'Kampmann, Matthias, and Sybille Hellebrand. “Design-for-FAST: Supporting X-Tolerant
Compaction during Faster-than-at-Speed Test.” 20th IEEE International Symposium
on Design & Diagnostics of Electronic Circuits & Systems (DDECS’17),
IEEE, 2017, doi:10.1109/ddecs.2017.7934564.'
short: 'M. Kampmann, S. Hellebrand, in: 20th IEEE International Symposium on Design
& Diagnostics of Electronic Circuits & Systems (DDECS’17), IEEE, 2017.'
date_created: 2019-07-05T08:23:56Z
date_updated: 2022-05-11T17:14:51Z
department:
- _id: '48'
doi: 10.1109/ddecs.2017.7934564
language:
- iso: eng
publication: 20th IEEE International Symposium on Design & Diagnostics of Electronic
Circuits & Systems (DDECS'17)
publication_identifier:
isbn:
- '9781538604724'
publication_status: published
publisher: IEEE
status: public
title: 'Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed
Test'
type: conference
user_id: '209'
year: '2017'
...
---
_id: '12975'
author:
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: 'Kampmann M, Hellebrand S. X Marks the Spot: Scan-Flip-Flop Clustering for
Faster-than-at-Speed Test. In: 25th IEEE Asian Test Symposium (ATS’16).
Hiroshima, Japan: IEEE; 2016:1-6. doi:10.1109/ats.2016.20'
apa: 'Kampmann, M., & Hellebrand, S. (2016). X Marks the Spot: Scan-Flip-Flop
Clustering for Faster-than-at-Speed Test. In 25th IEEE Asian Test Symposium
(ATS’16) (pp. 1–6). Hiroshima, Japan: IEEE. https://doi.org/10.1109/ats.2016.20'
bibtex: '@inproceedings{Kampmann_Hellebrand_2016, place={Hiroshima, Japan}, title={X
Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test}, DOI={10.1109/ats.2016.20}, booktitle={25th
IEEE Asian Test Symposium (ATS’16)}, publisher={IEEE}, author={Kampmann, Matthias
and Hellebrand, Sybille}, year={2016}, pages={1–6} }'
chicago: 'Kampmann, Matthias, and Sybille Hellebrand. “X Marks the Spot: Scan-Flip-Flop
Clustering for Faster-than-at-Speed Test.” In 25th IEEE Asian Test Symposium
(ATS’16), 1–6. Hiroshima, Japan: IEEE, 2016. https://doi.org/10.1109/ats.2016.20.'
ieee: 'M. Kampmann and S. Hellebrand, “X Marks the Spot: Scan-Flip-Flop Clustering
for Faster-than-at-Speed Test,” in 25th IEEE Asian Test Symposium (ATS’16),
2016, pp. 1–6.'
mla: 'Kampmann, Matthias, and Sybille Hellebrand. “X Marks the Spot: Scan-Flip-Flop
Clustering for Faster-than-at-Speed Test.” 25th IEEE Asian Test Symposium (ATS’16),
IEEE, 2016, pp. 1–6, doi:10.1109/ats.2016.20.'
short: 'M. Kampmann, S. Hellebrand, in: 25th IEEE Asian Test Symposium (ATS’16),
IEEE, Hiroshima, Japan, 2016, pp. 1–6.'
date_created: 2019-08-28T08:53:04Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
doi: 10.1109/ats.2016.20
language:
- iso: eng
page: 1-6
place: Hiroshima, Japan
publication: 25th IEEE Asian Test Symposium (ATS'16)
publisher: IEEE
status: public
title: 'X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test'
type: conference
user_id: '209'
year: '2016'
...
---
_id: '12976'
author:
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Michael
full_name: A. Kochte, Michael
last_name: A. Kochte
- first_name: Eric
full_name: Schneider, Eric
last_name: Schneider
- first_name: Thomas
full_name: Indlekofer, Thomas
last_name: Indlekofer
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: 'Kampmann M, A. Kochte M, Schneider E, Indlekofer T, Hellebrand S, Wunderlich
H-J. Optimized Selection of Frequencies for Faster-Than-at-Speed Test. In: 24th
IEEE Asian Test Symposium (ATS’15). Mumbai, India: IEEE; 2015:109-114. doi:10.1109/ats.2015.26'
apa: 'Kampmann, M., A. Kochte, M., Schneider, E., Indlekofer, T., Hellebrand, S.,
& Wunderlich, H.-J. (2015). Optimized Selection of Frequencies for Faster-Than-at-Speed
Test. In 24th IEEE Asian Test Symposium (ATS’15) (pp. 109–114). Mumbai,
India: IEEE. https://doi.org/10.1109/ats.2015.26'
bibtex: '@inproceedings{Kampmann_A. Kochte_Schneider_Indlekofer_Hellebrand_Wunderlich_2015,
place={Mumbai, India}, title={Optimized Selection of Frequencies for Faster-Than-at-Speed
Test}, DOI={10.1109/ats.2015.26},
booktitle={24th IEEE Asian Test Symposium (ATS’15)}, publisher={IEEE}, author={Kampmann,
Matthias and A. Kochte, Michael and Schneider, Eric and Indlekofer, Thomas and
Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2015}, pages={109–114}
}'
chicago: 'Kampmann, Matthias, Michael A. Kochte, Eric Schneider, Thomas Indlekofer,
Sybille Hellebrand, and Hans-Joachim Wunderlich. “Optimized Selection of Frequencies
for Faster-Than-at-Speed Test.” In 24th IEEE Asian Test Symposium (ATS’15),
109–14. Mumbai, India: IEEE, 2015. https://doi.org/10.1109/ats.2015.26.'
ieee: M. Kampmann, M. A. Kochte, E. Schneider, T. Indlekofer, S. Hellebrand, and
H.-J. Wunderlich, “Optimized Selection of Frequencies for Faster-Than-at-Speed
Test,” in 24th IEEE Asian Test Symposium (ATS’15), 2015, pp. 109–114.
mla: Kampmann, Matthias, et al. “Optimized Selection of Frequencies for Faster-Than-at-Speed
Test.” 24th IEEE Asian Test Symposium (ATS’15), IEEE, 2015, pp. 109–14,
doi:10.1109/ats.2015.26.
short: 'M. Kampmann, M. A. Kochte, E. Schneider, T. Indlekofer, S. Hellebrand, H.-J.
Wunderlich, in: 24th IEEE Asian Test Symposium (ATS’15), IEEE, Mumbai, India,
2015, pp. 109–114.'
date_created: 2019-08-28T09:03:08Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
doi: 10.1109/ats.2015.26
language:
- iso: eng
page: 109-114
place: Mumbai, India
publication: 24th IEEE Asian Test Symposium (ATS'15)
publisher: IEEE
status: public
title: Optimized Selection of Frequencies for Faster-Than-at-Speed Test
type: conference
user_id: '209'
year: '2015'
...
---
_id: '13077'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Thomas
full_name: Indlekofer, Thomas
last_name: Indlekofer
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Michael
full_name: Kochte, Michael
last_name: Kochte
- first_name: Chang
full_name: Liu, Chang
last_name: Liu
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: Hellebrand S, Indlekofer T, Kampmann M, Kochte M, Liu C, Wunderlich H-J. Effiziente
Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler. 27. Workshop
“Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad
Urach, Germany; 2015.
apa: Hellebrand, S., Indlekofer, T., Kampmann, M., Kochte, M., Liu, C., & Wunderlich,
H.-J. (2015). Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler.
27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15),
Bad Urach, Germany.
bibtex: '@book{Hellebrand_Indlekofer_Kampmann_Kochte_Liu_Wunderlich_2015, place={27.
Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15),
Bad Urach, Germany}, title={Effiziente Auswahl von Testfrequenzen für den Test
kleiner Verzögerungsfehler}, author={Hellebrand, Sybille and Indlekofer, Thomas
and Kampmann, Matthias and Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim},
year={2015} }'
chicago: Hellebrand, Sybille, Thomas Indlekofer, Matthias Kampmann, Michael Kochte,
Chang Liu, and Hans-Joachim Wunderlich. Effiziente Auswahl von Testfrequenzen
Für Den Test Kleiner Verzögerungsfehler. 27. Workshop “Testmethoden und Zuverlässigkeit
von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, 2015.
ieee: S. Hellebrand, T. Indlekofer, M. Kampmann, M. Kochte, C. Liu, and H.-J. Wunderlich,
Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler.
27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15),
Bad Urach, Germany, 2015.
mla: Hellebrand, Sybille, et al. Effiziente Auswahl von Testfrequenzen Für Den
Test Kleiner Verzögerungsfehler. 2015.
short: S. Hellebrand, T. Indlekofer, M. Kampmann, M. Kochte, C. Liu, H.-J. Wunderlich,
Effiziente Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler,
27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15),
Bad Urach, Germany, 2015.
date_created: 2019-08-28T12:05:44Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
keyword:
- Workshop
language:
- iso: eng
place: 27. Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen"
(TuZ'15), Bad Urach, Germany
status: public
title: Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler
type: misc
user_id: '659'
year: '2015'
...
---
_id: '12977'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Thomas
full_name: Indlekofer, Thomas
last_name: Indlekofer
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Michael
full_name: A. Kochte, Michael
last_name: A. Kochte
- first_name: Chang
full_name: Liu, Chang
last_name: Liu
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: 'Hellebrand S, Indlekofer T, Kampmann M, A. Kochte M, Liu C, Wunderlich H-J.
FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects. In: IEEE
International Test Conference (ITC’14). Seattle, Washington, USA: IEEE; 2014.
doi:10.1109/test.2014.7035360'
apa: 'Hellebrand, S., Indlekofer, T., Kampmann, M., A. Kochte, M., Liu, C., &
Wunderlich, H.-J. (2014). FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden
Delay Defects. In IEEE International Test Conference (ITC’14). Seattle,
Washington, USA: IEEE. https://doi.org/10.1109/test.2014.7035360'
bibtex: '@inproceedings{Hellebrand_Indlekofer_Kampmann_A. Kochte_Liu_Wunderlich_2014,
place={Seattle, Washington, USA}, title={FAST-BIST: Faster-than-at-Speed BIST
Targeting Hidden Delay Defects}, DOI={10.1109/test.2014.7035360},
booktitle={IEEE International Test Conference (ITC’14)}, publisher={IEEE}, author={Hellebrand,
Sybille and Indlekofer, Thomas and Kampmann, Matthias and A. Kochte, Michael and
Liu, Chang and Wunderlich, Hans-Joachim}, year={2014} }'
chicago: 'Hellebrand, Sybille, Thomas Indlekofer, Matthias Kampmann, Michael A.
Kochte, Chang Liu, and Hans-Joachim Wunderlich. “FAST-BIST: Faster-than-at-Speed
BIST Targeting Hidden Delay Defects.” In IEEE International Test Conference
(ITC’14). Seattle, Washington, USA: IEEE, 2014. https://doi.org/10.1109/test.2014.7035360.'
ieee: 'S. Hellebrand, T. Indlekofer, M. Kampmann, M. A. Kochte, C. Liu, and H.-J.
Wunderlich, “FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects,”
in IEEE International Test Conference (ITC’14), 2014.'
mla: 'Hellebrand, Sybille, et al. “FAST-BIST: Faster-than-at-Speed BIST Targeting
Hidden Delay Defects.” IEEE International Test Conference (ITC’14), IEEE,
2014, doi:10.1109/test.2014.7035360.'
short: 'S. Hellebrand, T. Indlekofer, M. Kampmann, M. A. Kochte, C. Liu, H.-J. Wunderlich,
in: IEEE International Test Conference (ITC’14), IEEE, Seattle, Washington, USA,
2014.'
date_created: 2019-08-28T09:04:45Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
doi: 10.1109/test.2014.7035360
language:
- iso: eng
place: Seattle, Washington, USA
publication: IEEE International Test Conference (ITC'14)
publisher: IEEE
status: public
title: 'FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects'
type: conference
user_id: '209'
year: '2014'
...